CN108666258A - Wafer jig and the method that wafer is clamped - Google Patents

Wafer jig and the method that wafer is clamped Download PDF

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Publication number
CN108666258A
CN108666258A CN201710209060.8A CN201710209060A CN108666258A CN 108666258 A CN108666258 A CN 108666258A CN 201710209060 A CN201710209060 A CN 201710209060A CN 108666258 A CN108666258 A CN 108666258A
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CN
China
Prior art keywords
wafer
platform
push rod
sensor
top surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710209060.8A
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Chinese (zh)
Inventor
卢芳万
张瑞堂
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Himax Technologies Ltd
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Himax Technologies Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Himax Technologies Ltd filed Critical Himax Technologies Ltd
Priority to CN201710209060.8A priority Critical patent/CN108666258A/en
Publication of CN108666258A publication Critical patent/CN108666258A/en
Pending legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches

Abstract

A kind of method that the present invention proposes wafer jig and holding chip, the wafer chuck include the platform with top surface;Stopper is set to the front end of platform;Push rod is set to the rear end of platform;At least an actuator is articulated in push rod;Sensor is set to the front end of platform, to measure sensor and the distance between wafer thereon.

Description

Wafer jig and the method that wafer is clamped
Technical field
The present invention relates to a kind of wafer jig (wafer clamp) more particularly to a kind of crystalline substances suitable for robot system Circle fixture, to pick up and place wafer.
Background technology
Manipulator (robotic hand) or the tooth fork (fork) of robot system generally to automatic Picking and are placed brilliant Circle (wafer or chip).Wafer is clamped using vacuum tooth fork (vacuum fork) in traditional robot system.Due to tradition Vacuum tooth fork is easily dislocated (misalignment) situation so that wafer can not be refined contraposition and pickup, cause wafer It falls and ruptures.
In addition, traditional vacuum tooth fork is the top surface or bottom surface designed to contact wafer to be picked up.Such equipment can not be applicable in In some wafers, such as optical element (such as optical lens or glass).
In consideration of it, a kind of engagement type (engaged) tooth fork is therefore proposed, to improve the missing of vacuum tooth fork.However, traditional Engagement type tooth fork can not be fast moved and be rotated, thus cause kicking down for wafer 10.
Wafer effectively can not be aligned and pick up in view of tradition machinery tooth fork, therefore there is an urgent need for propose a kind of novel wafer clamp Tool, to improve the shortcomings that tradition machinery tooth is pitched.
Invention content
In view of above-mentioned, the first purpose of the embodiment of the present invention is to propose a kind of wafer jig suitable for robot system And the method for clamping wafer.The wafer jig that the embodiment of the present invention is provided can precisely to being located at wafer, and can fast move and It rotates without and causes kicking down for wafer.
According to embodiments of the present invention, wafer jig includes platform, stopper, push rod, at least an actuator and sensor.It is flat Platform has a top surface.Stopper is set to the front end of platform, and push rod is set to the rear end of platform.Actuator is articulated in push rod.Sensing Device is set to the front end of platform, to measure sensor and the distance between wafer thereon.
According to the method for the clamping wafer that another embodiment of the present invention is proposed, mobile wafer jig extremely has wafer Slot.Sensor detects the presence of wafer on sensor.Wafer jig is continued to move along, until sensor detects wafer Be not present.Wafer jig is up moved, and activate an at least actuator and by push rod toward being pushed forward so that wafer is by firmly It is held between stopper and push rod.
The beneficial effects of the present invention are, (vacuum fork) is pitched compared to traditional vacuum tooth, it is provided by the present invention Wafer chuck is using sensor (especially FIBER OPTIC SENSORS) with precisely to being located at wafer.Wafer chuck provided by the present invention makes With actuator (especially pneumatic cylinder) to fast move and rotate, without causing kicking down for chip.
Description of the drawings
Figure 1A shows the perspective view of the wafer jig suitable for robot system of the embodiment of the present invention.
The perspective view of the pneumatic cylinder of Figure 1B view similars.
The perspective view of the FIBER OPTIC SENSORS of Fig. 1 C view similars.
Fig. 2 shows the vertical view of the wafer jig of Figure 1A.
Fig. 3 A to Fig. 3 D displays are using the wafer jig of Figure 1A to pick up the flow diagram of wafer.
Fig. 4 shows the perspective view of Fig. 3 D.
Wherein, the reference numerals are as follows:
100 wafer jigs
10 wafers
11 platforms
12 stoppers
13 push rods
14 actuators
15 panels
16 sensors
17 mounting holes
18 mounting holes
31 cassettes
The first distances of d1
D2 second distances
Specific implementation mode
Figure 1A shows the perspective view of the wafer jig 100 suitable for robot system of the embodiment of the present invention.Fig. 2 display figures The vertical view of the wafer jig 100 of 1A.Wafer 10 can be temporarily clamped in fixed position, to keep away in the wafer jig 100 of the present embodiment Exempt from mobile or detaches.Wafer jig 100 especially (but non-limiting) but will not can touch the top surface of wafer wafer is clamped Or bottom surface.When wafer jig 100 be used as manipulator, coordinate the other elements of robot system to pick up and place 10 (example of wafer Such as optical lens or glass) when, then wafer jig 100 is alternatively referred to as mechanical tooth fork (robot fork).
In the present embodiment, wafer jig 100 may include platform (platform) 11, with flat top.Platform 11 Under wafer 10, to support wafer 10.
