CN108957062A - A kind of probe - Google Patents

A kind of probe Download PDF

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Publication number
CN108957062A
CN108957062A CN201811023349.1A CN201811023349A CN108957062A CN 108957062 A CN108957062 A CN 108957062A CN 201811023349 A CN201811023349 A CN 201811023349A CN 108957062 A CN108957062 A CN 108957062A
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CN
China
Prior art keywords
contact
connecting rod
line ear
plastic cement
spring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201811023349.1A
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Chinese (zh)
Other versions
CN108957062B (en
Inventor
郭艳彬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DONGGUAN YINGZHIBAO ELECTRONIC TECHNOLOGY Co Ltd
Original Assignee
DONGGUAN YINGZHIBAO ELECTRONIC TECHNOLOGY Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Priority to CN201811023349.1A priority Critical patent/CN108957062B/en
Publication of CN108957062A publication Critical patent/CN108957062A/en
Application granted granted Critical
Publication of CN108957062B publication Critical patent/CN108957062B/en
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The invention belongs to battery technology fields, more particularly to a kind of probe, including First Line ear (1), plastic cement (2), spring (3), conducting wire (4), connecting rod (5), second line ear (6) and contact (7), the First Line ear (1) is set to the plastic cement (2), the second line ear (6) is set to the contact (7), the plastic cement (2) and the contact (7) are respectively arranged at the both ends of the connecting rod (5), the First Line ear (1) is connect by the conducting wire (4) with the second line ear (6), the connecting rod (5) is placed in the spring (3).Pressure is uniform at work for the probe, is not likely to produce impression, adaptability and stability are strong, and work efficiency is high.

