CN209280836U - Short-circuit test system between a kind of motor commutation device piece - Google Patents
Short-circuit test system between a kind of motor commutation device piece Download PDFInfo
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- CN209280836U CN209280836U CN201821755486.XU CN201821755486U CN209280836U CN 209280836 U CN209280836 U CN 209280836U CN 201821755486 U CN201821755486 U CN 201821755486U CN 209280836 U CN209280836 U CN 209280836U
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- probe
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Abstract
The utility model discloses short-circuit test systems between a kind of motor commutation device piece, are related to motor commutation device short-circuit test field.Traditional short circuit tester volume is big, at high cost, mobile inconvenient, significantly limits short circuit tester in the application of phase changer industry.The utility model includes probe for being connected with phase changer, for the test device of detection probe voltage levels, test device includes main control chip and main control chip peripheral circuit, main control chip peripheral circuit includes that test circuit and the power supply circuit for power supply, probe are divided into upper layer probe, lower layer's probe；Test circuit includes the upper layer probe test circuit being connected with upper layer probe, the lower layer's probe test circuit being connected with lower layer probe；Test the quantity voltage to test each probe corresponding with number of probes of circuit.By the light current structure of chip controls, the volume of instrument is greatly reduced, the weight of detection device can be effectively reduced, the cost of batch production is reduced, is convenient for carrying application.
Description
Technical field
The utility model relates to short circuits between motor commutation device short-circuit test field more particularly to a kind of motor commutation device piece to survey
Test system.
Background technique
Phase changer is the critical component that motor can be allowed persistently to rotate on direct current generator and AC commutator electric machine, therefore
It is widely used in the fields such as electric tool, electric motor of automobile, household electrical appliance and industrial motor；In recent years, with relevant industries
Scale goes from strength to strength, and development trend is become better and better, and market increasingly increases the demand of phase changer.Short-circuit test is that phase changer is surveyed
Vital a kind of test in examination project, traditional short circuit tester volume is big, at high cost, mobile inconvenient, greatly limits
Short circuit tester has been made in the application of phase changer industry.
Utility model content
The technical problems to be solved in the utility model and the technical assignment of proposition be prior art is carried out improve with
It improves, short-circuit test system between a kind of motor commutation device piece is provided, to realize the micromation of test macro, be convenient for carrying using being
Purpose.For this purpose, the utility model takes following technical scheme.
Short-circuit test system between a kind of motor commutation device piece, including for being connected with phase changer probe, visit for detecting
The test device of needle voltage levels, the test device include main control chip and main control chip peripheral circuit, the master control
Chip periphery circuit includes that test circuit and the power supply circuit for power supply, the probe are divided into upper layer probe, lower layer's probe；
The test circuit includes the upper layer probe test circuit being connected with upper layer probe, the lower layer's probe survey being connected with lower layer probe
Try circuit；Test the quantity voltage to test each probe corresponding with number of probes of circuit.Pass through the light current of chip controls
Structure greatly reduces the volume of instrument, can be effectively reduced the weight of detection device, reduces the cost of batch production,
It is convenient for carrying application.
As further improving and supplementing to above-mentioned technical proposal, the utility model further includes that following supplementary technology is special
Sign.
As optimization technique means: the control terminal PX of the upper layer probe test circuit is connected with main control chip pin,
The test side of upper layer probe test circuit is connected with upper observing and controlling needle；It includes that base stage is connected with control terminal that upper layer probe, which tests circuit,
First triode, the switching tube being connected with the first transistor collector, the test side are connected with switching tube.Realize that upper layer is visited
The detection and control of needle.
As optimization technique means: the described upper layer probe test circuit further include pressure limiting resistance R1, protective resistance R2, on
Pull-up resistor R3, first triode are NPN triode, and the base stage of the first triode passes through pressure limiting resistance R1 and control terminal phase
Even, the collector of the first triode is connected by pull-up resistor R3 with power supply.It helps to realize whether good to the contact of upper layer probe
Good detection.
As optimization technique means: the switching tube is NMOS tube, the current collection of the grid of switching tube and the first triode
Extremely it is connected, the drain electrode of switching tube is connected by pull-up resistor R4 with power supply；The control terminal is connected with drain electrode, the source of switching tube
Pole ground connection.
As optimization technique means: the control terminal POUTX and main control chip pin phase of lower layer's probe test circuit
Even, lower layer's probe test circuit includes the second transistor, relay, described relay one end and lower layer's probe phase
Even, the other end of relay ground connection, the base stage of the second triode are connected with control terminal POUTX, the collector of the second triode and
Relay coil is connected.Realize the detection and control of lower layer's probe.
As optimization technique means: described lower layer's probe test circuit further include pressure limiting resistance R5, protective resistance R6, on
Pull-up resistor R7, second triode are NPN triode, and the base stage of the second triode passes through pressure limiting resistance R5 and control terminal
POUTX is connected, and the collector of the second triode is connected by pull-up resistor R3 with power supply.It helps to realize and lower layer's probe is contacted
Whether good detection.
As optimization technique means: the main control chip is connected by expanding plate interface with plug-in expansion board, described
Plug-in expansion board is equipped with lower layer's probe and tests circuit.Convenient for extending and safeguarding replacement, facilitates maintenance, reduce complexity
Property.
As optimization technique means: the main control chip, upper layer probe test circuit and testing circuit with upper layer probe
Connected probe interface is set on a pcb board, and the probe interface and probe match.Realize the circuit structure of master board
Micromation.
As optimization technique means: the test macro further includes PLC, display, and the main control chip passes through logical
Communication interface is connected with PLC, and the PLC is connected with display.Convenient for human-computer interaction and operation control.
The utility model has the advantages that conveniently realized to probe whether contact good judgement any two panels of phase changer between it is whether short
The detection on road, working method is simple, easy to operate；By the light current line structure of chip controls, the volume of instrument is greatly reduced,
Weight is significantly reduced, the cost of batch production is reduced, is convenient for carrying application.
Detailed description of the invention
Fig. 1 is Tthe utility model system schematic diagram.
Fig. 2 is the utility model probe and phase changer connection schematic diagram.
Fig. 3 is the utility model upper layer probe test circuit diagram.
Fig. 4 is the utility model lower layer probe test circuit diagram.
In figure: 1- main control chip；The plug-in expansion board of 2-；3- expands plate interface；4- display；The upper layer 5- probe；6- lower layer
Probe；7- copper sheet；8- phase changer.
Specific embodiment
The technical solution of the utility model is described in further detail below in conjunction with Figure of description.
As shown in Figs 1-4, short-circuit test system between a kind of motor commutation device piece, including the spy for being connected with phase changer 8
Needle, for the test device of detection probe voltage levels, test device includes 1 peripheral circuit of main control chip 1 and main control chip, main
Control 1 peripheral circuit of chip includes that test circuit and the power supply circuit for power supply, probe are divided into upper layer probe 5, lower layer's probe 6；
Test circuit includes the test of lower layer's probe 6 that the upper layer probe 5 that is connected with upper layer probe 5 tests circuit, is connected with lower layer probe 6
Circuit；Test the quantity voltage to test each probe corresponding with number of probes of circuit.
In order to realize the detection and control of upper layer probe 5, upper layer probe 5 tests the control terminal PX and main control chip 1 of circuit
Pin is connected, and the test side that upper layer probe 5 tests circuit is connected with upper observing and controlling needle；Upper layer probe 5 test circuit include base stage with
The first connected triode of control terminal, the switching tube that is connected with the first transistor collector, test side is connected with switching tube.It realizes
The detection and control of upper layer probe 5.
For the ease of judging upper layer probe 5 with the presence or absence of effectively contact, it further includes pressure limiting resistance that upper layer probe 5, which tests circuit,
R1, protective resistance R2, pull-up resistor R3, the first triode are NPN triode, and the base stage of the first triode passes through pressure limiting resistance R1
It is connected with control terminal, the collector of the first triode is connected by pull-up resistor R3 with power supply, and switching tube is NMOS tube, switching tube
Grid be connected with the collector of the first triode, the drain electrode of switching tube is connected by pull-up resistor R4 with power supply；Control terminal with
Drain electrode is connected, the source electrode ground connection of switching tube.Help to realize to upper layer probe 5 contact whether good detection.
In order to realize the detection and control of lower layer's probe 6, lower layer's probe 6 tests the control terminal POUTX and master control core of circuit
1 pin of piece is connected, and it includes the second transistor, relay that lower layer's probe 6, which tests circuit, and relay one end is connected with lower layer probe 6,
The other end of relay is grounded, and the base stage of the second triode is connected with control terminal POUTX, the collector and relay of the second triode
Device coil is connected.Realize the detection and control of lower layer's probe 6.
For the ease of judging lower layer's probe 6 with the presence or absence of effectively contact, it further includes pressure limiting resistance that lower layer's probe 6, which tests circuit,
R5, protective resistance R6, pull-up resistor R7, the second triode are NPN triode, and the base stage of the second triode passes through pressure limiting resistance R5
It is connected with control terminal POUTX, the collector of the second triode is connected by pull-up resistor R3 with power supply.It helps to realize to lower layer
Probe 6 contact whether good detection.
For the ease of maintenance, main control chip 1 is connected by expanding plate interface 3 with plug-in expansion board 2, in plug-in expansion board 2
Circuit is tested equipped with lower layer's probe 6.Convenient for extending and safeguarding replacement, facilitates maintenance, reduce complexity.
In order to realize the micromation of system equipment, main control chip 1, upper layer probe 5 are tested circuit and are tested with upper layer probe 5
The connected probe interface of circuit is set on a pcb board, and probe interface and probe match.Realize the micro- of the circuit structure of master board
Type is easy to implement the micromation of detection device.
For the ease of human-computer interaction, test macro further includes PLC, display 4, and main control chip 1 passes through communication interface and PLC
It is connected, PLC is connected with display 4.Convenient for human-computer interaction and operation control.
The course of work of short-circuit test system between a kind of motor commutation device piece, comprising the following steps:
1, probe is inserted into probe interface by preparation respectively；
2, whether detection probe contacts well:
The control terminal PX that upper layer probe 5 tests circuit exports high level, the first triode ON, NPN triode collector
Current potential be pulled low, NMOS tube is not turned on, and the drain potential of NMOS tube is high level, and upper layer probe 5 connects high level；
The control terminal POUT that lower layer's probe 6 tests circuit exports low level, and the second triode is not turned on, the second triode
Collector potential is high level, and relay K is closed, and lower layer's probe 6 connects low level；When upper layer probe 5 and lower layer's probe 6 connect simultaneously
When touching copper sheet 7, if upper and lower level probe 6 contacts well, the high level of the drain electrode of NMOS tube is pulled low, otherwise unchanged；It is complete
Whether contacted well at judgement probe；
3, whether short-circuit between the detection any two panels of phase changer 8:
The control terminal POUT that lower layer's probe 6 tests circuit exports high level, NPN triode conducting, the collection of the second triode
Electrode potential is low level, and relay K is disconnected, i.e., short-circuit test does not consider lower layer's probe 6 between piece；
Test for the first time: a P mouthfuls of output low level of main control chip 1, NPN triode are not turned on, the first triode current collection
Extremely high level, i.e. NMOS transistor conduction, NMOS tube drain potential are pulled low, and corresponding upper layer probe 5 is low level, other upper layers are visited
Needle 5 tests the connected P mouth of circuit and exports high level, i.e., other upper layer probes 5 are high level, if having probe and upper layer probe 5
The current potential of short circuit, correspondent probe is pulled low, if the current potential of that is, all probes remains unchanged without probe short circuit；
Second tests: next P mouthful output low levels of main control chip 1, other P mouthfuls of output high level, if having probe and
5 short circuit of upper layer probe, the current potential of correspondent probe is pulled low, if the current potential of that is, all probes remains unchanged without probe short circuit.Successively
Circulation, can be detected out between any two panels of phase changer 8 whether short circuit.It has conveniently realized to whether probe contacts good judgement
Between any two panels of phase changer 8 whether Duan Lu detection, working method is simple, easy to operate.
In this example, main control chip 1 uses STM32 chip, and communication interface uses 485 interfaces, and display 4 is touched using HMI
Touch screen.
Short-circuit test system is the specific implementation of the utility model between a kind of motor commutation device piece shown in figure 1 above -4
Example, has embodied the utility model in essence feature and progress, needs can be used according to actual, in opening for the utility model
Under showing, the equivalent modifications of shape, structure etc., the column in the protection scope of this programme are carried out to it.
Claims (9)
1. short-circuit test system between a kind of motor commutation device piece, it is characterised in that: including the spy for being connected with phase changer (8)
Needle, for the test device of detection probe voltage levels, the test device includes main control chip (1) and main control chip (1)
Peripheral circuit, the main control chip (1) peripheral circuit include test circuit and the power supply circuit for power supply, the probe
It is divided into upper layer probe (5), lower layer's probe (6)；The test circuit includes the upper layer probe (5) being connected with upper layer probe (5)
Test circuit, lower layer's probe (6) the test circuit being connected with lower layer's probe (6)；The quantity for testing circuit is opposite with number of probes
It should be to test the voltage of each probe.
2. short-circuit test system between a kind of motor commutation device piece according to claim 1, it is characterised in that: the upper layer
Probe (5) test circuit control terminal PX be connected with main control chip (1) pin, upper layer probe (5) test circuit test side and
Upper observing and controlling needle is connected；Upper layer probe (5) test circuit includes the first triode and the first triode that base stage is connected with control terminal
The connected switching tube of collector, the test side is connected with switching tube.
3. short-circuit test system between a kind of motor commutation device piece according to claim 2, it is characterised in that: the upper layer
Probe (5) test circuit further includes pressure limiting resistance R1, protective resistance R2, pull-up resistor R3, and first triode is NPN tri-
The base stage of pole pipe, the first triode is connected by pressure limiting resistance R1 with control terminal, and the collector of the first triode passes through pull-up electricity
Resistance R3 is connected with power supply.
4. short-circuit test system between a kind of motor commutation device piece according to claim 3, it is characterised in that: the switch
Pipe is NMOS tube, and the grid of switching tube is connected with the collector of the first triode, the drain electrode of switching tube pass through pull-up resistor R4 and
Power supply is connected；The control terminal is connected with drain electrode, the source electrode ground connection of switching tube.
5. short-circuit test system between a kind of motor commutation device piece according to claim 2, it is characterised in that: the lower layer
The control terminal POUTX of probe (6) test circuit is connected with main control chip (1) pin, and lower layer's probe (6) tests circuit packet
The second transistor, relay is included, described relay one end is connected with lower layer's probe (6), the other end ground connection of relay, and second
The base stage of triode is connected with control terminal POUTX, and the collector of the second triode is connected with relay coil.
6. short-circuit test system between a kind of motor commutation device piece according to claim 5, it is characterised in that: the lower layer
Probe (6) test circuit further includes pressure limiting resistance R5, protective resistance R6, pull-up resistor R7, and second triode is NPN tri-
The base stage of pole pipe, the second triode is connected by pressure limiting resistance R5 with control terminal POUTX, and the collector of the second triode passes through upper
Pull-up resistor R3 is connected with power supply.
7. short-circuit test system between a kind of motor commutation device piece according to claim 1, it is characterised in that: the master control
Chip (1) is connected by expanding plate interface (3) with plug-in expansion board (2), and the plug-in expansion board (2) is equipped under described
Layer probe (6) tests circuit.
8. short-circuit test system between a kind of motor commutation device piece according to claim 7, it is characterised in that: the master control
Chip (1), upper layer probe (5) test circuit and the probe interface being connected with upper layer probe (5) test circuit are set to a pcb board
On, the probe interface and probe match.
9. short-circuit test system between a kind of motor commutation device piece according to claim 8, it is characterised in that: the test
System further includes PLC, display (4), and the main control chip (1) is connected by communication interface with PLC, the PLC with show
Show that device (4) are connected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821755486.XU CN209280836U (en) | 2018-10-26 | 2018-10-26 | Short-circuit test system between a kind of motor commutation device piece |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821755486.XU CN209280836U (en) | 2018-10-26 | 2018-10-26 | Short-circuit test system between a kind of motor commutation device piece |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209280836U true CN209280836U (en) | 2019-08-20 |
Family
ID=67599502
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821755486.XU Expired - Fee Related CN209280836U (en) | 2018-10-26 | 2018-10-26 | Short-circuit test system between a kind of motor commutation device piece |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209280836U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109444626A (en) * | 2018-10-26 | 2019-03-08 | 浙江丰源智能装备有限公司 | Short-circuit test system and its working method between a kind of motor commutation device piece |
| CN109444626B (en) * | 2018-10-26 | 2024-04-26 | 浙江丰源智能装备有限公司 | Short circuit test system between motor phase changer sheets and working method thereof |
-
2018
- 2018-10-26 CN CN201821755486.XU patent/CN209280836U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109444626A (en) * | 2018-10-26 | 2019-03-08 | 浙江丰源智能装备有限公司 | Short-circuit test system and its working method between a kind of motor commutation device piece |
| CN109444626B (en) * | 2018-10-26 | 2024-04-26 | 浙江丰源智能装备有限公司 | Short circuit test system between motor phase changer sheets and working method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190820 Termination date: 20211026 |