CN109444626B - Short circuit test system between motor phase changer sheets and working method thereof - Google Patents
Short circuit test system between motor phase changer sheets and working method thereof Download PDFInfo
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- CN109444626B CN109444626B CN201811261741.XA CN201811261741A CN109444626B CN 109444626 B CN109444626 B CN 109444626B CN 201811261741 A CN201811261741 A CN 201811261741A CN 109444626 B CN109444626 B CN 109444626B
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- 238000001514 detection method Methods 0.000 claims description 20
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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Abstract
The invention discloses a short circuit test system between motor phase changer sheets and a working method thereof, and relates to the field of short circuit test of motor phase changer. The traditional short circuit tester has large volume, high cost and inconvenient movement, and greatly limits the application of the short circuit tester in the industry of phase changers. The invention comprises a probe connected with a phase changer and a testing device for detecting the voltage of the probe, wherein the testing device comprises a main control chip and a main control chip peripheral circuit, the main control chip peripheral circuit comprises a testing circuit and a power supply circuit for supplying power, and the probe is divided into an upper layer probe and a lower layer probe; the test circuit comprises an upper layer probe test circuit connected with the upper layer probe and a lower layer probe test circuit connected with the lower layer probe; the number of test circuits corresponds to the number of probes to test the voltage of each probe. Through the weak current structure of chip control, reduced the volume of instrument greatly, can reduce the weight of check out test set effectively, reduced batch production's cost, conveniently carry the application.
Description
Technical Field
The invention relates to the field of short circuit test of motor phase shifters, in particular to a short circuit test system between motor phase shifters.
Background
The phase changer is a key component which can enable the motor to rotate continuously on the direct current motor and the alternating current phase changer motor, so the phase changer is widely applied to the fields of electric tools, automobile motors, household appliances, industrial motors and the like; in recent years, as the scale of related industries is continuously increased, the development trend is better, and the demand of the market for the phase changer is increasing. The short circuit test is a test which is critical in the phase changer test project, and the traditional short circuit tester has large volume, high cost and inconvenient movement, thereby greatly limiting the application of the short circuit tester in the phase changer industry.
Disclosure of Invention
The invention aims to solve the technical problems and provide the technical task of perfecting and improving the prior art scheme, and provides the motor phase changer inter-chip short circuit test system, so as to realize the miniaturization of the test system and achieve the purpose of convenient carrying and application. For this purpose, the present invention adopts the following technical scheme.
The short circuit test system between the motor phase changer sheets comprises a probe and a test device, wherein the probe is used for being connected with the phase changer, the test device is used for detecting the voltage of the probe, the test device comprises a main control chip and a main control chip peripheral circuit, the main control chip peripheral circuit comprises a test circuit and a power supply circuit used for supplying power, and the probe is divided into an upper layer probe and a lower layer probe; the test circuit comprises an upper layer probe test circuit connected with the upper layer probe and a lower layer probe test circuit connected with the lower layer probe; the number of test circuits corresponds to the number of probes to test the voltage of each probe. Through the weak current structure of chip control, reduced the volume of instrument greatly, can reduce the weight of check out test set effectively, reduced batch production's cost, conveniently carry the application.
As a further improvement and supplement to the above-mentioned technical solutions, the present invention also includes the following additional technical features.
As a preferable technical means: the control end PX of the upper layer probe test circuit is connected with the pin of the main control chip, and the detection end of the upper layer probe test circuit is connected with the upper measurement and control needle; the upper layer probe test circuit comprises a first triode with a base connected with the control end and a switching tube connected with a collector of the first triode, and the detection end is connected with the switching tube. The detection and control of the upper layer probe are realized.
As a preferable technical means: the upper layer probe test circuit also comprises a voltage limiting resistor R1, a protection resistor R2 and a pull-up resistor R3, wherein the first triode is an NPN triode, the base electrode of the first triode is connected with the control end through the voltage limiting resistor R1, and the collector electrode of the first triode is connected with the power supply through the pull-up resistor R3. Helping to realize good detection of upper layer probe contact.
As a preferable technical means: the switching tube is an NMOS tube, the grid electrode of the switching tube is connected with the collector electrode of the first triode, and the drain electrode of the switching tube is connected with a power supply through a pull-up resistor R4; the control end is connected with the drain electrode, and the source electrode of the switching tube is grounded.
As a preferable technical means: the control end POUTX of the lower-layer probe test circuit is connected with the pin of the main control chip, the lower-layer probe test circuit comprises a second triode and a relay, one end of the relay is connected with the lower-layer probe, the other end of the relay is grounded, the base electrode of the second triode is connected with the control end POUTX, and the collector electrode of the second triode is connected with the relay coil. The detection and control of the lower probe are realized.
As a preferable technical means: the lower-layer probe test circuit also comprises a voltage limiting resistor R5, a protection resistor R6 and a pull-up resistor R7, wherein the second triode is an NPN triode, the base electrode of the second triode is connected with the control end POUTX through the voltage limiting resistor R5, and the collector electrode of the second triode is connected with a power supply through the pull-up resistor R3. Helping to realize good detection of the contact of the lower probe.
As a preferable technical means: the main control chip is connected with the external expansion board through an expansion board interface, and the external expansion board is provided with the lower-layer probe test circuit. The expansion, maintenance and replacement are convenient, the maintenance is convenient, and the complexity is reduced.
As a preferable technical means: the main control chip, the upper layer probe test circuit and the probe interface connected with the upper layer probe test circuit are arranged on a PCB board, and the probe interface is matched with the probe. The circuit structure of the main control board is miniaturized.
As a preferable technical means: the testing system also comprises a PLC and a display, wherein the main control chip is connected with the PLC through a communication interface, and the PLC is connected with the display. Is convenient for man-machine interaction and operation control.
Another object of the present invention is to provide a method for operating a short circuit test system between motor phase changer plates, comprising the steps of:
1) Preparing, namely respectively inserting probes into the probe interfaces;
2) Detecting whether the probe is in good contact:
The control end PX of the upper probe test circuit outputs a high level, the first triode is conducted, the potential of the collector electrode of the NPN triode is pulled down, the NMOS tube is not conducted, the potential of the drain electrode of the NMOS tube is high, and the upper probe is connected with the high level;
The control end POUT of the lower-layer probe test circuit outputs a low level, the second triode is not conducted, the collector potential of the second triode is a high level, the relay K is closed, and the lower-layer probe is connected with the low level; when the upper layer probe and the lower layer probe are contacted with the copper sheet at the same time, if the upper layer probe and the lower layer probe are well contacted, the high level of the drain electrode of the NMOS tube is pulled down, otherwise, the drain electrode of the NMOS tube is unchanged; the judgment is completed as to whether the probe is in good contact.
3) Detecting whether a short circuit exists between any two plates of the phase changer:
The control end POUT of the lower-layer probe test circuit outputs high level, the NPN triode is conducted, the collector potential of the second triode is low level, the relay K is disconnected, namely the inter-chip short circuit test does not consider the lower-layer probe;
First test: the P port of the main control chip outputs a low level, the NPN triode is not conducted, the collector electrode of the first triode is high level, namely the NMOS tube is conducted, the drain electrode potential of the NMOS tube is pulled down, the corresponding upper-layer probe is low level, the P ports connected with other upper-layer probe test circuits output high level, namely the other upper-layer probes are all high level, if the probes are short-circuited with the upper-layer probes, the potential of the corresponding probes is pulled down, and if no probes are short-circuited, the potential of all the probes is kept unchanged;
Second test: the next P port of the main control chip outputs a low level, the other P ports output a high level, if a probe is short-circuited with an upper layer probe, the potential of the corresponding probe is pulled down, and if no probe is short-circuited, the potential of all the probes is kept unchanged. And (5) sequentially circulating to detect whether the short circuit exists between any two plates of the phase changer. The method conveniently realizes the judgment of whether the probe is in good contact or not and the detection of whether the short circuit exists between any two plates of the phase changer or not, and has the advantages of simple working method and convenient operation.
The beneficial effects are that: the method has the advantages that the judgment on whether the probe is in good contact or not and the detection on whether the short circuit exists between any two plates of the phase changer are conveniently realized, the working method is simple, and the operation is convenient; the chip-controlled weak circuit structure greatly reduces the volume of the instrument, effectively reduces the weight, reduces the cost of mass production and is convenient to carry and apply.
