CN109357624A - A kind of strain measurement method and device based on absolute phase - Google Patents
A kind of strain measurement method and device based on absolute phase Download PDFInfo
- Publication number
- CN109357624A CN109357624A CN201811148215.2A CN201811148215A CN109357624A CN 109357624 A CN109357624 A CN 109357624A CN 201811148215 A CN201811148215 A CN 201811148215A CN 109357624 A CN109357624 A CN 109357624A
- Authority
- CN
- China
- Prior art keywords
- shearing
- module
- displacement
- measured object
- synchronously
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000691 measurement method Methods 0.000 title abstract description 8
- 238000010008 shearing Methods 0.000 claims abstract description 172
- 238000006073 displacement reaction Methods 0.000 claims abstract description 103
- 230000003287 optical effect Effects 0.000 claims abstract description 64
- 230000001419 dependent effect Effects 0.000 claims abstract description 36
- 238000000034 method Methods 0.000 claims description 36
- 238000005259 measurement Methods 0.000 claims description 13
- 238000003384 imaging method Methods 0.000 claims description 12
- 238000012545 processing Methods 0.000 claims description 7
- 238000005305 interferometry Methods 0.000 abstract description 5
- 230000001360 synchronised effect Effects 0.000 abstract description 4
- 238000010586 diagram Methods 0.000 description 18
- 238000009826 distribution Methods 0.000 description 14
- 230000008569 process Effects 0.000 description 12
- 230000006870 function Effects 0.000 description 9
- 230000006872 improvement Effects 0.000 description 9
- 238000003860 storage Methods 0.000 description 9
- 238000004590 computer program Methods 0.000 description 7
- 230000010287 polarization Effects 0.000 description 7
- 238000001228 spectrum Methods 0.000 description 7
- 238000005286 illumination Methods 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 5
- 238000004364 calculation method Methods 0.000 description 3
- 238000013178 mathematical model Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000001413 cellular effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000005055 memory storage Effects 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
- G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The embodiment of the present application discloses a kind of strain measurement method and device based on absolute phase, which comprises builds the speckle-shearing interferometry optical path based on spatial carrier, wherein includes four different lasers of wavelength in the speckle-shearing interferometry optical path；According to the speckle-shearing interferometry optical path, the deformed multiple absolute phase values of determining measured object are synchronized；According to the multiple absolute phase values, the multiple displacement space gradients for determining the measured object are synchronized；According to the multiple displacement space gradient, the multidimensional dependent variable for determining the measured object is synchronized.The dependent variable that the embodiment of the present application is obtained according to absolute phase can really reflect the strained situation of object.
Description
Technical Field
The application relates to the technical field of full-field optical measurement, in particular to a strain measurement method and device based on an absolute phase.
Background
Strain measurement is an important means of analyzing the stress distribution under material loading. Reliable strain measurement can provide parameters such as mechanical property indexes, defect positions, deformation conditions under load conditions, risk values and the like of the material. Therefore, strain measurement is very important in engineering mechanics.
At present, strain measurement is carried out by adopting the traditional shearing speckle interference technology, and the displacement space gradient can be determined only according to the relative phase of a measured object in the deformation process. Because the displacement space gradient is the first derivative of displacement, the positive and negative magnitudes of the displacement space gradient represent the increase and decrease of deformation and the deformation rate, and the displacement space gradient determined according to the relative phase cannot truly reflect the strain condition of the measured object.
Disclosure of Invention
The embodiment of the application provides a strain measurement method and device based on an absolute phase, which are used for solving the problem that the strain condition of a measured object cannot be truly reflected in the conventional strain measurement.
The embodiment of the application provides a strain measurement method based on an absolute phase, which comprises the following steps:
building a shearing speckle interference optical path based on a space carrier, wherein the shearing speckle interference optical path comprises four lasers with different wavelengths;
synchronously determining a plurality of absolute phase values of the deformed measured object according to the shearing speckle interference optical path;
synchronously determining a plurality of displacement space gradients of the measured object according to the plurality of absolute phase values;
and synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement space gradients.
Optionally, the shearing speckle interference optical path includes: at least one shearing module, an imaging lens and an image sensor;
wherein the at least one shear module is configured to introduce a shear volume and to introduce a spatial carrier volume.
Optionally, the shearing speckle interference optical path includes: a first shear module, wherein the shear volume of the first shear module is in the x-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the first shearing module, three positions of the displacement of the measured object in the x-axis direction are synchronously determinedMoving the spatial gradient:and
optionally, the synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement spatial gradients includes:
according to the three displacement spatial gradients:andsynchronously determining a first principal dependent variable epsilon of the object to be measuredxxFirst shear strain amount epsilonyxAnd a second amount of shear strain εzx。
Optionally, the shearing speckle interference optical path includes: a second shearing module, wherein the shearing amount of the second shearing module is in the y-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the second shearing module, three displacement space gradients of the displacement of the measured object in the y-axis direction are synchronously determined:and
optionally, the synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement spatial gradients includes:
according to the three displacement spatial gradients:andsynchronously determining a second principal dependent variable epsilon of the object to be measuredyyThird amount of shear strain εxyAnd a fourth amount of shear strain εzy。
Optionally, the shearing speckle interference optical path includes: the device comprises a first shearing module and a second shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction, and the shearing amount of the second shearing module is in the y-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the first shearing module, three displacement space gradients of the displacement of the measured object in the x-axis direction are synchronously determined:and
according to the second shearing module, three displacement space gradients of the displacement of the measured object in the y-axis direction are synchronously determined:and
optionally, the synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement spatial gradients includes:
according to the six displacement spatial gradients:andsynchronously determining a first principal dependent variable epsilon of the object to be measuredxxSecond principal dependent variable εyyFirst shear strain amount epsilonyxSecond amount of shear strain εzxThird amount of shear strain εxyAnd a fourth amount of shear strain εzy。
The embodiment of the present application further provides a strain measurement device based on absolute phase, including:
the device comprises a building module, a processing module and a control module, wherein the building module is used for building a shearing speckle interference light path based on a space carrier, and the shearing speckle interference light path comprises four lasers with different wavelengths;
the first determining module is used for synchronously determining a plurality of absolute phase values of the deformed measured object according to the shearing speckle interference optical path;
the first determining module is further configured to synchronously determine a plurality of displacement spatial gradients of the measured object according to the plurality of absolute phase values;
and the second determination module is used for synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement space gradients.
Optionally, the shearing speckle interference optical path includes: at least one shearing module, an imaging lens and an image sensor;
wherein the at least one shear module is configured to introduce a shear volume and to introduce a spatial carrier volume.
The embodiment of the application adopts at least one technical scheme which can achieve the following beneficial effects:
in the embodiment of the application, a shearing speckle interference optical path based on a space carrier is built, wherein the shearing speckle interference optical path comprises four lasers with different wavelengths; according to the shearing speckle interference optical path, synchronously determining a plurality of absolute phase values of the measured object after deformation, so that a plurality of displacement space gradients of the measured object are synchronously determined according to the plurality of absolute phase values; and then according to a plurality of displacement space gradients, the multidimensional dependent variable of the measured object is synchronously determined, so that the dependent variable obtained according to the absolute phase can truly reflect the strain condition of the object.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:
fig. 1 is a schematic flowchart of a strain measurement method based on absolute phase according to an embodiment of the present disclosure;
fig. 2 is a schematic diagram of a shearing speckle interference optical path according to an embodiment of the present disclosure;
FIG. 3 is a schematic diagram of a rectangular distribution of four lasers according to an embodiment of the present application;
FIG. 4 is a schematic diagram of another shearing speckle interference optical path provided in the embodiments of the present application;
FIG. 5 is a schematic diagram of another shearing speckle interference optical path provided in the embodiments of the present application;
fig. 6 is a schematic structural diagram of a strain measurement apparatus based on absolute phase according to an embodiment of the present disclosure.
Detailed Description
The technical solutions of the present application will be described clearly and completely below with reference to the specific embodiments of the present application and the accompanying drawings. It should be apparent that the described embodiments are only some of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The technical solutions provided by the embodiments of the present application are described in detail below with reference to the accompanying drawings.
Fig. 1 is a schematic flowchart of a strain measurement method based on absolute phase according to an embodiment of the present disclosure. The method may be as follows.
102, constructing a shearing speckle interference light path based on the space carrier, wherein the shearing speckle interference light path comprises four lasers with different wavelengths.
And step 104, synchronously determining a plurality of absolute phase values of the deformed measured object according to the sheared speckle interference light path.
And step 106, synchronously determining a plurality of displacement space gradients of the measured object according to the plurality of absolute phase values.
And step 108, synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement space gradients.
Optionally, the shearing speckle interference optical path comprises: at least one shearing module, an imaging lens and an image sensor;
wherein, at least one shear module is used for introducing shear quantity and introducing space carrier quantity.
Optionally, the image sensor is a color camera.
When the image sensor is a color camera, the light path adjustment process only needs to ensure that the high-frequency spectrum corresponding to the same laser and containing the phase information of the measured object is completely separated from the low-frequency spectrum corresponding to the background light.
Because the wavelengths of the four lasers are different, namely the colors of the laser emitted by the four lasers are different, the frequency spectrums corresponding to the different lasers fall in different color sensitive areas of the color camera to realize collection, and finally the frequency spectrums corresponding to the different lasers are separated, so that the difficulty of realizing frequency spectrum separation by adjusting a light path can be reduced, and phase extraction can be respectively carried out on the frequency spectrums corresponding to the different lasers.
