CN109471057A - A kind of method and apparatus detecting Compact Range reflecting surface performance - Google Patents
A kind of method and apparatus detecting Compact Range reflecting surface performance Download PDFInfo
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- CN109471057A CN109471057A CN201910006982.8A CN201910006982A CN109471057A CN 109471057 A CN109471057 A CN 109471057A CN 201910006982 A CN201910006982 A CN 201910006982A CN 109471057 A CN109471057 A CN 109471057A
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The present invention relates to a kind of method and apparatus for detecting Compact Range reflecting surface performance, an embodiment of the method includes: to carry out sampling in Compact Range dead zone cross section to obtain two dimensional electric field distributed data；Two dimensional inverse fourier transform is carried out to the two dimensional electric field distributed data, obtains the spectrum of plane waves distributed data of measuring signal；It determines spatial alternation function of the electromagnetic wave in the communication process from sampled point to reflecting surface, and the spectrum of plane waves distributed data is handled using the spatial alternation function, obtain the spectrum of plane waves distributed data of reflecting surface；Two-dimension fourier transform is carried out to the spectrum of plane waves distributed data of the reflecting surface, obtains the two dimensional electric field distributed data of reflecting surface；Two dimensional electric field distributed data according to the reflecting surface detects reflecting surface performance.The embodiment can obtain the two dimensional electric field distributed data of reflecting surface to effectively detect the performance of Compact Range reflecting surface.
Description
Technical field
The present invention relates to electromagnetic scattering fields of measurement more particularly to a kind of methods and dress for detecting Compact Range reflecting surface performance
It sets.
Background technique
Reflecting surface is the important component in Compact Range darkroom, and effect is the spherical electromagnetic wave low coverage for giving off feed
It is liftoff to be converted into plane wave, form the dead zone (i.e. workspace) for meeting far field test requirement.Reflector shape, cross polarization
The quality of the performance indicators such as purity, the design of edge diffraction, jagged edges can all influence darkroom dead zone size and dead zone quality.It is special
Not, the reflecting surface in practical darkroom can further decrease quiet zone performance due to the influence of the factors such as machining accuracy, deformation.
Reflecting surface performance detection is a technological difficulties of Compact Range darkroom service check.Since reflecting surface is fixedly mounted on
In darkroom, the equipment for testing the indexs such as its deformation, damage is difficult to be unfolded, and the variation of the physical sizes such as reflecting surface deformation can not
Illustrate its influence to ELECTROMAGNETIC REFLECTION.The field distribution situation that detection method is verification test darkroom dead zone is commonly used now, still
Dead zone field distribution not only includes the influence of reflecting surface, further includes the dry of a variety of stray waves such as darkroom interference source, multipath effect
It relates to, interference will cause to the performance diagnogtics result of reflecting surface.
Therefore, it is difficult to the case where detecting for the electromagnetic performance of Compact Range darkroom reflecting surface, needs a kind of detection Compact Range
The method of reflecting surface performance provides technical support for reflecting surface service check, reparation etc..
Summary of the invention
The technical problem to be solved by the present invention is to how effectively detect the performance of Compact Range reflecting surface, examined for reflecting surface performance
It tests, repair etc. and technical support is provided.
In order to solve the above-mentioned technical problem, in one aspect, the present invention provides a kind of detection Compact Range reflecting surface performances
Method.
The method of the detection Compact Range reflecting surface performance of the embodiment of the present invention includes: to be adopted in Compact Range dead zone cross section
Sample obtains two dimensional electric field distributed data；Two dimensional inverse fourier transform is carried out to the two dimensional electric field distributed data, obtains measurement letter
Number spectrum of plane waves distributed data；Determine spatial alternation function of the electromagnetic wave in the communication process from sampled point to reflecting surface,
And the spectrum of plane waves distributed data is handled using the spatial alternation function, obtain the spectrum of plane waves distribution of reflecting surface
Data；Two-dimension fourier transform is carried out to the spectrum of plane waves distributed data of the reflecting surface, obtains the two dimensional electric field point of reflecting surface
Cloth data；Two dimensional electric field distributed data according to the reflecting surface detects reflecting surface performance.
