CN109444626B - Short circuit test system between motor phase changer sheets and working method thereof - Google Patents

Abstract

The invention discloses a short circuit test system between motor phase changer sheets and a working method thereof, and relates to the field of short circuit test of motor phase changer. The traditional short circuit tester has large volume, high cost and inconvenient movement, and greatly limits the application of the short circuit tester in the industry of phase changers. The invention comprises a probe connected with a phase changer and a testing device for detecting the voltage of the probe, wherein the testing device comprises a main control chip and a main control chip peripheral circuit, the main control chip peripheral circuit comprises a testing circuit and a power supply circuit for supplying power, and the probe is divided into an upper layer probe and a lower layer probe; the test circuit comprises an upper layer probe test circuit connected with the upper layer probe and a lower layer probe test circuit connected with the lower layer probe; the number of test circuits corresponds to the number of probes to test the voltage of each probe. Through the weak current structure of chip control, reduced the volume of instrument greatly, can reduce the weight of check out test set effectively, reduced batch production's cost, conveniently carry the application.

Description

A motor inverter inter-slice short circuit test system and working method thereof

Technical Field

The invention relates to the field of motor commutator short-circuit testing, and in particular to a motor commutator inter-slice short-circuit testing system.

Background technique

The commutator is a key component of DC motors and AC commutator motors that allows the motor to rotate continuously. Therefore, it is widely used in power tools, automotive motors, household appliances, industrial motors and other fields. In recent years, with the continuous expansion of the scale of related industries and the better development trend, the market demand for commutators has increased. Short-circuit test is a crucial test in commutator test projects. Traditional short-circuit testers are large in size, high in cost, and inconvenient to move, which greatly limits the application of short-circuit testers in the commutator industry.

Summary of the invention

The technical problem to be solved and the technical task proposed by the present invention are to improve and perfect the existing technical solutions and provide a motor inverter inter-segment short circuit test system to achieve miniaturization of the test system and facilitate portability and application. To this end, the present invention adopts the following technical solutions.

A motor inverter inter-chip short circuit test system includes a probe connected to the inverter and a test device for detecting the voltage of the probe. The test device includes a main control chip and a peripheral circuit of the main control chip. The peripheral circuit of the main control chip includes a test circuit and a power supply circuit for power supply. The probe is divided into an upper probe and a lower probe; the test circuit includes an upper probe test circuit connected to the upper probe and a lower probe test circuit connected to the lower probe; the number of test circuits corresponds to the number of probes to test the voltage of each probe. The weak current structure controlled by the chip greatly reduces the size of the instrument, can effectively reduce the weight of the detection equipment, reduce the cost of mass production, and is convenient for carrying and application.

As a further improvement and supplement to the above technical solution, the present invention also includes the following additional technical features.

As a preferred technical means: the control end PX of the upper probe test circuit is connected to the pin of the main control chip, and the detection end of the upper probe test circuit is connected to the upper measurement and control pin; the upper probe test circuit includes a first transistor whose base is connected to the control end, a switch tube connected to the collector of the first transistor, and the detection end is connected to the switch tube. Detection and control of the upper probe is realized.

As a preferred technical means: the upper probe test circuit also includes a voltage limiting resistor R1, a protection resistor R2, and a pull-up resistor R3, the first transistor is an NPN transistor, the base of the first transistor is connected to the control end through the voltage limiting resistor R1, and the collector of the first transistor is connected to the power supply through the pull-up resistor R3. This helps to detect whether the upper probe is in good contact.

As an optimal technical means: the switch tube is an NMOS tube, the gate of the switch tube is connected to the collector of the first transistor, and the drain of the switch tube is connected to the power supply through the pull-up resistor R4; the control end is connected to the drain, and the source of the switch tube is grounded.

As a preferred technical means: the control end POUTX of the lower probe test circuit is connected to the pin of the main control chip, and the lower probe test circuit includes a second triode and a relay, one end of the relay is connected to the lower probe, the other end of the relay is grounded, the base of the second triode is connected to the control end POUTX, and the collector of the second triode is connected to the relay coil. Detection and control of the lower probe is realized.

As a preferred technical means: the lower probe test circuit also includes a voltage limiting resistor R5, a protection resistor R6, and a pull-up resistor R7, and the second transistor is an NPN transistor, the base of the second transistor is connected to the control terminal POUTX through the voltage limiting resistor R5, and the collector of the second transistor is connected to the power supply through the pull-up resistor R3. This helps to detect whether the lower probe is in good contact.

As a preferred technical means: the main control chip is connected to the external expansion board through the expansion board interface, and the external expansion board is provided with the lower layer probe test circuit, which is convenient for expansion and maintenance and replacement, and reduces complexity.

As a preferred technical means: the main control chip, the upper probe test circuit and the probe interface connected to the upper probe test circuit are arranged on a PCB board, and the probe interface matches the probe, so as to realize the miniaturization of the circuit structure of the main control board.

As a preferred technical means: the test system also includes a PLC and a display, the main control chip is connected to the PLC via a communication interface, and the PLC is connected to the display, which is convenient for human-computer interaction and operation control.

Another object of the present invention is to provide a working method of a motor inverter inter-slice short circuit test system, which comprises the following steps:

1) Preparation: insert the probes into the probe interfaces respectively;

2) Check whether the probe is in good contact:

The control terminal PX of the upper probe test circuit outputs a high level, the first transistor is turned on, the collector potential of the NPN transistor is pulled down, the NMOS transistor is not turned on, the drain potential of the NMOS transistor is high, and the upper probe is connected to a high level;

The control terminal POUT of the lower probe test circuit outputs a low level, the second transistor is not turned on, the collector potential of the second transistor is a high level, the relay K is closed, and the lower probe is connected to a low level; when the upper probe and the lower probe contact the copper sheet at the same time, if the upper and lower probes are in good contact, the high level of the drain of the NMOS tube is pulled down, otherwise there is no change; the determination of whether the probes are in good contact is completed.

3) Check whether there is a short circuit between any two chips of the inverter:

The control terminal POUT of the lower probe test circuit outputs a high level, the NPN transistor is turned on, the collector potential of the second transistor is a low level, and the relay K is disconnected, that is, the inter-chip short circuit test does not consider the lower probe;

The first test: a P port of the main control chip outputs a low level, the NPN transistor is not turned on, the collector of the first transistor is a high level, that is, the NMOS tube is turned on, the drain potential of the NMOS tube is pulled down, and the corresponding upper probe is a low level. The P ports connected to the other upper probe test circuits output a high level, that is, the other upper probes are all high levels. If a probe is short-circuited with the upper probe, the potential of the corresponding probe is pulled down. If no probe is short-circuited, the potential of all probes remains unchanged.

Second test: The next P port of the main control chip outputs a low level, and other P ports output a high level. If a probe is short-circuited with the upper probe, the potential of the corresponding probe is pulled down. If no probe is short-circuited, the potential of all probes remains unchanged. By cycling in sequence, it is possible to detect whether any two chips of the commutator are short-circuited. It is convenient to determine whether the probes are in good contact and detect whether any two chips of the commutator are short-circuited. The working method is simple and easy to operate.

Beneficial effects: It is convenient to judge whether the probe is in good contact and whether there is a short circuit between any two pieces of the commutator. The working method is simple and the operation is convenient. The weak circuit structure controlled by the chip greatly reduces the size of the instrument, effectively reduces the weight, reduces the cost of mass production, and is convenient for carrying and application.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic diagram of the system of the present invention.

FIG. 2 is a schematic diagram showing the connection between the probe and the phase converter of the present invention.

FIG. 3 is a schematic diagram of an upper probe test circuit of the present invention.

