CN109357624A - A strain measurement method and device based on absolute phase - Google Patents

Abstract

The embodiment of the present application discloses a strain measurement method and device based on absolute phase, the method includes: constructing a shear speckle interference optical path based on a space carrier, wherein the shear speckle interference optical path includes four wavelengths different lasers; according to the shearing speckle interference optical path, synchronously determine a plurality of absolute phase values of the measured object after deformation; according to the plurality of absolute phase values, synchronously determine a plurality of displacement spaces of the measured object Gradient; according to the plurality of displacement spatial gradients, synchronously determine the multi-dimensional strain of the measured object. The strain amount obtained according to the absolute phase in the embodiment of the present application can truly reflect the strain condition of the object.

Description

A strain measurement method and device based on absolute phase

technical field

The present application relates to the technical field of full-field optical measurement, and in particular, to a strain measurement method and device based on absolute phase.

Background technique

Strain measurement is an important means of analyzing the stress distribution under material load. Reliable strain measurements can provide parameters such as mechanical properties of the material, defect locations, deformation under load, and risk values. Therefore, strain measurement is very important in engineering mechanics.

At present, the traditional shear speckle interferometry technique is used for strain measurement, and the displacement spatial gradient can only be determined according to the relative phase of the deformation process of the measured object. Since the displacement spatial gradient is the first derivative of the displacement, its positive and negative values reflect the increase and decrease of the deformation and the deformation rate. The displacement spatial gradient determined according to the relative phase cannot truly reflect the strain of the measured object.

SUMMARY OF THE INVENTION

Embodiments of the present application provide a strain measurement method and device based on absolute phase, so as to solve the problem that the existing strain measurement cannot truly reflect the strain condition of the measured object.

The embodiment of the present application provides a strain measurement method based on absolute phase, including:

Building a shear speckle interference optical path based on a space carrier, wherein the shear speckle interference optical path includes four lasers with different wavelengths;

According to the shear speckle interference optical path, synchronously determine a plurality of absolute phase values after the deformation of the measured object;

According to the plurality of absolute phase values, synchronously determine a plurality of displacement spatial gradients of the measured object;

According to the plurality of displacement space gradients, the multi-dimensional strain amount of the measured object is determined synchronously.

Optionally, the shearing speckle interference optical path includes: at least one shearing module, an imaging lens, and an image sensor;

Wherein, the at least one clipping module is used for introducing clipping quantity and introducing space carrier quantity.

Optionally, the shearing speckle interference optical path includes: a first shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction;

Simultaneously determine multiple displacement spatial gradients of the measured object, including:

According to the first shearing module, three displacement spatial gradients of the displacement of the measured object in the x-axis direction are synchronously determined: and

Optionally, synchronously determining the multi-dimensional strain of the measured object according to the plurality of displacement spatial gradients, including:

According to the three displacement spatial gradients: and Simultaneously determine the first principal strain variable ε _xx , the first shear strain variable ε _yx and the second shear strain variable ε _zx of the measured object.

Optionally, the shearing speckle interference optical path includes: a second shearing module, wherein the shearing amount of the second shearing module is in the y-axis direction;

Simultaneously determine multiple displacement spatial gradients of the measured object, including:

According to the second shearing module, the three displacement spatial gradients of the displacement of the measured object in the y-axis direction are determined synchronously: and

Optionally, synchronously determining the multi-dimensional strain of the measured object according to the plurality of displacement spatial gradients, including:

According to the three displacement spatial gradients: and Simultaneously determine the second main strain variable ε _yy , the third shear strain variable ε _xy and the fourth shear strain variable ε _zy of the measured object.

Optionally, the shearing speckle interference optical path includes: a first shearing module and a second shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction, and the second shearing module The shear amount of the module is in the y-axis direction;

Simultaneously determine multiple displacement spatial gradients of the measured object, including:

According to the first shearing module, three displacement spatial gradients of the displacement of the measured object in the x-axis direction are synchronously determined: and

According to the second shearing module, the three displacement spatial gradients of the displacement of the measured object in the y-axis direction are determined synchronously: and

Optionally, synchronously determining the multi-dimensional strain of the measured object according to the plurality of displacement spatial gradients, including:

According to the six displacement spatial gradients: and Simultaneously determine the first principal strain variable ε _xx , the second principal strain variable ε _yy , the first shear strain variable ε _yx , the second shear strain variable ε _zx , the third shear strain variable ε _xy and the fourth Shear strain variable ε _zy .

