CN109351375A - 一种平面阵列拦截杂质的单向微流控芯片 - Google Patents

一种平面阵列拦截杂质的单向微流控芯片 Download PDF

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CN109351375A
CN109351375A CN201811431011.XA CN201811431011A CN109351375A CN 109351375 A CN109351375 A CN 109351375A CN 201811431011 A CN201811431011 A CN 201811431011A CN 109351375 A CN109351375 A CN 109351375A
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吕云平
王继业
姚伟宣
王学军
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Zhejiang Police College
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Abstract

本发明公开一种平面阵列拦截杂质的单向微流控芯片。该芯片由基片和玻璃片键合构成，基片内开有两端开放的“凵”形腔室，该腔室包括样品入口、样品检测单元、样品出口，所述样品入口与样品检测单元以及样品出口依次相连通。样品出口无多个柱状体组成的平面阵列，其他方面结构与样品入口结构相同。本发明的微流控芯片的样品入口和样品出口结构简单，样品进口可以拦截样品中的杂质并让其它物质通过，提高检测精准度。

Description

一种平面阵列拦截杂质的单向微流控芯片
技术领域
本发明属于微流控芯片，具体涉及一种带有样品入口和样品出口的微流控芯片。
背景技术
市场上的微流控芯片包括样品入口、样品检测单元和样品出口，这种微流控芯片的样品入口不能拦截待检样品中的杂质，由于待检样品中会含有杂质，需设置专门的拦截单元来拦截待检样品中的杂质，因而这种微流控芯片结构复杂。
发明内容
本发明的目的是提供一种结构简单且样品入口可拦截待检样品中杂质的微流控芯片。
为了实现上述目的，本发明的技术方案是：一种微流控芯片，由基片和玻璃片(即平面阵列)键合构成，基片内开有两端开放的“凵”形腔室，该腔室包括样品入口、样品检测单元、样品出口，所述样品入口与样品检测单元以及样品出口依次相连通；所述样品检测单元为现有成熟检测模块。
所述样品入口位于基片“凵”形腔室的其中一臂，具体包括样品过滤室、滤液收集室以及多个柱状体组成的平面阵列；样品过滤室入口位于样品过滤室顶部，样品过滤室的底部与滤液收集室的入口连通，样品过滤室的底部与滤液收集室的入口尺寸一致，且两者间通过多个柱状体组成的平面阵列隔开；滤液收集室的出口设置在基片“凵”形腔室臂部的侧壁，且滤液收集室的出口与样品检测单元的入口相连通；
上述微流控芯片的样品过滤室为底面为正方形的长方体腔室，2000μm≤底面边长≤4000μm,1600μm≤样品过滤室高度≤3200μm。
上述微流控芯片的滤液收集室为底面为正方形的长方体腔室，2000μm≤长方体腔室的底面边长≤4000μm,1600μm≤滤液收集室高度≤3200μm。
上述微流控芯片滤液收集室出口的宽度为495-505μm，高度为495-505μm。
上述微流控芯片多个柱状体组成的平面阵列中柱状体之间的最小距离是40μm。
上述微流控芯片的样品出口位于基片“凵”形腔室的另一臂，具体包括样品出口室入口、样品出口室、样品出口室出口；样品出口室为正方形的长方体腔室，样品出口室入口位于基片“凵”形腔室臂部的侧壁(即长方体腔室侧壁)，样品出口室出口位于长方体腔室顶部。
上述微流控芯片样品出口的样品出口室为正方形的长方体腔室，2000μm≤底面边长≤4000μm,3200μm≤样品出口室高度≤6400μm。
上述微流控芯片样品出口室入口的宽度为495-505μm，高度为495-505μm。
本发明的优势是：1)由于样品入口的滤液收集室中设置可拦截样品中杂志的柱状体阵列，不需要设置专门的拦截单元对待检样品中的杂质进行拦截，因而结构简单；2)柱状形阵列位于滤液收集室之间，待检样品中杂质被拦截，而滤液则由滤液收集室出口流出，因此这种微流控芯片样品入口可吸咐待检测样品的杂质并让其余物质流出。
附图说明
图1是本发明的微流控芯片的一种实施例的结构示意图；
图2是本发明的微流控芯片的俯视图；
图3是本发明的微流控芯片的立体示意图；
图4是样品入口的立体图；
图5是样品入口的侧视图。
图中标记：样品入口1，样品过滤室入口1-1，样品过滤室1-2，平面阵列1-3，滤液收集室1-4，滤液收集室出口1-5，样品检测单元2，样品出口3，样品出口室入口3-1，样品出口室3-2，样品出口室出口3-3。
具体实施方式
以下结合附图以及给出的实施例，对本发明作进一步的说明。
如图1～5所示，一种微流控芯片，由基片和玻璃片键合构成，包括样品入口1和样品出口3,所述样品入口1和样品出口3相连通；
所述样品入口1包括样品过滤室1-2、样品过滤室入口1-1、滤液收集室1-4、滤液收集室出口1-5和多个柱状体组成的平面阵列1-3，样品过滤室1-2与滤液收集室1-4为底面为正方形的长方体腔室，样品过滤室入口1-1位于长方体腔室顶部，滤液收集室出口1-5位于长方体腔室侧壁上；
多个柱状体组成的平面阵列1-3将长方体腔室分割为样品过滤室1-2和滤液收集室1-4。
上述样品过滤室1-2的尺寸为：2000μm≤长方体腔室的底面边长≤4000μm,1600μm≤样品过滤室高度≤3200μm。
上述滤液收集室1-4的尺寸为：2000μm≤长方体腔室的底面边长≤4000μm,1600μm≤滤液收集室高度≤3200μm。
上述滤液收集室出口1-5的宽度为500±5μm，高度为500±5μm。
上述多个柱状体组成的平面阵列1-3中柱状体之间的距离是40μm。
如图1～3所示，上述微流控芯片的样品出口3包括样品出口室入口3-1、样品出口室3-2、样品出口室出口3-3；样品出口室3-1为底面为正方形的长方体腔室，样品出口室入口3-1位于长方体腔室侧壁上，样品出口室出口3-3位于长方体腔室顶部。
上述样品出口3的样品出口室3-2的尺寸为：2000μm≤长方体腔室的底面边长≤4000μm,3200μm≤样品出口室高度≤6400μm。
上述样品出口3的样品出口室入口3-1的宽度为500±5μm，高度为500±5μm。
如图1所示上述微流控芯片还包括样品检测单元2，所述样品入口1与样品检测单元2以及样品出口3依次相连通。
用本发明的可拦截直径大于40μm杂质的微流控芯片的样品入口1进行样品检测时，按图1所示，将本发明的微流控芯片的样品入口1与样品检测单元2及样品出口3依次相连通后就可以对待检测样品进行检测。
如图1-5所示，当待检测样品从样品过滤室1-2顶部入口1-1注入后，由于样品过滤室1-1底部柱状体阵列的过滤作用，直径大于40μm的杂质将被拦截在样品过滤室1-2中，其余滤液汇集于滤液收集室1-4中并通过滤液收集室出口1-5流进检测单元2进行检测后经样品出口3流出。
上述实施例并非是对于本发明的限制，本发明并非仅限于上述实施例，只要符合本发明要求，均属于本发明的保护范围。

Claims (6)

1.一种平面阵列拦截杂质的单向微流控芯片，其特征在于基片和玻璃片键合构成，基片内开有两端开放的“凵”形腔室，该腔室包括样品入口、样品检测单元、样品出口，所述样品入口与样品检测单元以及样品出口依次相连通；
所述样品入口位于基片“凵”形腔室的其中一臂，具体包括样品过滤室、滤液收集室以及多个柱状体组成的平面阵列；样品过滤室入口位于样品过滤室顶部，样品过滤室的底部与滤液收集室的入口连通，样品过滤室的底部与滤液收集室的入口尺寸一致，且两者间通过多个柱状体组成的平面阵列隔开；滤液收集室的出口设置在基片“凵”形腔室臂部的侧壁，且滤液收集室的出口与样品检测单元的入口相连通；
上述微流控芯片多个柱状体组成的平面阵列中柱状体之间的最小距离是40μm；
所述样品出口位于基片“凵”形腔室的另一臂，具体包括样品出口室入口、样品出口室、样品出口室出口；样品出口室为正方形的长方体腔室，样品出口室入口位于基片“凵”形腔室臂部的侧壁，样品出口室出口位于长方体腔室顶部。
2.如权利要求1所述的一种平面阵列拦截杂质的单向微流控芯片，其特征在于上述微流控芯片的样品过滤室为底面为正方形的长方体腔室，2000μm≤底面边长≤4000μm,1600μm≤样品过滤室高度≤3200μm。
3.如权利要求1所述的一种平面阵列拦截杂质的单向微流控芯片，其特征在于上述微流控芯片的滤液收集室为底面为正方形的长方体腔室，2000μm≤长方体腔室的底面边长≤4000μm,1600μm≤滤液收集室高度≤3200μm。
4.如权利要求1所述的一种平面阵列拦截杂质的单向微流控芯片，其特征在于上述微流控芯片滤液收集室出口的宽度为495-505μm，高度为495-505μm。
5.如权利要求1所述的一种平面阵列拦截杂质的单向微流控芯片，其特征在于上述微流控芯片样品出口的样品出口室为正方形的长方体腔室，2000μm≤底面边长≤4000μm,3200μm≤样品出口室高度≤6400μm。
6.如权利要求1所述的一种平面阵列拦截杂质的单向微流控芯片，其特征在于上述微流控芯片样品出口室入口的宽度为495-505μm，高度为495-505μm。
CN201811431011.XA 2018-11-28 2018-11-28 一种平面阵列拦截杂质的单向微流控芯片 Withdrawn CN109351375A (zh)

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Cited By (1)

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CN111207988A (zh) * 2020-02-18 2020-05-29 中南大学 一种基于微流体的矿浆监测装置

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