CN109186448B - Pin falling depth tester - Google Patents
Pin falling depth tester Download PDFInfo
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- CN109186448B CN109186448B CN201811192425.1A CN201811192425A CN109186448B CN 109186448 B CN109186448 B CN 109186448B CN 201811192425 A CN201811192425 A CN 201811192425A CN 109186448 B CN109186448 B CN 109186448B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/26—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring depth
Abstract
The invention provides a pin falling depth tester, which comprises a CPU, a filter circuit, a blocking amplification circuit, a test circuit, a signal processing circuit, a relay array, a relay control circuit, a key, a display circuit and a safety mechanism state indicating circuit, wherein the CPU generates sine PWM signals, the sine PWM signals are input into the test circuit after being subjected to filtering blocking amplification processing, a tested electromagnetic pin and a standard resistor are controlled to be connected into the test circuit, voltage signals of the tested electromagnetic pin and the standard resistor are collected and input into the CPU after passing through the signal processing circuit, the CPU calculates the inductance of the tested electromagnetic pin, and the pin falling depth of the electromagnetic pin is obtained through conversion according to the variable quantity of the inductance. The invention accurately measures the depth of the electromagnetic pin of the safety mechanism falling into the locking hole, has stable measurement data and higher precision, and completely meets the requirements of production and use of the safety mechanism.
Description
Technical Field
The invention relates to the technical field of safety mechanism testing, in particular to a pin falling depth tester.
Background
The safety mechanism is a highly reliable valve device installed on the missile engine, is usually installed on a channel between an electric ignition tube and gunpowder, and can reliably cut off or connect a fire and explosion transfer channel of the solid missile engine according to requirements.
The safety mechanism has two states, namely a safety state and an operating state. The safety mechanism can only be in one of these two states, namely either in a safety state or in an operating state.
When the safety mechanism is in the safety state, the electromagnetic pin in the safety mechanism is in the pin pulling state. At the moment, the motor in the safety mechanism is electrified for a certain time, the safety mechanism is switched to a working state from a safety state, the electromagnetic pin in the safety mechanism is inserted into the locking hole, and the safety mechanism is locked in the working state by the electromagnetic pin. However, in the practical test process, the applicant finds that if the depth of the electromagnetic pin inserted into the locking hole (namely, the pin falling depth) is shallow, the electromagnetic pin is easy to be separated from the locking hole when the safety mechanism is subjected to vibration or strong impact, and the safety mechanism returns to the safety state under the action of the internal spiral spring, so that the pin falling depth of the electromagnetic pin directly influences the reliability of the working state of the safety mechanism.
Through theoretical analysis, the applicant finds that when the safety mechanism is in the working state, the safety mechanism is considered to be reliably locked in the working state by the electromagnetic pin only under the condition that the depth of the electromagnetic pin inserted into the position locking hole exceeds 2 mm; it is only possible to determine whether the safety mechanism is reliably locked in the operating state by the solenoid pin after the depth of insertion of the solenoid pin into the capture hole is known. However, the electromagnetic pin is installed inside the safety mechanism of the metal shell, the depth of the electromagnetic pin inserted into the lock position hole cannot be directly measured by using a caliper equivalent tool, and the installation position of the electromagnetic pin can be determined only by the experience of an assembly worker.
Disclosure of Invention
In the assembly process of the safety mechanism of the missile engine, when the electromagnetic pin is installed, an assembly worker determines the installation position of the electromagnetic pin by experience at present, so that after the electromagnetic pin is installed in the safety mechanism, when the safety mechanism is converted into a working state from a safety state, and the electromagnetic pin is inserted into the locking hole, the depth of the electromagnetic pin inserted into the locking hole is shallow, so that the electromagnetic pin is separated from the locking hole when the safety mechanism is vibrated or strongly impacted, and the safety mechanism returns to the safety state under the action of an internal worm-wire spring, so that the reliability of the working state of the safety mechanism is greatly reduced.
Therefore, a pin falling depth tester needs to be developed to accurately measure the pin falling depth of the electromagnetic pin, and the electromagnetic pin is arranged in the safety mechanism of the metal shell and cannot be directly measured in a mechanical measuring mode such as a caliper.
