CN109684734A - A kind of method of inspection model matrix - Google Patents
A kind of method of inspection model matrix Download PDFInfo
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- CN109684734A CN109684734A CN201811600971.4A CN201811600971A CN109684734A CN 109684734 A CN109684734 A CN 109684734A CN 201811600971 A CN201811600971 A CN 201811600971A CN 109684734 A CN109684734 A CN 109684734A
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- G06F30/30—Circuit design
- G06F30/36—Circuit design at the analogue level
- G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods
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Abstract
A kind of method of inspection model matrix, comprising the following steps: carry out circuit simulation, collect the node of iteration difficulty；The device connected on the node of convergence difficulties is searched according to circuit network topology；Matrix checking is carried out to the device found；Provide testing result information.The method of inspection model matrix of the present invention, the correctness of device model Jacobian matrix element is carried out checking judgement during integrated circuit simulating using the matrix checking for including forward difference inspection, centered difference inspection and Jason Richardson's extrapolation inspection and provides location of mistake, that is whether the Jacobian matrix of dynamic chek system of linear equations and right-hand vector matches, so that it is guaranteed that the correctness solved, improves simulation efficiency.
Description
Technical field
The present invention relates to integrated circuit simulating software fields.In particular to a kind of method of inspection model matrix.
Background technique
With the development of IC industry, electronic circuit scale is increasing, to the simulation velocity of circuit simulating software
It is also higher and higher with the requirement of simulation accuracy.Circuit simulating software is mainly simulation circuit structure, and physical problem is converted to number
Knowledge topic establishes correlation model and equation group and carries out analytical calculation using computer and acquires solution of equations come analog circuit spy
Property.It is to guarantee the key factor of simulation result correctness that Nonlinear System of Equations is accurately solved during circuit simulation.Most often
The method for solving Nonlinear System of Equations is Newton iteration method, will solve the transformation of Nonlinear System of Equations problem in an iterative process
The problem of at system of linear equations is solved.It solves system of linear equations and relies primarily on Jacobian matrix and corresponding right-hand vector.If refined
It is mismatched than matrix and right-hand vector, Newton iteration meeting convergence difficulties, the number of iterations increases, the serious solution that will lead to after convergence
As a result mistake or do not restrain, eventually lead to emulation failure.So the correctness of Jacobian matrix is extremely important.
In order to guarantee the correctness of Jacobian matrix, the invention proposes a kind of fast automatic inspection methods of dynamic.We
Method can automaticly inspect the correctness of the Jacobian matrix of device model during circuit simulation, and automatic report check is as a result, fixed
The incorrect Jacobian matrix element position in position, convenient for amendment Jacobian matrix element in time, for the essence for improving solving equations
Degree and efficiency provide safeguard.
Summary of the invention
In order to solve the shortcomings of the prior art, the purpose of the present invention is to provide a kind of sides of inspection model matrix
Method carries out the correctness of device model Jacobian matrix element during integrated circuit simulating to check judgement and to making mistake
Whether positioning, the i.e. Jacobian matrix of dynamic chek system of linear equations and right-hand vector match, so that it is guaranteed that the correctness solved, mentions
High simulation efficiency.
To achieve the above object, the method for inspection model matrix provided by the invention, comprising the following steps:
1) circuit simulation is carried out, the node of iteration difficulty is collected；
2) device connected on the node of convergence difficulties is found according to circuit network topology；
3) matrix checking is carried out to the device found；
4) testing result information is provided.
Further, the step 1) further comprises:
If iteration result is that solution does not restrain, node is sorted according to voltage difference；
If iteration result is that right-hand vector does not restrain, sort according to right-hand vector；
The node that X nodes are checked as needs before coming；
Wherein, X is positive integer.
Further, the matrix checking, including forward difference inspection, centered difference inspection and Jason Richardson extrapolate and examine
It looks into.
Further, the forward difference inspection the following steps are included:
It calculates the numerical solution of conductance: calculating the branch voltage of the branch voltage drop and preceding iteration step of current iteration step first
The poor del_v of drop, then with current iteration walk branch current and preceding iteration walk branch current difference divided by del_v, obtain
The numerical solution con_value of conductance；
It calculates the numerical solution of capacitor: calculating the branch voltage of the branch voltage drop and preceding iteration step of current iteration step first
The poor del_v of drop, then with current iteration walk branch charge and preceding iteration walk branch charge difference divided by del_v, obtain
The numerical solution cap_value of capacitor；
It checks conductance correctness: the numerical solution con_value of conductance is compared with the corresponding conductance in device Jacobian matrix
Compared with the poor con_del of the two if the tolerance tol for having exceeded permission if made marks；
It checks capacitor correctness: the numerical solution cap_value of capacitor is compared with the corresponding capacitor in device Jacobian matrix
Compared with the poor cap_del of the two if the tolerance tol for having exceeded permission if made marks；
If difference in conductances con_del and capacitance difference cap_del are both less than tolerance tol, testing result information can be directly given；
If having one in difference in conductances con_del and capacitance difference cap_del not less than tolerance tol, centered difference detection is carried out.
Further, the centered difference inspection the following steps are included:
It calculates the numerical solution of conductance: calculating the branch voltage of the branch voltage drop and preceding iteration step of current iteration step first
The poor del_v of drop, then removed with the difference of the branch current of current iteration step back and the current iteration branch current that walks latter step
With 2 times of del_v, the numerical solution con_value_2 of conductance is obtained；
It calculates the numerical solution of capacitor: walking the branch electricity of latter step with the branch charge of current iteration step back and current iteration
The difference of lotus obtains the numerical solution cap_value_2 of capacitor divided by 2 times of del_v；
It checks conductance correctness: the numerical solution con_value_2 of conductance is carried out with the corresponding conductance in device Jacobian matrix
Compare, if the poor con_del_2 of the two has exceeded the tolerance tol of permission, just does a label；
It checks capacitor correctness: the numerical solution cap_value_2 of capacitor is carried out with the corresponding capacitor in device Jacobian matrix
Compare, the poor cap_del_2 of the two if the tolerance tol for having exceeded permission if made marks；
If difference in conductances con_del_2 and capacitance difference cap_del_2 are both less than tolerance tol, testing result can be directly given
Information；If having one in difference in conductances con_del_2 and capacitance difference cap_del_2 not less than tolerance tol, Jason Richardson is carried out
Extrapolation checks.
Further, the Jason Richardson extrapolate check the following steps are included:
It calculates the numerical solution of conductance: calculating the branch voltage of the branch voltage drop and preceding iteration step of current iteration step first
The poor del_v of drop, then calculate current iteration step back branch current and current iteration walk latter step branch current it
Difference obtains first item D0, then the branch current with current iteration step first two steps and two steps after current iteration step divided by 2 times of del_v
The difference of branch current obtain D1 divided by 4 times of del_v, obtain high-precision conductance divided by 4 with the difference that 4 times of D0 subtracts D1
Numerical solution con_value_3；
It calculates the numerical solution of capacitor: walking the branch electricity of latter step with the branch charge of current iteration step back and current iteration
The difference of lotus obtains first item C_D0, then branch charge and current iteration with current iteration step first two steps divided by 2 times of del_v
The difference of the branch charge of two steps obtains C_D1 divided by 4 times of del_v after step, is obtained with the difference that 4 times of C_D0 subtracts C_D1 divided by 4
The numerical solution cap_value_3 of capacitor；
Check conductance correctness: by the numerical solution con_value_3 of conductance and device model fill out the corresponding conductance in matrix into
Row compares, if the poor con_del_3 of the two has exceeded the tolerance of permission, just does a label；
It checks capacitor correctness: the numerical solution cap_value3 of capacitor being filled out into the corresponding capacitor in matrix with device model and is carried out
Compare, if the poor cap_del_3 of the two has exceeded the tolerance of permission, just do a label, finally according to marker for judgment is refined can
It whether wrong is filled in than matrix, then quotes corresponding inspection result；
It whether wrong and quote corresponding information is filled according to marker for judgment matrix.
Further, matrix checking described in step 2, when being connected to the node that different needs check to the same device,
Rechecking no longer is carried out to the device checked.
Further, the step 2 further comprises,
During carrying out matrix checking, the linear node of device inside is filtered out, only checks non-linear node；
When device model is established, linear node is first determined according to the physical characteristic of model, is made marks to linear node, in matrix
It is distinguished and whether is checked by marking when inspection.
Further, matrix check described in step 2, check object are the nonzero element in Jacobian matrix.
To achieve the above object, the present invention also provides a kind of computer readable storage mediums, are stored thereon with computer and refer to
The step of order, the computer instruction executes the method for above-mentioned inspection model matrix when running.
It can find that model matrix fills in Problem-Error in the present invention during circuit simulation, it is correct to improve model matrix
Property, and then the number of iterations of solving equations is reduced, improve simulation efficiency and simulation accuracy.
Other features and advantages of the present invention will be illustrated in the following description, also, partly becomes from specification
It obtains it is clear that understand through the implementation of the invention.
Detailed description of the invention
Attached drawing is used to provide further understanding of the present invention, and constitutes part of specification, and with it is of the invention
Embodiment together, is used to explain the present invention, and is not construed as limiting the invention.In the accompanying drawings:
Fig. 1 is the flow chart of the method for inspection model matrix according to the present invention.
Specific embodiment
Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings, it should be understood that preferred reality described herein
Apply example only for the purpose of illustrating and explaining the present invention and is not intended to limit the present invention.
Fig. 1 is the flow chart of the method for inspection model matrix according to the present invention, below with reference to Fig. 1, to of the invention
The method of inspection model matrix is described in detail.
Firstly, carrying out circuit simulation in step 101, the node of iteration difficulty is collected.
When solving large-scale circuit, when Newton iteration walks abnormal increase, the node for causing convergence difficulties is found, if
It is that solution (solution) does not restrain, node (node) is sorted according to voltage difference (deltaV)；If right-hand vector (residue) is no
Convergence, sorts according to residue.The node that X nodes are checked as needs before coming, wherein X takes just whole according to demand
Number.
Electric current, charge and voltage difference that current iteration walks back and latter step are stored in simulation process, are convenient for
Extrapolate the number of conductance and capacitor when matrix checking (matrix check) by numerical analysis method according to stored data
Value solution, does not need the value for computing repeatedly electric current and charge, it is possible to reduce calculation amount saves the time.
In step 102, the device connected on the node of convergence difficulties is found according to circuit network topology.
In this step, by the topological relation of search circuit network, the device being connected with the node that needs check is found
Part carries out matrix check to these device model matrixes in the next steps, and the device checked is marked.It is right
When the same device is connected to the node that different needs check, rechecking no longer is carried out to the device checked.In this way may be used
To reduce the device number checked, shorten the review time.
During carrying out matrix check, needs to filter out the linear node of device inside, only check non-linear section
Point significantly reduces and checks number.When device model is established, linear node is first determined according to the physical characteristic of model, to linear
Node makes marks.Distinguish whether detected (check) by marking in matrix check.
In step 103, matrix check is carried out to the device found.
Matrix check in the present invention mainly includes three kinds of inspections, respectively forward difference inspection, equation of the ecentre sorting
It looks into extrapolate with Jason Richardson and check.
In this step, to the device found, successively point situation carries out forward difference inspection, centered difference inspection and reason
Cha Desen extrapolation checks.
Usually, if necessary to check n tie up matrix, each element in matrix need to be checked, i.e., to carry out n ×
N times matrix check.Only the nonzero element in Jacobian matrix is checked in the present invention.Before being checked, to refined
Inspection is made than element all in matrix, if element value is 0, without matrix check.It can reduce in this way
Calculation times improve and check efficiency.
Firstly, carrying out forward difference inspection to the device found.The present invention utilizes the forward difference method in numerical analysis
The numerical solution for extrapolating conductance and capacitor is compared, the difference of the two with the value actually inserted in the numerical solution and Jacobian matrix
Then think that Jacobian matrix fills in mistake greater than tolerance.Specific step is as follows:
1) it calculates the numerical solution of conductance: calculating the branch voltage drop of current iteration step and the branch electricity of preceding iteration step first
The poor del_v of pressure drop, then with current iteration walk branch current and preceding iteration walk branch current difference divided by del_v, obtain
To the numerical solution con_value of conductance；
2) it calculates the numerical solution of capacitor: calculating the branch voltage drop of current iteration step and the branch electricity of preceding iteration step first
The poor del_v of pressure drop, then with current iteration walk branch charge and preceding iteration walk branch charge difference divided by del_v, obtain
To the numerical solution cap_value of capacitor；
3) it checks conductance correctness: the numerical solution con_value of conductance is carried out with the corresponding conductance in device Jacobian matrix
Compare, the poor con_del of the two if the tolerance tol for having exceeded permission if made marks.
4) capacitor correctness is checked: by the numerical solution cap_value of capacitor and the corresponding capacitor in device Jacobian matrix
It is compared, the poor cap_del of the two if the tolerance tol for having exceeded permission if made marks.
5) it whether wrong and quote corresponding information is filled according to marker for judgment Jacobian matrix.
If difference in conductances con_del and capacitance difference cap_del are both less than tolerance tol, step 104 can be carried out, is provided
Testing result information is quoted matrix and is filled in correctly, and exits；If having one in difference in conductances con_del and capacitance difference cap_del
Not less than tolerance tol, then next step centered difference detection is carried out.
Centered difference detection of the invention is the number that conductance and capacitor are extrapolated using the central difference method in numerical analysis
Value solution, is compared with the value actually inserted in the numerical solution and Jacobian matrix, and the difference of the two is greater than tolerance and then thinks Jacobean matrix
Battle array fills in mistake.Specific step is as follows:
1) it calculates the numerical solution of conductance: calculating the branch voltage drop of current iteration step and the branch electricity of preceding iteration step first
The poor del_v of pressure drop, then with current iteration step back branch current and current iteration walk latter step branch current difference
Divided by 2 times of del_v, the numerical solution con_value_2 of conductance is obtained；
2) it calculates the numerical solution of capacitor: walking the branch of latter step with the branch charge of current iteration step back and current iteration
The difference of charge obtains the numerical solution cap_value_2 of capacitor divided by 2 times of del_v；
3) check conductance correctness: by the numerical solution con_value_2 of conductance and the corresponding conductance in device Jacobian matrix into
Row compares, if the poor con_del_2 of the two has exceeded the tolerance tol of permission, just does a label.
4) capacitor correctness is checked: by the numerical solution cap_value_2 of capacitor electricity corresponding with device Jacobian matrix
Appearance is compared, and the poor cap_del_2 of the two if the tolerance tol for having exceeded permission if made marks.
If difference in conductances con_del_2 and capacitance difference cap_del_2 are both less than tolerance tol, step 104 can be carried out,
Testing result information is provided, matrix is quoted and fills in correctly, and exit；If difference in conductances con_del_2 and capacitance difference cap_del_2
In have one not less than tolerance tol, then carry out next step Jason Richardson and extrapolate to check.
Jason Richardson of the invention extrapolate check be extrapolated using Jason Richardson's extrapolation of numerical analysis it is high-precision
The numerical solution of conductance and capacitor, then compared with the value inserted in the numerical solution and Jacobian matrix, the difference of the two, which is greater than, to be held
It is poor then think that Jacobian matrix fills in mistake.Specific step is as follows:
1) it calculates the numerical solution of conductance: calculating the branch voltage drop of current iteration step and the branch electricity of preceding iteration step first
The poor del_v of pressure drop, then calculate the branch current of current iteration step back and current iteration walks the branch current of latter step
Difference obtain first item D0 divided by 2 times of del_v, then with after the branch current and current iteration step of current iteration step first two steps two
The difference of the branch current of step obtains D1 divided by 4 times of del_v, obtains high-precision conductance divided by 4 with the difference that 4 times of D0 subtracts D1
Numerical solution con_value_3；
2) it calculates the numerical solution of capacitor: walking the branch of latter step with the branch charge of current iteration step back and current iteration
The difference of charge obtains first item C_D0, then changed with current with the branch charge of current iteration step first two steps divided by 2 times of del_v
The difference of the branch charge of two steps obtains C_D1 divided by 4 times of del_v after riding instead of walk, is obtained with the difference that 4 times of C_D0 subtracts C_D1 divided by 4
To the numerical solution cap_value_3 of capacitor；
3) it checks conductance correctness: the numerical solution con_value_3 of conductance is filled out with device model to the corresponding conductance in matrix
It is compared, if the poor con_del_3 of the two has exceeded the tolerance of permission, just does a label.
4) it checks capacitor correctness: the numerical solution cap_value3 of capacitor and device model being filled out corresponding electric in matrix
Appearance is compared, if the poor cap_del_3 of the two has exceeded the tolerance of permission, just does a label.Finally sentenced according to label
Whether disconnected Jacobian matrix is filled in wrong, then quotes corresponding inspection result.
3) and 4) 5) whether wrong and quote corresponding information filled according to the marker for judgment matrix in.
Entire checking process carries out automatically during circuit simulation, and quotes device model Jacobean matrix array element automatically
Element fills in the specifying information of mistake.
In step 104, testing result information is provided.
In this step, whether contrast number solution and Jacobian matrix entry value are less than tolerance, issue final inspection report
It accuses.
During entire circuit simulation, when each Newton iteration, successively carries out three of the above inspection and quotes inspection knot
Fruit, if the inspection of front passes through, without subsequent inspection.It is modified Jacobian matrix element according to inspection result,
To improve the correctness for the Jacobian matrix filled in, and then the number of iterations of reduction solving equations, raising simulation efficiency.
The forward difference inspection technique utilized in the present invention, calculating speed is fast, the simulation process suitable for large-scale circuit
It checks；Centered difference inspection technique, computational accuracy is higher, and calculating speed is slightly slower than forward difference inspection technique；Jason Richardson, which extrapolates, to be examined
Cha Fa, computational accuracy highest, calculating speed are fast not as good as forward difference inspection technique and centered difference inspection technique.The present invention sufficiently combines
Three kinds of inspection methods, the inspection result obtained finally provide Jacobian matrix inspection result information.
Specifically, the advantage of the invention is that the following aspects:
First, quickly find the node for causing convergence difficulties.According to ranking and searching the reason of convergence difficulties.
Second, to the device for having carried out matrix check, the time is saved in not rechecking.
Third only checks the non-linear node of device inside, reduces and checks number.
4th, matrix check only is carried out to nonzero element, improves and checks efficiency.
5th, matrix check can be checked step by step, from simple to complex, reduce unnecessary calculating.
6th, the speed of solving equations can be improved using method of the invention: Jacobian matrix, which fills in mistake, to be increased
Add the number of iterations of solving equations, this will restrict the simulation velocity of circuit.The present invention checks Jacobean matrix in simulation process
The correctness of battle array, provides fabric error message, fills in problem convenient for quickly positioning Jacobian matrix, improves Jacobian matrix essence
Degree, and then improve solving equations speed.
7th, the reliability of simulation result can be improved using method of the invention: the mistake letter quoted according to the present invention
Breath, corrects the Jacobian matrix of device model, solving equations precision can be improved, improve the accuracy of simulation result.
The present invention also provides a kind of computer readable storage mediums, are stored thereon with computer instruction, the computer
The step of executing the method for above-mentioned inspection model matrix when instruction operation, the method for the inspection model matrix is referring to aforementioned portion
The introduction divided, repeats no more.
Those of ordinary skill in the art will appreciate that: the foregoing is only a preferred embodiment of the present invention, and does not have to
In the limitation present invention, although the present invention is described in detail referring to the foregoing embodiments, for those skilled in the art
For, still can to foregoing embodiments record technical solution modify, or to part of technical characteristic into
Row equivalent replacement.All within the spirits and principles of the present invention, any modification, equivalent replacement, improvement and so on should all include
Within protection scope of the present invention.
Claims (10)
1. a kind of method of inspection model matrix, which comprises the following steps:
1) circuit simulation is carried out, the node of iteration difficulty is collected；
2) device connected on the node of convergence difficulties is searched according to circuit network topology；
3) matrix checking is carried out to the device found；
4) testing result information is provided.
2. the method for inspection model matrix according to claim 1, which is characterized in that the step 1) further comprises:
If iteration result is that solution does not restrain, node is sorted according to voltage difference；
If iteration result is that right-hand vector does not restrain, sort according to right-hand vector；
The node that X nodes are checked as needs before coming；
Wherein, X is positive integer.
3. the method for inspection model matrix according to claim 1, which is characterized in that the matrix checking, including forward
Difference inspection, centered difference inspection and Jason Richardson, which extrapolate, to be checked.
4. the method for inspection model matrix according to claim 3, which is characterized in that the forward difference inspection include with
Lower step:
It calculates the numerical solution of conductance: calculating the branch voltage of the branch voltage drop and preceding iteration step of current iteration step first
The poor del_v of drop, then with current iteration walk branch current and preceding iteration walk branch current difference divided by del_v, obtain
The numerical solution con_value of conductance；
It calculates the numerical solution of capacitor: calculating the branch voltage of the branch voltage drop and preceding iteration step of current iteration step first
The poor del_v of drop, then with current iteration walk branch charge and preceding iteration walk branch charge difference divided by del_v, obtain
The numerical solution cap_value of capacitor；
It checks conductance correctness: the numerical solution con_value of conductance is compared with the corresponding conductance in device Jacobian matrix
Compared with the poor con_del of the two if the tolerance tol for having exceeded permission if made marks；
It checks capacitor correctness: the numerical solution cap_value of capacitor is compared with the corresponding capacitor in device Jacobian matrix
Compared with the poor cap_del of the two if the tolerance tol for having exceeded permission if made marks；
If difference in conductances con_del and capacitance difference cap_del are both less than tolerance tol, testing result information can be directly given；
If having one in difference in conductances con_del and capacitance difference cap_del not less than tolerance tol, centered difference detection is carried out.
5. the method for inspection model matrix according to claim 3, which is characterized in that the centered difference inspection include with
Lower step:
It calculates the numerical solution of conductance: calculating the branch voltage of the branch voltage drop and preceding iteration step of current iteration step first
The poor del_v of drop, then removed with the difference of the branch current of current iteration step back and the current iteration branch current that walks latter step
With 2 times of del_v, the numerical solution con_value_2 of conductance is obtained；
It calculates the numerical solution of capacitor: walking the branch electricity of latter step with the branch charge of current iteration step back and current iteration
The difference of lotus obtains the numerical solution cap_value_2 of capacitor divided by 2 times of del_v；
It checks conductance correctness: the numerical solution con_value_2 of conductance is carried out with the corresponding conductance in device Jacobian matrix
Compare, if the poor con_del_2 of the two has exceeded the tolerance tol of permission, just does a label；
It checks capacitor correctness: the numerical solution cap_value_2 of capacitor is carried out with the corresponding capacitor in device Jacobian matrix
Compare, the poor cap_del_2 of the two if the tolerance tol for having exceeded permission if made marks；
If difference in conductances con_del_2 and capacitance difference cap_del_2 are both less than tolerance tol, testing result can be directly given
Information；If having one in difference in conductances con_del_2 and capacitance difference cap_del_2 not less than tolerance tol, Jason Richardson is carried out
Extrapolation checks.
6. the method for inspection model matrix according to claim 3, which is characterized in that the Jason Richardson, which extrapolates, checks packet
Include following steps:
It calculates the numerical solution of conductance: calculating the branch voltage of the branch voltage drop and preceding iteration step of current iteration step first
The poor del_v of drop, then calculate current iteration step back branch current and current iteration walk latter step branch current it
Difference obtains first item D0, then the branch current with current iteration step first two steps and two steps after current iteration step divided by 2 times of del_v
The difference of branch current obtain D1 divided by 4 times of del_v, obtain high-precision conductance divided by 4 with the difference that 4 times of D0 subtracts D1
Numerical solution con_value_3；
It calculates the numerical solution of capacitor: walking the branch electricity of latter step with the branch charge of current iteration step back and current iteration
The difference of lotus obtains first item C_D0, then branch charge and current iteration with current iteration step first two steps divided by 2 times of del_v
The difference of the branch charge of two steps obtains C_D1 divided by 4 times of del_v after step, is obtained with the difference that 4 times of C_D0 subtracts C_D1 divided by 4
The numerical solution cap_value_3 of capacitor；
Check conductance correctness: by the numerical solution con_value_3 of conductance and device model fill out the corresponding conductance in matrix into
Row compares, if the poor con_del_3 of the two has exceeded the tolerance of permission, just does a label；
It checks capacitor correctness: the numerical solution cap_value3 of capacitor being filled out into the corresponding capacitor in matrix with device model and is carried out
Compare, if the poor cap_del_3 of the two has exceeded the tolerance of permission, just do a label, finally according to marker for judgment is refined can
It whether wrong is filled in than matrix, then quotes corresponding inspection result；
It whether wrong and quote corresponding information is filled according to marker for judgment matrix.
7. the method for inspection model matrix according to claim 1, which is characterized in that be connected to difference to the same device
Needs check node when, rechecking no longer is carried out to the device that checked.
8. the method for inspection model matrix according to claim 1, which is characterized in that the step 2 further comprises,
During carrying out matrix checking, the linear node of device inside is filtered out, only checks non-linear node；
When device model is established, linear node is first determined according to the physical characteristic of model, is made marks to linear node, in matrix
It is distinguished and whether is detected by marking when inspection.
9. the method for inspection model matrix according to claim 1, which is characterized in that matrix checking described in step 2,
Check object is the nonzero element in Jacobian matrix.
10. a kind of computer readable storage medium, is stored thereon with computer instruction, which is characterized in that the computer instruction
Perform claim requires the step of method of 1 to 9 described in any item inspection model matrixes when operation.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN112861461A (en) * | 2021-03-05 | 2021-05-28 | 北京华大九天科技股份有限公司 | Abnormity detection method and device for circuit simulation model |
| CN113128157A (en) * | 2021-04-22 | 2021-07-16 | 北京华大九天科技股份有限公司 | Method and device for solving high-impedance node non-convergence in analog circuit simulation |
| CN113255268A (en) * | 2021-05-21 | 2021-08-13 | 北京华大九天科技股份有限公司 | Method for detecting and repairing transient analysis non-convergence in circuit simulation |
| CN113283133A (en) * | 2021-05-17 | 2021-08-20 | 杜玉玲 | Sensor grid discretization error evaluation method based on ANSYS software |
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| CN113283133B (en) * | 2021-05-17 | 2023-12-08 | 杜玉玲 | Sensor grid discretization error assessment method based on ANSYS software |
| CN113255268A (en) * | 2021-05-21 | 2021-08-13 | 北京华大九天科技股份有限公司 | Method for detecting and repairing transient analysis non-convergence in circuit simulation |
| CN113255268B (en) * | 2021-05-21 | 2022-05-24 | 北京华大九天科技股份有限公司 | Method for detecting and repairing transient analysis non-convergence in circuit simulation |
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