FIG. 4 is a schematic diagram of a lower layer probe test circuit of the present invention.

In the figure: 1-main control chip; 2-external expansion board; 3-expansion board interface; 4-display; 5-upper probe; 6-lower probe; 7-copper sheet; 8-phase inverter.

Detailed ways

The technical solution of the present invention is further described in detail below in conjunction with the accompanying drawings.

As shown in Figures 1-4, a motor inverter inter-chip short-circuit test system includes a probe for connecting to the inverter 8 and a test device for detecting the voltage of the probe. The test device includes a main control chip 1 and a peripheral circuit of the main control chip 1. The peripheral circuit of the main control chip 1 includes a test circuit and a power supply circuit for power supply. The probes are divided into an upper probe 5 and a lower probe 6; the test circuit includes an upper probe 5 test circuit connected to the upper probe 5 and a lower probe 6 test circuit connected to the lower probe 6; the number of test circuits corresponds to the number of probes to test the voltage of each probe.

In order to realize the detection and control of the upper probe 5, the control end PX of the upper probe 5 test circuit is connected to the pin of the main control chip 1, and the detection end of the upper probe 5 test circuit is connected to the upper measurement and control pin; the upper probe 5 test circuit includes a first triode whose base is connected to the control end, a switch tube connected to the collector of the first triode, and the detection end is connected to the switch tube. Detection and control of the upper probe 5 are realized.

In order to facilitate the judgment of whether the upper probe 5 has effective contact, the upper probe 5 test circuit also includes a voltage limiting resistor R1, a protection resistor R2, and a pull-up resistor R3. The first transistor is an NPN transistor. The base of the first transistor is connected to the control end through the voltage limiting resistor R1. The collector of the first transistor is connected to the power supply through the pull-up resistor R3. The switch tube is an NMOS tube. The gate of the switch tube is connected to the collector of the first transistor. The drain of the switch tube is connected to the power supply through the pull-up resistor R4. The control end is connected to the drain, and the source of the switch tube is grounded. This helps to detect whether the upper probe 5 has good contact.

In order to realize the detection and control of the lower probe 6, the control terminal POUTX of the lower probe 6 test circuit is connected to the pin of the main control chip 1, and the lower probe 6 test circuit includes a second triode and a relay, one end of the relay is connected to the lower probe 6, the other end of the relay is grounded, the base of the second triode is connected to the control terminal POUTX, and the collector of the second triode is connected to the relay coil. Detection and control of the lower probe 6 are realized.

In order to facilitate the determination of whether the lower probe 6 has effective contact, the lower probe 6 test circuit also includes a voltage limiting resistor R5, a protection resistor R6, and a pull-up resistor R7. The second transistor is an NPN transistor. The base of the second transistor is connected to the control terminal POUTX through the voltage limiting resistor R5, and the collector of the second transistor is connected to the power supply through the pull-up resistor R3. This helps to detect whether the lower probe 6 has good contact.

For easy maintenance, the main control chip 1 is connected to the external expansion board 2 through the expansion board interface 3, and the external expansion board 2 is provided with a lower layer probe 6 test circuit. It is convenient for expansion and maintenance replacement, convenient for repair, and reduces complexity.

In order to realize the miniaturization of system equipment, the main control chip 1, the upper probe 5 test circuit and the probe interface connected to the upper probe 5 test circuit are arranged on a PCB board, and the probe interface matches the probe. The miniaturization of the circuit structure of the main control board is realized, which is convenient for realizing the miniaturization of the detection equipment.

In order to facilitate human-computer interaction, the test system also includes a PLC and a display 4. The main control chip 1 is connected to the PLC through a communication interface, and the PLC is connected to the display 4. This facilitates human-computer interaction and operation control.

A working process of a motor inverter inter-slice short circuit test system includes the following steps:

1) Preparation: insert the probes into the probe interfaces respectively;

2) Check whether the probe is in good contact:

The control terminal PX of the upper probe 5 test circuit outputs a high level, the first transistor is turned on, the collector potential of the NPN transistor is pulled down, the NMOS transistor is not turned on, the drain potential of the NMOS transistor is high, and the upper probe 5 is connected to a high level;

The control terminal POUT of the lower probe 6 test circuit outputs a low level, the second transistor is not turned on, the collector potential of the second transistor is high, the relay K is closed, and the lower probe 6 is connected to a low level; when the upper probe 5 and the lower probe 6 contact the copper sheet 7 at the same time, if the upper and lower probes 6 are in good contact, the high level of the drain of the NMOS tube is pulled down, otherwise there is no change; the determination of whether the probes are in good contact is completed.

3) Check whether there is a short circuit between any two pieces of the inverter 8:

The control terminal POUT of the lower probe 6 test circuit outputs a high level, the NPN transistor is turned on, the collector potential of the second transistor is a low level, and the relay K is disconnected, that is, the inter-chip short circuit test does not consider the lower probe 6;

The first test: a P port of the main control chip 1 outputs a low level, the NPN transistor is not turned on, the collector of the first transistor is a high level, that is, the NMOS tube is turned on, the drain potential of the NMOS tube is pulled down, and the corresponding upper probe 5 is a low level. The P ports connected to the test circuits of other upper probes 5 output a high level, that is, the other upper probes 5 are all high levels. If a probe is short-circuited with the upper probe 5, the potential of the corresponding probe is pulled down. If no probe is short-circuited, the potential of all probes remains unchanged.

Second test: The next P port of the main control chip 1 outputs a low level, and other P ports output a high level. If a probe is short-circuited with the upper probe 5, the potential of the corresponding probe is pulled down. If no probe is short-circuited, the potential of all probes remains unchanged. By cycling in sequence, it is possible to detect whether any two chips of the phase converter 8 are short-circuited; it is convenient to determine whether the probes are in good contact and detect whether any two chips of the phase converter 8 are short-circuited. The working method is simple and easy to operate.

In this example, the main control chip 1 adopts an STM32 chip, the communication interface adopts a 485 interface, and the display 4 adopts an HMI touch screen.

The motor inverter inter-segment short-circuit test system shown in the above Figures 1-4 is a specific embodiment of the present invention, which has embodied the substantial characteristics and progress of the present invention. According to actual use needs and under the guidance of the present invention, equivalent modifications in shape, structure, etc. can be made to it, which are all within the protection scope of this scheme.

Claims (9)

