CN108731836B - Temperature measuring method, circuit and cooking utensil - Google Patents

Temperature measuring method, circuit and cooking utensil Download PDF

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CN108731836B
CN108731836B CN201710255011.8A CN201710255011A CN108731836B CN 108731836 B CN108731836 B CN 108731836B CN 201710255011 A CN201710255011 A CN 201710255011A CN 108731836 B CN108731836 B CN 108731836B
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value
sampling
temperature
sampling interval
interval
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CN108731836A (en
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曾彬
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Zhejiang Shaoxing Supor Domestic Electrical Appliance Co Ltd
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Zhejiang Shaoxing Supor Domestic Electrical Appliance Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
    • G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
    • G01K7/24—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
    • G01K7/25—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit for modifying the output characteristic, e.g. linearising

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  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)

Abstract

The invention discloses a temperature measuring method, a temperature measuring circuit and a cooking appliance. The temperature measuring method comprises the following steps: collecting a sampling value; acquiring a sampling interval to which a sampling value belongs and a temperature value corresponding to the sampling interval; obtaining a temperature correction value according to the functional relation between the sampling value and the sampling interval; and obtaining a temperature value corresponding to the sampling value according to the temperature value corresponding to the sampling interval and the temperature correction value. The invention solves the technical problem of lower precision of the temperature measuring method in the prior art.

Description

Temperature measuring method, circuit and cooking utensil
Technical Field
The invention relates to the field of data processing, in particular to a temperature measuring method, a temperature measuring circuit and a cooking appliance.
Background
At present, the Temperature measurement of household electrical appliances basically uses a thermistor called NTC (Negative Temperature Coefficient), which is widely applied due to stable performance and low price. The single chip microcomputer obtains the AD value of the NTC associated circuit point through the AD sampling circuit, so that the resistance value of the NTC is calculated, the resistance value of the NTC and the environment temperature of the NTC are in one-to-one correspondence, and the temperature of the temperature measuring point is further calculated.
The minimum scale of the conventionally used NTC resistance value and temperature comparison table is 1 degree, so that the precision of the NTC temperature control electric appliance is also 1 degree. However, in the case of extremely high control accuracy requirements, such as boiling point, spill point, and optimal temperature point of cooked food, if not high, the accuracy of these points will greatly affect the product performance.
Aiming at the problem of low precision of a temperature measurement method in the prior art, an effective solution is not provided at present.
Disclosure of Invention
The embodiment of the invention provides a temperature measuring method, a temperature measuring circuit and a cooking utensil, and at least solves the technical problem that the temperature measuring method in the prior art is low in precision.
According to an aspect of an embodiment of the present invention, there is provided a temperature measurement method including: collecting a sampling value; acquiring a sampling interval to which a sampling value belongs and a temperature value corresponding to the sampling interval; obtaining a temperature correction value according to the functional relation between the sampling value and the sampling interval; and obtaining a temperature value corresponding to the sampling value according to the temperature value corresponding to the sampling interval and the temperature correction value.
Further, in a case that the functional relationship is a linear functional relationship, obtaining the temperature correction value according to the functional relationship between the sampling value and the sampling interval includes: calculating a difference value between the maximum value and the minimum value in the sampling interval to obtain a first difference value; calculating the difference value between the maximum value in the sampling interval and the sampling value to obtain a second difference value; and calculating the ratio of the second difference to the first difference to obtain a temperature correction value.
Further, obtaining a temperature value corresponding to the sampling value according to the temperature value and the temperature correction value corresponding to the sampling interval, includes: and calculating the sum of the temperature value corresponding to the sampling interval and the temperature correction value to obtain a temperature value.
Further, before calculating a sum of the temperature value corresponding to the sampling interval and the temperature correction value to obtain the temperature value, the method further includes: calculating the product of the temperature correction value and the amplification factor to obtain a first product value; calculating the product of the temperature value corresponding to the sampling interval and the amplification factor to obtain a second product value; and calculating the sum of the first product value and the second product value to obtain a temperature value.
