CN108956671B - Special-shaped sample carrying and fixing jig for scanning electron microscope test - Google Patents

Abstract

The invention belongs to the technical field of jigs, and relates to a special-shaped sample carrying and fixing jig for scanning electron microscope test. The adjusting fixture includes a base and an outer frame, a two-way adjusting threaded rod, and a sleeve. The outer frame and the base are designed as a whole. The upper part of the base and the outer frame is an outer frame, and the inner cavity of the outer frame is a wedge-shaped hollow structure. There are two sets of toothed hooks, the upper hooks are tines, the tooth tip interval of the upper hooks is consistent with the maximum width of the special-shaped sample, the lower hooks are square teeth, and the width of the tooth ends of the lower hooks is the same as The minimum width of the profiled samples coincides. The present invention adopts the combination structure of the two-dimensional tooth-shaped fixed outer frame and the threaded top column, which is simple in structure, easy to manufacture, flexible in operation and reliable in use. The invented fixture breaks through the limitation of strict requirements on the size and shape of the sample in the scanning electron microscope test, especially in the field of microscopic observation of aero-engine blades, and has high scientific research application and engineering application value.

Description

Special-shaped sample carrying and fixing jig for scanning electron microscope test

technical field

The invention belongs to the technical field of jigs, and relates to a special-shaped sample carrying and fixing jig for scanning electron microscope test.

Background technique

The main function of the scanning electron microscope is to observe the microscopic morphology of the sample surface and analyze the element or structure of the sample. It is also important to improve the level of tools and spare parts for sample observation.

In aero-engines, blades are listed as the most critical structures in the engine due to the high ambient temperature and complex stress. The performance level of the blades, especially the temperature resistance grade, has become an important symbol of the advanced degree of aero-engines. In the scientific research of aero-engine blades, the frequency of microscopic observation of SEM is high and the task is heavy. However, due to the irregular shape, variety and size of blades and connecting tenons, it is difficult to fix the sample during microscopic observation. In the past, the conventional operation was to wrap the uneven area at the bottom of the tenon teeth with aluminum foil to observe the transverse fracture. If the sample-carrying fixture can fix such irregular samples and prevent the sample from shaking during the test, it can effectively solve the problem of high-power observation by technicians during the test, and obtain more real and good test results. According to the investigation, it is found that the existing sample holding fixture for SEM test does not involve this type. During the traditional operation of wrapping the uneven area at the bottom of the tenon teeth with aluminum foil to observe the transverse fracture, the sample is prone to fretting and the observation effect is not good. Therefore, it is necessary to make this type of fixture.

SUMMARY OF THE INVENTION

The purpose of the present invention is to provide a sample carrying fixture for scanning electron microscope test which can meet the fixing requirements of blade tenon teeth and other irregular samples of the same type.

The technical scheme of the present invention is as follows: the adjusting fixture includes a base and an outer frame, a two-way adjusting threaded rod and a sleeve, the outer frame and the base are designed as one body, the upper part of the base and the outer frame is an outer frame, and the inner cavity of the outer frame is a wedge-shaped hollow Structure, there are two sets of toothed hooks on the inner cavity of the outer frame, the upper hooks are tines, the tooth tips of the upper hooks are consistent with the maximum width of the special-shaped sample, the lower hooks are square teeth, and the lower hooks are square teeth. The interval width of the hook tooth end of the group card is consistent with the minimum width of the special-shaped sample; there are threaded holes on the separation surface of the upper and lower parts of the base and the outer frame. The threaded hole is placed in the inner cavity of the outer frame, the lower end of the bidirectional threaded rod is directly connected with the electron microscope sample stage, and the sleeve is sleeved on the lower part of the base and the outer frame. One group of hooks and the two-way adjusting threaded rod are in three-way contact with the special-shaped sample at the same time.

The special-shaped sample is a blade with tenon teeth.

The inclined surface of the tines of the upper set of hooks is consistent with the inclined surface of the tenon teeth of the blade.

The shape of the tooth end of the lower group of hook teeth is consistent with the shape of the end surface of the blade tenon tooth.

The advantages of the present invention are as follows: the present invention adopts the combination structure of the two-size tooth-shaped fixed outer frame and the threaded top column, which is simple in structure, easy to manufacture, flexible in operation and reliable in use. It can carry samples of different sizes, covering a large number of types and sizes of blades and samples of similar structures, and uses a two-way threaded rod design, one end is screwed to the equipment sample stage, and fixed by a sleeve, and the cooperation is stable and reliable; the inner side of the outer frame of the fixture The tooth-like structure can be matched with blade tenon teeth and other irregular-shaped sample structures, which increases the flexibility of sampling size and sampling shape of the analysis sample. Directly put it into the SEM sample chamber without any damage, and conduct a non-destructive test, and then completely fix the sample through the other end of the threaded top column to avoid the irregular shape of the test sample. , the fixture is stable and reliable during use; after the sample is installed on the sample stage of the equipment, the fixture can be flexibly adjusted through the sleeve to reach the required observation position or height, so as to obtain comprehensive, true and reliable scanning electron microscope observation information and energy spectrum test The fixture of the invention breaks through the limitation of the scanning electron microscope test on the strict requirements on the size and shape of the sample, especially in the field of microscopic observation of aero-engine blades, and has high scientific research application and engineering application value.

Description of drawings

Fig. 1 is the front view of the present invention;

Fig. 2 is the left side view of Fig. 1;

FIG. 3 is a plan view of FIG. 1 .

Detailed ways

The technical solutions of the present invention will be described in detail below with reference to the accompanying drawings.

The adjustment fixture includes a base and an outer frame 1, a two-way adjustment threaded rod 2, and a sleeve 3. The outer frame and the base 1 are designed as a whole. The upper part of the base and the outer frame 1 is an outer frame, and the inner cavity of the outer frame is a wedge-shaped hollow structure. There are two sets of tooth-shaped hooks on the inner cavity of the frame, the hooks of the upper group are tines, the tooth-tip interval of the hooks of the upper group is consistent with the maximum width of the special-shaped sample, the hooks of the lower group are square teeth, and the hooks of the lower group are square teeth. The interval width between the tooth ends of the hook 5 is consistent with the minimum width of the special-shaped sample; the upper and lower parts of the base and the outer frame 1 are separated by a threaded hole 6 with a diameter of φ8mm, and the upper section of the two-way adjustment threaded rod 2 passes through the base and the outer frame 1. The threaded holes on the upper and lower part of the separation surface 6 are placed in the inner cavity of the outer frame, and the lower end of the bidirectional threaded rod 2 is directly screwed and connected to the electron microscope sample stage 7. By adjusting the length of the threaded rod 2 to cooperate with the hook, the diameter of the sleeve 3 φ22mm, which is also threaded with the outer cavity diameter of the sleeve φ26mm. It is sleeved on the lower part of the base and the outer frame 1. The other end of the threaded rod 2 is screwed to the sample stage 7 of the equipment. Slight wobbling of the fixture during the test operation. When the special-shaped sample is installed on the fixture, one group of the two sets of toothed hooks and the two-way adjusting threaded rod are in three-way contact with the special-shaped sample at the same time. The sample can be clamped in three directions by using the hooks of different distances and the adjustment threaded rod.

Example 1

The test sample is a blade with tenon teeth, the shape of the tenon teeth is wedge-shaped, and the maximum width of the tenon teeth is 11.5mm. The hook and the threaded top column clamp the sample in three directions. Finally, put the clamp on the sleeve, adjust the appropriate height, and screw it on the sample holder of the equipment, and then put it into the SEM sample chamber for analysis.

Example 2

The test sample is a blade with tenon teeth, the shape of the tenon teeth is square, and the maximum width dimension of the tenon teeth is 10.5mm. The threaded top column clamps the sample in three directions. Finally, put the clamp on the sleeve, adjust the appropriate height, screw it on the sample holder of the equipment, and then put it into the SEM sample chamber for analysis.

Claims (3)

1. A special-shaped sample bearing and adjusting clamp for a scanning electron microscope test is characterized by comprising a base, an outer frame, a bidirectional adjusting threaded rod and a sleeve, wherein the outer frame and the base are designed integrally, the upper parts of the base and the outer frame are provided with the outer frame, the inner cavity of the outer frame is of a wedge-shaped hollow structure, two groups of toothed hooks are arranged in the inner cavity of the outer frame, the upper group of hooks are sharp teeth, the tooth tip interval of the upper group of hooks is matched with the maximum width of a special-shaped sample, the lower group of hooks are square teeth, and the tooth end interval width of the lower group of hooks is matched with the minimum width of the; the upper and lower part separating surfaces of the base and the outer frame are provided with threaded holes, the upper section of the bidirectional adjusting threaded rod passes through the threaded holes on the upper and lower part separating surfaces of the base and the outer frame and is arranged in the inner cavity of the outer frame, the lower end of the bidirectional adjusting threaded rod is directly screwed and connected with an electron microscope sample stage, the sleeve is sleeved on the lower parts of the base and the outer frame, and when a special-shaped sample is arranged on the clamp, one of the two groups of toothed clamping hooks and the bidirectional adjusting threaded rod are simultaneously in three-way contact with; the special-shaped sample is a blade with tenon teeth.

2. The special-shaped sample bearing and adjusting clamp for the scanning electron microscope test as claimed in claim 1, wherein the inclined plane of the sharp tooth of the upper set of clamping hooks is consistent with the inclined plane of the tenon tooth of the blade.

3. The special-shaped sample bearing and adjusting clamp for the scanning electron microscope test as claimed in claim 1, wherein the shape of the tooth end of the lower set of clamping hooks is consistent with the shape of the tooth end of the blade tenon.

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