CN109444626A - Short-circuit test system and its working method between a kind of motor commutation device piece - Google Patents
Short-circuit test system and its working method between a kind of motor commutation device piece Download PDFInfo
- Publication number
- CN109444626A CN109444626A CN201811261741.XA CN201811261741A CN109444626A CN 109444626 A CN109444626 A CN 109444626A CN 201811261741 A CN201811261741 A CN 201811261741A CN 109444626 A CN109444626 A CN 109444626A
- Authority
- CN
- China
- Prior art keywords
- probe
- circuit
- test
- short
- triode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 115
- 238000000034 method Methods 0.000 title claims abstract description 9
- 239000000523 sample Substances 0.000 claims abstract description 176
- 238000001514 detection method Methods 0.000 claims abstract description 25
- 230000002093 peripheral effect Effects 0.000 claims abstract description 7
- 241001125929 Trisopterus luscus Species 0.000 claims description 6
- 230000001681 protective effect Effects 0.000 claims description 6
- 238000004891 communication Methods 0.000 claims description 4
- 229910052802 copper Inorganic materials 0.000 claims description 4
- 239000010949 copper Substances 0.000 claims description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 230000005611 electricity Effects 0.000 claims description 3
- 238000002360 preparation method Methods 0.000 claims description 3
- 238000010923 batch production Methods 0.000 abstract description 3
- 238000005457 optimization Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 4
- 230000003993 interaction Effects 0.000 description 3
- 238000012423 maintenance Methods 0.000 description 3
- 238000011161 development Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001502 supplementing effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Abstract
The invention discloses short-circuit test system and its working methods between a kind of motor commutation device piece, are related to motor commutation device short-circuit test field.Traditional short circuit tester volume is big, at high cost, mobile inconvenient, significantly limits short circuit tester in the application of phase changer industry.The present invention includes probe for being connected with phase changer, for the test device of detection probe voltage levels, test device includes main control chip and main control chip peripheral circuit, main control chip peripheral circuit includes that test circuit and the power supply circuit for power supply, probe are divided into upper layer probe, lower layer's probe；Test circuit includes the upper layer probe test circuit being connected with upper layer probe, the lower layer's probe test circuit being connected with lower layer probe；Test the quantity voltage to test each probe corresponding with number of probes of circuit.By the light current structure of chip controls, the volume of instrument is greatly reduced, the weight of detection device can be effectively reduced, the cost of batch production is reduced, is convenient for carrying application.
Description
Technical field
The present invention relates to short-circuit test systems between motor commutation device short-circuit test field more particularly to a kind of motor commutation device piece
System.
Background technique
Phase changer is the critical component that motor can be allowed persistently to rotate on direct current generator and AC commutator electric machine, therefore
It is widely used in the fields such as electric tool, electric motor of automobile, household electrical appliance and industrial motor；In recent years, with relevant industries
Scale goes from strength to strength, and development trend is become better and better, and market increasingly increases the demand of phase changer.Short-circuit test is that phase changer is surveyed
Vital a kind of test in examination project, traditional short circuit tester volume is big, at high cost, mobile inconvenient, greatly limits
Short circuit tester has been made in the application of phase changer industry.
Summary of the invention
The technical problem to be solved in the present invention and the technical assignment of proposition are to be improved and improved to prior art,
Short-circuit test system is convenient for carrying for the purpose of application between providing a kind of motor commutation device piece with realizing the micromation of test macro.
For this purpose, the present invention takes following technical scheme.
Short-circuit test system between a kind of motor commutation device piece, including for being connected with phase changer probe, visit for detecting
The test device of needle voltage levels, the test device include main control chip and main control chip peripheral circuit, the master control
Chip periphery circuit includes that test circuit and the power supply circuit for power supply, the probe are divided into upper layer probe, lower layer's probe；
The test circuit includes the upper layer probe test circuit being connected with upper layer probe, the lower layer's probe survey being connected with lower layer probe
Try circuit；Test the quantity voltage to test each probe corresponding with number of probes of circuit.Pass through the light current of chip controls
Structure greatly reduces the volume of instrument, can be effectively reduced the weight of detection device, reduces the cost of batch production,
It is convenient for carrying application.