Based on the principle, the technical scheme of the invention is as follows:
the pin falling depth tester is characterized in that: the device comprises a CPU, a filter circuit, a blocking amplification circuit, a test circuit, a signal processing circuit, a relay array, a relay control circuit, a key, a display circuit and a safety mechanism state indicating circuit;
the CPU generates a sine PWM signal and inputs the sine PWM signal into the filter circuit, and the filter circuit outputs a sine wave signal Sin after filtering the PWM signal; the sine wave signal Sin passes through the blocking amplification circuit and then outputs a Sin _ out signal for the test circuit to use;
the relay control circuit receives a control signal generated by the CPU and controls the relay array to act according to the control signal; the relay array can control the safety mechanism to perform state conversion and control an electromagnetic pin of the safety mechanism to be connected into a test circuit;
the testing circuit receives the Sin _ out signal, the Sin _ out signal can flow through the tested electromagnetic pin and the standard resistor through the closed relay array after being subjected to current limiting in the testing circuit, voltages are generated at two ends of the tested electromagnetic pin and the standard resistor, and the voltages generated on the tested electromagnetic pin and the standard resistor are amplified and then are respectively input into the analog switch circuit, so that an output signal EK3_ A corresponding to the tested electromagnetic pin and an output signal EK3_ B corresponding to the standard resistor are obtained;
the signal processing circuit processes output signals corresponding to the measured electromagnetic pin and the standard resistor and then respectively inputs the processed output signals into the CPU, and the CPU processes voltage signals V generated on the measured electromagnetic pin and the standard resistor according to the signal processing circuit1And V2Calculating the inductive reactance X of the electromagnetic pin to be detected, wherein V1＝a+jb，V2C + jd, then
Rs is the standard resistance value; and the pin falling depth of the electromagnetic pin is obtained through conversion according to the variable quantity of the inductive reactance X;
the CPU is connected with the keys and the display circuit, carries out man-machine interaction through the keys and the display circuit and displays test information;
the CPU is connected with the safety mechanism state indicating circuit, the safety mechanism state indicating circuit can receive the safety mechanism state switch signal, display the state information according to the safety mechanism state switch signal and send the state information to the CPU, and the CPU controls the state switching direction of the safety mechanism according to the state information.
Further preferred scheme, a pin fall depth tester, its characterized in that: in the filter circuit, PWM signals are subjected to 2-stage RC filtering, followed by using an operational amplifier, and subjected to 3-stage RC filtering to output sine wave signals Sin.
Further preferred scheme, a pin fall depth tester, its characterized in that: in the signal processing circuit, signals EK3_ A and EK3_ B are input into an analog switch and then controlled to output an EK3_ C signal, EK3_ C enters the analog switch after being processed by two-stage operational amplifier, controlled output EK5_ C and EK5_ C are amplified after being filtered by 2-stage RC and finally enter the input end of an AD converter of a CPU.
Advantageous effects
The pin falling depth tester provided by the invention is already applied to the development, production and product inspection and acceptance of safety mechanisms in the unit of the applicant. The application result shows that the tester can correctly control the safety mechanism to carry out state conversion and indicate the state of the safety mechanism, and can also accurately measure the depth of the electromagnetic pin of the safety mechanism falling into the locking hole, the measured data is stable, the precision is high, and the requirements of the safety mechanism on production and use are completely met.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
FIG. 1: a structural block diagram of the pin falling depth tester;
FIG. 2: the structure of the electromagnetic pin is shown schematically;
FIG. 3: measuring a schematic diagram of a circuit;
FIG. 4: a PWM generating circuit diagram;
FIG. 5: a filtering processing diagram of the PWM signal;
FIG. 6: a sine wave alternating current signal;
FIG. 7: testing the circuit diagram;
FIG. 8: a signal processing circuit diagram;
FIG. 9: a relay control circuit diagram;
FIG. 10: a key circuit diagram;
FIG. 11: displaying a circuit diagram;
FIG. 12: the safety mechanism status displays a circuit diagram.
Detailed Description
The following detailed description of embodiments of the invention is intended to be illustrative, and not to be construed as limiting the invention.
The safety mechanism in this embodiment has two channels, so when the pin falling depth tester tests the pin falling depth of the safety mechanism, the two channels of the safety mechanism need to be controlled to be switched from the insurance state to the working state, and the two channels of the safety mechanism also need to be controlled to be switched from the working state to the insurance state.
