CN111181632A - Automatic test system of SFP optical module - Google Patents
Automatic test system of SFP optical module Download PDFInfo
- Publication number
- CN111181632A CN111181632A CN202010002754.6A CN202010002754A CN111181632A CN 111181632 A CN111181632 A CN 111181632A CN 202010002754 A CN202010002754 A CN 202010002754A CN 111181632 A CN111181632 A CN 111181632A
- Authority
- CN
- China
- Prior art keywords
- module
- signal connection
- unit
- signal
- detection module
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/073—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an out-of-service signal
- H04B10/0731—Testing or characterisation of optical devices, e.g. amplifiers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D21/00—Measuring or testing not otherwise provided for
- G01D21/02—Measuring two or more variables by means not covered by a single other subclass
Abstract
The invention relates to the technical field of testing, in particular to an automatic testing system of an SFP optical module, wherein a controller is in signal connection with an editing module, a comparison unit, an aging unit and a testing unit, and the comparison unit is in signal connection with a database; the aging unit signal comprises a microcontroller in signal connection with a controller, the microcontroller is in signal connection with a temperature sensor, a humidity sensor and an execution module, the execution module is in signal connection with a heating module, a cooling module and a humidity adjusting module, and the heating module, the cooling module and the humidity adjusting module are controlled by the execution module to adjust the tested temperature and humidity; the test unit comprises a power detection module, an extinction ratio detection module, an eye pattern detection module, a sensitivity detection module, an overload detection module, a transmission detection module and a warning module. The invention has the advantages of carrying out aging simulation on the optical module and being beneficial to the accuracy of the test result.
Description
Technical Field
The invention relates to the technical field of testing, in particular to an automatic testing system of an SFP optical module.
Background
The SFP optical module is a hot-plug small-package module packaged by SFP, the highest speed can reach 10.3G at present, and an interface is LC. The SFP optical module is mainly composed of a laser. SFP classification can be classified into rate classification, wavelength classification, mode classification. When the SFP optical module is produced, the SFP optical module needs to be tested to ensure the quality of a product, and in the existing test, when the SFP optical module is tested, temperature simulation is performed when the SFP optical module is not operated, so that the product is tested, and the test result is inaccurate.
Disclosure of Invention
The invention aims to solve the defects in the prior art and provides an automatic test system for an SFP optical module.
In order to achieve the purpose, the invention adopts the following technical scheme:
designing an automatic test system of an SFP optical module, wherein a controller is in signal connection with an editing module, a comparison unit, an aging unit and a test unit, and the comparison unit is in signal connection with a database;
the aging unit signal comprises a microcontroller in signal connection with a controller, the microcontroller is in signal connection with a temperature sensor, a humidity sensor and an execution module, the execution module is in signal connection with a heating module, a cooling module and a humidity adjusting module, and the heating module, the cooling module and the humidity adjusting module are controlled by the execution module to adjust the tested temperature and humidity;
the test unit comprises a power detection module, an extinction ratio detection module, an eye pattern detection module, a sensitivity detection module, an overload detection module, a transmission detection module and a warning module, and is in signal connection with the controller.
Preferably, the comparison unit comprises an information reading module, the information reading module reads the production date, the model and the number of the SFP optical module, the information reading module is in signal connection with an inquiry module, the inquiry module is in signal connection with the database, the inquiry module is in signal connection with a storage module, the storage module is in signal connection with a comparison module, the storage module, the inquiry module and the information reading module are in signal connection with the controller, and preferably, the editing module comprises date input, model input and code input.
Preferably, the power detection module may be an optical power meter, the extinction ratio detection module may be an optical oscilloscope, and the sensitivity detection module may be an error code meter.
Preferably, the controller is in signal connection with a processing module, the processing module is in signal connection with a display module, and the display module is electrically connected with a power supply.
Preferably, the database is in signal connection with a checking unit, and the checking unit is electrically connected with the input module.
Preferably, the proofreading unit comprises a storage module, the storage module is in signal connection with an error detection module, the error detection module is in signal connection with a comparison module, the comparison module is in signal connection with a marking module, the marking module is in signal connection with a change module, the change module is in signal connection with an uploading module, and the storage module, the error detection module, the comparison module, the marking module, the change module and the uploading module are in signal connection with a microprocessor.
The automatic test system of the SFP optical module provided by the invention has the beneficial effects that: aging simulation when the aging unit carries out operating temperature on the optical module, and simultaneously, a plurality of items of the optical module are detected and controlled through the detection unit, so that the detection effect is improved, the accuracy of the detection result is facilitated, and the quality of the product is ensured.
Drawings
Fig. 1 is a system block diagram of an automated testing system for an SFP optical module according to the present invention;
FIG. 2 is a system block diagram of a comparison unit of an automated test system for an SFP optical module according to the present invention;
FIG. 3 is a system block diagram of a calibration unit of an automated test system for an SFP optical module according to the present invention;
fig. 4 is a system block diagram of an editing module of an automated testing system for an SFP optical module according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.
Example 1
Referring to fig. 1 and 4, an automated test system for an SFP optical module comprises a controller, and is characterized in that the controller is in signal connection with an editing module, a comparison unit, an aging unit and a test unit, the comparison unit is in signal connection with a database, and the editing module comprises date input, model input and code input;
the aging unit signal comprises a microcontroller in signal connection with a controller, the microcontroller is in signal connection with a temperature sensor, a humidity sensor and an execution module, the execution module is in signal connection with a heating module, a cooling module and a humidity adjusting module, the heating module, the cooling module and the humidity adjusting module are controlled by the execution module to adjust the temperature and the humidity of the test, the temperature of the optical module during working is heated by the heating module, the temperature is reduced by the cooling module, the humidity during working is adjusted by the humidity adjusting module, so that the environment of the heating module during working is simulated, and the humidity sensor and the temperature sensor achieve the purpose of monitoring the temperature in real time;
the test unit comprises a power detection module, an extinction ratio detection module, an eye pattern detection module, a sensitivity detection module, an overload detection module, a transmission detection module and a warning module, the power detection module can be specifically an optical power meter, the extinction ratio detection module can be specifically an optical oscillograph, the sensitivity detection module can be specifically an error code meter, various performances of the optical module under different temperatures and humidities are detected through the power detection module, the extinction ratio detection module, the eye pattern detection module, the sensitivity detection module, the overload detection module, the transmission detection module and the warning module, and then the comparison unit is used for comparing with data in a database, and testing the optical module to judge the qualification of the optical module.
When testing, the temperature of the optical module during operation is heated through the heating module, the temperature is reduced through the cooling module, the humidity of the during operation is adjusted through the humidity adjusting module, thereby the environment of the heating module during operation is simulated, the humidity sensor and the temperature sensor play the purpose of real-time monitoring to the temperature, each item performance under different temperatures and humidity is detected through the test unit, then the data in the comparison unit and the database are compared, thereby the optical module is tested, and the qualification of the optical module is judged.
Example 2
Referring to fig. 2, as another preferred embodiment of the present invention, the difference from embodiment 1 is that the comparison unit includes an information reading module, the information reading module reads the production date, model and number of the SFP optical module, the information reading module is in signal connection with an inquiry module, the inquiry module is in signal connection with the database, the inquiry module is in signal connection with a storage module, the storage module is in signal connection with a comparison module, the storage module, the inquiry module and the information reading module are in signal connection with the controller, the model of the optical module is read through the information reading module, then the inquiry module searches in the database according to the model and the temperature and humidity during aging, and then performs a comparison analysis through the comparison module.
Example 3
Referring to fig. 1, as another preferred embodiment of the present invention, the difference from embodiment 1 is that the controller is in signal connection with a processing module, the processing module is in signal connection with a display module, the display module is electrically connected with a power supply, and the display module is designed to facilitate displaying of test results and data.
Example 4
Referring to fig. 4, as another preferred embodiment of the present invention, the difference from embodiment 1 is that the database is in signal connection with a checking unit, the checking unit is electrically connected with an input module, the checking unit includes a storage module, the storage module is in signal connection with an error detection module, the error detection module is in signal connection with a comparison module, the comparison module is in signal connection with a marking module, the marking module is in signal connection with a modification module, the modification module is in signal connection with an upload module, the storage module, the error detection module, the comparison module, the marking module, the modification module and the upload module are in signal connection with a microprocessor, data in the database is expanded through the input module, when the data is expanded, the same information is input twice, the information contents of the two times are compared through the comparison module, and when the data is found to be different, different information is marked in a thickening mode through the marking module, then is changed through the changing module, and is uploaded to the database through the uploading module, and therefore accuracy of input information is guaranteed.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered to be within the technical scope of the present invention, and the technical solutions and the inventive concepts thereof according to the present invention should be equivalent or changed within the scope of the present invention.
Claims (7)
1. An automatic test system of an SFP optical module comprises a controller, and is characterized in that the controller is in signal connection with an editing module, a comparison unit, an aging unit and a test unit, and the comparison unit is in signal connection with a database;
the aging unit signal comprises a microcontroller in signal connection with a controller, the microcontroller is in signal connection with a temperature sensor, a humidity sensor and an execution module, the execution module is in signal connection with a heating module, a cooling module and a humidity adjusting module, and the heating module, the cooling module and the humidity adjusting module are controlled by the execution module to adjust the tested temperature and humidity;
the test unit comprises a power detection module, an extinction ratio detection module, an eye pattern detection module, a sensitivity detection module, an overload detection module, a transmission detection module and a warning module, and is in signal connection with the controller.
2. The automated test system of the SFP optical module as claimed in claim 1, wherein the comparison unit comprises an information reading module, the information reading module reads the production date, model and number of the SFP optical module, the information reading module is in signal connection with an inquiry module, the inquiry module is in signal connection with the database, the inquiry module is in signal connection with a storage module, the storage module is in signal connection with a comparison module, and the comparison module, the storage module, the inquiry module and the information reading module are in signal connection with the controller.
3. The automated test system for the SFP optical module as claimed in claim 1, wherein the editing module comprises a date input, a model input, and a code input.
4. The system of claim 1, wherein the power detection module is an optical power meter, the extinction ratio detection module is an optical oscilloscope, and the sensitivity detection module is an error detector.
5. The automated test system of the SFP optical module as claimed in claim 1, wherein the controller is connected with a processing module through signals, the processing module is connected with a display module through signals, and the display module is electrically connected with a power supply.
6. The automated test system of an SFP optical module of claim 1, wherein the database is in signal connection with a calibration unit, and the calibration unit is electrically connected with an input module.
7. The automated test system of the SFP optical module as claimed in claim 6, wherein the calibration unit comprises a storage module, the storage module is connected with an error detection module by a signal, the error detection module is connected with a comparison module by a signal, the comparison module is connected with a marking module by a signal, the marking module is connected with a change module by a signal, the change module is connected with an upload module by a signal, and the storage module, the error detection module, the comparison module, the marking module, the change module and the upload module are connected with a microprocessor by signals.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010002754.6A CN111181632A (en) | 2020-01-02 | 2020-01-02 | Automatic test system of SFP optical module |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010002754.6A CN111181632A (en) | 2020-01-02 | 2020-01-02 | Automatic test system of SFP optical module |
Publications (1)
Publication Number | Publication Date |
---|---|
CN111181632A true CN111181632A (en) | 2020-05-19 |
Family
ID=70657772
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202010002754.6A Pending CN111181632A (en) | 2020-01-02 | 2020-01-02 | Automatic test system of SFP optical module |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN111181632A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112187356A (en) * | 2020-10-13 | 2021-01-05 | 速博通讯(山东)有限公司 | Automatic test system of SFP optical module |
CN113740977A (en) * | 2020-05-29 | 2021-12-03 | 瞻博网络公司 | Optoelectronic device using hybrid automated test equipment |
WO2022067579A1 (en) * | 2020-09-29 | 2022-04-07 | 华为技术有限公司 | Optical module test structure and apparatus |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103001693A (en) * | 2012-12-25 | 2013-03-27 | 索尔思光电(成都)有限公司 | Light module test method |
CN203721160U (en) * | 2013-12-31 | 2014-07-16 | 工业和信息化部电子第五研究所 | OLED module aging service life test system |
CN104198861A (en) * | 2014-09-13 | 2014-12-10 | 安徽鑫龙电器股份有限公司 | Electronics ageing test system |
CN106341183A (en) * | 2016-11-11 | 2017-01-18 | 济南浪潮高新科技投资发展有限公司 | Method for monitoring optical module by netmanager software |
CN109000734A (en) * | 2018-08-18 | 2018-12-14 | 成都飞机工业(集团)有限责任公司 | The method of real-time monitoring optical module working condition ageing process |
CN109039451A (en) * | 2018-09-18 | 2018-12-18 | 武汉恒泰通技术有限公司 | A kind of optical module monitoring system |
CN109798937A (en) * | 2019-02-18 | 2019-05-24 | 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) | Low-power semiconductor laser reliability Auto-Test System |
CN110611533A (en) * | 2019-09-24 | 2019-12-24 | 四川天邑康和通信股份有限公司 | Method for filtering defective optical modules of ONU (optical network Unit) in production line |
-
2020
- 2020-01-02 CN CN202010002754.6A patent/CN111181632A/en active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103001693A (en) * | 2012-12-25 | 2013-03-27 | 索尔思光电(成都)有限公司 | Light module test method |
CN203721160U (en) * | 2013-12-31 | 2014-07-16 | 工业和信息化部电子第五研究所 | OLED module aging service life test system |
CN104198861A (en) * | 2014-09-13 | 2014-12-10 | 安徽鑫龙电器股份有限公司 | Electronics ageing test system |
CN106341183A (en) * | 2016-11-11 | 2017-01-18 | 济南浪潮高新科技投资发展有限公司 | Method for monitoring optical module by netmanager software |
CN109000734A (en) * | 2018-08-18 | 2018-12-14 | 成都飞机工业(集团)有限责任公司 | The method of real-time monitoring optical module working condition ageing process |
CN109039451A (en) * | 2018-09-18 | 2018-12-18 | 武汉恒泰通技术有限公司 | A kind of optical module monitoring system |
CN109798937A (en) * | 2019-02-18 | 2019-05-24 | 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) | Low-power semiconductor laser reliability Auto-Test System |
CN110611533A (en) * | 2019-09-24 | 2019-12-24 | 四川天邑康和通信股份有限公司 | Method for filtering defective optical modules of ONU (optical network Unit) in production line |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113740977A (en) * | 2020-05-29 | 2021-12-03 | 瞻博网络公司 | Optoelectronic device using hybrid automated test equipment |
WO2022067579A1 (en) * | 2020-09-29 | 2022-04-07 | 华为技术有限公司 | Optical module test structure and apparatus |
CN112187356A (en) * | 2020-10-13 | 2021-01-05 | 速博通讯(山东)有限公司 | Automatic test system of SFP optical module |
CN112187356B (en) * | 2020-10-13 | 2021-11-30 | 速博通讯(山东)有限公司 | Automatic test system of SFP optical module |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN111181632A (en) | Automatic test system of SFP optical module | |
CN109927933B (en) | Unmanned aerial vehicle steering engine automatic test system | |
CN108037444B (en) | GNSS PCBA automatic test system and application method thereof | |
CN103149527A (en) | Printed circuit board (PCB) detecting device and corresponding method | |
CN210108419U (en) | Equipment and system for automatic comprehensive test and aging of laser | |
CN110186516A (en) | A kind of equipment, system and method for the test of laser automatic Synthesis and aging | |
CN104459588A (en) | System and method for current sensor test | |
CN100449302C (en) | Quickly non-demage discriminating method and device for marked wine year of bottled yellow rice or millet wine | |
CN201653450U (en) | Digital display meter automatic calibration device based on machine vision | |
CN103604453B (en) | Multipurpose test system for CVT change speed gear box | |
CN116125242A (en) | Object detection method and system | |
CN103697930A (en) | Intelligent detection device and detection method for HART instrument aging test | |
CN102539113A (en) | BOTDA curve analysis method based on brillouin time domain analyzer | |
CN103412256A (en) | Membrane switch AOI detector and membrane switch AOI detection method | |
CN107907764B (en) | Detection method and system suitable for intelligent characteristic verification of intelligent instrument | |
CN115733543A (en) | Optical module firmware time sequence test platform and test method | |
CN112781623A (en) | Optical fiber gyroscope state detection and test system | |
CN107192692A (en) | Mistake proofing detection method for structural member assembly in automobile, machinery or household appliances manufacturing | |
CN109522167B (en) | Air detector product testing device and testing method | |
CN201653544U (en) | Laser ageing detection device | |
CN208283349U (en) | A kind of titration outfit of pin-point reading | |
CN109186940B (en) | Monitoring method and monitoring device for testing precision | |
CN109633208A (en) | Air velocity transducer quality determining method and device | |
CN110411657A (en) | A kind of intelligent pressure transmitter verification system | |
CN214173386U (en) | Optical fiber gyroscope state detection and test system |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
RJ01 | Rejection of invention patent application after publication | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20200519 |