As further improving and supplementing to above-mentioned technical proposal, the invention also includes following additional technical features.
As optimization technique means: the control terminal PX of the upper layer probe test circuit is connected with main control chip pin,
The test side of upper layer probe test circuit is connected with upper observing and controlling needle；It includes that base stage is connected with control terminal that upper layer probe, which tests circuit,
First triode, the switching tube being connected with the first transistor collector, the test side are connected with switching tube.Realize that upper layer is visited
The detection and control of needle.
As optimization technique means: the described upper layer probe test circuit further include pressure limiting resistance R1, protective resistance R2, on
Pull-up resistor R3, first triode are NPN triode, and the base stage of the first triode passes through pressure limiting resistance R1 and control terminal phase
Even, the collector of the first triode is connected by pull-up resistor R3 with power supply.It helps to realize whether good to the contact of upper layer probe
Good detection.
As optimization technique means: the switching tube is NMOS tube, the current collection of the grid of switching tube and the first triode
Extremely it is connected, the drain electrode of switching tube is connected by pull-up resistor R4 with power supply；The control terminal is connected with drain electrode, the source of switching tube
Pole ground connection.
As optimization technique means: the control terminal POUTX and main control chip pin phase of lower layer's probe test circuit
Even, lower layer's probe test circuit includes the second transistor, relay, described relay one end and lower layer's probe phase
Even, the other end of relay ground connection, the base stage of the second triode are connected with control terminal POUTX, the collector of the second triode and
Relay coil is connected.Realize the detection and control of lower layer's probe.
As optimization technique means: described lower layer's probe test circuit further include pressure limiting resistance R5, protective resistance R6, on
Pull-up resistor R7, second triode are NPN triode, and the base stage of the second triode passes through pressure limiting resistance R5 and control terminal
POUTX is connected, and the collector of the second triode is connected by pull-up resistor R3 with power supply.It helps to realize and lower layer's probe is contacted
Whether good detection.
As optimization technique means: the main control chip is connected by expanding plate interface with plug-in expansion board, described
Plug-in expansion board is equipped with lower layer's probe and tests circuit.Convenient for extending and safeguarding replacement, facilitates maintenance, reduce complexity
Property.
As optimization technique means: the main control chip, upper layer probe test circuit and testing circuit with upper layer probe
Connected probe interface is set on a pcb board, and the probe interface and probe match.Realize the circuit structure of master board
Micromation.
As optimization technique means: the test macro further includes PLC, display, and the main control chip passes through logical
Communication interface is connected with PLC, and the PLC is connected with display.Convenient for human-computer interaction and operation control.
It is a further object to provide a kind of working method of short-circuit test system between motor commutation device piece, packets
Include following steps:
1) probe is inserted into probe interface by preparation respectively；
2) whether detection probe contacts well:
The control terminal PX that upper layer probe tests circuit exports high level, the first triode ON, the current potential of NPN triode collector
It is pulled low, NMOS tube is not turned on, and the drain potential of NMOS tube is high level, and upper layer probe connects high level；
The control terminal POUT that lower layer's probe tests circuit exports low level, and the second triode is not turned on, the current collection of the second triode
Electrode potential is high level, and relay K is closed, and lower layer's probe connects low level；When upper layer probe and lower layer's probe contact copper sheet simultaneously
When, if upper and lower level probe contacts well, the high level of the drain electrode of NMOS tube is pulled low, otherwise unchanged；It completes to determine to visit
Whether needle contacts well.
3) whether short-circuit between the detection any two panels of phase changer:
The control terminal POUT that lower layer's probe tests circuit exports high level, NPN triode conducting, the collector electricity of the second triode
Position is low level, and relay K is disconnected, i.e., short-circuit test does not consider lower layer's probe between piece；
Test for the first time: a P mouthfuls of output low level of main control chip, NPN triode are not turned on, and the first transistor collector is height
Level, i.e. NMOS transistor conduction, NMOS tube drain potential are pulled low, and corresponding upper layer probe is low level, the test of other upper layer probes
The connected P mouth of circuit exports high level, i.e., other upper layer probes are high level, if having probe and upper layer probe short circuit, accordingly
The current potential of probe is pulled low, if the current potential of that is, all probes remains unchanged without probe short circuit；
Second of test: next P mouthfuls of output low levels of main control chip, other P mouthfuls of output high level, if thering is probe and upper layer to visit
Needle short circuit, the current potential of correspondent probe is pulled low, if the current potential of that is, all probes remains unchanged without probe short circuit.It circuits sequentially, i.e.,
Can detect that between any two panels of phase changer whether short circuit.It has conveniently realized to whether probe contacts good judgement and phase changer
Between any two panels whether Duan Lu detection, working method is simple, easy to operate.