1. Theory and principle of testing
The structure of the electromagnetic pin is shown in fig. 2, the outside is a coil, in electricity, the coil is an inductor, when the safety mechanism is converted into a working state, a spring inside the electromagnetic pin pushes a plug pin (pure iron) to be inserted into a locking hole, the inductance and the reactance of the external coil are changed due to the movement of the plug pin, and the moving distance (namely the pin falling depth) of the electromagnetic pin is known through the measured inductance and the reactance.
Measuring principleAs shown in FIG. 3, V0sin ω t is the alternating current used by the measuring circuit as sine, R0Is a current limiting resistor, Zx is the measured resistor (or inductor), and Rs is the standard resistor.
The operational amplifier is a high gain amplifier, and ideally, the open loop gain Ko → ∞, the input impedance Zi → ∞, and the output resistance are 0, so that the point Q can be regarded as an imaginary zero point, and the input current to be amplified at the point Q is 0, and the sum of the currents of the branches at the point Q is 0 according to kirchhoff's current law, so that the current flowing through the resistor Zx to be measured is equal to the current flowing through the standard resistor Rs. Namely:
namely, it is
In the above formula, Zx, V1 and V2 are complex numbers, and assume that the voltage V on Zx1Voltage on Rs ═ a + jb
V2Then, according to equation (2), c + jd, one can obtain:
suppose ZxR + jX, then:
real part of Zx:
imaginary part of Zx:
in fact, for the electromagnetic pin to be tested, it is formed by winding a multi-turn coil, and includes both a dc resistor R and an inductor X, which is actually a series connection of a dc resistor and an inductor.
Corresponding to the detected electromagnetic pin Zx, the equation (4) expresses the real part R of Zx, which is the direct current resistance of the electromagnetic pin; equation (5) represents the imaginary component X of Zx, which is the inductive reactance of the electromagnetic pin.
When the bolt in the electromagnetic pin moves, the moving distance is short, so that the moving distance of the inner iron core of the electromagnetic pin and the variation of the inductive reactance of the electromagnetic pin are considered to be in a linear relation, the inductive reactance obtained by the formula (5) is used, and the pin falling depth of the electromagnetic pin can be converted by using the linear relation.
2. Description of the block diagram:
based on the above principle, as shown in fig. 1, the pin-dropping depth tester in this embodiment includes a CPU, a filter circuit, a blocking amplifier circuit, a test circuit, a signal processing circuit, a relay array, a relay control circuit, a key, a display circuit, and a safety mechanism status indication circuit.
The CPU generates a sine PWM signal and inputs the sine PWM signal into the filter circuit, and the filter circuit outputs a sine wave signal Sin after filtering the PWM signal; the sine wave signal Sin outputs a Sin _ out signal after passing through the blocking amplifying circuit, and the Sin _ out signal is used by the test circuit.
The relay control circuit receives a control signal generated by the CPU and controls the relay array to act according to the control signal; the relay array can control the safety mechanism to carry out state conversion and control the electromagnetic pin of the safety mechanism to be connected into the test circuit.
The testing circuit receives the Sin _ out signal, after the Sin _ out signal is subjected to current limiting in the testing circuit, the Sin _ out signal can flow through the tested electromagnetic pin and the standard resistor through the closed relay array, voltage is generated at two ends of the tested electromagnetic pin and the standard resistor, the voltage generated on the tested electromagnetic pin and the voltage generated on the standard resistor are amplified and then are respectively input into the analog switch circuit, and an output signal EK3_ A corresponding to the tested electromagnetic pin and an output signal EK3_ B corresponding to the standard resistor are obtained.
The signal processing circuit processes output signals corresponding to the measured electromagnetic pin and the standard resistor and then respectively inputs the processed output signals into the CPU, and the CPU processes voltage signals V generated on the measured electromagnetic pin and the standard resistor according to the signal processing circuit1And V2Calculating the inductive reactance X of the electromagnetic pin to be detected, wherein V1＝a+jb，V2C + jd, then
Rs is the standard resistance value; and the pin falling depth of the electromagnetic pin is obtained through conversion according to the variable quantity of the inductive reactance X.
