CN109351377A - 一种内设交叉阵列可单向拦截杂质的微流控芯片 - Google Patents

一种内设交叉阵列可单向拦截杂质的微流控芯片 Download PDF

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CN109351377A
CN109351377A CN201811438417.0A CN201811438417A CN109351377A CN 109351377 A CN109351377 A CN 109351377A CN 201811438417 A CN201811438417 A CN 201811438417A CN 109351377 A CN109351377 A CN 109351377A
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姚伟宣
傅得锋
王继业
吕云平
王学军
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Zhejiang Police College
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Abstract

本发明公开一种内设交叉阵列可单向拦截杂质的微流控芯片。所述的微流控芯片由基片和玻璃片键合构成，包括由孔道连通的样品入口和样品出口。样品入口包括样品过滤室、滤液收集室、样品过滤室入口、滤液收集室出口和多个柱状体组成的立体交叉阵列；样品过滤室与滤液收集室为圆柱形腔室，多个柱状体组成的立体交叉阵列将圆柱形腔室分割为样品过滤室和滤液收集室；样品过滤室入口位于圆柱形腔室顶部，滤液收集室出口位于圆柱形腔室侧壁上。样品出口无多个柱状体组成的立体交叉阵列，其他方面结构与样品入口结构相同。本发明的微流控芯片的样品入口和样品出口结构简单，样品进口可以拦截样品中的杂质并让其它物质通过，提高检测精准度。

Description

一种内设交叉阵列可单向拦截杂质的微流控芯片
技术领域
本发明属于微流控芯片，具体涉及一种带有样品入口和样品出口的微流控芯片。
背景技术
市场上的微流控芯片包括样品入口、样品检测单元和样品出口，这种微流控芯片的样品入口不能拦截待检样品中的杂质，由于待检样品中会含有杂质，需设置专门的拦截单元来拦截待检样品中的杂质，因而这种微流控芯片结构复杂。
发明内容
本发明的目的是提供一种结构简单且样品入口可拦截待检样品中的杂质的微流控芯片。
为了实现上述目的，本发明的技术方案是：一种微流控芯片，由基片和玻璃片(即立体交叉阵列)键合构成，基片内开有两端开放的“凵”形腔室，该腔室包括样品入口、样品检测单元、样品出口。所述样品入口与样品检测单元以及样品出口依次相连通；所述样品检测单元为现有成熟检测模块。
所述样品入口位于基片“凵”形腔室的其中一臂，具体包括样品过滤室、滤液收集室和多个柱状体组成的立体交叉阵列；样品过滤室与滤液收集室上下设置组合成圆柱形腔室，样品过滤室入口位于圆柱形腔室顶部，滤液收集室出口位于圆柱形腔室下端侧壁上。立体交叉阵列设置在样品过滤室与滤液收集室间。
所述多个柱状体组成的立体交叉阵列由多个柱状体交错成网状构成。
上述微流控芯片的样品过滤室的尺寸为：1500μm≤圆柱形腔室直径≤3000μm,30μm≤样品过滤室高度≤50μm。
上述微流控芯片的滤液收集室的尺寸为：1500μm≤圆柱形腔室直径≤3000μm,30μm≤滤液收集室高度≤50μm。
上述微流控芯片滤液收集室出口的宽度为495～505μm，高度为30～50μm。
上述微流控芯片多个柱状体组成的立体交叉阵列中相邻柱状体之间的最小距离是40μm。
上述微流控芯片的样品出口位于基片“凵”形腔室的另一臂，具体包括样品出口室入口、样品出口室、样品出口室出口；样品出口室为圆柱形腔室，样品出口室入口位于圆柱形腔室下端侧壁上，样品出口室出口位于圆柱形腔室顶部。
上述微流控芯片样品出口的样品出口室的尺寸为：1500μm≤圆柱形腔室直径≤3000μm,60μm≤圆柱形腔室高度≤100μm。
上述微流控芯片样品出口室入口的宽度为495～505μm，高度为30～50μm。
本发明的好处是：1)由于样品入口的滤液收集室中设置可拦截样品中杂质的柱状体交叉阵列，不需要设置专门的拦截单元对待检样品中的杂质进行拦截，因而结构简单；2)柱状体交叉阵列位于滤液收集室与样品过滤室之间，待检样品中的杂质被拦截而滤液则由滤液收集室出口流出，因此这种微流控芯片样品入口可吸咐待检测样品的杂质并让其余物质流出。
附图说明
图1是本发明的微流控芯片的一种实施例的结构示意图；
图2是本发明的微流控芯片的立体示意图；
图3是样品入口的俯视图；
图4是样品入口的立体图。
具体实施方式
以下结合附图以及给出的实施例，对本发明作进一步的说明。
如图1～4所示，一种微流控芯片，由基片和玻璃片键合构成，包括样品入口1和样品出口3,所述样品入口1和样品出口3相连通；
所述样品入口1包括样品过滤室1-2、样品过滤室入口1-1、滤液收集室1-4、滤液收集室出口1-5和多个柱状体组成的立体交叉阵列1-3，样品过滤室1-2与滤液收集室1-4为圆柱形腔室，样品过滤室入口1-1位于圆柱形腔室顶部，滤液收集室出口1-5位于圆柱形腔室侧壁上；
多个柱状体组成的立体交叉阵列1-3将长方体腔室分割为样品过滤室1-2和滤液收集室1-4。
上述样品过滤室1-2的尺寸为：1500μm≤圆柱形腔室直径≤3000μm,30μm≤样品过滤室高度≤50μm。
上述滤液收集室1-4的尺寸为：1500μm≤圆柱形腔室直径≤3000μm,30μm≤滤液收集室高度≤50μm。
上述滤液收集室出口1-5的宽度为500±5μm，高度为30～50μm。
上述多个柱状体组成的立体交叉阵列1-3中相邻柱状体之间的距离是40μm。
如图1～3所示，上述微流控芯片的样品出口3包括样品出口室入口3-1、样品出口室3-2、样品出口室出口3-3；样品出口室3-2为圆柱形腔室，样品出口室入口3-1位于圆柱形腔室下端侧壁上，样品出口室出口3-3位于圆柱形腔室顶部。
上述样品出口3的样品出口室3-2的尺寸为：1500μm≤圆柱形腔室≤3000μm,60μm≤圆柱形腔室≤100μm。
上述样品出口3的样品出口室入口3-1的宽度为500±5μm，高度为30～50μm。如图1所示上述微流控芯片还包括样品检测单元2，所述样品入口1与样品检测单元2以及样品出口3依次相连通。
用本发明的可拦截直径大于40μm杂质的微流控芯片的样品入口1进行样品检测时，按图1所示，将本发明的微流控芯片的样品入口1与样品检测单元2及样品出口3依次相连通后就可以对待检测样品进行检测。
如图1-4所示，当待检测样品从样品过滤室1-2顶部入口1-1注入后，由于样品过滤室1-1底部柱状体阵列的过滤作用，直径大于40μm的杂质将被拦截在样品过滤室1-2中，其余滤液汇集于滤液收集室1-4中并通过滤液收集室出口1-5流进检测单元2进行检测后经样品出口3流出。
上述实施例并非是对于本发明的限制，本发明并非仅限于上述实施例，只要符合本发明要求，均属于本发明的保护范围。

Claims (7)

1.一种内设交叉阵列可单向拦截杂质的微流控芯片，其特征在于由基片和立体交叉阵列键合构成，基片内开有两端开放的“凵”形腔室，该腔室包括样品入口、样品检测单元、样品出口。所述样品入口与样品检测单元以及样品出口依次相连通；
所述样品入口位于基片“凵”形腔室的其中一臂，具体包括样品过滤室、滤液收集室和多个柱状体组成的立体交叉阵列；样品过滤室与滤液收集室上下设置组合成圆柱形腔室，样品过滤室入口位于圆柱形腔室顶部，滤液收集室出口位于圆柱形腔室下端侧壁上；立体交叉阵列设置在样品过滤室与滤液收集室间；
所述多个柱状体组成的立体交叉阵列由多个柱状体交错成网状构成；
所述样品出口位于基片“凵”形腔室的另一臂，具体包括样品出口室入口、样品出口室、样品出口室出口；样品出口室为圆柱形腔室，样品出口室入口位于圆柱形腔室下端侧壁上，样品出口室出口位于圆柱形腔室顶部。
2.如权利要求1所述的一种内设交叉阵列可单向拦截杂质的微流控芯片，其特征在于上述微流控芯片的样品过滤室的尺寸为：1500μm≤圆柱形腔室直径≤3000μm,30μm≤样品过滤室高度≤50μm。
3.如权利要求1所述的一种内设交叉阵列可单向拦截杂质的微流控芯片，其特征在于上述微流控芯片的滤液收集室的尺寸为：1500μm≤圆柱形腔室直径≤3000μm,30μm≤滤液收集室高度≤50μm。
4.如权利要求1所述的一种内设交叉阵列可单向拦截杂质的微流控芯片，其特征在于上述微流控芯片滤液收集室出口的宽度为495～505μm，高度为30～50μm。
5.如权利要求1所述的一种内设交叉阵列可单向拦截杂质的微流控芯片，其特征在于上述微流控芯片多个柱状体组成的立体交叉阵列中相邻柱状体之间的最小距离是40μm。
6.如权利要求1所述的一种内设交叉阵列可单向拦截杂质的微流控芯片，其特征在于上述微流控芯片样品出口的样品出口室的尺寸为：1500μm≤圆柱形腔室直径≤3000μm,60μm≤圆柱形腔室高度≤100μm。
7.如权利要求1所述的一种内设交叉阵列可单向拦截杂质的微流控芯片，其特征在于上述微流控芯片样品出口室入口的宽度为495～505μm，高度为30～50μm。
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