CN1090317C - 光纤布拉格光栅护层分离探测 - Google Patents

光纤布拉格光栅护层分离探测 Download PDF

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CN1090317C
CN1090317C CN95196458A CN95196458A CN1090317C CN 1090317 C CN1090317 C CN 1090317C CN 95196458 A CN95196458 A CN 95196458A CN 95196458 A CN95196458 A CN 95196458A CN 1090317 C CN1090317 C CN 1090317C
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詹姆斯·R·邓菲
詹姆斯·J·瑞安
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Abstract

一种光学腐蚀传感器使用了插入光纤(18)中的光纤布拉格光栅(20)。该光栅(20)具有一由诸如铝制成的护层(40)，护层受到腐蚀就会分离。护层(40)沾光栅(20)的四周向里施以径向作用力，从而使光栅反射率曲线的波长带宽变宽并相对于未加护层时有漂移。而且，当护层受腐时光栅(20)上的作用力便减小，从而使光栅反射率曲线的波长带宽和漂移变小而又回复到其未加护层的情况。

Description

光纤布拉格光栅护层分离探测
对相关专利申请的交叉参考
共有未决的美国专利申请系列号(UTC Docket NO.R-3867)题为“高灵敏性的光纤泡沫护层分离探测”，是与本文同时提出的，其内容与本文公开的内容有关。
技术领域
本发明涉及灵巧结构，更具体说涉及光学腐蚀的探测。
背景技术
众所周知，在温度和应变的光测技术中，将传感器布置在结构的表面上或表面内。这种传感器能提供有关结构上不同点处应力的信息，从而提供结构的疲劳、使用期限、和检修周期的信息。这种传感器集成结构及使之适用的光学和电子学便叫做“灵巧结构”。这样的一个系统在共有未决的美国专利申请系列号NO.08/207,993，题为“能测量应变和温度的插入式光传感器”的申请中作以说明。
除了测量结构中各点的应力和温度外，还希望能弄清关于结构元件的腐蚀情况的信息以求得何时该结构就不能胜任其正常应用。例如，如果飞机机身和机翼在临界应力点有腐蚀，就可能引起结构失效。
因此，希望获得一种能检测结构材料中的腐蚀的传感器。
发明的公开
本发明的目的是提供一种能探测腐蚀的传感器。
根据本发明，光学传感器包括光学纤维、光纤光栅和某种材料的护层。上述的光纤光栅插在光学纤维中，它的入射光反射率曲线有一反射波长带宽；护层材料有一个预定的厚度，且沿光纤光栅的长度和周边分布；护层沿光纤光栅的长度和周边施以向里的径向力，从而使光纤光栅的反射率曲线的波长带宽比没有护层时宽；当护层至少有一部分分离时光纤光栅上的作用力就减小，结果光纤光栅的反射率曲线的波长带宽变窄，这就提供了检测护层分离的光学参量。
在本发明的传感器中，光纤可包括光纤芯线和包围此芯线的镀层。
在本发明的传感器中，护层施予的作用力可不均匀地分布在光纤光栅周围并破坏了光纤光栅反射率的周期性变化，从而使反射率曲线的波长带宽变宽。
在本发明的传感器中，护层可沿光纤光栅四周作用一平均合力，从而引起波长漂移。
在本发明的传感器中，护层可包括铝
在本发明的传感器中，护层的分离可包括护层的腐蚀。
本发明还提供一种制造光传感器的方法，它包括：
获得一插有光纤光栅的光纤；
沿光纤光栅的周边和长度将护层涂敷到光纤光栅上；
该护层涂到光纤光栅上，结果护层沿光纤光栅四周施加不均匀作用力；
该作用力使光纤光栅的反射率曲线的波长带宽比无此护层时宽；以及
施于光纤光栅的力当护层至少有一部分分离时减小，从而引起光纤光栅的反射率曲线的波长带宽变窄，这提供了检测护层分离的光学参数。
在本发明的制造方法中，护层可沿光纤光栅四周施以一平均合力，从而使光纤光栅的峰值反射波长比无此护层时的峰值反射波长偏离一个值，该波长漂移在护层至少有一部分分离时减少。
在本发明的方法中，所述护层涂敷方法可包括气相沉积。
在本发明的方法中，所述护层涂敷方法可包括凝固熔敷。
在本发明的方法中，所述护层的分离可包括护层的腐蚀。
本发明还提供一种用于传感器检测护层从光纤分离的方法，它包括：
获得有光纤光栅插在其中的光纤；
沿光纤光栅的周边和长度将护层涂敷到该光纤光栅上；
护层施力于光纤光栅，因此护层在光纤光栅的周边和长度上施以不均匀作用力；
该作用力使光纤光栅的反射率曲线上的波长带宽比无此护层时宽；
该光纤光栅上的作用力在护层至少有一部分分离时减小，从而使该光纤光栅反射率曲线上的波长带宽变窄；
提供将光线引入光纤的光源；
提供两个探测器，以获得被光纤光栅反射或穿过的光线强度的信号指示，从而检测到护层的分离。
根据本发明，护层的作用力也使光纤光栅的峰值反射波长比没有护层时偏移一个量，而此波长漂移在护层至少有一部分分离时便缩小。
根据本发明，护层包括铝。
本发明代表灵巧结构的一项技术进步，使得可通过发现以某种材料(如铝)作护层的光栅引起光栅反射率曲线变宽及漂移来探测结构的腐蚀。发生的加宽和漂移的量可由护层镀敷工艺和护层材料进行调整。本发明重量轻、价格便宜、容易安装且对腐蚀的灵敏度高。此外，本传感器容易与其他同样使用光纤布拉格光栅的灵巧传感器结合起来，如温度传感器和/或应变传感器。
本发明以上的和其他的目的、特点和优点从对附图所示实施例的详细说明而清楚起来。
附图概述
图1是按照本发明的光纤中的有铝涂覆层的布拉格光栅示意图。
图2是按照本发明的光纤布拉光栅的横截面图，图上示出芯线、镀层和铝护层。
图3是布拉格光栅按照本发明涂护层之前和之后的反射光谱的曲线图。
实施本发明的最佳方式
参看图1，光源10将光信号12提供给分光镜14，预定量的光16通过它进入光纤18。光信号16入射到附加在光纤18芯线上的布拉格光栅20。众所周知，光纤布拉格光栅的反射率变化是周期性的，它反射一段窄的波长光带而让其它波长通过，因此展现一窄波长反射率曲线，如格伦等人在美国专利No.4,725,110中的说明。
光16的一部分22被光栅20反射，其余被波长穿过光栅20成为输出光24。输出光24从光纤18中出来并入射到探测器26上，探测器26向导线28提供一表明入射光24的强度的电信号。同样，反射光22也从光纤18中出来并入射到分光镜14，分光镜14将光22的预定部分(如线30所指出的)反射到探测器32上。探测器32给导线34提供一指示入射光30强度的电信号。此外，光纤光栅20由例如铝质的护层40(镀层的方法在下文讨论)包覆。
现在来参看图2，光纤光栅20的横截面上包括一光纤芯线42，它由渗杂锌基的二氧化硅制成，直径约6-9微米。包围芯线42的是纯二氧化硅制成的镀层44，其外径约为125微米。包围镀层44的是铝的外护层40，其外径约196微米。如果希望，也可给芯线、镀层和护层采用其他的材料和采用不同的直径。
再看图3，我们发现，当光纤光栅用铝那样的材料套上并处于受压状态时，未加护层的典型光栅，其一般的狭窄反射(反射率)曲线100(或滤光性)会发生二种效应。第一，光栅反射率曲线的波长带宽加大，即变宽，由未加护层时的狭光栅曲线100变成加护层后的宽光栅曲线102。第二，反射率曲线的中央反射波长从未加护层时的曲线100的λ1漂移到加护层时的曲线102的较短波长λ2，总波长漂移为Δλs。
波长加宽效应是由于铝护层40给镀层44和芯线42(如线46所示)施加压力或作用力(也叫“微弯曲”)，而使光纤反射率发生微小的不均匀变化所造成的。当铝在玻璃纤维表面冷却下来，晶界上自然会出现这种微小的不均匀性。而且，这种不均匀性还由下列事实所造成，即护层40(图2)套在镀层44的周界(即圆周)上并非完全均匀，因此由护层40施加的压力46也不均匀。此外，由于护层40的厚度沿纵轴或光栅20(图1)的长度方向不完全均匀，所以作用到光栅20上的压力46(图2)沿光栅20长度发生随机变化，因而也造成这种不均匀性。所以，护层沿光栅20的纵轴(也绕光栅圆周)引起随机的压力梯度，它能使反射率有相应的随机变化。特别是，微弯曲破坏了反射率光滑的正弦周期性反射率变化，这产生典型的狭带布拉格光栅的狭反射率曲线。
这种压力梯度及相应的反射率的变化也降低了光栅20的反射效率(即最高反射率)，由于波长反射率曲线的加宽，从未加护层光栅的反射率R1降到加护层光栅的较低反射率R2。
此外，波长漂移Δλs偏离未加护层时的值，是由于光栅上施加的合力的变化引起的。因此，护层作用到光栅的合力越大，波长漂移Δλs越大。
当光栅20周围的护层40被腐蚀时，由护层40所施加的压力减小，因此光栅上的微弯曲程度及合力减小。照这样，当护层完全分离时，光栅回复到其正常的狭反射率曲线，如图3中的曲线100所示，其中央反射波长为λ1。如果护层只有部分分离，即护层仅仅变薄或只在某些地方分离而别处不分离，则相对于未加护层的反射率曲线作相应的变动。有多少分离量才使光栅反射率曲线产生变化，这取决于护层加给光栅的初始力、护层材料的刚性及护层剩余部分的厚度，并且很容易由技术人员确定出来。
如前所述，我们发现波长漂移Δλs是由护层对光栅施加的平均合力引起的，带宽增量是由上述的微弯曲(即作用在光栅上的不均匀力)引起的。因此我们发现，光栅涂敷所用的工艺和护层材料决定了波长漂移量Δλs及反射率曲线变狭量。
因此，如果将光纤浸渍到650℃左右的熔化铝液中然后提取出来，促使它冷却并和光纤表面粘结，从而得到镀铝的光纤时，则光纤和铝的热膨胀系数间的很大差异会使冷却时光纤上作用的合力很大。这种方法叫做“凝固涂敷”。这种情况下由于冷却后光纤圆周及长度上有压缩应变效应，其平均的波长漂移Δλs可以是-4.9nm量级。还有，该方法的光栅反射带宽(例如半峰值宽度值)约增加了3倍或3倍以下，例如有效增量从0.17nm到0.55nm以下。
但是，如果光纤在涂敷过程中处于环境温度下(如喷溅或气相沉积)，则光纤的冷却温度梯度没有像上述浸渍法那么大，因而光纤上作用的平均合力也没有那样大。因而波长漂移Δλs较小。同样，采用该方法时，得到的涂层光滑而均匀。照这样，不均匀力或微弯曲均较小，于是反射带宽变化比上述浸渍法要小。
因此，我们发现，光栅上的平均合力直接与光纤涂敷过程中的温度及涂覆材料的热膨胀系数有关，因此通过调整光栅上的平均合力来控制反射波长漂移量是可能的。而且我们还发现，通过调整光栅上镀层的光洁度和均匀度来控制反射带宽加宽量也是可能的。
应当明白，光源10可以是宽带光源，探测器32可以是光学分光计，它能提供代表波长反射率曲线，即反射波长及相关光强度的电信号34。或者，光源10可以是一在有源波长扫描/查询技术中使用的可变光源，共有未决的美国专利申请系列号NO.08/129,217，题为“光纤光栅传感器的诊断系统”中所描述的光源。
任何其他分析光输出信号30或24的方法(取决于该装置究竟是在反射还是在传输中操作)都可用于探测因腐蚀而引起的光输出信号的变化。但是，传感技术对本发明不是关键。例如，在探测器32和分光镜14之间的光路30上可以放置一光纤光栅60，它与光栅20的反射率曲线匹配，且用上述讨论的使波长漂移最小的技术给光栅20加护层。这时，如果光栅20有护层(且反射率曲线是宽带的)，则反射光22及30也是宽带的。而且，由于光栅60的反射率曲线比入射光30的窄，所以光30的一部分穿过光栅60在探测器32上可以看到。相反，如果光栅20上的护层分离了，则两个光栅20、60的反射率曲线就相匹配，于是无光(或极少)可通到探测器32。
或者，光栅20和60相匹配且有涂层，但只有光栅20可能受到腐蚀，这种情况下，如果无腐蚀则见到最少的光；如果光栅20上的护层腐蚀了，则探测器看到的光最强，这是因为未加护层的光纤反射率更高。
同样应当明白，光栅上的护层分离的一种效应或两种效应，即反射率曲线宽度的改变及中央波长漂移均可用于检测腐蚀情况。
此外，其它材料(非铝)也可用于包围光栅的护层，只要它们会腐蚀、汽化、变薄或以其他方式而使护层局部或完全分离从而降低作用在光栅上的作用力。因此，本发明可用于探测光栅周围护层被局部或全部去除的情况，只要如上讨论地满足光栅上的平均合力和力的不均匀性的预定变化准则。
而且，可以不将镀层涂在全长上，只将光栅部分长度镀上也可。

Claims (14)

1、一种光传感器，包括：
光纤(18)；
插入所说的光纤(18)中的光纤光栅(20)，其入射光反射率曲线有一反射波长带宽；以及
某种材料的护层(40)，其厚度是预定的且沿光纤光栅(20)的长度和周边包覆；
护层(40)沿光纤光栅四周向里施以径向力，从而使光纤光栅(20)的反射率曲线的波长带宽比无此护层(40)时宽；
其特征在于：
当护层(40)至少有一部分分离时，光纤光栅(20)上的作用力减少，从而引起光纤光栅(20)的反射率曲线的波长带宽变窄，这提供了检测护层分离的光学参量。
2、根据权利要求1所述的传感器，其中，光纤(18)包括光纤芯线(42)和包围此芯线(42)的镀层(44)。
3、根据权利要求1所述的传感器，其中，护层施予的作用力不均匀地分布在光纤光栅(20)周围并破坏了光纤光栅反射率的周期性变化，从而使反射率曲线的波长带宽变宽。
4、根据权利要求1所述的传感器，其中，护层施予的作用力也使光纤光栅的峰值反射波长比无此护层时的峰值反射波长偏移一个值，而该波长漂移在护层至少有一部分分离时减少。
5、根据权利要求4所述的传感器，其中，护层沿光纤光栅四周作用一平均合力，从而引起波长漂移。
6、根据权利要求1至5任一项所述的传感器，其中，护层(40)包括铝。
7、根据权利要求1至5中任一项所述的传感器，其中，护层(40)的分离包括护层(40)的腐蚀。
8、一种制造光传感器的方法，它包括：
获得一插有光纤光栅(20)的光学纤维(18)；
沿光纤光栅(20)的周边和长度将护层(40)涂敷到光纤光栅(20)上；
该护层(40)涂到光纤光栅(20)上，结果护层(40)沿光纤光栅四周施加不均匀作用力；
该作用力使光纤光栅(20)的反射率曲线的波长带宽比无此护层(40)时宽；以及
施于光纤光栅(20)的力当护层(40)至少有一部分分离时减小，从而引起光纤光栅(20)的反射率曲线的波长带宽变窄，这提供了检测护层分离的光学参数。
9、根据权利要求8所述的方法，其中：
护层沿光纤光栅四周施以一平均合力，从而使光纤光栅的峰值反射波长比无此护层时的峰值反射波长偏离一个值，该波长漂移在护层至少有一部分分离时减少。
10、根据权利要求8所述的方法，其中，所述护层包括铝。
11、根据权利要求8所述的方法，其中，所述护层涂敷方法包括气相沉积。
12、根据权利要求8所述的方法，其中，所述护层涂敷方法包括凝固熔敷。
13、根据权利要求8所述的方法，其中，所述护层的分离包括护层的腐蚀。
14、一种用于传感器检测护层(40)从光纤(18)分离的方法，它包括：
获得有光纤光栅(20)插在其中的光学纤维(18)；
沿光纤光栅(20)的周边和长度将护层(40)涂敷到该光纤光栅上；
护层(40)施力于光纤光栅(20)，因此护层(40)在光纤光栅(20)的周边和长度上施以不均匀作用力；
该作用力使光纤光栅(20)的反射率曲线上的波长带宽比无此护层时宽；
该光纤光栅(20)上的作用力在护层至少有一部分分离时减小，从而使该光纤光栅反射率曲线上的波长带宽变窄；
提供将光线引入光学纤维(18)的光源(12)；
提供两个探测器(32，26)，以获得被光纤光栅(20)反射或穿过的光线强度的信号指示，从而检测到护层的分离。
CN95196458A 1994-11-29 1995-11-21 光纤布拉格光栅护层分离探测 Expired - Lifetime CN1090317C (zh)

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CN1303418C (zh) * 2004-07-29 2007-03-07 中国船舶重工集团公司第七二五研究所 监测金属腐蚀的沉积膜光纤传感器及其制备方法
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CN102483337B (zh) * 2009-07-16 2015-11-25 哈米德瑞萨·埃洛莫哈迈德 一种光纤传感器及制造方法

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JPH11514432A (ja) 1999-12-07
US20050018945A1 (en) 2005-01-27
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US20030118297A1 (en) 2003-06-26
KR100322430B1 (ko) 2002-03-08
EP0795117B1 (en) 1999-01-27
CN1166872A (zh) 1997-12-03
US6885785B2 (en) 2005-04-26
DK0795117T3 (da) 1999-09-13
GR3029748T3 (en) 1999-06-30
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EP0795117A1 (en) 1997-09-17
DE69507635D1 (de) 1999-03-11

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