Further, acquiring a sampling interval to which the sampling value belongs and a temperature value corresponding to the sampling interval, including: acquiring a sampling interval to which a sampling value belongs; and acquiring a temperature value corresponding to the maximum value in the sampling interval to obtain a temperature value corresponding to the sampling interval.
Further, collecting the sampled values comprises: and collecting a sampling value through a thermistor.
According to another aspect of the embodiments of the present invention, there is also provided a temperature measurement circuit, including: the first end of the sampling resistor is connected with the direct-current power supply, and the second end of the sampling resistor is grounded; and the second end of the sampling resistor is connected to the sampling end of the controller and is used for collecting the sampling value, acquiring the sampling interval to which the sampling value belongs and the temperature value corresponding to the sampling interval, acquiring the temperature correction value according to the functional relation between the sampling value and the sampling interval, and acquiring the temperature value corresponding to the sampling value according to the temperature value and the temperature correction value corresponding to the sampling interval.
Further, the circuit further comprises: and the pull-up resistor is connected between the direct current power supply and the first end of the sampling resistor in series.
Further, the circuit further comprises: the protection resistor is connected between the second end of the sampling resistor and the sampling end of the controller in series; and a first end of the protection capacitor is connected to the sampling end of the controller, and a second end of the protection capacitor is grounded.
Further, the sampling resistor is a thermistor.
Further, the controller is a single chip microcomputer.
According to another aspect of the embodiments of the present invention, there is also provided a cooking appliance including: the pot body is used for containing cooked food; the pot cover is covered on the pot body; the temperature measuring circuit in any one of the above embodiments is arranged inside the pot body or the pot cover.
According to another aspect of the embodiments of the present invention, there is also provided a storage medium, where the storage medium includes a stored program, and where the program is executed to control an apparatus in which the storage medium is located to perform the temperature measurement method in any one of the above embodiments.
According to another aspect of the embodiments of the present invention, there is also provided a processor, configured to execute a program, where the program executes the temperature measurement method in any one of the above embodiments.
In the embodiment of the invention, sampling values are collected, a sampling interval to which the sampling values belong and temperature values corresponding to the sampling interval are obtained, a temperature correction value is obtained according to the functional relation between the sampling values and the sampling interval, and a temperature value corresponding to the sampling values is obtained according to the temperature values corresponding to the sampling interval and the temperature correction value. It is easy to note that after the sampling interval to which the sampling value belongs and the temperature value corresponding to the sampling interval are obtained, the temperature correction value can be further obtained according to the functional relationship between the sampling value and the sampling interval, and the final temperature value can be obtained according to the temperature correction value and the temperature value, so that the technical problem that the temperature measurement method in the prior art is low in precision is solved. Therefore, by the scheme provided by the embodiment of the invention, the technical effects of improving the accuracy of the temperature value and improving the measurement accuracy can be achieved under the condition of not increasing the measurement cost.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the invention without limiting the invention. In the drawings:
FIG. 1 is a flow chart of a method of temperature measurement according to an embodiment of the present invention;
FIG. 2 is a flow chart of an alternative temperature measurement method according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a temperature measurement circuit according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of an alternative temperature measurement circuit according to an embodiment of the present invention; and
FIG. 5 is a schematic diagram of an alternative temperature measurement circuit according to an embodiment of the present invention.
Detailed Description
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
Example 1
In accordance with an embodiment of the present invention, there is provided an embodiment of a temperature measurement method, it should be noted that the steps illustrated in the flowchart of the drawings may be performed in a computer system such as a set of computer-executable instructions and that, although a logical order is illustrated in the flowchart, in some cases, the steps illustrated or described may be performed in an order different than that presented herein.
Fig. 1 is a flow chart of a temperature measurement method according to an embodiment of the present invention, as shown in fig. 1, the method including the steps of:
and step S102, collecting sampling values.
Specifically, the sampling value may be an AD (Analog-to-Digital) sampling value acquired by an AD sampling circuit.