The utility model has the advantages that conveniently realized to probe whether contact good judgement any two panels of phase changer between it is whether short
The detection on road, working method is simple, easy to operate；By the light current line structure of chip controls, the volume of instrument is greatly reduced,
Weight is significantly reduced, the cost of batch production is reduced, is convenient for carrying application.
Detailed description of the invention
Fig. 1 is present system schematic diagram.
Fig. 2 is probe of the present invention and phase changer connection schematic diagram.
Fig. 3 is upper layer probe test circuit diagram of the present invention.
Fig. 4 is lower layer's probe test circuit diagram of the present invention.
In figure: 1- main control chip；The plug-in expansion board of 2-；3- expands plate interface；4- display；The upper layer 5- probe；6- lower layer
Probe；7- copper sheet；8- phase changer.
Specific embodiment
Technical solution of the present invention is described in further detail below in conjunction with Figure of description.
As shown in Figs 1-4, short-circuit test system between a kind of motor commutation device piece, including the spy for being connected with phase changer 8
Needle, for the test device of detection probe voltage levels, test device includes 1 peripheral circuit of main control chip 1 and main control chip, main
Control 1 peripheral circuit of chip includes that test circuit and the power supply circuit for power supply, probe are divided into upper layer probe 5, lower layer's probe 6；
Test circuit includes the test of lower layer's probe 6 that the upper layer probe 5 that is connected with upper layer probe 5 tests circuit, is connected with lower layer probe 6
Circuit；Test the quantity voltage to test each probe corresponding with number of probes of circuit.
In order to realize the detection and control of upper layer probe 5, upper layer probe 5 tests the control terminal PX and main control chip 1 of circuit
Pin is connected, and the test side that upper layer probe 5 tests circuit is connected with upper observing and controlling needle；Upper layer probe 5 test circuit include base stage with
The first connected triode of control terminal, the switching tube that is connected with the first transistor collector, test side is connected with switching tube.It realizes
The detection and control of upper layer probe 5.
For the ease of judging upper layer probe 5 with the presence or absence of effectively contact, it further includes pressure limiting resistance that upper layer probe 5, which tests circuit,
R1, protective resistance R2, pull-up resistor R3, the first triode are NPN triode, and the base stage of the first triode passes through pressure limiting resistance R1
It is connected with control terminal, the collector of the first triode is connected by pull-up resistor R3 with power supply, and switching tube is NMOS tube, switching tube
Grid be connected with the collector of the first triode, the drain electrode of switching tube is connected by pull-up resistor R4 with power supply；Control terminal with
Drain electrode is connected, the source electrode ground connection of switching tube.Help to realize to upper layer probe 5 contact whether good detection.
In order to realize the detection and control of lower layer's probe 6, lower layer's probe 6 tests the control terminal POUTX and master control core of circuit
1 pin of piece is connected, and it includes the second transistor, relay that lower layer's probe 6, which tests circuit, and relay one end is connected with lower layer probe 6,
The other end of relay is grounded, and the base stage of the second triode is connected with control terminal POUTX, the collector and relay of the second triode
Device coil is connected.Realize the detection and control of lower layer's probe 6.
For the ease of judging lower layer's probe 6 with the presence or absence of effectively contact, it further includes pressure limiting resistance that lower layer's probe 6, which tests circuit,
R5, protective resistance R6, pull-up resistor R7, the second triode are NPN triode, and the base stage of the second triode passes through pressure limiting resistance R5
It is connected with control terminal POUTX, the collector of the second triode is connected by pull-up resistor R3 with power supply.It helps to realize to lower layer
Probe 6 contact whether good detection.
For the ease of maintenance, main control chip 1 is connected by expanding plate interface 3 with plug-in expansion board 2, in plug-in expansion board 2
Circuit is tested equipped with lower layer's probe 6.Convenient for extending and safeguarding replacement, facilitates maintenance, reduce complexity.
In order to realize the micromation of system equipment, main control chip 1, upper layer probe 5 are tested circuit and are tested with upper layer probe 5
The connected probe interface of circuit is set on a pcb board, and probe interface and probe match.Realize the micro- of the circuit structure of master board
Type is easy to implement the micromation of detection device.
For the ease of human-computer interaction, test macro further includes PLC, display 4, and main control chip 1 passes through communication interface and PLC
It is connected, PLC is connected with display 4.Convenient for human-computer interaction and operation control.
The course of work of short-circuit test system between a kind of motor commutation device piece, comprising the following steps:
1) probe is inserted into probe interface by preparation respectively；
2) whether detection probe contacts well:
The control terminal PX that upper layer probe 5 tests circuit exports high level, the first triode ON, the electricity of NPN triode collector
Position is pulled low, and NMOS tube is not turned on, and the drain potential of NMOS tube is high level, and upper layer probe 5 connects high level；
The control terminal POUT that lower layer's probe 6 tests circuit exports low level, and the second triode is not turned on, the current collection of the second triode
Electrode potential is high level, and relay K is closed, and lower layer's probe 6 connects low level；When upper layer probe 5 and lower layer's probe 6 contact copper simultaneously
When piece 7, if upper and lower level probe 6 contacts well, the high level of the drain electrode of NMOS tube is pulled low, otherwise unchanged；Completion is sentenced
Determine whether probe contacts well.
3) whether short-circuit between the detection any two panels of phase changer 8:
The control terminal POUT that lower layer's probe 6 tests circuit exports high level, NPN triode conducting, the collector of the second triode
Current potential is low level, and relay K is disconnected, i.e., short-circuit test does not consider lower layer's probe 6 between piece；
Test for the first time: a P mouthfuls of output low level of main control chip 1, NPN triode are not turned on, and the first transistor collector is
High level, i.e. NMOS transistor conduction, NMOS tube drain potential are pulled low, and corresponding upper layer probe 5 is low level, other upper layer probes 5
It tests the connected P mouth of circuit and exports high level, i.e., other upper layer probes 5 are high level, if having probe and upper layer probe 5 short
The current potential on road, correspondent probe is pulled low, if the current potential of that is, all probes remains unchanged without probe short circuit；
Second of test: next P mouthfuls of output low levels of main control chip 1, other P mouthfuls of output high level, if having probe and upper layer
5 short circuit of probe, the current potential of correspondent probe is pulled low, if the current potential of that is, all probes remains unchanged without probe short circuit.Successively follow
Ring, can be detected out between any two panels of phase changer 8 whether short circuit；Conveniently realized to probe whether contact it is good judgement and
Between any two panels of phase changer 8 whether Duan Lu detection, working method is simple, easy to operate.
In this example, main control chip 1 uses STM32 chip, and communication interface uses 485 interfaces, and display 4 is touched using HMI
Touch screen.
Short-circuit test system is specific embodiments of the present invention between a kind of motor commutation device piece shown in figure 1 above -4,
Substantive distinguishing features of the present invention and progress are embodied, it can be carried out under the inspiration of the present invention using needs according to actual
The equivalent modifications of shape, structure etc., the column in the protection scope of this programme.
Claims (10)
1. short-circuit test system between a kind of motor commutation device piece, it is characterised in that: including the spy for being connected with phase changer (8)
Needle, for the test device of detection probe voltage levels, the test device includes main control chip (1) and main control chip (1)
Peripheral circuit, the main control chip (1) peripheral circuit include test circuit and the power supply circuit for power supply, the probe
It is divided into upper layer probe (5), lower layer's probe (6)；The test circuit includes the upper layer probe (5) being connected with upper layer probe (5)
Test circuit, lower layer's probe (6) the test circuit being connected with lower layer's probe (6)；The quantity for testing circuit is opposite with number of probes
It should be to test the voltage of each probe.
2. short-circuit test system between a kind of motor commutation device piece according to claim 1, it is characterised in that: the upper layer
Probe (5) test circuit control terminal PX be connected with main control chip (1) pin, upper layer probe (5) test circuit test side and
Upper observing and controlling needle is connected；Upper layer probe (5) test circuit includes the first triode and the first triode that base stage is connected with control terminal
The connected switching tube of collector, the test side is connected with switching tube.
3. short-circuit test system between a kind of motor commutation device piece according to claim 2, it is characterised in that: the upper layer
Probe (5) test circuit further includes pressure limiting resistance R1, protective resistance R2, pull-up resistor R3, and first triode is NPN tri-
The base stage of pole pipe, the first triode is connected by pressure limiting resistance R1 with control terminal, and the collector of the first triode passes through pull-up electricity
Resistance R3 is connected with power supply.
4. short-circuit test system between a kind of motor commutation device piece according to claim 3, it is characterised in that: the switch
Pipe is NMOS tube, and the grid of switching tube is connected with the collector of the first triode, the drain electrode of switching tube pass through pull-up resistor R4 and
Power supply is connected；The control terminal is connected with drain electrode, the source electrode ground connection of switching tube.
5. short-circuit test system between a kind of motor commutation device piece according to claim 2, it is characterised in that: the lower layer
The control terminal POUTX of probe (6) test circuit is connected with main control chip (1) pin, and lower layer's probe (6) tests circuit packet
The second transistor, relay is included, described relay one end is connected with lower layer's probe (6), the other end ground connection of relay, and second
The base stage of triode is connected with control terminal POUTX, and the collector of the second triode is connected with relay coil.
6. short-circuit test system between a kind of motor commutation device piece according to claim 5, it is characterised in that: the lower layer
Probe (6) test circuit further includes pressure limiting resistance R5, protective resistance R6, pull-up resistor R7, and second triode is NPN tri-
The base stage of pole pipe, the second triode is connected by pressure limiting resistance R5 with control terminal POUTX, and the collector of the second triode passes through upper
Pull-up resistor R3 is connected with power supply.
7. short-circuit test system between a kind of motor commutation device piece according to claim 1, it is characterised in that: the master control
Chip (1) is connected by expanding plate interface (3) with plug-in expansion board (2), and the plug-in expansion board (2) is equipped under described
Layer probe (6) tests circuit.
8. short-circuit test system between a kind of motor commutation device piece according to claim 7, it is characterised in that: the master control
Chip (1), upper layer probe (5) test circuit and the probe interface being connected with upper layer probe (5) test circuit are set to a pcb board
On, the probe interface and probe match.
9. short-circuit test system between a kind of motor commutation device piece according to claim 8, it is characterised in that: the test
System further includes PLC, display (4), and the main control chip (1) is connected by communication interface with PLC, the PLC with show
Show that device (4) are connected.
10. the working method of short-circuit test system between a kind of motor commutation device piece according to claim 9, it is characterised in that
The following steps are included:
1) probe is inserted into probe interface by preparation respectively；
2) whether detection probe contacts well:
The control terminal PX output high level of upper layer probe (5) test circuit, the first triode ON, NPN triode collector
Current potential is pulled low, and NMOS tube is not turned on, and the drain potential of NMOS tube is high level, and upper layer probe (5) connects high level；
The control terminal POUT that lower layer's probe (6) tests circuit exports low level, and the second triode is not turned on, the collection of the second triode
