CN105527501B  A kind of micro capacitance method  Google Patents
A kind of micro capacitance method Download PDFInfo
 Publication number
 CN105527501B CN105527501B CN201510894356.9A CN201510894356A CN105527501B CN 105527501 B CN105527501 B CN 105527501B CN 201510894356 A CN201510894356 A CN 201510894356A CN 105527501 B CN105527501 B CN 105527501B
 Authority
 CN
 China
 Prior art keywords
 capacitance
 testing
 discharge time
 voltage value
 capacitor
 Prior art date
Links
 238000000691 measurement method Methods 0.000 claims abstract description 8
 239000003990 capacitor Substances 0.000 claims description 51
 238000007599 discharging Methods 0.000 claims description 23
 238000000034 methods Methods 0.000 claims description 15
 238000004364 calculation methods Methods 0.000 claims description 3
 238000010586 diagrams Methods 0.000 description 6
 238000009774 resonance method Methods 0.000 description 4
 230000000875 corresponding Effects 0.000 description 3
 230000000694 effects Effects 0.000 description 2
 238000010291 electrical methods Methods 0.000 description 2
 230000004048 modification Effects 0.000 description 2
 238000006011 modification reactions Methods 0.000 description 2
 241000208340 Araliaceae Species 0.000 description 1
 235000003140 Panax quinquefolius Nutrition 0.000 description 1
 239000004020 conductors Substances 0.000 description 1
 238000005516 engineering processes Methods 0.000 description 1
 235000005035 ginseng Nutrition 0.000 description 1
 235000008434 ginseng Nutrition 0.000 description 1
 238000004519 manufacturing process Methods 0.000 description 1
Classifications

