CN109507220B - Multi-axis special-shaped sample X-ray fluorescence spectrum analysis device - Google Patents

Multi-axis special-shaped sample X-ray fluorescence spectrum analysis device Download PDF

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CN109507220B
CN109507220B CN201811288808.9A CN201811288808A CN109507220B CN 109507220 B CN109507220 B CN 109507220B CN 201811288808 A CN201811288808 A CN 201811288808A CN 109507220 B CN109507220 B CN 109507220B
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axis
sample
moving mechanism
seat
special
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CN109507220A (en
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王清亚
李福生
汤彬
张丽娇
张焱
张雄杰
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East China Institute of Technology
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East China Institute of Technology
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016X-ray
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/309Accessories, mechanical or electrical features support of sample holder
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/33Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3307Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts source and detector fixed; object moves

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The invention provides a multi-axis special-shaped sample X-ray fluorescence spectrum analysis device, and relates to the technical field of X-ray detection analysis. It includes: the device comprises a sample chamber, a first moving mechanism arranged in the sample chamber, a sample table, an X-ray emitter, a detector and a camera; the first moving mechanism comprises an X-axis moving mechanism and a Y-axis moving mechanism, and the sample stage is arranged on the X-axis moving mechanism and the Y-axis moving mechanism; the sample platform includes slide bracket, set firmly spherical hinge seat, cam mechanism on the slide bracket and with spherical hinge seat articulated sample seat, cam mechanism including set firmly motor on the slide bracket, with the output shaft of motor cam and with cam butt cooperation pulley spare, the pulley spare is kept away from the one end of cam is connected to the sample seat. The distance and the angle between the special-shaped sample and the X-ray emitter can be changed, and the detection of multiple dimensions of the special-shaped sample is realized.

Description

Multi-axis special-shaped sample X-ray fluorescence spectrum analysis device
Technical Field
The invention relates to the field of X-ray detection analysis, in particular to a multi-axis special-shaped sample X-ray fluorescence spectrum analysis device.
Background
An X-ray fluorescence spectrometer is a detection instrument for analyzing a substance component by using fluorescent X-rays, and an X-ray fluorescence spectrometer (XRF) is composed of an excitation source (X-ray tube) and a detection system. The X-ray tube generates incident X-rays (primary X-rays), the sample to be detected is excited, each element in the excited sample emits secondary X-rays, the secondary X-rays emitted by different elements have specific energy characteristics or wavelength characteristics, the detection system measures the energy and the quantity of the emitted secondary X-rays, and then instrument software converts the information collected by the detection system into the types and the contents of various elements in the sample.
The basic structure of the mainstream XRF instrument in the market at present is a two-dimensional design, an X-ray tube is excited to generate rays to be incident on a sample, then, sample fluorescence is generated and received by a detector, and then, a test result is obtained through spectrum processing and analysis. During the use process, the sample is prepared into a planar standard sample and then is measured. And for some special-shaped samples which cannot be damaged, such as ores and the like, detection cannot be carried out, so that the application of the X-ray fluorescence spectrometer is greatly limited.
In view of the above, the inventors of the present invention have made a study of the prior art and then have made the present application.
Disclosure of Invention
The invention provides a multi-axis special-shaped sample X-ray fluorescence spectrum analysis device, aiming at solving the problem that an X-ray fluorescence spectrometer is limited in special-shaped sample detection.
In order to solve the technical problem, the invention provides a multi-axis special-shaped sample X-ray fluorescence spectrum analysis device, which comprises: the device comprises a sample chamber, a first moving mechanism arranged in the sample chamber, a sample table, an X-ray emitter, a detector and a camera;
the first moving mechanism comprises an X-axis moving mechanism and a Y-axis moving mechanism, and the sample stage is arranged on the X-axis moving mechanism and the Y-axis moving mechanism and moves along the X axis or along the Y axis through the X-axis moving mechanism and the Y-axis moving mechanism respectively;
the sample platform includes slide bracket, set firmly spherical hinge seat, cam mechanism on the slide bracket and with spherical hinge seat articulated sample seat, cam mechanism including set firmly motor on the slide bracket, with the output shaft of motor cam and with cam butt cooperation pulley spare, the pulley spare is kept away from the one end of cam is connected to the sample seat.