Electrode potential is high level, and relay K is closed, and lower layer's probe (6) connects low level；When upper layer probe (5) and lower layer's probe (6) are same
When contact copper sheet (7) when, if upper and lower level probe (6) contact well, the high level of the drain electrode of NMOS tube is pulled low, nothing on the contrary
Variation；It completes to determine whether probe contacts well；
3) whether short-circuit between any two panels of detection phase changer (8):
The control terminal POUT that lower layer's probe (6) tests circuit exports high level, NPN triode conducting, the current collection of the second triode
Electrode potential is low level, and relay K is disconnected, i.e., short-circuit test does not consider lower layer's probe (6) between piece；
Test for the first time: a P mouthfuls of output low level of main control chip (1), NPN triode are not turned on, the first transistor collector
For high level, i.e. NMOS transistor conduction, NMOS tube drain potential is pulled low, and corresponding upper layer probe (5) are low level, other upper layers are visited
Needle (5) tests the connected P mouth of circuit and exports high level, i.e., other upper layer probes (5) are high level, if having probe and upper layer to visit
Needle (5) short circuit, the current potential of correspondent probe is pulled low, if the current potential of that is, all probes remains unchanged without probe short circuit；
Second tests: next P mouthfuls of output low levels of main control chip (1), other P mouthfuls of output high level, if having probe with it is upper
Layer probe (5) short circuit, the current potential of correspondent probe is pulled low, if the current potential of that is, all probes remains unchanged without probe short circuit；Successively
Circulation, can be detected out between any two panels of phase changer (8) whether short circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811261741.XA CN109444626B (en) | 2018-10-26 | Short circuit test system between motor phase changer sheets and working method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811261741.XA CN109444626B (en) | 2018-10-26 | Short circuit test system between motor phase changer sheets and working method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109444626A true CN109444626A (en) | 2019-03-08 |
| CN109444626B CN109444626B (en) | 2024-04-26 |
Family
ID=
Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4053830A (en) * | 1976-11-10 | 1977-10-11 | Avtron Manufacturing, Inc. | Armature winding termination continuity tester and method |
| US4893086A (en) * | 1989-01-24 | 1990-01-09 | Shrewsbury Junior R | Bar-to-bar armature tester |
| CN101907668A (en) * | 2009-06-04 | 2010-12-08 | 刘巍 | Instrument for testing insulation between plates of commutator |
| CN102221656A (en) * | 2010-04-19 | 2011-10-19 | 鸿富锦精密工业（深圳）有限公司 | Short circuit tester |
| CN204330936U (en) * | 2014-12-08 | 2015-05-13 | 中航锂电（洛阳）有限公司 | A kind of lithium ion battery short-circuit test device |
| CN205210219U (en) * | 2015-10-30 | 2016-05-04 | 广东利扬芯片测试股份有限公司 | Test panel is surveyed in short circuit of opening a way of chip |
| RU2593408C1 (en) * | 2015-03-27 | 2016-08-10 | Евгений Петрович Бессуднов | Objective method for accurate detection of short circuit between collector plates of dc machines collectors dovetail |
| CN106383288A (en) * | 2016-08-25 | 2017-02-08 | 歌尔股份有限公司 | Test equipment for USB interface earphone |
| CN106483421A (en) * | 2016-11-29 | 2017-03-08 | 深圳市燕麦科技股份有限公司 | Open-short circuit system and method for testing between one kind is point-to-point |
| CN206178072U (en) * | 2016-07-27 | 2017-05-17 | 广州奥松电子有限公司 | TZ automatic probe station tester of 603B |
| CN206684252U (en) * | 2017-03-31 | 2017-11-28 | 江门亿都半导体有限公司 | A kind of Scanning Detction machine for being applied to TAB modules in LCD |
| CN207134803U (en) * | 2017-06-16 | 2018-03-23 | 国网浙江省电力公司电力科学研究院 | A kind of energization rear defence phase fault circuit for intelligent phase-change switch |
| CN207488442U (en) * | 2017-08-04 | 2018-06-12 | 深圳市新国都支付技术有限公司 | A kind of POS machine mainboard automatic test circuit |
| CN207611107U (en) * | 2017-12-12 | 2018-07-13 | 浙江长城换向器有限公司 | A kind of commutator detection device |
| KR101897753B1 (en) * | 2018-04-24 | 2018-09-12 | 고진호 | Test device for motor |
| CN209280836U (en) * | 2018-10-26 | 2019-08-20 | 浙江丰源智能装备有限公司 | Short-circuit test system between a kind of motor commutation device piece |