 G—PHYSICS
 G01—MEASURING; TESTING
 G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
 G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
 G01R27/02—Measuring real or complex resistance, reactance, impedance, or other twopole characteristics derived therefrom, e.g. time constant
 G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
 G01R27/2605—Measuring capacitance
Abstract
Description
Technical field
The present invention relates to capacitance measuring technique field more particularly to a kind of micro capacitance methods.
Background technique
Characteristic of the capacitance sensor because of its small size and lowpower consumption and in high precision etc., in industry and consumer production There is very extensive application in the multiple fields such as product.It is directed to the measurement of capacitor at present, common method has resonance method, oscillation Method, charge and discharge electrical method and acexcited method etc., wherein resonance method and succusion are not suitable for being applied to survey the highprecision of small capacitance It measures in occasion, drift and temperature drift are larger when charge and discharge electrical method, thus the stability of system is limited；The acexcited method response time is long, and It is not easy to practical application.Abovementioned capacitance measurement method usually also needs to rely in addition to all having the limitation that can not respectively overcome Complicated circuit design, realization is complicated for operation, and capacitive measurement scales are fixed and are difficult to be extended, thus cannot achieve to various The measurement of size small capacitance.Circuit knot can be simplified to a certain extent even by the mode of capacitive digital converter chip Structure, but the price of usually such chip is high and using complicated, and performance and a variety of limitations are still remained to measurement capacitor itself.
Summary of the invention
The technical problem to be solved in the present invention is that, for technical problem of the existing technology, the present invention provides one Kind realize it is easy to operate, required it is at low cost, small capacitance can be measured and do not limited by capacitance, while measurement efficiency and precision High micro capacitance method.
In order to solve the above technical problems, technical solution proposed by the present invention are as follows:
A kind of micro capacitance method, the measurement method include measured capacitance value step, the measured capacitance value step Suddenly are as follows: required discharge time when measurement testing capacitance and reference capacitance are discharged to second voltage value from the first voltage value respectively, The capacitance of testing capacitance is calculated according to the discharge time that the relationship and measurement of discharge time and capacitance obtain.
As a further improvement of the present invention, the specific measuring process of the discharge time are as follows: successively by testing capacitance, ginseng It examines capacitor to be connected in same charging and discharging circuit, will be made after the capacitor charging to the first voltage value of access by the charging and discharging circuit The capacitor of the access starts to discharge, and record be discharged to second voltage value needed for discharge time, respectively measurement obtain it is to be measured Discharge time needed for capacitor, reference capacitance.
As a further improvement of the present invention: the charging and discharging circuit by pulse signal generator to the capacitor of access into Row charging makes the capacitor of access discharge by discharge resistance；The charging and discharging circuit records discharge time by time converter.
As a further improvement of the present invention: the measured capacitance value step further includes reference capacitance configuration step, specifically The capacitor of same quantitative levels is in as reference capacitance with testing capacitance for configuration.
As a further improvement of the present invention: the second voltage value is the first voltage value of designated ratio, wherein 0 < refer to Certainty ratio < 100%.
As a further improvement of the present invention, the capacitance of the testing capacitance with specific reference to reference capacitance capacitance, And the ratio calculation of discharge time obtains between testing capacitance and reference capacitance.
As a further improvement of the present invention: the capacitance of the testing capacitance is specifically calculated according to the following formula；
C = C_{0*} μ/(μ+n)
Wherein C is the capacitance of testing capacitance, C_{0}For the capacitance of reference capacitance, μ is testing capacitance from the first voltage value V_{0} It is discharged to second voltage value V_{t}The discharge time of Shi Suoxu, μ+n are reference capacitance from the first voltage value V_{0}It is discharged to second voltage value V_{t}The discharge time of Shi Suoxu, wherein the discharge time between testing capacitance and reference capacitance is poor.
As a further improvement of the present invention, the measurement method further includes distributed capacitance removal step, specific steps Are as follows: successively using the distribution capacity of testing capacitance both ends conducting wire as target capacitance, mesh is calculated according to the measured capacitance value step The capacitance for marking capacitor obtains the distributed capacitance of testing capacitance both ends conducting wire, and is gone according to obtained distributed capacitance calculating Except the final capacitance of testing capacitance after distributed capacitance.
As a further improvement of the present invention: when the capacitance for calculating target capacitance, especially by by target capacitance The conducting wire at place end is connected in charging and discharging circuit, discharge time needed for measuring target capacitance.
As a further improvement of the present invention: the final capacitance of the testing capacitance is by the testing capacitance that is calculated The distributed capacitance that capacitance subtracts both ends conducting wire obtains.
Compared with the prior art, the advantages of the present invention are as follows:
1) micro capacitance method of the present invention, it is to be measured by measuring based on the characteristic between discharge time and capacitance Discharge time between capacitor and reference capacitance calculates the capacitance of testing capacitance, needs not rely on complicated circuit structure, Realize that easy to operate and measurement efficiency and precision are high, simultaneously because based on discharge time between reference capacitance and testing capacitance Comparison, thus the measurement of the very small small capacitance of capacitance may be implemented, and measurement range is unrestricted, the application of measurement Occasion is extensive；
2) micro capacitance method of the present invention, by successively connecing testing capacitance, reference capacitance when discharge time measures To in same charging and discharging circuit, the capacitor of access is carried out by identical charge and discharge process by charging and discharging circuit, can make to It surveys capacitor and reference capacitance is under same charge and discharge operating condition, so that discharge time and capacitance are established linear relationship, be based on Discharge time comparison in the discharge process can accurately calculate the capacitance of testing capacitance；
3) micro capacitance method of the present invention, when discharge time only needs measurement to be discharged to a certain proportion of supply voltage value The required time, without completing entire discharge process, compared with traditional measurement method needs to complete entire discharge process, Ke Yi great It is big to shorten time of measuring, effectively improve measurement efficiency；
4) in micro capacitance method of the present invention, by configuring the reference capacitance with the same order of magnitude of testing capacitance, by The comparison of discharge time determines the capacitance of testing capacitance between the capacitor of the same order of magnitude, can reduce gain offsets, thus Further increase the precision of capacitance measurement；Simultaneously by reference to the configuration of capacitor, the small electric to each quantitative levels may be implemented The measurement of appearance, is not limited by capacitance size；
5) micro capacitance method of the present invention, on the basis of measured capacitance value, by measuring testing capacitance two respectively The distributed capacitance at end can effectively eliminate distribution capacity pair in micro capacitance compared to more traditional resonance method, advocate approach etc. The influence of measurement result obtains the accurate capacitance of testing capacitance.
Detailed description of the invention
Fig. 1 is the implementation process schematic diagram of the present embodiment micro capacitance method.
Fig. 2 is the structural schematic diagram of charging and discharging circuit in the present embodiment.
Fig. 3 is the realization principle schematic diagram of the present embodiment micro capacitance method.
Fig. 4 is the discharge curve contrast schematic diagram of testing capacitance and reference capacitance in the present embodiment.
Fig. 5 is the principle schematic diagram of distribution capacity in testing capacitance.
Fig. 6 is the realization principle schematic diagram that the present embodiment micro capacitance method includes removal distribution capacity step.
Specific embodiment
Below in conjunction with Figure of description and specific preferred embodiment, the invention will be further described, but not therefore and It limits the scope of the invention.
As shown in Figure 1, the present embodiment micro capacitance method includes measured capacitance value step, measured capacitance value step Are as follows: required discharge time, root when measurement testing capacitance and reference capacitance are discharged to second voltage value from the first voltage value respectively The capacitance of testing capacitance is calculated according to the discharge time that the relationship and measurement of discharge time and capacitance obtain.
Since under identical operating condition, the discharge time length of capacitor is related to capacitance, i.e. discharge time is in capacitance Linear relationship, the present embodiment pass through measurement testing capacitance and reference capacitance based on the characteristic between discharge time and capacitance Between discharge time calculate the capacitance of testing capacitance, need not rely on complicated circuit structure, realize it is easy to operate and The efficiency and precision of measurement are high, simultaneously because based on reference capacitance compared with discharge time between testing capacitance, thus can To realize the measurement of the very small small capacitance of capacitance, and measurement range is unrestricted, and the application of measurement is extensive.
In the present embodiment, the specific measuring process of discharge time are as follows: testing capacitance, reference capacitance are successively connected to same fill In discharge loop, the capacitor of access will be made to start to discharge after the capacitor charging to the first voltage value of access by charging and discharging circuit, And record be discharged to second voltage value needed for discharge time, respectively measurement obtain testing capacitance, reference capacitance needed for electric discharge Time.By the way that successively testing capacitance, reference capacitance are connected in same charging and discharging circuit, by charging and discharging circuit by the capacitor of access Identical charge and discharge process is carried out, testing capacitance and reference capacitance can be made to be under same charge and discharge operating condition, thus will Discharge time and capacitance establish linear relationship, can accurately be calculated based on the discharge time comparison in the discharge process to be measured The capacitance of capacitor.
The present embodiment charging and discharging circuit is as shown in Fig. 2, include pulse signal generator, the testing capacitance of access or reference electricity Appearance and discharge resistance put the capacitor of access to the capacitor charging of access, by discharge resistance by pulse signal generator Electricity, structure is simple and stability is good.The present embodiment also sets up the discharge time in time converter record charging and discharging circuit, specifically Using Highprecision timetodigital converter, highprecision discharge time can be intuitively acquired.Testing capacitance and reference electricity When the discharge time measurement of appearance, successively testing capacitance, reference capacitance are accessed in charging and discharging circuit, so that being put with same Resistance connection composition Lowpass lowpass filter circuit；As shown in figure 3, pulse signal is generated by pulse signal generator, it will The capacitor charging accessed in charging and discharging circuit to the supply voltage of the first voltage value, then charging and discharging circuit by discharge resistance into Row electric discharge, required time is recorded by timetodigit converter when being discharged to second voltage value, testing capacitance and reference electricity Hold respectively execute abovementioned steps after i.e. can measure obtains corresponding discharge time, the discharge time obtained by measurement can calculate to Survey the capacitance of capacitor.
The electricity of capacitor and the voltage at its both ends are linear, are represented by Q=UC, and wherein Q is the electricity of capacitor, U For the voltage at capacitor both ends, C is capacitance, thus can determine corresponding electric capacitance change by voltage value.In the present embodiment, Second voltage value is the first voltage value of designated ratio, wherein 0 < designated ratio < 100%, can be configured according to actual needs, I.e. discharge time only needs measurement to be discharged to the time required when a certain proportion of supply voltage value, entirely discharges without completing Journey can greatly shorten time of measuring compared with traditional measurement method needs to complete entire discharge process, effectively improve measurement effect Rate.The present embodiment specifically takes 90%, that is, the discharge time measured be discharged to the first voltage value 90%(original capacitor electricity 90%) When the time required to, second voltage value specifically can also be configured according to actual needs.
In the present embodiment, measured capacitance value step further includes reference capacitance configuration step, specially configuration and testing capacitance Capacitor in same quantitative levels is as reference capacitance, if testing capacitance is pF grades, then pF grades of capacitors of corresponding selection are made For reference capacitance.Before testing capacitance measurement, can usually determine its quantitative levels (order of magnitude), the present embodiment by configure with to The reference capacitance for surveying the same order of magnitude of capacitor, determines testing capacitance by the comparison of discharge time between the capacitor of the same order of magnitude Capacitance can reduce gain offsets, to further increase the precision of capacitance measurement, while by reference to the configuration of capacitor, The measurement that the small capacitance to each quantitative levels may be implemented, is not limited by capacitance size, and testing capacitance is specifically as follows several Capacitor of the fF to tens nF.
In the present embodiment, the value of testing capacitance is with specific reference to the capacitance and testing capacitance of reference capacitance and with reference to electricity The ratio calculation of discharge time obtains between appearance.Discharge time is in a linear relationship with capacitance, i.e. testing capacitance and reference capacitance Between capacitance ratio and the ratio of discharge time it is in a linear relationship, then according to the capacitance of reference capacitance, then by be measured The capacitance of testing capacitance can be calculated in the ratio of discharge time between capacitor and reference capacitance.
Discharge curve that the present embodiment testing capacitance, reference capacitance are recorded as shown in figure 4, wherein abscissa is the time, Testing capacitance is from the first voltage value V_{0}It is discharged to second voltage value V_{t}The discharge time of Shi Suoxu is μ s, testing capacitance and reference electricity Discharge time difference between appearance is ns, then μ+n is reference capacitance from the first voltage value V_{0}It is discharged to second voltage value V_{t}Shi Suoxu's Discharge time, specifically (1) is calculated the value of testing capacitance according to the following formula；
C = C_{0*}μ/(μ+n) (1)
Wherein C is the capacitance of testing capacitance, C_{0}For the capacitance of reference capacitance.
In the present embodiment, measurement method further includes distributed capacitance removal step, specific steps are as follows: successively with testing capacitance The distribution capacity of both ends conducting wire calculates the capacitance of target capacitance according to measured capacitance value step as target capacitance, obtain to The distributed capacitance of capacitor both ends conducting wire is surveyed, and calculates the final capacitance of testing capacitance according to obtained distributed capacitance.
Capacitor all exists between any two insulated electric conductor, adjacent two circle of adjacent conducting wire, coil, discrete element and All there is certain capacitor, as distribution capacity, influence etc. of the distribution capacity to circuit between each section inside one element Imitate a capacitor on to circuit in parallel.In lowfrequency ac circuit, the capacitive reactance of distribution capacity is very big, and the influence to circuit is not Greatly, therefore in lowfrequency ac circuit, it can not generally consider the influence of distribution capacity, but for high frequency ac circuit, distribution The influence of capacitor cannot be ignored.
Since the size of small capacitance is in millimeter rank, the capacitance signal that can be obtained is very faint, thus directly surveys Distribution capacity is also superimposed in the capacitor measured, and the value of usually distribution capacity is often more much greater than testing capacitance itself. The present embodiment is on the basis of abovementioned measured capacitance value, by measuring the distributed capacitance at testing capacitance both ends, Ke Yiyou respectively Effect eliminates influence of the distribution capacity to measurement result in micro capacitance, obtains the accurate capacitance of testing capacitance, and traditional Resonance method and succusion etc. can not overcome the influence of distribution capacity.
In the present embodiment, when calculating the capacitance of target capacitance, connected especially by by the conducting wire at end where target capacitance Into charging and discharging circuit, discharge time needed for measuring target capacitance.Testing capacitance both ends conducting wire is successively connected to charge and discharge In circuit, that is, it can measure discharge time needed for obtaining both ends distribution capacity, so that both ends distributed capacitance be calculated.
In the present embodiment, the distributed capacitance of both ends conducting wire is subtracted by the capacitance for the testing capacitance being calculated, and is obtained Obtain the final capacitance of testing capacitance.
As shown in figure 5, C1 and C2 are equivalent to the spuious distribution capacity of the both ends testing capacitance C conducting wire etc. respectively, A, B are respectively The wire interface at testing capacitance both ends.When being measured to testing capacitance, as shown in fig. 6, the end A, B is accessed to charge and discharge first In circuit, the capacitance of testing capacitance is calculated by abovementioned measured capacitance value step, that is, includes the total capacitance value of distribution capacity； The both ends testing capacitance C distribution capacity C1 and C2 are measured respectively again, wherein distribution capacity C1 is electricity of the end A relative to ground Appearance, distribution capacity C2 are capacitor of the end B relative to ground, respectively terminate the end A, B in charging and discharging circuit according to abovementioned capacitor Value measuring process measures, and can be obtained the capacitance of distribution capacity C1 and C2；Finally by capacitance (A, B of testing capacitance Capacitor between both ends) subtract acquisition distribution capacity C1 and C2 capacitance to get arrive testing capacitance C final capacitance, Distributed capacitance is eliminated in final capacitance.
Abovementioned only presently preferred embodiments of the present invention, is not intended to limit the present invention in any form.Although of the invention It has been disclosed in a preferred embodiment above, however, it is not intended to limit the invention.Therefore, all without departing from technical solution of the present invention Content, technical spirit any simple modifications, equivalents, and modifications made to the above embodiment, should all fall according to the present invention In the range of technical solution of the present invention protection.
Claims (8)
Priority Applications (1)
Application Number  Priority Date  Filing Date  Title 

CN201510894356.9A CN105527501B (en)  20151208  20151208  A kind of micro capacitance method 
Applications Claiming Priority (1)
Application Number  Priority Date  Filing Date  Title 

CN201510894356.9A CN105527501B (en)  20151208  20151208  A kind of micro capacitance method 
Publications (2)
Publication Number  Publication Date 

CN105527501A CN105527501A (en)  20160427 
CN105527501B true CN105527501B (en)  20190405 
Family
ID=55769847
Family Applications (1)
Application Number  Title  Priority Date  Filing Date 

CN201510894356.9A CN105527501B (en)  20151208  20151208  A kind of micro capacitance method 
Country Status (1)
Country  Link 

CN (1)  CN105527501B (en) 
Families Citing this family (8)
Publication number  Priority date  Publication date  Assignee  Title 

CN107402319A (en) *  20160519  20171128  苏州明皜传感科技有限公司  Measure the probe card of micro electric capacity 
TWI610081B (en) *  20160527  20180101  蘇州明皜傳感科技有限公司  Probe card for measuring microcapacitance 
CN105974203B (en) *  20160624  20181002  武汉精测电子集团股份有限公司  A kind of micro capacitance method and device 
CN106645981B (en) *  20161230  20190827  上海东软载波微电子有限公司  Capacitor's capacity measuring circuit 
CN106501618B (en) *  20161230  20190226  上海东软载波微电子有限公司  Capacitor's capacity measuring circuit 
CN108519521A (en) *  20180410  20180911  杭州米芯微电子有限公司  Capacitance measurement system, method and apparatus 
CN108469218B (en) *  20180509  20200207  广东工业大学  Capacitance ranging method, system and device and readable storage medium 
TWI686042B (en)  20181207  20200221  群光電能科技股份有限公司  Power conversion device 
Citations (2)
Publication number  Priority date  Publication date  Assignee  Title 

CN101173967A (en) *  20061101  20080507  上海华虹Nec电子有限公司  Testing circuit and method for tiny capacitance 
CN101490567A (en) *  20060601  20090722  伊莱克斯家用产品公司  Method and device for measuring the capacitance of a capacitive component 
Family Cites Families (2)
Publication number  Priority date  Publication date  Assignee  Title 

FR2885416B1 (en) *  20050507  20160610  Acam Messelectronic Gmbh  Method and device for measuring capacities. 
US9470739B2 (en) *  20131112  20161018  Ford Global Technologies, Llc  DC link capacitance measurement for electric vehicle drivetrain 

2015
 20151208 CN CN201510894356.9A patent/CN105527501B/en active IP Right Grant
Patent Citations (2)
Publication number  Priority date  Publication date  Assignee  Title 

CN101490567A (en) *  20060601  20090722  伊莱克斯家用产品公司  Method and device for measuring the capacitance of a capacitive component 
CN101173967A (en) *  20061101  20080507  上海华虹Nec电子有限公司  Testing circuit and method for tiny capacitance 
NonPatent Citations (1)
Title 

基于充放电原理的小电容测量电路;李新娥等;《探测与控制学报》;20120430;第34卷(第2期);第4248页 
Also Published As
Publication number  Publication date 

CN105527501A (en)  20160427 
Similar Documents
Publication  Publication Date  Title 

CN105379120B (en)  It is detected using Δ/Σ conversion capacitive proximity  
CN101806832B (en)  Measuring method for frequencies of lowfrequency signals  
CN102608542A (en)  Method for estimating charge state of power cell  
RU2324286C1 (en)  Device for analogtodigital conversion of measured voltage  
CN103018680B (en)  Metering method and metering device of battery level and battery supply set  
US9244104B2 (en)  Detecting a dielectric article  
KR20160087389A (en)  Capacitive fingerprint sensing device  
CN103257271B (en)  A kind of microcapacitance sensor harmonic wave based on STM32F107VCT6 and mAcetyl chlorophosphonazo pickup unit and detection method  
US10074004B2 (en)  Capacitive fingerprint sensor with integrator  
CN203149027U (en)  Voltage fluctuation and flicker detection apparatus based on energy operator and frequency spectrum correction  
TWI615761B (en)  Capacitive fingerprint sensor  
CN100439926C (en)  Integrator for Rogowski coil and its realizing method  
CN101813725B (en)  Method for measuring phase difference of lowfrequency signals  
CN102954753B (en)  Capacitive distance sensor  
CN101975893B (en)  Differential capacitance detection circuit based on instrument amplifier and detection method thereof  
CN201141892Y (en)  Threephase fourwire electronic splitphase measuring electric energy meter  
CN102095934B (en)  Measuring method for phase difference of alternating current signals  
CN103454905B (en)  A kind of method for synchronizing time  
CN102628892B (en)  Method for calculating voltageloss unusual electrical energy measurement on line and electric energy meter  
CN102997974B (en)  Adaptive capacitance liquid level meter  
CN103743933B (en)  A kind of singlephase electric energy meter is to the compensation method from heat affecting  
CN1882843A (en)  Battery cell voltage and impedance measuring circuit  
CN204909403U (en)  Electronic clinical thermometer  
CN104050366A (en)  Dynamic reactive power compensation device response time test method  
CN106066217B (en)  System and method for MEMS sensor 
Legal Events
Date  Code  Title  Description 

PB01  Publication  
C06  Publication  
SE01  Entry into force of request for substantive examination  
C10  Entry into substantive examination  
GR01  Patent grant  
GR01  Patent grant 