CN108872722A - A kind of three-dimensional vector diagram acquisition methods and planar near-field antenna measurement method - Google Patents
A kind of three-dimensional vector diagram acquisition methods and planar near-field antenna measurement method Download PDFInfo
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- CN108872722A CN108872722A CN201810333234.6A CN201810333234A CN108872722A CN 108872722 A CN108872722 A CN 108872722A CN 201810333234 A CN201810333234 A CN 201810333234A CN 108872722 A CN108872722 A CN 108872722A
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
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Abstract
The invention belongs to antenna measurement technical fields, disclose a kind of three-dimensional vector diagram acquisition methods, including：Obtain the subdivision geometrical model of measuring probe；Based on the subdivision geometrical model, it is calculated using high order MoM and surrounds the field distribution on spherical surface near region；Based on the field distribution, pass through the three-dimensional vector diagram for the far field arbitrary point that spherical surface Near-far fields transfer is popped one's head in.The present invention, which provides one kind, to reduce the method for calculation amount in the case where guaranteeing three-dimensional vector diagram precision.
Description
Technical field
The present invention relates to antenna measurement technical field, in particular to a kind of three-dimensional vector diagram acquisition methods and plane
Near field antenna measurements method.
Background technique
The general flow of the near field measurement of antenna is：Antenna to be measured is placed in darkroom, is then arrived apart from antenna 3 to be measured
The close-in electromagnetic field data for obtaining antenna are scanned on one enveloping surface of 10 wavelength with a with known characteristic small probe,
The far-field characteristic of antenna is obtained using Near-far fields transfer algorithm.
It is different according to the shape of the enveloping surface of scanning, near field measurement is generally divided into Planar Near-Field Measurement, cylinder near field is surveyed
Amount and spherical surface near field measurement；And three kinds of measuring techniques require to use complicated probe compensation algorithm by the near field of antenna to be measured
Data are converted to accurate far-field pattern.In order to obtain accurate far-field pattern, probe at measured frequency point three
N dimensional vector n directional diagram must be accurate；The existing method for obtaining three-dimensional vector diagram is probably divided into following several：
(1) three-dimensional figure is gone out using the mouth face approximate calculation of probe；
(2) the two-dimensional directional figure of measurement or simulation calculation probe, then approximation synthesizes three-dimensional figure；
(3) measurement or the certain discrete frequency points of simulation calculation at three-dimensional figure, then at frequency point needed for interpolation calculation
Three-dimensional figure；
(4) the three-dimensional figure popped one's head at any frequency point is obtained using moment method, FInite Element or other numerical methods.
The above method (1) and (2) belong to approximation method, not high in the probe orientation figure precision that any frequency point calculates；Side
Method (3) precision on the certain frequency points for accurately measuring or calculating is very high, but after other frequency points are using interpolation method
Precision is not high；Method (4) calculates the directional diagram of any frequency point using conventional Computational electromagnetics method in real time, and precision is higher, but
It is that calculation amount is huge, speed is slow, is difficult to meet engine request.That is, existing acquisition probe is at measured frequency point
Three-dimensional vector diagram method in the case where meeting measurement accuracy, calculation amount is huge, it is difficult to meet engine request.
Summary of the invention
The present invention provides a kind of three-dimensional vector diagram acquisition methods and planar near-field antenna measurement method, solves existing
In technology in the case where meeting measurement accuracy, the calculation amount of three-dimensional vector diagram of the probe at measured frequency point is obtained
It is huge, it is difficult to the technical issues of meeting engine request.
In order to solve the above technical problems, the present invention provides a kind of three-dimensional vector diagram acquisition methods, including：
Obtain the subdivision geometrical model of measuring probe；
Based on the subdivision geometrical model, it is calculated using high order MoM and surrounds the field distribution on spherical surface near region；
Based on the field distribution, pass through the trivector direction for the far field arbitrary point that spherical surface Near-far fields transfer is popped one's head in
Figure.
Further, it is described using high order MoM calculate its near region surround spherical surface on field distribution include：
Based on Nyquist's theorem, sampled measurements point is chosen on the near region spherical surface of probe to be measured；
Field distribution at the sampled measurements point is calculated using high order MoM.
Further, the field distribution calculated at the sampled measurements point using high order MoM includes：
Using the conducting wire of high-order base function expansion subdivision geometrical model and the current distribution of conductor surface on piece, electromagnetic field is obtained
Integral equation；
Matrix equation, which is converted, by the integral equation solves electric current expansion coefficient；
The field distribution at sampled measurements point is calculated based on the electric current expansion coefficient.
Further, the interval between the adjacent sampled measurements point is less than or equal to 0.5 times of wavelength.
Further, the subdivision geometrical model for obtaining measuring probe includes：
Subdivision is carried out in two mutually orthogonal directions to measuring probe.
Further, when carrying out subdivision, the shape of subdivision dough sheet is rectangle.
Further, wavelength of the side length less than 0.5 times of the subdivision dough sheet.
A kind of probe compensation method, the trivector side popped one's head in based on the three-dimensional vector diagram acquisition methods
It is compensated to measured value of the figure to measuring probe.
A kind of planar near-field antenna measurement method based on the probe compensation method, and executes following steps：
Antenna and measuring probe to be measured are disposed in Planar Near Field Test System；
It is scanned measurement, obtains Near-field Data；
Primary measurement data is converted to using plane near quadrangle subdivision graph algorithm；
The primary measurement data is compensated based on the three-dimensional vector diagram of probe, obtains the far field of antenna to be measured
Directional diagram.
One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages：
Measuring probe subdivision is obtained subdivision geometry by the three-dimensional vector diagram acquisition methods provided in the embodiment of the present application
Model is then calculated subdivision geometrical model by high order MoM and surrounds the field distribution on spherical surface, phase a near region
To conventional electromagnetic calculation method, series is higher, and the number of split surface the piece number and unknown number is substantially reduced, thus in geometric multiple
Calculation amount is reduced, computational efficiency is greatly improved, is suitable for engineer application；And further, pass through ball for near-zone electric fields distribution
Face far to field transformation obtains far field field distribution, so as to avoid the calculating of a large amount of data, so that calculation amount is further reduced, mentions
Rise computational efficiency.
Detailed description of the invention
Fig. 1 is the flow chart provided in an embodiment of the present invention for obtaining three-dimensional vector diagram；
Fig. 2 is measuring probe subdivision geometrical model schematic diagram provided in an embodiment of the present invention；
Fig. 3 is high-order basic function schematic diagram provided in an embodiment of the present invention；
Fig. 4 is the face the E directional diagram of loudspeaker provided in an embodiment of the present invention；
Fig. 5 is the face the H directional diagram of loudspeaker provided in an embodiment of the present invention.
Specific embodiment
The embodiment of the present application is by providing a kind of three-dimensional vector diagram acquisition methods and planar near-field antenna measurement side
Method solves in the prior art in the case where meeting measurement accuracy, obtains trivector side of the probe at measured frequency point
Calculation amount to figure is huge, it is difficult to the technical issues of meeting engine request.
In order to better understand the above technical scheme, in conjunction with appended figures and specific embodiments to upper
It states technical solution to be described in detail, it should be understood that the specific features in the embodiment of the present invention and embodiment are to the application skill
The detailed description of art scheme, rather than the restriction to technical scheme, in the absence of conflict, the embodiment of the present application
And the technical characteristic in embodiment can be combined with each other.
It is high for realizing in the case where guaranteeing precision the present embodiment provides a kind of three-dimensional vector diagram acquisition methods
Effect is quickly obtained three-dimensional vector diagram, to adapt to engineer application.
The acquisition methods specifically include：
Obtain the subdivision geometrical model of measuring probe；
Based on the subdivision geometrical model, it is calculated using high order MoM and surrounds the field distribution on spherical surface near region；
Based on the field distribution, pass through the trivector direction for the far field arbitrary point that spherical surface Near-far fields transfer is popped one's head in
Figure.
Above method step will be described in detail below.
Referring to Fig. 1, obtain the subdivision geometrical model of measuring probe, to measuring probe in two mutually orthogonal directions into
Row subdivision, that is, the usually said direction x and the direction y based on three-dimensional system of coordinate carry out subdivision.
In general, measuring probe needs to be measured with two kinds of polarization directions, typically horizontally and vertical direction,
Therefore it carries out also carrying out two mutually orthogonal directions progress subdivisions when subdivision, to obtain reliable subdivision geometry mould
Type.
Usual subdivision can be realized by software tool, according to measurement frequency, corresponding wavelength be selected to carry out automatic division.
In general, probe is mostly the optical waveguide probe of standard, tactical rule, when carrying out subdivision, using Rectangular Partition, the shape of subdivision dough sheet
Shape is chosen as rectangle, can reduce the quantity of dough sheet to a certain extent, convenient for simplifying subsequent calculating.
The side length of the subdivision dough sheet is less than or equal to 0.5 times of wavelength, so as to guarantee the complete of the model data obtained
Whole property and reliability.
Referring to fig. 2, obtained so that WR187 pops one's head in as an example according to 0.5 times of wavelength subdivision geometrical model；It is regular and complete anti-
The structure feature of probe is answered.
After obtaining complete reliable subdivision geometrical model, carrying out unfolding calculation using high order MoM, it is surrounded near region
Field distribution on spherical surface.
Usually after obtaining specific subdivision geometrical model, setting working frequency and driving source later can be using height
Grade moment method calculates its radiation field.
Referring to Fig. 3, specifically, using the conducting wire of high-order base function expansion subdivision geometrical model and the electricity of conductor surface on piece
The integral equation of electromagnetic field is converted matrix equation by flow distribution, obtains electric current expansion coefficient by solving, and then can calculate
Obtain the electric field that near region surrounds on any discrete point on spherical surface.
It is worth noting that the measuring probe of rule is calculated it using high order MoM and is surrounded on spherical surface near region
Field distribution, specifically can be based on Nyquist's theorem, on the near region spherical surface of probe to be measured choose sampled measurements point；Using height
Rank moment method calculates the field distribution at the sampled measurements point.
Specifically, in the case where meeting Nyquist's theorem and largest interval being maintained at 0.5 times of wavelength, close
Area surrounds on spherical surface and selects discrete point, calculates the near field field distribution of these discrete points.Then pass through spherical surface far to field transformation
Algorithm, the far field field distribution of arbitrary point is calculated.
On the one hand, relative to pure Computational electromagnetics method, speed is faster；On the other hand, relative to directly calculating probe
Three-dimensional vector diagram, due to that by the way of Nyquist's theorem combination Near-far fields transfer, can be in the diminution of geometry grade
The scale of the point of calculating, greatly reduces calculation amount, improves computational efficiency, to adapt to engineer application.
By taking WR187 pops one's head in as an example, when at interval of once taking at one, need to take 360 × 180 points altogether；Opposite, it adopts
With the method for high order MoM combination spherical surface Near-far fields transfer, it is only necessary to calculate meet 36 × 18 of Nyquist's theorem it is discrete
Point calculates duration and reduces 100 times, and calculating speed shortens in geometry grade.Then 360 × 180 are obtained by spherical surface far to field transformation
The far field field distribution of a point.The whole process time is greatly reduced.
In general, multiple discrete frequency points can be selected according to the Measurement bandwidth of probe, is repeated in above method step
Suddenly, the far field three-dimensional vector diagram under the conditions of different frequent points is obtained.
It after obtaining three-dimensional vector diagram, can be directly applied in probe compensation algorithm, be used for antenna measurement
Journey.
Correspondingly, the present embodiment provides a kind of planar near-field antenna measurement method based on above-mentioned backoff algorithm.
Antenna and measuring probe to be measured are disposed in Planar Near Field Test System；
It is scanned measurement, obtains Near-field Data；
Primary measurement data is converted to using plane near quadrangle subdivision graph algorithm；
The primary measurement data is compensated based on the three-dimensional vector diagram of probe, obtains the far field of antenna to be measured
Directional diagram.
Referring to fig. 4 and Fig. 5, illustrate by taking loudspeaker to be measured as an example.
Loudspeaker to be measured and probe to be measured are placed in Planar Near-Field Measurement darkroom, working frequency 5.7Ghz, use is above-mentioned
The loudspeaker that compensation method obtains are compareed the directional diagram in the face E and the face H and standard results.It can be found that it is almost consistent, most
Big error is less than 0.3dB.
One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages：
Measuring probe subdivision is obtained subdivision geometry by the three-dimensional vector diagram acquisition methods provided in the embodiment of the present application
Model is then calculated subdivision geometrical model by high order MoM and surrounds the field distribution on spherical surface, phase a near region
To conventional electromagnetic calculation method, series is higher, and the number of split surface the piece number and unknown number is substantially reduced, thus in geometric multiple
Calculation amount is reduced, computational efficiency is greatly improved, is suitable for engineer application；And further, pass through ball for near-zone electric fields distribution
Face far to field transformation obtains far field field distribution, so as to avoid the calculating of a large amount of data, so that calculation amount is further reduced, mentions
Rise computational efficiency.
It should be noted last that the above specific embodiment is only used to illustrate the technical scheme of the present invention and not to limit it,
Although being described the invention in detail referring to example, those skilled in the art should understand that, it can be to the present invention
Technical solution be modified or replaced equivalently, without departing from the spirit and scope of the technical solution of the present invention, should all cover
In the scope of the claims of the present invention.
Claims (9)
1. a kind of three-dimensional vector diagram acquisition methods, which is characterized in that including：
Obtain the subdivision geometrical model of measuring probe；
Based on the subdivision geometrical model, it is calculated using high order MoM and surrounds the field distribution on spherical surface near region；
Based on the field distribution, using the three-dimensional vector diagram for the far field arbitrary point that spherical surface Near-far fields transfer is popped one's head in.
2. three-dimensional vector diagram acquisition methods as described in claim 1, which is characterized in that described to use high order MoM meter
It, which is calculated, in the field distribution that near region surrounds on spherical surface includes：
Based on Nyquist's theorem, sampled measurements point is chosen on the near region spherical surface of probe to be measured；
Field distribution at the sampled measurements point is calculated using high order MoM.
3. three-dimensional vector diagram acquisition methods as claimed in claim 2, which is characterized in that described to use high order MoM meter
Calculating the field distribution at the sampled measurements point includes：
Using the conducting wire of high-order base function expansion subdivision geometrical model and the current distribution of conductor surface on piece, the product of electromagnetic field is obtained
Divide equation；
Matrix equation, which is converted, by the integral equation solves electric current expansion coefficient；
The field distribution at sampled measurements point is calculated based on the electric current expansion coefficient.
4. three-dimensional vector diagram acquisition methods as claimed in claim 2, which is characterized in that the adjacent sampled measurements point
Between interval be less than or equal to 0.5 times of wavelength.
5. three-dimensional vector diagram acquisition methods as described in claim 1, which is characterized in that described to obtain cuing open for measuring probe
Point geometrical model includes：
Subdivision is carried out in two mutually orthogonal directions to measuring probe.
6. three-dimensional vector diagram acquisition methods as claimed in claim 5, it is characterised in that：When carrying out subdivision, subdivision dough sheet
Shape be rectangle.
7. three-dimensional vector diagram acquisition methods as claimed in claim 6, it is characterised in that：The side length of the subdivision dough sheet is small
In 0.5 times of wavelength.
8. a kind of probe compensation method, it is characterised in that：Based on the described in any item three-dimensional vector diagrams of claim 1~7
The three-dimensional vector diagram that acquisition methods are popped one's head in compensates the measured value of measuring probe.
9. a kind of planar near-field antenna measurement method, which is characterized in that it is based on probe compensation method according to any one of claims 8, and
Execute following steps：
Antenna and measuring probe to be measured are disposed in Planar Near Field Test System；
It is scanned measurement, obtains Near-field Data；
Primary measurement data is converted to using plane near quadrangle subdivision graph algorithm；
The primary measurement data is compensated based on the three-dimensional vector diagram of probe, obtains the far field direction of antenna to be measured
Figure.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113128090A (en) * | 2021-04-21 | 2021-07-16 | 北京航空航天大学 | Waveguide mode excitation method based on moment method, storage medium and device |
| CN113435069A (en) * | 2021-08-27 | 2021-09-24 | 湖南卫导信息科技有限公司 | Antenna directional pattern simulation method, device and equipment for satellite navigation simulation |
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Cited By (3)
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| CN113128090A (en) * | 2021-04-21 | 2021-07-16 | 北京航空航天大学 | Waveguide mode excitation method based on moment method, storage medium and device |
| CN113128090B (en) * | 2021-04-21 | 2021-09-10 | 北京航空航天大学 | Waveguide mode excitation method based on moment method, storage medium and device |
| CN113435069A (en) * | 2021-08-27 | 2021-09-24 | 湖南卫导信息科技有限公司 | Antenna directional pattern simulation method, device and equipment for satellite navigation simulation |
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