CN100427958C - Agitating measuring device and measuring method - Google Patents
Agitating measuring device and measuring method Download PDFInfo
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- CN100427958C CN100427958C CNB021479550A CN02147955A CN100427958C CN 100427958 C CN100427958 C CN 100427958C CN B021479550 A CNB021479550 A CN B021479550A CN 02147955 A CN02147955 A CN 02147955A CN 100427958 C CN100427958 C CN 100427958C
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Abstract
The present invention relates to an agitating measurement device for measuring the agitating quantity of a serial digital signal, which comprises a sketchy length measurement unit, a multiphase signal generation unit, a phase difference length measurement unit, a length integration unit, a signal selection unit, an average length calculation unit, a length difference value calculation unit, and an agitating calculation unit, wherein the sketchy length measurement unit receives a serial digital signal and a reference clock and generates sketchy pulse length; the multiphase signal generation unit generates a plurality of phase-delay reference clocks of different phases; the phase difference length measurement unit generates a positive edge phase difference length and a negative edge phase difference length; the length integration unit receives the sketchy pulse length, the positive edge phase difference length and the negative edge phase difference length and calculates the pulse length of the serial digital signal; the signal selection unit selects the pulse length corresponding to a length selection signal to serve as measurement pulse length; the average length calculation unit calculates the average pulse length of the measurement pulse length; the length difference value calculation unit calculates the length difference value of the measurement pulse length and the average pulse length; the agitating calculation unit calculates the average value of the length difference value to serve as agitating quantity.
Description
Technical field
The present invention relates to jitter measuring apparatus and measuring method, particularly relate to the length of utilizing multiphase clock to come the accurate Calculation serial digital signal, and measure the jitter measuring apparatus and the measuring method of the amount of jitter of serial digital signal.
Background technology
In optical media reading device (optical storage apparatus), jitter measuring apparatus (Jitter meter) is an important link.The measurement result of this jitter measuring apparatus is the pointer (indicator) of signal quality (signal quality).If the optical media reading device uses jitter measuring apparatus accurately, then this optical media reading device can capture correct signal message, and the oneself is adjusted to optimum condition.Jitter measuring apparatus generally is divided into numerical approach (digital method) and analogy method (analog method).
Numerical approach be will input the shaping (shaping) of serial digital signal elder generation, calculate the umber of pulse of the reference clock that each pulse width occurred of waveform after the shaping again.Afterwards, find out the difference value of the umber of pulse of being calculated as amount of jitter.The shortcoming of the method is when the serial digital signal of high frequency, and the reference clock of higher frequency must be provided.Convert voltage signal to and analogy method is each pulse width with serial digital signal, utilize wave filter to filter this voltage signal again.The voltage change amount of being filtered is amount of jitter.The shortcoming of the method is that the switch speed of employed switch influences measurement result widely, and change-over switch at a high speed is difficult for implementing.
Summary of the invention
Because a kind of jitter measuring apparatus and measuring method that need not provide high frequency reference clock can accurately measure the amount of jitter of serial digital signal is provided the problems referred to above.
For achieving the above object, jitter measuring apparatus of the present invention comprises: a summary linear measure longimetry unit is used to receive a serial digital signal and a reference clock, and produces the summary pulse length; One multi-phase signals generation unit is used for producing according to reference clock the phase delay reference clock of a plurality of outs of phase; One phase differential linear measure longimetry unit is used to receive serial digital signal, reference clock and phase delay reference clock, and produces positive edge phase differential length and negative edge phase differential length; One length integral unit is used to receive summary pulse length, positive edge phase differential length and negative edge phase differential length, and calculates the pulse length of serial digital signal; One signal selected cell is used for selecting signal according to a length, selects should length selecting the pulse length of signal as measuring pulse length; One average length computing unit is used for receiving and measures pulse length, and calculates the average pulse length of this measurement pulse length; One difference in length value computing unit is used for receiving and measures pulse length and average pulse length, and calculates the length difference of measuring pulse length and average pulse length; And a Jitter Calculation unit, be used to receive length difference, and the mean value that calculates this length difference is as amount of jitter.
Because jitter measuring apparatus of the present invention can utilize the reference clock of lower frequency to measure the amount of jitter of serial digital signal, release must provide the puzzlement of high frequency reference clock.
Description of drawings
Fig. 1 shows the calcspar of jitter measuring apparatus of the present invention.
The calcspar of one embodiment of Fig. 2 shows signal linear measure longimetry unit.
Fig. 3 shows phase differential linear measure longimetry element circuit figure.
Fig. 4 shows the sequential chart of serial digital signal and reference clock.
Fig. 5 shows a decoding embodiment of decoding scheme of the present invention.
Fig. 6 shows an embodiment of average length computing unit.
Fig. 7 shows the process flow diagram of jitter measurement method of the present invention.
The drawing reference numeral explanation
10 jitter measuring apparatus
11 signal length measuring units
111 summary linear measure longimetry unit
112 multi-phase signals generation units
113 phase differential linear measure longimetry unit
114 length integral unit
12 signal selected cells
13 average length computing units
14 difference in length value computing units
15 Jitter Calculation unit
Embodiment
Describe jitter measuring apparatus of the present invention and measuring method in detail below in conjunction with accompanying drawing.
Fig. 1 shows the calcspar of jitter measuring apparatus of the present invention.As shown in the drawing, jitter measuring apparatus 10 of the present invention comprises a signal length measuring unit 11, a signal selected cell 12, an average length computing unit 13, a difference in length value computing unit 14 and a Jitter Calculation unit 15.Signal length measuring unit 11 is used to receive a serial digital signal (serial digital data signal) and a reference clock (reference clock), and the multiphase clock that utilizes reference clock to produce is accurately measured the length of each pulse of serial digital signal.Because the pulse length of serial digital signal has multiple scope, for example from serial digital signal that CD-ROM captured between 3T-11T, T is the basic cycle unit of serial digital signal, therefore jitter measuring apparatus 10 utilizes signal selected cell 12 to select signal according to length, selects should length selecting the pulse length of signal as measuring pulse length.Average length computing unit 13 is used for calculating the average length of selected measurement pulse length.Difference in length value computing unit 14 is used to calculate the difference in length value of each selected measurement pulse length and average length.At last, the mean value of Jitter Calculation unit 15 computational length difference value is exported as jitter value.
The calcspar of one embodiment of Fig. 2 shows signal linear measure longimetry unit.As shown in the drawing, signal length measuring unit 11 comprises summary linear measure longimetry unit 111, multi-phase signals generation unit 112, phase differential linear measure longimetry unit 113 and length integral unit 114.Known signal length measuring unit is directly measured the pulse length of serial digital signal with the high frequency reference clock that is higher than tens of times of serial digital signal frequencies, and the present invention is then to equal or can accurately measure a little more than the high frequency reference clock of serial digital signal frequency several times the pulse length of serial digital signal.Summary linear measure longimetry unit 111 is used for directly directly measuring with reference clock CK0 the pulse length of serial digital signal, because the frequency of reference clock CK0 is not high, the pulse length of summary is only measured in this summary linear measure longimetry unit 111.It is identical with reference clock CK0 frequency that signal length measuring unit 11 utilizes multi-phase signals generation unit 112 to produce, but the different a plurality of out of phase reference clocks of phase place, for example CK1-CK7.The 113 phase differential length of measuring the positive and negative edge of serial digital signal according to this out of phase reference clock CK0-CK7 in phase differential linear measure longimetry unit.Afterwards, signal length measuring unit 11 utilizes length integral unit 114 to integrate the phase differential length of summary pulse length and positive and negative edge, can accurate calculate the pulse length of serial digital signal.
Fig. 3 shows the embodiment of phase differential linear measure longimetry element circuit figure.As shown in the drawing, suppose that multi-phase signals generation unit 112 produces the reference clock CK1-CK7 of 7 outs of phase and phase average, so phase differential linear measure longimetry unit 113 receives 8 reference clock CK0-CK7.Phase differential linear measure longimetry unit 113 utilizes 8 groups of D flip-flops to receive 8 reference clock CK0-CK7 respectively, and serial digital signal.Every group of D flip-flop comprises a positive edge and triggers a trigger and a negative edge triggering trigger, and each D flip-flop with reference clock as input end signal, and with serial digital signal as trigger pip.So 8 groups of D flip-flops produce one group of positive edge phase signal DA0-DA7 by 8 positive edge triggering triggers, and produce one group of negative edge phase signal DB0-DB7 by 8 negative edge triggering triggers.Decoding scheme 1131 is the phase differential length that positive edge phase signal DA0-DA7 of basis and negative edge phase signal DB0-DB7 produce positive and negative edge.
