CN106528722A - Method and system for consistency testing of equipment data models of intelligent electronic device - Google Patents
Method and system for consistency testing of equipment data models of intelligent electronic device Download PDFInfo
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- CN106528722A CN106528722A CN201610954703.7A CN201610954703A CN106528722A CN 106528722 A CN106528722 A CN 106528722A CN 201610954703 A CN201610954703 A CN 201610954703A CN 106528722 A CN106528722 A CN 106528722A
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Abstract
The invention discloses a method and a system for consistency testing of equipment data models of an intelligent electronic device. The system comprises an SCD analysis module, an MMS communication module and a model consistency testing module. Equipment data model information of an IED device and equipment data model information of a tested device are both organized according to logic equipment information, data set information and data object information in order to be closer to classification of actual scenes, so that the accuracy of testing is improved and the method and the device have very strong practical value.
Description
Technical field
The present invention relates to the conformance test method and system of intelligent electronic device device data model.
Background technology
It is comprehensive with domestic intelligent substation new technology, international standard, power industry standard and electric power enterprise standard
Development, the popularization construction of intelligent substation is also like a raging fire, becomes transformer station's pattern of current main flow, is the weight of intelligent grid
Want part and key node.Wherein, whole station SCD file is very crucial in the popularization of intelligent substation is built, and it describes
Whole station all devices, and the device configuration information described in device data model is the base for correctly configuring whole station SCD file
Plinth.Therefore, Substation IED appliance arrangement data model uniformity test is one of key project of intelligent substation test.When
Front intelligent substation test develops towards the direction of high efficiency, automation, whole station, not only carries out monomer to each IED in station
Functional test, and the SCD file detection at whole station, empty terminal test are designed, but do not relate to IED appliance arrangement data models
Uniformity test.Auto-Test System parses the device data model file of each IED file, whole link from SCD file
The correctness of middle device data model needs calibrating, and the correctness of device data model that system is read from tested IED devices
It is also required to calibrating.Therefore, it is necessary to the IED device datas model after SCD file parsing and the equipment read from tested device
Data model carries out uniformity comparison test, with avoid because both models are inconsistent cause it is whole station test occur communication failure or
Data correspondence mistake.
The content of the invention
Goal of the invention：It is an object of the invention to provide a kind of smart electronicses that can solve the problem that defect present in prior art
The conformance test method and system of appliance arrangement data model.
Technical scheme：The conformance test method of intelligent electronic device device data model of the present invention, including with
Lower step：
S1：The SCD file at the whole station of transformer station is read and parsed, all IED devices in SCD file is traveled through, is generated each
The device data model file of IED devices, saves as the first device data model file；The device data mould of the IED devices
The type document definition device data model information of IED devices, the device data model information of IED devices logically equipment letter
The tree of breath, data set information and data object information is organized；
S2：Concrete tested device is navigated to, device data model file is read from tested device using MMS communication commands,
Save as the second device data model file；The device data model file of the tested device defines the equipment of tested device
Data model information, the device data model information of tested device logically facility information, data set information and data object
The tree of information is organized；
S3：The difference of the first device data model file and the second device data model file is contrasted, both one is realized
Cause property contrastive test.
Further, the uniformity comparison test in step S3 is carried out using following method：From logical device, data
Collection and these three levels of data object carry out successively secondary to the first device data model file and the second device data model file
Matching, compare the difference between the first device data model file and the second device data model file, realize uniformity ratio
To test.So matched from logical device, data set and data object these three levels are successively secondary, can be effectively improved
The accuracy matched somebody with somebody, and then improve the accuracy of uniformity comparison test.
Further, the matching of the logical device and data set is carried out using following method：Logical device is analyzed respectively
The model keyword included with data set, carries out Intelligent Recognition and matching according to model keyword, after the match is successful, logic is set
Standby and data set carries out title and the differentiation of mark is compared.
Further, the matching of the data object is carried out using following method：The title institute of analyze data object first
Comprising semantic keywords, then matched according to semantic keywords, choose matching degree two data objects of highest build
Vertical corresponding relation, and the two data objects to setting up corresponding relation carry out title, mark, data type, unit, maximum
The contrast of value, minimum of a value, step-length and data value.Carry out matching using semantic keywords the accuracy that can improve matching.
Further, the logical device information of the IED devices describes the logical device of IED devices, defines logic and sets
Standby title and identity property；The data set information of IED devices describes the data set of IED devices, defines the name of data set
Claim and identity property；The data object information of IED devices describes the data that data set includes, defines the name of each data
The attribute of title, mark, data type, unit, maximum, minimum of a value, step-length and data value.
Further, the logical device information of the tested device describes the logical device of tested device, defines logic
The title and identity property of equipment；The data set information of tested device describes the data set of tested device, defines data set
Title and identity property；The data object information of tested device describes the data that data set includes, defines each data
Title, mark, data type, unit, maximum, minimum of a value, the attribute of step-length and data value.
The consistency testing system of intelligent electronic device device data model of the present invention, including SCD parsing modules,
MMS communication modules and model consistency test module；Wherein：
SCD parsing modules：For reading and parsing the SCD file at the whole station of transformer station, all IED in SCD file are traveled through
Device, generates the device data model file of each IED device, saves as the first device data model file；The IED devices
Device data model file define the device data model information of IED devices, the device data model information of IED devices is pressed
Organized according to the tree of logical device information, data set information and data object information；
MMS communication modules：For device data model file being read from tested device, save as the second device data model
File；The device data model file of the tested device defines the device data model information of tested device, tested device
The tree of device data model information logically facility information, data set information and data object information carry out group
Knit；
Model consistency test module：For contrasting the first device data model file and the second device data model file
Difference, realize both uniformity comparison test.
Beneficial effect：Compared with prior art, the present invention has following beneficial effect：The invention discloses a kind of intelligence
The device data model letter of the conformance test method and system of electronic equipment data model, IED devices and tested device
Breath logically organized by the tree of facility information, data set information and data object information, is so more pressed close to
The classification of actual field, improves the accuracy of test, with very strong practical value.
Description of the drawings
System block diagrams of the Fig. 1 for the specific embodiment of the invention.
Specific embodiment
With reference to the accompanying drawings and detailed description, technical scheme is further introduced.
As shown in figure 1, the uniformity that this specific embodiment discloses a kind of intelligent electronic device device data model is surveyed
Test system, including SCD parsing modules, MMS communication modules and model consistency test module；Wherein：
SCD parsing modules：For reading and parsing the SCD file at the whole station of transformer station, all IED in SCD file are traveled through
Device, generates the device data model file of each IED device, saves as the first device data model file；IED devices set
Standby data pattern file defines the device data model information of IED devices, and the device data model information of IED devices is according to patrolling
The tree for collecting facility information, data set information and data object information is organized；
MMS communication modules：For device data model file being read from tested device, save as the second device data model
File；The device data model file of the tested device defines the device data model information of tested device, tested device
The tree of device data model information logically facility information, data set information and data object information carry out group
Knit；
Model consistency test module：For contrasting the first device data model file and the second device data model file
Difference, realize both uniformity comparison tests, form test report and simultaneously feed back to test interface.
Wherein, uniformity comparison test is carried out using following method：From logical device, data set and data object this three
Individual level carries out successively secondary matching to the first device data model file and the second device data model file, compares first and sets
Standby difference between data pattern file and the second device data model file, realizes that uniformity comparison is tested.
The matching of logical device and data set is carried out using following method：According to IEC61850 modeling specifications, divide respectively
The model keyword that analysis logical device and data set are included, carries out Intelligent Recognition and matching according to model keyword, and the match is successful
Afterwards, the differentiation that title and mark are carried out to logical device and data set is compared.
The matching of data object is carried out using following method：The semantic pass included by the title of analyze data object first
Key word, is then matched according to semantic keywords, is chosen matching degree two data objects of highest and is set up corresponding relation, and
The two data objects to setting up corresponding relation carry out title, mark, data type, unit, maximum, minimum of a value, step-length
With the contrast of data value.Semantic keywords therein are the keywords defined in relay protection specialized vocabulary storehouse.Relay protection is special
Industry lexicon is arranged according to relay protection specialty and is formed, all semantic crucial comprising protective relaying device device data model
Word.
The logical device information of IED devices describes the logical device of IED devices, defines the title and mark of logical device
Know attribute；The data set information of IED devices describes the data set of IED devices, defines the title and identity property of data set；
The data object information of IED devices describes the data that data set includes, defines the title of each data, mark, data class
The attribute of type, unit, maximum, minimum of a value, step-length and data value.
The logical device information of tested device describes the logical device of tested device, define logical device title and
Identity property；The data set information of tested device describes the data set of tested device, defines the title and mark of data set
Attribute；The data object information of tested device describes the data that data set includes, define the title of each data, mark,
The attribute of data type, unit, maximum, minimum of a value, step-length and data value.
This specific embodiment also discloses a kind of conformance test method of intelligent electronic device device data model, bag
Include following steps：
S1：The SCD file at the whole station of transformer station is read and parsed, all IED devices in SCD file is traveled through, is generated each
The device data model file of IED devices, saves as the first device data model file；The device data mould of the IED devices
The type document definition device data model information of IED devices, the device data model information of IED devices logically equipment letter
The tree of breath, data set information and data object information is organized；
S2：Concrete tested device is navigated to, device data model file is read from tested device using MMS communication commands,
Save as the second device data model file；The device data model file of the tested device defines the equipment of tested device
Data model information, the device data model information of tested device logically facility information, data set information and data object
The tree of information is organized；
S3：The difference of the first device data model file and the second device data model file is contrasted, both one is realized
Cause property contrastive test.
Claims (7)
1. the conformance test method of intelligent electronic device device data model, it is characterised in that：Comprise the following steps：
S1：The SCD file at the whole station of transformer station is read and parsed, all IED devices in SCD file are traveled through, each IED is generated and is filled
The device data model file put, saves as the first device data model file；The device data model file of the IED devices
Define the device data model information of IED devices, the device data model information of IED devices logically facility information, number
Organized according to the tree of collection information and data object information；
S2：Concrete tested device is navigated to, device data model file is read from tested device using MMS communication commands, is preserved
For the second device data model file；The device data model file of the tested device defines the device data of tested device
Model information, the device data model information of tested device logically facility information, data set information and data object information
Tree organized；
S3：The difference of the first device data model file and the second device data model file is contrasted, both uniformity are realized
Contrastive test.
2. the conformance test method of intelligent electronic device device data model according to claim 1, it is characterised in that：
Uniformity comparison test in step S3 is carried out using following method：From logical device, data set and data object this
Three levels carry out successively secondary matching to the first device data model file and the second device data model file, compare first
Difference between device data model file and the second device data model file, realizes that uniformity comparison is tested.
3. the conformance test method of intelligent electronic device device data model according to claim 2, it is characterised in that：
The matching of the logical device and data set is carried out using following method：The mould that logical device and data set are included is analyzed respectively
Type keyword, carries out Intelligent Recognition and matching according to model keyword, after the match is successful, carries out name to logical device and data set
The differentiation for claiming and identifying is compared.
4. the conformance test method of intelligent electronic device device data model according to claim 2, it is characterised in that：
The matching of the data object is carried out using following method：The semanteme included by the title of analyze data object first is crucial
Word, is then matched according to semantic keywords, is chosen matching degree two data objects of highest and is set up corresponding relation, and right
Set up corresponding relation the two data objects carry out title, mark, data type, unit, maximum, minimum of a value, step-length and
The contrast of data value.
5. the conformance test method of intelligent electronic device device data model according to claim 1, it is characterised in that：
The logical device information of the IED devices describes the logical device of IED devices, defines the title and mark category of logical device
Property；The data set information of IED devices describes the data set of IED devices, defines the title and identity property of data set；IED
The data object information of device describes the data that data set includes, define the title of each data, mark, data type,
The attribute of unit, maximum, minimum of a value, step-length and data value.
6. the conformance test method of intelligent electronic device device data model according to claim 1, it is characterised in that：
The logical device information of the tested device describes the logical device of tested device, defines the title and mark of logical device
Attribute；The data set information of tested device describes the data set of tested device, defines the title and identity property of data set；
The data object information of tested device describes the data that data set includes, defines the title of each data, mark, data class
The attribute of type, unit, maximum, minimum of a value, step-length and data value.
7. the consistency testing system of intelligent electronic device device data model, it is characterised in that：Including SCD parsing modules, MMS
Communication module and model consistency test module；Wherein：
SCD parsing modules：For reading and parsing the SCD file at the whole station of transformer station, all IED devices in SCD file are traveled through,
The device data model file of each IED device is generated, the first device data model file is saved as；The IED devices set
Standby data pattern file defines the device data model information of IED devices, and the device data model information of IED devices is according to patrolling
The tree for collecting facility information, data set information and data object information is organized；
MMS communication modules：For device data model file being read from tested device, save as the second device data model text
Part；The device data model file of the tested device defines the device data model information of tested device, tested device
The tree of device data model information logically facility information, data set information and data object information is organized；
Model consistency test module：For contrasting the difference of the first device data model file and the second device data model file
It is different, realize both uniformity comparison tests.
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| CN103268325A (en) * | 2013-04-26 | 2013-08-28 | 国家电网公司 | Dynamic checking method of intelligent substation IED (intelligent electronic device) model configuration correctness based on SCD (security coding device) files |
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| CN107404405A (en) * | 2017-08-02 | 2017-11-28 | 许继集团有限公司 | A kind of intelligent substation IEC61850 conformance test methods and system |
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Application publication date: 20170322 |