CN104535814A - Device and method for correcting high-speed sampling oscilloscope trigger jitter - Google Patents
Device and method for correcting high-speed sampling oscilloscope trigger jitter Download PDFInfo
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- CN104535814A CN104535814A CN201410805384.4A CN201410805384A CN104535814A CN 104535814 A CN104535814 A CN 104535814A CN 201410805384 A CN201410805384 A CN 201410805384A CN 104535814 A CN104535814 A CN 104535814A
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Abstract
The invention discloses a device and method for correcting high-speed sampling oscilloscope trigger jitter. The device comprises a signal source, a power divider, a 90-degree bridge and a data acquisition and processing unit. The signal source is used for generating first signals and second signals sharing the time base, and the first signals are output to the first input end of a sampling oscilloscope. The power divider is used for dividing the second signals from the signal source into reference signals and sampling oscilloscope trigger signals. The 90-degree bridge is used for dividing the reference signals from the power divider into two paths of orthogonal sine signals with the phase difference being 90 degrees, and the two paths of orthogonal sine signals are output to the second input end and the third input end of the sampling oscilloscope. The data acquisition and processing unit is used for calculating the trigger jitter value of the sampling oscilloscope based on the two paths of sine signals of the sampling oscilloscope and correcting the first signals through the calculated trigger jitter value. By means of the technical scheme, the trigger jitter of the sampling oscilloscope is corrected, and the accuracy of the measuring result of the sampling oscilloscope is improved.
Description
Technical field
The present invention relates to a kind of method for revising trigger jitter.More specifically, a kind of device and method for revising high-speed sampling oscillograph trigger jitter is related to.
Background technology
In the test of communication system, the bit error rate is an important indicator of measurement system quality.And the shake of signal is one of major reason causing error code, need to measure and analyze.High-speed sampling oscillograph is a kind of effective jitter measurement and analysis tool, is widely used in the test of data system.But in the test of some data systems with a large bandwidth and at a high rate, the shake that sampling oscilloscope self is introduced can cause larger impact to measurement result, causes measurement result can not reflect the actual index of system well.
Therefore, need to provide a kind of device and method for revising high-speed sampling oscillograph trigger jitter to improve the accuracy of signal jitter measurement, the trigger jitter of sampling oscilloscope is revised.
Summary of the invention
The object of the invention is to improve a kind of device and method for revising high-speed sampling oscillograph trigger jitter, solve current high-speed sampling oscillograph to when data system is tested with a large bandwidth and at a high rate, the shake self introduced can produce considerable influence to test result, makes test result have problem compared with big error.
For achieving the above object, the present invention adopts following technical proposals:
Revise a device for sampling oscilloscope trigger jitter, this device described comprises
Signal source, for generation of the first signal and the secondary signal of synchronic base, this first signal exports the first input end of sampling oscilloscope to;
Power splitter, for being divided into reference signal and sampling oscilloscope trigger pip by the secondary signal from signal source;
90 ° of electric bridges, for the reference signal from power splitter being divided into phase differential to be the two-way orthogonal sine signal of 90 °, and export second and the 3rd input end of sampling oscilloscope to respectively;
Data acquisition and processing unit, the two-way sinusoidal signal based on sampling oscilloscope calculates the trigger jitter value of described sampling oscilloscope, and revises described first signal with the trigger jitter value calculated.
Preferably, this device described comprises further
Bandpass filter, for carrying out filtering to the reference signal from shown power splitter, and by filtered Signal transmissions to 90 ° electric bridge.
Preferably, described in
Data acquisition and processing unit at least need the two-way sinusoidal signal gathering one-period in order to calculate the trigger jitter value of sampling oscilloscope in gatherer process.
Revise a method for sampling oscilloscope trigger jitter, described the method comprises
Measured signal is transferred to sampling oscilloscope first input end;
Another road signal with the synchronic base of measured signal is divided into reference signal and trigger pip;
Described reference signal be divided into phase differential to be the two-way orthogonal sine signal of 90 °, transfer to second and the 3rd input end of sampling oscilloscope respectively;
Sampling oscilloscope is sampled to described measured signal and described two-way orthogonal sine signal based on described trigger pip;
The trigger jitter value that data processing obtains described sampling oscilloscope is carried out to gathered two-way orthogonal sine signal;
Based on described trigger jitter value, gathered measured signal is revised.
Preferably, described reference signal is divided into phase differential to be the two-way orthogonal sine signal of 90 ° after signal filtering.
Preferably, described in
Sampling oscilloscope at least needs the two-way sinusoidal signal gathering one-period in sampling process.
