CN109186448A - One kind falling pin depth tester - Google Patents
One kind falling pin depth tester Download PDFInfo
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- CN109186448A CN109186448A CN201811192425.1A CN201811192425A CN109186448A CN 109186448 A CN109186448 A CN 109186448A CN 201811192425 A CN201811192425 A CN 201811192425A CN 109186448 A CN109186448 A CN 109186448A
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- circuit
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- cpu
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/26—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring depth
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The present invention proposes that one kind falls pin depth tester, including CPU, filter circuit, blocking amplifying circuit, test circuit, signal processing circuit, relay battle array, control relay circuit, key and display circuit and release mechanism condition indication circuit CPU generate sine pulse width modulation (PWM) signal input test circuit after filtering blocking enhanced processing, circuit is tested in tested electromagnetism pin and the controlled access of measuring resistance, and acquire the voltage signal of tested electromagnetism pin and measuring resistance, CPU is inputted after signal processing circuit, CPU resolves the induction reactance of tested electromagnetism pin, and pin depth is fallen according to what the variable quantity of induction reactance converted to obtain electromagnetism pin.The present invention accurately measures the depth that release mechanism electromagnetism pin falls into lock-bit hole, and measurement data is stable, has degree of precision, the requirement for fully meeting release mechanism production and using.
Description
Technical field
The present invention relates to release mechanism the field of test technology, specially one kind falls pin depth tester.
Background technique
Release mechanism is the highly reliable valving of one kind installed on missile propulsive plant, be typically mounted on electric squib and
On channel between gunpowder, the biography fire for being assuredly shut off or connecting tide stress field, propagation of explosion channel can according to need.
Release mechanism has two states, i.e. safety position and working condition.Release mechanism state in which can only be this
One of two states, i.e., or in safety position or in running order.
When release mechanism is in safety position, the electromagnetism pin inside release mechanism is in state of pulling pin.At this time to safety
In-house electrical power certain time, release mechanism are transformed into working condition from safety position, the electricity inside release mechanism
Magnetic pin is inserted into lock-bit hole, and release mechanism is scheduled on working condition by electromagnetism lock.But applicant sends out during actual test
Existing, if the depth (falling pin depth) in electromagnetism pin insertion lock-bit hole is shallower, release mechanism is vibrated or when intense impact, electromagnetism
Just easily abjection lock-bit hole, release mechanism return to safety position under the action of internal helical line spring to pin, and therefore, electromagnetism pin falls pin
Depth directly affects the reliability of release mechanism working condition.
By theory analysis, it is found by the applicant that being only inserted into lock-bit in electromagnetism pin when release mechanism is in running order
In the case that the depth in hole is more than 2mm, just think that release mechanism is reliably locked in working condition by electromagnetism pin;So only bright
After the depth for really obtaining electromagnetism pin insertion lock-bit hole, it just can determine that whether release mechanism by electromagnetism pin is reliably locked in work shape
State.However electromagnetism pin is mounted on the inside of the release mechanism of metal shell, it is impossible to directly measure electromagnetism using measurers such as slide calliper rule
The depth in pin insertion lock-bit hole, can only often lean on the experience of assembler to determine the installation site of electromagnetism pin.
Summary of the invention
In the assembling process of missile propulsive plant release mechanism, when installing electromagnetism pin, assembler is currently by warp
The installation site for testing determining electromagnetism pin, after causing electromagnetism pin to be packed into release mechanism, when release mechanism is transformed into work from safety position
Make state, when electromagnetism pin is inserted into lock-bit hole, it is possible to the depth that electromagnetism pin is inserted into lock-bit hole is shallower, cause release mechanism by
When vibration or intense impact, electromagnetism pin deviates from lock-bit hole, and release mechanism returns to safety position under the action of internal helical line spring,
Thus greatly reduce the reliability of release mechanism working condition.
For this reason, it may be necessary to develop it is a kind of fall that pin depth tester carrys out precise measurement electromagnetism pin fall pin depth, due to electromagnetism pin
It is mounted on the inside of the release mechanism of metal shell, can not directly be measured by the mechanical measurements such as slide calliper rule mode, so this
The creative method using electricity is invented, by providing alternating current excitation power supply to electromagnetism pin, is measured inside release mechanism
The induction reactance of electromagnetism cordon circle changes, and conversion obtains the depth in lock-bit hole inside electromagnetism pin insertion release mechanism.
Based on the above principles, the technical solution of the present invention is as follows:
Described one kind falls pin depth tester, it is characterised in that: including CPU, filter circuit, blocking amplifying circuit, test
Circuit, signal processing circuit, relay battle array, control relay circuit, key and display circuit and release mechanism state instruction
Circuit;
The CPU generates sine pulse width modulation (PWM) signal input filter circuit, and filter circuit is filtered pwm signal rear defeated
Sine wave signal Sin out;Sine wave signal Sin exports Sin_out signal after blocking amplifying circuit, makes for test circuit
With;
The control relay circuit receives the control signal that CPU is generated, and dynamic according to control signal control relay battle array
Make;The relay battle array can control release mechanism and carry out state conversion, and the electromagnetism pin joint of control release mechanism enters test
Circuit;
The test circuit receives Sin_out signal, Sin_out signal in test circuit after current limliting, Neng Goutong
The relay battle array for crossing closure flows through tested electromagnetism pin and measuring resistance, all generates electricity in tested electromagnetism pin and standard resistor at two terminals
Pressure is tested the voltage generated in electromagnetism pin and measuring resistance and inputs analog switching circuit respectively after amplification, obtains tested electricity
The corresponding output signal EK3_A of the magnetic pin and corresponding output signal EK3_B of measuring resistance;
The signal processing circuit is defeated respectively after handling tested electromagnetism pin and the corresponding output signal of measuring resistance
Enter CPU, the CPU is according to the voltage signal by generating in signal processing circuit treated tested electromagnetism pin and measuring resistance
V1And V2, the induction reactance X of tested electromagnetism pin is calculated, wherein V1=a+jb, V2=c+jd, then
Rs is measuring resistance resistance value;And pin depth is fallen according to what the variable quantity of induction reactance X converted to obtain electromagnetism pin;
The CPU is connected with key and display circuit, carries out human-computer interaction by key and display circuit and shows test
Information;
The CPU is connected with release mechanism condition indication circuit, and the release mechanism condition indication circuit can receive peace
Full mechanism status switching signal, and carry out status information according to release mechanism status switch signal and show, and by status information
It is sent to CPU, CPU controls the state conversion direction of release mechanism according to status information.
Further preferred embodiment, described one kind fall pin depth tester, it is characterised in that: in filter circuit, pwm signal
It after 2 grades of RC are filtered, carries out following processing using amplifier, after filtering using 3 grades of RC, exports sine wave signal Sin.
Further preferred embodiment, described one kind fall pin depth tester, it is characterised in that: in signal processing circuit, letter
Controlled output EK3_C signal after number EK3_A and EK3_B input analog switch, K3_C enters after the processing of two stage amplifer to simulate
Switch, controlled output EK5_C, EK5_C amplify after 2 grades of RC are filtered, and finally enter the AD converter input terminal of CPU.
Beneficial effect
Development, the life proposed by the present invention for falling pin depth tester and being applied to release mechanism in applicant's internal institution
During production and the examination and test of products are checked and accepted.Using the results show that the tester, which can correctly control release mechanism, carries out state conversion, instruction
The state of release mechanism, while the depth that release mechanism electromagnetism pin falls into lock-bit hole also can be accurately measured, measurement data is stable, has
There is degree of precision, the requirement for fully meeting release mechanism production and using.
Additional aspect and advantage of the invention will be set forth in part in the description, and will partially become from the following description
Obviously, or practice through the invention is recognized.
Detailed description of the invention
Above-mentioned and/or additional aspect of the invention and advantage will become from the description of the embodiment in conjunction with the following figures
Obviously and it is readily appreciated that, in which:
Fig. 1: the structural block diagram of pin depth tester is fallen;
Fig. 2: the structural schematic diagram of electromagnetism pin;
Fig. 3: measuring circuit schematic diagram;
Fig. 4: PWM occurs circuit diagram;
Fig. 5: the filtering processing figure of pwm signal;
Fig. 6: sine wave AC electric signal;
Fig. 7: test circuit diagram;
Fig. 8: signal processing circuit figure;
Fig. 9: control relay circuit figure;
Figure 10: key circuit figure;
Figure 11: display circuit figure;
Figure 12: release mechanism status display circuit figure.
Specific embodiment
The embodiment of the present invention is described below in detail, the embodiment is exemplary, it is intended to it is used to explain the present invention, and
It is not considered as limiting the invention.
There are two channels for release mechanism tool in the present embodiment, fall pin in test release mechanism so falling pin depth tester
When depth, two channels for needing to control release mechanism are transformed into working condition from safety position, it is also desirable to control release mechanism
Two channels be transformed into safety position from working condition, in order to facilitate the operation of the state of person recognition securement mechanism, it is also necessary to
Show the state in two channels of release mechanism.
1, measurement theory and principle
The structure of electromagnetism pin is as shown in Fig. 2, outside is coil, and in electricity, coil is an inductance, when release mechanism turns
After changing to working condition, electromagnetism pin contained spring pushes bolt (pure iron) to be inserted into lock-bit hole, due to the movement of bolt, causes outer
The variation of the inductance induction reactance of portion's coil, by the induction reactance measured, we know that the moving distance of electromagnetism pin (falls pin depth
Degree).
Measuring principle is as shown in figure 3, V0Sin ω t is that measuring circuit uses sinusoidal alternating current, R0It is current-limiting resistance, Zx is
Measured resistance (or inductance), Rs are measuring resistances.
Operational amplifier is a high-gain amplifier, ideally open-loop gain Ko → ∞, input impedance Zi → ∞,
Output resistance is 0, therefore Q point is regarded as virtual zero point, and amplifier is 0 in the input current of Q point, fixed according to kirchhoff electric current
Rule, the electric current of each branch of Q point and be 0, so, the electric current for flowing through measured resistance Zx is equal with the electric current for flowing through measuring resistance Rs.
That is:
I.e.
In above formula, Zx, V1 and V2 are plural numbers, it is assumed that the voltage V on Zx1Voltage V on=a+jb, Rs2=c+j, d that
, it is available according to formula (2):
Assuming that Zx=R+jX, then:
The real part of Zx:
The imaginary part of Zx:
In fact, it is formed by multiturn coil coiling for being tested electromagnetism pin, a D.C. resistance R has both been contained,
Include an inductance X, the series connection of actually one D.C. resistance and an inductance.
Corresponding to tested electromagnetism pin Zx, that formula (4) indicates is the real part R of Zx, it is the D.C. resistance of electromagnetism pin;Formula
(5) that indicate is the imaginary part X of Zx, it is the induction reactance of electromagnetism pin.
When bolt is mobile inside electromagnetism pin, since moving distance is shorter, it is believed that the inner-core of electromagnetism pin is mobile
The variable quantity of distance and the induction reactance of electromagnetism pin is linear, and the induction reactance obtained using formula (5) utilizes linear relationship
Converse electromagnetism pin falls pin depth.
2, block diagram illustrates:
Based on the above principles, as shown in Figure 1, one of the present embodiment falls pin depth tester, including CPU, filtered electrical
Road, blocking amplifying circuit, test circuit, signal processing circuit, relay battle array, control relay circuit, key and display circuit
And release mechanism condition indication circuit.
The CPU generates sine pulse width modulation (PWM) signal input filter circuit, and filter circuit is filtered pwm signal rear defeated
Sine wave signal Sin out;Sine wave signal Sin exports Sin_out signal after blocking amplifying circuit, makes for test circuit
With.
The control relay circuit receives the control signal that CPU is generated, and dynamic according to control signal control relay battle array
Make;The relay battle array can control release mechanism and carry out state conversion, and the electromagnetism pin joint of control release mechanism enters test
Circuit.
The test circuit receives Sin_out signal, Sin_out signal in test circuit after current limliting, Neng Goutong
The relay battle array for crossing closure flows through tested electromagnetism pin and measuring resistance, all generates electricity in tested electromagnetism pin and standard resistor at two terminals
Pressure is tested the voltage generated in electromagnetism pin and measuring resistance and inputs analog switching circuit respectively after amplification, obtains tested electricity
The corresponding output signal EK3_A of the magnetic pin and corresponding output signal EK3_B of measuring resistance.
The signal processing circuit is defeated respectively after handling tested electromagnetism pin and the corresponding output signal of measuring resistance
Enter CPU, the CPU is according to the voltage signal by generating in signal processing circuit treated tested electromagnetism pin and measuring resistance
V1And V2, the induction reactance X of tested electromagnetism pin is calculated, wherein V1=a+jb, V2=c+jd, then
Rs is measuring resistance resistance value;And pin depth is fallen according to what the variable quantity of induction reactance X converted to obtain electromagnetism pin.
The CPU is connected with key and display circuit, carries out human-computer interaction by key and display circuit and shows test
Information.
The CPU is connected with release mechanism condition indication circuit, and the release mechanism condition indication circuit can receive peace
Full mechanism status switching signal, and carry out status information according to release mechanism status switch signal and show, and by status information
It is sent to CPU, CPU controls the state conversion direction of release mechanism according to status information.
3, physical circuit illustrates:
1) the generation circuit of sine wave alternating current
Sine wave required for testing is to generate sine pulse width modulation (PWM) signal by CPU, and circuit as shown in Figure 4 uses MCS-51's
P1.3 pin generates sine pulse width modulation (PWM) signal;
Pwm signal is filtered using filter circuit, as shown in figure 5, pwm signal is after 2 grades of RC are filtered
Make impedance matching, carries out following processing using amplifier;After filtering using 3 grades of RC, sine wave signal Sin is exported;
As shown in fig. 6, sine wave signal Sin becomes alternating current after blocking, believe using Sin_out is exported after amplification
Number, it is used for test circuit.
2) circuit is tested
Circuit is tested as shown in fig. 7, entering to test circuit by the electromagnetism pin joint of tested release mechanism by relay, works as relay
When device K1 and K3 are closed, release mechanism first passage electromagnetism pin joint enters to test circuit;Similarly, when relay K2 and K4 are closed,
Release mechanism second channel electromagnetism pin joint enters to test circuit.When sine wave signal Sin_out is after R9 and R10 current limliting, by closing
The relay of conjunction flows through tested electromagnetism pin and measuring resistance R11, and electromagnetism pin tested in this way and the both ends measuring resistance R11 all generate electricity
Pressure drop is tested the voltage drop generated on electromagnetism pin after instrument amplifier U17 amplification, obtains signal into analog switching circuit
EK3_A;The voltage drop that the both ends measuring resistance R11 generate obtains letter into analog switching circuit after instrument amplifier U18 amplification
Number EK3_B.
3) signal processing circuit
Signal processing circuit is as shown in figure 8, signal EK3_A or EK3_B is controlled by the software logic set, through analog switch
EK3_C signal is exported afterwards, and EK3_C enters analog switch EK5_B after the processing of two stage amplifer, controls output letter by software logic
It number is EK5_C, EK5_C amplifies after 2 grades of RC are filtered, and finally enters the AD converter input terminal P10 of CPU.
4) control relay circuit
Control relay circuit is as shown in figure 9, export 8 tunnels using CPU mouth line P23 and P24 control I2C chip PCF8574
Signal RELAY_CON1~RELAY_CON8, output is R_CON1~R_CON8 after 74HC540 reverse phase, finally by
ULN2803 output control relay RELAY1~RELAY8.Wherein RELAY1~RELAY4 is used to control the test for falling pin depth,
See K1~K4 of Fig. 7;RELAY5~RELAY8 carries out state conversion for controlling release mechanism.
5) key and display circuit
Key circuit is as shown in Figure 10, and 8 key KBD_1~KBD_8 and ground wire form free-standing key, as key KEY1
When having any one key KEYx to press in~KEY8, signal KBD_x becomes low level, finally by being output to door CD4082
The external interrupt pin P32_INT0 of CPU generates interrupt signal at this time, passes through software control CPU mouth line P23 and P24 inside CPU
The signal KBD_x, CPU for reading key complete different tasks according to different keys.
Display circuit is as shown in figure 11, uses P0 mouth line P01~P07 control liquid crystal display LCD output test letter of CPU
Breath, or cooperate key circuit to carry out human-computer interaction by display information.
6) release mechanism status display circuit
Release mechanism status display circuit is as shown in figure 12, and it is first passage respectively that there are four status switches for release mechanism
Discharge cock (discharge cock 1), first passage operating switch (operating switch 1), second channel discharge cock (discharge cock 2),
Second channel operating switch (operating switch 2).When release mechanism first passage is in safety position, discharge cock 1 is in and closes
Conjunction state, operating switch 1 are in an off state;SAFE1 exports low level at this time, for showing luminous the two of release mechanism state
Pole pipe D15 is lit, while photoelectrical coupler output signal S_SAFE1 exports low level, and WORK1 exports high level, for showing
Show that the light emitting diode D16 of release mechanism state does not work, photoelectrical coupler output signal S_WORK1 exports high level;CPU passes through
The output signal S_SAFE1 and S_WORK1 of photoelectrical coupler is read to control the conversion direction of release mechanism.Corresponding second channel
It is also such.
The above-mentioned development, production and product for falling pin depth tester and being applied to release mechanism in applicant's internal institution
In inspection and acceptance.Using the results show that the tester, which can correctly control release mechanism, carries out state conversion, instruction release mechanism
State, while also can accurately measure the depth that release mechanism electromagnetism pin falls into lock-bit hole, measurement data is stable, it is more high-precision to have
Degree, the requirement for fully meeting release mechanism production and using.
Although the embodiments of the present invention has been shown and described above, it is to be understood that above-described embodiment is example
Property, it is not considered as limiting the invention, those skilled in the art are not departing from the principle of the present invention and objective
In the case where can make changes, modifications, alterations, and variations to the above described embodiments within the scope of the invention.
Claims (3)
1. one kind falls pin depth tester, it is characterised in that: including CPU, filter circuit, blocking amplifying circuit, test circuit, letter
Number processing circuit, relay battle array, control relay circuit, key and display circuit and release mechanism condition indication circuit;
The CPU generates sine pulse width modulation (PWM) signal input filter circuit, and filter circuit exports just after being filtered to pwm signal
String wave signal Sin;Sine wave signal Sin exports Sin_out signal after blocking amplifying circuit, uses for test circuit;
The control relay circuit receives the control signal that CPU is generated, and according to control signal control relay battle array movement;Institute
Release mechanism progress state conversion can be controlled by stating relay battle array, and the electromagnetism pin joint of control release mechanism enters to test circuit;
The test circuit receives Sin_out signal, Sin_out signal in test circuit after current limliting, can be by closing
The relay battle array of conjunction flows through tested electromagnetism pin and measuring resistance, all generates voltage, quilt in tested electromagnetism pin and standard resistor at two terminals
It surveys the voltage generated in electromagnetism pin and measuring resistance and inputs analog switching circuit respectively after amplification, obtain tested electromagnetism pin pair
The corresponding output signal EK3_B of the output signal EK3_A and measuring resistance answered;
The signal processing circuit inputs respectively after handling tested electromagnetism pin and the corresponding output signal of measuring resistance
CPU, the CPU are according to the voltage signal V by generating in signal processing circuit treated tested electromagnetism pin and measuring resistance1
And V2, the induction reactance X of tested electromagnetism pin is calculated, wherein V1=a+jb, V2=c+jd, then
Rs is measuring resistance resistance value;And pin depth is fallen according to what the variable quantity of induction reactance X converted to obtain electromagnetism pin;
The CPU is connected with key and display circuit, carries out human-computer interaction by key and display circuit and shows test information;
The CPU is connected with release mechanism condition indication circuit, and the release mechanism condition indication circuit can receive safe machine
Structure status switch signal, and carry out status information according to release mechanism status switch signal and show, and status information is sent
The state conversion direction of release mechanism is controlled according to status information to CPU, CPU.
2. one kind falls pin depth tester according to claim 1, it is characterised in that: in filter circuit, pwm signal passes through 2
It after grade RC filtering, carries out following processing using amplifier, after filtering using 3 grades of RC, exports sine wave signal Sin.
3. one kind falls pin depth tester according to claim 1, it is characterised in that: in signal processing circuit, signal EK3_A
Enter analog switch after the processing of two stage amplifer with controlled output EK3_C signal, K3_C after EK3_B input analog switch, by
Control output EK5_C, EK5_C amplifies after 2 grades of RC are filtered, and finally enters the AD converter input terminal of CPU.
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CN201811192425.1A CN109186448B (en) | 2018-10-13 | 2018-10-13 | Pin falling depth tester |
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CN201811192425.1A CN109186448B (en) | 2018-10-13 | 2018-10-13 | Pin falling depth tester |
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CN109186448B CN109186448B (en) | 2020-06-16 |
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