CN109557054A - A kind of detection device of the circuit board via quality based on infrared external reflection principle - Google Patents
A kind of detection device of the circuit board via quality based on infrared external reflection principle Download PDFInfo
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- CN109557054A CN109557054A CN201811438242.3A CN201811438242A CN109557054A CN 109557054 A CN109557054 A CN 109557054A CN 201811438242 A CN201811438242 A CN 201811438242A CN 109557054 A CN109557054 A CN 109557054A
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- circuit board
- slide rail
- infrared
- detection device
- quality based
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
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- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
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- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
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- Pathology (AREA)
- Geophysics And Detection Of Objects (AREA)
Abstract
The present invention provides a kind of detection devices of circuit board via quality based on infrared external reflection principle, based on infrared reflection principle, pass through the setting of the infrared reflection type sensor of test bar lower end, the difference of reflected intensity of the infrared reflection type sensor detection infrared ray by gauge orifice and to gaging hole back reflection back can be compared when detection to judge the quality of via hole, such as: the position in hole and the blockage in hole, if infrared reflection type sensor detects the deviation for the reflected intensity that infrared ray is returned by gauge orifice back reflection in the reflected intensity that infrared ray is returned by gauge orifice back reflection and preferred circuit plate not within the scope of test stone, then circuit board is considered as substandard product.The present invention can detect the circuit board of different size, different pore size, and be able to achieve automatic detection, have the advantages that applied widely, detection efficiency is high, detection time is short and at low cost.
Description
Technical field
The present invention relates to circuit board detecting field more particularly to a kind of circuit board via quality based on infrared external reflection principle
Detection device.
Background technique
The quality problems that hole is caused during circuit board making are relatively common defects, such as few to bore, do not drill through, plug-hole
Deng a certain proportion of not drilling through, bore less or when same batch products the defects of plug-hole, existing technology for occupying at present
Be using visually testing according to hole mode, and during high-volume examines workpiece, this check system Check-Out Time is long,
Checkability is low, and easily missing inspection, in addition, also having whether the method test aperture that whether can pass through hole using test probe closes
Lattice, but the circuit board of same specification, same position aperture can only be tested, otherwise to be remake according to the position in different holes
Test board, this check system is at high cost, and checkability is low.
Summary of the invention
Technical problem to be solved by the present invention lies in, provide it is a kind of it is at low cost, detection efficiency is high, detection time is short, suitable
With the detection device of the wide circuit board via quality based on infrared external reflection principle of range.
In order to solve the above technical problem, the present invention provides a kind of circuit board via quality based on infrared external reflection principle
Detection device comprising workbench, test bar, elevating lever, link block, longitudinal slide rail, horizontal slide rail and column, the work
Platform is equipped with the fixture for fixing circuit board, and the bottom of the column is fixedly arranged on the side of the workbench, described longitudinal sliding
Rail is installed in the top of the column, and the horizontal slide rail is vertically disposed in the longitudinal slide rail, the horizontal slide rail energy
It is moved forward and backward on the length direction of the longitudinal slide rail, the link block is set in the horizontal slide rail, the connection
Block can move left and right on the length direction of the horizontal slide rail, and the upper end of the elevating lever is connect with the link block, described
The lower end of elevating lever is connect with the upper end of the test bar, and the elevating lever can drive the test bar to move up and down, the inspection
The lower end for surveying stick is equipped with the infrared reflection type sensing for passing through the reflected intensity that gauge orifice back reflection is returned for detecting infrared ray
Device.
Preferably, the longitudinal slide rail is equipped with the first driving mechanism, the power output of first driving mechanism
End connect with the horizontal slide rail and the horizontal slide rail can be driven to be moved forward and backward on the length direction of the longitudinal slide rail.
Preferably, the horizontal slide rail is equipped with the second driving mechanism, the power output of second driving mechanism
End connect with the link block and the link block can be driven to move left and right on the length direction of the horizontal slide rail.
Preferably, the elevating lever is electric pushrod.
Preferably, first driving mechanism is electric pushrod.
Preferably, second driving mechanism is electric pushrod.
Preferably, the detector of the test bar is equipped with diameter scale.
Preferably, the elevating lever is electric pushrod.
Preferably, being equipped with spring between the test bar and elevating lever.
The detection device for implementing a kind of circuit board via quality based on infrared external reflection principle of the invention, with the prior art
It compares, has the following beneficial effects:
The present invention is based on infrared reflection principles, pass through the setting of the infrared reflection type sensor of test bar lower end, inspection
Can compare when survey infrared reflection type sensor detection infrared ray by gauge orifice and to gaging hole back reflection return reflection it is strong
The difference of degree judges the quality of via hole, such as: the position in hole and the blockage in hole, if infrared reflection type sensor detects
In circuit board to be detected after infrared ray warp in the reflected reflected intensity in hole to be measured and preferred circuit plate infrared ray by marking
When the deviation for the reflected intensity that quasi- hole back reflection is returned is not within the scope of test stone, then circuit board is considered as substandard product；
If infrared reflection type sensor detect in circuit board to be detected after infrared ray warp the reflected reflected intensity in hole to be measured with
When the deviation for the reflected intensity that infrared ray is returned by gauge orifice back reflection in preferred circuit plate is within the scope of test stone, then
Circuit board is considered as qualified products；The present invention can detect the circuit board of different size, different pore size as a result, and be able to achieve automation
Detection, has the advantages that applied widely, detection efficiency is high, detection time is short and at low cost.
Detailed description of the invention
In order to illustrate the technical solution of the embodiments of the present invention more clearly, the attached drawing to embodiment is simply situated between below
It continues.
Fig. 1 is a kind of structure of the detection device of circuit board via quality based on infrared external reflection principle provided by the invention
Schematic diagram；
Fig. 2 is a kind of system of the detection device of circuit board via quality based on infrared external reflection principle provided by the invention
Schematic diagram；
Marked in the figure: 1 is workbench, 2 be test bar, and 3 be elevating lever, and 4 be link block, and 5 be horizontal slide rail, and 6 be longitudinal
Sliding rail, 7 be column, and 81 be preferred circuit plate, and 82 be circuit board to be detected, and 9 be fixture, and 10 be motor encoder, and 11 be infrared
Line reflection type sensor, 12 be data acquisition module, and 13 be data storage module, and 14 be data comparison module.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
As depicted in figs. 1 and 2, the preferred embodiment of the present invention, a kind of circuit board via matter based on infrared external reflection principle
The detection device of amount, including workbench 1, test bar 2, elevating lever 3, link block 4, horizontal slide rail 5, longitudinal slide rail 6 and column 7,
The workbench 1 is equipped with the fixture 9 for fixing circuit board, and the bottom of the column 7 is fixedly arranged on the one of the workbench 1
Side, the longitudinal slide rail 6 are installed in the top of the column 7, and the horizontal slide rail 5 is vertically disposed at the longitudinal slide rail 6
On, the horizontal slide rail 5 can be moved forward and backward on the length direction of the longitudinal slide rail 6, and the link block 4 is set to described
In horizontal slide rail 5, the link block 4 can move left and right on the length direction of the horizontal slide rail 5, the elevating lever 3 it is upper
End is connect with the link block 4, and the lower end of the elevating lever 3 is connect with the upper end of the test bar 2, and the elevating lever 3 can drive
It moves the test bar 2 to move up and down, the lower end of the test bar 2, which is equipped with, returns for detecting infrared ray by gauge orifice back reflection
Reflected intensity infrared reflection type sensor 11.
Illustratively, the longitudinal slide rail 6 is equipped with the first driving mechanism, the power output end of first driving mechanism
It is connect with the horizontal slide rail 5 and the horizontal slide rail 5 can be driven to be moved forward and backward on the length direction of the longitudinal slide rail 6,
First driving mechanism is preferably electric pushrod, realizes automation control, and testing result is accurate.
Illustratively, the horizontal slide rail 5 is equipped with the second driving mechanism, and second driving mechanism can drive the company
It connects block 4 to move left and right on the length direction of the horizontal slide rail 5, second driving mechanism is preferably electric pushrod, is realized
Automation control, testing result are accurate.
Illustratively, the elevating lever 3 is electric pushrod, realizes automation control, and testing result is accurate.
Illustratively, spring is equipped between the test bar 2 and elevating lever 3, which works as a buffer, effectively prevent examining
It surveys between stick 2 and circuit board and rigid collision occurs and causes circuit board damage.
Illustratively, the detector of the test bar 2 is taper, can be suitably used for the plug-hole for getting through different pore size.
Illustratively, the detector of the test bar 2 is equipped with diameter scale, observable via diameter size, to judge
Whether via diameter size is qualified.
Implement a kind of detection device of circuit board via quality based on infrared external reflection principle of the invention, detection process
It is as follows:
S1: preferred circuit plate 81 is put into workbench 1, will test stick by the first driving mechanism and the second driving mechanism
2 are successively moved to the position opposite with gauge orifice each in preferred circuit plate 81, are driven by the acquisition of data acquisition module 12 first
The standard coordinate data for each position that motivation structure and the motor encoder of the second driving mechanism 10 detect, and be sent to electrical
In the processor of control device；Meanwhile data acquisition module 12 acquires infrared reflection type sensor 11 and detects infrared ray process
The reflected intensity that gauge orifice back reflection is returned, and be converted into electric signal and be sent in data storage module 13；
S2: circuit board 82 to be detected is put into workbench 1, and the standard coordinate data obtained according to step S1 will test stick
2 be moved to position corresponding to the standard coordinate data, pass through data acquisition module 12 acquire infrared reflection type sensor
11 detection infrared rays pass through the reflected intensity that gauge orifice back reflection is returned, and are converted into electric signal and are sent to data comparison module 14
In, it is calculated in circuit board 82 to be detected by data comparison module 14 and whether is got the bid with preferred circuit plate 81 to the reflected intensity of gaging hole
The deviation of the reflected intensity in quasi- hole；
When infrared ray passes through the reflected intensity returned to gaging hole back reflection and preferred circuit plate 81 in circuit board 82 to be detected
When the deviation for the reflected intensity that middle infrared ray is returned by gauge orifice back reflection is not within the scope of test stone, decline test bar
2 make the insertion of its end in gaging hole；
If the end of test bar 2 cannot be inserted into in gaging hole, the position of circuit board under test via hole is not right, slowdown monitoring circuit to be checked
Plate 82 is considered as substandard product；
If the end of test bar 2 can be inserted into in gaging hole, test bar 2 resets, when infrared ray reflection sensor 11 detects
Not to the deviation of the reflected intensity of gaging hole and the reflected intensity in 81 Plays hole of preferred circuit plate into circuit board 82 to be detected
When within the scope of test stone, then the position of circuit board under test via hole is not right, and circuit board 82 to be detected is considered as substandard product；
If the end of test bar 2 can be inserted into in gaging hole, test bar 2 resets, when infrared ray reflection sensor 11 detects
Deviation into circuit board 82 to be detected to the reflected intensity of gaging hole and the reflected intensity in 81 Plays hole of preferred circuit plate exists
When within the scope of test stone, then it should be considered as qualification to gaging hole；
S3: it repeats step S2 and is detected to other to gaging hole, complete all inspections to gaging hole in circuit board 82 to be detected
It surveys.
It should be noted that being passed the present invention is based on infrared reflection principle by the infrared reflection type of 2 lower end of test bar
The setting of sensor 11, when detection, can compare infrared reflection type sensor 11 and detect infrared ray by gauge orifice and after gaging hole
The difference of reflected reflected intensity judges the quality of via hole, such as: the position in hole and the blockage in hole, if infrared ray
Reflection sensor 11 detects in circuit board 82 to be detected the reflected reflected intensity in hole to be measured after infrared ray warp and standard
When the deviation for the reflected intensity that infrared ray is returned by gauge orifice back reflection in circuit board 81 is not within the scope of test stone, then
Circuit board is considered as substandard product；If infrared reflection type sensor 11 detect in circuit board 82 to be detected after infrared ray warp to
The reflected intensity that infrared ray is returned by gauge orifice back reflection in the reflected reflected intensity of gaging hole and preferred circuit plate 81
When deviation is within the scope of test stone, then circuit board is considered as qualified products；The present invention can detect different size, difference as a result,
The circuit board in aperture, and it is able to achieve automatic detection, with applied widely, detection efficiency is high, detection time is short and at low cost
The advantages of.
Above disclosed is only presently preferred embodiments of the present invention, cannot limit the right of the present invention with this certainly
Range, therefore according to equivalent variations made by scope of the present invention patent, it is still within the scope of the present invention.
Claims (9)
1. a kind of detection device of the circuit board via quality based on infrared external reflection principle, which is characterized in that including workbench, inspection
Stick, elevating lever, link block, longitudinal slide rail, horizontal slide rail and column are surveyed, the workbench is equipped with the folder for fixing circuit board
Tool, the bottom of the column are fixedly arranged on the side of the workbench, and the longitudinal slide rail is installed in the top of the column, described
Horizontal slide rail is vertically disposed in the longitudinal slide rail, before the horizontal slide rail can be on the length direction of the longitudinal slide rail
After move, the link block is arranged in the horizontal slide rail, and the link block can be on the length direction of the horizontal slide rail
It moves left and right, the upper end of the elevating lever is connect with the link block, the upper end of the lower end of the elevating lever and the test bar
Connection, the elevating lever can drive the test bar to move up and down, and the lower end of the test bar is equipped with for detecting infrared ray warp
Cross the infrared reflection type sensor for the reflected intensity that gauge orifice back reflection is returned.
2. the detection device of the circuit board via quality based on infrared external reflection principle as described in claim 1, which is characterized in that
The longitudinal slide rail is equipped with the first driving mechanism, and the power output end of first driving mechanism is connect with the horizontal slide rail
And the horizontal slide rail can be driven to be moved forward and backward on the length direction of the longitudinal slide rail.
3. the detection device of the circuit board via quality based on infrared external reflection principle as described in claim 1, which is characterized in that
The horizontal slide rail is equipped with the second driving mechanism, and the power output end of second driving mechanism is connect simultaneously with the link block
The link block can be driven to move left and right on the length direction of the horizontal slide rail.
4. the detection device of the circuit board via quality based on infrared external reflection principle as described in claim 1, which is characterized in that
The elevating lever is electric pushrod.
5. the detection device of the circuit board via quality based on infrared external reflection principle as claimed in claim 2, which is characterized in that
First driving mechanism is electric pushrod.
6. the detection device of the circuit board via quality based on infrared external reflection principle as claimed in claim 3, which is characterized in that
Second driving mechanism is electric pushrod.
7. the detection device of the circuit board via quality based on infrared external reflection principle as described in claim 1, which is characterized in that
The detector of the test bar is taper.
8. the detection device of the circuit board via quality based on infrared external reflection principle as claimed in claim 7, which is characterized in that
The detector of the test bar is equipped with diameter scale.
9. the detection device of the circuit board via quality based on infrared external reflection principle as described in claim 1, which is characterized in that
Spring is equipped between the test bar and elevating lever.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811438242.3A CN109557054A (en) | 2018-11-27 | 2018-11-27 | A kind of detection device of the circuit board via quality based on infrared external reflection principle |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811438242.3A CN109557054A (en) | 2018-11-27 | 2018-11-27 | A kind of detection device of the circuit board via quality based on infrared external reflection principle |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109557054A true CN109557054A (en) | 2019-04-02 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811438242.3A Pending CN109557054A (en) | 2018-11-27 | 2018-11-27 | A kind of detection device of the circuit board via quality based on infrared external reflection principle |
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| Country | Link |
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| CN (1) | CN109557054A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112188743A (en) * | 2020-10-27 | 2021-01-05 | 惠州市特创电子科技有限公司 | Multilayer circuit board and rivet drilling method thereof |
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| CN206399355U (en) * | 2017-01-25 | 2017-08-11 | 丰顺县和生电子有限公司 | A kind of printed circuit board surface accuracy detecting device |
| CN207703742U (en) * | 2017-12-16 | 2018-08-07 | 无锡昌至盛机械制造有限公司 | A kind of circuit board detection device |
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2018
- 2018-11-27 CN CN201811438242.3A patent/CN109557054A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001337050A (en) * | 2000-05-29 | 2001-12-07 | Nikkiso Co Ltd | Method and apparatus for inspecting printed board |
| JP2005121417A (en) * | 2003-10-15 | 2005-05-12 | Seiren Denshi Kk | Inspection device for printed circuit board |
| CN202329590U (en) * | 2011-12-01 | 2012-07-11 | 山东法因数控机械股份有限公司 | Device for detecting point positions of plate surface |
| CN204612645U (en) * | 2015-05-27 | 2015-09-02 | 苏州艾迪亚电子科技有限公司 | Circuit board mounting hole checkout equipment |
| CN104848806A (en) * | 2015-05-29 | 2015-08-19 | 重庆长安汽车股份有限公司 | Detecting device for positive and negative surfaces of valve seat ring |
| CN106257232A (en) * | 2015-06-18 | 2016-12-28 | 牧德科技股份有限公司 | Detection method and detection equipment for hole site information of printed circuit board |
| CN205600116U (en) * | 2016-05-19 | 2016-09-28 | 郑州机械研究所 | Excellent aircraft nose is sent in automatic planing of carbon arc |
| CN106596588A (en) * | 2016-12-09 | 2017-04-26 | 英业达科技有限公司 | Automatic detection system for circuit boards |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112188743A (en) * | 2020-10-27 | 2021-01-05 | 惠州市特创电子科技有限公司 | Multilayer circuit board and rivet drilling method thereof |
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Application publication date: 20190402 |
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| RJ01 | Rejection of invention patent application after publication |