CN111006661B - A measuring method and measuring device for eliminating dead time of cold atom interferometer - Google Patents

A measuring method and measuring device for eliminating dead time of cold atom interferometer Download PDF

Info

Publication number
CN111006661B
CN111006661B CN201911309241.3A CN201911309241A CN111006661B CN 111006661 B CN111006661 B CN 111006661B CN 201911309241 A CN201911309241 A CN 201911309241A CN 111006661 B CN111006661 B CN 111006661B
Authority
CN
China
Prior art keywords
laser
type
switch
interference
cooling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201911309241.3A
Other languages
Chinese (zh)
Other versions
CN111006661A (en
Inventor
姚战伟
陈红辉
鲁思滨
李润兵
王谨
詹明生
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wuhan Institute of Physics and Mathematics of CAS
Original Assignee
Wuhan Institute of Physics and Mathematics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wuhan Institute of Physics and Mathematics of CAS filed Critical Wuhan Institute of Physics and Mathematics of CAS
Priority to CN201911309241.3A priority Critical patent/CN111006661B/en
Publication of CN111006661A publication Critical patent/CN111006661A/en
Application granted granted Critical
Publication of CN111006661B publication Critical patent/CN111006661B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C21/00—Navigation; Navigational instruments not provided for in groups G01C1/00 - G01C19/00
    • G01C21/10—Navigation; Navigational instruments not provided for in groups G01C1/00 - G01C19/00 by using measurements of speed or acceleration
    • G01C21/12—Navigation; Navigational instruments not provided for in groups G01C1/00 - G01C19/00 by using measurements of speed or acceleration executed aboard the object being navigated; Dead reckoning
    • G01C21/16—Navigation; Navigational instruments not provided for in groups G01C1/00 - G01C19/00 by using measurements of speed or acceleration executed aboard the object being navigated; Dead reckoning by integrating acceleration or speed, i.e. inertial navigation

Landscapes

  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Automation & Control Theory (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

本发明公开了一种消除冷原子干涉仪死时间的测量装置，包括原子干涉仪物理系统，原子干涉仪物理系统包括原子冷却区域、原子选态区域、原子干涉区域和原子探测区域，原子冷却区域中包含第一类原子和第二类原子，冷却激光开关切换控制第一冷却激光和第二冷却激光入射原子冷却区域，选态激光开关切换控制第一选态激光和第二选态激光入射原子选态区域，干涉激光开关切换控制第一干涉激光和第二干涉激光入射原子干涉区域，探测激光开关切换控制第一探测激光和第二探测激光入射到原子探测区域。本发明还公开了一种消除冷原子干涉仪死时间的测量方法。本发明可以实现无死时间的测量，减小各个过程之间串扰引起的灵敏度降低。

Figure 201911309241

The invention discloses a measuring device for eliminating the dead time of a cold atom interferometer. It contains the first type of atoms and the second type of atoms, and the switching of the cooling laser switches controls the first cooling laser and the second cooling laser to enter the atomic cooling area, and the switching of the selective laser switches controls the first selected laser and the second selected laser to enter the atoms. In the state selection region, the switching of the interference laser controls the first interference laser and the second interference laser to enter the atomic interference region, and the switching of the detection laser controls the first detection laser and the second detection laser to enter the atomic detection region. The invention also discloses a measurement method for eliminating the dead time of the cold atom interferometer. The invention can realize the measurement without dead time, and reduce the sensitivity reduction caused by the crosstalk between the various processes.