It should be noted that, in the shearing interference optical path, the image sensor may adopt a black and white camera in addition to a color camera, and is not limited specifically here.
If a black-and-white camera is used, during the optical path adjustment process, a plurality of optical path parameters (e.g., spatial carrier amount, etc.) need to be adjusted to ensure complete separation between the frequency spectrums corresponding to the four finally obtained lasers.
Compared with a time phase shift method, the interference phase can be solved only by three speckle patterns, and the interference phase can be solved only by one speckle pattern in a space carrier method, so that the shearing speckle interference light path based on the space carrier can realize synchronous measurement of multi-dimensional strain in the dynamic deformation process of the measured object.
According to the number and the shearing direction of the shearing modules, different multidimensional dependent variables of the measured object can be synchronously determined.
The following describes the process of synchronously determining the multidimensional dependent variable of the measured object according to different shearing modules.
First, the shearing speckle interference optical path includes: a first shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the first shearing module, three displacement space gradients of the displacement of the measured object in the x-axis direction are synchronously determined:and
further, according to the plurality of displacement space gradients, synchronously determining the multidimensional dependent variable of the measured object, comprising:
according to three displacement spatial gradients:andsynchronous determination of a first principal variable epsilon of an object to be measuredxxFirst shear strain amount epsilonyxAnd a second amount of shear strain εzx。
Fig. 2 is a schematic diagram of a shearing speckle interference optical path according to an embodiment of the present disclosure.
As shown in fig. 2, the shearing speckle interference optical path includes: wavelength of λ1Laser 1 of wavelength lambda2Laser 2 of wavelength lambda3Laser 3 of wavelength lambda4The laser 4, the first shearing module with the shearing amount in the x-axis direction, the imaging lens, the image sensor and the measured object.
In the shearing speckle interference optical path shown in fig. 2, the placement of the four lasers can be determined according to actual conditions, and not only a right-angle distribution mode can be adopted, but also a distribution mode with any included angle can be adopted, and no specific limitation is made here.
The following description will be made in detail by taking the layout in which four lasers are distributed at right angles as an example.
Fig. 3 is a schematic diagram of a right-angle distribution of four lasers according to an embodiment of the present application.
As shown in FIG. 3, laser 1 and laser 3 are located on xoz plane, laser 2 and laser 4 are located on yoz plane, the included angle between the laser emitted by laser 1 and the yoz plane is α, the included angle between the laser emitted by laser 3 and the yoz plane is- α, the included angle between the laser emitted by laser 2 and the xoz plane is α, and the included angle between the laser emitted by laser 4 and the xoz plane is- α.
It should be noted that the laser 1, the laser 2, the laser 3, and the laser 4 may be interchanged in position according to actual situations, and strain measurement is not affected.
In the sheared speckle interference optical path shown in fig. 2, the dotted line portion is a first shearing module, and the first shearing module includes: a first beam splitter prism, a first plane mirror M1, and a second plane mirror M2.
By adjusting the first plane mirror M1 in the first shearing module, the amount of spatial carrier and the amount of shear in the x-axis direction are introduced.
In the shearing speckle interferometry, when the shearing quantity is on the x axis, the relationship between the phase variation quantity and the displacement space gradient of the measured object is as follows:
wherein u, v and w are displacement components of the displacement of the measured object in the directions of the x axis, the y axis and the z axis respectively;α is the included angle between the illumination direction and the yoz plane, β is the included angle between the illumination direction and the xoz plane, and gamma is the included angle between the illumination direction and the z axis.
Still taking the shearing speckle interference optical path shown in fig. 2 as an example, the laser 1, the laser 2, the laser 3, and the laser 4 respectively emit laser light to illuminate the object to be measured, and the first object light, the second object light, the third object light, and the fourth object light are obtained by reflection of the object to be measured, and then the first object light, the second object light, the third object light, and the fourth object light respectively pass through the imaging lens and the first shearing module with the shearing amount in the x-axis direction, and then form shearing interference on the surface of the image sensor.
Taking the layout of four lasers in a right-angle distribution mode as an example, because a fourth laser lighting optical path is introduced, a resolving formula can be added in a mathematical model, and then four absolute phase values after the measured object is deformed are obtained according to a shearing speckle interference pattern acquired by an image sensor:
wherein,is the initial phase value of the measured object before deformation.
