CN109798937A - Low-power semiconductor laser reliability Auto-Test System - Google Patents
Low-power semiconductor laser reliability Auto-Test System Download PDFInfo
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- CN109798937A CN109798937A CN201910124184.5A CN201910124184A CN109798937A CN 109798937 A CN109798937 A CN 109798937A CN 201910124184 A CN201910124184 A CN 201910124184A CN 109798937 A CN109798937 A CN 109798937A
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Abstract
The invention discloses a kind of low-power semiconductor laser reliability Auto-Test Systems, it include: industrial personal computer, temperature control modules, hygrosensor, Laser Power Devices, energy supply control module, electrical parameter collection plate and optical detection module, energy supply control module is used to the output of Laser Power Devices being assigned to each laser；Electrical parameter collection plate is used to acquire the electrical parameter of each laser, and collected electrical parameter is transmitted to industrial personal computer；Temperature control modules are used to control the temperature of laser；Hygrosensor is used for the temperature of detection laser and temperature data is transmitted to industrial personal computer；Optical detection module acquires the power data of laser, and collected power data is transmitted to industrial personal computer for receiving the light that laser launches；Industrial personal computer, which receives, comes from the electrical parameter, temperature data and power data, is monitored to the reliability of laser.The present invention is suitable for the automatic test of low-power semiconductor laser, is controlled by industrial personal computer, improves the reliability of system.
Description
Technical field
The present invention relates to laser device reliability the field of test technology more particularly to a kind of low-power semiconductor laser are reliable
Property Auto-Test System.
Background technique
Semiconductor laser is widely used to various industrial circles, and reliability and service life are its most important indexs.Mesh
Preceding reliability of semiconductor laser test macro existing in the market is mostly used in superpower laser, used in it will test
Each independent subsystem combine and be monitored, this monitoring is inconvenient for operation based on manually monitoring, and cannot achieve
Automatic monitoring, can not achieve the automatic test of multistation product.For low-power semiconductor laser below for 1~2w,
Number of lasers is big, and laser device reliability test period is long, manually monitor it is more difficult, so be badly in need of establish it is a set of
The Auto-Test System of laser device reliability realizes real time monitoring and analysis to product.
Summary of the invention
The object of the present invention is to provide a kind of low-power semiconductor laser reliability Auto-Test Systems, realize to small function
The integral automation reliability test of rate semiconductor laser.
To achieve the goals above, it is tested automatically the present invention provides a kind of low-power semiconductor laser reliability and is
System, comprising: industrial personal computer, temperature control modules, hygrosensor, Laser Power Devices, energy supply control module, electrical parameter collection plate and light
Detecting module, the energy supply control module are used to the output of the Laser Power Devices being assigned to each laser；The electrical parameter
Collection plate is used to acquire the electrical parameter of each laser, and collected electrical parameter is transmitted to the industrial personal computer；The temperature
Control module includes the precise temperature control slot based on intelligent PID algorithm, for controlling the temperature of the laser；The temperature sensing
Device is used to detect the temperature of the laser and temperature data is transmitted to the industrial personal computer；The optical detection module is for receiving
The light that the laser launches acquires the power data of the laser, and collected power data is transmitted to institute
State industrial personal computer；The industrial personal computer receives the electrical parameter from the electrical parameter collection plate, the temperature from the hygrosensor
Data and power data from the optical detection module, are monitored the reliability of the laser.
Preferably, the low-power semiconductor laser reliability Auto-Test System further includes test box, the temperature
Control module, hygrosensor, Laser Power Devices, energy supply control module, electrical parameter collection plate and optical detection module are set to described
Test box.
Preferably, it is provided with laser jig plate in the precise temperature control slot, is provided with and draws on the laser jig plate
Foot fixture, the laser are fixed on the laser jig plate by the pin fixture.
Preferably, the pin fixture includes the pin elastic slice and use of fixture cover, pin for clamping the laser
In the fixed block of the fixation pin elastic slice.
Preferably, heat-generating pipe is additionally provided in the precise temperature control slot, the heat-generating pipe is installed on the laser fixture
Plate, for heating the laser jig plate.
Preferably, the laser jig plate includes upper fixture plate and lower press plate, and the heat-generating pipe is arranged on described
Between jig plate and lower press plate.
Preferably, the temperature control modules further include temperature controller, and the temperature controller is visited according to the temperature
The temperature for surveying device detection, controls the heating temperature of the heat-generating pipe.