Preferably, the trigger jitter value of described acquisition sampling oscilloscope comprises the steps:
By the two-way reference signal time shaft alignment collected, and draw as horizontal ordinate and ordinate using the range value of two-way reference signal respectively, obtain an ellipse;
Described trigger jitter value is obtained by elliptic transformation being become unit circle.
Preferably, the optimum solution drawn using quasi-Newton method through extreme value approximation computation is as described trigger jitter value.
The sampling oscilloscope that trigger jitter is corrected, this sampling oscilloscope comprises multiple input end, and this sampling oscilloscope described comprises further:
First input end, for receiving the first signal from signal source;
Second input end and the 3rd input end, be respectively used to receive the two-way orthogonal sine signal that the phase differential separated with the secondary signal of the synchronic base of the first signal is 90 °;
Data acquisition and processing module, two-way sinusoidal signal based on sampling oscilloscope calculates the trigger jitter value of described sampling oscilloscope, and with the trigger jitter value calculated, described first signal is revised, obtain the first signal of the trigger jitter value through revising described sampling oscilloscope.
Beneficial effect of the present invention is as follows:
Technical scheme advantage of the present invention is to carry out the oscillographic trigger jitter correction of high-speed sampling based on orthogonal signal, significantly improves the accuracy of high-speed sampling oscilloscope measurement result, improves the measurement level to data system with a large bandwidth and at a high rate.
Accompanying drawing explanation
Below in conjunction with accompanying drawing, the specific embodiment of the present invention is described in further detail.
Fig. 1 illustrates a kind of structural representation revising high-speed sampling oscillograph trigger jitter device in the embodiment of the present invention;
Fig. 2 illustrates a kind of process flow diagram revising high-speed sampling oscillograph trigger jitter method in the embodiment of the present invention;
Fig. 3 illustrates a kind of process flow diagram obtaining high-speed sampling oscillograph trigger jitter value in the embodiment of the present invention;
Fig. 4 illustrates a kind of schematic diagram obtaining high-speed sampling oscillograph trigger jitter value in the embodiment of the present invention.
Embodiment
In order to be illustrated more clearly in the present invention, below in conjunction with preferred embodiments and drawings, the present invention is described further.Parts similar in accompanying drawing represent with identical Reference numeral.It will be appreciated by those skilled in the art that specifically described content is illustrative and nonrestrictive, should not limit the scope of the invention with this below.
As shown in Figure 1, the invention discloses a kind of device for revising high-speed sampling oscillograph trigger jitter, this device comprises pattern generator 1, power splitter 2, bandpass filter 3,90 ° of electric bridges 4, sampling oscilloscope 5, computing machines 6.
Pattern generator 1 produces the two paths of signals with clear and definite phase relation, and by a circuit-switched data signal, is transferred to the passage one of positive sampling oscilloscope 5 to be repaired, as measured signal by measured signal output terminals A 1 through coaxial cable; Another road signal with the synchronic base of data-signal is transferred to power splitter 2 through coaxial cable, is divided into two paths of signals through power splitter 2.
The road signal separated through power splitter 2 transfers to bandpass filter 3 as with reference to signal by reference to signal output part A2,90 ° of electric bridges 4 are transferred to through coaxial cable after signal filtering, another road signal separated through power splitter 2 transfers to the trigger input of positive sampling oscilloscope 5 to be repaired through coaxial cable by trigger pip output terminals A 3 as the trigger pip of sampling oscilloscope, for sampling oscilloscope 5 provides trigger pip.
After 90 ° of electric bridge 4 signal transacting, export the orthogonal sine signal that two-way phase differential is 90 °, input to the passage three and passage four waiting to revise oscillograph 5 respectively through isometric coaxial cable.
Sampling oscilloscope 5, base during by regulating, data acquisition window at least needs the two-way orthogonal sinusoidal reference signal gathering one-period.
Computing machine 6, for controlling the beginning, end, data length collection etc. of the data acquisition of sampling oscilloscope 5, the test data of the passage one stored by GPIB or USB interface reading sampling oscilloscope, passage three, passage four, and through a series of coordinate transform and extreme value approximate procedure, obtain the trigger jitter best estimate of sampling oscilloscope 5, and revise according to the measured signal of best estimate to passage one of trigger jitter, obtain revised measured signal.
Because current conventional high bandwidth sampling oscilloscope 5 is all modular, each module comprises two passages, in order to ensure not introducing new error when collection signal, need the passage inputed to by two-way orthogonal sine signal in same module, as being input to passage three and passage four, and guarantee at least to hold one-period in the whole data acquisition window of sampling oscilloscope, can normally carry out with the data processing after making it.