Solving an equation to obtain an initial phase value of the measured object before deformation and three displacement space gradients of the measured object on an x axis:
wherein, three displacement spatial gradients:andthe absolute phase value is obtained by calculation according to the deformed absolute phase value of the measured object. And then according to three displacement spatial gradients:andsynchronously determining the first principal dependent variable of the measured objectFirst amount of shear strainAnd a second amount of shear strain
Second, the shearing speckle interference optical path includes: the second shearing module, wherein the shearing amount of the second shearing module is in the y-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the second shearing module, three displacement space gradients of the displacement of the measured object in the y-axis direction are synchronously determined:and
further, according to the plurality of displacement space gradients, synchronously determining the multidimensional dependent variable of the measured object, comprising:
according to three displacement spatial gradients:andsynchronous determination of the second principal variable epsilon of the object to be measuredyyThird amount of shear strain εxyAnd a fourth amount of shear strain εzy。
Fig. 4 is a schematic diagram of another shearing speckle interference optical path provided in the embodiment of the present application.
As shown in fig. 4, the shearing speckle interference optical path includes: wavelength of λ1Laser 1 of wavelength lambda2Laser 2 of wavelength lambda3Laser 3 of wavelength lambda4The laser 4, a second shearing module with the shearing amount in the y-axis direction, an imaging lens, an image sensor and a measured object.
In the shearing speckle interference optical path shown in fig. 4, the placement of the four lasers can be determined according to the actual situation, and may be in a right-angle distribution manner or in an arbitrary included angle distribution manner, which is not specifically limited herein.
The following description will be made in detail by taking the layout of four lasers in a right angle distribution as shown in fig. 3 as an example.
In the shearing speckle interference optical path shown in fig. 4, the second shearing module includes: a second beam splitter prism, a third plane mirror M3 and a fourth plane mirror M4.
By adjusting the third plane mirror M3 in the second shearing module, the amount of space carrier and the shearing amount in the y-axis direction are introduced.
In the shearing speckle interferometry, when the shearing quantity is on the y axis, the relationship between the phase variation quantity and the displacement space gradient of the measured object is as follows:
wherein u, v and w are displacement components of the displacement of the measured object in the directions of the x axis, the y axis and the z axis respectively;the partial derivatives of displacement components u, v and w in the y-axis direction, α is the included angle between the illumination direction and the yoz plane, β is the included angle between the illumination direction and the xoz plane, and gamma is the included angle between the illumination direction and the z-axis.
Still taking the shearing speckle interference optical path shown in fig. 4 as an example, the laser 1, the laser 2, the laser 3, and the laser 4 respectively emit laser light to illuminate the object to be measured, and the first object light, the second object light, the third object light, and the fourth object light are obtained by reflection of the object to be measured, and then the first object light, the second object light, the third object light, and the fourth object light form shearing interference on the surface of the image sensor after passing through the imaging lens and the second shearing module with the shearing amount in the y-axis direction, respectively.
Taking the layout of four lasers in a right-angle distribution mode as an example, because a fourth laser lighting optical path is introduced, a resolving formula can be added in a mathematical model, and then four absolute phase values after the measured object is deformed are obtained according to a shearing speckle interference pattern acquired by an image sensor:
wherein,is the initial phase value of the measured object before deformation.
Solving an equation to obtain an initial phase value of the measured object before deformation and three displacement space gradients of the measured object on the y axis:
wherein, three displacement spatial gradients:andthe absolute phase value is obtained by calculation according to the deformed absolute phase value of the measured object. And then according to three displacement spatial gradients:andsynchronously determining the second principal dependent variable of the measured objectThird amount of shear strainAnd fourth amount of shear strain
Third, the shearing speckle interference optical path includes: the device comprises a first shearing module and a second shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction, and the shearing amount of the second shearing module is in the y-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the first shearing module, three displacement space gradients of the displacement of the measured object in the x-axis direction are synchronously determined:and
according to the second shearing module, three displacement space gradients of the displacement of the measured object in the y-axis direction are synchronously determined:and
further, according to the plurality of displacement space gradients, synchronously determining the multidimensional dependent variable of the measured object, comprising:
from six displacement spatial gradients:andsynchronous determination of a first principal variable epsilon of an object to be measuredxxSecond principal dependent variable εyyFirst shear strain amount epsilonyxThe first stepTwo shear strain amount epsilonzxThird amount of shear strain εxyAnd a fourth amount of shear strain εzy。
Fig. 5 is a schematic diagram of another shearing speckle interference optical path provided in the embodiment of the present application.
As shown in fig. 5, the shearing speckle interference optical path includes: wavelength of λ1Laser 1 of wavelength lambda2Laser 2 of wavelength lambda3Laser 3 of wavelength lambda4The device comprises a laser 4, a first polarization beam splitter prism, a second polarization beam splitter prism, a first shearing module with shearing amount in the x-axis direction, a second shearing module with shearing amount in the y-axis direction, an imaging lens, an image sensor and a measured object.
In the shearing speckle interference optical path shown in fig. 5, the placement of the four lasers can be determined according to the actual situation, and may be in a right-angle distribution manner or in an arbitrary included angle distribution manner, which is not specifically limited herein.
