CN108645349A - A kind of measurement method and device of Transient deformation - Google Patents
A kind of measurement method and device of Transient deformation Download PDFInfo
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- CN108645349A CN108645349A CN201810353161.7A CN201810353161A CN108645349A CN 108645349 A CN108645349 A CN 108645349A CN 201810353161 A CN201810353161 A CN 201810353161A CN 108645349 A CN108645349 A CN 108645349A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
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Abstract
This application discloses a kind of measurement method of Transient deformation and devices, including：Laser emitting laser irradiation measured object, wherein periodical Transient deformation is presented in measured object；Speckle interference gauge head receives the reflected light reflected through measured object, and forms speckle interference according to reflected light；Speckle interference gauge head exports the speckle interference set of graphs obtained according to default Timing acquisition, wherein speckle interference set of graphs is by being sampled to each position on time shaft in the Transient deformation period；Image processing module determines that the deformation position of Transient deformation and/or deformation quantity occurs within the Transient deformation period in measured object according to speckle interference set of graphs.The application can effectively improve measuring speed, reduce time of measuring by carrying out the sampling of speckle interference figure to each position on time shaft in the Transient deformation period come measurement period Transient deformation.
Description
Technical field
This application involves whole-field optically technical field of measurement and test more particularly to the measurement methods and device of a kind of Transient deformation.
Background technology
Measurement for periodical dynamic deformation, generally use stroboscopic illumination method.For example, during vibration measurement, lead to
Ovennodulation laser realizes that laser strobe illumination, the frequency for exporting stroboscopic laser are consistent with vibration frequency so that illumination is locked in
In some phase of vibration.The phase diagram under two different conditions is obtained respectively by stroboscopic illumination method, then subtracts each other to obtain
Corresponding to the phase distribution of measured object Displacements Distribution, and then obtain vibration amplitude spatial distribution.
But it is directed to periodical Transient deformation and (occurs primary instantaneous deformation, difference i.e. within the longer time period
Repeatability between period is higher), the time of measuring that deformation measurement is carried out using stroboscopic illumination method is longer.For example, working as long period
Transient deformation is there are when the Transient deformation of millisecond duration in 1s, and the measurement duration of stroboscopic illumination method may need to be up to 50 hours
Continuous measurement.
Invention content
The embodiment of the present application provides a kind of measurement method and device of Transient deformation, to solve existing periodical transient state
The longer problem of time of measuring of deformation.
The embodiment of the present application provides a kind of measurement method of Transient deformation, including：
Laser emitting laser irradiation measured object, wherein periodical Transient deformation is presented in the measured object；
Speckle interference gauge head receives the reflected light reflected through the measured object, and forms speckle according to the reflected light
Interference；
The speckle interference gauge head exports the speckle interference set of graphs obtained according to default Timing acquisition, wherein described to dissipate
Spot interferes set of graphs to be by being sampled to each position on time shaft in the Transient deformation period；
Image processing module determines that the measured object occurs within the Transient deformation period according to the speckle interference set of graphs
The deformation position and/or deformation quantity of Transient deformation.
Optionally, the speckle interference gauge head includes one of the following：
Speckle interference gauge head based on time-phase displacement technology, the speckle interference gauge head based on spatial carrier technology.
Optionally, when the speckle interference gauge head is the speckle interference gauge head based on time-phase displacement technology, time phase
The phase shift step number of shifting technology is N, step-length x；
The speckle interference gauge head exports the speckle interference set of graphs obtained according to default Timing acquisition, including：
At leastIn a continuous Transient deformation period, camera in the speckle interference gauge head according to it is described default when
Sequence acquires speckle interference figure；
Wherein, t is the exposure time of the camera, and n is the sampling frame per second of the camera；
Phase difference between adjacent Transient deformation period corresponding speckle interference figure is x；
The sampling start time in i-th of Transient deformation period to the i-th+N-1 Transient deformation periods is identical；
Corresponding sampling start time in i-th+N number of Transient deformation period, than i-th Transient deformation period, corresponding sampling was opened
Begin moment delay t.
Optionally, by phase shift driver, phase is introduced between corresponding speckle interference figure of adjacent Transient deformation period
Poor x；
By angular encoder and camera trigger circuit, the camera is controlled according to the default Timing acquisition speckle interference
Figure.
Optionally, the speckle interference gauge head is speckle-shearing interferometry gauge head.
