CN109416385A - 一种现场可编程门电路及其在线测试方法 - Google Patents

一种现场可编程门电路及其在线测试方法 Download PDF

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CN109416385A
CN109416385A CN201780036353.9A CN201780036353A CN109416385A CN 109416385 A CN109416385 A CN 109416385A CN 201780036353 A CN201780036353 A CN 201780036353A CN 109416385 A CN109416385 A CN 109416385A
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sampling
memory
data
trigger
circuit
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CN109416385B (zh
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李晓亮
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Shenzhen A&E Intelligent Technology Institute Co Ltd
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Shenzhen A&E Intelligent Technology Institute Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

一种现场可编程门电路的在线测试方法和现场可编程门电路,该方法包括:通过所述现场可编程门电路上的硬件接口接收上位机的配置信息(S102);根据所述配置信息从所述现场可编程门电路中选择对应的信号源并配置采样参数(S104);根据所述采样参数对所述信号源进行采样以得到采样数据(S106);将所述采样数据写入现场可编程门电路内部的存储器(S108);将所述存储器中的所述采样数据通过所述硬件接口发送至所述上位机(S110)。本发明根据配置信息完成问题的定位,简单而准确,无需配合特定的JTAP线缆,简单实用,同时,调试方便,特别是现场调试,无需搭建特殊的硬件环境,开发者手头上无需测试仪器。

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PCT国内申请,说明书已公开。

Claims (19)

  1. PCT国内申请,权利要求书已公开。
CN201780036353.9A 2017-05-19 2017-05-19 一种现场可编程门电路及其在线测试方法 Active CN109416385B (zh)

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Citations (5)

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US20030233207A1 (en) * 2002-06-17 2003-12-18 Samsung Electronics Co., Inc. Apparatus and method for testing a computer system by utilizing FPGA and programmable memory module
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CN103197231A (zh) * 2013-04-03 2013-07-10 湖南大学 用于模拟电路故障诊断和预测的fpga装置
CN104598354A (zh) * 2015-02-15 2015-05-06 浪潮电子信息产业股份有限公司 基于软硬架构的高端容错计算机fpga专用调试方法及其装置

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CN101262380B (zh) * 2008-04-17 2011-04-06 中兴通讯股份有限公司 一种用于fpga仿真的装置及方法
CN101980036B (zh) * 2010-10-22 2012-08-29 福建鑫诺通讯技术有限公司 基于fpga实现的jtag测试方法
CN102495359B (zh) * 2011-12-13 2014-04-23 曙光信息产业(北京)有限公司 一种fpga调试系统和方法

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US20030233207A1 (en) * 2002-06-17 2003-12-18 Samsung Electronics Co., Inc. Apparatus and method for testing a computer system by utilizing FPGA and programmable memory module
CN102541707A (zh) * 2010-12-15 2012-07-04 中国科学院电子学研究所 复用jtag接口的fpga片内逻辑分析仪系统和方法
CN103049361A (zh) * 2013-01-11 2013-04-17 加弘科技咨询(上海)有限公司 具有嵌入式逻辑分析功能的fpga及逻辑分析系统
CN103197231A (zh) * 2013-04-03 2013-07-10 湖南大学 用于模拟电路故障诊断和预测的fpga装置
CN104598354A (zh) * 2015-02-15 2015-05-06 浪潮电子信息产业股份有限公司 基于软硬架构的高端容错计算机fpga专用调试方法及其装置

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CN109416385B (zh) 2021-12-07

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