Preferably, each laser is connected with a relay switch, the energy supply control module by control it is described after
Electric switch is controlled to the independently-powered of each laser.
Preferably, the electrical parameter of the electrical parameter collection plate acquisition includes voltage, electric current, power.
Preferably, the optical detection module includes optical detector and photoelectric power collection plate, and the optical detector is for connecing
Laser is received, the photoelectric power collection plate is used to acquire the power data of laser.
Low-power semiconductor laser reliability Auto-Test System of the invention is suitable for low-power semiconductor laser
Automatic test controlled by industrial personal computer by integrating all subsystems, improve the reliability of system.
Detailed description of the invention
In the following, the preferred embodiment of the present invention will be described in more detail in conjunction with attached drawing, in which:
Fig. 1 is that the composition of the low-power semiconductor laser reliability Auto-Test System of one embodiment of the present invention is shown
It is intended to；
Fig. 2 is the test box of the low-power semiconductor laser reliability Auto-Test System of one embodiment of the present invention
Perspective view；
Fig. 3 is the schematic diagram of the laser jig plate in Fig. 2；
Fig. 4 is the structure chart of the pin fixture in Fig. 3；
Fig. 5 is the power supply control of the low-power semiconductor laser reliability Auto-Test System of one embodiment of the present invention
The functional block diagram of molding block.
Specific embodiment
In order to make those skilled in the art more fully understand technical solution of the present invention, below in conjunction with attached drawing to this hair
It is bright to be further detailed.
Fig. 1 is that the composition of the low-power semiconductor laser reliability Auto-Test System of one embodiment of the present invention is shown
It is intended to.As shown in Figure 1, the low-power semiconductor laser reliability Auto-Test System of embodiment of the present invention includes: industry control
Machine, temperature control modules, hygrosensor, Laser Power Devices, energy supply control module, electrical parameter collection plate and optical detection module, electricity
Source control module is connect with Laser Power Devices, and for the output of Laser Power Devices to be assigned to each laser, electrical parameter collection plate is real
When acquire the electrical parameter of each laser, and collected electrical parameter is transmitted to industrial personal computer；Optical detection module receives laser
The light launched acquires the power data of the laser in real time, and collected power data is transmitted to industrial personal computer；Temperature
Degree detector is connect with laser, for detecting the temperature of the laser and temperature data being transmitted to industrial personal computer, temperature control
The temperature of molding block control laser；Industrial personal computer receives the electrical parameter from electrical parameter collection plate, the function from optical detection module
Rate data and temperature data from hygrosensor, are monitored the reliability of laser.
Preferably, the low-power semiconductor laser reliability Auto-Test System of embodiment of the present invention is formed as testing
Case, it is easy to remove, facilitate test.Fig. 2 is that the low-power semiconductor laser reliability of one embodiment of the present invention is surveyed automatically
The perspective view of the test box of test system.
As shown in Fig. 2, test box is made of case lid 10 and cabinet 20, case lid 10 is opened and closed by bracket 21, is set in case lid 10
It is equipped with the optical detection module of low-power semiconductor laser reliability Auto-Test System, including attenuator 22 and is set to decaying
The photoelectric power collection plate 23 of 22 the inside of piece.Bracket 21 can be pneumatic spring bracket.Preferably, optical detection module further include into
The photoelectric conversion plate of row photoelectric conversion.
The low-power semiconductor laser 24 of multistation is set in cabinet 20 by laser jig plate 25, laser 24
Shine the attenuator 22 got on case lid upwards, and collected power data is then passed to work by photoelectric power collection plate 23
Control machine.Preferably, it is provided with optical detector on photoelectric power collection plate 23, since optical detector is very sensitive to temperature, Ke Yitong
Overdamping piece 22 perhaps takes away heat by the heat-insulated fan of setting or refrigeration can be arranged on photoelectric power collection plate 23
Optical detector is arranged on by piece, or these means can be combined and be guaranteed that the temperature of circuit board is stably and controllable.
In the present embodiment, the temperature control modules and electricity of low-power semiconductor laser reliability Auto-Test System
Source control module is all set in the cabinet 20 of test box.Temperature control modules are used to control the temperature of low-power semiconductor laser
Degree.Present embodiment realizes the temperature control to laser by precise temperature control thermostat, compares environmental cabinet temperature control or water cooling control
Temperature, such structure can more preferably realize laser control temperature and whole temperature-controlled precision is higher, the temperature difference is smaller.Based on intelligent PID
(Proportional Integral Derivative, proportional integral differential) algorithm realizes the design of precise temperature control slot, multiple
The multistation device of different zones can realize identical temperature, and heating rate is fast, can be rapidly heated in 2 minutes to set
Experimental temperature and keep constant rapidly, guarantee give identical experimental condition to one group of device, to remove external factor
It influences.
In the present embodiment, as shown in Fig. 2, low-power semiconductor laser 24 is fixed on by aftermentioned pin fixture
On laser jig plate 25, multiple laser jig plates 25 are placed in precise temperature control slot.Temperature control modules include heat-generating pipe
(be directed in the explanation of Fig. 3 and be described in detail later), heat-generating pipe is mounted on laser jig plate 25, is used for heating laser jig plate
25, to heat to low-power semiconductor laser 24, realize the examination of laser high temperature service life.Temperature control modules also wrap
Temperature controller 27 is included, the temperature controller 27 (is directed in the explanation of Fig. 3 later and is described in detail) detection according to hygrosensor
Temperature, control the heating temperature of the heat-generating pipe.
Energy supply control module, which can integrate, controls distribution plate (not shown) for power supply, and power supply controls distribution plate and Laser Power Devices
Connection, for the output of the Laser Power Devices to be assigned to each laser.Electrical parameter collection plate 26 acquires small-power half in real time
The electrical parameter of conductor laser 24, and collected electrical parameter is transmitted to industrial personal computer.
Fig. 3 is the schematic diagram of the laser jig plate in Fig. 2.As shown in figure 3, laser jig plate 26 is set using modularization
Meter mode, including upper fixture plate 33 and lower press plate 32, upper lower press plate are for example connected by screw etc..Small-power semiconductor swashs
Light device 24 is fixed on laser jig plate 26 by the pin fixture 31 being embedded in lower press plate 32.Heat-generating pipe 34 is placed in
Between upper lower press plate, for heating to laser jig plate 26, the constant temperature difference of entire jig plate ensure that.In upper folder
It is provided with hygrosensor 35 on tool plate 33, for detecting the temperature of the laser 24 and temperature data being transmitted to industry control
Machine.
Fig. 4 is the structure chart of the pin fixture in Fig. 3.As shown in figure 4, pin fixture 31 includes fixture cover 41, for pressing from both sides
Firmly the pin elastic slice 42 of the pin of laser 24 and the fixed block 43 for fixing pin elastic slice 42.The pin of laser 24 is from folder
Pin fixture 31 is inserted into 41 top of tool cover, and each pin of laser 24 is all inserted into a fixture.Each laser is represented in Fig. 3
Device 24 there are two pin, be mounted with the case where two pin fixtures 31.The 1st row indicates the feelings for not yet installing laser 24 in figure
Shape, the 2nd row and the 2nd row indicate the situation for being mounted with laser 24.Pin fixture 31 is for example existed by spiral connection setting
On laser jig plate 26.
Fig. 5 is the power supply control of the low-power semiconductor laser reliability Auto-Test System of one embodiment of the present invention
The working principle diagram of molding block.As shown, energy supply control module is connect with Laser Power Devices, for by the defeated of the Laser Power Devices
It is assigned to each laser out.In the present embodiment, industrial personal computer controls the small function that the energy supply control module is each station
Rate semiconductor laser is independently-powered, guarantees working long hours for laser, and then electrical parameter collection plate 26 acquires laser
Electrical parameter (voltage, electric current, power etc.) is sent to industrial personal computer, when industrial personal computer discovery data have exception, then cut off corresponding laser
The power supply of device.Because there are many laser station, Laser Power Devices output is assigned on each laser by energy supply control module, is realized
The independent circuits of each laser control.Each laser is connected with a relay switch, and industrial personal computer can be to every by software
A laser is independently controlled.
It is above that certain exemplary embodiments of the invention are only described by way of explanation, undoubtedly, for ability
The those of ordinary skill in domain without departing from the spirit and scope of the present invention can be with a variety of different modes to institute
The embodiment of description is modified.Therefore, above-mentioned attached drawing and description are regarded as illustrative in nature, and should not be construed as to the present invention
The limitation of claims.
Claims (10)
1. a kind of low-power semiconductor laser reliability Auto-Test System characterized by comprising
Industrial personal computer, temperature control modules, hygrosensor, Laser Power Devices, energy supply control module, electrical parameter collection plate and optical detection
Module,
The energy supply control module is used to the output of the Laser Power Devices being assigned to each laser；
The electrical parameter collection plate is used to acquire the electrical parameter of each laser, and collected electrical parameter is transmitted to the work
Control machine；
The temperature control modules include the precise temperature control slot based on intelligent PID algorithm, for controlling the temperature of the laser；
The hygrosensor is used to detect the temperature of the laser and temperature data is transmitted to the industrial personal computer；
The optical detection module is used to receive the light that the laser launches, and acquires the power data of the laser, and
Collected power data is transmitted to the industrial personal computer；
The industrial personal computer receive the electrical parameter from the electrical parameter collection plate, the temperature data from the hygrosensor and
Power data from the optical detection module, is monitored the reliability of the laser.
2. low-power semiconductor laser reliability Auto-Test System according to claim 1, which is characterized in that also wrap
Test box is included, the temperature control modules, hygrosensor, Laser Power Devices, energy supply control module, electrical parameter collection plate and light are visited
It surveys module and is set to the test box.
3. low-power semiconductor laser reliability Auto-Test System according to claim 1 or 2, which is characterized in that
It is provided with laser jig plate in the precise temperature control slot, pin fixture, the laser are provided on the laser jig plate
Device is fixed on the laser jig plate by the pin fixture.
4. low-power semiconductor laser reliability Auto-Test System according to claim 3, which is characterized in that described
Pin fixture includes fixture cover, the pin elastic slice of pin for clamping the laser and for fixing the pin elastic slice
Fixed block.
5. low-power semiconductor laser reliability Auto-Test System described in any one of -4 according to claim 1,
It is characterized in that, heat-generating pipe is additionally provided in the precise temperature control slot, and the heat-generating pipe is installed on the laser jig plate, is used for
Heat the laser jig plate.
6. low-power semiconductor laser reliability Auto-Test System according to claim 5, which is characterized in that described
Laser jig plate includes upper fixture plate and lower press plate, the heat-generating pipe setting the upper fixture plate and lower press plate it
Between.
7. low-power semiconductor laser reliability Auto-Test System according to claim 5 or 6, which is characterized in that
The temperature control modules further include temperature controller, the temperature that the temperature controller is detected according to the hygrosensor,
Control the heating temperature of the heat-generating pipe.
8. low-power semiconductor laser reliability Auto-Test System according to any one of claims 1-7,
It is characterized in that, each laser is connected with a relay switch, and the energy supply control module is opened by controlling the relay
It closes to control to the independently-powered of each laser.
9. low-power semiconductor laser reliability Auto-Test System described in any one of -8 according to claim 1,
It is characterized in that, the electrical parameter of the electrical parameter collection plate acquisition includes voltage, electric current, power.
10. low-power semiconductor laser reliability Auto-Test System described in any one of -9 according to claim 1,
It being characterized in that, the optical detection module includes optical detector and photoelectric power collection plate, and the optical detector is used to receive laser,
The photoelectric power collection plate is used to acquire the power data of laser.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910124184.5A CN109798937A (en) | 2019-02-18 | 2019-02-18 | Low-power semiconductor laser reliability Auto-Test System |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910124184.5A CN109798937A (en) | 2019-02-18 | 2019-02-18 | Low-power semiconductor laser reliability Auto-Test System |
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| Publication Number | Publication Date |
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| CN109798937A true CN109798937A (en) | 2019-05-24 |
Family
ID=66560975
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| Application Number | Title | Priority Date | Filing Date |
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| CN201910124184.5A Withdrawn CN109798937A (en) | 2019-02-18 | 2019-02-18 | Low-power semiconductor laser reliability Auto-Test System |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111181632A (en) * | 2020-01-02 | 2020-05-19 | 武汉思博源科技有限公司 | Automatic test system of SFP optical module |
| CN112187356A (en) * | 2020-10-13 | 2021-01-05 | 速博通讯(山东)有限公司 | Automatic test system of SFP optical module |
| CN116577627A (en) * | 2023-07-14 | 2023-08-11 | 深圳市星汉激光科技股份有限公司 | Semiconductor laser reliability test method, system and medium |
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