Description

A kind of probe
Technical field
The invention belongs to battery technology field, in particular to a kind of probe.
Background technique
The exploitation of lithium battery and applying just occurred in modern age, and corresponding production equipment also send out by more other traditional industries To open up late more, power battery even more just starts to produce in enormous quantities in recent years, and during production, it needs to fill battery At this moment discharge examination will use probe, for being contacted with mesuring battary.
In the prior art, flexibility is high at work for spininess structure probe, and pressure is uniform, adaptable, not to tab Impression can be generated, internal resistance is big, and temperature increases, and demand contact area is big, shunts;The super-high-current of single needle structure probe, internal resistance is low, temperature Liter is small, and pressure is uneven, is easy to generate impression to tab, causes the fraction defective of product to increase, increase production cost.
In summary, the relevant technologies existing defects are unfavorable for industrial production, it would be highly desirable to perfect.
Summary of the invention
It is an object of the invention to: in view of the deficiencies of the prior art, and a kind of probe is provided, pressure is uniform at work, It is not likely to produce impression, adaptability and stability are strong, and work efficiency is high.
To achieve the above object, the present invention adopts the following technical scheme:
A kind of probe, including First Line ear, plastic cement, spring, conducting wire, connecting rod, the second line ear and contact, the First Line ear are set It is placed in the plastic cement, the second line ear is set to the contact, and the plastic cement and the contact are respectively arranged at the connection The both ends of bar, the First Line ear are connect by the conducting wire with the second line ear, and the connecting rod is placed in the spring. Pressure is uniform at work for the probe, is not likely to produce impression, adaptability and stability are strong, and work efficiency is high.
As a kind of improvement of probe of the present invention, the both ends of the spring can be move freely.Spring is directly sleeved on In connecting rod, this design is so that the freedom degree of spring is bigger.
As a kind of improvement of probe of the present invention, the contact is fixed in the lower end of the spring.This design Be conducive to stability when spring works.
As a kind of improvement of probe of the present invention, the plastic cement is fixed in the upper end of the spring.This design Be conducive to stability when spring works.
As a kind of improvement of probe of the present invention, the First Line ear and the plastic cement by positioning pin and/or Screw is fixedly connected.In addition to this it is possible to be other fixed forms.
As a kind of improvement of probe of the present invention, the bottom of the plastic cement is provided with mounting hole and pilot hole, institute Mounting hole is stated for by the conducting wire, the pilot hole to be used to pass through the connecting rod.The setting of mounting hole and pilot hole increases Integrally-built stability is added.
As a kind of improvement of probe of the present invention, the upper end of the connecting rod is equipped with pyramidal structure, the taper Structure and the pilot hole cooperate.The upper end of connecting rod uses pyramidal structure, allows it to suffer from one's own actions balance, increases stability, keeps Probe is close to tab.
As a kind of improvement of probe of the present invention, the number of the connecting rod is at least 2.This design increases The stability of structure.
As a kind of improvement of probe of the present invention, the cross sectional shape of the contact be it is fan-shaped, semicircle, round and At least one of polygon.Contact uses design, can be according to tab size, shape, free switching contact bottom electricity Pressing type, and can free switching contact shape, to solve super-high-current, internal resistance is small, the low problem of temperature rise.
As a kind of improvement of probe of the present invention, the number for being set to the voltage needle of the contact bottom is at least 1.Probe voltage needle can effectively adapt to tab with 1 or more probe voltage pin position/width with flexible arrangement Various shape, voltage needle can be flexibly set according to actual needs.
Detailed description of the invention
The drawings described herein are used to provide a further understanding of the present invention, constitutes a part of the invention, this hair Bright illustrative embodiments and their description are used to explain the present invention, and are not constituted improper limitations of the present invention.In the accompanying drawings:
One of Fig. 1 is the structural diagram of the present invention;
Fig. 2 is second structural representation of the invention;
Fig. 3 is the present invention in structural schematic diagram when being uncompressed;
Fig. 4 is the present invention in structural schematic diagram when compressing;
Fig. 5 is one of the structural schematic diagram of plastic cement in the present invention;
Fig. 6 is the second structural representation of plastic cement in the present invention;
Fig. 7 is the third structural representation of plastic cement in the present invention;
Fig. 8 is one of the structural schematic diagram of contact in the present invention;
Fig. 9 is the second structural representation of contact in the present invention;
Figure 10 is the third structural representation of contact in the present invention;
Figure 11 is four of the structural schematic diagram of contact in the present invention;
Wherein: 1- First Line ear;2- plastic cement;3- spring;4- conducting wire;5- connecting rod;6- the second line ear;7- contact;8- mounting hole; 9- pilot hole;10- pyramidal structure;11- voltage needle;12- positioning pin;13- screw.
Specific embodiment
As used some vocabulary to censure specific components in the specification and claims.Those skilled in the art answer It is understood that hardware manufacturer may call the same component with different nouns.This specification and claims are not with name The difference of title is as the mode for distinguishing component, but with the difference of component functionally as the criterion of differentiation.Such as logical The "comprising" of piece specification and claim mentioned in is an open language, therefore should be construed to " include but do not limit In "." substantially " refer within an acceptable error range, those skilled in the art can within a certain error range solve described in Technical problem basically reaches the technical effect.
In the description of the present invention, it is to be understood that, term " on ", "lower", "front", "rear", "left", "right", level " The orientation or positional relationship of equal instructions is to be based on the orientation or positional relationship shown in the drawings, be merely for convenience of the description present invention and Simplify description, rather than the device or element of indication or suggestion meaning must have a particular orientation, with specific orientation construction And operation, therefore be not considered as limiting the invention.
In the present invention unless specifically defined or limited otherwise, term " installation ", " connected ", " connection ", " fixation " etc. Term shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or be integrally connected;It can be Mechanical connection, is also possible to be electrically connected;It can be directly connected, two can also be can be indirectly connected through an intermediary Connection inside element.For the ordinary skill in the art, above-mentioned term can be understood at this as the case may be Concrete meaning in invention.
Below in conjunction with attached drawing, invention is further described in detail, but not as a limitation of the invention.
Embodiment 1
As shown in figs. 1-11, a kind of probe, including First Line ear 1, plastic cement 2, spring 3, conducting wire 4, connecting rod 5,6 and of the second line ear Contact 7, First Line ear 1 are set to plastic cement 2, and the second line ear 6 is set to contact 7, and plastic cement 2 and contact 7 are respectively arranged at connecting rod 5 Both ends, First Line ear 1 connect by conducting wire 4 with the second line ear 6, and connecting rod 5 is placed in spring 3.The probe is pressed at work Power is uniform, is not likely to produce impression, adaptability and stability are strong, and work efficiency is high.
Preferably, the both ends of spring 3 can be move freely.Spring 3 is directly sleeved in connecting rod 5, and this design is so that spring 3 Freedom degree it is bigger.
Preferably, First Line ear 1 is fixedly connected with plastic cement 2 by positioning pin 12 and/or screw 13.In addition to this, may be used also To be other fixed forms.
Preferably, the bottom of plastic cement 2 is provided with mounting hole 8 and pilot hole 9, and mounting hole 8 is used for through conducting wire 4, pilot hole 9 For passing through connecting rod 5.The setting of mounting hole 8 and pilot hole 9 increases integrally-built stability.
Preferably, the upper end of connecting rod 5 is equipped with pyramidal structure 10, and pyramidal structure 10 and pilot hole 9 cooperate.Connecting rod 5 Upper end uses pyramidal structure, it is allowed to suffer from one's own actions balance, increases stability, and probe is kept to be close to tab.
Preferably, the number of connecting rod 5 is at least 2.It is this to design the stability for increasing structure.
Preferably, the cross sectional shape of contact 7 is at least one of fan-shaped, semicircle, round and polygon.Contact 7 is adopted , can be according to tab size, shape, 7 bottom voltage needle of free switching contact, 11 type with design, and it can free switching 7 shape of contact, to solve super-high-current, internal resistance is small, the low problem of temperature rise.
Preferably, the number for being set to the voltage needle 11 of 7 bottom of contact is at least 2.Probe voltage needle can with 1 or More probe voltage pin position/width can effectively adapt to the various shape of tab with flexible arrangement, electric according to actual needs Pressing can be flexibly set.
The working principle of the invention is: according to tab size, shape, 7 bottom voltage needle of free switching contact, 11 type, with And can 7 shape of free switching contact, adaptable, at work, voltage needle 11 contacts probe with tab, in the effect of spring 3 Under, pressure is uniform, is not likely to produce impression, and under the action of connecting rod 5, stability is strong.
Embodiment 2
As shown in figs. 1-11, unlike the first embodiment: contact 7 is fixed in the lower end of the spring 3 in the present embodiment.It is this to set In respect of the stability being conducive to when spring 3 works.
Other structures are in the same manner as in Example 1, and which is not described herein again.
Embodiment 3
As shown in figs. 1-11, unlike the first embodiment: plastic cement 2 is fixed in the upper end of the spring 3 in the present embodiment.It is this to set In respect of the stability being conducive to when spring 3 works.
Other structures are in the same manner as in Example 1, and which is not described herein again.
Embodiment 4
As shown in figs. 1-11, as different from Example 2: plastic cement 2 is fixed in the upper end of the spring 3 in the present embodiment.It is this to set In respect of the stability being conducive to when spring 3 works.
Other structures are in the same manner as in Example 2, and which is not described herein again.
Several preferred embodiments of the invention have shown and described in above description, but as previously described, it should be understood that the present invention Be not limited to forms disclosed herein, should not be regarded as an exclusion of other examples, and can be used for various other combinations, Modification and environment, and the above teachings or related fields of technology or knowledge can be passed through within that scope of the inventive concept describe herein It is modified.And changes and modifications made by those skilled in the art do not depart from the spirit and scope of the present invention, then it all should be in this hair In the protection scope of bright appended claims.

Claims (10)

1. a kind of probe, it is characterised in that: including First Line ear (1), plastic cement (2), spring (3), conducting wire (4), connecting rod (5), Second line ear (6) and contact (7), the First Line ear (1) are set to the plastic cement (2), and the second line ear (6) is set to institute It states contact (7), the plastic cement (2) is respectively arranged at the both ends of the connecting rod (5), the First Line ear with the contact (7) (1) it is connect by the conducting wire (4) with the second line ear (6), the connecting rod (5) is placed in the spring (3).
2. a kind of probe according to claim 1, it is characterised in that: the both ends of the spring (3) can be move freely.
3. a kind of probe according to claim 1, it is characterised in that: the contact is fixed in the lower end of the spring (3) (7)。
4. a kind of probe according to claim 1, it is characterised in that: the plastic cement is fixed in the upper end of the spring (3) (2)。
5. a kind of probe according to claim 1, it is characterised in that: the First Line ear (1) passes through with the plastic cement (2) Positioning pin (12) and/or screw (13) are fixedly connected.
6. a kind of probe according to claim 1, it is characterised in that: the bottom of the plastic cement (2) is provided with mounting hole (8) With pilot hole (9), the mounting hole (8) is used for through the conducting wire (4), and the pilot hole (9) is for passing through the connecting rod (5)。
7. a kind of probe according to claim 1, it is characterised in that: the upper end of the connecting rod (5) is equipped with pyramidal structure (10), the pyramidal structure (10) and the pilot hole (9) cooperate.
8. a kind of probe according to claim 1, it is characterised in that: the number of the connecting rod (5) is at least 2.
9. a kind of probe according to claim 1, it is characterised in that: the cross sectional shape of the contact (7) is fan-shaped, semicircle At least one of shape, circle and polygon.
10. a kind of probe according to claim 1, it is characterised in that: be set to the voltage needle of the contact (7) bottom (11) number is at least 1.
CN201811023349.1A 2018-09-04 2018-09-04 Probe Active CN108957062B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201811023349.1A CN108957062B (en) 2018-09-04 2018-09-04 Probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201811023349.1A CN108957062B (en) 2018-09-04 2018-09-04 Probe

Publications (2)

Publication Number Publication Date
CN108957062A true CN108957062A (en) 2018-12-07
CN108957062B CN108957062B (en) 2024-07-23

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201811023349.1A Active CN108957062B (en) 2018-09-04 2018-09-04 Probe

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CN (1) CN108957062B (en)

Citations (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06213927A (en) * 1993-01-19 1994-08-05 Hioki Ee Corp Attaching apparatus and replacing apparatus for probe pin
KR20070075757A (en) * 2006-01-16 2007-07-24 미래산업 주식회사 Apparatus for contacting devices to test sockets in semiconductor test handler
JP2008232778A (en) * 2007-03-20 2008-10-02 Nec Tokin Corp Contact probe
CN202732753U (en) * 2012-08-27 2013-02-13 芜湖宏越机械有限公司 Buffering durable coupler
CN203365492U (en) * 2013-07-26 2013-12-25 英利能源(中国)有限公司 Probe assembly and solar cell module tester possessing same
JP2014048052A (en) * 2012-08-29 2014-03-17 Micronics Japan Co Ltd Probe unit and inspection device
US20140266277A1 (en) * 2013-03-18 2014-09-18 Cheng Yun Technology Co., Ltd. Semiconductor testing probe needle
CN204547946U (en) * 2015-01-15 2015-08-12 雷瑞明 A kind of automobile luggage racks anchor fitting
KR101597484B1 (en) * 2015-01-14 2016-02-24 주식회사 타이스일렉 Probe for testing secondary battery
CN205180190U (en) * 2015-11-03 2016-04-27 国网山东济南市历城区供电公司 Drive bird ware structure and special installation pole thereof
KR20160087286A (en) * 2015-01-13 2016-07-21 주식회사 엘지화학 Probe Used in Charging and Discharging or Test of Secondary Battery
CN206717170U (en) * 2017-05-03 2017-12-08 江苏秉宸科技有限公司 A kind of line wheel list long conical surface location structure of multi-line slicer
US20180011127A1 (en) * 2015-01-06 2018-01-11 Omron Corporation Kelvin probe and kelvin inspection unit provided with same
CN207123549U (en) * 2017-07-27 2018-03-20 东莞市盈之宝电子科技有限公司 One kind test probe
CN207301133U (en) * 2017-08-25 2018-05-01 东莞市盈之宝电子科技有限公司 One kind test probe structure
JP2018133248A (en) * 2017-02-16 2018-08-23 住友重機械搬送システム株式会社 Inspecting device and probe for electric storage device
CN208953580U (en) * 2018-09-04 2019-06-07 东莞市盈之宝电子科技有限公司 A kind of probe

Patent Citations (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06213927A (en) * 1993-01-19 1994-08-05 Hioki Ee Corp Attaching apparatus and replacing apparatus for probe pin
KR20070075757A (en) * 2006-01-16 2007-07-24 미래산업 주식회사 Apparatus for contacting devices to test sockets in semiconductor test handler
JP2008232778A (en) * 2007-03-20 2008-10-02 Nec Tokin Corp Contact probe
CN202732753U (en) * 2012-08-27 2013-02-13 芜湖宏越机械有限公司 Buffering durable coupler
JP2014048052A (en) * 2012-08-29 2014-03-17 Micronics Japan Co Ltd Probe unit and inspection device
US20140266277A1 (en) * 2013-03-18 2014-09-18 Cheng Yun Technology Co., Ltd. Semiconductor testing probe needle
CN203365492U (en) * 2013-07-26 2013-12-25 英利能源(中国)有限公司 Probe assembly and solar cell module tester possessing same
US20180011127A1 (en) * 2015-01-06 2018-01-11 Omron Corporation Kelvin probe and kelvin inspection unit provided with same
KR20160087286A (en) * 2015-01-13 2016-07-21 주식회사 엘지화학 Probe Used in Charging and Discharging or Test of Secondary Battery
KR101597484B1 (en) * 2015-01-14 2016-02-24 주식회사 타이스일렉 Probe for testing secondary battery
CN204547946U (en) * 2015-01-15 2015-08-12 雷瑞明 A kind of automobile luggage racks anchor fitting
CN205180190U (en) * 2015-11-03 2016-04-27 国网山东济南市历城区供电公司 Drive bird ware structure and special installation pole thereof
JP2018133248A (en) * 2017-02-16 2018-08-23 住友重機械搬送システム株式会社 Inspecting device and probe for electric storage device
CN206717170U (en) * 2017-05-03 2017-12-08 江苏秉宸科技有限公司 A kind of line wheel list long conical surface location structure of multi-line slicer
CN207123549U (en) * 2017-07-27 2018-03-20 东莞市盈之宝电子科技有限公司 One kind test probe
CN207301133U (en) * 2017-08-25 2018-05-01 东莞市盈之宝电子科技有限公司 One kind test probe structure
CN208953580U (en) * 2018-09-04 2019-06-07 东莞市盈之宝电子科技有限公司 A kind of probe

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