And the CPU is connected with the keys and the display circuit, performs man-machine interaction through the keys and the display circuit and displays test information.
The CPU is connected with the safety mechanism state indicating circuit, the safety mechanism state indicating circuit can receive the safety mechanism state switch signal, display the state information according to the safety mechanism state switch signal and send the state information to the CPU, and the CPU controls the state switching direction of the safety mechanism according to the state information.
3. Description of specific circuits:
1) sine wave alternating current generating circuit
The sine wave required by the test is generated by a CPU (Central processing Unit) to be a sine PWM (pulse width modulation) signal, and the circuit shown in FIG. 4 generates the sine PWM signal by using a P1.3 pin of MCS-51;
filtering the PWM signal by using a filter circuit, as shown in fig. 5, after the PWM signal is filtered by 2-stage RC, in order to match impedance, following processing is performed by using an operational amplifier; after 3-stage RC filtering, outputting a sine wave signal Sin;
as shown in fig. 6, the sine wave signal Sin is isolated and then converted into ac, and then amplified to output Sin _ out signal for the test circuit.
2) Test circuit
The test circuit is shown in FIG. 7, the electromagnetic pin of the safety mechanism to be tested is connected into the test circuit through the relay, and when the relays K1 and K3 are closed, the electromagnetic pin of the first channel of the safety mechanism is connected into the test circuit; similarly, when relays K2 and K4 are closed, the safety mechanism second channel electromagnetic pin is switched into the test circuit. After the sine wave signal Sin _ out is subjected to current limiting through R9 and R10, the sine wave signal Sin _ out flows through the tested electromagnetic pin and the standard resistor R11 through a closed relay, so that voltage drops are generated at two ends of the tested electromagnetic pin and two ends of the standard resistor R11, and the voltage drops generated on the tested electromagnetic pin are amplified by the instrument amplifier U17 and enter the analog switch circuit to obtain a signal EK3_ A; the voltage drop generated at the two ends of the standard resistor R11 is amplified by an instrumentation amplifier U18 and enters an analog switch circuit to obtain a signal EK3_ B.
3) Signal processing circuit
As shown in fig. 8, the signal EK3_ a or EK3_ B is controlled by a set software logic, and outputs an EK3_ C signal after passing through an analog switch, the EK3_ C enters the analog switch EK5_ B after being processed by two-stage operational amplifier, the signal EK5_ C is controlled by the software logic, and the EK5_ C is amplified after being filtered by 2-stage RC, and finally enters the AD converter input terminal P10 of the CPU.
4) Relay control circuit
As shown in FIG. 9, the RELAY control circuit uses CPU port lines P23 and P24 to control I2C chip PCF8574 to output 8 paths of signals RELAY _ CON 1-RELAY _ CON8, which are output as R _ CON 1-R _ CON8 after being inverted by 74HC540, and finally output control RELAYs RELAY 1-RELAY 8 through ULN 2803. Among them, RELAY 1-RELAY 4 are used for the test of controlling the pin falling depth, see K1-K4 of FIG. 7; RELAY 5-RELAY 8 are used for controlling the safety mechanism to perform state conversion.
5) Key and display circuit
The KEY circuit is as shown in fig. 10, the 8 KEYs KBD _1 to KBD _8 and the ground wire form an independent KEY, when any KEY KEYx of the KEYs KEY1 to KEY8 is pressed, the signal KBD _ x becomes low level, and is finally output to the external interrupt pin P32_ INT0 of the CPU through the and gate CD4082, at this time, the CPU internally generates an interrupt signal, the CPU interface lines P23 and P24 are controlled by software to read the KEY signal KBD _ x, and the CPU completes different tasks according to different KEYs.
The display circuit uses the P0 port lines P01-P07 of the CPU to control the LCD to output test information or to carry out man-machine interaction by matching the display information with the key circuit as shown in FIG. 11.
6) Safety mechanism state display circuit
The safety mechanism state display circuit is shown in fig. 12, and the safety mechanism has four state switches, which are a first channel safety switch (safety switch 1), a first channel working switch (working switch 1), a second channel safety switch (safety switch 2), and a second channel working switch (working switch 2). When the first channel of the safety mechanism is in a safety state, the safety switch 1 is in a closed state, and the working switch 1 is in an open state; at this time, the SAFE1 outputs a low level, the led D15 for displaying the state of the safety mechanism is lit, the photocoupler output signal S _ SAFE1 outputs a low level, the WORK1 outputs a high level, the led D16 for displaying the state of the safety mechanism is not lit, and the photocoupler output signal S _ WORK1 outputs a high level; the CPU controls the switching direction of the safety mechanism by reading output signals S _ SAFE1 and S _ WORK1 of the photo-couplers. As does the corresponding second channel.
The pin falling depth tester is already applied to the research, production and product inspection and acceptance of safety mechanisms in the unit of the applicant. The application result shows that the tester can correctly control the safety mechanism to carry out state conversion and indicate the state of the safety mechanism, and can also accurately measure the depth of the electromagnetic pin of the safety mechanism falling into the locking hole, the measured data is stable, the precision is high, and the requirements of the safety mechanism on production and use are completely met.
Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made in the above embodiments by those of ordinary skill in the art without departing from the principle and spirit of the present invention.
Claims (3)
1. The utility model provides a round pin degree of depth tester that falls which characterized in that: the device comprises a CPU, a filter circuit, a blocking amplification circuit, a test circuit, a signal processing circuit, a relay array, a relay control circuit, a key, a display circuit and a safety mechanism state indicating circuit;
the CPU generates a sine PWM signal and inputs the sine PWM signal into the filter circuit, and the filter circuit outputs a sine wave signal Sin after filtering the PWM signal; the sine wave signal Sin passes through the blocking amplification circuit and then outputs a Sin _ out signal for the test circuit to use;
the relay control circuit receives a control signal generated by the CPU and controls the relay array to act according to the control signal; the relay array can control the safety mechanism to perform state conversion and control an electromagnetic pin of the safety mechanism to be connected into a test circuit;
the testing circuit receives the Sin _ out signal, the Sin _ out signal can flow through the tested electromagnetic pin and the standard resistor through the closed relay array after being subjected to current limiting in the testing circuit, voltages are generated at two ends of the tested electromagnetic pin and the standard resistor, and the voltages generated on the tested electromagnetic pin and the standard resistor are amplified and then are respectively input into the analog switch circuit, so that an output signal EK3_ A corresponding to the tested electromagnetic pin and an output signal EK3_ B corresponding to the standard resistor are obtained;
the signal processing circuit processes output signals corresponding to the measured electromagnetic pin and the standard resistor and then respectively inputs the processed output signals into the CPU, and the CPU processes voltage signals V generated on the measured electromagnetic pin and the standard resistor according to the signal processing circuit1And V2Calculating the inductive reactance X of the electromagnetic pin to be detected, wherein V1＝a+jb，V2C + jd, then
Rs is the standard resistance value; and the pin falling depth of the electromagnetic pin is obtained through conversion according to the variable quantity of the inductive reactance X;
the CPU is connected with the keys and the display circuit, carries out man-machine interaction through the keys and the display circuit and displays test information;
the CPU is connected with the safety mechanism state indicating circuit, the safety mechanism state indicating circuit can receive the safety mechanism state switch signal, display the state information according to the safety mechanism state switch signal and send the state information to the CPU, and the CPU controls the state switching direction of the safety mechanism according to the state information.
2. The pin drop depth tester of claim 1, wherein: in the filter circuit, PWM signals are subjected to 2-stage RC filtering, followed by using an operational amplifier, and subjected to 3-stage RC filtering to output sine wave signals Sin.
3. The pin drop depth tester of claim 1, wherein: in the signal processing circuit, signals EK3_ A and EK3_ B are input into an analog switch and then controlled to output an EK3_ C signal, EK3_ C enters the analog switch after being processed by two-stage operational amplifier, controlled output EK5_ C and EK5_ C are amplified after being filtered by 2-stage RC and finally enter the input end of an AD converter of a CPU.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201811192425.1A CN109186448B (en) | 2018-10-13 | 2018-10-13 | Pin falling depth tester |
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| CN201811192425.1A CN109186448B (en) | 2018-10-13 | 2018-10-13 | Pin falling depth tester |
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| CN109186448B true CN109186448B (en) | 2020-06-16 |
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