Fig. 4 shows the sequential chart of serial digital signal and reference clock CK0-CK7, and wherein Ti is that pulse length, the Tr of serial digital signal are that summary pulse length, Δ T1 are that positive edge phase differential length and Δ T2 are negative edge phase differential length.The Cycle Length of hypothetical reference clock CK0-CK7 is P, and in this embodiment, Cycle Length P is identical with the T of basic cycle unit of serial digital signal, is beneficial to explanation, and the length of Cycle Length P is short more certainly, and the resolution of measurement is high more.At first, directly with the pulse length of reference clock CK0 direct census serial digital signal, therefore as shown in the figure, Tr is 4 reference clock cycles, that is Tr=4P in summary linear measure longimetry unit 111.In addition, positive edge phase signal DA0-DA7 triggers 8 positive edge to trigger the output valve that trigger produced when the positive edge of serial digital signal, and therefore positive edge phase signal DA0-DA7 is 11000011 in Fig. 4.In like manner, negative edge phase signal DB0-DB7 triggers 8 negative edge to trigger the output valves that trigger produced when serial digital signal is born edge, and therefore negative edge phase signal DB0-DB7 is 00111100 in Fig. 4.Decoding scheme 1131 promptly calculates phase differential length Δ T1 and Δ T2 according to this phase signal DA0-DA7 and DB0-DB7.
Fig. 5 shows a decoding embodiment of decoding scheme of the present invention, and wherein P is the Cycle Length of reference clock.As shown in Figure 5, phase signal DA0-DA7 and DB0-DB7 only have 8 kinds of states, respectively corresponding 8 kinds of phase differential length.For example, phase signal is 10000111 o'clock, and its corresponding phase differential length is 0*P/8, that is the positive edge of serial digital signal or negative edge and reference clock CK0 same-phase.And when phase signal was 11000011, its corresponding phase differential length was 1*P/8, that is the positive edge of serial digital signal or negative edge and reference clock CK1 same-phase, by that analogy.Certainly, present embodiment is with the reference clock of 8 outs of phase as an example, if with the reference clock of 10 outs of phase as an example, then phase signal is 10, and has 10 kinds of states.Therefore the phase place of reference clock is many more, and the resolution of measurement is high more.
Again with reference to figure 2 and Fig. 4, after summary linear measure longimetry unit 111 and phase differential linear measure longimetry unit 113 were obtained summary length and phase differential length respectively, signal length measuring unit 11 utilized length integral unit 114 can calculate the pulse length of serial digital signal according to the phase differential length gauge of summary pulse length and positive and negative edge.Its computing method are as the formula (1):
Ti＝Tr-ΔT1+ΔT2....(1)
Because the pulse length T i of serial digital signal is distributed in the cycle of different range, for example the scope of CD-ROM system is 3T-11T, so jitter measuring apparatus of the present invention 10 utilizes signal selected cell 12 to pick out the amount of jitter that the identical pulse length Ti of scope calculates serial digital signal.Signal selected cell 12 selects signal to come the identical pulse length Ti of range of choice according to a length, and for example if it is 5 that length is selected signal, then signal selected cell 12 selects pulse length Ti near 5T as measuring pulse length.Certainly, can be real-time ground output select the pulse length Ti of signal near length to this signal selected cell 12, also can utilize all pulse length Ti of a memory storage after, length is exported the pulse length Ti that the nearly length of a winding is selected signal.
Afterwards, jitter measuring apparatus 10 of the present invention utilizes average length computing unit 13 to calculate the average length Ta of selected measurement pulse length.This average length computing unit 13 can be a low-pass filter, as shown in Figure 6.If low-pass filter is the mean value calculation system (average system) of 1/M, X (N) express time is the input of N, and Y (N+1) express time is the output of N+1, and then the output valve of this low-pass filter is:
Y(N+1)＝(1/M)*X(N)+[(M-1)/M]*Y(N)...(2)
Then, jitter measuring apparatus 10 utilizes difference in length value computing unit 14 to calculate the difference in length value of each selected measurement pulse length and average length Ta.This difference in length value computing unit 14 can be a subtracter, will measure pulse length and deduct average length Ta, can produce difference in length value Te.At last, jitter measuring apparatus 10 utilizes the mean value of Jitter Calculation unit 15 computational length difference value Te to export as jitter value.This Jitter Calculation unit 15 is identical with average length computing unit 13, also can utilize low-pass filter to implement.
Fig. 7 shows the process flow diagram of jitter measurement method of the present invention.The step of its measurement is as follows:
Step S702: calculate the summary pulse length.Utilize a reference clock to calculate the summary pulse length of each pulse of serial digital signal.The frequency of this reference clock can be too high.
Step S704: calculate phase differential length.Calculate the phase differential length of the positive edge of the positive and negative edge of serial digital signal and reference clock according to the leggy reference clock.This leggy reference clock utilizes reference clock to produce, so the frequency of leggy reference clock is identical with the frequency of reference clock.
Step S706: calculate pulse length.According to summary pulse length and phase differential length computation pulse length.Its computing method are that the summary pulse length is deducted positive edge phase differential length, add negative edge phase differential length afterwards.
Step S708: strobe pulse length.Select the signal selector should length selects the pulse length of signal as measuring pulse length according to a length.Because pulse length and on-fixed, for example therefore the pulse length in the CD-ROM system must select the pulse length of same range as to calculate amount of jitter between 3T-11T.
Step S710: calculate average length.The mean value that calculates the measurement pulse length is as average pulse length.
Step S712: computational length difference value.Calculate the difference value that each measures pulse length and average pulse length, as the difference in length value.
Step S714: calculate amount of jitter.The mean value that is the computational length difference value is as measured amount of jitter.
In sum, jitter measuring apparatus of the present invention can utilize the reference clock of lower frequency to measure the amount of jitter of serial digital signal, and release must provide the puzzlement of high frequency reference clock.Though more than with embodiment the present invention is described, therefore do not limit scope of the present invention, only otherwise break away from spirit of the present invention, those skilled in the art can carry out various distortion or change.
Claims (20)
1. jitter measuring apparatus is used for measuring the amount of jitter of serial digital signal, and this jitter measuring apparatus comprises:
One summary linear measure longimetry unit is used to receive described serial digital signal and reference clock, and produces the summary pulse length to each pulse that should serial digital signal;
One multi-phase signals generation unit is used for producing according to described reference clock the leggy reference clock of a plurality of outs of phase;
One phase differential linear measure longimetry unit is used to receive described serial digital signal, described reference clock and described leggy reference clock, and produces positive edge phase differential length and negative edge phase differential length that should serial digital signal; And
One length integral unit is used to receive described summary pulse length, positive edge phase differential length and negative edge phase differential length, and calculates the described summary pulse length of each pulse of corresponding described serial digital signal.
One signal selected cell is used for selecting signal according to a length, selects from described summary pulse length should length selecting the pulse length of signal as measuring pulse length;
One average length computing unit is used to receive described measurement pulse length, and calculates the average pulse length of this measurement pulse length;
One difference in length value computing unit is used to receive described measurement pulse length and described average pulse length, and calculates the length difference of measuring pulse length and average pulse length; And
One Jitter Calculation unit is used to receive described length difference, and the mean value that calculates this length difference is as amount of jitter.
2. jitter measuring apparatus as claimed in claim 1, wherein said summary linear measure longimetry unit is a counter, and the umber of pulse that is used for calculating the described reference clock that is occurred during each high levels of described serial digital signal and the low level is as described summary pulse length.
3. jitter measuring apparatus as claimed in claim 1, wherein said phase differential linear measure longimetry unit comprises:
The trigger that a plurality of positive edge trigger is used for described serial digital signal receiving described reference clock and the described leggy reference clock input signal as this trigger simultaneously, and producing positive edge phase signal as trigger pip;
The trigger that a plurality of negative edge trigger is used for described serial digital signal receiving described reference clock and the described leggy reference clock input signal as this trigger simultaneously, and producing negative edge phase signal as trigger pip; And
One code translator is used to receive described positive edge phase signal and negative edge phase signal, and produces described positive edge phase differential length and negative edge phase differential length according to comparison list.
4. jitter measuring apparatus as claimed in claim 1, wherein said length integral unit are used for described summary pulse length and described positive edge phase differential length and bear edge phase differential length and make plus and minus calculation.
5. jitter measuring apparatus as claimed in claim 1, wherein said average length computing unit is a low-pass filter.
6. jitter measuring apparatus as claimed in claim 1, wherein said Jitter Calculation unit is a low-pass filter.
7. jitter measuring apparatus as claimed in claim 1, wherein said difference in length value computing unit is a subtracter.
8. jitter measurement method is used for measuring the amount of jitter of serial digital signal, and this jitter measurement method comprises the following step:
Calculate the summary pulse length, utilize a reference clock to calculate the summary pulse length of each pulse of serial digital signal;
Calculate phase differential length, calculate the positive and negative edge phase differential length of positive and negative edge with the triggering edge of reference clock of serial digital signal according to one group of leggy reference clock, wherein should organize leggy reference clock and produce according to described reference clock;
Calculate pulse length, according to described summary pulse length and described positive and negative edge phase differential length computation and produce pulse length;
Strobe pulse length, according to a length select signal from described pulse length selector should length selects the pulse length of signal as measuring pulse length;
Calculate average length, the mean value that calculates described measurement pulse length is as average pulse length;
The computational length difference value, calculate described each measure the difference value of pulse length and described average pulse length, as the difference in length value; And
Calculate amount of jitter, the mean value that calculates described difference in length value is as amount of jitter.
9. jitter measurement method as claimed in claim 8 in the step of wherein said calculating pulse length, deducts described positive edge phase differential length with described summary pulse length, and adds the above negative edge phase differential length as pulse length.
10. a jitter measurement method is used for measuring the amount of jitter at serial digital signal, and described jitter measurement method comprises step:
Receive a described serial digital signal and a reference clock, and measure the pulse length of each pulse of this serial digital signal according to this reference clock;
Select corresponding length to select the pulse length of signal as selected pulse length;
Calculate the average pulse length of selected pulse length;
Receive selected pulse length and described average pulse length, and calculate the difference in length value of each selected pulse length and average pulse length; And
The mean value that receives described difference in length value and calculate this difference in length value is as amount of jitter;
Receive described serial digital signal and described reference clock, and produce the summary pulse length of each pulse of this serial digital signal;
Produce multiphase clock according to described reference clock;
Receive described serial digital signal, described reference clock and described multiphase clock, and produce positive edge phase differential and negative edge phase differential each pulse that should serial digital signal; And
Receive described summary pulse length, positive edge phase differential and negative edge phase differential, and calculate the described pulse length of each pulse of corresponding described serial digital signal.
11. jitter measurement method as claimed in claim 10, wherein, the step that produces described summary pulse length is the umber of pulse of counting as the reference clock of each pulse of summary pulse length.
12. jitter measurement method as claimed in claim 10, wherein, the step that produces positive edge phase differential and negative edge phase differential comprises step:
According to producing positive edge phase signal as the reference clock of input signal and multiphase clock with as the serial digital signal of trigger pip;
According to producing negative edge phase signal as the reference clock of input signal and multiphase clock with as the serial digital signal of trigger pip; And
Receive described positive edge phase signal and described negative edge phase signal, and produce positive edge phase differential and negative edge phase differential according to look-up table.
13., wherein, calculate the step of pulse length and subtract each other and sum operation for described summary pulse length, described positive edge phase differential and negative edge phase differential execution as the jitter measurement method of claim 10.
14. jitter measurement method as claimed in claim 10, wherein, the step of calculating average pulse length is to carry out the low-pass filtering rules.
15. jitter measurement method as claimed in claim 10, wherein, the mean value that calculates described difference in length value is to carry out the low-pass filtering rules as the step of amount of jitter.
16. jitter measurement method as claimed in claim 10, wherein, the step of calculating described difference in length value is to carry out the subtraction rules.
17. a pulse length measurement mechanism is used for measuring the pulse length at serial digital signal, described pulse length measurement mechanism comprises:
One summary linear measure longimetry unit is used to receive serial digital signal and reference clock, and produces the summary pulse length of each pulse of described serial digital signal;
One multi-phase signals generator is used for producing multiphase clock according to reference clock;
One phase differential linear measure longimetry unit is used to receive serial digital signal, reference clock and multiphase clock, and produces the positive edge phase differential and the negative edge phase differential of each pulse of described serial digital signal; And
One length integral unit is used to receive summary pulse length, positive edge phase differential and negative edge phase differential, and calculates the pulse length of each pulse of described serial digital signal.
18. a pulse length measuring method is used for measuring the pulse length at serial digital signal, described pulse length measuring method comprises step:
Receive serial digital signal and reference clock, and produce the summary pulse length of each pulse of described serial digital signal;
Produce multiphase clock according to reference clock;
Receive serial digital signal, reference clock and multiphase clock, and produce the positive edge phase differential and the negative edge phase differential of each pulse of described serial digital signal; And
Receive summary pulse length, positive edge phase differential and negative edge phase differential, and calculate the pulse length of each pulse of described serial digital signal.
19. a phase difference measuring apparatus is used for measuring the phase differential at serial digital signal, described phase difference measuring apparatus comprises:
The trigger that a plurality of positive edge trigger is used to receive reference clock and multiphase clock as input signal with receive serial digital signal as trigger pip, to produce positive edge phase signal;
The trigger that a plurality of negative edge trigger is used to receive reference clock and multiphase clock as input signal with receive serial digital signal as trigger pip, to produce negative edge phase signal; And
Demoder is used to receive described positive edge phase signal and negative edge phase signal, and produces positive edge phase differential and negative edge phase differential according to comparison list.
20. a method for measuring phase difference is used for measuring the phase differential at serial digital signal, described method for measuring phase difference comprises step:
By receiving reference clock and multiphase clock as input signal with receive serial digital signal as trigger pip, to produce a plurality of positive edge phase signals;
By receiving reference clock and multiphase clock as input signal with receive serial digital signal as trigger pip, to produce a plurality of negative edge phase signals; And
Receive positive edge phase signal and negative edge phase signal, and produce positive edge phase differential and negative edge phase differential according to comparison list.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107192890A (en) * | 2017-07-02 | 2017-09-22 | 中国航空工业集团公司雷华电子技术研究所 | A kind of measuring method of radio-frequency pulse shake |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1862273B (en) * | 2006-01-09 | 2010-04-21 | 北京大学深圳研究生院 | System for on-chip testing clock signal dither |
| CN100501423C (en) * | 2006-04-18 | 2009-06-17 | 北京大学深圳研究生院 | High-frequency clock jitter measuring circuit and calibration method thereof |
| CN101359014B (en) * | 2007-07-31 | 2010-11-17 | 智原科技股份有限公司 | Built-in dithering measuring circuit |
| JP5228481B2 (en) * | 2007-12-28 | 2013-07-03 | 富士通株式会社 | Method for estimating jitter based on simultaneous operation signal noise for semiconductor device, method for calculating correlation between simultaneous operation signal noise amount and jitter amount used for the estimation, program for realizing them, and semiconductor device and the same Printed circuit board design method |
| CN101232333B (en) * | 2008-01-16 | 2011-06-22 | 中兴通讯股份有限公司 | Clock shake measuring method and oscilloscope for measuring clock shake |
| CN108333440B (en) * | 2017-12-30 | 2021-02-12 | 聚光科技(杭州)股份有限公司 | Pulse detection method and device |
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| US5293520A (en) * | 1991-10-18 | 1994-03-08 | Advantest Corporation | Jitter analyzer |
| US5692009A (en) * | 1993-10-01 | 1997-11-25 | Leader Electronics Corporation | Jitter measuring method and apparatus |
| CN1289410A (en) * | 1998-01-30 | 2001-03-28 | 波峰有限公司 | Method and apparatus for jitter analysis |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5293520A (en) * | 1991-10-18 | 1994-03-08 | Advantest Corporation | Jitter analyzer |
| US5692009A (en) * | 1993-10-01 | 1997-11-25 | Leader Electronics Corporation | Jitter measuring method and apparatus |
| CN1289410A (en) * | 1998-01-30 | 2001-03-28 | 波峰有限公司 | Method and apparatus for jitter analysis |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107192890A (en) * | 2017-07-02 | 2017-09-22 | 中国航空工业集团公司雷华电子技术研究所 | A kind of measuring method of radio-frequency pulse shake |
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