Patent Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4053830A (en) * | 1976-11-10 | 1977-10-11 | Avtron Manufacturing, Inc. | Armature winding termination continuity tester and method |
| US4893086A (en) * | 1989-01-24 | 1990-01-09 | Shrewsbury Junior R | Bar-to-bar armature tester |
| CN101907668A (en) * | 2009-06-04 | 2010-12-08 | 刘巍 | Instrument for testing insulation between plates of commutator |
| CN102221656A (en) * | 2010-04-19 | 2011-10-19 | 鸿富锦精密工业（深圳）有限公司 | Short circuit tester |
| CN204330936U (en) * | 2014-12-08 | 2015-05-13 | 中航锂电（洛阳）有限公司 | A kind of lithium ion battery short-circuit test device |
| RU2593408C1 (en) * | 2015-03-27 | 2016-08-10 | Евгений Петрович Бессуднов | Objective method for accurate detection of short circuit between collector plates of dc machines collectors dovetail |
| CN205210219U (en) * | 2015-10-30 | 2016-05-04 | 广东利扬芯片测试股份有限公司 | Test panel is surveyed in short circuit of opening a way of chip |
| CN206178072U (en) * | 2016-07-27 | 2017-05-17 | 广州奥松电子有限公司 | TZ automatic probe station tester of 603B |
| CN106383288A (en) * | 2016-08-25 | 2017-02-08 | 歌尔股份有限公司 | Test equipment for USB interface earphone |
| CN106483421A (en) * | 2016-11-29 | 2017-03-08 | 深圳市燕麦科技股份有限公司 | Open-short circuit system and method for testing between one kind is point-to-point |
| CN206684252U (en) * | 2017-03-31 | 2017-11-28 | 江门亿都半导体有限公司 | A kind of Scanning Detction machine for being applied to TAB modules in LCD |
| CN207134803U (en) * | 2017-06-16 | 2018-03-23 | 国网浙江省电力公司电力科学研究院 | A kind of energization rear defence phase fault circuit for intelligent phase-change switch |
| CN207488442U (en) * | 2017-08-04 | 2018-06-12 | 深圳市新国都支付技术有限公司 | A kind of POS machine mainboard automatic test circuit |
| CN207611107U (en) * | 2017-12-12 | 2018-07-13 | 浙江长城换向器有限公司 | A kind of commutator detection device |
| KR101897753B1 (en) * | 2018-04-24 | 2018-09-12 | 고진호 | Test device for motor |
| CN209280836U (en) * | 2018-10-26 | 2019-08-20 | 浙江丰源智能装备有限公司 | Short-circuit test system between a kind of motor commutation device piece |
Non-Patent Citations (1)
| Title |
|---|
| 常涛;孙以材;潘国峰;: "基于单片机的四探针测试系统的研制", 传感器世界, no. 02 * |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106708003B (en) | A kind of electric machine controller fault detection system and method | |
| CN106707158A (en) | Time relay calibration device and calibration method thereof | |
| CN206281915U (en) | The test device and system of a kind of capacitance type touch key | |
| CN108089754A (en) | A kind of touch-control simulator | |
| CN201277992Y (en) | Full automatic digital multi-purpose meter | |
| CN106443449B (en) | A kind of conducting control table based on hall signal automatically generates the detection method of instrument | |
| CN209280836U (en) | Short-circuit test system between a kind of motor commutation device piece | |
| CN203799003U (en) | Integrated online verification calibrator for voltage-withstand tester | |
| CN204945296U (en) | A kind of cellular phone data line tester | |
| CN204188749U (en) | A kind of X-ray machine control cables fault locator | |
| CN206788647U (en) | A kind of testing device for motor controller | |
| CN109444626A (en) | Short-circuit test system and its working method between a kind of motor commutation device piece | |
| CN101963641B (en) | Conductor bundle detection system | |
| CN205263212U (en) | Select testing arrangement that closes a floodgate mutually | |
| CN203673037U (en) | Automatic circuit board detection tool of intelligent electric energy meter | |
| CN205176256U (en) | Single -phase smart electric meter testing arrangement | |
| CN204882853U (en) | Electric energy meter pressure resistance test installation | |
| CN107064781A (en) | A kind of simple resistor network automatic test approach | |
| CN201527458U (en) | Conductor bundle detecting device | |
| CN109444626B (en) | Short circuit test system between motor phase changer sheets and working method thereof | |
| CN205959062U (en) | General test fixture of DC Brushless motor control panel | |
| CN206370027U (en) | Electric boot-strap circuit on a kind of simple and practical pure hardware | |
| CN103969618A (en) | Detecting device and detecting method of smart sockets | |
| CN208109948U (en) | A kind of testing tool of novel self-capacitance touch controlled key | |
| CN207502652U (en) | A kind of communication apparatus knows card detection circuit and detection device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant |