CN101232333B - Clock shake measuring method and oscilloscope for measuring clock shake - Google Patents
Clock shake measuring method and oscilloscope for measuring clock shake Download PDFInfo
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- CN101232333B CN101232333B CN2008100027278A CN200810002727A CN101232333B CN 101232333 B CN101232333 B CN 101232333B CN 2008100027278 A CN2008100027278 A CN 2008100027278A CN 200810002727 A CN200810002727 A CN 200810002727A CN 101232333 B CN101232333 B CN 101232333B
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Abstract
The invention provides a clock jitter measurement method and an oscilloscope, the method comprises the following steps that: a clock to be measured is accessed into a measurement channel of the oscilloscope with a delay trigger function; the measurement effort T0 which is caused by a trigger system of the oscilloscope is measured; the trigger mode of the oscilloscope is set as a delay mode, the delay time value T1 is adjusted according to the jitter frequency scope which needs to be measured; the clock edge CLK2 which has the time interval T1 to the trigger clock edge CLK1 is found; the time interval value T2 between the left point and the right point of the CLK2 edge on the trigger level position is measured; and the Tjitter=((T2)<2>-(T0)<2>)<1/2> is set as the clock jitter value. The method eliminates the measurement error which is caused by the trigger system of the oscilloscope, so as to achieve the purpose of simply and effectively reduce the measurement error of the clock jitter.
Description
Technical field
The present invention relates to the communications field, more specifically, relate to a kind of clock shake measuring method and the oscilloscope that is used to measure clock jitter.
Background technology
The error performance and the clock jitter of Modern High-Speed digital communication system are closely related, and clock jitter exceeds standard and can cause system's error performance to worsen.Clock jitter is measured and both can also can be realized in time domain at frequency domain.At the frequency domain category, can test with frequency spectrograph or phase noise instrument.At the time domain category, can test with oscilloscope, time interval analyzer or the Error Detector with jitter analysis ability.
Based on one of oscillographic clock jitter method of testing is to utilize oscillographic delay (delay) to trigger function to realize, but the measure error of present this method of testing is bigger.
Summary of the invention
The present invention aims to provide a kind of clock shake measuring method and is used to measure the oscilloscope of clock jitter, can solve the bigger problem of measure error in the clock jitter method of testing of prior art.
According to an aspect of the present invention, provide a kind of clock shake measuring method, may further comprise the steps: clock to be measured has been inserted oscillographic test channel with delay triggering function; Measure the measure error T0 that causes owing to oscillographic triggering system; It is delayed mode that oscillographic triggering mode is set, and according to the chattering frequency scope of wanting to measure, adjusts and to be worth T1 time of delay; Finding and triggering clock edge CLK1 is the clock edge CLK2 of T1 at a distance of the time interval; Measure the CLK2 time interval value T2 of edge between triggering level left and the rightest locational point; Be provided with
As the clock jitter value.
Preferably, measure the measure error T0 cause owing to oscillographic triggering system and specifically comprise: the triggering mode that oscillographic test channel is set is the triggering of clock to be measured edge, and it is half of clock amplitude to be measured that triggering level is made as; It is the infinite persistence mode that oscillographic display mode is set, and shows a plurality of clock waveforms on oscillographic display screen simultaneously; In the time interval between the left and the rightest point in edge of using horizon light mapping amount clock to be measured on the trigger position, be designated as T0.
Preferably, be during clock to be measured edge triggers at the triggering mode that oscillographic test channel is set, trigger according to concrete application choice rising edge or trailing edge.
Preferably, by show a plurality of clock waveforms simultaneously on oscillographic display screen, finding on the oscilloscope display screen and triggering clock edge CLK1 is the clock edge CLK2 of T1 at a distance of the time interval.
According to a further aspect in the invention, provide a kind of oscilloscope that is used to measure clock jitter, it has the triggering of delay function, and comprising: test channel is used to insert clock to be measured; Adjusting module, being used to be provided with oscillographic triggering mode is delayed mode, according to the chattering frequency scope of wanting to measure, adjusts and to be worth T1 time of delay; Measurement module, be used to measure the measure error T0 that causes owing to oscillographic triggering system, finding and triggering clock edge CLK1 is the clock edge CLK2 of T1 at a distance of the time interval, and measures the CLK2 time interval value T2 of edge between triggering level left and the rightest locational point; Module is set, is used for being provided with
As the clock jitter value.
Preferably, measurement module specifically comprises: first is provided with the unit, and the triggering mode that is used to be provided with oscillographic test channel is that clock to be measured edge triggers, and it is half of clock amplitude to be measured that triggering level is made as; Second is provided with the unit, and being used to be provided with oscillographic display mode is the infinite persistence mode, shows a plurality of clock waveforms on oscillographic display screen simultaneously; Measuring unit is used for the time interval between the left and the rightest point in edge of using horizon light mapping amount clock to be measured on the trigger position, is designated as T0.
Preferably, first the unit is set is during clock to be measured edge triggers at the triggering mode that oscillographic test channel is set, and triggers according to concrete application choice rising edge or trailing edge.
Method of measurement of the foregoing description and oscilloscope have been eliminated the measure error of bringing owing to oscillographic triggering system, so reached the purpose that simply and effectively reduces the clock jitter measure error.
Description of drawings
Accompanying drawing described herein is used to provide further understanding of the present invention, constitutes the application's a part, and illustrative examples of the present invention and explanation thereof are used to explain the present invention, do not constitute improper qualification of the present invention.In the accompanying drawings:
Fig. 1 shows the flow chart according to the clock shake measuring method of the embodiment of the invention;
Fig. 2 shows the systematic error instrumentation plan according to the embodiment of the invention;
Fig. 3 shows the clock jitter instrumentation plan under the delay trigger mode according to the embodiment of the invention; And
Fig. 4 shows the oscilloscope that is used to measure clock jitter according to the embodiment of the invention.
Embodiment
Below with reference to the accompanying drawings and in conjunction with the embodiments, describe the present invention in detail.
Fig. 1 shows the flow chart according to the clock shake measuring method of the embodiment of the invention, may further comprise the steps:
Step S10 inserts the oscillographic test channel with delay triggering function to clock to be measured, for example uses oscilloprobe just can insert clock to be measured;
Step S20 measures the measure error T0 that causes owing to oscillographic triggering system;
Step S30, it is delayed mode that oscillographic triggering mode is set, and according to the chattering frequency scope of wanting to measure, adjusts value time of delay, this time value is designated as T1;
Step S40, finding and triggering clock edge CLK1 is the clock edge CLK2 of T 1 at a distance of the time interval, for example, show a plurality of clock waveforms on oscillographic display screen simultaneously, can find and trigger clock edge CLK1 on the oscilloscope display screen is the clock edge CLK2 of T1 at a distance of the time interval;
Step S50 measures the time interval value of CLK2 edge between triggering level left and the rightest locational point, is designated as T2 (as shown in Figure 3);
Step S60 is provided with
As the clock jitter value.
Main testing equipment comprises:
Has the oscilloscope that postpones to trigger function;
Oscilloprobe with high input impedance and low input capacitive reactance.
Compared with prior art, this embodiment has introduced and has eliminated because the implementation method of the measure error that oscillographic triggering system is brought reaches the purpose that simply and effectively reduces the clock jitter measure error.
Fig. 2 shows the systematic error instrumentation plan according to the embodiment of the invention.Preferably, as shown in Figure 2, measure the measure error T0 cause owing to oscillographic triggering system and specifically comprise: the triggering mode that oscillographic test channel is set is the triggering of clock to be measured edge, and it is half of clock amplitude to be measured that triggering level is made as; It is the infinite persistence mode that oscillographic display mode is set, and shows a plurality of clock waveforms on oscillographic display screen simultaneously; In the time interval between the left and the rightest point in edge of using horizon light mapping amount clock to be measured on the trigger position, be designated as T0.
Preferably, be during clock to be measured edge triggers at the triggering mode that oscillographic test channel is set, trigger according to concrete application choice rising edge or trailing edge.
Preferably, by show a plurality of clock waveforms simultaneously on oscillographic display screen, finding on the oscilloscope display screen and triggering clock edge CLK1 is the clock edge CLK2 of T1 at a distance of the time interval.
As can be seen from the above description, the present invention has realized following technique effect: the method that is used for realizing reducing the clock jitter measure error on the digital oscilloscope with delay triggering function.
Fig. 4 shows the oscilloscope that is used to measure clock jitter according to the embodiment of the invention, and it has the triggering of delay function, comprising:
Adjusting module 20, being used to be provided with oscillographic triggering mode is delayed mode, according to the chattering frequency scope of wanting to measure, adjusts and to be worth T1 time of delay;
Preferably, measurement module 30 specifically comprises: first is provided with the unit, and the triggering mode that is used to be provided with oscillographic test channel is that clock to be measured edge triggers, and it is half of clock amplitude to be measured that triggering level is made as; Second is provided with the unit, and being used to be provided with oscillographic display mode is the infinite persistence mode, shows a plurality of clock waveforms on oscillographic display screen simultaneously; Measuring unit is used for the time interval between the left and the rightest point in edge of using horizon light mapping amount clock to be measured on the trigger position, is designated as T0.
Preferably, first the unit is set is during clock to be measured edge triggers at the triggering mode that oscillographic test channel is set, and triggers according to concrete application choice rising edge or trailing edge.
The oscilloscope of the foregoing description has been eliminated the measure error of bringing owing to oscillographic triggering system, so reached the purpose that simply and effectively reduces the clock jitter measure error.
Obviously, those skilled in the art should be understood that, above-mentioned each module of the present invention or each step can realize with the general calculation device, they can concentrate on the single calculation element, perhaps be distributed on the network that a plurality of calculation element forms, alternatively, they can be realized with the executable program code of calculation element, thereby, they can be stored in the storage device and carry out by calculation element, perhaps they are made into each integrated circuit modules respectively, perhaps a plurality of modules in them or step are made into the single integrated circuit module and realize.Like this, the present invention is not restricted to any specific hardware and software combination.
The above is the preferred embodiments of the present invention only, is not limited to the present invention, and for a person skilled in the art, the present invention can have various changes and variation.Within the spirit and principles in the present invention all, any modification of being done, be equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (5)
1. a clock shake measuring method is characterized in that, may further comprise the steps:
Clock to be measured is inserted oscillographic test channel with delay triggering function;
Measure because the measure error T0 that oscillographic triggering system causes, wherein, the triggering mode that oscillographic test channel is set is the triggering of clock to be measured edge, and it is half of clock amplitude to be measured that triggering level is made as; It is the infinite persistence mode that oscillographic display mode is set, and shows a plurality of clock waveforms on oscillographic display screen simultaneously; In the time interval between the left and the rightest point in edge of using horizon light mapping amount clock to be measured on the trigger position, be designated as T0;
It is delayed mode that oscillographic triggering mode is set, and according to the chattering frequency scope of wanting to measure, adjusts and to be worth T1 time of delay;
Finding and triggering clock edge CLK1 is the clock edge CLK2 of T1 at a distance of the time interval;
Measure the CLK2 time interval value T2 of edge between triggering level left and the rightest locational point;
Be provided with
As the clock jitter value.
2. clock shake measuring method according to claim 1 is characterized in that, is during clock to be measured edge triggers at the triggering mode that oscillographic test channel is set, and triggers according to concrete application choice rising edge or trailing edge.
3. clock shake measuring method according to claim 1, it is characterized in that, by show a plurality of clock waveforms simultaneously on oscillographic display screen, finding on the oscilloscope display screen and triggering clock edge CLK1 is the clock edge CLK2 of T1 at a distance of the time interval.
4. oscilloscope that is used to measure clock jitter, it has and postpones to trigger function, it is characterized in that, comprising:
Test channel is used to insert clock to be measured;
Adjusting module, being used to be provided with oscillographic triggering mode is delayed mode, according to the chattering frequency scope of wanting to measure, adjusts and to be worth T1 time of delay;
Measurement module, be used to measure the measure error T0 that causes owing to oscillographic triggering system, finding and triggering clock edge CLK1 is the clock edge CLK2 of T1 at a distance of the time interval, and the measurement CLK2 time interval value T2 of edge between triggering level left and the rightest locational point, wherein, described measurement module comprises: first is provided with the unit, and the triggering mode that is used to be provided with oscillographic test channel is that clock to be measured edge triggers, and it is half of clock amplitude to be measured that triggering level is made as; Second is provided with the unit, and being used to be provided with oscillographic display mode is the infinite persistence mode, shows a plurality of clock waveforms on oscillographic display screen simultaneously; Measuring unit is used for the time interval between the left and the rightest point in edge of using horizon light mapping amount clock to be measured on the trigger position, is designated as T0;
Module is set, is used for being provided with
As the clock jitter value.
5. oscilloscope according to claim 4 is characterized in that, described first the unit is set is during clock to be measured edge triggers at the triggering mode that oscillographic test channel is set, and triggers according to concrete application choice rising edge or trailing edge.
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| CN2008100027278A CN101232333B (en) | 2008-01-16 | 2008-01-16 | Clock shake measuring method and oscilloscope for measuring clock shake |
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| CN2008100027278A CN101232333B (en) | 2008-01-16 | 2008-01-16 | Clock shake measuring method and oscilloscope for measuring clock shake |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104535814A (en) * | 2014-12-19 | 2015-04-22 | 北京无线电计量测试研究所 | Device and method for correcting high-speed sampling oscilloscope trigger jitter |
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| CN101719765B (en) * | 2009-11-25 | 2012-01-25 | 中兴通讯股份有限公司 | Method and device for generating low-jitter clock |
| CN103713171B (en) * | 2012-10-08 | 2017-08-25 | 北京普源精电科技有限公司 | It is a kind of that there is the oscillograph for postponing Trigger Function |
| CN103048508B (en) * | 2012-12-06 | 2016-03-16 | 深圳市鼎阳科技有限公司 | Improve the method for digital oscilloscope activation levels precision, device and digital oscilloscope |
| CN103675383B (en) * | 2013-11-29 | 2016-04-13 | 上海华力微电子有限公司 | A kind of circuit measuring waveform |
| CN106452693B (en) * | 2016-08-26 | 2019-04-30 | 西安空间无线电技术研究所 | It is a kind of to be made an uproar the clock phase jitter measurement method of bottom energy spectrometer based on dual-frequency point |
| CN106680736A (en) * | 2017-02-28 | 2017-05-17 | 郑州云海信息技术有限公司 | System of automatically testing Jitter in switching mode power supply |
| CN111190089B (en) * | 2018-11-14 | 2022-01-11 | 长鑫存储技术有限公司 | Method and device for determining jitter time, storage medium and electronic equipment |
| CN110729988B (en) * | 2019-09-25 | 2021-08-31 | 中山大学 | Circuit, output device, detection system and method for outputting clock jitter signal |
| CN113064535B (en) * | 2021-04-26 | 2022-09-13 | 北京世冠金洋科技发展有限公司 | Vernier display method and device for two-dimensional chart, electronic equipment and storage medium |
| CN114726437B (en) * | 2022-06-08 | 2022-10-14 | 电子科技大学 | Digital optical transmitter edge jitter detector |
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| CN104535814B (en) * | 2014-12-19 | 2017-12-26 | 北京无线电计量测试研究所 | A kind of device and method for being used to correct the triggering shake of high-speed sampling oscillograph |
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| CN101232333A (en) | 2008-07-30 |
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