The wafer jig 100 of the present embodiment may include stopper (stopper) 12, be set to the front end of platform 11.In this reality It applies in example, stopper 12 is fixedly arranged on platform 11, and the top surface of stopper 12 is higher than the top surface of platform 11.Therefore, when wafer 10 supports When on platform 11, the top surface of stopper 12 is identical or top surface higher than wafer 10.In one embodiment, stopper 12 can with it is flat Platform 11 is integrally formed.In another embodiment, stopper 12 can manufacture respectively with platform 11, then (using adhesive) is installed in one It rises.
The wafer jig 100 of the present embodiment may include push rod 13, be set to the rear end of platform 11.In the present embodiment, push rod 13 can move relative to the rear end of platform 11, and the top surface of push rod 13 is higher than the top surface of platform 11.Therefore, when wafer 10 supports When on platform 11, the top surface of push rod 13 is identical or top surface higher than wafer 10.
The wafer jig 100 of the present embodiment also may include an at least actuator (actuator) 14, be pivotally connected (pivotally Connected) in push rod 13.Wherein, actuator 14 can (that is, front end of past platform 11) pushes forward by push rod 13 so that brilliant Circle 10 can be held fixedly between stopper 12 and push rod 13.Embodiment as shown in Figure 1A, two actuators 14 are parallel to be articulated in Push rod 13.In another embodiment, an actuator 14 at least an auxiliary rod (not shown) is parallel is articulated in push rod 13.
In the present embodiment, actuator 14 may include pneumatic cylinder (pneumatic cylinder), also known as cylinder (air Cylinder), be it is a kind of using compressed gas to generate the mechanical device of linear reciprocating motion power.Pneumatic cylinder have it is quiet, The advantages that totally few with occupied space.The perspective view of the pneumatic cylinder 14 of Figure 1B view similars.Steven The pneumatic cylinder of model C J1 manufactured by Engineering companies (California, USA) is applicable to the present embodiment, but is not limited to This.Although the present embodiment uses pneumatic cylinder, other mechanical devices can also be used instead.
In the present embodiment, pneumatic cylinder 14 has the function of spring return function (spring return), when pneumatic cylinder does not activate When, the front end of pneumatic cylinder 14 can be returned to home position by internal spring (not shown).Therefore, push rod 13 can be pulled (also Moved toward the opposite direction of 11 front end of platform), thus freeing that wafer 10.In another embodiment, pneumatic cylinder 14 does not have spring Return function, but so that it is moved toward the opposite direction of 11 front end of platform from external springs (not shown).Pneumatic cylinder 14 can be by face Plate (plate) 15 supports.In one embodiment, panel 15 is made as a module together with pneumatic cylinder 14, can it is fixed (such as through By mounting hole 17, spiral shell is set) in the other parts of wafer jig 100.
The wafer jig 100 of the present embodiment more may include sensor 16, be set to stopper 12 or set on the front end of platform 11. Sensor 16 faces upward, to measure sensor 16 and the distance between object (being in this example wafer 10) thereon.Control Device (not shown) transmission control signal receives sensing signal caused by sensor 16 to sensor 16, and controllable actuating Device 14.
In the present embodiment, sensor 16 includes FIBER OPTIC SENSORS (fiber optic sensor), such as reflection-type (reflective) FIBER OPTIC SENSORS, by the characteristic for changing optical fiber so that measured quantity (measured quantity) modulation The intensity, phase of light, polarization (polarization), wavelength or transit time in optical fiber, to measure distance.Optical fiber senses Utensil have the advantages that it is small, from electromagnetic interference, resist high voltage and temperature.The optical fiber sense of Fig. 1 C view similars Survey the perspective view of device.The FIBER OPTIC SENSORS of model FU manufactured by Ji Ensi (Keyence) company (Taiwan) is applicable to this reality Example is applied, but not limited thereto.In one embodiment, FIBER OPTIC SENSORS is made as a module, can be fixed (such as via mounting hole 18 and spiral shell is set) in the other parts of wafer jig 100.Although the present embodiment uses FIBER OPTIC SENSORS, other can also be used instead Sensor.
The flow of wafer 10 is picked up in Fig. 3 A to Fig. 3 D displays using the wafer jig 100 of Figure 1A from cassette (cassette) 31 Schematic diagram.First, as shown in Figure 3A, manipulator of the wafer jig 100 as robot system is moved to a slot of cassette 31 (slot).At this point, actuator 14 is not yet activated, therefore push rod 13 is located at the position (backward) (that is, raw bits backward It sets).Sensor 16 detects the presence of wafer 10 according to the first distance d1 measured between sensor 16 and wafer 10. In one embodiment, when sensor 16 receives reflection from the optical signal of wafer 10, then the presence of wafer 10 is detected.
As shown in Figure 3B, wafer jig 100 continues to move along, and second distance d2 is arrived until sensor 16 measures, big In the first distance d1, thus detect being not present for wafer 10.In the present embodiment, when sensor 16 does not receive reflection eleutheromorph The optical signal of circle 10, then detect being not present for wafer 10.
As shown in Figure 3 C, when detecting being not present for wafer 10, then wafer jig 100 up moves, and 14 quilt of actuator Actuating and by push rod 14 toward being pushed forward (that is, toward front end of platform 11) so that wafer 10 be held fixedly in stopper 12 with push away Between bar 13.Finally, as shown in Figure 3D, wafer jig 100 is lifted to leave cassette 31.Fig. 4 shows the perspective view of Fig. 3 D.
According to above-described embodiment, (vacuum fork) is pitched compared to traditional vacuum tooth, wafer clamp provided by the present invention Tool 100 is using sensor 16 (especially FIBER OPTIC SENSORS) with precisely to being located at wafer 10.Wafer jig provided by the present invention 100 using actuator 14 (especially pneumatic cylinder) to fast move and rotate, without causing kicking down for wafer 10.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not limited to the guarantor of claims of the present invention Protect range;The equivalent change or modification completed under all other spirit disclosed without departing from invention, should be included in following In the protection domain of claims.

Claims (19)

1. a kind of wafer jig, including:
One platform has a top surface;
One stopper is set to the front end of the platform;
One push rod is set to the rear end of the platform;
An at least actuator is articulated in the push rod;And
One sensor is set to the front end of the platform, to measure the sensor and the distance between wafer thereon.
2. wafer jig according to claim 1, the wherein top surface of the platform are flat.
3. wafer jig according to claim 1, the wherein top surface of the stopper are higher than the top surface of the platform, therefore working as should For wafer support when on the platform, the top surface of the stopper is identical or top surface higher than the wafer.
4. wafer jig according to claim 1, the wherein top surface of the push rod are higher than the top surface of the platform, therefore work as the crystalline substance Circle is when being supported on the platform, and the top surface of the push rod is identical or top surface higher than the wafer.
5. wafer jig according to claim 1, the wherein actuator push forward the push rod so that the wafer is firm Ground is held between the stopper and the push rod.
6. wafer jig according to claim 1, wherein an at least actuator include two actuators, parallel to be articulated in this Push rod.
7. wafer jig according to claim 1, wherein an at least actuator include an actuator, auxiliary at least one Help bar is parallel to be articulated in the push rod.
8. wafer jig according to claim 1, the wherein actuator include pneumatic cylinder.
9. wafer jig according to claim 8, when the pneumatic cylinder does not activate, the front end of the pneumatic cylinder is drawn back into original Beginning position.
10. wafer jig according to claim 1 includes also a panel, to support the actuator.
11. wafer jig according to claim 1, the wherein sensor include FIBER OPTIC SENSORS.
12. wafer jig according to claim 11, the wherein FIBER OPTIC SENSORS include reflection-type optical fiber sensor.
13. a kind of method of clamping wafer, including:
One wafer jig is provided;
The slot that the mobile wafer jig has wafer to one;
One sensor detects the presence of wafer on the sensor;
The wafer jig is continued to move along, until the sensor detects being not present for wafer;And
The wafer jig is up moved, and activate an at least actuator and by a push rod toward being pushed forward so that wafer is by firmly It is held between a stopper and the push rod.
14. according to the method that wafer is clamped described in claim 13, the wherein wafer jig includes:
One platform;
The stopper is set to the front end of the platform;
The push rod is set to the rear end of the platform;
An at least actuator, is articulated in the push rod;And
The sensor is set to the front end of the platform.
15. according to the method that wafer is clamped described in claim 13, wherein the actuator includes pneumatic cylinder.
16. according to the method that wafer is clamped described in claim 15, when the pneumatic cylinder does not activate, the front end of the pneumatic cylinder is drawn It is back to home position.
17. according to the method that wafer is clamped described in claim 13, wherein the sensor includes reflection-type optical fiber sensor.
18. according to the method that wafer is clamped described in claim 17, when the reflection-type optical fiber sensor receives reflection from wafer Optical signal, then detect the presence of wafer.
19. according to the method that wafer is clamped described in claim 17, when the reflection-type optical fiber sensor does not receive reflection eleutheromorph Round optical signal then detects being not present for wafer.
CN201710209060.8A 2017-03-31 2017-03-31 Wafer jig and the method that wafer is clamped Pending CN108666258A (en)

Priority Applications (1)

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CN201710209060.8A CN108666258A (en) 2017-03-31 2017-03-31 Wafer jig and the method that wafer is clamped

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Application Number Priority Date Filing Date Title
CN201710209060.8A CN108666258A (en) 2017-03-31 2017-03-31 Wafer jig and the method that wafer is clamped

Publications (1)

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Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20050098581A (en) * 2004-04-07 2005-10-12 삼성전자주식회사 Wafer transport apparatus and method for sensing wafer of the same
CN100373580C (en) * 1998-12-02 2008-03-05 纽波特公司 Robot arm with specimen edge gripping end effector
CN100440421C (en) * 2003-06-27 2008-12-03 马特森技术公司 Endeffectors for handling semiconductor wafers
CN102021624A (en) * 2009-09-11 2011-04-20 中芯国际集成电路制造(上海)有限公司 Alignment device
TW201135863A (en) * 2009-10-14 2011-10-16 Rorze Corp Apparatus for holding thin-board-like material and method for holding thin-board-like material
CN102738056A (en) * 2011-06-28 2012-10-17 清华大学 Push rod-type wafer clamping device which extends with cylinder
CN202917463U (en) * 2012-10-23 2013-05-01 北京七星华创电子股份有限公司 Disk clamping device
KR20140049623A (en) * 2012-10-17 2014-04-28 엘지디스플레이 주식회사 Apparatus and method of unloading substrate
CN103887222A (en) * 2014-03-05 2014-06-25 中国电子科技集团公司第四十五研究所 Wafer clamping device utilizing spring tensioning force feedback and motor driving force feedback
CN104979245A (en) * 2015-06-17 2015-10-14 北京七星华创电子股份有限公司 Photoelectric detection method and photoelectric detection device for silicon wafer distribution state of semiconductor equipment carrying region
CN105632997A (en) * 2015-12-31 2016-06-01 北京七星华创电子股份有限公司 Safe pickup method and system for silicon wafer in silicon wafer carrying device
JP2016143787A (en) * 2015-02-03 2016-08-08 川崎重工業株式会社 Substrate transfer robot and substrate transfer method
CN106340479A (en) * 2015-07-07 2017-01-18 东京毅力科创株式会社 Substrate conveyance method and substrate processing apparatus

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100373580C (en) * 1998-12-02 2008-03-05 纽波特公司 Robot arm with specimen edge gripping end effector
CN100440421C (en) * 2003-06-27 2008-12-03 马特森技术公司 Endeffectors for handling semiconductor wafers
KR20050098581A (en) * 2004-04-07 2005-10-12 삼성전자주식회사 Wafer transport apparatus and method for sensing wafer of the same
CN102021624A (en) * 2009-09-11 2011-04-20 中芯国际集成电路制造(上海)有限公司 Alignment device
TW201135863A (en) * 2009-10-14 2011-10-16 Rorze Corp Apparatus for holding thin-board-like material and method for holding thin-board-like material
CN102738056A (en) * 2011-06-28 2012-10-17 清华大学 Push rod-type wafer clamping device which extends with cylinder
KR20140049623A (en) * 2012-10-17 2014-04-28 엘지디스플레이 주식회사 Apparatus and method of unloading substrate
CN202917463U (en) * 2012-10-23 2013-05-01 北京七星华创电子股份有限公司 Disk clamping device
CN103887222A (en) * 2014-03-05 2014-06-25 中国电子科技集团公司第四十五研究所 Wafer clamping device utilizing spring tensioning force feedback and motor driving force feedback
JP2016143787A (en) * 2015-02-03 2016-08-08 川崎重工業株式会社 Substrate transfer robot and substrate transfer method
CN104979245A (en) * 2015-06-17 2015-10-14 北京七星华创电子股份有限公司 Photoelectric detection method and photoelectric detection device for silicon wafer distribution state of semiconductor equipment carrying region
CN106340479A (en) * 2015-07-07 2017-01-18 东京毅力科创株式会社 Substrate conveyance method and substrate processing apparatus
CN105632997A (en) * 2015-12-31 2016-06-01 北京七星华创电子股份有限公司 Safe pickup method and system for silicon wafer in silicon wafer carrying device

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Application publication date: 20181016

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