As a further optimization, the sample seat is connected with a sample box in a rotating mode, the sample box comprises a rotating seat and a box body fixed on the rotating seat, the rotating seat is of an inverted T shape, an inverted T-shaped groove matched with the rotating seat is formed in the sample seat, and the rotating seat is rotatably embedded in the inverted T-shaped groove.
As a further optimization, the sliding platform is further provided with a rotating power part for pushing the rotating seat to rotate relative to the sample seat, the rotating power part comprises a gear and a motor for driving the gear to rotate, and the rotating seat is circumferentially provided with gear rings meshed with the gear.
As a further optimization, the sliding platform is connected with the Y-axis moving mechanism, the Y-axis moving mechanism drives the sliding platform to move along the Y-axis, the Y-axis moving mechanism is connected with the X-axis moving mechanism, and the X-axis moving mechanism drives the Y-axis moving mechanism to move along the X-axis.
As further optimization, the X-axis moving mechanism comprises two X-axis synchronous belts arranged along the X-axis direction, an X-axis synchronous belt wheel arranged on the X-axis synchronous belt and a first stepping motor driving the X-axis synchronous belt wheel to rotate, and two ends of the Y-axis moving mechanism are fixed with the two X-axis synchronous belts respectively.
As a further optimization, the Y-axis moving mechanism comprises a connecting seat, a Y-axis synchronous belt arranged on the connecting seat, a Y-axis synchronous belt pulley arranged on the Y-axis synchronous belt, and a second stepping motor for driving the Y-axis synchronous belt pulley to rotate, and the sliding platform is fixed on the Y-axis synchronous belt.
As a further optimization, a Y-axis guide rod is further arranged on the connecting seat, and the Y-axis guide rod is arranged in the sliding platform in a penetrating manner and is connected with the sliding platform in a sliding manner.
As further optimization, still include the second moving mechanism, the second moving mechanism sets up the top position in the sample room, wear to establish including instrument platform, upper and lower cross X axle slide bar and Y axle slide bar, drive on the instrument platform X axle slide bar is along the first lead screw subassembly and the drive that the Y axle removed Y axle slide bar is along the second lead screw subassembly that the X axle removed, instrument platform's loading end orientation sample platform, and install the X ray transmitter the detector with the camera.
As further optimization, detachably disposes the upset track on the sample seat, and the upset track includes first plate body and second plate body, and first plate body and second plate body all are to twist reverse the form, and first plate body twists into the horizontal surface by vertical surface gradually from the head end to the end, and suitably, the second plate body twists into vertical surface by the horizontal surface gradually from the head end to the end.