Because the two-way reference signal of the passage three and passage four that input to sampling oscilloscope 5 is initially orthogonal, therefore, can think that the difference between signal waveform and the waveform of former input reference signal gathering acquisition in computing machine 6 is caused by the trigger jitter of sampling oscilloscope 5, the method obtaining the best estimate of the trigger jitter of sampling oscilloscope 5 is specific as follows:
(1), by after the passage three of sampling oscilloscope 5 and the data acquisition of passage four, two paths of signals time shaft is alignd, and draws as horizontal ordinate and ordinate using the range value of two paths of signals, by acquisition ellipse;
(2), by transformation of coordinates by oval translation, oval center is overlapped with true origin;
(3), around true origin by ELLIPTIC REVOLUTION θ angle, oval major and minor axis is overlapped respectively with the x-axis of coordinate system and y-axis;
(4), by changing oval parameter, ellipse is converted into unit circle;
(5), by unit circle in the other direction rotate θ angle, release time information.
Unit circle elliptic transformation is become namely to be the trigger jitter value obtaining sampling oscilloscope 5, this trigger jitter value utilizes the mathematical method of such as quasi-Newton method to approach etc. the optimum solution calculated through extreme value, and gained optimum solution is the best estimate of sampling oscilloscope 5 trigger jitter.Revise with the test data of the trigger jitter value calculated to sampling oscilloscope 5 passage one collected and show in computing machine 6.
As shown in Figure 2, the invention also discloses a kind of method for revising high-speed sampling oscillograph trigger jitter, the method specifically comprises:
S1, the circuit-switched data signal that produced by pattern generator 1, as measured signal, transfer to the passage one of positive sampling oscilloscope 5 to be repaired through coaxial cable by measured signal output terminals A 1;
S2, pattern generator 1 is produced transfer to power splitter 2 with another road signal of the synchronic base of data-signal through coaxial cable, produce two paths of signals through power splitter 2;
S3, the road signal separated by power splitter 2 are sent to bandpass filter 3 as with reference to signal by reference to signal output part A2; Another road signal, as trigger pip, is sent to the trigger input of sampling oscilloscope 5;
S4, bandpass filter 3 are by ° electric bridge of the Signal transmissions to 90 after signal filtering;
S5,90 ° of electric bridges 4 are divided into two-way phase differential to be after the orthogonal sine signal of 90 ° after orthogonal transformation, transfer to passage three and the passage four of sampling oscilloscope 5 respectively;
The time base of S6, adjustment sampling oscilloscope 5, makes the signal of passage three and passage four at least can show one-period respectively in the data acquisition window of sampling oscilloscope 5;
S7, computing machine 6 is used to control the beginning of the data acquisition of sampling oscilloscope 5, end, data length collection, the test data of the passage one stored by GPIB or USB interface reading sampling oscilloscope, passage three, passage four, and through a series of coordinate transform and extreme value approximate procedure, obtain the trigger jitter of sampling oscilloscope 5, and revise according to the measured signal of best estimate to passage one of trigger jitter, obtain revised measured signal.
As shown in Figure 3 and Figure 4, in step S7, the method obtaining the best estimate of sampling oscilloscope 5 trigger jitter comprises following sub-step:
S701, by after the passage three of sampling oscilloscope 5 and the data acquisition of passage four, two paths of signals time shaft is alignd, and to draw as horizontal ordinate and ordinate using the range value of two paths of signals, by acquisition ellipse;
S702, by transformation of coordinates by oval translation, oval center is overlapped with true origin;
S703, around true origin by ELLIPTIC REVOLUTION θ angle, oval major and minor axis is overlapped with the x-axis of coordinate system and y-axis respectively;
S704, by changing oval parameter, ellipse is converted into unit circle;
S705, unit circle is in the other direction rotated θ angle, release time information.
Unit circle elliptic transformation is become namely to be the trigger jitter value obtaining sampling oscilloscope 5, this trigger jitter value is the optimum solution utilizing the mathematical method of such as quasi-Newton method to draw through extreme value approximation computation, and gained optimum solution is the best estimate of sampling oscilloscope 5 trigger jitter.Revise with the test data of the trigger jitter value calculated to sampling oscilloscope 5 passage one collected and show in computing machine 6.
In sum, technical scheme of the present invention, based on generation and the process of orthogonal sinusoidal reference signal, can revise the oscillographic trigger jitter of high-speed sampling, make measurement result reflect actual index more truly, improve the measurement level of instrument and equipment and device.
Obviously; the above embodiment of the present invention is only for example of the present invention is clearly described; and be not the restriction to embodiments of the present invention; for those of ordinary skill in the field; can also make other changes in different forms on the basis of the above description; here cannot give exhaustive to all embodiments, every belong to technical scheme of the present invention the apparent change of extending out or variation be still in the row of protection scope of the present invention.
