CN109115375B - Screening method and screening system of thermistor - Google Patents
Screening method and screening system of thermistor Download PDFInfo
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- CN109115375B CN109115375B CN201811226662.5A CN201811226662A CN109115375B CN 109115375 B CN109115375 B CN 109115375B CN 201811226662 A CN201811226662 A CN 201811226662A CN 109115375 B CN109115375 B CN 109115375B
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- 238000012216 screening Methods 0.000 title claims abstract description 172
- 238000000034 method Methods 0.000 title claims abstract description 41
- 238000001514 detection method Methods 0.000 claims abstract description 73
- 238000010438 heat treatment Methods 0.000 claims abstract description 10
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 abstract description 4
- 238000005259 measurement Methods 0.000 description 6
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- 230000008569 process Effects 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 2
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- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
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Abstract
The invention discloses a screening method and a screening system for thermistors, and relates to the technical field of electronic element production. The screening method of the thermistor comprises the following steps: clamping the standard thermistor through a tool clamp, so that the standard thermistor is arranged in a detection space formed by the tool clamp; communicating the detection space with a screening part of a universal resistance braider for screening the thermistor to be detected, and heating the detection space through the screening part so as to keep the detection temperature of the detection space consistent with the working temperature of the screening part; detecting a standard thermistor at the detection temperature to obtain a reference resistance value; and setting a resistance value screening range of the universal resistance braider according to the reference resistance value, and screening the thermistor to be tested according to the resistance value screening range. The screening method of the thermistors, disclosed by the invention, can improve the screening efficiency of the thermistors and rapidly screen a large number of thermistors.
Description
Technical Field
The invention relates to the technical field of electronic element production, in particular to a screening method and a screening system of a thermistor.
Background
The thermistor can change the resistance value of the thermistor through sensing the change of temperature, and is mainly divided into two major categories, one is an NTC thermistor with the resistance value reduced along with the temperature rise, and the other major category is a PTC thermistor with the resistance value also increased along with the temperature rise.
In the processing and production of thermistors, a great problem is how to perform batch testing and screening, a thermal sensitive resistor is completely different from a common resistor in resistance value measurement due to the special property of the thermal sensitive resistor, and has to use equipment such as a constant temperature oil tank and the like to perform auxiliary measurement in the measurement aspect due to the excessive sensitivity to temperature, although the measurement is accurate in the measurement mode, an element after oil immersion needs oil removal treatment, and the measurement efficiency is seriously influenced.
Therefore, a screening method of the thermistor is needed to improve the screening efficiency of the thermistor.
Disclosure of Invention
The invention aims to provide a screening method of thermistors, which can quickly screen a large number of thermistors.
It is another object of the present invention to provide a screening system that is capable of rapidly screening large numbers of thermistors.
The invention provides a technical scheme that: a screening method of thermistors comprises the following steps:
clamping a standard thermistor through a tool clamp, so that the standard thermistor is arranged in a detection space formed by the tool clamp;
communicating the detection space with a screening part of a universal resistance braider for screening the thermistor to be detected, and heating the detection space through the screening part so as to keep the detection temperature of the detection space consistent with the working temperature of the screening part;
detecting the standard thermistor at the detection temperature to obtain a reference resistance value;
and setting a resistance value screening range of the universal resistance braider according to the reference resistance value, and screening the thermistor to be tested according to the resistance value screening range.
Further, before the step of communicating the detection space with a screening portion of a universal resistance braider for screening the thermistor to be tested and heating the detection space by the screening portion so that the detection temperature of the detection space is kept consistent with the operating temperature of the screening portion, the method for screening the thermistor further includes:
and placing the universal resistance braider in a constant temperature environment, and preheating to enable the temperature of the screening part to reach the working temperature.
Further, the temperature of the constant temperature environment is 25 +/-0.1 ℃.
Further, the constant temperature environment is an air-conditioned room.
Further, before the step of detecting the standard thermistor at the detection temperature and obtaining the reference resistance value, the screening method of the thermistor further includes:
and electrically connecting the standard thermistor with a resistance detector.
Further, the tool clamp is in a cylindrical shape with a sealed top, and the detection space is defined by the peripheral wall and the top wall of the detection space.
Further, before the step of setting the resistance value screening range of the universal resistance braider according to the reference resistance value and screening the thermistor to be tested according to the resistance value screening range, the screening method of the thermistor further comprises the following steps:
and placing the thermistor to be tested in the screening part and standing for 3 minutes.
Further, the step of setting the resistance value screening range of the universal resistance braider according to the reference resistance value and screening the thermistor to be tested according to the resistance value screening range further comprises:
setting the resistance value screening range from small to large in sequence based on the reference resistance value so as to screen thermistors to be tested with different precisions;
further, the step of setting a resistance value screening range of the universal resistance braider according to the reference resistance value and screening the thermistor to be tested according to the resistance value screening range further comprises:
setting a resistance value range based on the resistance value reduction according to the reference resistance value to screen the NTC thermistor;
and setting a resistance range based on the resistance increase according to the reference resistance to screen the PTC thermistors.
The invention provides another technical scheme: a screening system comprises a constant temperature operation chamber, a tool clamp, a universal resistance braider and a resistance detector, wherein the tool clamp, the universal resistance braider and the resistance detector are all accommodated in the constant temperature operation chamber, the tool clamp is electrically connected with the resistance detector, the universal resistance braider comprises a control panel and a screening part, the control panel is electrically connected with the screening part, the screening part is used for screening thermistors to be tested,
the tool clamp is used for clamping the standard thermistor so that the standard thermistor is positioned in a detection space formed by the tool clamp;
the screening part is communicated with the detection space and used for heating the detection space so as to keep the detection temperature of the detection space consistent with the working temperature of the screening part;
the resistance detector is used for detecting the standard thermistor at the detection temperature to obtain a reference resistance value;
the control panel is used for setting a resistance value screening range of the universal resistance braider according to the reference resistance value so that the screening part screens the thermistor to be tested according to the resistance value screening range.
Compared with the prior art, the screening method of the thermistor provided by the invention has the beneficial effects that the standard thermistor is clamped by the tool clamp, the thermistor is positioned in the detection space of the tool clamp, the detection space is communicated with the screening part of the universal resistance braider for screening the thermistor to be tested, so that the detection temperature of the detection space is the same as the working temperature of the screening part, the resistance value of the standard thermistor is detected at the detection temperature, and the reference resistance value serving as the basis of the screening range of the set resistance value of the universal resistance braider is obtained, so that the screening method is simple, convenient and quick, and simple in process, and has the following beneficial effects: the screening efficiency of the thermistors can be improved, and the thermistors in large batches can be rapidly screened.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required to be used in the embodiments will be briefly described below. It is appreciated that the following drawings depict only certain embodiments of the invention and are therefore not to be considered limiting of its scope. For a person skilled in the art, it is possible to derive other relevant figures from these figures without inventive effort.
Fig. 1 is a schematic block diagram of a flow of a screening method of thermistors according to a first embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention. It is to be understood that the embodiments described are only a few embodiments of the present invention, and not all embodiments. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present invention, it is to be understood that the terms "upper", "lower", "inside", "outside", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, or the orientations or positional relationships that the products of the present invention are conventionally placed in use, or the orientations or positional relationships that are conventionally understood by those skilled in the art, and are used for the purpose of facilitating the description and simplifying the description, but do not indicate or imply that the equipment or the elements referred to must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention.
In the description of the present invention, it is also to be noted that, unless otherwise explicitly stated or limited, the terms "disposed" and "connected" are to be interpreted broadly, and for example, "connected" may be a fixed connection, a detachable connection, or an integral connection; can be mechanically or electrically connected; the connection may be direct or indirect via an intermediate medium, and may be a communication between the two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
The following detailed description of embodiments of the invention refers to the accompanying drawings.
First embodiment
Fig. 1 is a schematic flow chart of a screening method of a thermistor according to a first embodiment of the present invention, and referring to fig. 1, the screening method of the thermistor includes the following steps:
and S101, clamping the standard thermistor through a tool clamp, so that the standard thermistor is positioned in a detection space formed by the tool clamp.
In this step, the standard thermistor is a thermistor with higher resistance accuracy selected according to the production parameters of the batch of thermistors to be measured.
Wherein, frock clamp is the cylindric of top seal, the detection space is enclosed by its perisporium and roof jointly, be provided with the clamping part on frock clamp's the roof, the clamping part has good electric conductivity, frock clamp's perisporium and roof are all insulating, the clamping part is used for the clamping standard thermistor, the clamping part runs through the roof and leaves the connector lug, be used for being connected with resistance detector electricity, the detection space temperature change that has reduced outside air flow and arouse of frock clamp's perisporium and roof very big degree, it is stable to have kept the detection space, standard thermistor's environmental stability has been guaranteed promptly.
Further, the screening method of the thermistor also comprises the following steps:
and S102, placing the universal resistance braider in a constant temperature environment, and preheating to enable the temperature of the screening part to reach the working temperature.
In this step, the constant temperature of the constant temperature environment is 25 ± 0.1 ℃, and in this embodiment, the constant temperature environment is an air-conditioned room, and the temperature in the room is kept at 25 ± 0.1 ℃ by adjusting the air conditioner.
In the step, the screening part is a part used for screening the thermistor on the universal resistance braider, and in the actual screening process, the screening part can generate heat and the temperature is increased, so that the screening accuracy of the thermistor is influenced.
Further, the screening method of the thermistor also comprises the following steps:
and step S103, communicating the detection space with a screening part of the universal resistance braider for screening the thermistor to be detected, and heating the detection space through the screening part so as to keep the detection temperature of the detection space consistent with the working temperature of the screening part.
In the screening method of the thermistor provided by the invention, the detection space where the standard thermistor is located is communicated with the screening part, and the screening part heats the detection space, so that the environment temperature, namely the detection temperature of the standard thermistor is the same as the working temperature of the screening part, and the measured reference resistance is more accurate in the subsequent resistance detection of the standard thermistor to obtain the reference resistance of the universal resistance braider, and the screening result is more reliable.
Further, the screening method of the thermistor also comprises the following steps:
and step S104, electrically connecting the standard thermistor with the resistance detector.
And step S105, detecting the standard thermistor at the detection temperature to obtain a reference resistance value.
Step S104 and step S105 are processes of obtaining the detected reference resistance value. In step S104, the connector lug of the clamping portion is electrically connected to a resistance detector, which is a commonly used instrument for detecting resistance values of resistors; in step S105, the thermistor is at the detection temperature, the detection temperature is equal to the working temperature of the screening portion, the tooling fixture greatly reduces the temperature change of the detection space caused by the flow of the outside air, and after the screening portion finishes heating the detection space, the temperature of the detection space is kept stable, that is, the ambient temperature of the standard thermistor is ensured to be stable, so that the reference temperature obtained by the standard thermistor at the detection temperature detected by the resistance detector has strong persuasion.
Further, the screening method of the thermistor also comprises the following steps:
in step S106, the thermistor to be tested is placed in the screening part and left to stand for 3 minutes.
In the step, the thermistor to be tested is placed in the screening part and stands for 3 minutes, and the thermistor to be tested is screened among the resistors to be tested, namely, the resistor to be tested is fully adaptive to the working temperature and is screened in a stable state, so that the accuracy of the screening process of the resistor to be tested is improved, and the error is reduced.
Further, the screening method of the thermistor also comprises the following steps:
and S107, setting a resistance value screening range of the universal resistance braider according to the reference resistance value, and screening the thermistor to be tested according to the resistance value screening range.
The universal resistance braider has the function of automatically detecting the resistance values of the resistors in batches, and after the thermistors to be detected are input into the universal resistance braider, the thermistors are screened according to a set resistance value screening range.
When the batch of thermistors are screened with precision, the resistance screening range is set from small to large in sequence based on the reference resistance, and the smaller the resistance screening range is, the higher the precision of the obtained thermistors is. For example, if the reference resistance value is 5K Ω, and the resistance value range is set from small to large, firstly, the a range of 5 ± 0.1K Ω is set for screening to obtain the part a of thermistors, and then the B range of 5 ± 0.2K Ω is set for screening to obtain the part B of thermistors, then, the resistance value precision of the a thermistor is higher than that of the B thermistor, and by analogy, the screening range is set from small to large for screening, and the precision screening of the batch thermistors can be completed.
When the screening purpose is to distinguish NTC thermistors from PTC thermistors:
the NTC thermistor reduces resistance value along with the temperature rise, and sets a resistance value range based on the reduction of the reference resistance value according to the reference resistance value, namely, sets a range from a value smaller than the reference resistance value to the reference resistance value, and then the NTC thermistor can be obtained through screening;
the resistance value of the PTC thermistor increases along with the increase of the temperature, and the resistance value range increased based on the value is set according to the reference resistance value, namely, the range from the reference resistance value to a value larger than the reference resistance value is set, and then the PTC thermistor can be obtained through screening.
The screening method of the thermistor provided by the invention can accurately and quickly obtain the reference resistance value of the batch screening basis, omits the complicated flow in the prior art, can improve the screening efficiency of the thermistor and can quickly screen a large batch of thermistors.
Second embodiment
The screening system provided by the embodiment comprises a constant temperature operation chamber, a tool clamp, a universal resistance braider and a resistance detector, wherein the tool clamp, the universal resistance braider and the resistance detector are all accommodated in the constant temperature operation chamber, the tool clamp is electrically connected with the resistance detector, the universal resistance braider comprises a control panel and a screening part, the control panel and the screening part are electrically connected with each other, the screening part is used for screening a thermistor to be detected, the tool clamp is used for clamping a standard thermistor, so that the standard thermistor is positioned in a detection space formed by the tool clamp, the screening part is communicated with the detection space and is used for heating the detection space, so that the detection temperature of the detection space is consistent with the working temperature of the screening part, the resistance detector is used for detecting the standard thermistor at the detection temperature to obtain a reference resistance value, the control panel is used for setting the, so that the screening part screens the thermistor to be tested according to the resistance value screening range.
The screening system provided by this embodiment can specifically implement the screening method for thermistors provided by the first embodiment, which can rapidly screen large batches of thermistors.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. A screening method of thermistors is characterized by comprising the following steps:
clamping a standard thermistor through a tool clamp, so that the standard thermistor is positioned in a detection space formed by the tool clamp;
communicating the detection space with a screening part of a universal resistance braider for screening the thermistor to be detected, and heating the detection space through the screening part so as to keep the detection temperature of the detection space consistent with the working temperature of the screening part;
detecting the standard thermistor at the detection temperature to obtain a reference resistance value;
and setting a resistance value screening range of the universal resistance braider according to the reference resistance value, and screening the thermistor to be tested according to the resistance value screening range.
2. The method for screening thermistors as set forth in claim 1, wherein, prior to the step of communicating the detection space with a screening section of a universal resistance braider for screening thermistors to be tested, and heating the detection space by the screening section so that the detection temperature of the detection space and the operating temperature of the screening section are kept equal to each other, the method for screening thermistors further comprises:
and placing the universal resistance braider in a constant temperature environment, and preheating to enable the temperature of the screening part to reach the working temperature.
3. The method of screening thermistors as set forth in claim 2, wherein the temperature of said constant temperature environment is 25 ± 0.1 ℃.
4. The method for screening thermistors as set forth in claim 1, wherein said step of detecting said standard thermistor at said detection temperature to obtain a reference resistance value is preceded by the method for screening thermistors further comprising:
and electrically connecting the standard thermistor with a resistance detector.
5. The method of screening thermistors as set forth in claim 1, wherein said jig is cylindrical with a top sealed, and said detection space is defined by a peripheral wall and a top wall thereof.
6. The method for screening thermistors as claimed in claim 1, wherein before the step of setting a resistance value screening range of the universal resistance braider according to the reference resistance value and screening the thermistors to be tested according to the resistance value screening range, the method for screening thermistors further comprises:
and placing the thermistor to be tested in the screening part for standing for a preset time.
7. The method for screening thermistors as claimed in claim 1, wherein the step of setting a resistance value screening range of the universal resistance braider according to the reference resistance value and screening the thermistors to be tested according to the resistance value screening range further comprises:
and setting the resistance value screening range from small to large in sequence based on the reference resistance value so as to screen the thermistors to be tested with different precisions.
8. The method for screening thermistors as claimed in claim 1, wherein the step of setting a resistance value screening range of the universal resistance braider according to the reference resistance value and screening the thermistors to be tested according to the resistance value screening range further comprises:
and setting a resistance range based on the reduced value according to the reference resistance to screen the NTC thermistor.
9. The method for screening thermistors as claimed in claim 1, wherein the step of setting a resistance value screening range of the universal resistance braider according to the reference resistance value and screening the thermistors to be tested according to the resistance value screening range further comprises:
and setting a resistance range based on the numerical value increase according to the reference resistance value to screen the PTC thermistors.
10. A screening system is characterized by comprising a constant-temperature operation chamber, a tool fixture, a universal resistance braider and a resistance detector, wherein the tool fixture, the universal resistance braider and the resistance detector are all accommodated in the constant-temperature operation chamber, the tool fixture is electrically connected with the resistance detector, the universal resistance braider comprises a control panel and a screening part, the control panel is electrically connected with the screening part, the screening part is used for screening thermistors to be tested,
the fixture is used for clamping a standard thermistor, so that the standard thermistor is positioned in a detection space formed by the fixture;
the screening part is communicated with the detection space and used for heating the detection space so as to keep the detection temperature of the detection space consistent with the working temperature of the screening part;
the resistance detector is used for detecting the standard thermistor at the detection temperature to obtain a reference resistance value;
the control panel is used for setting a resistance value screening range of the universal resistance braider according to the reference resistance value so that the screening part screens the thermistor to be tested according to the resistance value screening range.
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CN110703084A (en) * | 2019-11-08 | 2020-01-17 | 江苏嵘成电器有限公司 | Temperature characteristic detection method of thermosensitive switch |
CN110763372A (en) * | 2019-11-29 | 2020-02-07 | 孝感华工高理电子有限公司 | Method for measuring resistance-temperature relation of NTC temperature sensor |
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JPH06254929A (en) * | 1993-03-09 | 1994-09-13 | Jiyuken Kogyo:Kk | Injection molding machine |
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CN201552143U (en) * | 2009-11-19 | 2010-08-18 | 四川西汉电子科技有限责任公司 | Hand-sorting clamp for high-power NTC thermistor chips |
CN102520251A (en) * | 2011-12-23 | 2012-06-27 | 雅化集团绵阳实业有限公司 | Automatic resistance detection device |
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