The embodiment of the present application also provides a strain measurement device based on absolute phase, including:

a building module for building a shear speckle interference light path based on a space carrier, wherein the shear speckle interference light path includes four lasers with different wavelengths;

a first determination module, configured to synchronously determine a plurality of absolute phase values after the deformation of the measured object according to the shear speckle interference optical path;

The first determination module is further configured to synchronously determine multiple displacement spatial gradients of the measured object according to the multiple absolute phase values;

The second determination module is configured to simultaneously determine the multi-dimensional strain of the measured object according to the plurality of displacement spatial gradients.

Optionally, the shearing speckle interference optical path includes: at least one shearing module, an imaging lens, and an image sensor;

Wherein, the at least one clipping module is used for introducing clipping quantity and introducing space carrier quantity.

The above-mentioned at least one technical solution adopted in the embodiments of the present application can achieve the following beneficial effects:

In the embodiment of the present application, a shearing speckle interference optical path based on a space carrier is constructed, wherein the shearing speckle interference optical path includes four lasers with different wavelengths; according to the shearing speckle interference optical path, the measured Multiple absolute phase values after deformation of the object, so that multiple displacement spatial gradients of the measured object are synchronously determined according to the multiple absolute phase values; The strain amount obtained from the absolute phase can truly reflect the strain of the object.

Description of drawings

The drawings described herein are used to provide further understanding of the present application and constitute a part of the present application. The schematic embodiments and descriptions of the present application are used to explain the present application and do not constitute an improper limitation of the present application. In the attached image:

1 is a schematic flowchart of a strain measurement method based on absolute phase provided by an embodiment of the present application;

FIG. 2 is a schematic diagram of a sheared speckle interference optical path according to an embodiment of the present application;

FIG. 3 is a schematic diagram of right-angle distribution of four lasers provided by an embodiment of the present application;

4 is a schematic diagram of another shear speckle interference optical path provided by an embodiment of the present application;

FIG. 5 is a schematic diagram of another shear speckle interference optical path provided by an embodiment of the present application;

FIG. 6 is a schematic structural diagram of a strain measurement device based on absolute phase provided by an embodiment of the present application.

Detailed ways

The technical solutions of the present application will be clearly and completely described below with reference to the specific embodiments of the present application and the corresponding drawings. Obviously, the described embodiments are only a part of the embodiments of the present application, but not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of this application.

The technical solutions provided by the embodiments of the present application will be described in detail below with reference to the accompanying drawings.

FIG. 1 is a schematic flowchart of an absolute phase-based strain measurement method provided by an embodiment of the present application. The method can be as follows.

Step 102 , build a shear speckle interference optical path based on a space carrier, wherein the shear speckle interference optical path includes four lasers with different wavelengths.

Step 104 , synchronously determine a plurality of absolute phase values after the deformation of the measured object according to the sheared speckle interference optical path.

Step 106 , synchronously determine a plurality of displacement spatial gradients of the measured object according to the plurality of absolute phase values.

Step 108: Synchronously determine the multi-dimensional strain of the measured object according to the multiple displacement spatial gradients.

Optionally, the shearing speckle interference optical path includes: at least one shearing module, an imaging lens, and an image sensor;

Among them, at least one clipping module is used for introducing clipping quantity and introducing space carrier quantity.

Optionally, the image sensor is a color camera.

When the image sensor is a color camera, it is only necessary to ensure complete separation between the high-frequency spectrum corresponding to the same laser and containing the phase information of the measured object and the low-frequency spectrum corresponding to the background light during the optical path adjustment.

Since the wavelengths of the four lasers are different, that is, the colors of the lasers emitted by the four lasers are different, the spectrums corresponding to different lasers will fall in different color-sensitive areas of the color camera for acquisition, and finally the spectrums corresponding to different lasers will be separated. Therefore, the difficulty of adjusting the optical path to achieve spectrum separation can be reduced, and the phase extraction can be performed separately for the spectrums corresponding to different lasers.

It should be noted that, in the shearing interference optical path, in addition to a color camera, the image sensor may also use a black-and-white camera, which is not specifically limited here.

If a black-and-white camera is used, during the optical path adjustment process, it is necessary to adjust a plurality of optical path parameters (for example, the amount of space carrier, etc.) to ensure complete separation between the spectrums corresponding to the four final lasers.

Compared with the time phase shift method, which requires at least three speckle patterns to solve the interference phase, the space carrier method only needs one speckle pattern to solve the interference phase. Therefore, the shear speckle interference optical path based on the space carrier can be realized. Simultaneous measurement of multi-dimensional strains during dynamic deformation of the measured object.

According to the number of shearing modules and the shearing direction, different multidimensional strains of the measured object can be determined simultaneously.

According to the different shear modules, the process of synchronously determining the multi-dimensional strain of the measured object is described in detail below.

First, the shearing speckle interference optical path includes: a first shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction;

Simultaneously determine multiple displacement spatial gradients of the measured object, including:

According to the first shearing module, the three displacement spatial gradients of the displacement of the measured object in the x-axis direction are determined synchronously: and

Further, according to multiple displacement spatial gradients, the multi-dimensional strain of the measured object is determined synchronously, including:

According to three displacement spatial gradients: and Simultaneously determine the first principal strain variable ε _xx , the first shear strain variable ε _yx and the second shear strain variable ε _zx of the measured object.

FIG. 2 is a schematic diagram of a shear speckle interference optical path according to an embodiment of the present application.

As shown in Figure 2, the shear speckle interference optical path includes: a laser 1 with a wavelength of λ ₁ , a laser 2 with a wavelength of λ ₂ , a laser 3 with a wavelength of λ ₃ , a laser 4 with a wavelength of λ ₄ , and a shearing amount The first shearing module in the x-axis direction, the imaging lens, the image sensor, and the measured object.

In the shearing speckle interference optical path shown in Figure 2, the placement of the four lasers can be determined according to the actual situation, either a right-angle distribution method or an arbitrary angle distribution method can be used, which is not done here. Specific restrictions.

The following takes the layout of the four lasers in a right-angle distribution as an example for detailed introduction.

FIG. 3 is a schematic diagram of right-angle distribution of four lasers according to an embodiment of the present application.

As shown in Figure 3, laser 1 and laser 3 are located in the xoz plane, and laser 2 and laser 4 are located in the yoz plane. The angle between the laser emitted by laser 1 and the yoz plane is α, the angle between the laser emitted by laser 3 and the yoz plane is -α, the angle between the laser emitted by laser 2 and the xoz plane is α, the laser 4 The angle between the outgoing laser and the xoz plane is -α.

It should be noted that the positions of laser 1, laser 2, laser 3, and laser 4 can be interchanged according to the actual situation, without affecting the strain measurement.

In the shearing speckle interference optical path shown in FIG. 2 , the dotted line part is the first shearing module, and the first shearing module includes: a first beam splitting prism, a first plane reflection mirror M1 , and a second plane reflection mirror M2 .

By adjusting the first plane mirror M1 in the first shearing module, the space carrier quantity and the shearing quantity in the x-axis direction are introduced.

In shear speckle interferometry, when the shear amount is on the x-axis, the relationship between the phase change of the measured object and the displacement spatial gradient is:

Among them, u, v, and w are the displacement components of the measured object in the x-axis, y-axis, and z-axis directions, respectively; are the partial derivatives of the displacement components u, v, and w in the x-axis direction; α is the angle between the illumination direction and the yoz plane, β is the angle between the illumination direction and the xoz plane, and γ is the illumination direction and the z-axis. the angle between.

Still taking the shear speckle interference optical path shown in Figure 2 above as an example, laser 1, laser 2, laser 3, and laser 4 respectively emit laser light to illuminate the object to be measured, and the first object light and the second object are reflected by the object to be measured. The light, the third object light, the fourth object light, and then the first object light, the second object light, the third object light, and the fourth object light respectively pass through the imaging lens, and the first shearing module whose shearing amount is in the x-axis direction Shearing interference is then formed on the surface of the image sensor.

Taking the layout of the four lasers at right angles as an example, since the fourth laser illumination light path is introduced, a solution formula can be added to the mathematical model, and then according to the shearing speckle interference collected by the image sensor Figure, get four absolute phase values after deformation of the measured object:

in, is the initial phase value of the measured object before deformation.

Solve the equation to obtain the initial phase value of the measured object before deformation and the three displacement spatial gradients of the measured object on the x-axis:

Among them, three displacement spatial gradients: and It is calculated according to the absolute phase value after deformation of the measured object. And then according to three displacement space gradients: and Simultaneously determine the first principal response variable of the measured object first shear strain and the second shear strain

Second, the shearing speckle interference optical path includes: a second shearing module, wherein the shearing amount of the second shearing module is in the y-axis direction;

Simultaneously determine multiple displacement spatial gradients of the measured object, including:

According to the second shearing module, the three displacement spatial gradients of the displacement of the measured object in the y-axis direction are determined simultaneously: and

Further, according to multiple displacement spatial gradients, the multi-dimensional strain of the measured object is determined synchronously, including:

According to three displacement spatial gradients: and Simultaneously determine the second principal strain variable ε _yy , the third shear strain variable ε _xy and the fourth shear strain variable ε _zy of the measured object.

FIG. 4 is a schematic diagram of another shear speckle interference optical path provided by an embodiment of the present application.

As shown in Fig. 4, the shear speckle interference optical path includes: laser 1 with wavelength λ ₁ , laser 2 with wavelength λ ₂ , laser 3 with wavelength λ ₃ , laser 4 with wavelength λ ₄ , and shear The second shearing module in the y-axis direction, the imaging lens, the image sensor, and the measured object.

In the shearing speckle interference optical path shown in Figure 4, the placement of the four lasers can also be determined according to the actual situation, either a right-angle distribution method or an arbitrary angle distribution method can be used. Here No specific limitation is made.

The following still takes the layout of the four lasers in a right-angle distribution manner as shown in FIG. 3 as an example for detailed description.

In the shearing speckle interference optical path shown in FIG. 4 , the second shearing module includes: a second beam splitter prism, a third plane reflection mirror M3, and a fourth plane reflection mirror M4.

By adjusting the third plane mirror M3 in the second shearing module, the space carrier quantity and the shearing quantity in the y-axis direction are introduced.

In shear speckle interferometry, when the shear amount is on the y-axis, the relationship between the phase change of the measured object and the displacement spatial gradient is:

Among them, u, v, and w are the displacement components of the measured object in the x-axis, y-axis, and z-axis directions, respectively; are the partial derivatives of the displacement components u, v, and w in the y-axis direction; α is the angle between the illumination direction and the yoz plane, β is the angle between the illumination direction and the xoz plane, and γ is the illumination direction and the z-axis. the angle between.

Still taking the shearing speckle interference optical path shown in Figure 4 above as an example, laser 1, laser 2, laser 3, and laser 4 respectively emit laser light to illuminate the object to be measured, and the first object light and the second object are reflected by the object to be measured. light, the third object light, the fourth object light, and then the first object light, the second object light, the third object light, and the fourth object light respectively pass through the imaging lens, and the second shearing module with the shearing amount in the y-axis direction Shearing interference is then formed on the surface of the image sensor.

Taking the layout of the four lasers at right angles as an example, since the fourth laser illumination light path is introduced, a solution formula can be added to the mathematical model, and then according to the shearing speckle interference collected by the image sensor Figure, get four absolute phase values after deformation of the measured object:

in, is the initial phase value of the measured object before deformation.

Solve the equation to obtain the initial phase value of the measured object before deformation and the three displacement spatial gradients of the measured object on the y-axis:

Among them, three displacement spatial gradients: and It is calculated according to the absolute phase value after deformation of the measured object. And then according to three displacement space gradients: and Simultaneously determine the second principal response variable of the measured object third shear strain and the fourth shear strain

Third, the shearing speckle interference optical path includes: a first shearing module and a second shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction, and the shearing amount of the second shearing module is in the y-axis direction axis direction;

Simultaneously determine multiple displacement spatial gradients of the measured object, including:

According to the first shearing module, the three displacement spatial gradients of the displacement of the measured object in the x-axis direction are determined synchronously: and

According to the second shearing module, the three displacement spatial gradients of the displacement of the measured object in the y-axis direction are determined simultaneously: and

Further, according to multiple displacement spatial gradients, the multi-dimensional strain of the measured object is determined synchronously, including:

According to six displacement spatial gradients: and Simultaneously determine the first principal strain ε _xx , the second principal strain ε _yy , the first shear strain ε _yx , the second shear strain ε _zx , the third shear strain ε _xy and the fourth shear strain variable ε _zy .