Claims (9)
1. revise a device for sampling oscilloscope trigger jitter, it is characterized in that, this device described comprises
Signal source, for generation of the first signal and the secondary signal of synchronic base, this first signal exports the first input end of sampling oscilloscope to;
Power splitter, for being divided into reference signal and sampling oscilloscope trigger pip by the secondary signal from signal source;
90 ° of electric bridges, for the reference signal from power splitter being divided into phase differential to be the two-way orthogonal sine signal of 90 °, and export second and the 3rd input end of sampling oscilloscope to respectively;
Data acquisition and processing unit, the two-way sinusoidal signal based on sampling oscilloscope calculates the trigger jitter value of described sampling oscilloscope, and revises described first signal with the trigger jitter value calculated.
2. the device of correction sampling oscilloscope trigger jitter according to claim 1, is characterized in that, this device described comprises further
Bandpass filter, for carrying out filtering to the reference signal from shown power splitter, and by filtered Signal transmissions to 90 ° electric bridge.
3. the device of correction sampling oscilloscope trigger jitter according to claim 1, is characterized in that, described in
Data acquisition and processing unit at least need the two-way sinusoidal signal gathering one-period in order to calculate the trigger jitter value of sampling oscilloscope in gatherer process.
4. revise a method for sampling oscilloscope trigger jitter, it is characterized in that, described the method comprises
Measured signal is transferred to sampling oscilloscope first input end;
Another road signal with the synchronic base of measured signal is divided into reference signal and trigger pip;
Described reference signal be divided into phase differential to be the two-way orthogonal sine signal of 90 °, transfer to second and the 3rd input end of sampling oscilloscope respectively;
Sampling oscilloscope is sampled to described measured signal and described two-way orthogonal sine signal based on described trigger pip;
The trigger jitter value that data processing obtains described sampling oscilloscope is carried out to gathered two-way orthogonal sine signal;
Based on described trigger jitter value, gathered measured signal is revised.
5. the method for correction sampling oscilloscope trigger jitter according to claim 4, is characterized in that, described reference signal is divided into phase differential to be the two-way orthogonal sine signal of 90 ° after signal filtering.
6. the method for correction sampling oscilloscope trigger jitter according to claim 4, is characterized in that, described in
Sampling oscilloscope at least needs the two-way sinusoidal signal gathering one-period in sampling process.
7. the method for correction sampling oscilloscope trigger jitter according to claim 4, is characterized in that, the trigger jitter value of described acquisition sampling oscilloscope comprises the steps:
By the two-way reference signal time shaft alignment collected, and draw as horizontal ordinate and ordinate using the range value of two-way reference signal respectively, obtain an ellipse;
Described trigger jitter value is obtained by elliptic transformation being become unit circle.
8. the method for correction sampling oscilloscope trigger jitter according to claim 7, is characterized in that, the optimum solution drawn through extreme value approximation computation using quasi-Newton method is as described trigger jitter value.
9. the sampling oscilloscope that is corrected of trigger jitter, this sampling oscilloscope comprises multiple input end, it is characterized in that, this sampling oscilloscope described comprises further:
First input end, for receiving the first signal from signal source;
Second input end and the 3rd input end, be respectively used to receive the two-way orthogonal sine signal that the phase differential separated with the secondary signal of the synchronic base of the first signal is 90 °;
Data acquisition and processing module, two-way sinusoidal signal based on sampling oscilloscope calculates the trigger jitter value of described sampling oscilloscope, and with the trigger jitter value calculated, described first signal is revised, obtain the first signal of the trigger jitter value through revising described sampling oscilloscope.
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105759197A (en) * | 2016-03-28 | 2016-07-13 | 工业和信息化部电子第五研究所 | System and method for acquiring DDS device single event effect abnormal waveforms |
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| CN106603166A (en) * | 2016-10-21 | 2017-04-26 | 北京无线电计量测试研究所 | Vector measurement device and method for wideband modulated signals |
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| CN110730055A (en) * | 2019-10-22 | 2020-01-24 | 上海创远仪器技术股份有限公司 | Method for realizing 5G signal emission modulation quality measurement based on signal analyzer |
| CN110730055B (en) * | 2019-10-22 | 2022-07-05 | 上海创远仪器技术股份有限公司 | Method for realizing 5G signal emission modulation quality measurement based on signal analyzer |
| CN113447873A (en) * | 2021-07-12 | 2021-09-28 | 北京无线电计量测试研究所 | Sampling oscilloscope complex frequency response calibration device and method |
| CN113447873B (en) * | 2021-07-12 | 2022-07-19 | 北京无线电计量测试研究所 | Sampling oscilloscope complex frequency response calibration device and method |
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