Drawings
Fig. 1 is a schematic diagram of the system of the present invention.
FIG. 2 is a schematic diagram of the connection of the probe to the phase changer according to the present invention.
FIG. 3 is a schematic diagram of an upper layer probe test circuit according to the present invention.
FIG. 4 is a schematic diagram of an underlying probe test circuit according to the present invention.
In the figure: 1-a main control chip; 2-externally hanging expansion boards; 3-expansion plate interface; 4-a display; 5-upper layer probes; 6-lower layer probes; 7-copper sheets; 8-phase changer.
Detailed Description
The technical scheme of the invention is further described in detail below with reference to the attached drawings.
As shown in fig. 1-4, a short circuit test system between motor phase changer sheets comprises a probe connected with a phase changer 8 and a test device for detecting the voltage of the probe, wherein the test device comprises a main control chip 1 and a peripheral circuit of the main control chip 1, the peripheral circuit of the main control chip 1 comprises a test circuit and a power supply circuit for supplying power, and the probe is divided into an upper layer probe 5 and a lower layer probe 6; the test circuit comprises an upper layer probe 5 test circuit connected with the upper layer probe 5 and a lower layer probe 6 test circuit connected with the lower layer probe 6; the number of test circuits corresponds to the number of probes to test the voltage of each probe.
In order to realize the detection and control of the upper probe 5, a control end PX of a testing circuit of the upper probe 5 is connected with a pin of the main control chip 1, and a detection end of the testing circuit of the upper probe 5 is connected with an upper measurement and control needle; the upper layer probe 5 test circuit comprises a first triode with a base connected with a control end and a switch tube connected with a collector of the first triode, and the detection end is connected with the switch tube. The detection and control of the upper layer probe 5 are realized.
In order to facilitate judging whether the upper probe 5 has effective contact, the upper probe 5 test circuit further comprises a voltage limiting resistor R1, a protection resistor R2 and a pull-up resistor R3, wherein the first triode is an NPN triode, the base electrode of the first triode is connected with the control end through the voltage limiting resistor R1, the collector electrode of the first triode is connected with the power supply through the pull-up resistor R3, the switch tube is an NMOS tube, the grid electrode of the switch tube is connected with the collector electrode of the first triode, and the drain electrode of the switch tube is connected with the power supply through the pull-up resistor R4; the control end is connected with the drain electrode, and the source electrode of the switch tube is grounded. Helping to achieve a good detection of the upper layer probe 5 contact.
In order to realize the detection and control of the lower-layer probe 6, a control end POUTX of a lower-layer probe 6 testing circuit is connected with a pin of the main control chip 1, the lower-layer probe 6 testing circuit comprises a second triode and a relay, one end of the relay is connected with the lower-layer probe 6, the other end of the relay is grounded, a base electrode of the second triode is connected with a control end POUTX, and a collector electrode of the second triode is connected with a relay coil. Detection and control of the lower probe 6 is achieved.
In order to judge whether the lower-layer probe 6 has effective contact or not, the lower-layer probe 6 testing circuit further comprises a voltage limiting resistor R5, a protection resistor R6 and a pull-up resistor R7, the second triode is an NPN triode, the base electrode of the second triode is connected with the control end POUTX through the voltage limiting resistor R5, and the collector electrode of the second triode is connected with a power supply through the pull-up resistor R3. Helping to achieve a good detection of the contact of the underlying probe 6.
In order to facilitate maintenance, the main control chip 1 is connected with the external expansion board 2 through the expansion board interface 3, and a lower layer probe 6 test circuit is arranged on the external expansion board 2. The expansion, maintenance and replacement are convenient, the maintenance is convenient, and the complexity is reduced.
In order to realize the miniaturization of the system equipment, the main control chip 1, the upper layer probe 5 test circuit and the probe interface connected with the upper layer probe 5 test circuit are arranged on a PCB board, and the probe interface is matched with the probe. The circuit structure of the main control board is miniaturized, and the detection equipment is miniaturized conveniently.
In order to facilitate man-machine interaction, the testing system further comprises a PLC and a display 4, wherein the main control chip 1 is connected with the PLC through a communication interface, and the PLC is connected with the display 4. Is convenient for man-machine interaction and operation control.
The working process of the motor phase-change device inter-sheet short circuit test system comprises the following steps:
1) Preparing, namely respectively inserting probes into the probe interfaces;
2) Detecting whether the probe is in good contact:
The control end PX of the upper probe 5 test circuit outputs a high level, the first triode is conducted, the potential of the collector of the NPN triode is pulled down, the NMOS tube is not conducted, the potential of the drain electrode of the NMOS tube is high, and the upper probe 5 is connected with the high level;
the control end POUT of the lower-layer probe 6 test circuit outputs a low level, the second triode is not conducted, the collector potential of the second triode is a high level, the relay K is closed, and the lower-layer probe 6 is connected with the low level; when the upper layer probe 5 and the lower layer probe 6 are simultaneously contacted with the copper sheet 7, if the upper layer probe 6 and the lower layer probe 6 are well contacted, the high level of the drain electrode of the NMOS tube is pulled down, otherwise, the high level is unchanged; the judgment is completed as to whether the probe is in good contact.
3) Detecting whether any two plates of the phase changer 8 are short-circuited:
The control end POUT of the test circuit of the lower-layer probe 6 outputs high level, the NPN triode is conducted, the collector potential of the second triode is low level, the relay K is disconnected, namely the inter-chip short circuit test does not consider the lower-layer probe 6;
First test: the P port of the main control chip 1 outputs a low level, the NPN triode is not conducted, the collector of the first triode is high level, namely the NMOS tube is conducted, the drain potential of the NMOS tube is pulled down, the corresponding upper layer probe 5 is low level, the P ports connected with the test circuits of other upper layer probes 5 output high level, namely the other upper layer probes 5 are high level, if the probes are short-circuited with the upper layer probes 5, the potential of the corresponding probes is pulled down, and if no probes are short-circuited, the potential of all the probes is kept unchanged;
Second test: the next P port of the main control chip 1 outputs a low level, the other P ports output a high level, if a probe is short-circuited with the upper layer probe 5, the potential of the corresponding probe is pulled down, and if no probe is short-circuited, the potential of all the probes is kept unchanged. The method is characterized in that the method is sequentially circulated, and whether the short circuit exists between any two sheets of the phase changer 8 can be detected; the method conveniently realizes the judgment of whether the probe is in good contact or not and the detection of whether the short circuit exists between any two pieces of the phase changer 8 or not, and has simple working method and convenient operation.
In this example, the main control chip 1 adopts an STM32 chip, the communication interface adopts a 485 interface, and the display 4 adopts an HMI touch screen.
The short circuit test system between motor phase changer sheets shown in the above figures 1-4 is a specific embodiment of the invention, has already shown the essential characteristics and improvements of the invention, and can be equivalently modified in terms of shape, structure and the like according to practical use requirements under the teaching of the invention, which are all within the scope of protection of the scheme.
Claims (9)
1. A short circuit test system between motor phase changer pieces is characterized in that: the testing device comprises a main control chip (1) and a peripheral circuit of the main control chip (1), wherein the peripheral circuit of the main control chip (1) comprises a testing circuit and a power supply circuit for supplying power, and the probes are divided into an upper layer probe (5) and a lower layer probe (6); the test circuit comprises an upper layer probe (5) test circuit connected with the upper layer probe (5) and a lower layer probe (6) test circuit connected with the lower layer probe (6); the number of the test circuits corresponds to the number of the probes to test the voltage of each probe;
The testing method comprises the following steps:
1) Preparing, namely respectively inserting probes into the probe interfaces;
2) Detecting whether the probe is in good contact:
the control end PX of the upper probe (5) test circuit outputs a high level, the first triode is conducted, the potential of the collector electrode of the NPN triode is pulled down, the NMOS tube is not conducted, the potential of the drain electrode of the NMOS tube is high, and the upper probe (5) is connected with the high level;
The control end POUT of the test circuit of the lower-layer probe (6) outputs a low level, the second triode is not conducted, the collector potential of the second triode is a high level, the relay K is closed, and the lower-layer probe (6) is connected with the low level; when the upper layer probe (5) and the lower layer probe (6) are simultaneously contacted with the copper sheet (7), if the upper layer probe (6) and the lower layer probe (6) are well contacted, the high level of the drain electrode of the NMOS tube is pulled down, otherwise, the drain electrode of the NMOS tube is unchanged; judging whether the probe is in good contact or not;
3) Detecting whether any two plates of the phase changer (8) are short-circuited or not:
The control end POUT of the test circuit of the lower-layer probe (6) outputs high level, the NPN triode is conducted, the collector potential of the second triode is low level, the relay K is disconnected, namely the inter-chip short circuit test does not consider the lower-layer probe (6);
First test: a P port of the main control chip (1) outputs a low level, an NPN triode is not conducted, a first triode collector is high level, namely an NMOS tube is conducted, the drain potential of the NMOS tube is pulled down, the corresponding upper layer probe (5) is low level, P ports connected with test circuits of other upper layer probes (5) output high level, namely other upper layer probes (5) are all high level, if a probe is short-circuited with the upper layer probe (5), the potential of the corresponding probe is pulled down, and if no probe is short-circuited, the potential of all probes is kept unchanged;
Second test: the next P port of the main control chip (1) outputs a low level, the other P ports output a high level, if a probe is short-circuited with the upper layer probe (5), the potential of the corresponding probe is pulled down, and if no probe is short-circuited, the potential of all the probes is kept unchanged; and (3) sequentially circulating to detect whether the short circuit exists between any two sheets of the phase changer (8).
2. The motor inverter inter-chip short circuit test system according to claim 1, wherein: the control end PX of the upper layer probe (5) testing circuit is connected with the pin of the main control chip (1), and the detection end of the upper layer probe (5) testing circuit is connected with the upper layer probe (5); the upper layer probe (5) testing circuit comprises a first triode with a base connected with a control end and a switching tube connected with a collector of the first triode, and the detection end is connected with the switching tube.
3. The motor inverter inter-chip short circuit test system according to claim 2, wherein: the upper probe (5) testing circuit further comprises a voltage limiting resistor R1, a protection resistor R2 and a pull-up resistor R3, the first triode is an NPN triode, the base electrode of the first triode is connected with the control end through the voltage limiting resistor R1, and the collector electrode of the first triode is connected with the power supply through the pull-up resistor R3.
4. A motor inverter inter-chip short circuit test system according to claim 3, wherein: the switching tube is an NMOS tube, the grid electrode of the switching tube is connected with the collector electrode of the first triode, and the drain electrode of the switching tube is connected with a power supply through a pull-up resistor R4; the source electrode of the switching tube is grounded.
5. The motor inverter inter-chip short circuit test system according to claim 2, wherein: the control end POUTX of the lower-layer probe (6) testing circuit is connected with the pin of the main control chip (1), the lower-layer probe (6) testing circuit comprises a second triode and a relay, one end of the relay is connected with the lower-layer probe (6), the other end of the relay is grounded, the base electrode of the second triode is connected with the control end POUTX, and the collector electrode of the second triode is connected with the relay coil.
6. The motor inverter inter-chip short circuit test system according to claim 5, wherein: the lower-layer probe (6) testing circuit further comprises a voltage limiting resistor R5, a protection resistor R6 and a pull-up resistor R7, the second triode is an NPN triode, the base electrode of the second triode is connected with the control end POUTX through the voltage limiting resistor R5, and the collector electrode of the second triode is connected with a power supply through the pull-up resistor R3.
7. The motor inverter inter-chip short circuit test system according to claim 1, wherein: the main control chip (1) is connected with the external expansion board (2) through the expansion board interface (3), and the external expansion board (2) is provided with the lower layer probe (6) test circuit.
8. The motor inverter inter-chip short circuit test system according to claim 7, wherein: the main control chip (1), the upper layer probe (5) testing circuit and the probe interface connected with the upper layer probe (5) testing circuit are arranged on a PCB board, and the probe interface is matched with the probe.
9. The motor inverter inter-chip short circuit test system according to claim 8, wherein: the testing system also comprises a PLC and a display (4), wherein the main control chip (1) is connected with the PLC through a communication interface, and the PLC is connected with the display (4).
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| CN111060811A (en) * | 2020-01-16 | 2020-04-24 | 珠海市运泰利自动化设备有限公司 | Chip pin position identification module and identification method thereof |
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