The following description will be made in detail by taking the layout of four lasers in a right angle distribution as shown in fig. 3 as an example.
In the shearing speckle interference optical path shown in fig. 5, the first shearing module includes: the first beam splitter prism, the first plane mirror M1 and the second plane mirror M2; the second cutting module comprises: a second beam splitter prism, a third plane mirror M3 and a fourth plane mirror M4.
Introducing the space carrier amount and the shearing amount in the x-axis direction by adjusting a first plane mirror M1 in a first shearing module; by adjusting the third plane mirror M3 in the second shearing module, the amount of space carrier and the shearing amount in the y-axis direction are introduced.
The laser 1, the laser 2, the laser 3 and the laser 4 respectively emit laser to illuminate a measured object, and a first object light, a second object light, a third object light and a fourth object light are obtained by reflection of the measured object; the first object light, the second object light, the third object light and the fourth object light respectively pass through the imaging lens and the first polarization beam splitter prism, the first object light is divided into first p light and first s light, the second object light is divided into second p light and second s light, the third object light is divided into third p light and third s light, and the fourth object light is divided into fourth p light and fourth s light; then the first p light, the second p light, the third p light and the fourth p light form shearing interference on the surface of the image sensor after passing through the first shearing module and the second polarization splitting prism respectively; the first s light, the second s light, the third s light and the fourth s light form shearing interference on the surface of the image sensor after passing through the second shearing module and the second polarization splitting prism respectively.
The first polarization beam splitter prism and the second polarization beam splitter prism enable shearing speckle interference obtained according to the first shearing module and the second shearing module not to mutually interfere.
Taking the layout of four lasers in a right-angle distribution mode as an example, because a fourth laser lighting optical path is introduced, a resolving formula can be added in a mathematical model, and then eight absolute phase values after the measured object is deformed are obtained according to a shearing speckle interference pattern acquired by an image sensor:
solving an equation to obtain an initial phase value of the measured object before deformation, three displacement space gradients of the measured object on an x axis and three displacement space gradients of the measured object on a y axis:
wherein, six displacement spatial gradients:andthe absolute phase value is obtained by calculation according to the deformed absolute phase value of the measured object. And then according to six displacement spatial gradients: andsynchronously determining the first principal dependent variable of the measured objectSecond principal dependent variableFirst amount of shear strainSecond amount of shear strainThird amount of shear strainAnd fourth amount of shear strain
According to the technical scheme recorded in the embodiment of the application, a shearing speckle interference light path based on a space carrier is built, wherein the shearing speckle interference light path comprises four lasers with different wavelengths; according to the shearing speckle interference optical path, synchronously determining a plurality of absolute phase values of the measured object after deformation, so that a plurality of displacement space gradients of the measured object are synchronously determined according to the plurality of absolute phase values; and then according to a plurality of displacement space gradients, the multidimensional dependent variable of the measured object is synchronously determined, so that the dependent variable obtained according to the absolute phase can truly reflect the strain condition of the object.
Fig. 6 is a schematic structural diagram of a strain measurement apparatus based on absolute phase according to an embodiment of the present disclosure. The apparatus shown in fig. 6 comprises:
the building module 601 is used for building a shearing speckle interference optical path based on a space carrier, wherein the shearing speckle interference optical path comprises four lasers with different wavelengths;
the first determining module 602 is configured to synchronously determine a plurality of absolute phase values of the deformed measured object according to the sheared speckle interference optical path;
the first determining module 602 is further configured to synchronously determine a plurality of displacement spatial gradients of the measured object according to the plurality of absolute phase values;
the second determining module 603 is configured to synchronously determine the multidimensional strain of the measured object according to the plurality of displacement spatial gradients.
Optionally, the shearing speckle interference optical path comprises: at least one shearing module, an imaging lens and an image sensor;
wherein, at least one shear module is used for introducing shear quantity and introducing space carrier quantity.
