CN109103147B - 柔性封装架构、制作方法及具有该架构的可穿戴设备 - Google Patents
柔性封装架构、制作方法及具有该架构的可穿戴设备 Download PDFInfo
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- CN109103147B CN109103147B CN201810779413.2A CN201810779413A CN109103147B CN 109103147 B CN109103147 B CN 109103147B CN 201810779413 A CN201810779413 A CN 201810779413A CN 109103147 B CN109103147 B CN 109103147B
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/13—Mountings, e.g. non-detachable insulating substrates characterised by the shape
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4803—Insulating or insulated parts, e.g. mountings, containers, diamond heatsinks
- H01L21/481—Insulating layers on insulating parts, with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
- H01L21/4853—Connection or disconnection of other leads to or from a metallisation, e.g. pins, wires, bumps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
- H01L23/147—Semiconductor insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49866—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials
- H01L23/49877—Carbon, e.g. fullerenes
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L23/562—Protection against mechanical damage
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/18—High density interconnect [HDI] connectors; Manufacturing methods related thereto
- H01L2224/23—Structure, shape, material or disposition of the high density interconnect connectors after the connecting process
- H01L2224/24—Structure, shape, material or disposition of the high density interconnect connectors after the connecting process of an individual high density interconnect connector
- H01L2224/241—Disposition
- H01L2224/24135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/24137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Nanotechnology (AREA)
- Composite Materials (AREA)
- Materials Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Ceramic Engineering (AREA)
- Structure Of Printed Boards (AREA)
Abstract
Description
Claims (14)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810779413.2A CN109103147B (zh) | 2018-07-16 | 2018-07-16 | 柔性封装架构、制作方法及具有该架构的可穿戴设备 |
Applications Claiming Priority (1)
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CN201810779413.2A CN109103147B (zh) | 2018-07-16 | 2018-07-16 | 柔性封装架构、制作方法及具有该架构的可穿戴设备 |
Publications (2)
Publication Number | Publication Date |
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CN109103147A CN109103147A (zh) | 2018-12-28 |
CN109103147B true CN109103147B (zh) | 2022-03-18 |
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CN201810779413.2A Active CN109103147B (zh) | 2018-07-16 | 2018-07-16 | 柔性封装架构、制作方法及具有该架构的可穿戴设备 |
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CN (1) | CN109103147B (zh) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN111490454B (zh) * | 2019-01-29 | 2021-01-22 | 潍坊华光光电子有限公司 | 一种具有深沟槽的脊型GaAs基激光器的P面金属制备方法 |
CN114679840B (zh) * | 2022-03-28 | 2024-05-24 | 杭州电子科技大学 | 一种柔性器件封装结构及封装方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3280394B2 (ja) * | 1990-04-05 | 2002-05-13 | ロックヒード マーティン コーポレーション | 電子装置 |
CN1822748A (zh) * | 2005-02-17 | 2006-08-23 | 精工爱普生株式会社 | 膜图案的形成方法及器件的制造方法、电光学装置及电子机器 |
KR20100122736A (ko) * | 2009-05-13 | 2010-11-23 | 스템코 주식회사 | 잉크젯 카트리지용 연성 회로 기판의 제조 방법, 그에 의해 제조된 잉크젯 카트리지용 연성 회로 기판 및 잉크젯 카트리지의 제조 방법 |
CN105500942A (zh) * | 2014-10-08 | 2016-04-20 | 株式会社东芝 | 图案形成方法及图案 |
CN106537570A (zh) * | 2014-09-26 | 2017-03-22 | 德州仪器公司 | 用于半导体封装的印刷互连件 |
CN106611757A (zh) * | 2015-10-27 | 2017-05-03 | 三星电子株式会社 | 具有柔性互连件的半导体装置及其制造方法 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6606247B2 (en) * | 2001-05-31 | 2003-08-12 | Alien Technology Corporation | Multi-feature-size electronic structures |
US8836094B1 (en) * | 2013-03-14 | 2014-09-16 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package device including an opening in a flexible substrate and methods of forming the same |
-
2018
- 2018-07-16 CN CN201810779413.2A patent/CN109103147B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3280394B2 (ja) * | 1990-04-05 | 2002-05-13 | ロックヒード マーティン コーポレーション | 電子装置 |
CN1822748A (zh) * | 2005-02-17 | 2006-08-23 | 精工爱普生株式会社 | 膜图案的形成方法及器件的制造方法、电光学装置及电子机器 |
KR20100122736A (ko) * | 2009-05-13 | 2010-11-23 | 스템코 주식회사 | 잉크젯 카트리지용 연성 회로 기판의 제조 방법, 그에 의해 제조된 잉크젯 카트리지용 연성 회로 기판 및 잉크젯 카트리지의 제조 방법 |
CN106537570A (zh) * | 2014-09-26 | 2017-03-22 | 德州仪器公司 | 用于半导体封装的印刷互连件 |
CN105500942A (zh) * | 2014-10-08 | 2016-04-20 | 株式会社东芝 | 图案形成方法及图案 |
CN106611757A (zh) * | 2015-10-27 | 2017-05-03 | 三星电子株式会社 | 具有柔性互连件的半导体装置及其制造方法 |
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CN109103147A (zh) | 2018-12-28 |
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