CN109149359A - A kind of tapered semiconductor laser - Google Patents

A kind of tapered semiconductor laser Download PDF

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Publication number
CN109149359A
CN109149359A CN201811276335.0A CN201811276335A CN109149359A CN 109149359 A CN109149359 A CN 109149359A CN 201811276335 A CN201811276335 A CN 201811276335A CN 109149359 A CN109149359 A CN 109149359A
Authority
CN
China
Prior art keywords
tapered
cavity surface
rib region
semiconductor laser
tapered zone
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201811276335.0A
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Chinese (zh)
Inventor
周坤
杜维川
康俊杰
李弋
谭昊
王昭
高松信
唐淳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institute of Applied Electronics of CAEP
Original Assignee
Institute of Applied Electronics of CAEP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institute of Applied Electronics of CAEP filed Critical Institute of Applied Electronics of CAEP
Priority to CN201811276335.0A priority Critical patent/CN109149359A/en
Publication of CN109149359A publication Critical patent/CN109149359A/en
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/10Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/1003Waveguide having a modified shape along the axis, e.g. branched, curved, tapered, voids
    • H01S5/1014Tapered waveguide, e.g. spotsize converter
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/10Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/12Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region the resonator having a periodic structure, e.g. in distributed feedback [DFB] lasers
    • H01S5/125Distributed Bragg reflector [DBR] lasers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/20Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure

Abstract

The present invention provides a kind of tapered semiconductor laser, the program includes rib region and tapered zone;Rib region generates the seed laser of nearly diffraction limit, and seed laser enters tapered zone amplification output;The front cavity surface of tapered zone, i.e., for the Cavity surface of the one end connecting with rib region without feedback laser, seed laser is unidirectionally amplified in tapered zone.The program can realize the unidirectional amplification of laser, front cavity surface makes beam quality be not easy to deteriorate in amplification process without feedback arrangement, can greatly increase the length of tapered zone, and higher power can both be exported by reaching, the beam quality of nearly diffraction limit can be kept again, it can be achieved that the laser of super brightness exports.

Description

A kind of tapered semiconductor laser
Technical field
The present invention relates to semiconductor laser knot design field, especially a kind of tapered semiconductor laser.
Background technique
In recent years, high-power semiconductor laser chip (LD) is quickly grown, as pump light source be widely used in it is civilian and Military field, especially as pump source of optical fiber laser, growth momentum is swift and violent in recent years.As optical fiber laser is to semiconductor Laser pumping source exports the continuous promotion of brightness demand, and the quantity of traditional tail optical fiber pumping source coupling semiconductor laser chip connects Nearly physics limit, the brightness of chip can only be promoted by continuing raising output brightness.On the other hand, aperture is total to by high-quality and efficient rate to close Beam, realization high-brightness semiconductor laser directly exports and the miniaturization of Recent study a new generation, lightweight high power laser light light One of the important channel in source.
Nearly diffraction limit laser is optimal pump source of optical fiber laser, but due to many reasons semiconductor laser chip It is poor in slow-axis direction beam quality.The high power stripe laser one single chip of current 100 μm wide of 9xx nm wave band is continuous Output power has reached 15 W-30 W, and electrical-optical transfer efficiency has reached 65% or more, however slow axis beam quality can only achieve 10-20 times of diffraction limit (M2=10-20), corresponding slow axis brightness can only achieve the level of 10 MW/cm2sr.In addition to light beam The promotion of quality, the promotion of brightness further include the output power for improving single-chip.By the shadow of Cavity surface damage, nonlinear effect etc. It rings, current 100 μm of wide chip maximum power output is limited in the level of 30 W or so, continues raising output power and compels Innovative research will be carried out in chip design by being essential.If single-chip slow axis beam quality reaches nearly diffraction limit, while defeated Power is increased to hectowatt grade out, then the brightness of semiconductor laser single-chip can promote two magnitudes.
Summary of the invention
The purpose of the present invention aiming at deficiency of the prior art, and provides a kind of tapered semiconductor laser Technical solution, the program can realize the unidirectional amplification of laser, and front cavity surface makes beam quality in amplification process without feedback arrangement In be not easy to deteriorate, the length of tapered zone can be greatly increased, higher power can not only be exported by reaching, but also can keep nearly diffraction pole The beam quality of limit is, it can be achieved that the laser of super brightness exports.
This programme is achieved by the following technical measures:
A kind of tapered semiconductor laser includes rib region and tapered zone;Rib region generates the seed laser of nearly diffraction limit, Seed laser enters tapered zone amplification output;The Cavity surface of the front cavity surface of tapered zone, i.e., the one end connecting with rib region swashs without feedback Seed laser is unidirectionally amplified in light, tapered zone.
As the preferred of this programme: the front cavity surface of tapered zone is provided with inclination Cavity surface structure;Anti-reflective is coated in inclination Cavity surface Penetrate film.
As the preferred of this programme: the side that the connecting pin of tapered zone and rib region is located at rib region is provided on piece DBR Optical grating construction.
As the preferred of this programme: high reflection deielectric-coating is deposited in laser rear facet, and antireflection deielectric-coating is deposited in front cavity surface.
As the preferred of this programme: rib region is ridged waveguide structure.
As the preferred of this programme: tapered zone is tapered gain waveguiding structure.
As the preferred of this programme: the length ratio of tapered zone and rib region is greater than 2.
The beneficial effect of this programme can according to the description of the above program, due to using rib region to send out in this scenario The seed laser of nearly diffraction limit, the front cavity surface of tapered zone are penetrated, i.e., the Cavity surface of the one end connecting with rib region makes without feedback laser Seed laser is unidirectionally amplified in tapered zone, can guarantee that beam quality is not easy to deteriorate in amplification process, can greatly increase tapered zone Length, higher power can not only be exported by reaching, but also the beam quality of nearly diffraction limit can be kept, it can be achieved that super brightness Laser output.
It can be seen that compared with prior art, the present invention having substantive features and progress, the beneficial effect implemented It is obvious.
Detailed description of the invention
Fig. 1 is the structural diagram of the present invention.
In figure, 101 be laser rear facet, and 102 be ridge waveguide, and 103 be DBR, and 104 be tapered transmission line, and 105 be laser Device front cavity surface, 106 be tapered zone front cavity surface.
Specific embodiment
All features disclosed in this specification or disclosed all methods or in the process the step of, in addition to mutually exclusive Feature and/or step other than, can combine in any way.
Any feature disclosed in this specification (including any accessory claim, abstract and attached drawing), except non-specifically chatting It states, can be replaced by other alternative features that are equivalent or have similar purpose.That is, unless specifically stated, each feature is only It is an example in a series of equivalent or similar characteristics.
As shown, this programme includes rib region and tapered zone;Rib region generates the seed laser of nearly diffraction limit, kind Sub- laser enters tapered zone amplification output;The front cavity surface of tapered zone, i.e., the Cavity surface of the one end being connect with rib region without feedback laser, Unidirectionally amplify seed laser in tapered zone.The front cavity surface of tapered zone is provided with inclination Cavity surface structure;Antireflection is coated in inclination Cavity surface Film.The side that the connecting pin of tapered zone and rib region is located at rib region is provided on piece DBR optical grating construction.Laser rear facet steams High reflection deielectric-coating is plated, antireflection deielectric-coating is deposited in front cavity surface.Rib region is ridged waveguide structure.Tapered zone is tapered gain wave Guide structure.
Embodiment:
It applies in 980 nm laser of GaAs base:
Epitaxial structure:
350 μm of substrate layer, 700 nm of lower limit layer, 2400 nm of ducting layer, 700 nm of upper limiting layer, 200 nm of contact layer.
Chip structure:
1) ridged section length: 1 mm;
2) ridged sector width: 5 μm;
3) ridged etching depth: 1.0 m;
4) Bragg mirror: 1.3 m of etching depth, 300 nm of period, logarithm 1000 are right;
5) tapered zone angle: 4 degree;
6) taper section length: 4 mm;
7) tapered zone etching depth: 200 nm;
8) front cavity surface corrodes: ethylene glycol: 30% phosphoric acid: hydrogen peroxide=20:5:1, and 3.5 μm of corrosion depth;
9) cavity surface film coating: it is 98% that rear facet, which plates highly reflecting films reflectivity, and front cavity surface coating anti reflection film reflectivity is 0.1%.
The invention is not limited to specific embodiments above-mentioned.The present invention, which expands to, any in the present specification to be disclosed New feature or any new combination, and disclose any new method or process the step of or any new combination.