Figure 201911309241

Description

Measurement method and measurement device for eliminating dead time of cold atom interferometer
Technical Field
The invention relates to the technical field of atomic inertia measurement, in particular to a measurement method for eliminating dead time of a cold atom interferometer and a measurement device for eliminating the dead time of the cold atom interferometer.
Background
The dead time of the cold atom interferometer has an important influence on the accuracy of inertial navigation, and the dead time can influence the accuracy of inertial navigation. The cold atom interferometer has a part of the time during the measurement process, which is called the dead time of the atom interferometer, during which the quantity to be measured cannot be measured. In the inertial navigation application, inertial information of a carrier needs to be acquired in real time, and position and attitude information required by navigation is acquired through a navigation algorithm. Dead time in the measurement process of the cold atom interferometer can cause the loss of output information of the inertial sensor and increase navigation measurement errors.
Dead time can be reduced or shortened by designing a proper interferometer configuration, the dead time of the fountain clock is eliminated by adopting two groups of interferometers to work alternately by G.W.Biedermann et al, and dead time-free interferometry is realized by adopting a butt-joint interference method by M.Meuneier et al. The two groups of interferometers increase the volume of the system, are not beneficial to the miniaturization of the interferometers, and meanwhile, the factors such as gravity, magnetic field gradient and the like influence the measurement result due to the separation of the space; the measurement is carried out by adopting a cross interference method, and the coherence of atomic interference can be destroyed in the processes of laser cooling, detection and the like, so that the measurement result of the interferometer is influenced.
Disclosure of Invention
The invention aims to solve the problems in the existing measuring method for eliminating the dead time of an atom interferometer, and provides a measuring device for eliminating the dead time of a cold atom interferometer.
The above object of the present invention is achieved by the following technical solutions:
a measuring device for eliminating cold atom interferometer dead time comprises an atom interferometer physical system, wherein the atom interferometer physical system comprises an atom cooling region, an atom state selection region, an atom interference region and an atom detection region, the atom cooling region comprises a first type of atom and a second type of atom,
the cooling laser switch switches and controls the first cooling laser and the second cooling laser to enter the atom cooling area, the state selection laser switch switches and controls the first state selection laser and the second state selection laser to enter the atom state selection area, the interference laser switch switches and controls the first interference laser and the second interference laser to enter the atom interference area, and the detection laser switch switches and controls the first detection laser and the second detection laser to enter the atom detection area.
Six cooling light fiber collimating mirrors are fixed on the outer side of the atomic cooling area, a pair of state-selecting light fiber collimating mirrors are fixed on the outer side of the atomic state-selecting area, three pairs of interference light fiber collimating mirrors are fixed on the outer side of the atomic interference area, a pair of detection light fiber collimating mirrors are fixed on the outer side of the atomic detection area,
the first cooling laser and the second cooling laser are switched by a cooling laser switch to enter a first optical splitter, and the first cooling laser or the second cooling laser enters 6 optical fibers respectively connected with 6 cooling optical fiber collimating lenses through the first optical splitter;
the first state-selection laser and the second state-selection laser are switched by a state-selection laser switch to enter a second optical splitter, and the first state-selection laser or the second state-selection laser enters 2 beams of optical fibers which are respectively connected with a pair of state-selection optical fiber collimating lenses through the second optical splitter;
the first interference laser and the second interference laser are switched by an interference laser switch to enter a third optical splitter, and the first interference laser or the second interference laser enters 6 bundles of optical fibers which are respectively connected with three pairs of interference light optical fiber collimating mirrors through the third optical splitter;
the first detection laser and the second detection laser are switched to enter the fourth optical coupler through the detection laser switch, and the first detection laser or the second detection laser enters the 2 bundles of optical fibers which are respectively connected with the pair of detection optical fiber collimating mirrors through the fourth optical coupler.
A measurement method for eliminating dead time of a cold atom interferometer comprises the following steps:
step 1, placing a measuring device for eliminating the dead time of the cold atom interferometer on a rotary table, and rotating the rotary table at a fixed rotating speed omega to facilitateRecording the measurement phase phi during interferometric measurements with atoms of the first type1Recording the measurement phase phi during interferometric measurements with atoms of the second type2Separately calculating the scale factor K1And a scale factor K2，
Figure BDA0002324060480000021
Wherein omega1And Ω2Respectively carrying out interference measurement on the first type of atoms and the second type of atoms;
step 2, firstly, controlling a cooling laser switch to switch a first cooling laser to enter an atom cooling area to cool a first type of atoms, then controlling the frequency of the first cooling laser, transferring the first type of atoms into an atom state selection area, controlling a state selection laser switch to switch the first state selection laser to enter the atom state selection area to select the first type of atoms, and controlling an interference laser switch to switch the first interference laser to enter the atom interference area to interfere the first type of atoms after the first type of atoms enter the atom interference area;
step 3, controlling a cooling laser switch to switch a second cooling laser to enter an atom cooling area to cool a second atom while the first atom starts to interfere, controlling the frequency of the second cooling laser after cooling, transferring the second atom to an atom state selection area, controlling a state selection laser switch to switch the second state selection laser to enter the atom state selection area to select a second atom, controlling the interference laser switch to switch the second interference laser to enter the atom interference area to interfere the second atom after the state selection is completed, and controlling the interference laser switch to switch the second interference laser to enter the atom interference area to interfere the second atom when the first atom finishes interfering;
