CN108766503A - A kind of test equipment for fixing SD card using vacuum cup - Google Patents
A kind of test equipment for fixing SD card using vacuum cup Download PDFInfo
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- CN108766503A CN108766503A CN201810567555.2A CN201810567555A CN108766503A CN 108766503 A CN108766503 A CN 108766503A CN 201810567555 A CN201810567555 A CN 201810567555A CN 108766503 A CN108766503 A CN 108766503A
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- 238000012360 testing method Methods 0.000 title claims abstract description 125
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 22
- 239000000758 substrate Substances 0.000 claims description 12
- 230000011664 signaling Effects 0.000 claims description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052802 copper Inorganic materials 0.000 claims description 4
- 239000010949 copper Substances 0.000 claims description 4
- 230000006835 compression Effects 0.000 claims description 3
- 238000007906 compression Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 22
- 101000785712 Homo sapiens Zinc finger protein 282 Proteins 0.000 description 11
- 102100026417 Zinc finger protein 282 Human genes 0.000 description 11
- 230000009977 dual effect Effects 0.000 description 3
- 239000003990 capacitor Substances 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000011990 functional testing Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a kind of test equipments for fixing SD card using vacuum cup, the test equipment of the SD card places SD card using vacuum cup, the exhausting hole way being arranged on vacuum cup can suck SD card, when servo motor depresses platen, platen compresses SD card, double end testing needle is pressed downward by SD card, after double end testing needle is pressed down, its lower end and contact terminal contact, contact terminal contact is by testing backplane circuit connecting test slot, test socket is plugged with SD card test pcb board, the test circuit tested on pcb board by SD card tests each SD, and corresponding test result is shown on a display screen, position corresponding with SD card putting groove unit is provided on display screen, when the underproof SD card of appearance, it can be shown with special color.The present invention can improve the testing efficiency of SD card, while test accurately.
Description
Technical field
The present invention relates to test equipments, particularly relate to a kind of test equipment for fixing SD card using vacuum cup.
Background technology
It is to meet safety, capacity, performance and use environment etc. that SD card (SecureDigitalMemoryCard), which is a kind of,
The demand of various aspects and a kind of novel memory devices part designed.Most of SD card functional test of current embedded platform uses
Video playing, read and write rate etc. in the method for manual testing, the i.e. plug of manual operation SD card, card, inefficiency, and very
The comprehensive error scene of hardly possible covering.Test is more also realized using relay platform, but this test needs additionally hard
Part equipment, and these hardware devices can not simulate all scenes of the SD card when actually reading and writing, thus can not be covered in test
SD card all scenes when in use and this test are also inadequate to the test pressure of SD card.
Invention content
For deficiency in the prior art, the technical problem to be solved in the present invention is the provision of a kind of using vacuum cup
The test equipment of fixed SD card.
In order to solve the above technical problems, the present invention is realized by following scheme：It is a kind of that SD card is fixed using vacuum cup
Test equipment, which includes tester table pedestal, the holder that is set on the tester table pedestal, is set to institute
The platen stated the servo motor of holder side, be set to the servo motor driven portion further includes under being set to the platen just
Side, the vacuum cup component for loading SD card being fixed on the tester table pedestal, and it is set to the test machine
Platform pedestal upper end and be placed in the holder rear test bottom plate, air plug in it is described test bottom plate on SD card test pcb board；
The vacuum cup component includes the vacuum cup fixed plate being fixed on the tester table pedestal and is set to described
The vacuum cup of vacuum cup dead plate upper end, the vacuum cup are provided with for loading SD card, by multiple SD card putting grooves
The SD card putting groove array of unit composition, the SD card putting groove unit are provided with for the SD card to be sucked fixed pumping
Kong Lu and the matched terminal hole position of the SD card terminal, tool is provided between the terminal hole position and the tester table pedestal
There are double end testing needle of the Telescopic for on-off circuit, the vacuum cup fixed plate to be provided with and the double end testing needle one
One corresponding contact terminal contact；
It is provided with microsd on the test bottom plate and turns usb protocol circuit, is provided with multigroup test socket, the test
It is plugged with SD card test pcb board on slot, SD card test pcb board, which is provided with, several can test corresponding SD card putting groove list
The test circuit unit of SD card in member.
Further, the support vertical is fixed on the tester table pedestal, the horizontal side plate leading flank of the upper end
Servo motor is fixed, the guide plate of horizontal side plate described in right angle setting is provided on horizontal side plate, the guide plate is provided with 2 and leads
Hole, 2 guide rods are set on guide hole, and the upper end is connected separately with the both ends of horizontal holder, and the horizontal support level is fixed on
On the upside of the back side of horizontal side plate, the servo motor telescopic rod connects platen, and 2 lower end of the guide rod are fixed on the platen
On rear side of upper surface.
Further, the double end testing needle include the housing of upper lower through-hole, the conductive rod that is set in the housing,
Housing upper end aperture is provided with the cylindrical cavity more larger than through-hole diameter, the conductive rod in the cylindrical cavity be provided with flange collar and
Ring plug is arranged in the spring being placed on conductive rod, the openings, and flange collar is blocked by ring plug, and the spring one end is against annular
Beyond the Great Wall, the other end is against at cylindrical cavity step, and spring is compressed spring, conductive rod is held out against in ring plug, again when being pressurized
Compression forms elastic force downwards.
Further, the conductive rod upper end be it is pointed and be exposed to it is outer put on openings, lower end is exposed under housing
Openings, the conductive rod upper end are placed on terminal hole position and expose a distance outside terminal hole position, and the conductive rod exists
When not by external force, lower end is provided with spacing with the contact terminal contact in vacuum cup fixed plate.
Further, it is set on every layer signal line pcb board at least provided with 2 layer signal line pcb boards on the test bottom plate
It is equipped between each signaling line circuit of signaling line circuit and is provided with anti-interference layer, the microsd turns usb protocol circuit and is provided with
Microsd turns usb protocol processor chips.
Further, the anti-interference layer is to cover copper to be grounded anti-interference layer.
Further, the signal wire pcb board is provided with eight layers.
Further, the vacuum cup include sucker substrate, the SD card putting groove array that is set on sucker substrate, institute
It states SD card putting groove array and is shaped as array by multiple SD card putting groove unit groups.
Further, the vacuum cup fixed plate includes fixed plate substrate and the contact jaw that is set on fixed plate substrate
Sub- contact array, the contact terminal contact array include several contact terminal contact point units, the contact terminal contact point unit
On each contact and double end testing needle correspond, bottom end circuit is connected to the circuit on the test bottom plate.
Further, the test circuit unit is provided with microsd and turns usb protocol bridgt circuit.
Compared with the existing technology, the beneficial effects of the invention are as follows：The test equipment of SD card of the present invention is put using vacuum cup
SD card is set, the exhausting hole way being arranged on vacuum cup can suck SD card, and when servo motor depresses platen, platen is by SD card
It compressing, double end testing needle is pressed downward by SD card, after double end testing needle is pressed down, lower end and contact terminal contact, contact
Terminal contact is plugged with SD card test pcb board, is tested by SD card by testing backplane circuit connecting test slot, test socket
Test circuit on pcb board tests each SD, and corresponding test result is shown on a display screen, is arranged on display screen
There is position corresponding with SD card putting groove unit, when there is underproof SD card, can be shown with special color.The present invention can
The testing efficiency of SD card is improved, while being tested accurately.
Description of the drawings
Fig. 1 is test equipment contour structures stereogram of the present invention；
Fig. 2 is test equipment side elevation view structural schematic diagram of the present invention；
Fig. 3 is test equipment main-vision surface structural schematic diagram of the present invention；
Fig. 4 is double end testing needle structural schematic diagram of the present invention；
Fig. 5 is vacuum cup structural schematic diagram of the present invention；
Fig. 6 is vacuum cup fixed plate structure schematic diagram of the present invention；
Fig. 7 is vacuum cup component of the present invention and test bottom plate positional structure schematic diagram；
Fig. 8 corresponds to the circuit diagram of SD card for the double end testing needle on SD card putting groove unit of the present invention；
Fig. 9 is the circuit diagram being connect with the VCC33 terminal circuits in Fig. 8 that the present invention is set on test bottom plate；
Figure 10 is that each terminal of test socket of the present invention is correspondingly connected with circuit diagram；
Figure 11 is that the copper that covers of eight layer signal line pcb boards of the invention is grounded anti-interference layer structural schematic diagram；
Figure 12 is the vertical view of Figure 11；
Figure 13 is the test circuit cell distribution schematic diagram of SD card；
Figure 14 is the main control chip circuit of the test circuit unit of SD card；
Figure 15 is the USB circuit being connect with main control chip；
Figure 16 is the circuit diagram being connect with main control chip XSCO HUB1 feet, XSC1 HUB1 feet；
Figure 17 is the circuit diagram being connect with main control chip SUSPEND HUB1 feet；
Figure 18 is the circuit diagram being connect with main control chip RST HUB1 feet；
Figure 19 is the circuit diagram being connect with main control chip SEL27 feet and the ends VCC5；
Figure 20 is the circuit diagram being connect with 20 feet of main control chip AVDD, 25 feet of SEL48；
Figure 21 is the circuit diagram being connect with main control chip HUB1 DP1 DM feet and HUB1 DP1 DP feet；
Figure 22 is the circuit diagram being connect with the VCC5_HUB1 in the ends main control chip VCC5, Figure 21 circuits；
Figure 23 is that microsd turns usb protocol bridgt circuit figure；
Figure 24 is the upside circuit diagram of Figure 22；
Figure 25 is the left side circuit diagram of Figure 22；
Figure 26 is the right side circuit diagram of Figure 22；
Figure 27 is the underside circuits figure of Figure 22；
The test circuit figure that Figure 28 is connect with main control chip.
Specific implementation mode
The preferred embodiment of the present invention is described in detail below in conjunction with the accompanying drawings, so that advantages and features of the invention energy
It is easier to be readily appreciated by one skilled in the art, so as to make a clearer definition of the protection scope of the present invention.
Please refer to attached drawing 1-12, a kind of test equipment for fixing SD card using vacuum cup of the invention, the test equipment
Including tester table pedestal 1, the holder 3 being set on the tester table pedestal 1, the servo for being set to 3 side of the holder
Motor 4, the platen 5 for being set to 4 driving portion of the servo motor, further include be set to immediately below the platen 5, be fixed on it is described
On tester table pedestal 1 for loading the vacuum cup component of SD card, and be set to 1 upper end of tester table pedestal and
It is placed in the test bottom plate 2 at 3 rear of the holder, air plug tests pcb board 8 in the SD card on the test bottom plate 2；
The vacuum cup component 6 includes the vacuum cup fixed plate 61 being fixed on the tester table pedestal 1 and is set to
The vacuum cup 62 of 61 upper end of vacuum cup fixed plate, the vacuum cup 62 are provided with for loading SD card, by multiple
The SD card putting groove array 63 of SD card putting groove unit composition, the SD card putting groove unit are provided with for inhaling the SD card
The exhausting hole way 65 fastened and the matched terminal hole position 64 of the SD card terminal, the terminal hole position and the tester table
The double end testing needle 66 that on-off circuit is used for Telescopic is provided between pedestal 1, the vacuum cup fixed plate 61 is set
It is equipped with and 66 one-to-one contact terminal contact of the double end testing needle；
It is provided with microsd on the test bottom plate 2 and turns usb protocol circuit 101, is provided with multigroup test socket 21, institute
It states and is plugged with SD card test pcb board 8 on test socket 21, SD card test pcb board 8, which is provided with, several can test corresponding SD
The test circuit unit 100 of SD card on card putting groove unit.
A kind of optimal technical scheme of the present embodiment：The holder 3 is perpendicularly fixed on the tester table pedestal 1,
The horizontal side plate leading flank of upper end fixes servo motor 4, and leading for horizontal side plate described in right angle setting is provided on horizontal side plate
Plate 9, the guide plate 9 are provided with 2 guide holes, and 2 guide rods 10 are set on guide hole, and the upper end is connected separately with the two of horizontal holder
End, the horizontal support level are fixed on the upside of the back side of horizontal side plate, and 4 telescopic rod of the servo motor connects platen 5, described
2 10 lower ends of guide rod are fixed on rear side of the upper surface of the platen 5.
A kind of optimal technical scheme of the present embodiment：The double end testing needle 66 includes the housing 25 of upper lower through-hole, setting
In the conductive rod 21 in the housing 25,25 upper end aperture of the housing is provided with the cylindrical cavity more larger than through-hole diameter,
Ring plug is arranged in the spring 24 that conductive rod 21 in the cylindrical cavity is provided with flange collar 22 and is placed on conductive rod, the openings,
Flange collar 22 is blocked by ring plug, and 24 one end of the spring is against on ring plug, and the other end is against at cylindrical cavity step, and spring is pressure
Contracting spring holds out against conductive rod in ring plug, and when being pressurized, compression forms elastic force still further below.
A kind of optimal technical scheme of the present embodiment：21 upper end of the conductive rod is pointed and is exposed to through-hole on housing 25
Mouthful, lower end is exposed to housing lower through-hole mouth, and 21 upper end of the conductive rod is placed on terminal hole position and exposes a distance in end
Outside sub-aperture position, the conductive rod 21 is not when by external force, lower end and the contact terminal contact in vacuum cup fixed plate 61
It is provided with spacing.
A kind of optimal technical scheme of the present embodiment：At least provided with 2 layer signal line pcb boards on the test bottom plate 2,
It is provided on per layer signal line pcb board between 31 each signaling line circuit 31 of signaling line circuit and is provided with anti-interference layer 32, it is described
Microsd turns usb protocol circuit 101 and is provided with microsd to turn usb protocol processor chips.
A kind of optimal technical scheme of the present embodiment：The anti-interference layer 32 is to cover copper to be grounded anti-interference layer.
A kind of optimal technical scheme of the present embodiment：The signal wire pcb board is provided with eight layers.
A kind of optimal technical scheme of the present embodiment：The vacuum cup 62 includes sucker substrate, is set to sucker substrate
On SD card putting groove array 63, the SD card putting groove array 63 is shaped as array by multiple SD card putting groove unit groups.
A kind of optimal technical scheme of the present embodiment：The vacuum cup fixed plate 61 includes fixed plate substrate 67 and setting
In the contact terminal contact array on fixed plate substrate 67, the contact terminal contact array includes that several contact terminal contacts are single
Member, each contact in the contact terminal contact point unit are corresponded with double end testing needle 66, and bottom end circuit is connected to described
Test the circuit on bottom plate 2.
A kind of optimal technical scheme of the present embodiment：The test circuit unit 100 is provided with microsd and turns usb protocol
Bridgt circuit 200.
In the present embodiment, it is provided with emergency button on tester table pedestal 1 and is set to the double of emergency button left and right sides
Operate the starting switch 7 of shutdown switch and dual operation.
The test equipment of SD card of the present invention places SD card using vacuum cup, after SD card is placed on SD card putting groove unit,
Its downward metal terminal need to be directed at terminal hole position 64, first, by taking out air, enable the exhausting hole way being arranged on vacuum cup
Enough to suck SD card, then both hands press the starting switch of dual operation simultaneously, and servo motor 4 works, and depresses and presses when servo motor 4
When disk, platen compresses SD card, and double end testing needle 66 is pressed downward by SD card, after double end testing needle is pressed down, lower end with contact
Terminal contact contacts, and contact terminal contact is plugged with SD card test by testing backplane circuit connecting test slot, test socket
Pcb board, the test circuit tested on pcb board by SD card test each SD, and include aobvious by corresponding test result
Position corresponding with SD card putting groove unit is provided in display screen, on display screen, it, can be with special when there is underproof SD card
Color is shown.The present invention can improve the testing efficiency of SD card, while test accurately.
After the completion of test, both hands press dual operation shutdown switch simultaneously, and servo motor reversion makes platen rise, then
Unqualified SD card is taken out, another vacuum cup for being already filled with SD is quickly changed.
Figure 13-28 is elaborated below according to accompanying drawing content：
Figure 13 is the test circuit cell distribution schematic diagram of SD card, and the test circuit list of eight groups of SD cards is provided on this plate body
Member.
Figure 14 is the main control chip circuit of the test circuit unit of SD card, which is GL850G master control cores
Piece, each pin connection circuit are as follows：
V33 feet connect the anode of a polarized capacitance C2, the cathode ground connection of polarized capacitance C2, in V33 feet and polarized capacitance
D3.3V_HUB1 Wiring ports are connected on circuit node between C2；
V5 feet connect the anode of resistance R1, polarized capacitance C1, another ports termination VCC5 resistance R1, the ports VCC5 connection figure 19
In circuit, polarized capacitance C1 cathode ground connection；
SEL27 feet connect the ports D3.3V_HUB1, the circuit in the ports the D3.3V_HUB1 connection figure 19, and the ports VCC5 connect voltage stabilizing
The ends IN of device ELM88331BA, the ports D3.3V_HUB1 connect the OUT terminal of voltage-stablizer ELM88331BA, voltage-stablizer ELM88331BA
The ends GND ground connection, capacitance C8 is connected between the ends GND and OUT terminal.
OVCUR1# feet connect the ports OVCUR HUB1；
PGANG feet connect the ports SUSPEND HUB1, and the circuit connection of the ports SUSPEND HUB1 and Figure 17 are connected with resistance
R8, resistance R9, the cathode of the other end connection light emitting diode D2 of resistance R9, the anode connection of resistance R8, light emitting diode D2
In main control chip D3.3V_HUB1 feet（Main control chip D3.3V_HUB1 feet herein are 37 feet of main control chip）；
33 feet of DVDD connect D3.3V_HUB1 feet；
26 feet of RESET# are the ports RST HUB1, and 18 circuit of connection figure, the ports RST HUB1 connect resistance R19, resistance R19
The other end be separately connected capacitance C9, resistance R16, resistance R21, the capacitance C9, the resistance R21 other ends are grounded respectively, described
The other end of resistance R16 connects CMOS logic IC, and CMOS logic IC is ELM7S08, the 2 feet connection master of the CMOS logic IC
Control chip VBUS_HUB1 ends, 1 foot connects the ends main control chip VCC5, and 5 feet connect the cathode of diode D3, diode D4
Cathode, the positive terminal access main control chip VCC5 ends of the diode D3, the diode D4 positive terminals be connected with resistance R10,
The other end of main control chip VBUS_HUB1, resistance R10 are grounded；
21 circuit of 6 feet of DP1 and 5 foot connection figures of DM1, Figure 21 circuits are USB circuit, and the ends D+ and D- of the USB circuit connect respectively
21 foot of 22 feet of DP4 and DM4 is connect, the ends VBUS are connected with the anode of polar capacitor C24, the ports main control chip VCC5_HUB1, have
The cathode of polar capacitor C24 is grounded, the ends the GND ground connection of the USB circuit, and the both sides USB are provided with AGND4 circuits, AGND4 electricity
It is connected with BEAD_120 inductance between the ends GND on road and USB；
19 feet of AVDD connect the ports A3.3V_HUB1；Circuit in the ports the A3.3V_HUB1 connection figure 20, the ports A3.3V_HUB1
It is connected with 0_NC inductance L2 between the ports main control chip D3.3V_HUB1, and connects between the ports A3.3V_HUB1 and ground terminal
Five capacitances in parallel are connected to, there are four capacitances for connection between the ports D3.3V_HUB1 and ground terminal；
Circuit in XSCO_HUB1 feet and XSC1_HUB1 feet connection figure 16, XSCO_HUB1 feet and XSC1_HUB1 feet are separately connected
The both ends of crystal oscillator, and two capacitances are connected between the both ends of crystal oscillator, it is grounded on the circuit node between two capacitances；
RREF feet connect resistance R11, the other end ground connection of resistance R11；
The ends main control chip VCC5 are connected with resistance R2, and the other end of resistance R2 connects fuse F1, the connection of the fuse F1 other ends
Resistance R3, the resistance R3 other ends connect resistance R6, resistance R6 other ends ground connection, the circuit between resistance R3 and resistance R6 circuits
The ports main control chip OVCUR_HUB1 are connected on node, and master control core is connected on the circuit node between base resistance R3 and fuse F1
The ports piece VCC5_HUB1.
Figure 23 to Figure 28 turns usb protocol bridgt circuit figure for the microsd of the present invention and is sentenced by the detection to SD card
Whether the function of disconnected SD card is perfect, and if reach professional standard, green light can be shown in the corresponding position of display screen after detection is qualified,
If it is unqualified can be shown in the corresponding position of display screen it is unqualified.
The foregoing is merely the preferred embodiment of the present invention, are not intended to limit the scope of the invention, every profit
The equivalent structure or equivalent flow shift made by description of the invention and accompanying drawing content is applied directly or indirectly in other phases
The technical field of pass, is included within the scope of the present invention.
Claims (10)
1. a kind of test equipment for fixing SD card using vacuum cup, which includes tester table pedestal（1）, be set to
The tester table pedestal（1）On holder（3）, be set to the holder（3）The servo motor of side（4）, be set to it is described
Servo motor（4）The platen of driving portion（5）, it is characterised in that：Further include being set to the platen（5）Underface is fixed on institute
State tester table pedestal（1）On for loading the vacuum cup component of SD card, and be set to the tester table pedestal（1）
Upper end and it is placed in the holder（3）The test bottom plate at rear（2）, air plug is in the test bottom plate（2）On SD card test pcb board
（8）；
The vacuum cup component（6）Including being fixed on the tester table pedestal（1）On vacuum cup fixed plate（61）And
It is set to the vacuum cup fixed plate（61）The vacuum cup of upper end（62）, the vacuum cup（62）It is provided with for loading
SD card, the SD card putting groove array being made of multiple SD card putting groove units（63）, the SD card putting groove unit is arranged useful
In the SD card is sucked fixed exhausting hole way（65）And the matched terminal hole position of the SD card terminal（64）, the terminal
Tester table pedestal described in Kong Weiyu（1）Between be provided with Telescopic be used for on-off circuit double end testing needle（66）,
The vacuum cup fixed plate（61）It is provided with and the double end testing needle（66）One-to-one contact terminal contact；
The test bottom plate（2）On be provided with microsd and turn usb protocol circuit（101）, it is provided with multigroup test socket
（21）, the test socket（21）On be plugged with SD card test pcb board（8）, the SD card test pcb board（8）It is provided with several
The test circuit unit of the SD card on corresponding SD card putting groove unit can be tested（100）.
2. a kind of test equipment for fixing SD card using vacuum cup according to claim 1, it is characterised in that：The branch
Frame（3）It is perpendicularly fixed at the tester table pedestal（1）On, the horizontal side plate leading flank of the upper end fixes servo motor（4）,
The guide plate of horizontal side plate described in right angle setting is provided on horizontal side plate（9）, the guide plate（9）2 guide holes are provided with, 2 are led
Bar（10）It is set on guide hole, the upper end is connected separately with the both ends of horizontal holder, and the horizontal support level is fixed on level
On the upside of the back side of side plate, the servo motor（4）Telescopic rod connects platen（5）, 2 guide rods（10）Lower end is fixed on described
Platen（5）Upper surface on rear side of.
3. a kind of test equipment for fixing SD card using vacuum cup according to claim 1, it is characterised in that：It is described double
Head testing needle（66）Include the housing of upper lower through-hole（25）, be set to the housing（25）Interior conductive rod（21）, described outer
Set（25）Upper end aperture is provided with the cylindrical cavity more larger than through-hole diameter, the conductive rod in the cylindrical cavity（21）It is provided with flange collar
（22）With the spring being placed on conductive rod（24）, the openings setting ring plug, flange collar（22）It is blocked by ring plug, the bullet
Spring（24）One end is against on ring plug, and the other end is against at cylindrical cavity step, and spring is compressed spring, by conductive rod hold out against in
Ring plug, when being pressurized, compression forms elastic force still further below.
4. a kind of test equipment for fixing SD card using vacuum cup according to claim 3, it is characterised in that：It is described to lead
Torch（21）Upper end is pointed and is exposed to housing（25）Upper openings, lower end are exposed to housing lower through-hole mouth, the conduction
Stick（21）Upper end is placed on terminal hole position and exposes a distance outside terminal hole position, the conductive rod（21）Not by external force
When, lower end and vacuum cup fixed plate（61）On contact terminal contact be provided with spacing.
5. a kind of test equipment for fixing SD card using vacuum cup according to claim 1, it is characterised in that：The survey
Try bottom plate（2）On at least provided with 2 layer signal line pcb boards, be provided with signaling line circuit on every layer signal line pcb board（31）Respectively
Signaling line circuit（31）Between be provided with anti-interference layer（32）, the microsd turns usb protocol circuit（101）It is provided with
Microsd turns usb protocol processor chips.
6. a kind of test equipment for fixing SD card using vacuum cup according to claim 5, it is characterised in that：It is described anti-
Interfere layer（32）It is grounded anti-interference layer to cover copper.
7. a kind of test equipment for fixing SD card using vacuum cup according to claim 6, it is characterised in that：The letter
Number line pcb board is provided with eight floor.
8. a kind of test equipment for fixing SD card using vacuum cup according to claim 1, it is characterised in that：It is described true
Suction disk（62）Including sucker substrate, the SD card putting groove array being set on sucker substrate（63）, the SD card putting groove battle array
Row（63）It is shaped as array by multiple SD card putting groove unit groups.
9. a kind of test equipment for fixing SD card using vacuum cup according to claim 1, it is characterised in that：It is described true
Suction disk fixed plate（61）Including fixed plate substrate（67）And it is set to fixed plate substrate（67）On contact terminal contact array,
The contact terminal contact array includes several contact terminal contact point units, each contact in the contact terminal contact point unit with
Double end testing needle（66）It corresponds, bottom end circuit is connected to the test bottom plate（2）On circuit.
10. a kind of test equipment for fixing SD card using vacuum cup according to claim 1, it is characterised in that：It is described
Test circuit unit（100）It is provided with microsd and turns usb protocol bridgt circuit（200）.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810567555.2A CN108766503A (en) | 2018-06-05 | 2018-06-05 | A kind of test equipment for fixing SD card using vacuum cup |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810567555.2A CN108766503A (en) | 2018-06-05 | 2018-06-05 | A kind of test equipment for fixing SD card using vacuum cup |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108766503A true CN108766503A (en) | 2018-11-06 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810567555.2A Pending CN108766503A (en) | 2018-06-05 | 2018-06-05 | A kind of test equipment for fixing SD card using vacuum cup |
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| Country | Link |
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| CN (1) | CN108766503A (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001273060A (en) * | 2000-03-02 | 2001-10-05 | Internatl Business Mach Corp <Ibm> | Test for manufacturing hot plug circuit on computer backplane |
| CN202351358U (en) * | 2011-10-17 | 2012-07-25 | 中国电力科学研究院 | On-line testing device of PCB (printed circuit board) of electric energy meter |
| CN205621264U (en) * | 2016-04-25 | 2016-10-05 | 大连民族大学 | Utilize oxygen bias voltage environment gas sensor static test system of hand -held type bluetooth customer end control |
| CN207396653U (en) * | 2017-11-08 | 2018-05-22 | 深圳市朝一电子有限公司 | A kind of mobile phone SIM deck measurement jig |
| CN208689950U (en) * | 2018-06-05 | 2019-04-02 | 深圳市时创意电子有限公司 | A kind of test equipment using the fixed SD card of vacuum chuck |
-
2018
- 2018-06-05 CN CN201810567555.2A patent/CN108766503A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001273060A (en) * | 2000-03-02 | 2001-10-05 | Internatl Business Mach Corp <Ibm> | Test for manufacturing hot plug circuit on computer backplane |
| CN202351358U (en) * | 2011-10-17 | 2012-07-25 | 中国电力科学研究院 | On-line testing device of PCB (printed circuit board) of electric energy meter |
| CN205621264U (en) * | 2016-04-25 | 2016-10-05 | 大连民族大学 | Utilize oxygen bias voltage environment gas sensor static test system of hand -held type bluetooth customer end control |
| CN207396653U (en) * | 2017-11-08 | 2018-05-22 | 深圳市朝一电子有限公司 | A kind of mobile phone SIM deck measurement jig |
| CN208689950U (en) * | 2018-06-05 | 2019-04-02 | 深圳市时创意电子有限公司 | A kind of test equipment using the fixed SD card of vacuum chuck |
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