Preferably, the method further includes: establish rectangular coordinate system in space using Compact Range dead zone center as origin；Its
In, X-direction is vertical direction, and Y direction is horizontal direction, and Z-direction is the direction that reflecting surface is directed toward at dead zone center；And
The sampling interval of the sampling meets following formula:
Wherein, Δ x is the sampling interval of X-direction, and Δ y is the sampling interval of Y-direction, and λ is measuring signal wavelength, DxIt is anti-
Face is penetrated in the length of X-direction, DyFor the length of reflecting surface in the Y direction, LxLength for scanning surface in X-direction, LyExist for scanning surface
The length of Y-direction, zminThe minimum range of reflecting surface is projected to for sampled point.
Preferably, it is described to the two dimensional electric field distributed data carry out two dimensional inverse fourier transform, specifically include: utilize with
Lower formula carries out two dimensional inverse fourier transform to the two dimensional electric field distributed data:
Wherein, F (kx,ky, z=0) be the measuring signal spectrum of plane waves distributed data, kxIt is wave number k in X-direction
Component, kyFor the component of wave number k in the Y direction, E (x, y, z=0) is the two dimensional electric field distributed data that sampling obtains, and j is imaginary number list
Position.
Preferably, the spatial alternation function is shown below:
Wherein, H (kx,ky) it is the spatial alternation function, z0For the distance for projecting to reflecting surface from sampled point.
Preferably, described that the spectrum of plane waves distributed data is handled using the spatial alternation function, it is specific to wrap
It includes: by the spectrum of plane waves distributed data of the measuring signal multiplied by the spatial alternation function.
Preferably, the spectrum of plane waves distributed data to the reflecting surface carries out two-dimension fourier transform, specifically includes:
The two-dimension fourier transform is carried out according to following formula:
Wherein, E (x, y, z=z0) be reflecting surface two dimensional electric field distributed data, F (kx,ky, z=z0) it is the flat of reflecting surface
Surface wave Spectral structure data.
On the other hand, the present invention provides a kind of device for detecting Compact Range reflecting surface performance.
The device of the detection Compact Range reflecting surface performance of the embodiment of the present invention can include: field distribution acquiring unit is used for
Sampling, which is carried out, in Compact Range dead zone cross section obtains two dimensional electric field distributed data；First wave Spectral structure computing unit, for institute
It states two dimensional electric field distributed data and carries out two dimensional inverse fourier transform, obtain the spectrum of plane waves distributed data of measuring signal；Second wave
Spectral structure computing unit, for determining spatial alternation function of the electromagnetic wave in the communication process from sampled point to reflecting surface, and
The spectrum of plane waves distributed data is handled using the spatial alternation function, obtains the spectrum of plane waves distribution number of reflecting surface
According to；Detection unit carries out two-dimension fourier transform for the spectrum of plane waves distributed data to the reflecting surface, obtains reflecting surface
Two dimensional electric field distributed data；Two dimensional electric field distributed data according to the reflecting surface detects reflecting surface performance.
Preferably, described device can further comprise establishment of coordinate system unit, for using Compact Range dead zone center as origin
Establish rectangular coordinate system in space；Wherein, X-direction is vertical direction, and Y direction is horizontal direction, and Z-direction is dead zone center
It is directed toward the direction of reflecting surface；
The sampling interval of the sampling meets following formula:
First wave Spectral structure computing unit can be further used for: be carried out using following formula to the two dimensional electric field distributed data
Two dimensional inverse fourier transform:
Wherein, Δ x is the sampling interval of X-direction, and Δ y is the sampling interval of Y-direction, and λ is measuring signal wavelength, DxIt is anti-
Face is penetrated in the length of X-direction, DyFor the length of reflecting surface in the Y direction, LxLength for scanning surface in X-direction, LyExist for scanning surface
The length of Y-direction, zminThe minimum range of reflecting surface is projected to for sampled point；F(kx,ky, z=0) and it is the flat of the measuring signal
Surface wave Spectral structure data, kxComponent for wave number k in X-direction, kyFor the component of wave number k in the Y direction, E (x, y, z=0) is sampling
The two dimensional electric field distributed data of acquisition, j are imaginary unit.