step 4, when the second type of atoms interfere, controlling a detection laser switch to switch a first detection laser to enter an atom detection area to detect the first type of atoms to obtain a measurement phase phin1Then controlling a cooling laser switch to switch a first cooling laser into the atom cooling area for the first type of atomsCooling, controlling the frequency of a first cooling laser after cooling, transferring a first type of atoms into an atom state selection area, controlling a state selection laser switch to switch a first state selection laser to enter the atom state selection area to select a first type of atoms, controlling an interference laser switch to switch a first interference laser to enter the atom interference area to interfere the first type of atoms when a second type of atoms finishes interference, and controlling a detection laser switch to switch a second detection laser to enter the atom detection area to detect the second type of atoms when the first type of atoms interferes to obtain a measurement phase phin2N is the number of times of repeating the step 3 and the step 4;
step 5, repeating the step 3 and the step 4, always keeping the first kind of atoms or the second kind of atoms in an interference measurement state, and recording a measurement phase phi obtained by the interference measurement of the first kind of atoms in real timen1Recording the measured phase phi obtained by the interference measurement of the second kind of atoms in real timen2；
Step 6, calculating a rotation measurement value omegajWherein
Figure BDA0002324060480000031
Compared with the prior art, the invention has the following beneficial effects:
the invention provides a double-component atom-based interference measurement scheme, which can control atoms of two components in a same vacuum cavity in a time-sharing manner, so that dead-time-free atomic interference measurement is realized, the atom control frequencies of different components are different, the mutual influence among all processes in the measurement can be reduced, the dead-time-free measurement is realized, and the sensitivity reduction caused by crosstalk of all processes is reduced.
Drawings
FIG. 1 is a schematic diagram of a measurement apparatus for eliminating cold atom interferometer dead time;
FIG. 2 is a schematic diagram of a laser control system;
FIG. 3 is a time sequence chart of the method of the present invention without dead time measurement;
in the figure: a-an atomic interferometer physical system and b-a laser control system; a 1-atom cooling region, a 2-atom state selection region, a 3-atom interference region, a 4-atom detection region, a 5-first type atoms, a 6-second type atoms; a 7-parabolic trajectory; a 8-detection system; a 11-cooling light fiber collimating mirror, a 12-state selecting light fiber collimating mirror, a 13-interference light fiber collimating mirror, a 14-detecting light fiber collimating mirror; b 11-first cooling laser, b 12-second cooling laser, b 21-first state-selecting laser, b 22-second state-selecting laser, b 31-first interference laser, b 32-second interference laser, b 41-first detection laser and b 42-second detection laser; c 1-cooling laser switch, c 2-state-selecting laser switch, c 3-interference laser switch and c 4-detection laser switch.
Detailed Description
The present invention will be described in further detail with reference to examples for the purpose of facilitating understanding and practice of the invention by those of ordinary skill in the art, and it is to be understood that the present invention has been described in the illustrative embodiments and is not to be construed as limited thereto.
In the embodiment, the measuring device for eliminating the dead time of the cold atom interferometer comprises an atom interferometer physical system a and a laser control system b;
as shown in fig. 1, the physical system a of the atomic interferometer is divided into four different regions, namely an atom cooling region a1, an atom state selection region a2, an atom interference region a3 and an atom detection region a4, wherein the atom cooling region a1 contains two component atoms, in the embodiment, rubidium 85 atom is selected as a first type of atom a5 and rubidium 87 atom is selected as a second type of atom a 6.
Six cooling light fiber collimating lenses a11 are fixed on the outer side of the atomic cooling region a1, a pair of state-selecting light fiber collimating lenses a12 are fixed on the outer side of the atomic state-selecting region a2, three pairs of interference light fiber collimating lenses a13 are fixed on the outer side of the atomic interference region a3, and a pair of detection light fiber collimating lenses a14 are fixed on the outer side of the atomic detection region a 4;
as shown in fig. 2, the laser control system b includes a first cooling laser b11, a second cooling laser b12, a first state-selection laser b21, a second state-selection laser b22, a first interference laser b31, a second interference laser b32, a first probing laser b41, and a second probing laser b 42.
The first cooling laser b11 and the second cooling laser b12 are switched by a cooling laser switch c1 to enter a first optical splitter, the first cooling laser b11 or the second cooling laser b12 enters 6 optical fibers respectively connected with 6 cooling optical fiber collimating mirrors a11 through the first optical splitter, and only the first cooling laser b11 or the second cooling laser b12 enters the atomic cooling area a1 through the 6 cooling optical fiber collimating mirrors a11 at a time.
The first state-selection laser b21 and the second state-selection laser b22 are switched by a state-selection laser switch c2 to enter a second optical splitter, the first state-selection laser b21 or the second state-selection laser b22 enters 2 beams of optical fibers respectively connected with a pair of state-selection optical fiber collimating mirrors a12 through the second optical splitter, and only the first state-selection laser b21 or the second state-selection laser b22 enters the atomic state selection region a2 through the pair of state-selection optical fiber collimating mirrors a12 at a time.
The first interference laser light b31 and the second interference laser light b32 are switched by an interference laser switch c3 to enter a third optical splitter, the first interference laser light b31 or the second interference laser light b32 enters 6 beams of optical fibers respectively connected with three pairs of interference light optical fiber collimating mirrors a13 through the third optical splitter, and only the first interference laser light b31 or the second interference laser light b32 enters the atomic interference region a3 at a time.
The first detection laser b41 and the second detection laser b42 are switched to enter a fourth optical splitter through a detection laser switch c4, the first detection laser b41 or the second detection laser b42 enters 2 bundles of optical fibers respectively connected with a pair of detection optical fiber collimating mirrors a14 through the fourth optical splitter, and only the first detection laser b41 or the second detection laser b42 enters the atom detection area a4 at a time.
As shown in fig. 3, the two-component atomic measurement process in the measurement setup to eliminate the cold atom interferometer dead time is performed crosswise. The cooling laser switch c1 controls the first cooling laser b11 to cool the first type of atoms a5 in the atom cooling area a1, the frequency of the first cooling laser b11 is changed to enable the first type of atoms a5 to obtain horizontal speed, the first type of atoms move along a parabolic track a7 under the action of gravity, and the atoms sequentially enter the atom state selection area a2, the atom interference area a3 and the atom detection area a 4. When the first type of atom a5 enters the atom state selection region a2, the state selection laser switch c2 controls the first state selection laser b21 to enter the atom state selection region a2 to select the state of the first type of atom a5, and after the first type of atom a5 enters the atom interference region a3, the interference laser switch c3 controls the first interference laser b31 to enter the atom interference region a3 to control the first type of atom a5, so that atom interference is formed. Meanwhile, the cooling laser switch c1 controls the second cooling laser b12 to enter the atom cooling region a1 to cool the second type of atoms a6 and transfer the second type of atoms a6 to the atom selection region a2, the state selection laser switch c2 controls the second state selection laser b22 to enter the atom selection region a2 to select the second type of atoms a6, when the first type of atoms a5 finishes interference, the second type of atoms a6 is transferred to the atom interference region a3, and the interference laser switch c3 controls the second interference laser b32 to enter the atom interference region a3 to control the second type of atoms a6, so that atomic interference is formed. When the second type of atom a6 starts to interfere, the first type of atom a5 enters the atom detection region a4, and the detection laser switch c4 controls the first detection laser b4 to enter the atom detection region a4 to detect the first type of atom a5, so as to obtain a measurement signal.
A measurement method for eliminating dead time of a cold atom interferometer comprises the following steps:
step 1, placing a measuring device for eliminating the dead time of the cold atom interferometer on a rotary table, wherein the rotation direction of the rotary table is consistent with the rotation measuring direction of the measuring device for eliminating the dead time of the cold atom interferometer, rotating the rotary table at a fixed rotation speed omega, and recording a measuring phase phi when carrying out interference measurement by utilizing a first type of atoms a51Recording the measurement phase phi when using the second type of atom a6 for interferometric measurement2Separately calculating the scale factor K1And a scale factor K2And the formula is used in the calculation:
Figure BDA0002324060480000061
wherein，Ω1And Ω2The rotating speed of the turntable when the first type of atoms a5 are subjected to interference measurement and the rotating speed of the turntable when the second type of atoms a6 are subjected to interference measurement are respectively.
Step 2, firstly, controlling a cooling laser switch c1 to switch a first cooling laser b11 to enter an atom cooling area a1 to cool a first type of atoms a5, then controlling the frequency of the first cooling laser b11 to transfer the first type of atoms a5 to enter an atom state selection area a2, controlling a state selection laser switch c2 to switch a first state selection laser b21 to enter an atom state selection area a2 to select states of the first type of atoms a5, and after the first type of atoms a5 enter an atom interference area a3, controlling an interference laser switch c3 to switch a first interference laser b31 to enter an atom interference area a3 to interfere with the first type of atoms a 5;
step 3, when the first-type atoms a5 start to interfere, controlling a cooling laser switch c1 to switch a second cooling laser b12 to enter an atom cooling area a1 to cool a second-type atoms a6, controlling the frequency of a second cooling laser b12 after cooling, transferring a second-type atom a6 to enter an atom state selection area a2, controlling a state selection laser switch c2 to switch a second state selection laser b22 to enter an atom state selection area a2 to select a second-type atom a6, after the state selection is completed, allowing a second-type atom a6 to enter an atom interference area a3, and when the first-type atom a5 finishes interfering, controlling an interference laser switch c3 to switch a second interference laser b32 to enter an atom interference area (a3) to interfere with the second-type atom a 6;
step 4, when the second type atoms a6 interfere, the detection laser switch c4 is controlled to switch the first detection laser b41 to enter the atom detection area a4 to detect the first type atoms a5, and the measurement phase phi is obtainedn1Then, a cooling laser switch c1 is controlled to switch a first cooling laser b11 to enter an atom cooling area a1 to cool a first type of atoms a5, the frequency of the first cooling laser b11 is controlled after cooling, the first type of atoms a5 are transferred to an atom state selection area a2, a state selection laser switch c2 is controlled to switch a first state selection laser b21 to enter an atom state selection area a2 to select states of the first type of atoms a5, the first type of atoms a5 after state selection enters an atom interference area a3, and interference is controlled while interference of a second type of atoms a6 is finishedThe laser switch c3 switches the first interference laser b31 to enter the atom interference area a3 to interfere with the first type of atoms a5, and when the first type of atoms a5 interfere, the detection laser switch c4 is controlled to switch the second detection laser b42 to enter the atom detection area a4 to detect the second type of atoms a6, so that the measured phase phi is obtainedn2N is the number of times of repeating the step 3 and the step 4;
step 5, repeating the step 3 and the step 4, always keeping the first type atoms a5 or the second type atoms a6 in an interference measurement state, and recording the measurement phase phi obtained by the interference measurement of the first type atoms a5 in real timen1Recording the measured phase phi obtained by the interference measurement of the second type atoms a6 in real timen2。
Step 6, calculating a rotation measurement value omegajWherein
Figure BDA0002324060480000071
The techniques of laser cooling of atoms in an atom interferometer, phase extraction after atom interference and the like are general techniques, and are not discussed in detail in the patent.
The specific embodiments described herein are merely illustrative of the spirit of the invention. Various modifications or additions may be made to the described embodiments or alternatives may be employed by those skilled in the art without departing from the spirit or ambit of the invention as defined in the appended claims.

