CN110071691A - For analyzing the method and related device of the solar components of reliability failures - Google Patents
For analyzing the method and related device of the solar components of reliability failures Download PDFInfo
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- CN110071691A CN110071691A CN201910423877.4A CN201910423877A CN110071691A CN 110071691 A CN110071691 A CN 110071691A CN 201910423877 A CN201910423877 A CN 201910423877A CN 110071691 A CN110071691 A CN 110071691A
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- failed component
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- test
- solar components
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- 238000000034 method Methods 0.000 title claims abstract description 31
- 238000012360 testing method Methods 0.000 claims abstract description 60
- 238000005259 measurement Methods 0.000 claims abstract description 28
- 239000000463 material Substances 0.000 claims abstract description 21
- 238000005086 pumping Methods 0.000 claims abstract description 14
- 239000002002 slurry Substances 0.000 claims abstract description 6
- 238000010030 laminating Methods 0.000 claims description 9
- 238000003475 lamination Methods 0.000 claims description 6
- 230000000694 effects Effects 0.000 claims description 4
- 230000005611 electricity Effects 0.000 claims description 3
- 238000004321 preservation Methods 0.000 claims description 3
- 238000012795 verification Methods 0.000 claims description 2
- 210000004027 cell Anatomy 0.000 description 21
- 239000000047 product Substances 0.000 description 7
- 239000011521 glass Substances 0.000 description 6
- 101000760175 Homo sapiens Zinc finger protein 35 Proteins 0.000 description 3
- 102100024672 Zinc finger protein 35 Human genes 0.000 description 3
- 239000002313 adhesive film Substances 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 230000006641 stabilisation Effects 0.000 description 2
- 238000011105 stabilization Methods 0.000 description 2
- 101001073212 Arabidopsis thaliana Peroxidase 33 Proteins 0.000 description 1
- 101001123325 Homo sapiens Peroxisome proliferator-activated receptor gamma coactivator 1-beta Proteins 0.000 description 1
- 102100028961 Peroxisome proliferator-activated receptor gamma coactivator 1-beta Human genes 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 210000005056 cell body Anatomy 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 235000015110 jellies Nutrition 0.000 description 1
- 239000008274 jelly Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 238000013082 photovoltaic technology Methods 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- SJWPTBFNZAZFSH-UHFFFAOYSA-N pmpp Chemical compound C1CCSC2=NC=NC3=C2N=CN3CCCN2C(=O)N(C)C(=O)C1=C2 SJWPTBFNZAZFSH-UHFFFAOYSA-N 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000013102 re-test Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
- H02S50/15—Testing of PV devices, e.g. of PV modules or single PV cells using optical means, e.g. using electroluminescence
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Photovoltaic Devices (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The present invention relates to a kind of methods for analyzing the solar components of reliability failures, comprising: (1) failed component is placed in high temperature, in half-light environment and keeps electrical pumping preset time；(2) EL test and power test are carried out again, obtain that treated EL test result and power measurements；(3) treated EL test result is compared with the EL test result of original state, and treated power measurements are compared with the power measurements of original state, if EL test result that treated relative to original state EL test result in the first preset range and treated power measurements relative to original state power measurements in the second preset range, analyze the failed component as cell piece failure；Other comparison results, then analyzing the failed component is that encapsulating material causes or cell piece slurry contacts caused failure.The present invention also provides corresponding devices.
Description
Technical field
The present invention relates to photovoltaic technology field, more particularly, to a kind of for analyzing the solar energy group of reliability failures
The method and related device of part.
Background technique
Back passivating solar battery (PERC) and back passivation solar components have become the main product of photovoltaic art, reliability
Test (high temperature and humidity test, abbreviation DH1000；Wet jelly test, abbreviation HF10；High/low temperature loop test, abbreviation TC200) always
It is industry focal point, will be seen that product in the failure of varying environment and different stress conditions by product reliability test
Mode and failure regularity.The immanent cause of failure product and the weakness of product can be found out by the analysis carried out to failure product
Link improves product reliability level so as to take appropriate measures, to ensure the product reliability service life.
Inevitably there is the solar cell panel assembly of reliability failures during the test, and solar components undergo reliability
After test failure, failure mechanism can not be often analyzed, because laminating packaging terminates solar components, can not be separated complete
Cell piece, then decomposition analysis is carried out to cell piece and encapsulating material.So perplexing the failure point of solar components always in the industry
Analysis, none suitable method can distinguish the problem of failure solar components are solar cell pieces or component package material
The problem of.
Summary of the invention
The main object of the present invention aiming at the problems and shortcomings present on, provide a kind of saving consumptive material, it is time-consuming it is short,
The simple and effective method for analyzing the solar components of reliability failures and corresponding device
To achieve the goals above, the method and technology for the solar components for analyzing reliability failures that the present invention uses
Scheme is as follows:
The method includes:
(1) failed component is placed in high temperature, in half-light environment and keeps electrical pumping preset time；
(2) EL test and power test are carried out, obtain that treated EL test result and power measurements；
(3) EL test result and power test knot of the failed component before reliability failures as original state are obtained
Fruit compares treated EL test result with the EL test result of original state, and will treated power measurements
It compares with the power measurements of original state,
If EL test result that treated in the first preset range and is handled relative to the EL test result of original state
Power measurements afterwards relative to original state power measurements in the second preset range, then analyze the failed component
For cell piece failure；
If other comparison results, then analyze the failed component be encapsulating material cause or cell piece slurry contact caused by
Failure.
Preferably, the surface temperature of failed component is 85 DEG C~130 in the high temperature, half-light environment of the step (1)
℃。
Preferably, the surface temperature of the failed component is 110 DEG C~130 DEG C.
Preferably, preset time in the step (1) is 4h~for 24 hours.
Preferably, the electrical pumping condition in the step (1) are as follows: electric current 5A~10A is powered to solar panels forward direction.
Preferably, electric current 5.9A~6A of the electrical pumping.
Preferably, failed component is coated with lamination pad, in the step (1) to carry out heat preservation and shading.
Preferably, the failed component analyzed as cell piece failure meets verification step in the step (3):
The failed component to fail for cell piece will be analyzed and carry out test of being exposed to the sun, power test is carried out later, after being exposed to the sun
Power measurements, and it is described be exposed to the sun after power measurements relative to treated in step (2) power test
As a result it in third preset range, is resumed and stable power measurements with proving that failed component has.
Preferably, being that encapsulating material causes or the contact of cell piece slurry is caused to analysis fails in the step (3)
Component carries out continuing to judge, observes the cell piece surface of failed component with the presence or absence of steam,
If so, judging the failed component for encapsulating material failure；
If it is not, then judging to fail caused by the failed component contacts for cell size.
The present invention also provides a kind of device based on the method, the device includes:
Laminating bench, for placing failed component and providing hot environment；
Lamination pad, for wrapping up the failed component to provide half-light environment；
DC power supply device, for providing electrical pumping to failed component.
Detailed description of the invention
Fig. 1 is corresponding EL test chart.
Fig. 2 is the flow diagram of method provided by the invention.
Fig. 3 is the structural schematic diagram of device provided by the invention.
Appended drawing reference
1 laminating bench
2 lamination pads
3 failed components
4 DC power supply devices
5 cover boards
Specific embodiment
In order to be more clearly understood that technology contents of the invention, spy lifts following embodiment and is described in detail.
The present invention relates to a kind of method for analyzing the solar components of reliability failures, by solar components into
Row high temperature and electrical pumping processing are sentenced if the EL test of failed component and power test are stable to restore normal (original state)
The failed component of breaking is cell piece failure, and failure is not related with the encapsulating material of photovoltaic module.Avoid the mistake of technical staff
Sentence, find Problem of Failure accurately for technical staff and provide accurate direction, save time and the cost of failure analysis, and avoids separating
The trouble of cell piece and encapsulating material.
Method provided by the present invention for analyzing the solar components of reliability failures, specifically includes:
S0: the solar components to fail in reliability test are sub-elected, face glass cleaning is stand-by, and the known failure
Corresponding EL test result and power measurements of the component before carrying out reliability test, the original state as the failed component
EL test result and power measurements；
S1: down lying in the glass of failed component on the table top of laminating machine, to carry out electricity in high temperature, half-light environment
Injection；
S2: carrying out EL test and power test, obtain that treated EL test result and power measurements；
S3: result compares, and judges failed component for cell piece failure or other failures；
S4: verifying analysis is the failed component of cell piece failure.
In step S0:
The failed component sub-elected must not contact hair and plastics, and fusing after high-temperature process is prevented to be attached to surface.
Step S1 specifically:
The glass of failed component is lain in down on the table top of laminating machine, then is laminated in the back side bedding of failed component
Piece (playing insulation effect) pads package failed component, the positive and negative anodes of the positive and negative anodes access direct current power box of failed component with lamination；
Electrical pumping electric current is set as 6A~10A, 5A~9A, 150 DEG C of the table top set temperature of laminating machine, such as leads to constant 6A
Or the forward current of 9A, 1h monitor the actual temperature of failed component and are passed through the situation of electric current, wherein considered repealed component
The temperature on surface is 85 DEG C~130 DEG C, 110 DEG C~130 DEG C, when being passed through the forward current of 6A, actual test monitoring 5.9A~
6A, power are maximum 600W or so；
It waits 4h to take out, is cooled to 30 DEG C.
In step S2:
Full-automatic EL tester can be used in EL test, shoots image using the infrared camera of resolution ratio, obtains simultaneously decision set
Part defect；Component tester can be used in power test, measures related unit for electrical property parameters.
In step S3:
If EL and power can return to original state and stablize in original state, illustrate that failed component is led for cell piece
The failure of cause；
If EL or power can not return to original state, illustrate that failed component is that encapsulating material causes or cell size connects
Failure caused by touching, at least quickly eliminates the problem of cell body is decayed, it is no longer necessary to battery process comparison is done, by failure side
To narrowing down to two, that is, cell size contact problems or encapsulating material problem.
Wherein, encapsulating material includes frame, glass, EVA adhesive film and backboard, and wherein EVA adhesive film is most important material, is made
Solar components are easily caused to generate fatal defect with improper, initial sample presentation requires to can be used by test authentication, because
This also easily quick lock in Effect of Materials.
If encapsulating material fails, generally has steam and enter solar battery sheet surface, then whether observe cell piece surface
There is steam entrance, so that it may judge.
After excluding encapsulating material failure again, just only surplus cell size contact problems, then can quickly select different slurries
The battery of material carries out one-time authentication, retest, so that it may draw a conclusion.
Step S4 specifically:
To confirm whether the power of failed component is in stable state, failed component is put into outdoor environment and done and is exposed to the sun
The irradiation of 60kwh, the power difference of actual power and original state after then test failure component is exposed to the sun, if the difference power
Value is receiving in range, then illustrates that the power of failed component can be restored to original state and stabilization.
As shown in figure 3, the present invention also provides corresponding device, including laminating bench 1, for placing failed component and providing
Hot environment；It is laminated pad 2, for wrapping up the failed component 3 to provide half-light environment, avoids the shadow of indoor other light sources
It rings；DC power supply device 4, for providing electrical pumping and cover board 5 to failed component.Particularly, which can adapt to big ruler
Very little solar components, such as 1650 × 992 × 35mm and 1960 × 992 × 40mm.
Wherein, it is laminated and pads high temperature resistant, on bedding to solar panel or wrap up this failed component to play heat preservation and hide
Light-blocking effect.
Embodiment 1
S0: sub-electing is being more than 5% failed component, face glass cleaning by the decaying of DH1000 and HF10 measured power
For use, and the known failed component carry out DH1000 and HF10 test before corresponding EL test result and power measurements,
The EL test result and power measurements of original state as the failed component；
S1: down lying in the glass of failed component on the table top of laminating machine, to carry out electricity in high temperature, half-light environment
Injection；
S2: carrying out EL test and power test, obtain that treated EL test result and power measurements；
S3: result compares, the power level that can be restPosed and EL test shows original dimmed blackening
Cell piece has also restored normal luminous state；
S4: being exposed to the sun through outdoor, and power is without decline phenomenon.
Above-mentioned steps as shown in Fig. 2, combine S3 and S4 step that can clearly judge that above-mentioned failed component is battery as a result,
Piece failure, and this failure can be resumed and stabilize.
The following table 1 is the Experiment Data Records of above-mentioned whole process, and Fig. 1 is corresponding EL figure.
Table 1 and Fig. 1's the result shows that, by reliability test DH1000 and stand 6 days after power (PMPP) decline 8.5%
Solar components, the battery of part blackening, after electrical pumping is handled, power has been restored to normal 309.6W, originally become
Dark or blackening battery has restored normal luminous state again, and subsequent standing process and outdoor are exposed to the sun process, all in stabilization
State.
Method provided by the invention can use up in a short time block and find out solar components failure cause, and solar components
It can restore as before, not influence to use by the method for electrical pumping and high temperature, save consumptive material.
In this description, the present invention is described with reference to its specific embodiment.But it is clear that can still make
Various modifications and alterations are without departing from the spirit and scope of the invention.Therefore, the description and the appended drawings should be considered as illustrative
And not restrictive.
Claims (10)
1. a kind of method for analyzing the solar components of reliability failures, which is characterized in that the method includes:
(1) failed component is placed in high temperature, in half-light environment and keeps electrical pumping preset time；
(2) EL test and power test are carried out, obtain that treated EL test result and power measurements；
(3) EL test result and power measurements of the failed component before reliability failures as original state are obtained,
Treated EL test result is compared with the EL test result of original state, and will treated power measurements and just
The power measurements of beginning state compare,
If EL test result that treated relative to original state EL test result is in the first preset range and treated
Power measurements relative to original state power measurements in the second preset range, then analyze the failed component for electricity
The failure of pond piece；
If other comparison results, then analyzing the failed component is that encapsulating material causes or cell piece slurry contacts caused lose
Effect.
2. the method according to claim 1 for analyzing the solar components of reliability failures, which is characterized in that in institute
In the high temperature of the step of stating (1), half-light environment, the surface temperature of failed component is 85 DEG C~130 DEG C.
3. the method according to claim 2 for analyzing the solar components of reliability failures, which is characterized in that described
Failed component surface temperature be 110 DEG C~130 DEG C.
4. the method according to claim 1 for analyzing the solar components of reliability failures, which is characterized in that described
The step of (1) in preset time be 4h~for 24 hours.
5. the method according to claim 1 for analyzing the solar components of reliability failures, which is characterized in that described
The step of (1) in electrical pumping condition are as follows: electric current 5A~10A, to solar panels forward direction be powered.
6. the method according to claim 5 for analyzing the solar components of reliability failures, which is characterized in that described
Electrical pumping electric current 5.9A~6A.
7. the method according to claim 1 for analyzing the solar components of reliability failures, which is characterized in that described
The step of (1) in, failed component be coated with lamination pad, with carry out heat preservation and shading.
8. the method according to claim 1 for analyzing the solar components of reliability failures, which is characterized in that in institute
In the step of stating (3), the failed component analyzed as cell piece failure meets verification step:
The failed component to fail for cell piece will be analyzed and carry out test of being exposed to the sun, carry out power test, the function after being exposed to the sun later
Rate test result, and it is described be exposed to the sun after power measurements relative to treated in step (2) power measurements
In third preset range, it is resumed and stable power measurements with proving that failed component has.
9. the method according to claim 1 for analyzing the solar components of reliability failures, which is characterized in that described
The step of (3) in, to analysis be encapsulating material cause or cell piece slurry contact caused by failed component carry out continuing to judge, see
The cell piece surface for examining failed component whether there is steam,
If so, judging the failed component for encapsulating material failure；
If it is not, then judging to fail caused by the failed component contacts for cell size.
10. a kind of device based on method described in any one of claims 1 to 9, which is characterized in that the device packet
It includes:
Laminating bench, for placing failed component and providing hot environment；
Lamination pad, for wrapping up the failed component to provide half-light environment；
DC power supply device, for providing electrical pumping to failed component.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910423877.4A CN110071691B (en) | 2019-05-21 | 2019-05-21 | Method for evaluating a solar module with failed reliability and corresponding device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910423877.4A CN110071691B (en) | 2019-05-21 | 2019-05-21 | Method for evaluating a solar module with failed reliability and corresponding device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110071691A true CN110071691A (en) | 2019-07-30 |
| CN110071691B CN110071691B (en) | 2020-05-08 |
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| CN201910423877.4A Expired - Fee Related CN110071691B (en) | 2019-05-21 | 2019-05-21 | Method for evaluating a solar module with failed reliability and corresponding device |
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011152445A1 (en) * | 2010-06-04 | 2011-12-08 | 株式会社アイテス | Electroluminescence inspection device for solar panel and electroluminescence inspection method |
| CN104485875A (en) * | 2014-12-17 | 2015-04-01 | 常州天合光能有限公司 | Failure analysis method for judging failed photovoltaic component and photovoltaic component structure using failure analysis method |
-
2019
- 2019-05-21 CN CN201910423877.4A patent/CN110071691B/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011152445A1 (en) * | 2010-06-04 | 2011-12-08 | 株式会社アイテス | Electroluminescence inspection device for solar panel and electroluminescence inspection method |
| CN104485875A (en) * | 2014-12-17 | 2015-04-01 | 常州天合光能有限公司 | Failure analysis method for judging failed photovoltaic component and photovoltaic component structure using failure analysis method |
Non-Patent Citations (1)
| Title |
|---|
| 龚海丹 等.: "晶体硅光伏组件EL检测出的黑片缺陷失效分析", 《太阳能》 * |
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