1. A motor inverter inter-chip short circuit test system, characterized in that it comprises a probe connected to the inverter (8) and a test device for detecting the voltage of the probe, the test device comprising a main control chip (1) and a peripheral circuit of the main control chip (1), the peripheral circuit of the main control chip (1) comprising a test circuit and a power supply circuit for power supply, the probe is divided into an upper probe (5) and a lower probe (6); the test circuit comprises an upper probe (5) test circuit connected to the upper probe (5) and a lower probe (6) test circuit connected to the lower probe (6); the number of the test circuits corresponds to the number of the probes so as to test the voltage of each probe; The test method is: 1) Preparation: insert the probes into the probe interfaces respectively; 2) Check whether the probe is in good contact: The control terminal PX of the upper probe (5) test circuit outputs a high level, the first transistor is turned on, the collector potential of the NPN transistor is pulled down, the NMOS transistor is not turned on, the drain potential of the NMOS transistor is high, and the upper probe (5) is connected to a high level; The control terminal POUT of the lower probe (6) test circuit outputs a low level, the second transistor is not turned on, the collector potential of the second transistor is a high level, the relay K is closed, and the lower probe (6) is connected to a low level; when the upper probe (5) and the lower probe (6) contact the copper sheet (7) at the same time, if both the upper and lower probes (6) are in good contact, the high level of the drain of the NMOS tube is pulled down, otherwise there is no change; the determination of whether the probes are in good contact is completed; 3) Check whether there is a short circuit between any two pieces of the inverter (8): The control terminal POUT of the lower probe (6) test circuit outputs a high level, the NPN transistor is turned on, the collector potential of the second transistor is a low level, and the relay K is disconnected, that is, the inter-chip short circuit test does not consider the lower probe (6); First test: a P port of the main control chip (1) outputs a low level, the NPN transistor is not conducting, the collector of the first transistor is at a high level, that is, the NMOS tube is conducting, the drain potential of the NMOS tube is pulled down, and the corresponding upper probe (5) is at a low level. The P ports connected to the test circuits of other upper probes (5) output high levels, that is, the other upper probes (5) are all at high levels. If a probe is short-circuited with the upper probe (5), the potential of the corresponding probe is pulled down. If no probe is short-circuited, the potential of all probes remains unchanged. Second test: the next P port of the main control chip (1) outputs a low level, and the other P ports output a high level. If a probe is short-circuited with the upper probe (5), the potential of the corresponding probe is pulled down. If no probe is short-circuited, the potential of all probes remains unchanged. This cycle is repeated in sequence to detect whether any two chips of the phase converter (8) are short-circuited. 2. A motor inverter inter-chip short-circuit test system according to claim 1, characterized in that: the control end PX of the upper probe (5) test circuit is connected to the pin of the main control chip (1), and the detection end of the upper probe (5) test circuit is connected to the upper probe (5); the upper probe (5) test circuit includes a first transistor whose base is connected to the control end, a switch tube connected to the collector of the first transistor, and the detection end is connected to the switch tube. 3. A motor commutator inter-chip short circuit test system according to claim 2, characterized in that: the upper probe (5) test circuit also includes a voltage limiting resistor R1, a protection resistor R2, and a pull-up resistor R3, and the first transistor is an NPN transistor, the base of the first transistor is connected to the control end through the voltage limiting resistor R1, and the collector of the first transistor is connected to the power supply through the pull-up resistor R3. 4. A motor inverter inter-chip short-circuit test system according to claim 3, characterized in that: the switch tube is an NMOS tube, the gate of the switch tube is connected to the collector of the first transistor, the drain of the switch tube is connected to the power supply through the pull-up resistor R4; the source of the switch tube is grounded. 5. A motor inverter inter-chip short circuit test system according to claim 2, characterized in that: the control end POUTX of the lower probe (6) test circuit is connected to the pin of the main control chip (1), the lower probe (6) test circuit comprises a second transistor and a relay, one end of the relay is connected to the lower probe (6), the other end of the relay is grounded, the base of the second transistor is connected to the control end POUTX, and the collector of the second transistor is connected to the relay coil. 6. A motor inverter inter-chip short circuit test system according to claim 5, characterized in that: the lower probe (6) test circuit also includes a voltage limiting resistor R5, a protection resistor R6, and a pull-up resistor R7, and the second transistor is an NPN transistor, the base of the second transistor is connected to the control terminal POUTX through the voltage limiting resistor R5, and the collector of the second transistor is connected to the power supply through the pull-up resistor R3. 7. A motor inverter inter-chip short circuit test system according to claim 1, characterized in that: the main control chip (1) is connected to the external expansion board (2) through an expansion board interface (3), and the external expansion board (2) is provided with the lower probe (6) test circuit. 8. A motor inverter inter-chip short circuit test system according to claim 7, characterized in that: the main control chip (1), the upper probe (5) test circuit and the probe interface connected to the upper probe (5) test circuit are arranged on a PCB board, and the probe interface is matched with the probe. 9. A motor inverter inter-chip short-circuit test system according to claim 8, characterized in that: the test system also includes a PLC and a display (4), the main control chip (1) is connected to the PLC via a communication interface, and the PLC is connected to the display (4).