FIG. 5 is a schematic diagram of another shear speckle interference optical path provided by an embodiment of the present application.

As shown in Figure 5, the shear speckle interference optical path includes: a laser 1 with a wavelength of λ ₁ , a laser 2 with a wavelength of λ ₂ , a laser 3 with a wavelength of λ ₃ , a laser 4 with a wavelength of λ ₄ , a first polarization A beam splitter prism, a second polarized beam splitter prism, a first shearing module with the shearing amount in the x-axis direction, a second shearing module with the shearing amount in the y-axis direction, an imaging lens, an image sensor, and an object to be measured.

In the shearing speckle interference optical path shown in Figure 5, the placement of the four lasers can also be determined according to the actual situation, either a right-angle distribution method or an arbitrary angle distribution method can be used. Here No specific limitation is made.

The following still takes the layout of the four lasers in a right-angle distribution manner as shown in FIG. 3 as an example for detailed description.

In the shearing speckle interference optical path shown in FIG. 5 , the first shearing module includes: a first beam splitting prism, a first plane mirror M1, and a second plane mirror M2; the second shear module includes: a second beam splitter Prism, third plane mirror M3, fourth plane mirror M4.

By adjusting the first plane mirror M1 in the first shearing module, the space carrier wave and the shear amount in the x-axis direction are introduced; by adjusting the third plane mirror M3 in the second shear module, the space carrier wave and the shear amount in the x-axis direction are introduced. The amount of shear in the y-axis direction.

Laser 1, laser 2, laser 3, and laser 4 respectively emit laser light to illuminate the object to be measured, and the first object light, second object light, third object light, and fourth object light are reflected by the object to be measured; the first object light , The second object light, the third object light, and the fourth object light pass through the imaging lens and the first polarization beam splitting prism respectively, the first object light is divided into the first p light and the first s light, and the second object light is divided into the second The p light and the second s light and the third object light are divided into the third p light and the third s light, and the fourth object light is divided into the fourth p light and the fourth s light; and then the first p light and the second p light , the third p light, and the fourth p light respectively pass through the first shearing module and the second polarizing beam splitter prism to form shearing interference on the surface of the image sensor; the first s light, the second s light, the third s light, the fourth After passing through the second shearing module and the second polarizing beam splitting prism, the s light forms shearing interference on the surface of the image sensor.

Through the first polarization beam splitter prism and the second polarization beam splitter prism, the shearing speckle interference obtained according to the first shearing module and the second shearing module will not interfere with each other.

Taking the layout of the four lasers at right angles as an example, since the fourth laser illumination light path is introduced, a solution formula can be added to the mathematical model, and then according to the shearing speckle interference collected by the image sensor Figure, get eight absolute phase values after deformation of the measured object:

Solve the equation to obtain the initial phase value of the measured object before deformation, the three displacement spatial gradients of the measured object on the x-axis, and the three displacement spatial gradients of the measured object on the y-axis:

Among them, six displacement spatial gradients: and It is calculated according to the absolute phase value after deformation of the measured object. And then according to six displacement space gradients: and Simultaneously determine the first principal response variable of the measured object second principal response variable first shear strain second shear strain third shear strain and the fourth shear strain

In the technical solutions described in the embodiments of the present application, a shear speckle interference optical path based on a space carrier is constructed, wherein the shear speckle interference optical path includes four lasers with different wavelengths; according to the shear speckle interference optical path, the synchronous determination Multiple absolute phase values after deformation of the measured object, so that according to the multiple absolute phase values, multiple displacement spatial gradients of the measured object can be determined simultaneously; Therefore, the strain amount obtained according to the absolute phase can truly reflect the strain condition of the object.

FIG. 6 is a schematic structural diagram of a strain measurement device based on absolute phase provided by an embodiment of the present application. The device shown in Figure 6 includes:

A building module 601 is used to build a shear speckle interference light path based on a space carrier, wherein the shear speckle interference light path includes four lasers with different wavelengths;

The first determination module 602 is configured to synchronously determine a plurality of absolute phase values after the deformation of the measured object according to the sheared speckle interference optical path;

The first determining module 602 is further configured to synchronously determine multiple displacement spatial gradients of the measured object according to multiple absolute phase values;

The second determination module 603 is configured to simultaneously determine the multi-dimensional strain of the measured object according to the plurality of displacement spatial gradients.

Optionally, the shearing speckle interference optical path includes: at least one shearing module, an imaging lens, and an image sensor;

Among them, at least one clipping module is used for introducing clipping quantity and introducing space carrier quantity.

Optionally, the shearing speckle interference optical path includes: a first shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction;

The first determining module 602 is specifically used for:

According to the first shearing module, the three displacement spatial gradients of the displacement of the measured object in the x-axis direction are determined synchronously: and

The second determining module 603 is specifically used for:

According to three displacement spatial gradients: and Simultaneously determine the first principal strain variable ε _xx , the first shear strain variable ε _yx and the second shear strain variable ε _zx of the measured object.

Optionally, the shearing speckle interference optical path includes: a second shearing module, wherein the shearing amount of the second shearing module is in the y-axis direction;

The first determining module 602 is specifically used for:

According to the second shearing module, the three displacement spatial gradients of the displacement of the measured object in the y-axis direction are determined simultaneously: and

Optionally, the second determining module 603 is specifically configured to:

According to three displacement spatial gradients: and Simultaneously determine the second principal strain variable ε _yy , the third shear strain variable ε _xy and the fourth shear strain variable ε _zy of the measured object.

Optionally, the shearing speckle interference optical path includes: a first shearing module and a second shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction, and the shearing amount of the second shearing module is in the x-axis direction. y-axis direction;

The first determination module 602 further includes:

The first determination unit is used for synchronously determining three displacement spatial gradients of the displacement of the measured object in the x-axis direction according to the first shearing module: and

The second determining unit is configured to synchronously determine the three displacement spatial gradients of the displacement of the measured object in the y-axis direction according to the second shearing module: and

Optionally, the second determining module 603 is specifically configured to:

According to six displacement spatial gradients: and Simultaneously determine the first principal strain ε _xx , the second principal strain ε _yy , the first shear strain ε _yx , the second shear strain ε _zx , the third shear strain ε _xy and the fourth shear strain variable ε _zy .

According to the strain measurement device based on absolute phase, a building module is used to build a shear speckle interference optical path based on a space carrier, wherein the shear speckle interference light path includes four lasers with different wavelengths; The speckle interference optical path is cut to synchronously determine multiple absolute phase values after the deformation of the measured object; the first determination module is also used to synchronously determine multiple displacement spatial gradients of the measured object according to the multiple absolute phase values; the second determination module It is used to simultaneously determine the multi-dimensional strain of the measured object according to multiple displacement spatial gradients, so that the strain obtained according to the absolute phase can truly reflect the strain of the object.

In the 1990s, improvements in a technology could be clearly differentiated between improvements in hardware (eg, improvements to circuit structures such as diodes, transistors, switches, etc.) or improvements in software (improvements in method flow). However, with the development of technology, the improvement of many methods and processes today can be regarded as a direct improvement of the hardware circuit structure. Designers almost get the corresponding hardware circuit structure by programming the improved method flow into the hardware circuit. Therefore, it cannot be said that the improvement of a method flow cannot be realized by hardware entity modules. For example, a Programmable Logic Device (PLD) (eg, Field Programmable Gate Array (FPGA)) is an integrated circuit whose logic function is determined by user programming of the device. It is programmed by the designer to "integrate" a digital system on a PLD without having to ask the chip manufacturer to design and manufacture a dedicated integrated circuit chip. And, instead of making integrated circuit chips by hand, these days, much of this programming is done using software called a "logic compiler", which is similar to the software compiler used in program development and writing, but before compiling The original code also has to be written in a specific programming language, which is called Hardware Description Language (HDL), and there is not only one HDL, but many kinds, such as ABEL (Advanced Boolean Expression Language) , AHDL (Altera Hardware Description Language), Confluence, CUPL (Cornell University Programming Language), HDCal, JHDL (Java Hardware Description Language), Lava, Lola, MyHDL, PALASM, RHDL (RubyHardware Description Language), etc. The most commonly used are VHDL (Very-High-Speed Integrated Circuit Hardware Description Language) and Verilog. It should also be clear to those skilled in the art that a hardware circuit for implementing the logic method process can be easily obtained by simply programming the method process in the above-mentioned several hardware description languages and programming it into the integrated circuit.

The controller may be implemented in any suitable manner, for example, the controller may take the form of eg a microprocessor or processor and a computer readable medium storing computer readable program code (eg software or firmware) executable by the (micro)processor , logic gates, switches, application specific integrated circuits (ASICs), programmable logic controllers and embedded microcontrollers, examples of controllers include but are not limited to the following microcontrollers: ARC 625D, Atmel AT91SAM, Microchip PIC18F26K20 and Silicon Labs C8051F320, the memory controller can also be implemented as part of the control logic of the memory. Those skilled in the art also know that, in addition to implementing the controller in the form of pure computer-readable program code, the controller can be implemented as logic gates, switches, application-specific integrated circuits, programmable logic controllers and embedded devices by logically programming the method steps. The same function can be realized in the form of a microcontroller, etc. Therefore, such a controller can be regarded as a hardware component, and the devices included therein for realizing various functions can also be regarded as a structure within the hardware component. Or even, the means for implementing various functions can be regarded as both a software module implementing a method and a structure within a hardware component.

The systems, devices, modules or units described in the above embodiments may be specifically implemented by computer chips or entities, or by products with certain functions. A typical implementation device is a computer. Specifically, the computer can be, for example, a personal computer, a laptop computer, a cellular phone, a camera phone, a smart phone, a personal digital assistant, a media player, a navigation device, an email device, a game console, a tablet computer, a wearable device, or A combination of any of these devices.

For the convenience of description, when describing the above device, the functions are divided into various units and described respectively. Of course, when implementing the present application, the functions of each unit may be implemented in one or more software and/or hardware.

As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, system or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) having computer-usable program code embodied therein.

The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each process and/or block in the flowchart illustrations and/or block diagrams, and combinations of processes and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to the processor of a general purpose computer, special purpose computer, embedded processor or other programmable data processing device to produce a machine such that the instructions executed by the processor of the computer or other programmable data processing device produce Means for implementing the functions specified in a flow or flow of a flowchart and/or a block or blocks of a block diagram.

These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory result in an article of manufacture comprising instruction means, the instructions The apparatus implements the functions specified in the flow or flow of the flowcharts and/or the block or blocks of the block diagrams.

These computer program instructions can also be loaded on a computer or other programmable data processing device to cause a series of operational steps to be performed on the computer or other programmable device to produce a computer-implemented process such that The instructions provide steps for implementing the functions specified in the flow or blocks of the flowcharts and/or the block or blocks of the block diagrams.

In a typical configuration, a computing device includes one or more processors (CPUs), input/output interfaces, network interfaces, and memory.

Memory may include non-persistent memory in computer readable media, random access memory (RAM) and/or non-volatile memory in the form of, for example, read only memory (ROM) or flash memory (flash RAM). Memory is an example of a computer-readable medium.

Computer-readable media includes both persistent and non-permanent, removable and non-removable media, and storage of information may be implemented by any method or technology. Information may be computer readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read only memory (ROM), Electrically Erasable Programmable Read Only Memory (EEPROM), Flash Memory or other memory technology, Compact Disc Read Only Memory (CD-ROM), Digital Versatile Disc (DVD) or other optical storage, Magnetic tape cartridges, magnetic tape magnetic disk storage or other magnetic storage devices or any other non-transmission medium that can be used to store information that can be accessed by a computing device. Computer-readable media, as defined herein, excludes transitory computer-readable media, such as modulated data signals and carrier waves.

It should also be noted that the terms "comprising", "comprising" or any other variation thereof are intended to encompass a non-exclusive inclusion such that a process, method, article or device comprising a series of elements includes not only those elements, but also Other elements not expressly listed or inherent to such a process, method, article of manufacture or apparatus are also included. Without further limitation, an element qualified by the phrase "comprising a..." does not preclude the presence of additional identical elements in the process, method, article of manufacture or device that includes the element.

The application may be described in the general context of computer-executable instructions, such as program modules, being executed by a computer. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform particular tasks or implement particular abstract data types. The application may also be practiced in distributed computing environments where tasks are performed by remote processing devices that are linked through a communications network. In a distributed computing environment, program modules may be located in both local and remote computer storage media including storage devices.

Each embodiment in this specification is described in a progressive manner, and the same and similar parts between the various embodiments may be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, as for the system embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and for related parts, please refer to the partial descriptions of the method embodiments.

The above descriptions are merely examples of the present application, and are not intended to limit the present application. Various modifications and variations of this application are possible for those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of this application shall be included within the scope of the claims of this application.

Claims (10)

1. a strain measurement method based on absolute phase, is characterized in that, comprises: Building a shear speckle interference optical path based on a space carrier, wherein the shear speckle interference optical path includes four lasers with different wavelengths; According to the shear speckle interference optical path, synchronously determine a plurality of absolute phase values after the deformation of the measured object; According to the plurality of absolute phase values, synchronously determine a plurality of displacement spatial gradients of the measured object; According to the plurality of displacement space gradients, the multi-dimensional strain amount of the measured object is determined synchronously. 2. The method of claim 1, wherein the shearing speckle interference optical path comprises: at least one shearing module, an imaging lens, and an image sensor; Wherein, the at least one clipping module is used for introducing clipping quantity and introducing space carrier quantity. 3. The method of claim 2, wherein the shearing speckle interference optical path comprises: a first shearing module, wherein the shearing amount of the first shearing module is in the x-axis direction; Simultaneously determine multiple displacement spatial gradients of the measured object, including: According to the first shearing module, three displacement spatial gradients of the displacement of the measured object in the x-axis direction are synchronously determined: and 4. The method according to claim 3, wherein, according to the plurality of displacement spatial gradients, synchronously determining the multi-dimensional strain of the measured object, comprising: According to the three displacement spatial gradients: and Simultaneously determine the first principal strain variable ε _xx , the first shear strain variable ε _yx and the second shear strain variable ε _zx of the measured object. 5. The method of claim 2, wherein the shearing speckle interference optical path comprises: a second shearing module, wherein the shearing amount of the second shearing module is in the y-axis direction; Simultaneously determine multiple displacement spatial gradients of the measured object, including: According to the second shearing module, the three displacement spatial gradients of the displacement of the measured object in the y-axis direction are determined synchronously: and 6. The method according to claim 5, wherein, according to the plurality of displacement space gradients, synchronously determining the multi-dimensional strain of the measured object, comprising: According to the three displacement spatial gradients: and Simultaneously determine the second main strain variable ε _yy , the third shear strain variable ε _xy and the fourth shear strain variable ε _zy of the measured object. 7. The method of claim 2, wherein the shearing speckle interference optical path comprises: a first shearing module and a second shearing module, wherein the shearing amount of the first shearing module In the x-axis direction, the shearing amount of the second shearing module is in the y-axis direction; According to the shear speckle interference optical path, multiple displacement spatial gradients of the measured object are synchronously determined, including: According to the first shearing module, three displacement spatial gradients of the displacement of the measured object in the x-axis direction are synchronously determined: and According to the second shearing module, the three displacement spatial gradients of the displacement of the measured object in the y-axis direction are determined synchronously: and 8. The method according to claim 7, wherein synchronously determining the multi-dimensional strain of the measured object according to the plurality of displacement space gradients, comprising: According to the six displacement spatial gradients: and Simultaneously determine the first principal strain variable ε _xx , the second principal strain variable ε _yy , the first shear strain variable ε _yx , the second shear strain variable ε _zx , the third shear strain variable ε _xy and the fourth Shear strain variable ε _zy . 9. A strain measurement device based on absolute phase, characterized in that, comprising: a building module for building a shear speckle interference light path based on a space carrier, wherein the shear speckle interference light path includes four lasers with different wavelengths; a first determination module, configured to synchronously determine a plurality of absolute phase values after the deformation of the measured object according to the shear speckle interference optical path; The first determination module is further configured to synchronously determine multiple displacement spatial gradients of the measured object according to the multiple absolute phase values; The second determination module is configured to simultaneously determine the multi-dimensional strain of the measured object according to the plurality of displacement spatial gradients. 10. The apparatus of claim 9, wherein the shearing speckle interference optical path comprises: at least one shearing module, an imaging lens, and an image sensor; Wherein, the at least one clipping module is used for introducing clipping quantity and introducing space carrier quantity.