Step S104, acquiring a sampling interval to which the sampling value belongs and a temperature value corresponding to the sampling interval.
Specifically, all the acquired AD sampling values may be divided into a plurality of intervals in advance, each interval corresponds to one temperature value, and for example, the temperature value corresponding to the maximum value of the sampling interval may be used as the temperature value corresponding to the sampling interval.
And step S106, obtaining a temperature correction value according to the functional relation between the sampling value and the sampling interval.
Specifically, the functional relationship may be a linear functional relationship, an exponential functional relationship, a logarithmic functional relationship, etc., and the linear relationship is taken as an example in the embodiment of the present invention for detailed description; the temperature correction value can be a decimal part of the current sampling temperature, namely, a decimal point of the current sampling temperature is accurate, so that the measurement accuracy of the current sampling temperature is improved.
And step S108, obtaining a temperature value corresponding to the sampling value according to the temperature value and the temperature correction value corresponding to the sampling interval.
In an optional scheme, the processor may obtain the AD sampling value through the AD sampling circuit, obtain a sampling interval to which the AD sampling value belongs and a temperature value corresponding to the sampling interval by looking up a table, then obtain a temperature correction value according to a linear relationship between the AD sampling value and the sampling interval, and obtain a temperature value finally corresponding to the AD sampling value by calculating a sum of the temperature value corresponding to the sampling interval and the temperature correction value, that is, obtain the current sampling temperature. Compared with the existing temperature measurement method, the resistance value of the AD sampling value is not obtained only by looking up the table, and the temperature value corresponding to the AD sampling value is obtained by inquiring the resistance value and the temperature comparison table, so that the current sampling temperature is obtained; after the AD sampling value is inquired, a temperature correction value is further obtained through the linear relation between the AD sampling value and the sampling interval to which the AD sampling value belongs, and the temperature value corresponding to the sampling interval is corrected through the temperature correction value to obtain the current sampling temperature.
According to the embodiment of the invention, the sampling value is collected, the sampling interval to which the sampling value belongs and the temperature value corresponding to the sampling interval are obtained, the temperature correction value is obtained according to the functional relation between the sampling value and the sampling interval, and the temperature value corresponding to the sampling value is obtained according to the temperature value corresponding to the sampling interval and the temperature correction value. It is easy to note that after the sampling interval to which the sampling value belongs and the temperature value corresponding to the sampling interval are obtained, the temperature correction value can be further obtained according to the functional relationship between the sampling value and the sampling interval, and the final temperature value can be obtained according to the temperature correction value and the temperature value, so that the technical problem that the temperature measurement method in the prior art is low in precision is solved. Therefore, by the scheme provided by the embodiment of the invention, the technical effects of improving the accuracy of the temperature value and improving the measurement accuracy can be achieved under the condition of not increasing the measurement cost.
Optionally, in a case that the functional relationship is a linear functional relationship, step S106, obtaining the temperature correction value according to the functional relationship between the sampling value and the sampling interval, includes: calculating a difference value between the maximum value and the minimum value in the sampling interval to obtain a first difference value; calculating the difference value between the maximum value in the sampling interval and the sampling value to obtain a second difference value; and calculating the ratio of the second difference to the first difference to obtain a temperature correction value.
Specifically, the temperature correction value may be obtained according to an exponential function relationship between the AD sample value and the sampling interval, for example, if the acquired AD sample value is adValue, the sampling interval to which the adValue belongs is determined to be [ ADtx1, ADtx2], then a difference between ADtx2 and ADtx1 may be calculated, that is, a first difference adLen ═ ADtx 2-ADtx 1, and a difference between ADtx2 and adValue may be calculated, that is, a second difference adLen1 ═ ADtx2-adValue, and finally, the temperature correction value dig ═ adLen1/adLen may be obtained.
It should be noted that the step of calculating the first difference and the step of calculating the second difference may also be performed at the same time, that is, the difference between the maximum value and the minimum value in the sampling interval may be calculated to obtain the first difference, and the difference between the maximum value and the sampling value in the sampling interval may be calculated to obtain the second difference.
Through the steps, the temperature correction value can be obtained according to the linear function relation between the sampling value and the sampling interval, and the measurement precision is improved.
Optionally, in step S108, obtaining a temperature value corresponding to the sampling value according to the temperature value and the temperature correction value corresponding to the sampling interval, where the step includes: and calculating the sum of the temperature value corresponding to the sampling interval and the temperature correction value to obtain a temperature value.
Specifically, after the temperature value corresponding to the sampling interval is obtained, and the temperature correction value is calculated according to the linear functional relationship between the AD sampling value and the sampling interval, the sum of the two values may be calculated, that is, the sum of the temperature value and the temperature correction value is calculated, so as to obtain the temperature value corresponding to the adValue, for example, if the acquired AD sampling value is adValue, the sampling interval to which the adValue belongs is determined to be [ ADtx1, ADtx2], the temperature value corresponding to the sampling interval is Tx2, and the temperature correction value is calculated to be dig, the temperature value corresponding to the AD sampling value may be determined, that is, the current sampling temperature currtemp is Tx2+ dig.
Optionally, before calculating a sum of the temperature value corresponding to the sampling interval and the temperature correction value to obtain the temperature value, the method further includes: calculating the product of the temperature correction value and the amplification factor to obtain a first product value; calculating the product of the temperature value corresponding to the sampling interval and the amplification factor to obtain a second product value; and calculating the sum of the first product value and the second product value to obtain a temperature value.
Specifically, because the processor is a single chip microcomputer, and the floating point data is processed in the single chip microcomputer more complexly, an amplification factor can be introduced to convert the floating point data into integer data. The above-mentioned amplification factor is related to the measurement accuracy, for example, if the measurement accuracy is 1 digit after the decimal point, the amplification factor amp is 10; if the measurement precision is 2 bits after the decimal point, the amplification factor amp is 100. For example, if the acquired AD sample value is addvalue, the sampling interval to which the AD sample value belongs is determined to be [ ADtx1, ADtx2], the temperature value corresponding to the sampling interval is Tx2, and the calculated temperature correction value is dig, the temperature value corresponding to the AD sample value may be determined, that is, the current sampling temperature currtemp may be determined to be Tx2 × amp + dig × amp, where the first product value is dig × amp, and the second product value is Tx2 × amp.
It should be noted that the step of calculating the first product value and the step of calculating the second product value may also be performed simultaneously, that is, the product of the temperature correction value and the amplification factor may be calculated to obtain the first product value, and the product of the temperature value corresponding to the sampling interval and the amplification factor may be calculated to obtain the second product value.
Through the steps, the floating-point data can be converted into the integer data by introducing the amplification factors, the single chip microcomputer is convenient to process, and the effects of simplifying the complexity of the single chip microcomputer processing and improving the operation speed are achieved.
Optionally, in step S104, acquiring a sampling interval to which the sampling value belongs and a temperature value corresponding to the sampling interval, including: acquiring a sampling interval to which a sampling value belongs; and acquiring a temperature value corresponding to the maximum value in the sampling interval to obtain a temperature value corresponding to the sampling interval.
Specifically, table 1 is a comparison table of resistance values and temperatures, and as shown in table 1, when the temperature values are arranged from low to high, the corresponding AD sampling values are arranged from high to low, that is, the temperature values and the AD sampling values have an inverse relationship. The two AD sampling values corresponding to the two temperature values may be used as a sampling interval. For example, if the AD sample values are searched in ascending order, since the corresponding temperature values are from high to low, when the sample value adValue is located between ADtx1 and ADtx2, i.e. the sampling interval to which the sample value adValue belongs is [ ADtx1, ADtx2], the temperature value Tx2 corresponding to ADtx2 can be used as the temperature value corresponding to the sampling interval [ ADtx1, ADtx2 ].
TABLE 1
Figure BDA0001272827090000071
It should be noted that table 1 above only shows examples of 70 ℃ to 80 ℃, and other temperature ranges are also applicable.
Through the steps, the sampling interval to which the sampling value belongs and the temperature value corresponding to the sampling interval can be obtained in a table look-up mode, and the effect of improving the measuring speed is achieved.
Optionally, in step S102, acquiring the sample value includes: and collecting a sampling value through a thermistor.
Specifically, the thermistor may be an NTC (Negative Temperature Coefficient, short for Negative Temperature Coefficient) thermistor, and the single chip may obtain an AD sampling value of an NTC associated circuit point through an AD sampling circuit.
Fig. 2 is a flow chart of an alternative temperature measurement method according to an embodiment of the present invention, and a preferred embodiment of the present invention is described in detail below with reference to fig. 2 and table 1, taking 1 bit after decimal point as an example of measurement accuracy, as shown in fig. 2, the method may include the following steps:
and step S21, the singlechip acquires a sampling value adValue.
Optionally, as shown in table 1, it is assumed that the single chip microcomputer samples with a 10-bit ADC (Analog-to-Digital Converter, abbreviated as Analog-to-Digital Converter), and an AD sample value adValue is obtained as 640, where a pull-up resistor of an ADC port is 5.1k Ω.
In step S22, the sampling value adValue is obtained by looking up the table and is between ADtx1 and ADtx2, the temperature corresponding to ADtx1 is Tx1, and the temperature corresponding to ADtx2 is Tx 2.
Alternatively, by looking up a resistance value versus temperature value table, i.e. table 1, it can be determined that the current sampled temperature currtemp is between 70 ℃ and 71 ℃, and it can further be known that adValue is between ADtx1 ═ 634 and ADtx2 ═ 643, where Tx1 is 71 ℃ and Tx2 is 70 ℃.
In step S23, a difference value adLen between ADtx1 and ADtx2 is calculated.
Optionally, the difference adLen 643-.
In step S24, an amplification factor amp is set.
Optionally, since the measurement accuracy is 1 digit after the decimal point, amp may be set to 10, and the difference between the maximum value and the minimum value in the sampling interval may be divided into 10 equal parts, so that the fractional part of the current sampling temperature may be calculated, and when the sampling value is the maximum value, the fractional part is 0; when the sample value is the minimum value, the fractional part is 10, and carry forward is required.
In step S25, the temperature correction value dig ═ (ADtx2-adValue)/adLen @ amp is calculated.
Alternatively, the temperature correction value may be calculated according to a formula, that is, the decimal point precise bit dig ═ (643-640)/9 × 10 ═ 3.
In step S26, a temperature value currtemp ═ Tx2 × amp + dig corresponding to the sample value is calculated.
Alternatively, a temperature value corresponding to the AD sample value may be calculated according to a formula, that is, the current sample temperature currtemp is 70 × 10+3 — 703. I.e. the current sample temperature is 70.3 deg.c.
It should be noted that, because the single chip microcomputer cannot directly process floating-point data, an amplification factor may be introduced to convert the floating-point data into integer data, for example, 70.3 ℃ may be represented by 703, so as to simplify the complexity of processing by the single chip microcomputer and increase the operation speed.
Through the scheme, the accuracy of the temperature value can be improved and the measurement accuracy can be improved on the basis of the existing NTC thermistor under the condition that the measurement cost is not increased.
Example 2
According to an embodiment of the present invention, an embodiment of a temperature measurement circuit is provided.
FIG. 3 is a schematic diagram of a temperature measurement circuit according to an embodiment of the present invention, as shown in FIG. 3, the circuit comprising: a sampling resistor 31 and a controller 37, wherein a first end of the sampling resistor 31 is connected with the direct current power supply 33, and a second end of the sampling resistor 31 is grounded 35; the second end of the sampling resistor 31 is connected to the sampling end of the controller 37, the controller 37 is configured to collect a sampling value, obtain a sampling interval to which the sampling value belongs and a temperature value corresponding to the sampling interval, obtain a temperature correction value according to a functional relationship between the sampling value and the sampling interval, and obtain a temperature value corresponding to the sampling value according to the temperature value and the temperature correction value corresponding to the sampling interval.
Optionally, the sampling resistor 31 is a thermistor.
Optionally, the controller 37 is a single chip microcomputer.
Specifically, the sampling value may be an AD sampling value acquired by an AD sampling circuit; all the acquired AD sampling values can be divided into a plurality of intervals in advance, each interval corresponds to one temperature value, and for example, the temperature value corresponding to the maximum value of the sampling interval can be used as the temperature value corresponding to the sampling interval; the above functional relationship may be a linear functional relationship, an exponential functional relationship, a logarithmic functional relationship, etc., and the linear relationship is taken as an example in the embodiment of the present invention for detailed description; the temperature correction value can be a decimal part of the current sampling temperature, namely, a decimal point of the current sampling temperature is accurate, so that the measurement accuracy of the current sampling temperature is improved.
In an optional scheme, the processor may obtain the AD sampling value through the AD sampling circuit, obtain a sampling interval to which the AD sampling value belongs and a temperature value corresponding to the sampling interval by looking up a table, then obtain a temperature correction value according to a linear relationship between the AD sampling value and the sampling interval, and obtain a temperature value finally corresponding to the AD sampling value by calculating a sum of the temperature value corresponding to the sampling interval and the temperature correction value, that is, obtain the current sampling temperature. Compared with the existing temperature measurement method, the resistance value of the AD sampling value is not obtained only by looking up the table, and the temperature value corresponding to the AD sampling value is obtained by inquiring the resistance value and the temperature comparison table, so that the current sampling temperature is obtained; after the AD sampling value is inquired, a temperature correction value is further obtained through the linear relation between the AD sampling value and the sampling interval to which the AD sampling value belongs, and the temperature value corresponding to the sampling interval is corrected through the temperature correction value to obtain the current sampling temperature.
According to the above embodiment of the present invention, the temperature measuring circuit includes: a sampling resistor 31 and a controller 37, wherein a first end of the sampling resistor 31 is connected with the direct current power supply 33, and a second end of the sampling resistor 31 is grounded 35; the second end of the sampling resistor 31 is connected to the sampling end of the controller 37, the controller 37 is configured to collect a sampling value, obtain a sampling interval to which the sampling value belongs and a temperature value corresponding to the sampling interval, obtain a temperature correction value according to a functional relationship between the sampling value and the sampling interval, and obtain a temperature value corresponding to the sampling value according to the temperature value and the temperature correction value corresponding to the sampling interval. It is easy to note that after the sampling interval to which the sampling value belongs and the temperature value corresponding to the sampling interval are obtained, the temperature correction value can be further obtained according to the functional relationship between the sampling value and the sampling interval, and the final temperature value can be obtained according to the temperature correction value and the temperature value, so that the technical problem that the temperature measurement method in the prior art is low in precision is solved. Therefore, by the scheme provided by the embodiment of the invention, the technical effects of improving the accuracy of the temperature value and improving the measurement accuracy can be achieved under the condition of not increasing the measurement cost.
Optionally, fig. 4 is a schematic diagram of an alternative temperature measurement circuit according to an embodiment of the present invention, as shown in fig. 4, the circuit further includes: and a pull-up resistor 41, wherein the pull-up resistor 41 is connected in series between the dc power supply 33 and the first terminal of the sampling resistor 31.
Specifically, the pull-up resistor may be selected according to actual measurement requirements, for example, the pull-up resistor may be 5.1k Ω, and the resistance value and temperature value are shown in table 1.
Optionally, as shown in fig. 4, the circuit further includes: a protection resistor 43 and a protection capacitor 45, wherein the protection resistor 43 is connected in series between the second end of the sampling resistor 31 and the sampling end of the controller 37; a first terminal of the protection capacitor 45 is connected to the sampling terminal of the controller 37, and a second terminal of the protection capacitor 45 is grounded.
Specifically, the protection resistor 43 and the protection capacitor 45 play a role in limiting current and voltage, protect the sampling resistor 31 and the single chip microcomputer, prevent the sampling resistor and the single chip microcomputer from being damaged by overlarge current and voltage, influence the normal work of the circuit and improve the reliability of the circuit.
Fig. 5 is a schematic diagram of an alternative temperature measurement circuit according to an embodiment of the present invention, and a preferred embodiment of the present invention is described in detail below with reference to fig. 5, and as shown in fig. 5, the circuit may include: the digital signal processor comprises an NTC (namely the sampling resistor 31), a singlechip (namely the controller 37), a pull-up resistor R1, a protection capacitor C and a protection resistor R2, wherein one end of the pull-up resistor R1 is connected with a direct current power supply VDD, the other end of the pull-up resistor R1 is connected with the 1 end of the NTC, the 2 end of the NTC is grounded, and the 2 end of the NTC can be connected to an ADC port of the singlechip through the protection capacitor C and the protection resistor R2 which are connected in parallel. The single chip microcomputer can adopt a 10-bit ADC for sampling, a sampling interval to which the AD sampling value belongs and a temperature value corresponding to the sampling interval are obtained through table look-up, then a temperature correction value is obtained according to a linear relation between the AD sampling value and the sampling interval, and a temperature value finally corresponding to the AD sampling value is obtained through calculating the sum of the temperature value corresponding to the sampling interval and the temperature correction value, so that the current sampling temperature is obtained. Compared with the existing temperature measurement method, the resistance value of the AD sampling value is not obtained only by looking up the table, and the temperature value corresponding to the AD sampling value is obtained by inquiring the resistance value and the temperature comparison table, so that the current sampling temperature is obtained; after the AD sampling value is inquired, a temperature correction value is further obtained through the linear relation between the AD sampling value and the sampling interval to which the AD sampling value belongs, and the temperature value corresponding to the sampling interval is corrected through the temperature correction value to obtain the current sampling temperature.
Through the scheme, the measurement cost is not increased, the accuracy of the temperature value is improved, and the measurement accuracy is improved on the basis of the conventional NTC thermistor.
Example 3
According to an embodiment of the present invention, there is provided an embodiment of a cooking appliance, including: a pot body, a pot cover and the temperature measuring circuit in the embodiment 2, wherein the pot body is used for containing cooked food; the pot cover is covered on the pot body; the temperature measuring circuit is arranged inside the pot body or the pot cover.
Specifically, the cooking appliance may be an electric pressure cooker, an electric cooker, or a food processor, which is not limited in this respect.
According to the embodiment of the invention, the cooking appliance comprises the temperature measuring circuit, the controller in the temperature measuring circuit is used for collecting the sampling value, acquiring the sampling interval to which the sampling value belongs and the temperature value corresponding to the sampling interval, obtaining the temperature correction value according to the functional relation between the sampling value and the sampling interval, and obtaining the temperature value corresponding to the sampling value according to the temperature value corresponding to the sampling interval and the temperature correction value. It is easy to note that after the sampling interval to which the sampling value belongs and the temperature value corresponding to the sampling interval are obtained, the temperature correction value can be further obtained according to the functional relationship between the sampling value and the sampling interval, and the final temperature value can be obtained according to the temperature correction value and the temperature value, so that the technical problem that the temperature measurement method in the prior art is low in precision is solved. Therefore, by the scheme provided by the embodiment of the invention, the technical effects of improving the accuracy of the temperature value and improving the measurement accuracy can be achieved under the condition of not increasing the measurement cost.
Example 4
According to an embodiment of the present invention, there is provided an embodiment of a storage medium including a stored program, wherein an apparatus in which the storage medium is located is controlled to perform the temperature measurement method of any one of the above-described embodiments 1 when the program is executed.
Example 5
According to an embodiment of the present invention, an embodiment of a processor for running a program is provided, where the program is run to perform the temperature measurement method of any one of the above embodiments 1.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
In the above embodiments of the present invention, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In the embodiments provided in the present application, it should be understood that the disclosed technology can be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units may be a logical division, and in actual implementation, there may be another division, for example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, units or modules, and may be in an electrical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic or optical disk, and other various media capable of storing program codes.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.

Claims (13)

1. A method of measuring temperature, comprising:
collecting a sampling value;
acquiring a sampling interval to which the sampling value belongs and a temperature value corresponding to the sampling interval;
obtaining a temperature correction value according to the functional relation between the sampling value and the sampling interval;
obtaining a temperature value corresponding to the sampling value according to the temperature value corresponding to the sampling interval and the temperature correction value;
under the condition that the functional relation is a linear functional relation, obtaining a temperature correction value according to the functional relation between the sampling value and the sampling interval, wherein the method comprises the following steps:
calculating the difference value between the maximum value and the minimum value in the sampling interval to obtain a first difference value;
calculating the difference value between the maximum value in the sampling interval and the sampling value to obtain a second difference value;
and calculating the ratio of the second difference to the first difference to obtain the temperature correction value.
2. The method of claim 1, wherein obtaining the temperature value corresponding to the sampling value according to the temperature value corresponding to the sampling interval and the temperature correction value comprises:
and calculating the sum of the temperature value corresponding to the sampling interval and the temperature correction value to obtain the temperature value.
3. The method of claim 1, wherein obtaining the temperature value corresponding to the sampling value according to the temperature value corresponding to the sampling interval and the temperature correction value comprises:
calculating the product of the temperature correction value and the amplification factor to obtain a first product value;
calculating the product of the temperature value corresponding to the sampling interval and the amplification factor to obtain a second product value;
and calculating the sum of the first product value and the second product value to obtain a temperature value corresponding to the sampling value.
4. The method of claim 1, wherein obtaining the sampling interval to which the sampling value belongs and the temperature value corresponding to the sampling interval comprises:
acquiring a sampling interval to which the sampling value belongs;
and acquiring a temperature value corresponding to the maximum value in the sampling interval to obtain a temperature value corresponding to the sampling interval.
5. The method of any one of claims 1 to 4, wherein collecting sample values comprises:
and collecting the sampling value through a thermistor.
6. A temperature measurement circuit, comprising:
the sampling resistor is connected with a direct current power supply at a first end, and is grounded at a second end;
the second end of the sampling resistor is connected to the sampling end of the controller and used for collecting a sampling value, acquiring a sampling interval to which the sampling value belongs and a temperature value corresponding to the sampling interval, obtaining a temperature correction value according to a functional relation between the sampling value and the sampling interval, and obtaining a temperature value corresponding to the sampling value according to the temperature value corresponding to the sampling interval and the temperature correction value;
wherein, the controller is further configured to obtain a temperature correction value according to a functional relationship between the sampling value and the sampling interval when the functional relationship is a linear functional relationship, and the method includes:
calculating the difference value between the maximum value and the minimum value in the sampling interval to obtain a first difference value;
calculating the difference value between the maximum value in the sampling interval and the sampling value to obtain a second difference value;
and calculating the ratio of the second difference to the first difference to obtain the temperature correction value.
7. The circuit of claim 6, further comprising:
and the pull-up resistor is connected between the direct current power supply and the first end of the sampling resistor in series.
8. The circuit of claim 6, further comprising:
the protection resistor is connected between the second end of the sampling resistor and the sampling end of the controller in series;
and the first end of the protection capacitor is connected into the sampling end of the controller, and the second end of the protection capacitor is grounded.
9. The circuit of claim 6, wherein the sampling resistor is a thermistor.
10. The circuit of claim 6, wherein the controller is a single chip.
11. A cooking appliance, comprising:
the pot body is used for containing cooked food;
the pot cover is covered on the pot body;
the temperature measurement circuit of any one of claims 6 to 10, disposed inside the pot body or the pot cover.
12. A storage medium, characterized in that the storage medium includes a stored program, wherein when the program is run, a device in which the storage medium is located is controlled to execute the temperature measurement method according to any one of claims 1 to 5.
13. A processor, characterized in that the processor is configured to run a program, wherein the program is configured to execute the temperature measurement method according to any one of claims 1 to 5 when running.
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