JP2018133248A - Inspecting device and probe for electric storage device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an inspecting device in which maintenance of a probe is facilitated.SOLUTION: A probe 30 includes: a distal end portion 32 in contact with an electrode of an electric storage device; and a base portion 34 to which the distal end portion 32 is attached. The distal end portion 32 and the base portion 34 are detachable by relatively rotating.SELECTED DRAWING: Figure 3

Description

  The present invention relates to an inspection apparatus for inspecting an electricity storage device such as a secondary battery or a capacitor.

  Rechargeable secondary batteries such as lithium ion batteries and nickel metal hydride batteries, or electric double layer capacitors (hereinafter collectively referred to as energy storage devices) are used in mobile devices, electric vehicles, hybrid vehicles, household energy storage systems, etc. It is used in a wide range of fields, and its importance is increasing more and more in recent years.

  Before the storage device is shipped, it is inspected to check whether it normally functions using an inspection device. FIG. 1 is a diagram showing an inspection apparatus examined by the present inventors. The inspection apparatus 100r includes a power supply unit 102 and an inspection rack 200.

  The electricity storage device 10 is transported and inspected while being accommodated in the tray 2. One tray 2 can accommodate a plurality of power storage devices 10.

  The inspection rack 200 is provided with a plurality of slots 202. The tray 2 on which the electricity storage device 10 is placed is inserted into the slot 202. A probe is provided inside the slot 202 of the inspection rack 200, and this probe is in electrical contact with the electrode of the electricity storage device 10.

  The power supply unit 102 can charge and discharge each of the electricity storage devices 10 accommodated in the inspection rack 200 individually, and thus can inspect a plurality of electricity storage devices 10 in parallel. For example, the power supply unit 102 includes a converter 104 provided for each slot 202. Converter 104 has outputs of a plurality of channels corresponding to a plurality of power storage devices 10 accommodated in corresponding slots 202.

  The stacker crane 4 carries in the tray 2 and inserts the tray 2 into an empty slot of the inspection rack 200. The tray 2 that has been inspected is pulled out of the slot 204 and carried out.

JP2013-149440A JP 2014-155907 A

  FIG. 2 is a diagram showing the electricity storage device 10 and the probe 20. The probe 20 is disposed at a position facing the electrode 12 of the electricity storage device 10. The support frame 22 that supports the probe 20 can be raised and lowered. When measuring the electricity storage device 10, the support frame 22 is lowered and the probe 20 and the electrode 12 are brought into contact with each other.

  There is a problem that the contact resistance between the probe 20 and the electricity storage device 10 increases due to aging deterioration such as oxidation and wear. Therefore, it is necessary to remove the oxidation of the probe by regular maintenance. During the maintenance period, the slot 204 becomes unusable, so the production efficiency decreases.

  The present invention has been made in view of the above problems, and one of the exemplary purposes of an embodiment thereof is to provide an inspection apparatus in which maintenance of a probe is facilitated.

  An aspect of the present invention relates to an inspection apparatus that inspects a plurality of power storage devices, each of which corresponds to a plurality of power storage devices each having a slot into which a tray for accommodating and transporting the plurality of power storage devices is inserted. A plurality of probes in contact with one electrode. The probe includes a distal end portion that comes into contact with the electrode and a base portion to which the distal end portion is attached. The distal end portion and the base portion are detachable by relatively rotating.

  According to this aspect, only the tip portion that is likely to deteriorate can be removed from the base portion, so that only the tip portion can be replaced. The probe is movable in the vertical direction, so if the insertion type or the clamp type is adopted, the tip part is easy to come off, but the tip part and the base part can be detached by inadvertent removal by rotating relatively. It can prevent loosening.

The base portion may have a spring damper structure, and may include a latch structure for switching between a state in which the rod and the cylinder are relatively rotatable and a state in which the rod and the cylinder are locked in the rotation direction.
Thereby, when rotating a tip part in order to attach or detach a tip part, it can prevent that a tip part and a part of base part go around.

  Another aspect of the present invention is also an inspection apparatus. The inspection apparatus includes a slot into which a tray for accommodating and transporting a plurality of power storage devices is inserted, and a plurality of probes each contacting a corresponding electrode of the plurality of power storage devices. The probe includes a tip portion that comes into contact with the electrode, and a base portion to which the tip portion is attached, and the tip portion is screwed to the base portion.

  According to this aspect, it is possible to replace only the distal end portion by making it possible to remove only the distal end portion that is easily deteriorated from the base portion. The probe is movable in the vertical direction and may be detached if it is a plug-in type or a clamp type. However, it is possible to prevent the probe from being inadvertently detached or loosened by screwing the distal end to the base.

  The tip portion and the base portion may have a portion parallel to the surface of the electrode as a main contact surface. At the time of inspection, a force is generated so that the probe is pressed against the electrode of the electricity storage device, and the reaction force can increase the degree of adhesion between the contact surfaces of the tip portion and the base portion of the probe. The “contact surface” may be a part of a certain surface.

  The tip of the probe may be removable at a location accessible to maintenance personnel from the slot entrance.

  Yet another embodiment of the present invention relates to a probe used in an inspection apparatus that inspects a plurality of power storage devices. The probe includes a tip portion that comes into contact with the electrode of the electricity storage device, and a base portion to which the tip portion is attached. The tip part and the base part can be attached and detached by relatively rotating.

  Yet another embodiment of the present invention is also a probe. The probe includes a tip portion that comes into contact with the electrode of the electricity storage device, and a base portion to which the tip portion is attached. The probe includes a tip portion that comes into contact with the electrode, and a base portion to which the tip portion is attached, and the tip portion is screwed to the base portion.

  Yet another embodiment of the present invention is also a probe. The probe includes a tip portion that comes into contact with the electrode of the electricity storage device, and a base portion to which the tip portion is attached. The probe includes a tip portion that contacts the electrode and a base portion to which the tip portion is attached, and the tip portion and the base portion are in contact with each other at a portion parallel to the surface of the electrode.

  Note that any combination of the above-described constituent elements and the constituent elements and expressions of the present invention replaced with each other among methods, apparatuses, systems, and the like are also effective as an aspect of the present invention.

  According to an aspect of the present invention, maintenance of the probe can be facilitated.

It is a figure which shows the inspection apparatus which this inventor examined. It is a figure which shows an electrical storage device and a probe. FIG. 3A is a perspective view of the probe according to the first embodiment, and FIG. 3B is a perspective view of the distal end portion of the probe. It is sectional drawing of the probe of Fig.3 (a). It is a figure explaining the maintenance of a probe. FIGS. 6A and 6B are a cross-sectional view and a perspective view showing the probe according to the second embodiment. 7A and 7B are a perspective view and a cross-sectional view of a probe according to a second modification.

  The present invention will be described below based on preferred embodiments with reference to the drawings. The same or equivalent components, members, and processes shown in the drawings are denoted by the same reference numerals, and repeated descriptions are omitted as appropriate. The embodiments do not limit the invention but are exemplifications, and all features and combinations thereof described in the embodiments are not necessarily essential to the invention.

(First embodiment)
FIG. 3A is a perspective view of the probe according to the first embodiment, and FIG. 3B is a perspective view of the distal end portion of the probe. FIG. 4 is a cross-sectional view of the probe of FIG. As shown in FIG. 2, the probe 30 is used for making electrical contact with the electrode 12 of the electricity storage device 10 in an inspection apparatus.

  The probe 30 includes a distal end portion 32 and a base portion 34. The tip portion 32 is a portion that contacts the electrode 12 of the electricity storage device 10 and is made of a conductive metal. The base 34 is a main body of the probe 30, and the tip 32 is detachably attached to the tip of the base 34. The configuration of the base 34 is not particularly limited, but may have, for example, a spring damper structure, and includes a cylinder 38, a spring 36, and a rod 40. The tip 32 is attached to the bottom surface S1 of the cylinder 38. The terminal 44 is provided for electrical connection with an output of a converter of an inspection device (not shown). The shape of the terminal 44 is not limited, but may be a round terminal into which a banana plug can be inserted, for example. The entire probe 30 is detachable from the inspection device. The terminal 44 is electrically connected to the bottom surface S1 of the cylinder 38. The cylinder 38 and the rod 40 may be formed of a conductive metal. Alternatively, wiring for connecting the terminal 44 and the cylinder 38 may be inserted into the cylinder 38 and the rod 40. Although the shape of the front-end | tip part 32 is not specifically limited, For example, a U-shape may be sufficient.

  The distal end portion 32 and the base portion 34 are detachable by rotating relatively. Moreover, the front-end | tip part 32 and the base part 34 make part (surface) S1, S2 parallel to surface S3 of the electrode 12 of the electrical storage device 10 a main contact surface. In the present embodiment, the bottom surface S1 of the cylinder 38 and the top surface S2 of the tip end portion 32 are parallel to the surface S3 of the electrode 12.

  A threaded portion 33 protrudes from the upper surface S2 of the tip 32 that contacts the bottom surface S1 of the cylinder 38. On the bottom surface side of the cylinder 38, a screw hole 39 having a spiral groove that fits the screw portion 33 is provided.

  In the spring damper, the cylinder 38 is rotatable with respect to the rod 40 during normal use. The base portion 34 includes a latch structure for keeping the rod 40 and the cylinder 38 locked in the rotational direction. The latch structure can prevent the tip 32 and a part of the base 34 (cylinder 38) from rotating when the tip 32 is rotated to attach or detach the tip 32.

  Although the latch structure is not particularly limited, for example, an opening 42 is provided in the cylinder 38, a groove (not shown) is provided in a position overlapping the opening 42 in the rod 40, and a rotation is prevented by inserting a stopper into the opening 42 and the groove. May be.

  The above is the configuration of the probe 30.

  According to this embodiment, it is possible to replace only the distal end portion 32 by making it possible to remove only the distal end portion 32 that is easily deteriorated from the base portion 34. The distal end portion 32 may be disposable, or may be reused after maintenance such as cleaning and polishing.

  When removing the entire probe 30 for maintenance, a large-scale work is required. However, in this embodiment, the probe 30 can be removed simply by rotating the tip portion 32, so the burden of maintenance work can be greatly reduced. .

  It is also conceivable to employ a plug-in type or a clamp type for connecting the tip part 32 and the base part 34. However, since the probe 30 moves up and down in the vertical direction, in these methods, the force generated by the lifting may act in the direction separating the tip portion 32 and the base portion 34. In contrast, in this embodiment, since the tip end portion 32 cannot be removed from the base portion 34 unless it is rotated, it is possible to prevent the tip end portion 32 from being inadvertently detached or loosened due to repeated lifting and lowering.

  In addition, the tip portion 32 and the base portion 34 have the main contact surfaces that are parallel to the surface S3 of the electrode 12 of the electricity storage device 10 (the upper surface S2 of the tip portion 32 and the bottom surface S1 of the cylinder 38). At the time of inspection, a force is generated so that the probe 30 is pressed against the electrode 12 of the power storage device 10, and the reaction force increases the degree of adhesion between the contact surfaces S1 and S2 of the distal end portion 32 and the base portion 34 of the probe 30. Can do.

  Furthermore, electrical contact is realized between the tip 32 and the base 34 (cylinder 38) by fitting the screw 33 and the screw hole 39. As a result, the contact resistance between the distal end portion 32 and the base portion 34 can be further reduced, and there is almost no demerit caused by making the distal end portion 32 detachable.

  FIG. 5 is a diagram for explaining the maintenance of the probe. The deterioration of the tip 32 can be detected by monitoring the contact resistance. For example, by connecting a device for calibration (having a known resistance) instead of the device under test between adjacent probes, and measuring the generated voltage when a known current is supplied between the probes Contact resistance may be acquired. Alternatively, the generated current when a known voltage is applied between the probes may be measured. If the measured contact resistance exceeds the reference threshold, an alert requesting maintenance is displayed.

  The distal end portion 32 of the probe 30 can be removed from the entrance of the slot 202 at a location accessible to the maintenance worker 50. In FIG. 5, the scales of the worker 50 and the inspection rack 200 are shown differently from the actual scale.

  The worker 50 who has recognized the maintenance request rotates and removes the distal end portion 32 of the probe 30_1 having deteriorated. Then, the alternative tip 32 is attached to the probe 30_1 again.

  When removing the entire probe, it is necessary to remove the probe from the support frame 22, and it is also necessary to remove the wiring between the probe and the converter. On the other hand, in this embodiment, the probe 30 does not need to be removed from the support frame 22, and the terminal 44 and the wiring 45 need not be removed. Also in this respect, the probe 30 according to the present embodiment can greatly reduce the maintenance burden.

(Second embodiment)
6A and 6B are a cross-sectional view and a perspective view showing the probe 30 according to the second embodiment. In the first embodiment, the tip portion 32 and the screw portion 33 are integrated, whereas in the second embodiment, the tip portion 32 and the screw 46 are separated. In the second embodiment, when the distal end portion 32 is attached or detached, the screw 46 may be rotated instead of the distal end portion 32. Others are the same as the first embodiment.

  The present invention has been described based on the embodiments. This embodiment is an exemplification, and it will be understood by those skilled in the art that various modifications can be made to combinations of the respective constituent elements and processing processes, and such modifications are within the scope of the present invention. is there. Hereinafter, such modifications will be described.

(First modification)
The shape and structure of the tip portion 32 are not limited to those of the first and second embodiments.

(Second modification)
FIG. 7 is a cross-sectional view of a probe 30 according to a second modification. In this modification, the tip 32 is screwed to the cylinder 38 with a screw 46. The contact surface between the tip 32 and the cylinder 38 is perpendicular to the electrode 12 of the electricity storage device 10. In this modification, the reaction force when the tip portion 32 comes into contact with the electrode 12 is generated in the vertical direction on the paper surface, and thus does not act in the direction of increasing the adhesion between the tip portion 32 and the cylinder 38. Other than that, the same advantages as the first and second embodiments can be enjoyed.

  In the above, this invention was demonstrated based on the Example. It will be understood by those skilled in the art that the present invention is not limited to the above-described embodiment, and various design changes are possible, various modifications are possible, and such modifications are within the scope of the present invention. By the way.

DESCRIPTION OF SYMBOLS 2 ... Tray, 4 ... Stacker crane, 10 ... Electric storage device, 12 ... Electrode, 22 ... Support frame, 30 ... Probe, 32 ... Tip part, 33 ... Screw part, 34 ... Base part, 36 ... Spring, 38 ... Cylinder, 39 DESCRIPTION OF SYMBOLS ... Screw hole, 40 ... Rod, 42 ... Opening, 44 ... Terminal, 46 ... Screw, 100 ... Inspection apparatus, 102 ... Power supply unit, 104 ... Converter, 200 ... Inspection rack, 202 ... Slot.

Claims (10)

An inspection apparatus for inspecting a plurality of power storage devices,
A slot into which a tray for accommodating and transporting a plurality of power storage devices is inserted;
A plurality of probes each contacting a corresponding one electrode of the plurality of power storage devices;
With
The probe includes a tip portion that contacts the electrode and a base portion to which the tip portion is attached, and the tip portion and the base portion are detachable by relatively rotating. Inspection device.   The inspection apparatus according to claim 1, wherein the base portion has a spring damper structure and includes a rotation prevention mechanism so that a part of the base portion does not rotate with the tip portion. An inspection apparatus for inspecting a plurality of power storage devices,
A slot into which a tray for accommodating and transporting a plurality of power storage devices is inserted;
A plurality of probes each contacting a corresponding one electrode of the plurality of power storage devices;
With
2. The inspection apparatus according to claim 1, wherein the probe includes a tip portion that contacts the electrode and a base portion to which the tip portion is attached, and the tip portion is screwed to the base portion.   The inspection apparatus according to claim 1, wherein the tip portion and the base portion have a main contact surface at a portion parallel to the surface of the electrode.   5. The inspection apparatus according to claim 1, wherein the tip of the probe is removable at a location accessible to a maintenance worker from an entrance of the slot. An inspection apparatus for inspecting a plurality of power storage devices,
A slot into which a tray for accommodating and transporting a plurality of power storage devices is inserted;
A plurality of probes each in contact with a corresponding one of the plurality of power storage devices;
With
The probe includes a tip portion that contacts the electrode, and a base portion to which the tip portion is attached, and the tip portion and the base portion have a portion that is parallel to the surface of the electrode as a main contact surface. Inspection equipment. A probe used in an inspection apparatus for inspecting a plurality of power storage devices,
A tip portion in contact with the electrode of the electricity storage device;
A base to which the tip is attached;
With
The probe according to claim 1, wherein the tip and the base are detachable by relatively rotating. A probe used in an inspection apparatus for inspecting a plurality of power storage devices,
A tip portion in contact with the electrode of the electricity storage device;
A base to which the tip is attached;
With
The probe includes a tip portion that contacts the electrode, and a base portion to which the tip portion is attached, and the tip portion is screwed to the base portion.   The probe according to claim 7 or 8, wherein the tip portion and the base portion have a main contact surface at a portion parallel to the surface of the electrode. A probe used in an inspection apparatus for inspecting a plurality of power storage devices,
A tip portion in contact with the electrode of the electricity storage device;
A base to which the tip is attached;
With
The probe includes a tip portion that contacts the electrode, and a base portion to which the tip portion is attached, and the tip portion and the base portion have a portion that is parallel to the surface of the electrode as a main contact surface. Probe.

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