CN109107908A - System for sheet material sorting - Google Patents
System for sheet material sorting Download PDFInfo
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- CN109107908A CN109107908A CN201810793947.0A CN201810793947A CN109107908A CN 109107908 A CN109107908 A CN 109107908A CN 201810793947 A CN201810793947 A CN 201810793947A CN 109107908 A CN109107908 A CN 109107908A
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- sheet material
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- signal processing
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
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- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The present invention relates to a kind of systems for sheet material sorting, comprising: test device carries out specification test to the sheet material in a non contact fashion；Processing unit is controlled, the gear sorted to the sheet material is set；And multiple devices for sheet material sorting；Wherein, multiple devices for sheet material sorting are in parallel with the control processing unit；The control processing unit determines the gear of the sheet material according to the parameter that the specification of the test device is tested, and issues control signal to first device corresponding with the gear of the sheet material；Wherein, the first device is one corresponding with the gear of the sheet material in multiple devices for sheet material sorting.
Description
Technical field
The present invention relates to sheet material the field of test technology, the system for more particularly relating to sheet material sorting.
Background technique
In semicon industry, silicon wafer is usually to place after being tested by specification according to different stalls.Wherein, resistivity is surveyed
The artificial monolithic sorting test of four probe method is used, silicon wafer thickness carries out traditional thickness test using amesdial.
Silicon wafer after test, which generallys use, to be manually placed into special container, and is carried out artificial counting and weighing estimation and obtained
To silicon wafer quantity.However, manual operation may generate fault.For example, it may be possible to which silicon wafer is mistakenly placed into different stalls
In container；In another example, it is possible to create miscount.It is thereby possible to which the silicon wafer placed in container is made not exclusively to be same gear
Interior silicon wafer, this may the electric property consistency for silicon wafer adversely affect.
For example, the single crystal silicon semiconductor abrasive sheet in silicon wafer is mainly used for diode, in the manufacture of the discrete devices such as triode,
It is the core material of discrete device manufacture, is had a major impact to device electric property etc..Discrete device mostly uses axial technique,
It spreads the dopant of different conduction-types respectively on silicon wafer both sides, forms PN junction, industrial production generally uses batch to go into operation and gives birth to
Same electrical specification device is produced, at this time to the pressure-resistant consistency of same batch of devices, PN junction depth consistency has high requirements, these
Electric property consistency and same a collection of silicon chip resistivity consistency of thickness have compared with High relevancy.Therefore, how to guarantee that monocrystalline silicon is ground
The silicon wafer from different batches mixing that grinding sorting consistency and placement sub-elect is important.
Have some silicon wafer automatic fraction collectors in industry to occur, however itself the problem is that silicon wafer sorting test precision
It is lower, cause available gears less, this meet the requirements the silicon wafer electric property consistency after sorting still cannot.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of devices for sheet material sorting, and sorting work is prevented
The problem of mistake proofing.
In order to solve the above technical problems, the present invention provides a kind of systems for sheet material sorting, comprising: test device,
Specification test is carried out in a non contact fashion to the sheet material；Processing unit is controlled, the gear sorted to the sheet material is set；
And multiple devices for sheet material sorting；Wherein, multiple devices for sheet material sorting and the control processing unit
It is in parallel；The control processing unit determines the gear of the sheet material according to the parameter that the specification of the test device is tested,
And control signal is issued to first device corresponding with the gear of the sheet material；Wherein, the first device is multiple use
One corresponding with the gear of the sheet material in the device of sheet material sorting.
In one embodiment, the device for sheet material sorting includes signal processing apparatus and weight detecting mould
Block；Wherein, the signal processing module and the control processing unit communicate to connect；The weight detecting module is put for detecting
It sets the weight of the sheet material of the device for sheet material sorting and sends detection signal；The signal processing module and institute
The communication connection of weight detecting module is stated, and the signal processing module includes display module；When the signal processing module not
When receiving the detection signal of the weight detecting module, the display module shows the first alarm signal or the second alarm signal
Number；When the signal processing module receives the detection signal of the weight detecting module, the display module shows first
Alarm signal or third alarm signal.
In one embodiment, when the signal processing module of the first device does not receive the weight of the first device
When the detection signal of detection module, the display module of the first device shows the second alarm signal；When the first device
When signal processing module receives the detection signal of the weight detecting module of the first device, the display mould of the first device
Block shows the first alarm signal.
In one embodiment, the signal processing module further includes number display section；Wherein, when the first device
Signal processing module receive the detection signal of the weight detecting module and the display module show it is described first report
When alert signal, the counting that the number display section is shown increases by 1.
In one embodiment, it is not right with the gear of the sheet material in multiple devices for sheet material sorting to define
One answered is second device；When the signal processing module of the second device does not receive the weight detecting of the second device
When the detection signal of module, the display module of the second device shows the first alarm signal；When the signal of the second device
When processing module receives the detection signal of the weight detecting module of the second device, the display module of the second device is aobvious
Show third alarm signal.
In one embodiment, it is characterised in that: the signal processing module further includes number display section；
Wherein, when the signal processing module receives the detection signal of the weight detecting module and the display mould
When block shows the third alarm signal, the counting that the number display section is shown does not increase.
It is described under conditions of the display module of the second device shows third alarm signal in one embodiment
The signal processing module of second device carries out data feedback to the control processing unit, so that described be for sheet material sorting
System stops specification test.
In one embodiment, the weight inspection of the first device is received in the signal processing module of the first device
The detection signal of module is surveyed, and under conditions of the display module of the first device shows the first alarm signal, described first
The signal processing module of device to the control processing unit carry out data feedback, enable it is described for sheet material sorting system
Continue specification test.
In one embodiment, when the counting of the number display section in the device for sheet material sorting reaches predetermined
When value, the system for sheet material sorting issues standby signal and stops specification test.
In one embodiment, when the counting of the number display section reaches the dress described in predetermined value for sheet material sorting
After the container set is replaced, the system for sheet material sorting can continue specification test.
The beneficial effects of the present invention are: the system for sheet material sorting can prevent sheet material to be placed on wrong gear
On, and it is able to carry out product back-tracing information.
Detailed description of the invention
Fig. 1 is the schematic diagram of the system for sheet material sorting of the invention.
Fig. 2 is the schematic diagram of the device for sheet material sorting of the invention.
Fig. 3 is the schematic diagram of the use state of the device for sheet material sorting of the invention.
Fig. 4 is the functional schematic of the device for sheet material sorting of the invention.
Fig. 5 is the work flow diagram of the system for sheet material sorting of the invention.
Specific embodiment
To keep the technical problem to be solved in the present invention, technical solution and advantage clearer, below in conjunction with attached drawing and tool
Body embodiment is described in detail.In the following description, such as specific configuration is provided and the specific detail of component is only
In order to help comprehensive understanding the embodiment of the present invention.It therefore, it will be apparent to those skilled in the art that can be to reality described herein
Example is applied to make various changes and modifications without departing from scope and spirit of the present invention.In addition, for clarity and brevity, it is omitted pair
The description of known function and construction.
It should be understood that " one embodiment " or " embodiment " that specification is mentioned in the whole text mean it is related with embodiment
A particular feature, structure, or characteristic is included at least one embodiment of the present invention.Therefore, occur everywhere in the whole instruction
" in one embodiment " or " in one embodiment " not necessarily refer to identical embodiment.In addition, these specific features, knot
Structure or characteristic can combine in any suitable manner in one or more embodiments.
In various embodiments of the present invention, it should be appreciated that the size of the serial number of following each processes is not meant to execute suitable
Sequence it is successive, the execution of each process sequence should be determined by its function and internal logic, the implementation without coping with the embodiment of the present invention
Process constitutes any restriction.
It should be understood that the terms "and/or", only a kind of incidence relation for describing affiliated partner, expression can deposit
In three kinds of relationships, for example, A and/or B, can indicate: individualism A exists simultaneously A and B, these three situations of individualism B.
In addition, character "/" herein, typicallys represent the relationship that forward-backward correlation object is a kind of "or".
In embodiment provided herein, it should be appreciated that " B corresponding with A " indicates that B is associated with A, can be with according to A
Determine B.It is also to be understood that determine that B is not meant to determine B only according to A according to A, it can also be according to A and/or other information
Determine B.
Term " sheet material " is referred to by the abrasive sheet that is formed after the cutting of semiconductor monocrystal silicon rod in the present invention, also refer to
The abrasive sheet of crystal, sapphire, compound semiconductor and thin film of conductive material that cordless is tested.
Term " specification test " is the special parameter to silicon wafer: thickness, resistivity and resistivity evenness are interpreted, and
The specific gear of silicon wafer by specification test is assigned according to preset parameter range.
Term " sorting " refers to places silicon wafer according to preset specific gear respectively.The silicon wafer of particular gears as a result,
With roughly the same thickness, resistivity and resistivity evenness parameter.
It should also be noted that, herein, relational terms such as first and second and the like are used merely to one
Entity or operation are distinguished with another entity or operation, without necessarily requiring or implying between these entities or operation
There are any actual relationship or orders.Moreover, the terms "include", "comprise" or its any other variant are intended to contain
Lid non-exclusive inclusion.
For ease of description, silicon wafer is used to describe the system for sheet material sorting as example in the present invention, however should
Understand, the present disclosure applies equally to the crystal tested in a non contact fashion, sapphire, compound semiconductors and thin
The abrasive sheet of film conductive material.
System for sheet material sorting
System for sheet material sorting of the invention, comprising: test device advises the sheet material in a non contact fashion
Lattice test；Processing unit is controlled, the gear sorted to the sheet material is set；And multiple devices for sheet material sorting；
Wherein, multiple devices for sheet material sorting are in parallel with the control processing unit；The control processing unit is according to institute
State the gear that the parameter that the specification of test device is tested determines the sheet material, and to corresponding with the gear of the sheet material
One device issues control signal；Wherein, the first device be in multiple devices for sheet material sorting with described
The gear of material is one corresponding.
With reference to Fig. 1, it is schematically shown that the system for silicon wafer sorting.It should be understood that most of situations it
Under, the system for silicon wafer sorting is equally applicable to the grinding of crystal, sapphire, compound semiconductor and thin film of conductive material
Piece.
Typically, which includes: non-contact type silicon wafer test device 1, and display device 2 controls processing unit 3, multiple
Device 4 for silicon wafer sorting.
Wherein, non-contact type silicon wafer test device 1, which executes, tests the specification of silicon wafer, and the parameter of single piece of silicon wafer (is wrapped
Include but be not limited to thickness, resistivity and resistivity evenness) it is interpreted, and these parameters are sent to control processing unit 3.
Control processing unit 3 and non-contact type silicon wafer test device 1, display device 2 and the device 4 for silicon wafer sorting
Between have data connection.Typically, it can be attached using USB data line, it should be understood that ground is that other are suitable
Wired and/wireless data connection mode stands good in the present invention.
In store preset silicon wafer gear in processing unit 3 is controlled, the different range of silicon wafer parameters is defined in each gear.
After the parameter for receiving the specification test executed to silicon wafer from non-contact type silicon wafer test device 1, control processing unit 3 will
The parameter is compared with according to the parameter area of preset silicon wafer gear, and the parameter is divided to preset silicon wafer gear.
In one embodiment, control processing unit 3 sends silicon wafer gear signal to display device 2, in display device 2
The upper corresponding silicon wafer gear of display, and control signal is sent to the corresponding device 4 sorted for silicon wafer, it is sorted for silicon wafer
Device 4 receive control signal after, make corresponding reaction, and after receiving silicon wafer to control processing unit 3 send
Confirmation/error signal (will be described in more detail below).
Typically, control processing unit 3 can be PC machine.
Device for sheet material sorting
Device for sheet material sorting of the invention is suitable for receiving the sheet material for needing to carry out specification test in a non contact fashion,
The device for sheet material sorting includes: support base and the support seat of honour；Wherein the device for sheet material sorting also wraps
Include: weight detecting module, the weight detecting module are arranged between the support base and the support seat of honour, and described
Weight detecting module is used to detect the weight for the sheet material being placed on the support seat of honour and sends detection signal.
It is shown in Figure 2, show schematically the device 4 for silicon wafer sorting comprising: support base 4-6；In support
Seat 4-7；Weight detecting module 4-8 and signal processing module 4-1.
Wherein, weight detecting module 4-8 setting is placed between support base 4-6 and support seat of honour 4-7 for detecting
The weight of silicon wafer on the device 4 (support seat of honour 4-7) of silicon wafer sorting, and will test signal to signal processing module 4-1
It sends.In one embodiment, weight detecting module 4-8 can choose weight sensor.
Signal processing module
Signal processing module, the signal processing module and the weight detecting module communicate to connect, and the signal
Processing module includes display module；When the signal processing module does not receive the detection signal of the weight detecting module,
The display module shows the first alarm signal or the second alarm signal；When the signal processing module receives the weight inspection
When surveying the detection signal of module, the display module shows the first alarm signal or third alarm signal.The signal processing mould
Block further includes number display section.
Shown in Figure 2, signal processing module 4-1 can receive the control signal of control processing unit 3, and receive
Confirmation/error signal is sent to control processing unit 3 after detection signal.
In one embodiment, the top of the device 4 of silicon wafer sorting is arranged in signal processing module 4-1, comprising: is located at
Alarm display lamp 4-2 right above signal processing module 4-1, be located at the positive gear display screen 4-3 of signal processing module 4-1 and
Quantity display screen 4-4.Weight detecting module 4-8 directly passes through data line with signal processing module 4-1 and is communicated, in addition, letter
Number processing module 4-1 can also include USB data interface, to be communicated with control processing unit 3.
Preferably, the signal processing module and the weight detecting module communicate to connect, when the signal processing module
When not receiving the detection signal of the weight detecting module, the display module shows the first alarm signal or the second alarm signal
Number；When the signal processing module receives the detection signal of the weight detecting module, the display module shows first
Alarm signal or third alarm signal.More specifically, the signal processing module when the first device does not receive described first
When the detection signal of the weight detecting module of device, the display module of the first device shows the second alarm signal；When described
When the signal processing module of first device receives the detection signal of the weight detecting module of the first device, first dress
The display module set shows the first alarm signal；Further, define in multiple devices for sheet material sorting with institute
Gear not corresponding one for stating sheet material is second device；When the signal processing module of the second device does not receive described
When the detection signal of the weight detecting module of two devices, the display module of the second device shows the first alarm signal；Work as institute
When the detection signal for the weight detecting module that the signal processing module for stating second device receives the second device, described second
The display module of device shows third alarm signal.
Typically, alarm display lamp 4-2 can be three color alarm display lamps, in the control for not receiving control processing unit 3
When signal processed, and weight detecting module 4-8 is not provided when detecting signal, is shown the first alarm signal (such as yellow)；It is receiving
To control processing unit 3 control signal when, and weight detecting module 4-8 do not provide detection signal when, display second alarm
Signal (such as green)；Weight detecting module 4-8 provides detection signal, restores after sending confirmation signal to control processing unit 3
To show the first alarm signal；And when not receiving the control signal of control processing unit 3, and weight detecting module 4-8
When detection signal is provided, and third alarm signal is shown when sending error signal to control processing unit 3 (as red).
In one embodiment, multiple devices 4 for silicon wafer sorting are in parallel with control processing unit 3.Control processing
By determining silicon wafer gear signal, a corresponding device 4 for being used for silicon wafer sorting is sent device 3 thereto, corresponding to be used for silicon
The signal processing module 4-1 of the device 4 of piece sorting is after the control signal for receiving control processing unit 3, and weight detecting
When module 4-8 does not provide detection signal, control alarm display lamp 4-2 shows the second alarm signal.At this point, remaining does not receive control
The alarm display lamp 4-2 of the device 4 for silicon wafer sorting of signal processed still shows the first alarm signal.
In this way, silicon wafer 4-12 can be placed into the dress for being correctly used for silicon wafer sorting by operator under specific prompt
It sets in 4.Weight detecting module 4-8 sends detection signal after detecting corresponding silicon wafer weight, to signal processing module 4-1,
Signal processing module 4-1 receives detection signal control silicon wafer quantity display screen 4-4 and shows current silicon wafer quantity, and to control
Processing unit 3 restores alarm display lamp 4-2 after sending confirmation signal as the first alarm signal of display.
Wherein, when the signal processing module receives the detection signal of the weight detecting module and the display mould
When block shows first alarm signal, the counting that the number display section is shown increases by 1；When the signal processing module connects
Receive the detection signal of the weight detecting module and when the display module shows the third alarm signal, the quantity
The counting that display module is shown does not increase.
Preferably, quantity display screen 4-4 has three bit digital display functions, the device for silicon wafer sorting can be shown
Silicon wafer quantity in 4, every in the device 4 for silicon wafer sorting to increase a piece of silicon wafer, the counting on quantity display screen 4-4 can be automatic
Increase by 1, when reaching setting quantity, system automatic prompt.
The case where in case of faulty operation, that is, silicon wafer 4-12 is placed in the device 4 for silicon wafer sorting of mistake
Afterwards, weight detecting module 4-8 sends detection signal, signal to signal processing module 4-1 after detecting corresponding silicon wafer weight
After processing module 4-1 receives detection signal, shown to controlling the transmission error signal of processing unit 3 and controlling alarm display lamp 4-2
Show third alarm signal.In this way, the device 4 that can know which is used for silicon wafer sorting under specific prompt is to place mistake
's.Corresponding silicon wafer weight is being removed from the device 4 sorted for silicon wafer for placing mistake, weight detecting module 4-8 is being examined
After measuring corresponding silicon wafer weight reduction, detection signal is sent to signal processing module 4-1, signal processing module 4-1 is received
After detecting signal, wrong ring off signal is sent to control processing unit 3 and controls alarm display lamp 4-2 and restores the first alarm of display
Signal.
Referring to Fig. 3, being preferably used in the device 4 that silicon wafer sorts further includes the container 4-11 for placing silicon wafer 4-12.?
In one embodiment, container 4-11 is foam, so can be avoided silicon wafer 4-12 and collides damage.
In one embodiment, container 4-11 is fixed on support seat of honour 4-7, by multiple fastenings that side is arranged in
Part 4-10 is fixedly connected.
When the container in the device that the counting of number display section reaches described in predetermined value for sheet material sorting is replaced
Afterwards, the system for sheet material sorting can continue specification test.
The signal processing module further includes control signal input submodule, analog to digital-digital to analog converter submodule, signal processing
Submodule, memory module, transmission module.
Referring to fig. 4, signal processing module 4-1 has been described in further detail.Wherein, signal processing module 4-1 includes: control
Signal input submodule 4-1-2, is shown schematically as USB input submodule in figure, is used to provide signal processing module
The power supply of 4-1 is supported and information input；Analog to digital-digital to analog converter submodule 4-1-3 (AD/DA submodule) is used for gravity sensitive
The analog signal of device input is converted to digital signal, wherein AD refers to that analog to digital signal converts (Analog to
DigitalConvert), DA refers to that digital-analog signal converts (Digital to Analog Convert)；Signal processing
Module 4-1-1 controls display module 4-1-5 and transmission module 4-1-6 according to the control signal of input and/or detection signal,
And the data in memory module 4-1-4 can be called and write data into memory module 4-1-4；Memory module 4-4-4, is used for
The gear information recorded in real-time storage signal processing module 4-1, silicon wafer quantity information and status information, and have power-off data
Defencive function, that is, the data information being powered again before capable of retaining power-off after powering off；Display module 4-1-5 includes indicating lamp module (packet
Include alarm display lamp 4-2), gear encodes display module (including gear display screen 4-3) and number display section (including quantity
Display screen 4-4)；Transmission module 4-1-6 can carry out data feedback to control processing unit 3 (i.e. PC machine), including send true
Recognize signal/error signal/mistake ring off signal, furthermore, it may also be used for execute the functions such as data transmission, address searching.
Sheet material sorts process
To be further appreciated that the system for sheet material sorting of the invention, the process of system work is described referring to Fig. 5.
One preferred specific embodiment is as follows:
S1: to non-contact silicon wafer test device 1, display device 2 controls processing unit 3, multiple in parallel for sorting
Device 4 carries out physical connection with USB data line 5 and is powered, and opens software, preheats 30 minutes；
S2: opening system software interface in PC machine, carries out silicon wafer sorting setting and gear setting；
S3: the calibration of thickness resistivity cleans platform, suitable range is selected in non-contact silicon wafer test device, and select
Suitable print carries out the calibration of thickness resistivity, and thickness calibration is using 2 silicon wafers calibrations, and calibration silicon wafer is using 210.7 μm of 3 inch and 3
580.5 μm of inch each a piece of to be calibrated；Resistivity calibration: 2 silicon wafers calibration that resistivity calibration uses.It calibrates silicon wafer and uses 3
280.5 μm of inch, resistivity, which is that 30.53 Ω cm and 285.6 thickness, 48.78 Ω cm are each, a piece of is calibrated；
S4: test essential information input, for example, input test lot number encode, task odd numbers, tester's information and other
Essential information, uniformity controlling input 12%；
S5: carrying out silicon test, chooses gear automatically, carries out silicon test, and determine gear automatically according to test result,
It is shown in operation interface, the indicator light of the device 4 of respective notch lights, and prompts to be put into silicon wafer；
S6: silicon wafer sorting is placed, and the silicon wafer tested is placed on to the device 4 of respective notch, while carrying out misplacing detection；
When detecting that silicon wafer is placed into correct gear, S9 is returned to step；When detecting that silicon wafer is placed on dislocation gear, execute
Step S7；
S7: sorting misplaces alarm: the device 4 of respective notch shows alarm lamp at this time, and operation interface shows that silicon wafer is put
Misrepresent deliberately police；
S8: error correction simultaneously eliminates alarm；
S9: silicon wafer counts, and data transmission, silicon wafer sorting is placed correctly, automatic to carry out silicon wafer counting, and transmits number to PC machine
According to；
S10: the upper limit of the number alarm: when detecting that the gear silicon wafer quantity reaches setting limit, upper limit alarm is prompted, is held
Row step S11；When not up to limit is arranged in silicon wafer quantity, step S12 is executed；
S11: taking out silicon wafer, eliminates alarm, executes step S12 after eliminating alarm；
S12: test is completed, and is saved data: being determined that this tests whether to complete, such as not complete as completed to then follow the steps S13
At return step S5；
S13: production task is completed to determine, when production task completion, executes step S14 and return when production task does not complete
Receipt row step S4；
S14: saving batch measurement data, and task terminates.
The above is a preferred embodiment of the present invention, it is noted that for those skilled in the art
For, without departing from the principles of the present invention, several improvements and modifications can also be made, these improvements and modifications
It should be regarded as protection scope of the present invention.
Claims (10)
1. a kind of system for sheet material sorting, comprising:
Test device carries out specification test to the sheet material in a non contact fashion；
Processing unit is controlled, the gear sorted to the sheet material is set；And
Multiple devices for sheet material sorting；It is characterized by:
Multiple devices for sheet material sorting are in parallel with the control processing unit；
The control processing unit determines the gear of the sheet material according to the parameter that the specification of the test device is tested, and
Control signal is issued to first device corresponding with the gear of the sheet material；Wherein, the first device is multiple described is used for
One corresponding with the gear of the sheet material in the device of sheet material sorting.
2. system according to claim 1, it is characterised in that: the device for sheet material sorting includes signal processing device
It sets and weight detecting module；Wherein, the signal processing module and the control processing unit communicate to connect；
The weight detecting module be used to detect be placed into the sheet material of the device sorted for sheet material weight it is concurrent
Signal is surveyed in inspection；
The signal processing module and the weight detecting module communicate to connect, and the signal processing module includes display mould
Block；
When the signal processing module does not receive the detection signal of the weight detecting module, the display module shows
One alarm signal or the second alarm signal；
When the signal processing module receives the detection signal of the weight detecting module, the display module shows first
Alarm signal or third alarm signal.
3. system according to claim 2, it is characterised in that: when the signal processing module of the first device does not receive
When the detection signal of the weight detecting module of the first device, the display module of the first device shows the second alarm signal
Number；
When the signal processing module of the first device receives the detection signal of the weight detecting module of the first device,
The display module of the first device shows the first alarm signal.
4. system according to claim 3, it is characterised in that:
The signal processing module further includes number display section；
Wherein, when the signal processing module of the first device receives the detection signal of the weight detecting module and described
When display module shows first alarm signal, the counting that the number display section is shown increases by 1.
5. system according to claim 2, it is characterised in that: define in multiple devices for sheet material sorting with
The gear of the sheet material not corresponding one is second device；
When the signal processing module of the second device does not receive the detection signal of the weight detecting module of the second device
When, the display module of the second device shows the first alarm signal；
When the signal processing module of the second device receives the detection signal of the weight detecting module of the second device,
The display module of the second device shows third alarm signal.
6. system according to claim 5, it is characterised in that:
The signal processing module further includes number display section；
Wherein, when the signal processing module receives the detection signal of the weight detecting module and the display module is aobvious
When showing the third alarm signal, the counting that the number display section is shown does not increase.
7. system according to claim 5, it is characterised in that:
Under conditions of the display module of the second device shows third alarm signal, the signal processing mould of the second device
Block carries out data feedback to the control processing unit, so that the System Halt specification test for sheet material sorting.
8. system according to claim 2, it is characterised in that: receive institute in the signal processing module of the first device
The detection signal of the weight detecting module of first device is stated, and the display module of the first device shows the first alarm signal
Under conditions of, the signal processing module of the first device carries out data feedback to the control processing unit, so that the use
It can continue specification test in the system of sheet material sorting.
9. system according to claim 4, it is characterised in that: when the quantity in the device for sheet material sorting is shown
When the counting of module reaches predetermined value, the system for sheet material sorting issues standby signal and stops specification test.
10. system according to claim 8, it is characterised in that: when the counting of the number display section reaches predetermined value
After container in the device for sheet material sorting is replaced, the system for sheet material sorting can continue specification test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810793947.0A CN109107908A (en) | 2018-07-19 | 2018-07-19 | System for sheet material sorting |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810793947.0A CN109107908A (en) | 2018-07-19 | 2018-07-19 | System for sheet material sorting |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020153924A3 (en) * | 2019-01-21 | 2020-11-26 | Memak Plasti̇k Gida Maki̇na Sanayi̇ Ti̇caret Anoni̇m Şi̇rketi̇ | Grammage control system in chocolate enrobing machines |
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