Preferably, the spatial alternation function can be shown below:
Wherein, H (kx,ky) it is the spatial alternation function, z0For the distance for projecting to reflecting surface from sampled point.
Preferably, the second wave spectrum distribution computing unit can be further used for: the spectrum of plane waves of the measuring signal is distributed
Data are multiplied by the spatial alternation function；Detection unit can be further used for: the two-dimension fourier transform is carried out according to following formula:
Wherein, E (x, y, z=z0) be reflecting surface two dimensional electric field distributed data, F (kx,ky, z=z0) it is the flat of reflecting surface
Surface wave Spectral structure data.
Above-mentioned technical proposal of the invention has the advantages that the present invention provides a kind of detection Compact Range reflecting surface performance
Inversion method solves the problems, such as that reflecting surface performance is difficult to examine in previous Compact Range darkroom.Specifically, the present invention is first tight
The two dimensional electric field distributed data that sampling obtains particular polarization mode is carried out on the dead zone cross section of contracting field, and then two dimensional electric field is distributed
Data carry out two dimensional inverse fourier transform to obtain the spectrum of plane waves distribution of measuring signal, calculate and back-propagation process phase later
Equivalent spatial filter function (i.e. spatial alternation function), and the distribution of above-mentioned spectrum of plane waves is filtered using above-mentioned function
Processing is to obtain the distribution of the spectrum of plane waves on reflecting surface；Finally the spectrum of plane waves of reflecting surface is distributed and is obtained instead as Fourier transform
The field distribution on face is penetrated, drawing two dimensional image can be used to reflecting surface performance detection and analysis.By analyzing not same polarization side
The reflecting surface field distribution data of formula and frequency, the present invention can intuitively detect the performance of reflecting surface under respective conditions, including
ELECTROMAGNETIC REFLECTION intensity, phase perturbation, edge diffraction etc. have darkroom reflecting surface development, service check and reflecting surface reparation etc.
It is significant.
Detailed description of the invention
Fig. 1 is the key step schematic diagram of the method for the detection Compact Range reflecting surface performance of the embodiment of the present invention；
Fig. 2 is the Compact Range coordinate system and dead zone data collection system schematic diagram of the embodiment of the present invention；
Fig. 3 is the Compact Range reflecting surface simulation model schematic diagram of the embodiment of the present invention；
Fig. 4 is the dead zone center cross-sectional electric field amplitude distribution schematic diagram of the embodiment of the present invention；
Fig. 5 is the dead zone center cross-sectional electric field phase distribution schematic diagram of the embodiment of the present invention；
Fig. 6 is the reflecting surface electric field amplitude distribution schematic diagram of the embodiment of the present invention；
Fig. 7 is the reflecting surface electric field phase distribution schematic diagram of the embodiment of the present invention.
Specific embodiment
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with the embodiment of the present invention
In attached drawing, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described embodiment is
A part of the embodiments of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, ordinary skill people
Member's every other embodiment obtained without making creative work, shall fall within the protection scope of the present invention.
Fig. 1 is the key step schematic diagram of the method for the detection Compact Range reflecting surface performance of the embodiment of the present invention.Such as Fig. 1 institute
Show, following steps can be performed in the method for the detection Compact Range reflecting surface performance of the embodiment of the present invention:
Step S101: sampling is carried out in Compact Range dead zone cross section and obtains two dimensional electric field distributed data.
In this step, following rectangular coordinate system in space can be initially set up: using Compact Range dead zone center as origin, with level
Direction (i.e. a preset direction of horizontal plane) is Y direction, with vertical direction (i.e. vertical level direction, such as vertical-horizontal
Direction upwardly) it is X-direction, to be directed toward the direction of reflecting surface from dead zone center as Z-direction.Fig. 2 is implementation of the present invention
The Compact Range coordinate system and dead zone data collection system schematic diagram of example, the foundation of above-mentioned coordinate system and the acquisition for tightening field data
It can be found in Fig. 2.In the acquisition system of field distribution data in dead zone shown in Fig. 2, the electromagnetic wave of feed radiation is anti-by reflecting surface
Quasi-plane wave is formed in dead zone after penetrating, motion scan frame and receiving transducer is moved in X direction in the Y direction (i.e. receiving transducer can be in z
=0 plane carries out the two-dimensional movement of X, Y-direction), it can be sampled, be obtained in dead zone cross section (i.e. the plane of z=0)
Two dimensional electric field distributed data.
In concrete application, the sampling interval need to meet following formula:
Wherein, Δ x is the sampling interval of X-direction, and Δ y is the sampling interval of Y-direction, and λ is measuring signal wavelength, DxIt is anti-
Face is penetrated in the length of X-direction, DyFor the length of reflecting surface in the Y direction, LxLength for scanning surface in X-direction, LyExist for scanning surface
The length of Y-direction, zminThe minimum range of reflecting surface is projected to for sampled point.It is appreciated that scanning surface refers to that receiving transducer exists
Locating plane in sampling process.
Step S102: carrying out two dimensional inverse fourier transform to the two dimensional electric field distributed data, obtains the flat of measuring signal
Surface wave Spectral structure data.
In this step, two dimensional inverse fourier transform is carried out to the two dimensional electric field distributed data using following formula, obtained
To the spectrum of plane waves distributed data of measuring signal:
Wherein, F (kx,ky, z=0) be the measuring signal spectrum of plane waves distributed data, kxIt is wave number k in X-direction
Component, kyFor the component of wave number k in the Y direction, E (x, y, z=0) is the two dimensional electric field distributed data that sampling obtains, and j is imaginary number list
Position.
Step S103: spatial alternation function of the electromagnetic wave in the communication process from sampled point to reflecting surface, and benefit are determined
The spectrum of plane waves distributed data is handled with the spatial alternation function, obtains the spectrum of plane waves distribution number of reflecting surface
According to.
In embodiments of the present invention, it needs spectrum of plane waves distributed data (the i.e. plane wave of z=0 plane of measuring signal
Spectral structure data) it is transformed to spectrum of plane waves distributed data (the i.e. z=z of reflecting surface0The spectrum of plane waves distributed data of plane, z0For from
Sampled point projects to the distance of reflecting surface), at this time it needs to be determined that space in back-propagation process from sampled point to reflecting surface
Transforming function transformation function.It is appreciated that above-mentioned backpropagation is referred to the actual direction of propagation of measuring signal on the contrary, above-mentioned spatial alternation
Function can characterize decaying and constraint of the electromagnetic wave in back-propagation process, can be equivalent to a spatial filter function.
According to spectrum of plane waves theory, the spectrum of plane waves distribution on reflecting surface be may be expressed as:
Wherein, F (kx,ky, z=z0) be reflecting surface spectrum of plane waves distributed data, z0To project to reflecting surface from sampled point
Distance.Since reflecting surface is usually paraboloid curved surface, the distance of different sampled points to reflecting surface is different, i.e. z0Be with instead
Penetrate face and the relevant variable of sampling point position.It is appreciated that above formula is only theoretical formula, and non-present invention is practical uses
Formula.
In view of test scene shown in Fig. 2, the spectrum of plane waves component of not each direction of propagation has been involved in superposition and has asked
The process of resultant field, contributive to resultant field is that the direction of propagation existsBorder circular areas in spectrum of plane waves part, because
The spatial alternation function (i.e. equivalent spatial filter function) that this dead zone spectrum of plane waves propagates backward to reflecting surface may be expressed as:
Wherein, H (kx,ky) it is the spatial alternation function.
At this point, reflection can be obtained multiplied by the spatial alternation function in the spectrum of plane waves distributed data of the measuring signal
The spectrum of plane waves distributed data in face, it may be assumed that
F(kx,ky, z=z0)=F (kx,ky, z=0) and H (kx,ky)
Step S104: two-dimension fourier transform is carried out to the spectrum of plane waves distributed data of the reflecting surface, obtains reflecting surface
Two dimensional electric field distributed data；Two dimensional electric field distributed data according to the reflecting surface detects reflecting surface performance.
In this step, the two-dimension fourier transform can be carried out according to following formula:
Wherein, E (x, y, z=z0) be reflecting surface two dimensional electric field distributed data.
Through the above steps, the two dimensional electric field distributed data of reflecting surface can be obtained.By analyze different polarization modes and
The reflecting surface field distribution data of frequency, the present invention can intuitively detect the performance of reflecting surface under respective conditions, including electromagnetism
Reflected intensity, phase perturbation, edge diffraction etc. have weight to darkroom reflecting surface development, service check and reflecting surface reparation etc.
Want meaning.
Fig. 3 is the Compact Range reflecting surface simulation model schematic diagram of the embodiment of the present invention, and the parabolic surface of reflecting surface is
x2+y2=24z, dead zone X, Y-direction sampling interval be 0.01 meter, polarization mode is double horizontal polarizations, and signal frequency is
5GHz.The emulation data of dead zone field distribution are as shown in Figure 4, Figure 5.Fig. 4 is that the electric field amplitude at dead zone center is distributed, and Fig. 5 is dead zone
The electric field phase at center is distributed.In figures 4 and 5, abscissa is Y-direction distance, and ordinate is X-direction distance, in Fig. 4 not
Indicate that different electric field amplitude sizes, the different gray scales in Fig. 5 indicate different phase sizes with gray scale.Through of the present invention
The reflecting surface electric field amplitude obtained after inversion method processing is distributed as shown in fig. 6, phase distribution is as shown in Figure 7.In Fig. 6 and Fig. 7
In, abscissa is Y-direction distance, and ordinate is X-direction distance, and the different gray scales in Fig. 6 indicate different electric field amplitude sizes,
Different gray scales in Fig. 7 indicate different phase sizes.As can be seen from Figure 6 presence is stronger near the sawtooth of reflecting surface top edge
Edge diffraction, the interference that the reflection amplitudes of four corners are subject to is smaller, the corresponding also small (arrow above such as Fig. 6 of phase perturbation
Head and dotted line frame are signified).
In embodiments of the present invention, a kind of device for detecting Compact Range reflecting surface performance, the device are also provided can include: electricity
Field distribution acquiring unit, first wave Spectral structure computing unit, the second wave spectrum distribution computing unit and detection unit.
Wherein, field distribution acquiring unit can be used for carrying out sampling in Compact Range dead zone cross section obtaining two dimensional electric field distribution
Data；First wave Spectral structure computing unit can be used for carrying out two dimensional inverse fourier transform to the two dimensional electric field distributed data, obtain
Obtain the spectrum of plane waves distributed data of measuring signal；Second wave spectrum distribution computing unit can be used for determining electromagnetic wave from sampled point to
Spatial alternation function in the communication process of reflecting surface, and using the spatial alternation function to the spectrum of plane waves distributed data
It is handled, obtains the spectrum of plane waves distributed data of reflecting surface；Detection unit can be used for the spectrum of plane waves point to the reflecting surface
Cloth data carry out two-dimension fourier transform, obtain the two dimensional electric field distributed data of reflecting surface；Two dimension electricity according to the reflecting surface
Field distribution Data Detection reflecting surface performance.
As a preferred embodiment, described device can further comprise establishment of coordinate system unit, for Compact Range dead zone
Center is that origin establishes rectangular coordinate system in space；Wherein, X-direction is vertical direction, and Y direction is horizontal direction, Z-direction
The direction of reflecting surface is directed toward for dead zone center；The sampling interval of the sampling meets following formula:
First wave Spectral structure computing unit is further used for: carrying out two to the two dimensional electric field distributed data using following formula
Tie up inverse fourier transform:
Wherein, Δ x is the sampling interval of X-direction, and Δ y is the sampling interval of Y-direction, and λ is measuring signal wavelength, DxIt is anti-
Face is penetrated in the length of X-direction, DyFor the length of reflecting surface in the Y direction, LxLength for scanning surface in X-direction, LyExist for scanning surface
The length of Y-direction, zminThe minimum range of reflecting surface is projected to for sampled point；F(kx,ky, z=0) and it is the flat of the measuring signal
Surface wave Spectral structure data, kxComponent for wave number k in X-direction, kyFor the component of wave number k in the Y direction, E (x, y, z=0) is sampling
The two dimensional electric field distributed data of acquisition, j are imaginary unit.
Preferably, the spatial alternation function can be shown below:
Wherein, H (kx,ky) it is the spatial alternation function, z0For the distance for projecting to reflecting surface from sampled point.
In addition, in embodiments of the present invention, the second wave spectrum distribution computing unit can be further used for: by the measuring signal
Spectrum of plane waves distributed data multiplied by the spatial alternation function；
Detection unit is further used for: the two-dimension fourier transform is carried out according to following formula:
Wherein, E (x, y, z=z0) be reflecting surface two dimensional electric field distributed data, F (kx,ky, z=z0) it is the flat of reflecting surface
Surface wave Spectral structure data.
In conclusion in the technical solution of the embodiment of the present invention, a kind of the anti-of detection Compact Range reflecting surface performance is provided
Method is drilled, solves the problems, such as that reflecting surface performance is difficult to examine in previous Compact Range darkroom.Specifically, the present invention is tightening first
The two dimensional electric field distributed data that sampling obtains particular polarization mode is carried out on the dead zone cross section of field, then to two dimensional electric field distribution number
The spectrum of plane waves distribution that measuring signal is obtained according to two dimensional inverse fourier transform is carried out, calculates equal with back-propagation process later
The spatial filter function (i.e. spatial alternation function) of effect, and place is filtered to the distribution of above-mentioned spectrum of plane waves using above-mentioned function
Reason is to obtain the distribution of the spectrum of plane waves on reflecting surface；Finally the spectrum of plane waves of reflecting surface is distributed and is reflected as Fourier transform
Field distribution on face, drawing two dimensional image can be used to reflecting surface performance detection and analysis.By analyzing different polarization modes
With the reflecting surface field distribution data of frequency, the present invention can intuitively detect the performance of reflecting surface under respective conditions, including electricity
Magnetoreflection intensity, phase perturbation, edge diffraction etc. have darkroom reflecting surface development, service check and reflecting surface reparation etc.
Significance.
Finally, it should be noted that the above embodiments are merely illustrative of the technical solutions of the present invention, rather than its limitations；Although
Present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that: it still may be used
To modify the technical solutions described in the foregoing embodiments or equivalent replacement of some of the technical features；
And these are modified or replaceed, technical solution of various embodiments of the present invention that it does not separate the essence of the corresponding technical solution spirit and
Range.
Claims (10)
1. a kind of method for detecting Compact Range reflecting surface performance characterized by comprising
Sampling, which is carried out, in Compact Range dead zone cross section obtains two dimensional electric field distributed data；
Two dimensional inverse fourier transform is carried out to the two dimensional electric field distributed data, obtains the spectrum of plane waves distribution number of measuring signal
According to；
It determines spatial alternation function of the electromagnetic wave in the communication process from sampled point to reflecting surface, and utilizes the spatial alternation
Function handles the spectrum of plane waves distributed data, obtains the spectrum of plane waves distributed data of reflecting surface；
Two-dimension fourier transform is carried out to the spectrum of plane waves distributed data of the reflecting surface, obtains the two dimensional electric field distribution of reflecting surface
Data；Two dimensional electric field distributed data according to the reflecting surface detects reflecting surface performance.
2. the method according to claim 1, wherein
The method further includes: rectangular coordinate system in space is established using Compact Range dead zone center as origin；Wherein, X-direction
For vertical direction, Y direction is horizontal direction, and Z-direction is the direction that reflecting surface is directed toward at dead zone center；And
The sampling interval of the sampling meets following formula:
Wherein, Δ x is the sampling interval of X-direction, and Δ y is the sampling interval of Y-direction, and λ is measuring signal wavelength, DxFor reflecting surface
In the length of X-direction, DyFor the length of reflecting surface in the Y direction, LxLength for scanning surface in X-direction, LyIt is scanning surface in the side Y
To length, zminThe minimum range of reflecting surface is projected to for sampled point.
3. according to the method described in claim 2, it is characterized in that, described carry out two-dimentional Fu to the two dimensional electric field distributed data
Vertical leaf inverse transformation, specifically includes:
Two dimensional inverse fourier transform is carried out to the two dimensional electric field distributed data using following formula:
Wherein, F (kx,ky, z=0) be the measuring signal spectrum of plane waves distributed data, kxFor wave number k X-direction component,
kyFor the component of wave number k in the Y direction, E (x, y, z=0) is the two dimensional electric field distributed data that sampling obtains, and j is imaginary unit.
4. according to the method described in claim 2, it is characterized in that, the spatial alternation function is shown below:
Wherein, H (kx,ky) it is the spatial alternation function, z0For the distance for projecting to reflecting surface from sampled point.
5. according to the method described in claim 2, it is characterized in that, described utilize the spatial alternation function to the plane wave
Spectral structure data are handled, and are specifically included:
By the spectrum of plane waves distributed data of the measuring signal multiplied by the spatial alternation function.
6. according to any method of claim 2-5, which is characterized in that the spectrum of plane waves to the reflecting surface is distributed
Data carry out two-dimension fourier transform, specifically include:
The two-dimension fourier transform is carried out according to following formula:
Wherein, E (x, y, z=z0) be reflecting surface two dimensional electric field distributed data, F (kx,ky, z=z0) be reflecting surface plane wave
Spectral structure data.
7. a kind of device for detecting Compact Range reflecting surface performance characterized by comprising
Field distribution acquiring unit obtains two dimensional electric field distributed data for carrying out sampling in Compact Range dead zone cross section；
First wave Spectral structure computing unit is obtained for carrying out two dimensional inverse fourier transform to the two dimensional electric field distributed data
The spectrum of plane waves distributed data of measuring signal；
Second wave spectrum is distributed computing unit, for determining that space of the electromagnetic wave in the communication process from sampled point to reflecting surface becomes
Exchange the letters number, and the spectrum of plane waves distributed data is handled using the spatial alternation function, obtain the plane of reflecting surface
Wave spectrum distributed data；
Detection unit carries out two-dimension fourier transform for the spectrum of plane waves distributed data to the reflecting surface, obtains reflecting surface
Two dimensional electric field distributed data；Two dimensional electric field distributed data according to the reflecting surface detects reflecting surface performance.
8. device according to claim 7, which is characterized in that
Described device further comprises establishment of coordinate system unit, is sat for establishing space right-angle as origin using Compact Range dead zone center
Mark system；Wherein, X-direction is vertical direction, and Y direction is horizontal direction, and Z-direction is the side that reflecting surface is directed toward at dead zone center
To；
The sampling interval of the sampling meets following formula:
First wave Spectral structure computing unit is further used for: carrying out two-dimentional Fu to the two dimensional electric field distributed data using following formula
Vertical leaf inverse transformation:
Wherein, Δ x is the sampling interval of X-direction, and Δ y is the sampling interval of Y-direction, and λ is measuring signal wavelength, DxFor reflecting surface
In the length of X-direction, DyFor the length of reflecting surface in the Y direction, LxLength for scanning surface in X-direction, LyIt is scanning surface in the side Y
To length, zminThe minimum range of reflecting surface is projected to for sampled point；F(kx,ky, z=0) be the measuring signal plane wave
Spectral structure data, kxComponent for wave number k in X-direction, kyFor the component of wave number k in the Y direction, E (x, y, z=0) is that sampling obtains
Two dimensional electric field distributed data, j is imaginary unit.
9. device according to claim 8, which is characterized in that
The spatial alternation function is shown below:
Wherein, H (kx,ky) it is the spatial alternation function, z0For the distance for projecting to reflecting surface from sampled point.
10. device according to claim 8 or claim 9, which is characterized in that
Second wave spectrum distribution computing unit is further used for: by the spectrum of plane waves distributed data of the measuring signal multiplied by the sky
Between transforming function transformation function；
Detection unit is further used for: the two-dimension fourier transform is carried out according to following formula:
Wherein, E (x, y, z=z0) be reflecting surface two dimensional electric field distributed data, F (kx,ky, z=z0) be reflecting surface plane wave
Spectral structure data.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111208359A (en) * | 2020-02-06 | 2020-05-29 | 北京环境特性研究所 | Compact range reflecting surface side tooth and design method |
| CN113296067A (en) * | 2021-04-29 | 2021-08-24 | 北京邮电大学 | Compact range measuring system |
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