Claims (7)

1. a kind of tapered semiconductor laser, it is characterized in that: including rib region and tapered zone;The rib region generates nearly diffraction The seed laser of the limit, seed laser enter tapered zone amplification output;The front cavity surface of the tapered zone is connect with rib region The Cavity surface of one end unidirectionally amplifies seed laser without feedback laser, tapered zone.
2. a kind of tapered semiconductor laser according to claim 1, it is characterized in that: the front cavity surface of the tapered zone is arranged There is inclination Cavity surface structure;Anti-reflective film is coated in the inclination Cavity surface.
3. a kind of tapered semiconductor laser according to claim 1, it is characterized in that: the company of the tapered zone and rib region It connects end and the side of rib region is provided on piece DBR optical grating construction.
4. a kind of tapered semiconductor laser according to claim 1, it is characterized in that: laser rear facet vapor deposition is high Antireflection deielectric-coating is deposited in reflecting medium film, front cavity surface.
5. a kind of tapered semiconductor laser according to claim 1, it is characterized in that: the rib region is ridge waveguide knot Structure.
6. a kind of tapered semiconductor laser according to claim 1, it is characterized in that: the tapered zone is tapered gain wave Guide structure.
7. a kind of tapered semiconductor laser according to claim 1, it is characterized in that: the length of the tapered zone and rib region The ratio between degree is greater than 2.
CN201811276335.0A 2018-10-30 2018-10-30 A kind of tapered semiconductor laser Pending CN109149359A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201811276335.0A CN109149359A (en) 2018-10-30 2018-10-30 A kind of tapered semiconductor laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201811276335.0A CN109149359A (en) 2018-10-30 2018-10-30 A kind of tapered semiconductor laser

Publications (1)

Publication Number Publication Date
CN109149359A true CN109149359A (en) 2019-01-04

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109873295A (en) * 2019-04-17 2019-06-11 中国工程物理研究院应用电子学研究所 A kind of integrated Cascaded amplification semiconductor laser of on piece
CN112688169A (en) * 2020-12-25 2021-04-20 华中科技大学 Semiconductor laser bar and semiconductor external cavity
CN113594851A (en) * 2021-06-15 2021-11-02 中国工程物理研究院应用电子学研究所 High-brightness conical semiconductor laser

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1381762A (en) * 2001-04-17 2002-11-27 松下电器产业株式会社 Optical waveguide path device and light source and optical device using the device
CN1658453A (en) * 2004-02-18 2005-08-24 中国科学院半导体研究所 Hybrid integrated tunable semiconductor laser
CN101471534A (en) * 2007-12-28 2009-07-01 中国科学院半导体研究所 Method for making high brightness semiconductor conical laser/amplifier
CN101809833A (en) * 2007-09-28 2010-08-18 三洋电机株式会社 Nitride-group semiconductor light-emitting element, nitride-group semiconductor laser element, nitride-group semiconductor light emitting diode, their manufacturing method, and nitride-group semiconductor layer forming method
CN107681461A (en) * 2012-05-17 2018-02-09 菲尼萨公司 For EPON(PON)The direct modulation laser of application

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1381762A (en) * 2001-04-17 2002-11-27 松下电器产业株式会社 Optical waveguide path device and light source and optical device using the device
CN1658453A (en) * 2004-02-18 2005-08-24 中国科学院半导体研究所 Hybrid integrated tunable semiconductor laser
CN101809833A (en) * 2007-09-28 2010-08-18 三洋电机株式会社 Nitride-group semiconductor light-emitting element, nitride-group semiconductor laser element, nitride-group semiconductor light emitting diode, their manufacturing method, and nitride-group semiconductor layer forming method
CN101471534A (en) * 2007-12-28 2009-07-01 中国科学院半导体研究所 Method for making high brightness semiconductor conical laser/amplifier
CN107681461A (en) * 2012-05-17 2018-02-09 菲尼萨公司 For EPON(PON)The direct modulation laser of application

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109873295A (en) * 2019-04-17 2019-06-11 中国工程物理研究院应用电子学研究所 A kind of integrated Cascaded amplification semiconductor laser of on piece
CN112688169A (en) * 2020-12-25 2021-04-20 华中科技大学 Semiconductor laser bar and semiconductor external cavity
CN113594851A (en) * 2021-06-15 2021-11-02 中国工程物理研究院应用电子学研究所 High-brightness conical semiconductor laser

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