By adopting the technical scheme, the invention can obtain the following technical effects:
through setting up X axle moving mechanism, Y axle moving mechanism for slide bracket can move on X axle and Y axle, thereby realizes the position adjustment of special-shaped sample in two dimensions. Meanwhile, a spherical hinge seat is installed on the sliding platform, and a sample seat arranged on a spherical hinge can be driven by a cam mechanism to lift and descend the box body, so that the distance and the angle between a special-shaped sample and the X-ray emitter are changed, and the detection of a certain special-shaped surface of the special-shaped sample is realized. In addition, because the sample seat sets up the form that the ball seat is connected for the sample seat can rotate wantonly in 360 directions, realizes multi-angle adjustment and detection to special-shaped sample. Compared with the position adjustment of detection devices such as an X-ray emitter and the like, the position adjustment of the sample can be realized, the influence of the shaking of the detection devices caused by movement on the detection result can be reduced, and the detection precision is improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
FIG. 1 is a schematic structural diagram of a multi-axis special-shaped sample X-ray fluorescence spectrum analysis apparatus according to example 1 of the present invention;
FIG. 2 is a schematic structural view of an angle adjusting member according to embodiment 1 of the present invention;
fig. 3 is a mechanism diagram of a first moving mechanism of embodiment 1 of the invention;
FIG. 4 is a schematic structural diagram of a sample stage in example 1 of the present invention;
FIG. 5 is a schematic illustration of the construction of the cam assembly of FIG. 4;
FIG. 6 is a schematic structural view of a sample cartridge according to embodiment 1 of the present invention;
fig. 7 is a schematic structural view of a turning track according to embodiment 1 of the present invention;
fig. 8 is a schematic structural view of a second moving mechanism of embodiment 1 of the present invention;
fig. 9 is a schematic structural diagram of a sample stage in embodiment 2 of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings of the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention. Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like, indicate orientations and positional relationships based on those shown in the drawings, and are used only for convenience of description and simplicity of description, and do not indicate or imply that the equipment or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be considered as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the present invention, unless otherwise expressly stated or limited, "above" or "below" a first feature means that the first and second features are in direct contact, or that the first and second features are not in direct contact but are in contact with each other via another feature therebetween. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
The invention is described in further detail below with reference to the following detailed description and accompanying drawings:
as shown in fig. 1, the present embodiment provides a multi-axis special-shaped sample X-ray fluorescence spectrum analysis apparatus 100, including: a sample cell 110, a first movement mechanism 120 disposed within sample cell 110, a sample stage 130, an X-ray emitter 140, a detector 150, and a camera 160.
The X-ray emitter 140 serves as a radiation source for emitting X-rays, preferably with a multi-capillary X-ray lens. A multi-capillary X-ray lens is used to focus the X-rays. The detector 150 may, for example, employ a photomultiplier tube to count the number of counts reflecting the intensity of the radiation. The camera 140 may employ, for example, a CCD for observing the sample. It is understood that the X-ray emitter 140, the detector 150 and the camera 160 are all conventional structures, and the specific structures and implementation principles thereof are conventional and will not be described herein again.
An information processor 170 is arranged outside the sample room 110, and the X-ray emitter 140, the detector 150 and the camera 160 are all connected with the information processor through signal lines. The information processor 170 may be a computer device or the like for processing signals and image information.
The X-ray emitter 140, detector 150, and camera 160 are all mounted within the sample chamber 110 by a mounting plate 111. In the preferred embodiment, the X-ray emitter 140, detector 150 and camera head 160 are all mounted on the mounting plate 111 by an angle adjustment member 180.
As shown in fig. 2, the angle adjusting member 180 includes a fixing plate 181 fixedly coupled to the mounting plate, a clamping member 182, a rotating shaft, and a locking nut 183. The clamping member 182 is hinged to the fixing plate 181 through a rotating shaft, and the locking nut 183 locks the rotating shaft to fix the clamping member 182. The clamping member 182 is used for clamping detection devices such as the X-ray emitter 140, the detector 150 and the camera 160, and the mounting angles of the X-ray emitter 140, the detector 150 and the camera 160 can be adjusted by adjusting the angle of the clamping member 182 hinged on the fixing plate 181.
As shown in fig. 3, the first moving mechanism 120 includes an X-axis moving mechanism 121 and a Y-axis moving mechanism 122, and the sample stage 130 is disposed on the X-axis moving mechanism 121 and the Y-axis moving mechanism 122 and is moved along the X-axis or the Y-axis by the X-axis moving mechanism 121 and the Y-axis moving mechanism 122, respectively. In this embodiment, the X-axis and the Y-axis are perpendicular to each other.
Further, the sample stage 130 is connected to the Y-axis moving mechanism 122, the Y-axis moving mechanism 122 drives the sample stage 130 to move along the Y-axis, the Y-axis moving mechanism 122 is connected to the X-axis moving mechanism 121, and the X-axis moving mechanism 121 drives the Y-axis moving mechanism 122 to move along the X-axis.
The X-axis moving mechanism 121 includes two X-axis timing belts 123 arranged in the X-axis direction, an X-axis timing pulley 124 disposed on the X-axis timing belts 123, and a first stepping motor 125 for driving the X-axis timing pulley 124 to rotate. Both ends of the Y-axis moving mechanism 122 are fixed to two X-axis timing belts 123, respectively.
The Y-axis moving mechanism 122 includes a connecting base 126, a Y-axis timing belt 127 disposed on the connecting base 126, a Y-axis timing pulley 128 disposed on the Y-axis timing belt 127, and a second stepping motor 129 driving the Y-axis timing pulley 128 to rotate. The connecting seat 126 is fixed on the X-axis synchronous belt 123, and the sample stage 130 is fixed on the Y-axis synchronous belt 127.
For further optimization, the connecting seat 129 is further provided with a Y-axis guide rod 129a, the Y-axis guide rod 129a is arranged in the sample table 130 in a penetrating mode, and the sample table 130 slides along the Y-axis guide rod 129a, so that the stability of the moving process is guaranteed.
As shown in fig. 4, the sample stage 130 includes a sliding platform 131, a ball hinge base 132 fixed on the sliding platform, a cam mechanism 133, and a sample base 134 hinged to the ball hinge base 133. The sliding platform 131 is disposed on the connecting base 129 and moves along the X-axis or the Y-axis under the driving of the first moving mechanism 120. The sample holder 134 is mounted on the spherical hinge holder 133, and can be rotated and lifted, so that the angle of the sample holder can be flexibly adjusted.
As shown in fig. 5, the cam mechanism 133 includes a motor 133a fixed to the sliding platform 131, a cam 133b connected to an output shaft of the motor 133a, and a pulley member 133c engaged with the cam 133b in an abutting manner, and an end of the pulley member 133c away from the cam 133b is connected to the sample holder 134. The output shaft of the motor 133a rotates to drive the cam 133b to rotate, and under the eccentric action of the cam 133b, the pulley part in abutting fit with the cam 133b moves up or down to drive the sample holder 134 connected with the cam to lift, so that the sample holder 134 is inclined. In this embodiment, the pulley member includes a sliding rod and a pulley, one end of the sliding rod is connected to the pulley, and the other end is connected to the edge of the sample holder 134. The slide bar is provided with a guide block, and the cam rotates to enable the slide bar to lift relative to the guide block to drive the sample holder 134 to incline. The guide block can be fixed on the sliding platform through a support rod and the like, and the guide block can play a role in guiding and limiting. The slide bar is arranged at the edge of the sample holder 134, so that the sample holder 134 can generate a larger inclination angle when the slide bar is displaced slightly.
As shown in fig. 6, a sample cartridge 135 is fixedly connected to the sample holder 134. The sample to be detected is placed in the sample box for detection. The sample cartridge 135 has multiple compartments, e.g., 3, 4, 5, etc., into which multiple samples can be placed simultaneously. By moving the sliding platform, different interlayer is positioned in the detection area, and different samples are detected respectively.
Further, as shown in fig. 7, a turning rail 136 is detachably disposed in the sample box 135, the turning rail 136 includes a first plate 136a and a second plate 136b, the first plate 136a and the second plate 136b are twisted, the first plate 136a is gradually twisted from a head end to a tail end from a vertical surface to a horizontal surface, and correspondingly, the second plate 136b is gradually twisted from a head end to a tail end from a horizontal surface to a vertical surface. The leading end of the roll-over track 136 corresponds to the lifting point of the cam mechanism 133. The length of the turning rail 136 is approximately matched with the accommodating space of the sample box 135, and the turning rail 136 is clamped on the sample box 135 and can be taken out or put in according to the requirement of a user. The turning track 136 can move the sample at the head end to the tail end when the sample box is lifted, and in the moving process, the sample is changed from an initial placing state to another placing state, so that the sample is turned. The sample to be detected does not need to be taken out from the sample chamber, the change of the placing state of the sample can be realized, and the detection of a plurality of angles of the special-shaped sample is realized.
Further, as shown in fig. 8, the apparatus further includes a second moving mechanism 170, the second moving mechanism 170 is disposed at an upper position in the sample chamber 110, and includes an instrument platform 171, an X-axis sliding rod 172 and a Y-axis sliding rod 173 vertically and crosswise arranged on the instrument platform 171, a first lead screw assembly 174 for driving the X-axis sliding rod 172 to move along the Y-axis, and a second lead screw assembly 175 for driving the Y-axis sliding rod 173 to move along the X-axis, and a bearing surface of the instrument platform 171 faces the sample stage 130. The mounting plate 111 is fixed to the instrument platform 171. The X-axis sliding rod 172 and the Y-axis sliding rod 173 are arranged on the instrument platform 171 in a vertically crossed manner with a gap left therebetween, so that the X-axis movement and the Y-axis movement are prevented from interfering with each other.
In this embodiment, two ends of the X-axis sliding rod are respectively fixed to the lead screw nuts of the first lead screw assembly 174, and the lead screw rotates to drive the X-axis sliding rod to move along the Y-axis. Two ends of the Y-axis slide bar are respectively fixed on the screw rod nut of the second screw rod assembly 175, and the screw rod rotates to drive the Y-axis slide bar to move along the X axis. The instrument platform 171 can move to any position point through the X-axis slide bar and the Y-axis slide bar, and the detection dimensionality of the special-shaped sample is further expanded. And the mode of sliding rod motion is adopted, the stability of motion is guaranteed, and the detection instrument is prevented from shaking in the moving process, so that the detection result is prevented from being distorted.
Further, the bottom of the multi-axis special-shaped sample X-ray fluorescence spectrum analysis device 100 is provided with a caster 190, so that the device can be moved conveniently.
In summary, the embodiment of the invention is provided with the first moving mechanism and the spherical hinge seat to realize the multi-dimensional adjustment of the sample stage, and is provided with the second moving mechanism and the angle adjusting piece to realize the position and angle adjustment of the detection instrument, thereby greatly expanding the detection dimension of the X-ray fluorescence spectrum analysis device for the heterogeneous sample.
Example 2
The implementation principle and the generated technical effects of the multi-axis special-shaped sample X-ray fluorescence spectrum analysis device provided by the embodiment of the invention are the same as those of the embodiment 1, and for brief description, corresponding contents in the embodiment 1 can be referred to for the non-mentioned parts of the embodiment.
Further, as shown in fig. 9, the sample holder 134 is rotatably connected to the sample cartridge 135, and the sample cartridge 135 includes a rotating holder 136 and a cartridge body 137 fixed to the rotating holder 136. The rotating seat 136 is in an inverted T shape, the sample seat 134 is provided with an inverted T-shaped groove 138 matched with the rotating seat 136, and the rotating seat 136 is rotatably embedded in the inverted T-shaped groove 138.
Further, the sliding platform is further provided with a rotary power member 139 for pushing the rotary seat 136 to rotate relative to the sample seat 136, and the rotary power member 139 comprises a gear 139a and a motor 139b for driving the gear 139a to rotate. The bottom of the rotating seat 136 is a circular base, and the periphery of the rotating seat is provided with a gear ring 136 a. The side of the rotating seat 136 is provided with a side groove which extends inwards to be communicated with the inverted T-shaped groove 138, and the gear 139a partially extends into the side groove and is meshed with the gear ring 136 a. The motor 139b rotates to drive the gear 139a to rotate, and the rotating base 136 rotates, so that the sample box rotates, and the detection angle of the sample is adjusted.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (8)

1. A multi-axis special-shaped sample X-ray fluorescence spectrum analysis device is characterized by comprising: the device comprises a sample chamber, a first moving mechanism arranged in the sample chamber, a sample table, an X-ray emitter, a detector and a camera;
the first moving mechanism comprises an X-axis moving mechanism and a Y-axis moving mechanism, and the sample stage is arranged on the X-axis moving mechanism and the Y-axis moving mechanism and moves along the X axis or along the Y axis through the X-axis moving mechanism and the Y-axis moving mechanism respectively;
the sample table comprises a sliding platform, a spherical hinge seat fixedly arranged on the sliding platform, a cam mechanism and a sample seat hinged with the spherical hinge seat, the cam mechanism comprises a motor fixedly arranged on the sliding platform, a cam connected with an output shaft of the motor and a pulley piece in butt fit with the cam, and one end, far away from the cam, of the pulley piece is connected to the sample seat;
detachably disposes the upset track on the sample seat, and the upset track includes first plate body and second plate body, and first plate body and second plate body all are to twist reverse the form, and first plate body twists into the horizontal surface gradually from the head end to the end by vertical surface, and suitably ground, second plate body twist into vertical surface gradually from the head end to the end by the horizontal surface.
2. The multi-axis special-shaped sample X-ray fluorescence spectrum analysis device as claimed in claim 1, wherein a sample box is rotatably connected to the sample seat, the sample box comprises a rotating seat and a box body fixed on the rotating seat, the rotating seat is in an inverted T shape, the sample seat is provided with an inverted T-shaped groove matched with the rotating seat, and the rotating seat is rotatably embedded in the inverted T-shaped groove.
3. The multi-axis special-shaped sample X-ray fluorescence spectrum analysis device as claimed in claim 2, wherein a rotary power member for pushing the rotary base to rotate relative to the sample base is further arranged on the sliding platform, the rotary power member comprises a gear and a motor for driving the gear to rotate, and a gear ring meshed with the gear is arranged around the rotary base.
4. The multi-axis special-shaped sample X-ray fluorescence spectrum analysis device as claimed in claim 1, wherein the sliding platform is connected with the Y-axis moving mechanism, the Y-axis moving mechanism drives the sliding platform to move along a Y axis, the Y-axis moving mechanism is connected with the X-axis moving mechanism, and the X-axis moving mechanism drives the Y-axis moving mechanism to move along an X axis.
5. The multi-axis special-shaped sample X-ray fluorescence spectrum analysis device as claimed in claim 4, wherein the X-axis moving mechanism comprises two X-axis synchronous belts arranged along the X-axis direction, an X-axis synchronous pulley arranged on the X-axis synchronous belt, and a first stepping motor for driving the X-axis synchronous pulley to rotate, and two ends of the Y-axis moving mechanism are respectively fixed with the two X-axis synchronous belts.
6. The multi-axis special-shaped sample X-ray fluorescence spectrum analysis device as claimed in claim 5, wherein the Y-axis moving mechanism comprises a connecting seat, a Y-axis synchronous belt arranged on the connecting seat, a Y-axis synchronous pulley arranged on the Y-axis synchronous belt, and a second stepping motor for driving the Y-axis synchronous pulley to rotate, and the sliding platform is fixed on the Y-axis synchronous belt.
7. The multi-axis special-shaped sample X-ray fluorescence spectrum analysis device as claimed in claim 6, wherein a Y-axis guide rod is further arranged on the connecting seat, and the Y-axis guide rod is arranged in the sliding platform in a penetrating manner and is connected with the sliding platform in a sliding manner.
8. The multi-axis special-shaped sample X-ray fluorescence spectrum analysis device as claimed in claim 1, further comprising a second moving mechanism disposed at an upper position of the sample chamber, the second moving mechanism comprising an instrument platform, an X-axis slide bar and a Y-axis slide bar passing through the instrument platform in a criss-cross manner, a first lead screw assembly driving the X-axis slide bar to move along the Y-axis, and a second lead screw assembly driving the Y-axis slide bar to move along the X-axis, wherein a bearing surface of the instrument platform faces the sample stage and is provided with the X-ray emitter, the detector and the camera.
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