Optionally, the shearing speckle interference optical path comprises: a first shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction;
the first determining module 602 is specifically configured to:
according to the first shearing module, three displacement space gradients of the displacement of the measured object in the x-axis direction are synchronously determined:and
the second determining module 603 is specifically configured to:
according to three displacement spatial gradients:andsynchronous determination of a first principal variable epsilon of an object to be measuredxxFirst shear strain amount epsilonyxAnd a second amount of shear strain εzx。
Optionally, the shearing speckle interference optical path comprises: the second shearing module, wherein the shearing amount of the second shearing module is in the y-axis direction;
the first determining module 602 is specifically configured to:
according to the second shearing module, three displacement space gradients of the displacement of the measured object in the y-axis direction are synchronously determined:and
optionally, the second determining module 603 is specifically configured to:
according to three displacement spatial gradients:andsynchronous determination of the second principal variable epsilon of the object to be measuredyyThird amount of shear strain εxyAnd fourthShear strain amount epsilonzy。
Optionally, the shearing speckle interference optical path comprises: the device comprises a first shearing module and a second shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction, and the shearing amount of the second shearing module is in the y-axis direction;
the first determining module 602 further includes:
the first determining unit is used for synchronously determining three displacement space gradients of the displacement of the measured object in the x-axis direction according to the first shearing module:and
the second determining unit is used for synchronously determining three displacement space gradients of the displacement of the measured object in the y-axis direction according to the second shearing module:and
optionally, the second determining module 603 is specifically configured to:
from six displacement spatial gradients:andsynchronous determination of a first principal variable epsilon of an object to be measuredxxSecond principal dependent variable εyyFirst shear strain amount epsilonyxSecond amount of shear strain εzxThird amount of shear strain εxyAnd a fourth amount of shear strain εzy。
According to the strain measurement device based on the absolute phase, the building module is used for building a shearing speckle interference optical path based on the space carrier, wherein the shearing speckle interference optical path comprises four lasers with different wavelengths; the first determining module is used for synchronously determining a plurality of absolute phase values of the deformed measured object according to the shearing speckle interference light path; the first determination module is further used for synchronously determining a plurality of displacement space gradients of the measured object according to the plurality of absolute phase values; the second determination module is used for synchronously determining the multidimensional strain of the measured object according to the plurality of displacement space gradients, so that the strain obtained according to the absolute phase can truly reflect the strain condition of the object.
In the 90 s of the 20 th century, improvements in a technology could clearly distinguish between improvements in hardware (e.g., improvements in circuit structures such as diodes, transistors, switches, etc.) and improvements in software (improvements in process flow). However, as technology advances, many of today's process flow improvements have been seen as direct improvements in hardware circuit architecture. Designers almost always obtain the corresponding hardware circuit structure by programming an improved method flow into the hardware circuit. Thus, it cannot be said that an improvement in the process flow cannot be realized by hardware physical modules. For example, a Programmable Logic Device (PLD), such as a Field Programmable Gate Array (FPGA), is an integrated circuit whose Logic functions are determined by programming the Device by a user. A digital system is "integrated" on a PLD by the designer's own programming without requiring the chip manufacturer to design and fabricate application-specific integrated circuit chips. Furthermore, nowadays, instead of manually making an integrated Circuit chip, such Programming is often implemented by "logic compiler" software, which is similar to a software compiler used in program development and writing, but the original code before compiling is also written by a specific Programming Language, which is called Hardware Description Language (HDL), and HDL is not only one but many, such as abel (advanced Boolean Expression Language), ahdl (alternate Language Description Language), traffic, pl (core unified Programming Language), HDCal, JHDL (Java Hardware Description Language), langue, Lola, HDL, laspam, hardsradware (Hardware Description Language), vhjhd (Hardware Description Language), and vhigh-Language, which are currently used in most common. It will also be apparent to those skilled in the art that hardware circuitry that implements the logical method flows can be readily obtained by merely slightly programming the method flows into an integrated circuit using the hardware description languages described above.
The controller may be implemented in any suitable manner, for example, the controller may take the form of, for example, a microprocessor or processor and a computer-readable medium storing computer-readable program code (e.g., software or firmware) executable by the (micro) processor, logic gates, switches, an Application Specific Integrated Circuit (ASIC), a programmable logic controller, and an embedded microcontroller, examples of which include, but are not limited to, the following microcontrollers: ARC 625D, Atmel AT91SAM, Microchip PIC18F26K20, and Silicone Labs C8051F320, the memory controller may also be implemented as part of the control logic for the memory. Those skilled in the art will also appreciate that, in addition to implementing the controller as pure computer readable program code, the same functionality can be implemented by logically programming method steps such that the controller is in the form of logic gates, switches, application specific integrated circuits, programmable logic controllers, embedded microcontrollers and the like. Such a controller may thus be considered a hardware component, and the means included therein for performing the various functions may also be considered as a structure within the hardware component. Or even means for performing the functions may be regarded as being both a software module for performing the method and a structure within a hardware component.
The systems, devices, modules or units illustrated in the above embodiments may be implemented by a computer chip or an entity, or by a product with certain functions. One typical implementation device is a computer. In particular, the computer may be, for example, a personal computer, a laptop computer, a cellular telephone, a camera phone, a smartphone, a personal digital assistant, a media player, a navigation device, an email device, a game console, a tablet computer, a wearable device, or a combination of any of these devices.
For convenience of description, the above devices are described as being divided into various units by function, and are described separately. Of course, the functionality of the units may be implemented in one or more software and/or hardware when implementing the present application.
As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
In a typical configuration, a computing device includes one or more processors (CPUs), input/output interfaces, network interfaces, and memory.
The memory may include forms of volatile memory in a computer readable medium, Random Access Memory (RAM) and/or non-volatile memory, such as Read Only Memory (ROM) or flash memory (flash RAM). Memory is an example of a computer-readable medium.
Computer-readable media, including both non-transitory and non-transitory, removable and non-removable media, may implement information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), Read Only Memory (ROM), Electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), Digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information that can be accessed by a computing device. As defined herein, a computer readable medium does not include a transitory computer readable medium such as a modulated data signal and a carrier wave.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The application may be described in the general context of computer-executable instructions, such as program modules, being executed by a computer. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform particular tasks or implement particular abstract data types. The application may also be practiced in distributed computing environments where tasks are performed by remote processing devices that are linked through a communications network. In a distributed computing environment, program modules may be located in both local and remote computer storage media including memory storage devices.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, for the system embodiment, since it is substantially similar to the method embodiment, the description is simple, and for the relevant points, reference may be made to the partial description of the method embodiment.
The above description is only an example of the present application and is not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.
Claims (10)
1. A method of strain measurement based on absolute phase, comprising:
building a shearing speckle interference optical path based on a space carrier, wherein the shearing speckle interference optical path comprises four lasers with different wavelengths;
synchronously determining a plurality of absolute phase values of the deformed measured object according to the shearing speckle interference optical path;
synchronously determining a plurality of displacement space gradients of the measured object according to the plurality of absolute phase values;
and synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement space gradients.
2. The method of claim 1, wherein shearing the speckle interference optical path comprises: at least one shearing module, an imaging lens and an image sensor;
wherein the at least one shear module is configured to introduce a shear volume and to introduce a spatial carrier volume.
3. The method of claim 2, wherein shearing the speckle interference optical path comprises: a first shear module, wherein the shear volume of the first shear module is in the x-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the first shearing module, three displacement space gradients of the displacement of the measured object in the x-axis direction are synchronously determined:and
4. the method of claim 3, wherein simultaneously determining the multidimensional dependent variable of the object under test based on the plurality of spatial gradients of displacement comprises:
according to the three displacement spatial gradients:andsynchronously determining a first principal dependent variable epsilon of the object to be measuredxxFirst shear strain amount epsilonyxAnd a second amount of shear strain εzx。
5. The method of claim 2, wherein shearing the speckle interference optical path comprises: a second shearing module, wherein the shearing amount of the second shearing module is in the y-axis direction;
synchronously determining a plurality of displacement spatial gradients of a measured object, comprising:
according to the second shearing module, three displacement space gradients of the displacement of the measured object in the y-axis direction are synchronously determined:and
6. the method of claim 5, wherein simultaneously determining the multidimensional dependent variable of the object under test based on the plurality of spatial gradients of displacement comprises:
according to the three displacement spatial gradients:andsynchronously determining a second principal dependent variable epsilon of the object to be measuredyyThird amount of shear strain εxyAnd a fourth amount of shear strain εzy。
7. The method of claim 2, wherein shearing the speckle interference optical path comprises: the device comprises a first shearing module and a second shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction, and the shearing amount of the second shearing module is in the y-axis direction;
according to the shearing speckle interference light path, synchronously determining a plurality of displacement space gradients of the measured object, comprising:
according to the first shearing module, three displacement space gradients of the displacement of the measured object in the x-axis direction are synchronously determined:and
according to the second shearing module, three displacement space gradients of the displacement of the measured object in the y-axis direction are synchronously determined:and
8. the method of claim 7, wherein simultaneously determining the multidimensional dependent variable of the object under test based on the plurality of spatial gradients of displacement comprises:
according to the six displacement spatial gradients:andsynchronously determining a first principal dependent variable epsilon of the object to be measuredxxSecond principal dependent variable εyyFirst shear strain amount epsilonyxSecond amount of shear strain εzxThird amount of shear strain εxyAnd a fourth amount of shear strain εzy。
9. An absolute phase based strain gauge comprising:
the device comprises a building module, a processing module and a control module, wherein the building module is used for building a shearing speckle interference light path based on a space carrier, and the shearing speckle interference light path comprises four lasers with different wavelengths;
the first determining module is used for synchronously determining a plurality of absolute phase values of the deformed measured object according to the shearing speckle interference optical path;
the first determining module is further configured to synchronously determine a plurality of displacement spatial gradients of the measured object according to the plurality of absolute phase values;
and the second determination module is used for synchronously determining the multidimensional dependent variable of the measured object according to the plurality of displacement space gradients.
10. The apparatus of claim 9, wherein the shearing speckle interference optical path comprises: at least one shearing module, an imaging lens and an image sensor;
wherein the at least one shear module is configured to introduce a shear volume and to introduce a spatial carrier volume.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811148215.2A CN109357624B (en) | 2018-09-29 | 2018-09-29 | Strain measurement method and device based on absolute phase |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811148215.2A CN109357624B (en) | 2018-09-29 | 2018-09-29 | Strain measurement method and device based on absolute phase |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109357624A true CN109357624A (en) | 2019-02-19 |
| CN109357624B CN109357624B (en) | 2021-02-23 |
Family
ID=65348083
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811148215.2A Active CN109357624B (en) | 2018-09-29 | 2018-09-29 | Strain measurement method and device based on absolute phase |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109357624B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110333222A (en) * | 2019-07-15 | 2019-10-15 | 天津大学 | Two-way strain detecting method and apparatus in the face of graphene |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100686923B1 (en) * | 2004-12-06 | 2007-02-27 | 김수길 | Phase-shifting Method Using Waveplates in Shearography and System for Measuring Deformation Using The Same |
| EP1536247B1 (en) * | 2003-11-28 | 2008-06-11 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Interferometric microwave radar method |
| CN105136806A (en) * | 2015-07-24 | 2015-12-09 | 合肥工业大学 | Bi-directional shearing speckle interference system based on spatial carrier and measurement method |
| US20180172437A1 (en) * | 2016-06-29 | 2018-06-21 | Nikon Corporation | Determination of operability of a digital scanner with shearing interferometry |
-
2018
- 2018-09-29 CN CN201811148215.2A patent/CN109357624B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1536247B1 (en) * | 2003-11-28 | 2008-06-11 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Interferometric microwave radar method |
| KR100686923B1 (en) * | 2004-12-06 | 2007-02-27 | 김수길 | Phase-shifting Method Using Waveplates in Shearography and System for Measuring Deformation Using The Same |
| CN105136806A (en) * | 2015-07-24 | 2015-12-09 | 合肥工业大学 | Bi-directional shearing speckle interference system based on spatial carrier and measurement method |
| US20180172437A1 (en) * | 2016-06-29 | 2018-06-21 | Nikon Corporation | Determination of operability of a digital scanner with shearing interferometry |
Non-Patent Citations (1)
| Title |
|---|
| 吴思进: "新型迈克尔逊型数字剪切散斑干涉术的研究", 《中国博士学位论文全文数据库》 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110333222A (en) * | 2019-07-15 | 2019-10-15 | 天津大学 | Two-way strain detecting method and apparatus in the face of graphene |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109357624B (en) | 2021-02-23 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109000580B (en) | Strain measurement method and device | |
| CN109357615B (en) | Speckle interference and shearing speckle interference shared device | |
| CN109272454B (en) | Coordinate system calibration method and device of augmented reality equipment | |
| US20200236337A1 (en) | Multi-lens based capturing apparatus and method | |
| CN111263075B (en) | Method, device and equipment for calibrating lens module comprising voice coil motor | |
| CN113589473B (en) | Focusing method, device and equipment of lens module | |
| KR20190096391A (en) | Database status determination method and device, and consistency verification method and device | |
| George et al. | Extended depth of field using a logarithmic asphere | |
| JP4594114B2 (en) | Image processing apparatus and refractive index distribution measuring apparatus | |
| KR20180116415A (en) | Pupillary illumination | |
| CN109357624B (en) | Strain measurement method and device based on absolute phase | |
| US10984566B2 (en) | Image processing apparatus that calculates using luminance values of one or more input images produced by photoelectric conversion of multiple polarized lights, image-capturing apparatus and image processing method | |
| US10895752B1 (en) | Diffractive optical elements (DOEs) for high tolerance of structured light | |
| JP2014030179A (en) | Multi-spectral enhancements for scan cameras | |
| CN115857187A (en) | Silicon-based chip packaging method and device, storage medium and electronic equipment | |
| US20190238732A1 (en) | Lens apparatus, imaging apparatus, image processing apparatus and method, and storage medium | |
| WO2023172681A1 (en) | Suppression of first-order diffraction in a two-dimensional grating of an output coupler for a head-mounted display | |
| Brahimi et al. | On the well-posedness of uncalibrated photometric stereo under general lighting | |
| US10048601B2 (en) | Apparatus for measuring mask error and method therefor | |
| US20180218231A1 (en) | Image processing system, information processing device, information processing method, and information processing program | |
| CN214751103U (en) | Phase type spatial light modulator calibration device for experimental environment | |
| US20180172975A1 (en) | Microscope device, storage medium and observation method | |
| CN117118523B (en) | Information transmission system, method and device, storage medium and electronic equipment | |
| CN105278235B (en) | Method for generating pattern and information processing unit | |
| US12072905B2 (en) | Information processing device, information processing method, and computer program product |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |