CN108519521A - Capacitance measurement system, method and apparatus - Google Patents
Capacitance measurement system, method and apparatus Download PDFInfo
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- CN108519521A CN108519521A CN201810318737.6A CN201810318737A CN108519521A CN 108519521 A CN108519521 A CN 108519521A CN 201810318737 A CN201810318737 A CN 201810318737A CN 108519521 A CN108519521 A CN 108519521A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
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Abstract
The present invention provides a kind of capacitance measurement system, method and apparatus, are related to capacitance measuring technique field, which includes charge-discharge circuit, controller, TDC measuring circuits, reference capacitance and testing capacitance；The charge-discharge circuit is connected with controller and TDC measuring circuits respectively, which is connected with reference capacitance and testing capacitance respectively；The controller charges to reference capacitance and testing capacitance respectively for controlling the charge-discharge circuit, is additionally operable to send charging start signal and charging completion signal to TDC measuring circuits；The TDC measuring circuits are used to calculate the charging time in the charging time and testing capacitance of reference capacitance, and the capacity of the reference capacitance is multiplied by according to the ratio in testing capacitance charging time and reference capacitance charging time, to obtain the capacity of the testing capacitance.A kind of capacitance measurement system provided in an embodiment of the present invention, method and apparatus can improve the precision of capacitance measurement, and measurement method is simpler, measuring range bigger.
Description
Technical field
The present invention relates to capacitance measuring technique fields, more particularly, to a kind of capacitance measurement system, method and apparatus.
Background technology
Capacitance is an important physical amount of electricity metering, and capacitance sensor is because of its small size and low-power consumption and high-precision
Etc. characteristic, have very extensive application in industry and the multiple fields such as consumer product.It is directed to capacitance at present
Measurement, common method has resonance method, succusion, charge and discharge electrical method and ac-excited method etc., wherein resonance method and succusion not
It is suitably applied in the high-acruracy survey occasion to small capacitance, drift and temperature drift are larger when charge and discharge electrical method, thus the stabilization of system
Property is limited；The ac-excited method response time is long, and is not easy to practical application.Above-mentioned capacitance measurement method, which removes to all have, respectively can not
It outside the limitation overcome, usually also needs to rely on complicated circuit design, realization is complicated for operation, and capacitive measurement scales are fixed and hardly possible
To be extended, thus it cannot achieve the measurement to all size capacitance.Even by the mode of capacitive digital converter chip
Circuit structure can be simplified to a certain extent, but the price of usually such chip is high and using complicated, and performance and to measuring
Capacitance itself still remains a variety of limitations.
Generally, that there is also measurement methods is complicated, measurement accuracy is low, measuring range is inadequate for current capacitance measurement method
Big problem.
Invention content
In view of this, the purpose of the present invention is to provide a kind of capacitance measurement system, method and apparatus, capacitance can be improved
The precision of measurement, and measurement method is simpler, measuring range bigger.
In a first aspect, an embodiment of the present invention provides a kind of capacitance measurement systems, including：Charge-discharge circuit, controller,
TDC measuring circuits, reference capacitance and testing capacitance；The charge-discharge circuit is connected with controller and TDC measuring circuits respectively, this is filled
Discharge circuit is connected with reference capacitance and testing capacitance respectively；The controller is for controlling the charge-discharge circuit respectively to reference to electricity
Hold and testing capacitance charging, the controller are additionally operable to send charging start signal and charging completion signal to TDC measuring circuits；It should
TDC measuring circuits are used for when receiving the charging start signal, and record current time is at the first time；When receiving the charging
When end signal, record current time was the second time；The TDC measuring circuits are used to be distinguished according to first time and the second time
Calculate the charging time in the charging time and testing capacitance of reference capacitance；The TDC measuring circuits are additionally operable to calculate the testing capacitance
Charging time and the reference capacitance charging time ratio, and the ratio is multiplied by the capacity of the reference capacitance, to obtain
The capacity of the testing capacitance.
With reference to first aspect, an embodiment of the present invention provides the first possible embodiments of first aspect, wherein should
Charge-discharge circuit includes comparator, and the current source that is respectively connected with the first input end of the comparator, the second input terminal and
Reference voltage；The first input end is connected with reference capacitance and testing capacitance respectively；The output end of the comparator and controller phase
Even.
The possible embodiment of with reference to first aspect the first, an embodiment of the present invention provides second of first aspect
Possible embodiment, wherein when the controller receives the level reverse signal of comparator output terminal, the controller to
TDC measuring circuits send charging completion signal.
The possible embodiment of with reference to first aspect the first, an embodiment of the present invention provides the third of first aspect
Possible embodiment, wherein the current source is variable current source, which is variable reference voltage.
With reference to first aspect, an embodiment of the present invention provides the 4th kind of possible embodiments of first aspect, wherein should
Controller is microcontroller or PLC.
Second aspect, the embodiment of the present invention additionally provide a kind of capacitance measurement method, and this method is based on above-mentioned first aspect
And its capacitance measurement system that one of possible embodiment provides realizes that this method includes：The of testing capacitance is obtained respectively
Second charging duration of one charging duration and reference capacitance；A length of capacitance is from complete when the first charging duration and second charging
Discharge condition is to the duration being charged to needed for preset potential value；Calculate the ratio of the first charging duration and the second charging duration
Value；The ratio is multiplied with the capacity of reference capacitance to obtain the capacity of testing capacitance.
In conjunction with second aspect, an embodiment of the present invention provides the first possible embodiments of second aspect, wherein on
Before the step of stating the second charging duration of the first charging duration and reference capacitance that obtain testing capacitance respectively, further include：When
When the testing capacitance charges, current time is recorded as at the first time；When the testing capacitance is charged to preset potential value, will work as
The preceding time was recorded as the second time；Using the difference of second time and the first time as the first charging duration；When the reference
When capacitor charging, current time is recorded as the third time；When the reference capacitance is charged to preset potential value, by current time
It was recorded as the 4th time；Using the difference of the 4th time and the third time as the second charging duration.
The third aspect, the embodiment of the present invention additionally provide a kind of capacitance measuring device, including：Duration acquisition module, is used for
The first charging duration of testing capacitance and the second charging duration of reference capacitance are obtained respectively；This first charging duration and this second
A length of capacitance is from complete discharge condition to the duration being charged to needed for preset potential value when charging；Ratio calculation module, based on
Calculate the ratio of the first charging duration and the second charging duration；Capacity calculation module is used for the ratio and the reference capacitance
Capacity be multiplied to obtain the capacity of the testing capacitance.
In conjunction with the third aspect, an embodiment of the present invention provides the first possible embodiments of the third aspect, wherein should
Duration acquisition module includes：First charging duration unit, for when the testing capacitance charges, current time to be recorded as first
Time；When the testing capacitance is charged to preset potential value, current time was recorded as the second time；And by second time and
The difference of the first time is as the first charging duration；Second charging duration unit, for that when the reference capacitance charges, will work as
The preceding time is recorded as the third time；When the reference capacitance is charged to preset potential value, current time was recorded as the 4th time；
And using the difference of the 4th time and the third time as the second charging duration.
Fourth aspect, the embodiment of the present invention additionally provide a kind of capacitance measuring device, which includes processor, storage
Device, bus and communication interface, the processor, communication interface and memory are connected by bus；The memory is for storing program；
The processor executes above-mentioned second aspect and its possible reality for calling the program being stored in the memory by bus
The method that the offer of one of mode is provided.
The embodiment of the present invention brings following advantageous effect：
Capacitance measurement system provided in an embodiment of the present invention, method and apparatus, the capacitance measurement system include charge and discharge electricity
Road, controller, TDC measuring circuits, reference capacitance and testing capacitance；The charge-discharge circuit measures electricity with controller and TDC respectively
Road is connected, which is connected with reference capacitance and testing capacitance respectively；The controller is for controlling the charge-discharge circuit
Reference capacitance and testing capacitance is given to charge respectively, which is additionally operable to send charging start signal to TDC measuring circuits and fill
Electric end signal；The TDC measuring circuits are used for when receiving the charging start signal, and record current time is at the first time；
When receiving the charging completion signal, record current time was the second time；The TDC measuring circuits are used for according at the first time
The charging time in the charging time and testing capacitance of reference capacitance is calculated separately with the second time；The TDC measuring circuits are additionally operable to
The ratio in the charging time of the testing capacitance and the charging time of the reference capacitance is calculated, and the ratio is multiplied by the reference capacitance
Capacity, to obtain the capacity of the testing capacitance；The precision of capacitance measurement can be improved, and measurement method is simpler, measures
Range bigger.
Other feature and advantage of the disclosure will illustrate in the following description, alternatively, Partial Feature and advantage can be with
Deduce from specification or unambiguously determine, or by implement the disclosure above-mentioned technology it can be learnt that.
To enable the above objects, features, and advantages of the disclosure to be clearer and more comprehensible, preferred embodiment cited below particularly, and coordinate
Appended attached drawing, is described in detail below.
Description of the drawings
It, below will be to specific in order to illustrate more clearly of the specific embodiment of the invention or technical solution in the prior art
Embodiment or attached drawing needed to be used in the description of the prior art are briefly described, it should be apparent that, in being described below
Attached drawing is some embodiments of the present invention, for those of ordinary skill in the art, before not making the creative labor
It puts, other drawings may also be obtained based on these drawings.
Fig. 1 is a kind of structural schematic diagram of capacitance measurement system provided in an embodiment of the present invention；
Fig. 2 is a kind of circuit diagram of capacitance measurement system provided in an embodiment of the present invention；
Fig. 3 is a kind of TDC measuring circuit schematic diagrames of capacitance measurement system provided in an embodiment of the present invention；
Fig. 4 is a kind of flow diagram of capacitance measurement method provided in an embodiment of the present invention；
Fig. 5 is a kind of structural schematic diagram of capacitance measuring device provided in an embodiment of the present invention；
Fig. 6 is the structural schematic diagram of another capacitance measuring device provided in an embodiment of the present invention.
Icon：
11- charge-discharge circuits；12- controllers；13-TDC measuring circuits；14- reference capacitances；15- testing capacitances；When 51-
Long acquisition module；52- ratio calculation modules；53- capacity calculation modules；60- processors；61- memories；62- buses；63- is logical
Believe interface.
Specific implementation mode
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with attached drawing to the present invention
Technical solution be clearly and completely described, it is clear that described embodiments are some of the embodiments of the present invention, rather than
Whole embodiments.Based on the embodiments of the present invention, those of ordinary skill in the art are not making creative work premise
Lower obtained every other embodiment, shall fall within the protection scope of the present invention.
Currently, existing capacitance measurement method is there is also measurement method complexity, measurement accuracy is low, measuring range is not big enough
Problem is based on this, and a kind of capacitance measurement system provided in an embodiment of the present invention, method and apparatus can improve capacitance measurement
Precision, and measurement method is simpler, measuring range bigger.
For ease of understanding the present embodiment, first to a kind of capacitance measurement system disclosed in the embodiment of the present invention into
Row is discussed in detail.
Embodiment one
As shown in Figure 1, be a kind of structural schematic diagram of capacitance measurement system provided in an embodiment of the present invention, as seen from Figure 1,
The capacitance measurement system includes charge-discharge circuit 11, controller 12, TDC measuring circuits 13, reference capacitance 14 and testing capacitance 15.
Wherein, two two interconnected between charge-discharge circuit 11, controller 12 and TDC measuring circuits 13, also, charge-discharge circuit 11 is also
It is connected respectively with reference capacitance 14 and testing capacitance 15.
Here, the inside of TDC (Time-to-Digital Converter, time-to-digit converter) core measuring unit
It is by the absolute time delay of logic gate using signal come precise quantification time interval, it may be said that it is calculated certain
How many reverser passes through in time interval.The highest resolution of TDC depends on the minimum gate propagation delay time of chip,
It, can according to the numerical value of the position of ring oscillator and thick value counter with stop signal terminatings measuring by start signals
To calculate the time difference between start and stop.The flexibility of refresh rate, precision and current drain that TDC is measured is all very high.
In above-mentioned capacitance measurement system, controller 12 is for controlling charge-discharge circuit 11 respectively to reference capacitance 14 and waiting for
It surveys capacitance 15 to charge, also, the controller 12 is additionally operable to send charging start signal to TDC measuring circuits 13 and charging terminates letter
Number.Here, which can be microcontroller or PLC.
Before being charged to capacitance, needs to first pass through charge-discharge circuit 11 and discharge to capacitance, at least one
In possible embodiment, can by by capacity earth to bleed off capacitance charge.When TDC measuring circuits 13 receive controller
When the charging start signal of 12 transmissions, record current time is at the first time；When the charging for receiving the transmission of controller 12 terminates
When signal, record current time was the second time.During charging to reference capacitance 14, according to the TDC measuring circuits 13
The charging time of reference capacitance 14 can be calculated in the above-mentioned two time of record；In the process to charge to testing capacitance 15
In, the charging time of testing capacitance 15 can similarly be calculated.Because the amount of capacity of capacitance and the charging time of capacitance at
Proportional relation, so, TDC measuring circuits 13 calculate the ratio in 15 charging time of 14 charging time of reference capacitance and testing capacitance
Value, is used in combination the ratio to be multiplied by the capacity that capacity known to reference capacitance 14 can be obtained testing capacitance 15.
In this way, capacitance measurement, is just converted into the charging time by the capacitance measurement system provided through the embodiment of the present invention
It measures, and the high-precision that TDC is measured then effectively increases the precision of capacitance measurement.
In order to meet capacitance measurement system in the embodiment of the present invention charge-discharge circuit 11 function, it is at least one may
Embodiment in, the charge-discharge circuit 11 may include comparator and with the first input end of the comparator, second input
Hold the current source and reference voltage being respectively connected with.Wherein, first input end is connected with reference capacitance 14 and testing capacitance 15 respectively,
The output end of comparator is connected with controller 12.Current source provides charging voltage in charging process, reference voltage be used for than
The second input terminal compared with device provides stable comparison voltage.For the survey for being adapted to different capabilities capacitance of charge-discharge circuit 11
Amount, here, current source is variable current source, and reference voltage is variable reference voltage.The charging current of variable current source and
The amount of capacity of the capacitance that the voltage swing of variable reference voltage can measure as needed changes：If capacity very little, can
To use small charging current or high reference voltage；If capacity is very big, big charging current or low can be used
Reference voltage.It in this way, rational time of measuring can be selected, can not only ensure the measurement accuracy of capacitance, but also can ensure to survey
Measuring the time will not be too long.
In the charge-discharge circuit 11, originally, the voltage value of the first input end of comparator is less than the electricity of the second input terminal
Pressure value, during to capacitor charging, as capacitor charging electricity increases, the voltage value of the first input end of comparator is gradual
It increases, when the voltage value of first input end is more than the voltage value of the second input terminal, the output end output level reversion of comparator
Signal.At this moment, controller 12 receives the level reverse signal of comparator output terminal, and controller 12 is sent out to TDC measuring circuits 13
Send charging completion signal.In this way, the charge-discharge circuit 11 realize the charging to reference capacitance 14 and testing capacitance 15, electric discharge with
And the triggering for terminating charging signals in real time when capacitance terminates charging.
An embodiment of the present invention provides a kind of capacitance measurement systems, by the survey for capacitance measurement being converted into the charging time
Amount can improve the precision of capacitance measurement, and measurement method is simpler, measuring range bigger.
Embodiment two
In practical applications, as shown in Fig. 2, for a kind of circuit signal of capacitance measurement system provided in an embodiment of the present invention
Figure, Fig. 2 shows embodiment in, the charge-discharge circuit of the capacitance measurement system includes comparator, variable current source, variable
The controller of reference voltage and switch K1-K4, the system are microcontroller.
From Figure 2 it can be seen that reference capacitance C1 is connected to the positive input terminal of comparator by switch K1, testing capacitance C2 is by opening
The positive input terminal that K2 is connected to comparator is closed, the negative input of comparator terminates variable reference voltage, and variable current source passes through switch
K3 connects the positive input terminal of comparator, connects the positive input of comparator by K4 to the ground of reference capacitance C1 or testing capacitance C2 electric discharges
End.
Wherein, microcontroller is used for selecting the size of current of variable current source, selects the size of current of variable reference voltage, controls
Make switch K1-K4.Microcontroller also sends out the switch of START signal control K3/K4, while also issuing the TDC measuring circuits, should
START signal measures reference clock Fref with TDC and synchronizes.Variable current source fills reference capacitance C1 or testing capacitance C2
Electricity.Comparator is used to generate the signal that charging terminates, which also gives TDC measuring circuits to microcontroller.In at least one
In possible embodiment, as shown in figure 3, being a kind of TDC measuring circuits of capacitance measurement system provided in an embodiment of the present invention
Schematic diagram, the TDC measuring circuit circuits are used for measuring the charging time of reference capacitance C1 or testing capacitance C2.
The flow measured to testing capacitance using the capacitance measurement system is as follows.First, measure reference capacitance C1's
Charging time, microcontroller pre-set the charging current of variable current source and the voltage swing of variable reference voltage, allow
Switch K1 is closed, and K2 is disconnected, and START signal is allowed to be low level, and at this moment switch K4 is closed, and K3 is disconnected, reference capacitance C1 ground connection, electricity
Lotus is all bled off.Then, microcontroller becomes high level by START signal, while the START signal enters TDC measuring circuits
Start to measure, at this moment switch K3 is closed, and K4 is disconnected, and variable current source charges to reference capacitance C1, until the output electricity of comparator
Flat to invert, which is the STOP signals of TDC measuring circuits, which also gives TDC measuring circuits to microcontroller.
The charging time Tc1 of reference capacitance C1 is obtained by TDC measuring circuits.
Then, the charging time for measuring testing capacitance C2 allows switch K2 to be closed, and K1 is disconnected, and START signal is allowed to be low electricity
Flat, at this moment switch K4 is closed, and K3 is disconnected, and testing capacitance C2 ground connection, charge is all bled off.Secondly, microcontroller is by START signal
Become high level, while the START signal enters TDC measuring circuits and starts to measure, at this moment switch K3 is closed, and K4 is disconnected, and can be changed
Current source charges to testing capacitance C2, and until the output level of comparator inverts, which is the STOP of TDC measuring circuits
Signal, the signal also give TDC measuring circuits to microcontroller.The charging time of testing capacitance C2 is obtained by TDC measuring circuits
Tc2。
Finally, according to the ratio of Tc2 and Tc1, and the capacity for being multiplied by reference capacitance C1 can be obtained the value of testing capacitance C2.
Embodiment three
The embodiment of the present invention additionally provides a kind of capacitance measurement method, and this method is based on above-described embodiment one and embodiment two
And its capacitance measurement system that one of possible embodiment provides is realized, as shown in figure 4, being provided in an embodiment of the present invention one
The flow diagram of kind capacitance measurement method, from fig. 4, it can be seen that the capacitance measurement method includes the following steps：
Step S401：The first charging duration of testing capacitance and the second charging duration of reference capacitance are obtained respectively；It is above-mentioned
A length of capacitance is from complete discharge condition to the duration being charged to needed for preset potential value when the first charging duration and the second charging.
First, when testing capacitance charges, current time is recorded as at the first time；When testing capacitance is charged to default electricity
When place value, current time was recorded as the second time.Secondly, the difference of second time He the first time are filled as first
Electric duration.Then, when reference capacitance charges, current time is recorded as the third time, when reference capacitance is charged to default electricity
When place value, current time was recorded as the 4th time.Also, the difference of the 4th time He the third time are filled as second
Electric duration.
Step S402：Calculate the ratio of the first charging duration and the second charging duration.
The ratio of the two is obtained with the first charging duration divided by the second charging duration.
Step S403：The ratio is multiplied with the capacity of reference capacitance to obtain the capacity of testing capacitance.
Because of the capacity of capacitance and its duration positive correlation of charging, for identical the filling to reference capacitance and testing capacitance charging
Circuit, the capacity that reference capacitance is multiplied by with the ratio of charging duration obtained above obtain the capacity of testing capacitance.
Capacitance measurement method provided in an embodiment of the present invention has identical with the capacitance measurement system that above-described embodiment provides
Technical characteristic reach identical technique effect so can also solve identical technical problem.
Example IV
The embodiment of the present invention additionally provides a kind of capacitance measuring device, as shown in figure 5, the capacitance measuring device includes successively
Connected duration acquisition module 51, ratio calculation module 52 and capacity calculation module 53, wherein the function of modules is as follows：
Duration acquisition module 51, the second charging of the first charging duration and reference capacitance for obtaining testing capacitance respectively
Duration；A length of capacitance is from complete discharge condition to being charged to needed for preset potential value when the first charging duration and second charging
Duration.Here, which includes the first charging duration unit and the second duration charhing unit.Wherein, first
The duration unit that charges is used for when the testing capacitance charges, and current time is recorded as at the first time；When the testing capacitance charges
When to preset potential value, current time was recorded as the second time；And using the difference of second time and the first time as
First charging duration.Second charging duration unit is used for when the reference capacitance charges, and current time is recorded as the third time；
When the reference capacitance is charged to preset potential value, current time was recorded as the 4th time；And by the 4th time and this
The difference of three times is as the second charging duration.
Ratio calculation module 52, the ratio for calculating the first charging duration and the second charging duration.
Capacity calculation module 53 obtains the appearance of the testing capacitance for the ratio to be multiplied with the capacity of the reference capacitance
Amount.
The technique effect and preceding method embodiment phase of the device that the embodiment of the present invention is provided, realization principle and generation
Together, to briefly describe, device embodiment part does not refer to place, can refer to corresponding contents in preceding method embodiment.
Embodiment five
Referring to Fig. 6, the embodiment of the present invention also provides a kind of capacitance measuring device, including：Processor 60, memory 61, always
Line 62 and communication interface 63, processor 60, communication interface 63 and memory 61 are connected by bus 62；Processor 60 is for executing
The executable module stored in memory 61, such as computer program.
Wherein, memory 61 may include high-speed random access memory (RAM, Random Access Memory),
May further include nonvolatile memory (non-volatile memory), for example, at least a magnetic disk storage.By at least
One communication interface 63 (can be wired or wireless) realizes the communication between the system network element and at least one other network element
Connection can use internet, wide area network, local network, Metropolitan Area Network (MAN) etc..
Bus 62 can be isa bus, pci bus or eisa bus etc..It is total that bus can be divided into address bus, data
Line, controlling bus etc..For ease of indicating, only indicated with a four-headed arrow in Fig. 6, it is not intended that an only bus or one
The bus of type.
Wherein, memory 61 is for storing program, and processor 60 executes program after receiving and executing instruction, aforementioned
The method performed by device that the stream process that inventive embodiments any embodiment discloses defines can be applied in processor 60, or
Person is realized by processor 60.
Processor 60 may be a kind of IC chip, the processing capacity with signal.During realization, above-mentioned side
Each step of method can be completed by the integrated logic circuit of the hardware in processor 60 or the instruction of software form.Above-mentioned
Processor 60 can be general processor, including central processing unit (Central Processing Unit, abbreviation CPU), network
Processor (Network Processor, abbreviation NP) etc.；It can also be digital signal processor (Digital Signal
Processing, abbreviation DSP), application-specific integrated circuit (Application Specific Integrated Circuit, referred to as
ASIC), ready-made programmable gate array (Field-Programmable Gate Array, abbreviation FPGA) or other are programmable
Logical device, discrete gate or transistor logic, discrete hardware components.It may be implemented or execute in the embodiment of the present invention
Disclosed each method, step and logic diagram.General processor can be microprocessor or the processor can also be to appoint
What conventional processor etc..The step of method in conjunction with disclosed in the embodiment of the present invention, can be embodied directly in hardware decoding processing
Device executes completion, or in decoding processor hardware and software module combination execute completion.Software module can be located at
Machine memory, flash memory, read-only memory, programmable read only memory or electrically erasable programmable memory, register etc. are originally
In the storage medium of field maturation.The storage medium is located at memory 61, and processor 60 reads the information in memory 61, in conjunction with
Its hardware completes the step of above method.
It is apparent to those skilled in the art that for convenience and simplicity of description, the device of foregoing description
Specific work process, can refer to corresponding processes in the foregoing method embodiment, details are not described herein.
Unless specifically stated otherwise, the opposite step of the component and step that otherwise illustrate in these embodiments, digital table
It is not limit the scope of the invention up to formula and numerical value.
Flow chart and block diagram in attached drawing show the system, method and computer journey of multiple embodiments according to the present invention
The architecture, function and operation in the cards of sequence product.In this regard, each box in flowchart or block diagram can generation
A part for a part for one module, section or code of table, the module, section or code includes one or more uses
The executable instruction of the logic function as defined in realization.It should also be noted that in some implementations as replacements, being marked in box
The function of note can also occur in a different order than that indicated in the drawings.For example, two continuous boxes can essentially base
Originally it is performed in parallel, they can also be executed in the opposite order sometimes, this is depended on the functions involved.It is also noted that
It is the combination of each box in block diagram and or flow chart and the box in block diagram and or flow chart, can uses and execute rule
The dedicated hardware based system of fixed function or action is realized, or can use the group of specialized hardware and computer instruction
It closes to realize.
The computer program product for the progress capacitance measurement method that the embodiment of the present invention is provided, including store processor
The computer readable storage medium of executable non-volatile program code, the instruction that said program code includes can be used for executing
Method described in previous methods embodiment, specific implementation can be found in embodiment of the method, and details are not described herein.
Finally it should be noted that：Embodiment described above, only specific implementation mode of the invention, to illustrate the present invention
Technical solution, rather than its limitations, scope of protection of the present invention is not limited thereto, although with reference to the foregoing embodiments to this hair
It is bright to be described in detail, it will be understood by those of ordinary skill in the art that：Any one skilled in the art
In the technical scope disclosed by the present invention, it can still modify to the technical solution recorded in previous embodiment or can be light
It is readily conceivable that variation or equivalent replacement of some of the technical features；And these modifications, variation or replacement, do not make
The essence of corresponding technical solution is detached from the spirit and scope of technical solution of the embodiment of the present invention, should all cover the protection in the present invention
Within the scope of.Therefore, protection scope of the present invention should be based on the protection scope of the described claims.
Claims (10)
1. a kind of capacitance measurement system, which is characterized in that including：Charge-discharge circuit, controller, TDC measuring circuits, reference capacitance
And testing capacitance；The charge-discharge circuit is connected with the controller and the TDC measuring circuits respectively, the charge-discharge circuit
It is connected respectively with the reference capacitance and the testing capacitance；
The controller charges to the reference capacitance and the testing capacitance respectively for controlling the charge-discharge circuit, described
Controller is additionally operable to send charging start signal and charging completion signal to the TDC measuring circuits；
The TDC measuring circuits are used for when receiving the charging start signal, and record current time is at the first time；When connecing
When receiving the charging completion signal, record current time was the second time；
The TDC measuring circuits are used to calculate separately filling for the reference capacitance according to the first time and second time
The charging time of electric time and the testing capacitance；
The TDC measuring circuits are additionally operable to calculate the charging time of the testing capacitance and the charging time of the reference capacitance
Ratio, and the ratio is multiplied by the capacity of the reference capacitance, to obtain the capacity of the testing capacitance.
2. capacitance measurement system according to claim 1, which is characterized in that the charge-discharge circuit includes comparator, with
And the current source and reference voltage being respectively connected with the first input end of the comparator, the second input terminal；First input
End is connected with the reference capacitance and the testing capacitance respectively；The output end of the comparator is connected with the controller.
3. capacitance measurement system according to claim 2, which is characterized in that when the controller receives the comparator
When the level reverse signal of output end, the controller sends charging completion signal to the TDC measuring circuits.
4. capacitance measurement system according to claim 2, which is characterized in that the current source is variable current source, described
Reference voltage is variable reference voltage.
5. capacitance measurement system according to claim 1, which is characterized in that the controller is microcontroller or PLC.
6. a kind of capacitance measurement method, which is characterized in that the method is based on claim 1-5 any one of them capacitance measurements
System realization, including：
The first charging duration of the testing capacitance and the second charging duration of the reference capacitance are obtained respectively；Described first fills
A length of capacitance is from complete discharge condition to the duration being charged to needed for preset potential value when electric duration and second charging；
Calculate the ratio of the first charging duration and the second charging duration；
The ratio is multiplied with the capacity of the reference capacitance to obtain the capacity of the testing capacitance.
7. capacitance measurement method according to claim 6, which is characterized in that described to obtain the of the testing capacitance respectively
Before the step of second charging duration of one charging duration and the reference capacitance, further include：
When the testing capacitance charges, current time is recorded as at the first time；When the testing capacitance is charged to default electricity
When place value, current time was recorded as the second time；
Using the difference of second time and the first time as the first charging duration；
When the reference capacitance charges, current time is recorded as the third time；When the reference capacitance is charged to default electricity
When place value, current time was recorded as the 4th time；
Using the difference of the 4th time and the third time as the second charging duration.
8. a kind of capacitance measuring device, which is characterized in that including：
Duration acquisition module, the second charging duration of the first charging duration and reference capacitance for obtaining testing capacitance respectively；
A length of capacitance is from complete discharge condition to being charged to needed for preset potential value when the first charging duration and second charging
Duration；
Ratio calculation module, the ratio for calculating the first charging duration and the second charging duration；
Capacity calculation module obtains the appearance of the testing capacitance for the ratio to be multiplied with the capacity of the reference capacitance
Amount.
9. capacitance measuring device according to claim 8, which is characterized in that the duration acquisition module includes：
First charging duration unit, for when the testing capacitance charges, current time to be recorded as at the first time；When described
When testing capacitance is charged to preset potential value, current time was recorded as the second time；And by second time and described
The difference of one time is as the first charging duration；
Second charging duration unit, for when the reference capacitance charges, current time to be recorded as the third time；When described
When reference capacitance is charged to preset potential value, current time was recorded as the 4th time；And by the 4th time and described
The difference of three times is as the second charging duration.
10. a kind of capacitance measuring device, which is characterized in that described device includes processor, memory, bus and communication interface,
The processor, communication interface and memory are connected by the bus；
The memory is for storing program；
The processor executes the claim for calling the program being stored in the memory by the bus
Any the methods of 6-7.
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| EP3786912A1 (en) * | 2019-08-27 | 2021-03-03 | Nxp B.V. | Integrated circuit and measurement method |
| CN112462148A (en) * | 2020-10-29 | 2021-03-09 | 苏州浪潮智能科技有限公司 | Method, device and equipment for confirming capacitance capacity decline through constant current |
| CN112505427A (en) * | 2020-11-17 | 2021-03-16 | 上海美仁半导体有限公司 | Capacitance measuring circuit and measuring method |
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Application publication date: 20180911 |