The embodiment of the present application also provides a kind of measuring devices of Transient deformation, including：
Laser irradiates measured object for shoot laser, wherein periodical Transient deformation is presented in the measured object；
Speckle interference gauge head, for receiving the reflected light reflected through the measured object, and according to the reflected light shape
At speckle interference；
The speckle interference gauge head is additionally operable to export the speckle interference set of graphs obtained according to default Timing acquisition, wherein
The speckle interference set of graphs is by being sampled to each position on time shaft in the Transient deformation period；
Image processing module, for according to the speckle interference set of graphs, determining the measured object in the Transient deformation period
Inside there is the deformation position and/or deformation quantity of Transient deformation.
Optionally, the speckle interference gauge head includes one of the following：
Speckle interference gauge head based on time-phase displacement technology, the speckle interference gauge head based on spatial carrier technology.
Optionally, when the speckle interference gauge head is the speckle interference gauge head based on time-phase displacement technology, time phase
The phase shift step number of shifting technology is N, step-length x；
The speckle interference gauge head further comprises：
Camera, at leastIn a continuous Transient deformation period, according to the default Timing acquisition speckle interference
Figure；
Wherein, t is the exposure time of the camera, and n is the sampling frame per second of the camera；
Phase difference between adjacent Transient deformation period corresponding speckle interference figure is x；
The sampling start time in i-th of Transient deformation period to the i-th+N-1 Transient deformation periods is identical；
Corresponding sampling start time in i-th+N number of Transient deformation period, than i-th Transient deformation period, corresponding sampling was opened
Begin moment delay t.
Optionally, described device further includes：
Phase shift driver, for introducing phase difference x between corresponding speckle interference figure of adjacent Transient deformation period；
Angular encoder and camera trigger circuit, for controlling the camera according to the default Timing acquisition speckle interference
Figure.
Optionally, the speckle interference gauge head is speckle-shearing interferometry gauge head.
Above-mentioned at least one technical solution that the embodiment of the present application uses can reach following advantageous effect：
The measured object of periodical Transient deformation is presented in laser emitting laser irradiation, and speckle interference gauge head is received through measured object
Obtained reflected light is reflected, speckle interference is formed according to reflected light, and export the speckle interference obtained according to default Timing acquisition
Set of graphs, wherein the speckle interference set of graphs is by being adopted to each position on time shaft in the Transient deformation period
What sample obtained, and then image processing module determines that measured object goes out within the Transient deformation period according to the speckle interference set of graphs
The deformation position and/or deformation quantity of existing Transient deformation.By being carried out to each position on time shaft in the Transient deformation period
The sampling of speckle interference figure carrys out measurement period Transient deformation, can effectively improve measuring speed, reduces time of measuring.
Description of the drawings
Attached drawing described herein is used for providing further understanding of the present application, constitutes part of this application, this Shen
Illustrative embodiments and their description please do not constitute the improper restriction to the application for explaining the application.In the accompanying drawings：
Fig. 1 is a kind of flow diagram of the measurement method of Transient deformation provided by the embodiments of the present application；
Fig. 2 is a kind of schematic diagram of the optical path of Transient deformation provided by the embodiments of the present application；
Fig. 3 is the sampling schematic diagram of the speckle interference figure provided by the embodiments of the present application based on three step phase-shifting techniques；
Fig. 4 is the time diagram of angular encoder z phase signals and camera trigger signal provided by the embodiments of the present application；
Fig. 5 is a kind of structural schematic diagram of the measuring device of Transient deformation provided by the embodiments of the present application.
Specific implementation mode
Technical scheme is clearly and completely retouched with reference to the application specific embodiment and corresponding attached drawing
It states.Obviously, the described embodiments are only a part but not all of the embodiments of the present application.Based in the application
Embodiment, every other embodiment obtained by those of ordinary skill in the art without making creative efforts,
It shall fall in the protection scope of this application.
Below in conjunction with attached drawing, the technical solution that each embodiment of the application provides is described in detail.
Embodiment 1
Fig. 1 is a kind of flow diagram of the measurement method of Transient deformation provided by the embodiments of the present application.The method can
With as follows.
Step 102：Laser emitting laser irradiation measured object, wherein periodical Transient deformation is presented in measured object.
Step 104：Speckle interference gauge head receives the reflected light reflected through measured object, and forms speckle according to reflected light
Interference.
Step 106：Speckle interference gauge head exports the speckle interference set of graphs obtained according to default Timing acquisition, wherein dissipates
Spot interferes set of graphs to be by being sampled to each position on time shaft in the Transient deformation period.
In the embodiment of the present application, speckle interference gauge head is speckle-shearing interferometry gauge head.
It should be noted that speckle interference gauge head can also be other other than it can be speckle-shearing interferometry gauge head
Speckle interference gauge head (for example, common electronic speckle interference gauge head), be not specifically limited here.
It is following to be illustrated by taking speckle-shearing interferometry gauge head as an example.
Before being measured to the measured object that there is periodical Transient deformation, the optical path of Transient deformation is built.
Fig. 2 is a kind of schematic diagram of the optical path of Transient deformation provided by the embodiments of the present application.
As shown in Fig. 2, light path includes：Laser, speckle-shearing interferometry gauge head (referred to as, gauge head), beam expander, angle are compiled
Code device, camera trigger circuit (referred to as, trigger circuit), computer (PC).
Laser emitting laser, laser illuminate measured object after being expanded through beam expander, wherein periodical wink is presented in measured object
State deforms.The reflected light that laser obtains later through measured object reflection is irradiated to speckle-shearing interferometry gauge head so that cutting speckle is dry
After relating to gauge head reception reflected light, big speckle-shearing interferometry is formed according to reflected light.
Speckle-shearing interferometry gauge head forms big speckle-shearing interferometry, and the absolute deformation to periodical Transient deformation may be implemented
The measurement of amount.
In the embodiment of the present application, speckle interference gauge head includes one of the following：
Speckle interference gauge head based on time-phase displacement technology, the speckle interference gauge head based on spatial carrier technology.
Speckle interference gauge head based on different technologies can become transient state with realizing by setting different sampling time sequences
Each position in the shape period on time shaft carries out the sampling of speckle interference figure.
For example, the speckle interference gauge head based on spatial carrier technology, at leastIn a continuous Transient deformation period, dissipate
Spot interferes the camera in gauge head to acquire speckle interference figure according to default sampling time sequence；
Wherein, corresponding sampling start time in i+1 Transient deformation period, than i-th Transient deformation period are corresponding
It samples start time delay t, t and is equal to the exposure time of camera.
It is following by taking the speckle interference gauge head based on time-phase displacement technology as an example, be described in detail measurement period Transient deformation when
Speckle interference figure sampling process.
In the embodiment of the present application, when speckle interference gauge head is the speckle interference gauge head based on time-phase displacement technology, time phase
The phase shift step number of shifting technology is N, step-length x；
Speckle interference gauge head exports the speckle interference set of graphs obtained according to default Timing acquisition, including：
At leastIn a continuous Transient deformation period, the camera in speckle interference gauge head is according to default Timing acquisition
Speckle interference figure；
Wherein, t is the exposure time of camera, and n is the sampling frame per second of camera；
Phase difference between adjacent Transient deformation period corresponding speckle interference figure is x；
The sampling start time in i-th of Transient deformation period to the i-th+N-1 Transient deformation periods is identical；
Corresponding sampling start time in i-th+N number of Transient deformation period, than i-th Transient deformation period, corresponding sampling was opened
Begin moment delay t.
Since the Transient deformation of measured object is presented periodically, each transient state can be become using time-phase displacement technology
The shape period executes corresponding phase shift respectively, and the phase difference between adjacent Transient deformation period corresponding speckle interference figure is time phase
The step-length of shifting technology.For example, when using three step phase-shifting techniques, step-length is 120 °, then the adjacent Transient deformation period is corresponding scattered
Phase difference between spot interference pattern is 120 °；When using four-step phase-shifting technology, step-length is 90 °, then the adjacent Transient deformation period
Phase difference between corresponding speckle interference figure is 90 °.
Fig. 3 is the sampling schematic diagram of the speckle interference figure provided by the embodiments of the present application based on three step phase-shifting techniques.
As shown in figure 3, the phase shift step number of three step phase-shifting techniques is 3, step-length is 120 °.The exposure time of camera is t.
Within first Transient deformation period (referred to as, period 1), phase shift is 0 °；Second Transient deformation period
In (referred to as, second round), phase shift is 120 °；Within the third Transient deformation period (referred to as, period 3), phase shift is
240°；In 4th Transient deformation period (referred to as, period 4), phase shift is 0 °, and so on.
The sampling start time in first Transient deformation period to third Transient deformation period is identical；4th transient state becomes
The sampling start time in shape period to the 6th Transient deformation period is identical；The rest may be inferred.
For 4th Transient deformation cycle phase for first Transient deformation period, sampling start time postpones t；7th
For a Transient deformation cycle phase for the 4th Transient deformation period, sampling start time postpones t；The rest may be inferred.
In the embodiment of the present application, by phase shift driver, between corresponding speckle interference figure of adjacent Transient deformation period
Introduce phase difference x.
Optionally, phase shift driver is piezoelectric ceramics.
It should be noted that phase shift driver other than it can be piezoelectric ceramics, can also be that other can realize phase
The phase shift driver of shifting, is not specifically limited here.
It, can be with it should be noted that time-phase displacement technology can be traditional three step phase-shifting techniques, four-step phase-shifting technology etc.
It is 4+1 phase-shifting techniques, can also be other phase-shifting techniques, be not specifically limited here.
According to the step number of time-phase displacement technology, to determine the sampling time sequence of camera, when realizing in the Transient deformation period
Each position on countershaft carries out speckle interference figure sampling.
In the embodiment of the present application, by angular encoder and camera trigger circuit, control camera is according to default Timing acquisition
Speckle interference figure.
By angular encoder and camera trigger circuit, control camera is according to default Timing acquisition speckle interference figure so that
Each position in the Transient deformation period on time shaft can be traversed to the sampling of speckle interference figure, obtain speckle interference atlas
It closes.
Camera trigger circuit is the circuit for triggering camera and being sampled to speckle interference figure.
It is in 1s there are the Transient deformation of 100 μ s in the period for example, the Transient deformation of measured object is, when the exposure of camera
A length of 150 μ s.
The resolution ratio of angular encoder is 2000P/R, there is the output of A, B, Z three-phase.Control motor speed is 1R/s so that angle
2000 pulses of output per second of encoder A phases are spent, i.e. A phase signals are 2000Hz.
The input of camera trigger circuit is the output of angular encoder, and camera trigger circuit starts after receiving computer instruction
Work starts defeated after being divided to A phase signals five after waiting for first complete cycle Z phase signals of angular encoder, Z phase signals to reach
Go out, i.e. 400Hz, the frame rate of camera is made to reach 400fps by way of reducing resolution ratio, is i.e. the frame period is 2.5ms.
In order to traverse each position in the Transient deformation period on time shaft, every N number of Transient deformation period, phase
Be delayed t between the trigger signal and Z phase signals of machine trigger circuit, wherein the phase shift step number phase of the size of N and time-phase displacement technology
Together, the size of t and the exposure time of camera are identical.
For example, according to three step phase-shifting techniques, the exposure time of camera is 150 μ s, then every 3 Transient deformation periods,
Be delayed 150 μ s between the trigger signal and Z phase signals of camera trigger circuit, that is, realizes every 3 Transient deformation periods, camera
Sample 150 μ s of start time delay.
In order to traverse each position in the Transient deformation period on time shaft, camera is needed at leastIt is a continuous
The Transient deformation period in, according to default Timing acquisition speckle interference figure.
It is in 1s there are the Transient deformation of 100 μ s in the period for example, the Transient deformation of measured object is, when the exposure of camera
The frame per second of a length of t=150 μ s, camera are n=400fps.Speckle interference is carried out based on three step phase-shifting techniques (phase shift step number N=3)
When figure sampling, in order to traverse each position in the Transient deformation period on time shaft, then camera is needed at leastIn a continuous Transient deformation period, according to default Timing acquisition speckle interference figure.This 51
In a continuous Transient deformation period, angular encoder z phase signals and camera trigger signal are as shown in Figure 4.Fig. 4 is that the application is real
The time diagram of the angular encoder z phase signals and camera trigger signal of example offer is provided.Synchronous triggering signal shown in Fig. 4 is
Camera trigger signal.
The Transient deformation period of measured object is T, and the frame per second of camera is n, then within each Transient deformation period, camera acquisition
N × T width speckle interference figures.
Still by taking above-mentioned Fig. 4 as an example, within 51 continuous Transient deformation periods, camera needs to acquire n × T × 51=in total
400 × 1 × 51=20400 width speckle interference figures, obtain speckle interference set of graphs.
According to above-mentioned steps 102~106, the sampling duration of speckle interference figure can be reduced to minute rank or even shorter,
Significantly reduce the measurement duration of Transient deformation.
Step 108：Image processing module determines that measured object occurs within the Transient deformation period according to speckle interference set of graphs
The deformation position and/or deformation quantity of Transient deformation.
Image processing module carries out image procossing to speckle interference set of graphs, including：Phase calculation, phase diagram filtering, phase
The processes such as position unpacking, Three-dimensional Display.
It should be noted that image processing module can be computer shown in Fig. 2, can also be for carrying out image
The software of processing can also be that other can carry out the image processing module of image procossing, be not specifically limited here.
Still by taking above-mentioned Fig. 4 as an example, for the speckle interference atlas sampled within 51 continuous Transient deformation periods
It closes：For the 1st width figure in first Transient deformation period, the 1st width figure in second Transient deformation period, third Transient deformation
The 1st width figure in period calculates phase according to 3 step phase shift algorithms；For first Transient deformation period the 2nd width figure, second
2nd width figure, the 2nd width figure in third Transient deformation period in a Transient deformation period, calculate also according to 3 step phase shift algorithms
Phase；Then, then first three will calculate 400 amplitude phase diagrams in Transient deformation period.Then by 400 amplitude phase diagrams
Sequence subtracts each other the phase difference figure that can find out next position and a upper position.
Similarly, fourth, fifth, six Transient deformation period of 150 μ s of sampling start time delay can also calculate 400 width
Phase diagram, and so on, until the 49th, 50,51 Transient deformation period, phase diagram can traverse the measured object period
All positions during Transient deformation on time shaft.
The phase diagram sequence that every three computation of Period come out is subtracted each other, the position for the phase difference figure of striped occur is transient state
The position of the beginning of deformation, the phase difference figure that striped disappears just means that Transient deformation terminates.
By the way that there are the phase difference figures of striped to carry out unpacking, the deformation during measured object Transient deformation can be obtained
Amount.
The tested of periodical Transient deformation is presented in the technical solution that the embodiment of the present application is recorded, laser emitting laser irradiation
Object, speckle interference gauge head receive the reflected light that is reflected through measured object, and speckle interference is formed according to reflected light, and export according to
The speckle interference set of graphs that default Timing acquisition obtains, wherein the speckle interference set of graphs is by the Transient deformation period
What each position on time shaft was sampled, and then image processing module is according to the speckle interference set of graphs, really
Determine measured object and occurs the deformation position of Transient deformation and/or deformation quantity within the Transient deformation period.By to the Transient deformation period
Each position on interior time shaft carries out the sampling of speckle interference figure and carrys out measurement period Transient deformation, can effectively improve measurement
Speed reduces time of measuring.
Embodiment 2
Fig. 5 is a kind of structural schematic diagram of the measuring device of Transient deformation provided by the embodiments of the present application.Dress shown in fig. 5
Setting 500 includes：
Laser 501 irradiates measured object for shoot laser, wherein periodical Transient deformation is presented in measured object；
Speckle interference gauge head 502 forms speckle for receiving the reflected light reflected through measured object, and according to reflected light
Interference；
Speckle interference gauge head 502 is additionally operable to export the speckle interference set of graphs obtained according to default Timing acquisition, wherein
Speckle interference set of graphs is by being sampled to each position on time shaft in the Transient deformation period；
Image processing module 503, for according to speckle interference set of graphs, determining that measured object occurs within the Transient deformation period
The deformation position and/or deformation quantity of Transient deformation.
Optionally, speckle interference gauge head includes one of the following：
Speckle interference gauge head based on time-phase displacement technology, the speckle interference gauge head based on spatial carrier technology.
Optionally, when speckle interference gauge head is the speckle interference gauge head based on time-phase displacement technology, time-phase displacement technology
Phase shift step number is N, step-length x；
Shearing electronic speckle interference gauge head 502 further comprises：
Camera, at leastIn a continuous Transient deformation period, according to default Timing acquisition speckle interference figure；
Wherein, t is the exposure time of camera, and n is the sampling frame per second of camera；
Phase difference between adjacent Transient deformation period corresponding speckle interference figure is x；
The sampling start time in i-th of Transient deformation period to the i-th+N-1 Transient deformation periods is identical；
Corresponding sampling start time in i-th+N number of Transient deformation period, than i-th Transient deformation period, corresponding sampling was opened
Begin moment delay t.
Optionally, device 500 further includes：
Phase shift driver, for introducing phase difference x between corresponding speckle interference figure of adjacent Transient deformation period；
Angular encoder and camera trigger circuit, for controlling camera according to default Timing acquisition speckle interference figure.
According to the measuring device of Transient deformation, laser irradiates measured object for shoot laser, wherein week is presented in measured object
Phase property Transient deformation；Speckle interference gauge head is formed according to reflected light scattered for receiving the reflected light reflected through measured object
Spot is interfered；Speckle interference gauge head is additionally operable to export the speckle interference set of graphs obtained according to default Timing acquisition, wherein speckle is dry
It is by being sampled to each position on time shaft in the Transient deformation period to relate to set of graphs；Image processing module
For according to speckle interference set of graphs, determine measured object occur within the Transient deformation period deformation position of Transient deformation and/or
Deformation quantity.It is sampled come measurement period by carrying out speckle interference figure to each position on time shaft in the Transient deformation period
Transient deformation can effectively improve measuring speed, reduce time of measuring.
In the 1990s, the improvement of a technology can be distinguished clearly be on hardware improvement (for example,
Improvement to circuit structures such as diode, transistor, switches) or software on improvement (improvement for method flow).So
And with the development of technology, the improvement of current many method flows can be considered as directly improving for hardware circuit.
Designer nearly all obtains corresponding hardware circuit by the way that improved method flow to be programmed into hardware circuit.Cause
This, it cannot be said that the improvement of a method flow cannot be realized with hardware entities module.For example, programmable logic device
(Programmable Logic Device, PLD) (such as field programmable gate array (Field Programmable Gate
Array, FPGA)) it is exactly such a integrated circuit, logic function determines device programming by user.By designer
Voluntarily programming comes a digital display circuit " integrated " on a piece of PLD, designs and makes without asking chip maker
Dedicated IC chip.Moreover, nowadays, substitution manually makes IC chip, this programming is also used instead mostly " patrols
Volume compiler (logic compiler) " software realizes that software compiler used is similar when it writes with program development,
And the source code before compiling also write by handy specific programming language, this is referred to as hardware description language
(Hardware Description Language, HDL), and HDL is also not only a kind of, but there are many kind, such as ABEL
(Advanced Boolean Expression Language)、AHDL(Altera Hardware Description
Language)、Confluence、CUPL(Cornell University Programming Language)、HDCal、JHDL
(Java Hardware Description Language)、Lava、Lola、MyHDL、PALASM、RHDL(Ruby
Hardware Description Language) etc., VHDL (Very-High-Speed are most generally used at present
Integrated Circuit Hardware Description Language) and Verilog.Those skilled in the art also answer
This understands, it is only necessary to method flow slightly programming in logic and is programmed into integrated circuit with above-mentioned several hardware description languages,
The hardware circuit for realizing the logical method flow can be readily available.
Controller can be implemented in any suitable manner, for example, controller can take such as microprocessor or processing
The computer for the computer readable program code (such as software or firmware) that device and storage can be executed by (micro-) processor can
Read medium, logic gate, switch, application-specific integrated circuit (Application Specific Integrated Circuit,
ASIC), the form of programmable logic controller (PLC) and embedded microcontroller, the example of controller includes but not limited to following microcontroller
Device：ARC 625D, Atmel AT91SAM, Microchip PIC18F26K20 and Silicone Labs C8051F320, are deposited
Memory controller is also implemented as a part for the control logic of memory.It is also known in the art that in addition to
Pure computer readable program code mode is realized other than controller, can be made completely by the way that method and step is carried out programming in logic
Controller is obtained in the form of logic gate, switch, application-specific integrated circuit, programmable logic controller (PLC) and embedded microcontroller etc. to come in fact
Existing identical function.Therefore this controller is considered a kind of hardware component, and to including for realizing various in it
The device of function can also be considered as the structure in hardware component.Or even, it can will be regarded for realizing the device of various functions
For either the software module of implementation method can be the structure in hardware component again.
System, device, module or the unit that above-described embodiment illustrates can specifically realize by computer chip or entity,
Or it is realized by the product with certain function.It is a kind of typically to realize that equipment is computer.Specifically, computer for example may be used
Think personal computer, laptop computer, cellular phone, camera phone, smart phone, personal digital assistant, media play
It is any in device, navigation equipment, electronic mail equipment, game console, tablet computer, wearable device or these equipment
The combination of equipment.
For convenience of description, it is divided into various units when description apparatus above with function to describe respectively.Certainly, implementing this
The function of each unit is realized can in the same or multiple software and or hardware when application.
It should be understood by those skilled in the art that, embodiments herein can be provided as method, system or computer program
Product.Therefore, complete hardware embodiment, complete software embodiment or reality combining software and hardware aspects can be used in the application
Apply the form of example.Moreover, the application can be used in one or more wherein include computer usable program code computer
The computer program production implemented in usable storage medium (including but not limited to magnetic disk storage, CD-ROM, optical memory etc.)
The form of product.
The application is with reference to method, the flow of equipment (system) and computer program product according to the embodiment of the present application
Figure and/or block diagram describe.It should be understood that can be realized by computer program instructions every first-class in flowchart and/or the block diagram
The combination of flow and/or box in journey and/or box and flowchart and/or the block diagram.These computer programs can be provided
Instruct the processor of all-purpose computer, special purpose computer, Embedded Processor or other programmable data processing devices to produce
A raw machine so that the instruction executed by computer or the processor of other programmable data processing devices is generated for real
The device for the function of being specified in present one flow of flow chart or one box of multiple flows and/or block diagram or multiple boxes.
These computer program instructions, which may also be stored in, can guide computer or other programmable data processing devices with spy
Determine in the computer-readable memory that mode works so that instruction generation stored in the computer readable memory includes referring to
Enable the manufacture of device, the command device realize in one flow of flow chart or multiple flows and/or one box of block diagram or
The function of being specified in multiple boxes.
These computer program instructions also can be loaded onto a computer or other programmable data processing device so that count
Series of operation steps are executed on calculation machine or other programmable devices to generate computer implemented processing, in computer or
The instruction executed on other programmable devices is provided for realizing in one flow of flow chart or multiple flows and/or block diagram one
The step of function of being specified in a box or multiple boxes.
In a typical configuration, computing device includes one or more processors (CPU), input/output interface, net
Network interface and memory.
Memory may include computer-readable medium in volatile memory, random access memory (RAM) and/or
The forms such as Nonvolatile memory, such as read-only memory (ROM) or flash memory (flash RAM).Memory is computer-readable medium
Example.
Computer-readable medium includes permanent and non-permanent, removable and non-removable media can be by any method
Or technology realizes information storage.Information can be computer-readable instruction, data structure, the module of program or other data.
The example of the storage medium of computer includes, but are not limited to phase transition internal memory (PRAM), static RAM (SRAM), moves
State random access memory (DRAM), other kinds of random access memory (RAM), read-only memory (ROM), electric erasable
Programmable read only memory (EEPROM), fast flash memory bank or other memory techniques, read-only disc read only memory (CD-ROM) (CD-ROM),
Digital versatile disc (DVD) or other optical storages, magnetic tape cassette, tape magnetic disk storage or other magnetic storage apparatus
Or any other non-transmission medium, it can be used for storage and can be accessed by a computing device information.As defined in this article, it calculates
Machine readable medium does not include temporary computer readable media (transitory media), such as data-signal and carrier wave of modulation.
It should also be noted that, the terms "include", "comprise" or its any other variant are intended to nonexcludability
Including so that process, method, commodity or equipment including a series of elements include not only those elements, but also wrap
Include other elements that are not explicitly listed, or further include for this process, method, commodity or equipment intrinsic want
Element.In the absence of more restrictions, the element limited by sentence "including a ...", it is not excluded that wanted including described
There is also other identical elements in the process of element, method, commodity or equipment.
The application can describe in the general context of computer-executable instructions executed by a computer, such as program
Module.Usually, program module includes routines performing specific tasks or implementing specific abstract data types, program, object, group
Part, data structure etc..The application can also be put into practice in a distributed computing environment, in these distributed computing environments, by
Task is executed by the connected remote processing devices of communication network.In a distributed computing environment, program module can be with
In the local and remote computer storage media including storage device.
Each embodiment in this specification is described in a progressive manner, identical similar portion between each embodiment
Point just to refer each other, and each embodiment focuses on the differences from other embodiments.Especially for system reality
For applying example, since it is substantially similar to the method embodiment, so description is fairly simple, related place is referring to embodiment of the method
Part explanation.
Above is only an example of the present application, it is not intended to limit this application.For those skilled in the art
For, the application can have various modifications and variations.It is all within spirit herein and principle made by any modification, equivalent
Replace, improve etc., it should be included within the scope of claims hereof.
Claims (10)
1. a kind of measurement method of Transient deformation, which is characterized in that including：
Laser emitting laser irradiation measured object, wherein periodical Transient deformation is presented in the measured object；
Speckle interference gauge head receives the reflected light reflected through the measured object, and forms speckle according to the reflected light and do
It relates to；
The speckle interference gauge head exports the speckle interference set of graphs obtained according to default Timing acquisition, wherein the speckle is dry
It is by being sampled to each position on time shaft in the Transient deformation period to relate to set of graphs；
Image processing module determines that the measured object transient state occurs within the Transient deformation period according to the speckle interference set of graphs
The deformation position and/or deformation quantity of deformation.
2. the method as described in claim 1, which is characterized in that the speckle interference gauge head includes one of the following：
Speckle interference gauge head based on time-phase displacement technology, the speckle interference gauge head based on spatial carrier technology.
3. method as claimed in claim 2, which is characterized in that the speckle interference gauge head is described based on time-phase displacement technology
Speckle interference gauge head when, the phase shift step number of time-phase displacement technology is N, step-length x；
The speckle interference gauge head exports the speckle interference set of graphs obtained according to default Timing acquisition, including：
At leastIn a continuous Transient deformation period, the camera in the speckle interference gauge head is adopted according to the default sequential
Collect speckle interference pattern；
Wherein, t is the exposure time of the camera, and n is the sampling frame per second of the camera；
Phase difference between adjacent Transient deformation period corresponding speckle interference figure is x；
The sampling start time in i-th of Transient deformation period to the i-th+N-1 Transient deformation periods is identical；
Corresponding sampling start time in i-th+N number of Transient deformation period, when the corresponding sampling of than i-th Transient deformation period starts
Carve delay t.
4. method as claimed in claim 3, which is characterized in that by phase shift driver, corresponded in the adjacent Transient deformation period
Speckle interference figure between introduce phase difference x；
By angular encoder and camera trigger circuit, the camera is controlled according to the default Timing acquisition speckle interference figure.
5. such as Claims 1 to 4 any one of them method, which is characterized in that the speckle interference gauge head is dry for cutting speckle
Relate to gauge head.
6. a kind of measuring device of Transient deformation, which is characterized in that including：
Laser irradiates measured object for shoot laser, wherein periodical Transient deformation is presented in the measured object；
Speckle interference gauge head for receiving the reflected light reflected through the measured object, and is formed according to the reflected light scattered
Spot is interfered；
The speckle interference gauge head is additionally operable to export the speckle interference set of graphs obtained according to default Timing acquisition, wherein described
Speckle interference set of graphs is by being sampled to each position on time shaft in the Transient deformation period；
Image processing module, for according to the speckle interference set of graphs, determining that the measured object goes out within the Transient deformation period
The deformation position and/or deformation quantity of existing Transient deformation.
7. device as claimed in claim 6, which is characterized in that the speckle interference gauge head includes one of the following：
Speckle interference gauge head based on time-phase displacement technology, the speckle interference gauge head based on spatial carrier technology.
8. device as claimed in claim 7, which is characterized in that the speckle interference gauge head is described based on time-phase displacement technology
Speckle interference gauge head when, the phase shift step number of time-phase displacement technology is N, step-length x；
The speckle interference gauge head further comprises：
Camera, at leastIn a continuous Transient deformation period, according to the default Timing acquisition speckle interference figure；
Wherein, t is the exposure time of the camera, and n is the sampling frame per second of the camera；
Phase difference between adjacent Transient deformation period corresponding speckle interference figure is x；
The sampling start time in i-th of Transient deformation period to the i-th+N-1 Transient deformation periods is identical；
Corresponding sampling start time in i-th+N number of Transient deformation period, when the corresponding sampling of than i-th Transient deformation period starts
Carve delay t.
9. device as claimed in claim 7, which is characterized in that further include：
Phase shift driver, for introducing phase difference x between corresponding speckle interference figure of adjacent Transient deformation period；
Angular encoder and camera trigger circuit, for controlling the camera according to the default Timing acquisition speckle interference figure.
10. such as claim 6~9 any one of them device, which is characterized in that the speckle interference gauge head is dry for cutting speckle
Relate to gauge head.
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