Claims (3)

1.一种消除冷原子干涉仪死时间的测量装置，包括原子干涉仪物理系统(a)，其特征在于，原子干涉仪物理系统(a)包括原子冷却区域(a1)、原子选态区域(a2)、原子干涉区域(a3)和原子探测区域(a4)，原子冷却区域(a1)中包含第一类原子(a5)和第二类原子(a6)，1. a measuring device that eliminates cold atom interferometer dead time, comprises atom interferometer physics system (a), it is characterized in that, atom interferometer physics system (a) comprises atom cooling area (a1), atomic state selection area ( a2), the atomic interference region (a3) and the atomic detection region (a4), the atomic cooling region (a1) contains the first type of atoms (a5) and the second type of atoms (a6), 冷却激光开关(c1)切换控制第一冷却激光(b11)和第二冷却激光(b12)入射原子冷却区域(a1)，选态激光开关(c2)切换控制第一选态激光(b21)和第二选态激光(b22)入射原子选态区域(a2)，干涉激光开关(c3)切换控制第一干涉激光(b31)和第二干涉激光(b32)入射原子干涉区域(a3)，探测激光开关(c4)切换控制第一探测激光(b41)和第二探测激光(b42)入射到原子探测区域(a4)，The cooling laser switch (c1) switches to control the first cooling laser (b11) and the second cooling laser (b12) to enter the atomic cooling area (a1), and the selective laser switch (c2) switches to control the first selective laser (b21) and the second cooling laser (b21). The binary selective laser (b22) enters the atomic selective region (a2), and the interference laser switch (c3) switches and controls the first interference laser (b31) and the second interference laser (b32) to enter the atomic interference region (a3), and detects the laser switch (c4) switching and controlling the first detection laser light (b41) and the second detection laser light (b42) to be incident on the atom detection region (a4), 消除冷原子干涉仪死时间的测量装置中的两组分原子测量过程交叉进行，具体为：控制冷却激光开关(c1)切换第一冷却激光(b11)进入原子冷却区域(a1)中对第一类原子(a5)进行冷却，然后控制第一冷却激光(b11)频率，将第一类原子(a5)转移进入原子选态区域(a2)，控制选态激光开关(c2)切换第一选态激光(b21)进入原子选态区域(a2)中对第一类原子(a5)进行选态，当第一类原子(a5)进入原子干涉区域(a3)后，控制干涉激光开关(c3)切换第一干涉激光(b31)进入原子干涉区域(a3)中对第一类原子(a5)进行干涉；The two-component atomic measurement process in the measurement device for eliminating the dead time of the cold atom interferometer is performed alternately, specifically: controlling the cooling laser switch (c1) to switch the first cooling laser (b11) into the atomic cooling region (a1) to measure the first cooling laser (b11). The class atoms (a5) are cooled, and then the frequency of the first cooling laser (b11) is controlled, the first class atoms (a5) are transferred into the atomic state selection region (a2), and the state selection laser switch (c2) is controlled to switch the first state selection The laser (b21) enters the atomic state selection area (a2) to select the first type of atom (a5), and when the first type of atom (a5) enters the atomic interference area (a3), the interference laser switch (c3) is controlled to switch The first interference laser (b31) enters the atomic interference region (a3) to interfere with the first type of atoms (a5); 在第一类原子(a5)开始干涉的同时，控制冷却激光开关(c1)切换第二冷却激光(b12)进入原子冷却区域(a1)中对第二类原子(a6)进行冷却，冷却后操控第二冷却激光(b12)频率，将第二类原子(a6)转移进入原子选态区域(a2)，控制选态激光开关(c2)切换第二选态激光(b22)进入原子选态区域(a2)中对第二类原子(a6)进行选态，选态完成后的第二类原子(a6)进入原子干涉区域(a3)，当第一类原子(a5)结束干涉的时，控制干涉激光开关(c3)切换第二干涉激光(b32)进入原子干涉区域(a3)对第二类原子(a6)进行干涉；At the same time when the first type of atoms (a5) starts to interfere, control the cooling laser switch (c1) to switch the second cooling laser (b12) into the atomic cooling area (a1) to cool the second type of atoms (a6), and control the operation after cooling The frequency of the second cooling laser (b12), the second type of atoms (a6) are transferred into the atomic state selection region (a2), and the state selection laser switch (c2) is controlled to switch the second state selection laser (b22) into the atomic state selection region ( In a2), the second type of atom (a6) is selected. After the selection is completed, the second type of atom (a6) enters the atomic interference area (a3). When the first type of atom (a5) ends the interference, the interference is controlled. The laser switch (c3) switches the second interference laser (b32) into the atomic interference region (a3) to interfere with the second type of atoms (a6); 在第二类原子(a6)进行干涉时，控制探测激光开关(c4)切换第一探测激光(b41)进入原子探测区域(a4)中对第一类原子(a5)进行探测，获得测量相位，然后控制冷却激光开关(c1)切换第一冷却激光(b11)进入原子冷却区域(a1)中对第一类原子(a5)进行冷却，冷却后操控第一冷却激光(b11)频率，将第一类原子(a5)转移进入原子选态区域(a2)，控制选态激光开关(c2)切换第一选态激光(b21)进入原子选态区域(a2)中对第一类原子(a5)进行选态，选态完成后的第一类原子(a5)进入原子干涉区域(a3)，在第二类原子(a6)结束干涉的同时，控制干涉激光开关(c3)切换第一干涉激光(b31)进入原子干涉区域(a3)对第一类原子(a5)进行干涉，在第一类原子(a5)进行干涉时，控制探测激光开关(c4)切换第二探测激光(b42)进入原子探测区域(a4)中对第二类原子(a6)进行探测，获得测量相位。When the second type of atom (a6) interferes, the detection laser switch (c4) is controlled to switch the first detection laser (b41) into the atomic detection area (a4) to detect the first type of atom (a5) to obtain the measurement phase, Then control the cooling laser switch (c1) to switch the first cooling laser (b11) into the atomic cooling region (a1) to cool the first type of atoms (a5), and control the frequency of the first cooling laser (b11) after cooling to convert the first cooling laser (b11). The class atoms (a5) are transferred into the atomic state selection region (a2), and the state selection laser switch (c2) is controlled to switch the first state selection laser (b21) into the atomic state selection region (a2), and the first class atoms (a5) are processed. Select the state, the first type of atom (a5) after the state selection is completed enters the atomic interference area (a3), when the second type of atom (a6) ends the interference, control the interference laser switch (c3) to switch the first interference laser (b31) ) into the atomic interference area (a3) to interfere with the first type of atoms (a5), and when the first type of atoms (a5) interferes, control the detection laser switch (c4) to switch the second detection laser (b42) into the atomic detection area The second type of atom (a6) is detected in (a4) to obtain the measured phase. 2.根据权利要求1所述的一种消除冷原子干涉仪死时间的测量装置，其特征在于，所述的原子冷却区域(a1)外侧固定有六个冷却光光纤准直镜(a11)，原子选态区域(a2)外侧固定有一对选态光光纤准直镜(a12)，原子干涉区域(a3)外侧固定有三对干涉光光纤准直镜(a13)，原子探测区域(a4)外侧固定有一对探测光光纤准直镜(a14)，2. a kind of measuring device for eliminating cold atom interferometer dead time according to claim 1, is characterized in that, described atomic cooling area (a1) outside is fixed with six cooling optical fiber collimating mirrors (a11), A pair of optical fiber collimating mirrors (a12) are fixed outside the atomic state selection area (a2), three pairs of interference optical fiber collimating mirrors (a13) are fixed outside the atomic interference area (a3), and the atom detection area (a4) is fixed outside There is a pair of probe light fiber collimator (a14), 第一冷却激光(b11)和第二冷却激光(b12)通过冷却激光开关(c1)进行切换进入第一分光耦合器，第一冷却激光(b11)或第二冷却激光(b12)经过第一分光耦合器进入分别与6个冷却光光纤准直镜(a11)连接的6束光纤；The first cooling laser (b11) and the second cooling laser (b12) are switched through the cooling laser switch (c1) into the first splitting coupler, and the first cooling laser (b11) or the second cooling laser (b12) passes through the first splitting The coupler enters 6 bundles of optical fibers connected to 6 cooled optical fiber collimating mirrors (a11) respectively; 第一选态激光(b21)和第二选态激光(b22)通过选态激光开关(c2)进行切换进入第二分光耦合器，第一选态激光(b21)或第二选态激光(b22)经过第二分光耦合器进入分别与一对选态光光纤准直镜(a12)连接的2束光纤；The first state-selective laser (b21) and the second state-selective laser (b22) are switched through the state-selective laser switch (c2) to enter the second split coupler, the first state-selective laser (b21) or the second state-selective laser (b22) ) enter 2 bundles of optical fibers respectively connected with a pair of state-selective optical fiber collimating mirrors (a12) through the second splitting coupler; 第一干涉激光(b31)和第二干涉激光(b32)通过干涉激光开关(c3)进行切换进入第三分光耦合器，第一干涉激光(b31)或第二干涉激光(b32)经过第三分光耦合器进入分别与三对干涉光光纤准直镜(a13)连接的6束光纤；The first interference laser (b31) and the second interference laser (b32) are switched through the interference laser switch (c3) to enter the third splitting coupler, and the first interference laser (b31) or the second interference laser (b32) passes through the third splitting The coupler enters 6 bundles of fibers connected to three pairs of interference light fiber collimating mirrors (a13) respectively; 第一探测激光(b41)和第二探测激光(b42)通过探测激光开关(c4)进行切换进入第四分光耦合器，第一探测激光(b41)或第二探测激光(b42)经过第四分光耦合器进入分别与一对探测光光纤准直镜(a14)连接的2束光纤。The first detection laser (b41) and the second detection laser (b42) are switched through the detection laser switch (c4) to enter the fourth splitting coupler, and the first detection laser (b41) or the second detection laser (b42) passes through the fourth splitter The coupler enters two optical fibers connected to a pair of probe light fiber collimating mirrors (a14), respectively. 3.一种消除冷原子干涉仪死时间的测量方法，利用权利要求1所述的一种消除冷原子干涉仪死时间的测量装置，其特征在于，包括以下步骤：3. a measuring method that eliminates cold atom interferometer dead time, utilizes a kind of measuring device that eliminates cold atom interferometer dead time according to claim 1, is characterized in that, comprises the following steps: 步骤1、将消除冷原子干涉仪死时间的测量装置放置在转台上，以固定转速Ω转动转台，利用第一类原子(a5)进行干涉测量时，记录测量相位φ1，利用第二类原子(a6)进行干涉测量时，记录测量相位φ2，分别计算标度因子K1和标度因子K2，Step 1. Place the measuring device for eliminating the dead time of the cold atom interferometer on the turntable, rotate the turntable at a fixed rotational speed Ω, and use the first type of atoms (a5) to perform interferometric measurement, record the measurement phase φ 1 , and use the second type of atoms to perform interferometric measurement. (a6) When performing interferometric measurement, record the measurement phase φ 2 , and calculate the scale factor K 1 and the scale factor K 2 respectively,
Figure FDA0003143492640000031
Figure FDA0003143492640000031
 其中，Ω1和Ω2分别为第一类原子(a5)进行干涉测量时的转台转速和第二类原子(a6)进行干涉测量时的转台转速；Among them, Ω 1 and Ω 2 are the turntable rotation speed of the first type of atoms (a5) when the interferometric measurement is performed and the turntable rotation speed of the second type of atoms (a6) when the interferometric measurement is performed; 步骤2、首先控制冷却激光开关(c1)切换第一冷却激光(b11)进入原子冷却区域(a1)中对第一类原子(a5)进行冷却，然后控制第一冷却激光(b11)频率，将第一类原子(a5)转移进入原子选态区域(a2)，控制选态激光开关(c2)切换第一选态激光(b21)进入原子选态区域(a2)中对第一类原子(a5)进行选态，当第一类原子(a5)进入原子干涉区域(a3)后，控制干涉激光开关(c3)切换第一干涉激光(b31)进入原子干涉区域(a3)中对第一类原子(a5)进行干涉；Step 2. First, control the cooling laser switch (c1) to switch the first cooling laser (b11) into the atomic cooling region (a1) to cool the first type of atoms (a5), and then control the frequency of the first cooling laser (b11), The first type of atom (a5) is transferred into the atomic state selection region (a2), and the state selection laser switch (c2) is controlled to switch the first state selection laser (b21) into the atomic state selection region (a2) for the first type of atom (a5). ) to select the state, when the first type of atom (a5) enters the atomic interference region (a3), control the interference laser switch (c3) to switch the first interference laser (b31) into the atomic interference region (a3) for the first type of atom (a5) interfere; 步骤3、在第一类原子(a5)开始干涉的同时，控制冷却激光开关(c1)切换第二冷却激光(b12)进入原子冷却区域(a1)中对第二类原子(a6)进行冷却，冷却后操控第二冷却激光(b12)频率，将第二类原子(a6)转移进入原子选态区域(a2)，控制选态激光开关(c2)切换第二选态激光(b22)进入原子选态区域(a2)中对第二类原子(a6)进行选态，选态完成后的第二类原子(a6)进入原子干涉区域(a3)，当第一类原子(a5)结束干涉的时，控制干涉激光开关(c3)切换第二干涉激光(b32)进入原子干涉区域(a3)对第二类原子(a6)进行干涉；Step 3. When the first type of atoms (a5) starts to interfere, control the cooling laser switch (c1) to switch the second cooling laser (b12) into the atomic cooling area (a1) to cool the second type of atoms (a6), After cooling, control the frequency of the second cooling laser (b12), transfer the second type of atoms (a6) into the atomic state selection region (a2), and control the state selection laser switch (c2) to switch the second state selection laser (b22) into the atomic selection region. In the state region (a2), the second type of atom (a6) is selected. After the state selection is completed, the second type of atom (a6) enters the atomic interference region (a3). When the first type of atom (a5) ends the interference , control the interference laser switch (c3) to switch the second interference laser (b32) into the atomic interference region (a3) to interfere with the second type of atoms (a6); 步骤4、在第二类原子(a6)进行干涉时，控制探测激光开关(c4)切换第一探测激光(b41)进入原子探测区域(a4)中对第一类原子(a5)进行探测，获得测量相位φn1，然后控制冷却激光开关(c1)切换第一冷却激光(b11)进入原子冷却区域(a1)中对第一类原子(a5)进行冷却，冷却后操控第一冷却激光(b11)频率，将第一类原子(a5)转移进入原子选态区域(a2)，控制选态激光开关(c2)切换第一选态激光(b21)进入原子选态区域(a2)中对第一类原子(a5)进行选态，选态完成后的第一类原子(a5)进入原子干涉区域(a3)，在第二类原子(a6)结束干涉的同时，控制干涉激光开关(c3)切换第一干涉激光(b31)进入原子干涉区域(a3)对第一类原子(a5)进行干涉，在第一类原子(a5)进行干涉时，控制探测激光开关(c4)切换第二探测激光(b42)进入原子探测区域(a4)中对第二类原子(a6)进行探测，获得测量相位φn2，n为步骤3和步骤4重复的次数；Step 4. When the second type of atom (a6) interferes, control the detection laser switch (c4) to switch the first detection laser (b41) into the atomic detection area (a4) to detect the first type of atom (a5), and obtain Measure the phase φ n1 , then control the cooling laser switch (c1) to switch the first cooling laser (b11) into the atomic cooling region (a1) to cool the first type of atoms (a5), and control the first cooling laser (b11) after cooling frequency, transfer the first type of atoms (a5) into the atomic state selection region (a2), control the state selection laser switch (c2) to switch the first state selection laser (b21) into the atomic state selection region (a2) The atom (a5) is selected, and the first type of atom (a5) after the selection is completed enters the atomic interference region (a3). When the second type of atom (a6) ends the interference, the interference laser switch (c3) is controlled to switch the first type. An interference laser (b31) enters the atomic interference region (a3) to interfere with the first type of atoms (a5), and when the first type of atoms (a5) interferes, the detection laser switch (c4) is controlled to switch the second detection laser (b42) ) into the atomic detection area (a4) to detect the second type of atoms (a6) to obtain the measurement phase φ n2 , where n is the number of repetitions of step 3 and step 4; 步骤5、重复步骤3和步骤4，始终保持第一类原子(a5)或第二类原子(a6)处于干涉测量状态，实时记录第一类原子(a5)进行干涉测量获得的测量相位φn1，实时记录第二类原子(a6)进行干涉测量获得的测量相位φn2；Step 5. Repeat Step 3 and Step 4, keep the first type atom (a5) or the second type atom (a6) in the state of interferometric measurement, and record the measured phase φ n1 obtained by interferometric measurement of the first type atom (a5) in real time. , record the measured phase φ n2 obtained by interferometric measurement of the second type of atom (a6) in real time; 步骤6、计算转动测量数值Ωj，其中Step 6. Calculate the rotational measurement value Ω j , where
Figure FDA0003143492640000041
Figure FDA0003143492640000041
CN201911309241.3A 2019-12-18 2019-12-18 A measuring method and measuring device for eliminating dead time of cold atom interferometer Active CN111006661B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201911309241.3A CN111006661B (en) 2019-12-18 2019-12-18 A measuring method and measuring device for eliminating dead time of cold atom interferometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201911309241.3A CN111006661B (en) 2019-12-18 2019-12-18 A measuring method and measuring device for eliminating dead time of cold atom interferometer

Publications (2)

Publication Number Publication Date
CN111006661A CN111006661A (en) 2020-04-14
CN111006661B true CN111006661B (en) 2021-09-07

Family

ID=70116666

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201911309241.3A Active CN111006661B (en) 2019-12-18 2019-12-18 A measuring method and measuring device for eliminating dead time of cold atom interferometer

Country Status (1)

Country Link
CN (1) CN111006661B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113311496B (en) * 2021-06-11 2022-07-19 中国科学院精密测量科学与技术创新研究院 Gravity meter based on double-component atom interweaving interference effect

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1973248A (en) * 2004-03-30 2007-05-30 国家科研中心 Method for modulating an atomic clock signal with coherent population trapping and corresponding atomic clock
CN102570297A (en) * 2012-01-09 2012-07-11 中国科学院武汉物理与数学研究所 Laser-pulse timing sequence generation control method based on single ion light frequency standard
CN103837904A (en) * 2014-03-20 2014-06-04 中国科学院武汉物理与数学研究所 Combination inertial sensor based on multi-component atom interferometer and measurement method of combination inertial sensor
US8941053B1 (en) * 2011-09-28 2015-01-27 Sandia Corporation High data-rate atom interferometers through high recapture efficiency
US9086429B1 (en) * 2013-05-29 2015-07-21 Sandia Corporation High data rate atom interferometric device
CN107271055A (en) * 2016-04-20 2017-10-20 中国科学技术大学 A kind of infrared single photon detectorses system of parallel avalanche photodiode array structure
CN207180595U (en) * 2017-09-01 2018-04-03 中国科学院武汉物理与数学研究所 A kind of integrated Optical devices for cold atom interferometer
CN108254087A (en) * 2017-12-28 2018-07-06 国家电网公司 A kind of single-photon detector system and control method
CN109031923A (en) * 2018-07-23 2018-12-18 中国科学院上海光学精密机械研究所 Intracavitary cooled atomic clock
CN109781088A (en) * 2019-03-12 2019-05-21 中国计量大学 A miniaturized atomic interference gyroscope device and measurement method

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106647926B (en) * 2016-11-18 2023-08-08 浙江工业大学 DDS frequency hopping device for laser timing control of cold atom interferometer

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1973248A (en) * 2004-03-30 2007-05-30 国家科研中心 Method for modulating an atomic clock signal with coherent population trapping and corresponding atomic clock
US8941053B1 (en) * 2011-09-28 2015-01-27 Sandia Corporation High data-rate atom interferometers through high recapture efficiency
CN102570297A (en) * 2012-01-09 2012-07-11 中国科学院武汉物理与数学研究所 Laser-pulse timing sequence generation control method based on single ion light frequency standard
US9086429B1 (en) * 2013-05-29 2015-07-21 Sandia Corporation High data rate atom interferometric device
CN103837904A (en) * 2014-03-20 2014-06-04 中国科学院武汉物理与数学研究所 Combination inertial sensor based on multi-component atom interferometer and measurement method of combination inertial sensor
CN107271055A (en) * 2016-04-20 2017-10-20 中国科学技术大学 A kind of infrared single photon detectorses system of parallel avalanche photodiode array structure
CN207180595U (en) * 2017-09-01 2018-04-03 中国科学院武汉物理与数学研究所 A kind of integrated Optical devices for cold atom interferometer
CN108254087A (en) * 2017-12-28 2018-07-06 国家电网公司 A kind of single-photon detector system and control method
CN109031923A (en) * 2018-07-23 2018-12-18 中国科学院上海光学精密机械研究所 Intracavitary cooled atomic clock
CN109781088A (en) * 2019-03-12 2019-05-21 中国计量大学 A miniaturized atomic interference gyroscope device and measurement method

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Continuous Cold-Atom Inertial Sensor with 1 nrad= sec Rotation Stability;Dutta, D. Savoie 等;《PHYSICAL REVIEW LETTERS》;20160531;第183003-1至183003-5页 *
冷原子干涉重力仪的研究进展;李嘉华 等;《惯性技术与智能导航学术研讨会论文集》;20191023;第106-110页 *

Also Published As

Publication number Publication date
CN111006661A (en) 2020-04-14

Similar Documents

Publication Publication Date Title
CN101893429B (en) Super-precision surface measuring system based on polarization phase-shifting microscopy interference technology
JP5627610B2 (en) Method and apparatus for measuring substrate shape or thickness information
CN108061515B (en) Phase shift interferometer
TW201702552A (en) Method and system for determining in-plane distortions in a substrate
CN111006661B (en) A measuring method and measuring device for eliminating dead time of cold atom interferometer
CN102620680B (en) Detection device and method for absolute measurement of optical surface shape in three planes
CN107883889B (en) Vibration test three-dimensional deformation measuring device and method based on laser speckle interference
CN107289921A (en) A kind of rotational angular velocity measuring method to throwing formula cold atom interference gyro instrument based on ellipse fitting
CN105318843B (en) A kind of method of the application conjugation calculus of finite differences detection absolute face shape of cylindrical mirror
JP2002206916A (en) Method for measuring interference of non-rotationally symmetric wavefront error
CN106247978A (en) A kind of removal splices the method and device supported in detection
CN108332686B (en) A kind of detection device and method of conical mirror cone angle
CN113702039A (en) System and method for measuring rotation precision of hydrostatic bearing main shaft
CN106323191A (en) Device for detecting cylindrical mirror absolute surface by using conjugate difference method
CN107388996A (en) A kind of plane of reference planarity checking method
JP2009145081A (en) Method and apparatus for measuring error quantity of occurrence factor of rotational asymmetric aberration
US5831733A (en) Apparatus and methods for measuring gaps while compensating for birefringence effects in the measurement path
JP3146590B2 (en) Shape measuring method and shape measuring system
JPH02501874A (en) angular velocity sensor
JPH07190734A (en) Circumferential surface profile measuring method
CN108613634B (en) A method and device for detecting the surface shape of planar components by slope splicing
KR20060062997A (en) Phase Shifting Method Using Wavelength Plate and Measurement System Using Speckle Pattern Shear Interference Method
JP6539145B2 (en) Method of correcting interferometer periodic error and method of acquiring correction parameter
Liu et al. Development of a measuring equipment for silicon wafer warp
JPH09281003A (en) Apparatus for measuring phase matter

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant