CN108510133A - A kind of electronic product reliability index appraisal procedure based on comprehensive accelerated factor - Google Patents

A kind of electronic product reliability index appraisal procedure based on comprehensive accelerated factor Download PDF

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CN108510133A
CN108510133A CN201710098246.0A CN201710098246A CN108510133A CN 108510133 A CN108510133 A CN 108510133A CN 201710098246 A CN201710098246 A CN 201710098246A CN 108510133 A CN108510133 A CN 108510133A
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邵家骏
邢晓艳
吴晓华
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Sunlight Tech Beijing
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Abstract

The invention discloses a kind of electronic product reliability index appraisal procedures based on comprehensive accelerated factor, it is characterised in that:The step of carrying out the assessment of electronic product reliability index is as follows:The chife failure models of concern are focused, multi-pronged trouble-shooting basic reason determines sensitive stress collection;Plan design is carried out, determines each key element of accelerated life test plan;Implement accelerated life test;It is for statistical analysis to the test data obtained;The continuous collection of client production life cycle management fault data, progressive alternate amendment and perfect comprehensive accelerated factor are carried out, it is made more to meet engineering reality.This method solves the problems such as electronic product accelerated stress is insensitive, accelerated stress is single, test efficiency is low, accelerated factor error is larger, the practical feasibility for fully considering cases of engineering, to better adapt to the reliability index evaluation problem of high reliability long life product.

Description

A kind of electronic product reliability index appraisal procedure based on comprehensive accelerated factor
Technical field
The present invention relates to reliability test technical fields, are related to a kind of electronic product reliability based on comprehensive accelerated factor Index evaluating method.
Background technology
With the fierceness further of market competition, in civilian household appliances field, high reliability long life product is more and more.Such as Fruit removes the reliability of assessment product, life characteristics using conventional reliability, life test method, generally requires consuming and is difficult to hold The time cost received, or even also have little time to finish experiment, which has just updated or has been eliminated because performance is backward. Obviously, so long test period, has not only missed the best opportunity of product reliability promotion, but also has severely impacted research and development Progress, be difficult to receive in practice in engineering.Therefore, reliability, service life etc. are carried out using the method for accelerated life test The assessment of index then just seems not only necessary but also important.
But what is be subjected in being actually used due to product is complicated and diversified combined stress, and the acceleration longevity carried out at present Life experiment is substantially by rule of thumb or trial-and-error method directly selects temperature, vibration or voltage etc. as single accelerated stress, deposits The problems such as accelerated stress is not necessarily most sensitive effective, test efficiency is low, calculated accelerated factor error is larger.Cause This, the present invention finds sensitive stress collection with a set of detailed thinking, determines most effective subjects and test sample amount, is based on Comprehensive accelerated factor applies comprehensive accelerated stress to product and carries out accelerated life test, to obtain every reliability and service life The method of feature.
Invention content
The purpose of the present invention is:It is proposed a kind of electronic product reliability index appraisal procedure based on comprehensive accelerated factor, The problems such as electronic product accelerated stress is insensitive, accelerated stress is single, test efficiency is low, accelerated factor error is larger is solved, The practical feasibility for fully considering cases of engineering, the reliability index to better adapt to high reliability long life product are commented Estimate problem.
In order to reach above-mentioned goal of the invention, the present invention is realized by following technical solution, proposes that one kind is based on The electronic product reliability index appraisal procedure of comprehensive accelerated factor, it is characterised in that:Electronic product reliability index is carried out to comment The step of estimating is as follows:
Step 1:The chife failure models of concern are focused, multi-pronged trouble-shooting basic reason determines sensitive stress Collection.
For specific electronic product, the chife failure models of concern are focused, carry out deep failure part FA analyses, failure Data statistic analysis designs the check of & techniques, FMEA analyses, FTA analyses, simulation analysis, multi-pronged to find all potential events Hinder basic reason, FMEA is used in combination to be iterated and screen, identify sensitive stress, exports sensitive stress collection.It is transferred to step 2.
Step 2:Plan design is carried out, determines each key element of accelerated life test plan, including accelerates to answer Power and load mode, accelerated stress level and number, acceleration model and accelerated factor, test period and test sample amount, failure Criterion, measurement parameter and test period illustrate as follows respectively.
A. accelerated stress and load mode are selected
It selects mainly to consider acceleration of the stress to failure mechanism when accelerated stress, it is desirable that accelerated stress will be convenient for experiment Control, and there are suitable acceleration models.For the sensitive stress collection of step 1 output, can be carried out with FSI technologies effectively Property verification, verified effective stress collection is as comprehensive accelerated stress.Failure excites and improves FSI (Failure Stimulation and Improvement) it is in Highly Accelerated Life Test HALT (Highly Accelerated Life Test) expand on the basis of technology and develop.Its guiding theory is:Stepping is used to increase the side of sensitive stress in the lab Product life cycels may occur formula, and nearly all failure derived from design and processes defect all ejects, and adopts Effective corrective measure is taken, extreme high reliability level is just had reached before so that product is delivered user, to both fully meet Customer demand, and research and development progress is shortened, and research and development of products cost is greatly lowered.
The load mode of accelerated stress by existing testing equipment, can also build experimental enviroment again as far as possible.It adopts Accelerated life test is carried out with the applying mode of constant stress.
B. accelerated stress level and number are determined
Accelerated stress number of levels is 1, only selects and accelerates to the maximum highest stress level of failure mechanism acceleration Life test.By Nelson volumes, highest stress level is higher, then product service life distribution p rank point in working stress level The standard deviation of digit estimated value is smaller, and therefore, the setting of highest stress level should become not causing product that failure mechanism occurs Under the premise of change, acquirement is as high as possible, to reach best acceleration effect, so as to shorten test period.According in step 2 a FSI is tested, and increases stress level stepwise, until breaking down, finds the working limit and the limit of rupture of product.Highest Stress level should take a safety coefficient as close possible to upper working limit, such as the above working limit 90% is used as highest Stress level.Limiting range of stress schematic diagram is shown in Fig. 2.
C. acceleration model and accelerated factor are determined
For Mechatronic Systems, accelerated with the stress other than temperature, service life and stress obey antipower law relationship, when failure Between computational methods the life model of broad sense can be used, i.e.,:
Related symbol is described as follows in formula:
Tf:Out-of-service time;
S:Stress except temperature;
Ea:Activation energy;
T:Temperature stress;
A:For constant;
m:For constant;
k:Boltzmann constant, 8.62*10-5eV/deg.
Then accelerated factor (AF) can be described as:
Related symbol is described as follows in formula:
AF:Accelerated factor;
Tf0:Out-of-service time under normal stress level;
Tf1:Out-of-service time under accelerated stress level;
S0:Normal stress is horizontal;
S1:Accelerated stress is horizontal;
T0:Normal temperature stress level;
T1:Accelerate temperature stress horizontal.
D. test period and test sample amount are determined
It can select complete machine or the critical component of machine life can be represented as test sample.
The determination of test period and test sample amount can carry out according to the methods below.
In practical engineering application, under accelerated stress level, unless sample fast failure, is otherwise tested in time h ' Truncation.In order to obtain Test Information as much as possible, truncated time h ' should be grown as far as possible;Simultaneously in order to which the reliability to product is done Further analysis, if not yet breaking down in truncated time h ', experiment can proceed with.
Under at least 90% confidence level, to assess the Bx service life, if test period is h ', test sample amount n is:
Related symbol is described as follows in formula:
n:Test sample number;
AF:Accelerated factor;
LB:Ensure cycle-index or time;
h′:Test period under accelerated stress level;
r:Fail number;
x:Targeted failure rate;
β:Form parameter.
E. product failure criterion is determined
Before carrying out accelerated life test, for the chife failure models paid close attention in step 1, the event of product is explicitly defined Hinder criterion.The fault time of product is determined with the criterion, is ready for the test data statistical analysis in later stage.
F. planning survey parameter and test period
When experiment other than conventional performance parameter needs to measure, every relevant parameter that can characterize product failure mechanism It should all measure.Using fixed time test, mutually once tested, the test record period (e.g., per 4h to 10h) at regular intervals Close mode carries out after being dredged before taking.
Step 3:According to the testing program designed by step 2, implement accelerated life test.Pay attention to carrying out during experiment The control of accelerated stress and the monitoring for testing key process parameters.The measurement parameter planned in step 2 e should have detailed examination Test data record.The off-test when meeting failure criterion or reaching predetermined deadline.
Step 4:The test data obtained to the accelerated life test that step 3 carries out is for statistical analysis.Accelerate the longevity The basic task for ordering test statistics analysis is exactly to estimate the service life distributed constant of product under normal operation.For highly reliable longevity Product is ordered, under the constraint of time cost and expense cost, engineering is generally difficult to obtain enough fault datas in practice, even It may be zero failure data, therefore want extrapolation by acceleration model regression analysis and obtain the service life under regular service conditions Feature is feared I guess infeasible.So the data translation method based on accelerated factor theory is applied here, by accelerated life test Statistical Analysis Problems evolve into the Lifetime Distribution Analysis problem of a routine, are as follows:
Step 4-1:It, will be under the test data conversion to normal stress level under accelerated stress level by accelerated factor. In this way equivalent to increase sample size.
Step 4-2:Assuming that life of product obeys certain type of distribution, and whether distributional assumption is investigated by assuming that examining Correctly.
Step 4-3:Lifetime data after the conversion obtained to step 4-1 carries out fitting of distribution, obtains estimation of distribution parameters. If the situation of zero failure, then the statistical analysis technique of failure-free data is used.To obtain under regular service conditions Various reliabilities and life characteristics parameter.
Step 4-4:For testing the process data of the product key characteristic parameter obtained in the process (that is, being advised in step 2 e The measurement parameter drawn), the incidence relation between life of product and key characteristic parameter can be further established, being more suitable for height can By the reliability assessment of Long Life Products.
Step 5:The continuous collection of client production life cycle management fault data is carried out, gradually correct and improves synthesis Accelerated factor makes it more meet engineering reality.
Since the statistical analysis carried out in step 4 is the data translation method based on accelerated factor theory, then being used Synthesis accelerated factor whether to meet engineering practical just most important.
Herein, obtain comprehensive accelerated factor using following two approach, be modified with it is perfect:
I. it is based on engineering experience formula, is obtained in the way of theory deduction;
II. accelerated life test data are based on, are obtained in the way of data analysis.
Accelerated factor in step 2 f is to be obtained using I kind approach.Parameter m therein generally takes empirical value 2, but certain specific product is then needed to be modified.
The amendment of comprehensive accelerated factor is carried out using Section II kind approach.Specific method is:It is recommended that being received with the form of triangle battle array Collect the fault data of client production, carry out distributional analysis, obtains various reliabilities and life parameter under normal stress level, Such as p divides position service life, MTBF, characteristics life η, is denoted as TNormally;The test data under step 3 accelerated stress level is carried out simultaneously Distributional analysis obtains various reliabilities and life parameter under accelerated stress level, as p divides position service life, MTBF, characteristics life η Deng being denoted as TAccelerate;So, TNormally/TAccelerateSynthesis accelerated factor under as two stress levels.I, II kind approach are obtained Comprehensive accelerated factor is compared, and can be corrected and be improved comprehensive accelerated factor, it is made more to meet engineering reality, so as to will It corrects the accelerated factor after improving to iterate in accelerated life test plan, is cured as the accelerated life test side of development phase Case, carries out the quantitative evaluation of different model and different batches of product reliability index, and is provided for the product decisions of development phase Foundation.
The advantage of the invention is that:
I. common in practice the present invention be directed to engineer application and intractable high reliability long life electronic product reliable Property index evaluation problem, it is proposed that a kind of reliability index appraisal procedure based on comprehensive accelerated factor, this method can both contract Short test period adapts to the requirement of research and development of products progress, and can be screened to the height of current production reliability level, has Conducive in the technology decision-making of product development stage progress science.
II. the present invention obtains the highest level of accelerated stress using FSI technologies, it is ensured that failure mechanism occurs in product Highest stress level is obtained under the premise of consistent, to reach best acceleration effect.
III. the present invention using product client data carry out the amendment of accelerated factor with it is perfect, it is ensured that it is real that it meets engineering Border has important practical engineering value.
IV. the present invention utilizes the data translation method based on accelerated factor theory, and accelerated life test statistical analysis is asked Topic evolves into the Lifetime Distribution Analysis problem of a routine, had not only reduced its complexity but also had met common zero failure situation in engineering Processing.
V. the process data for the product key characteristic parameter that the present invention obtains experiment in the process, can further establish production Incidence relation between product service life and key characteristic parameter is more suitable for the reliability assessment of high reliability long life product.
Description of the drawings
Fig. 1 is that the present invention is based on the flows of the electronic product reliability index appraisal procedure of comprehensive accelerated factor;
Fig. 2 is limiting range of stress schematic diagram of the present invention;
Certain electronic product service life fitting of distribution goodness schematic diagram of Fig. 3 present invention;
Fig. 4 certain electronic product service life of the present invention is distributed synoptic diagram.
Specific implementation mode
Below with reference to example is implemented, the present invention is further illustrated, which is used for illustrating and noting limit The present invention.
It is certain electronic product to implement exemplary object, needs to make batch production rank whether can be transferred in the development stage The decision of section, and needed according to the requirement of client to provide relevant reliability and index of aging.So, in conjunction with example is implemented, originally Invention implements as follows:
Step 1:The chife failure models of concern are focused, multi-pronged trouble-shooting basic reason determines sensitive stress Collection.
For certain electronic product, product research and development project teacher (including product design engineer and Industrial Design Engineer) with Reliability engineer sets up multi-disciplinary team, focuses two fault modes of concern:Pump housing abrasion, motor burning, pass through Deep failure part FA analyses, fault data statistical analysis, the check of design & techniques, FMEA analyses, FTA analyses, simulation analysis, It is multi-pronged to find all potential failure basic reasons, it is used in combination FMEA to be iterated and screen, identifies sensitive stress, carried Sensitive stress collection, including three kinds are exported after refining and summing up:Temperature, pressure ratio, rotating speed.It is transferred to step 2.
Step 2:Plan design is carried out, determines each key element of accelerated life test plan, including accelerates to answer Power and load mode, accelerated stress level and number, test period and test sample amount, failure criterion, measurement parameter and test Period, acceleration model and accelerated factor illustrate as follows respectively.
A. accelerated stress and load mode are selected
It selects mainly to consider acceleration of the stress to failure mechanism when accelerated stress, it is desirable that accelerated stress will be convenient for experiment Control, and there are suitable acceleration models.In conjunction with previous experiment experience, the implementation of the limitation and the experiment that consider test period Feasibility carries out validation verification for the sensitive stress collection temperature, pressure ratio, rotating speed of step 1 output using FSI technologies, Using three temperature, pressure ratio, rotating speed stress as a kind of compound sensitive stress, increase stepwise, it can be by the failure of concern The abrasion of the pattern pump housing, motor burning eject, therefore by (temperature, pressure ratio, rotating speed) as comprehensive accelerated stress.
The load mode of accelerated stress carries out the acceleration longevity by existing testing equipment, using the applying mode of constant stress Life experiment.
B. accelerated stress level and number are determined
Accelerated stress number of levels is 1, only selects and accelerates to the maximum highest stress level of failure mechanism acceleration Life test.By Nelson volumes, highest stress level is higher, then product service life distribution p rank point in working stress level The standard deviation of digit estimated value is smaller, and therefore, the setting of highest stress level should become not causing product that failure mechanism occurs Under the premise of change, acquirement is as high as possible, to reach best acceleration effect, so as to shorten test period.According in step 2 a FSI test, increase stress level stepwise, until break down until, find product working limit be (122,11,68) and The limit of rupture (130,15,70).Highest stress level should take a safety coefficient as close possible to upper working limit, such as with The 90% of upper working limit is used as highest stress level, therefore accelerated stress level is determined as (110,10,61).
C. acceleration model and accelerated factor are determined
For Mechatronic Systems, accelerated with the stress other than temperature, service life and stress obey antipower law relationship, when failure Between computational methods the life model of broad sense can be used, i.e.,:
Related symbol is described as follows in formula:
Tf:Out-of-service time;
S:Stress except temperature;
Ea:Activation energy;
T:Temperature stress;
A:For constant;
m:For constant;
k:Boltzmann constant, 8.62*10-5eV/deg.
Then accelerated factor (AF) can be described as:
Related symbol is described as follows in formula:
AF:Accelerated factor;
Tf0:Out-of-service time under normal stress level;
Tf1:Out-of-service time under accelerated stress level;
S0:Normal stress is horizontal;
S1:Accelerated stress is horizontal;
T0:Normal temperature stress level;
T1:Accelerate temperature stress horizontal.
For the electronic product, accelerated aging examination is carried out as comprehensive accelerated stress using temperature, pressure ratio, rotating speed It tests, in conjunction with (3) formula, then the synthesis accelerated factor of the electronic product is at this time:
Related symbol is described as follows in formula:
ΔP1:Pressure ratio under accelerated stress level;
ΔP0:Pressure ratio under normal stress level;
V1:Rotating speed under accelerated stress level;
V0:Rotating speed under normal stress level;
T1:Temperature under accelerated stress level;
T0:Temperature under normal stress level;
Ea:Activation energy generally takes 0.56eV;
a、b:For constant, empirical value generally takes 2;
k:Boltzmann constant, 8.62*10-5eV/deg.
Accelerated factor of the accelerated stress level compared to normal stress level can be calculated using formula (6).
It is needed to pay attention to when being used about formula (6):Have ignored the reciprocation between stress;Rule of thumb take activation energy For 0.56Ev;A, the value of two parameters of b is empirically worth, it is understood that there may be certain error needs to be modified.
Stress level is (80,3.5,50) if normal, then the theoretical value that can calculate accelerated factor AF is 51.4.
D. test period and test sample amount are determined
Complete machine or the critical component that machine life can be represented can be selected as test sample, the electromechanics is selected to produce herein Product complete machine is as test sample.
The determination of test period and test sample amount can carry out according to the methods below.
In practical engineering application, under accelerated stress level, unless sample fast failure, is otherwise tested in time h ' Truncation.In order to obtain Test Information as much as possible, truncated time h ' should be grown as far as possible;Simultaneously in order to which the reliability to product is done Further analysis, if not yet breaking down in truncated time h ', experiment can proceed with.In view of researching and developing the limitation of progress, Experiment truncated time is set to 900h.
Under at least 90% confidence level, to assess the Bx service life, if test period is h ', test sample amount n is:
Related symbol is described as follows in formula:
n:Test sample number;
AF:Accelerated factor;
LB:Ensure cycle-index or time;
h′:Test period under accelerated stress level;
r:Fail number;
x:Targeted failure rate;
β:Form parameter.
Then:Under at least 90% confidence level, whether it is 10000h for the assessment Bx service life, is if test period is h ' 900h, accelerated factor AF are 51.4, and failure number r is 0, and targeted failure rate x is 0.03, and form parameter β is 1, then test sample Amount is n >=14.
E. product failure criterion is determined
Before carrying out accelerated life test, for the chife failure models paid close attention in step 1, the event of product is explicitly defined Hinder criterion.The fault time of product is determined with the criterion, is ready for the test data statistical analysis in later stage.
It is as follows that the failure criterion of the electronic product can refer to technical standard order:A) performance of the electronic product is decrease beyond The 3% of former measured value;B) pump housing wear extent is more than 5 μm;C) motor has nigrescence phenomenon after not turning dissection.
During the test, when the above-mentioned three kinds of situations of test sample appearance a period of time, then it is determined as failure.
F. planning survey parameter and test period
When experiment other than conventional performance parameter needs to measure, every relevant parameter that can characterize product failure mechanism It should all measure.Record current value should also test and remember if failure part during the electronic product accelerated life test Record wear extent, scaling loss position etc..Using fixed time test, once tested per 4h.
Step 3:According to the testing program designed by step 2, implement accelerated life test.Pay attention to carrying out during experiment The control of accelerated stress and the monitoring for testing key process parameters.The measurement parameter planned in step 2 e should have detailed examination Test data record.The off-test when meeting failure criterion or reaching predetermined deadline.
Step 4:The test data obtained to the accelerated life test that step 3 carries out is for statistical analysis.Accelerate the longevity The basic task for ordering test statistics analysis is exactly to estimate the service life distributed constant of product under normal operation.For highly reliable longevity Product is ordered, under the constraint of time cost and expense cost, engineering is generally difficult to obtain enough fault datas in practice, even It may be zero failure data, therefore want extrapolation by acceleration model regression analysis and obtain the service life under regular service conditions Feature is feared I guess infeasible.So the data translation method based on accelerated factor theory is applied here, by accelerated life test Statistical Analysis Problems evolve into the Lifetime Distribution Analysis problem of a routine, are as follows:
Step 4-1:It, will be under the test data conversion to normal stress level under accelerated stress level by accelerated factor. In this way equivalent to increase sample size.
Step 4-2:Assuming that life of product obeys certain type of distribution, and whether distributional assumption is investigated by assuming that examining Correctly.The electronic product service life fitting of distribution goodness schematic diagram is shown in Fig. 3.
Step 4-3:Lifetime data after the conversion obtained to step 4-1 carries out fitting of distribution, obtains estimation of distribution parameters. Do not occur pump housing wear-out failure due to there is motor burning failure during experiment, so the service life of motor determines the machine The service life of electric product complete machine.Then for motor burning fault mode, the distributional analysis of fault data can be directly carried out;For It is then the situation of zero failure for pump housing wear-out failure pattern, motor burning failure can be done to suspension processing, using fault-free number According to statistical analysis technique Wei Baisifa, it is assumed that first failure occurs at once, and it is estimated value to take confidence lower limit, so assessment As a result too conservative.To which the various reliabilities and life characteristics parameter of the electronic product under regular service conditions can be obtained. Electronic product service life distribution synoptic diagram is shown in Fig. 4.
Step 4-4:For testing the process data of the product key characteristic parameter obtained in the process (that is, being advised in step 2 e The measurement parameter drawn), the incidence relation between life of product and key characteristic parameter can be further established, being more suitable for height can By the reliability assessment of Long Life Products.For the electronic product, the incidence relation y=f of life of product and electric current can be established (x)。
Step 5:The continuous collection of client production life cycle management fault data is carried out, gradually correct and improves synthesis Accelerated factor makes it more meet engineering reality.
Since the statistical analysis carried out in step 4 is the data translation method based on accelerated factor theory, then being used Synthesis accelerated factor whether to meet engineering practical just most important.
Herein, obtain comprehensive accelerated factor using following two approach, be modified with it is perfect:
III. it is based on engineering experience formula, is obtained in the way of theory deduction;
IV. accelerated life test data are based on, are obtained in the way of data analysis.
Accelerated factor in step 2 f is to be obtained using I kind approach.Parameter m therein generally takes empirical value 2, but certain specific product is then needed to be modified.
The amendment of comprehensive accelerated factor is carried out using Section II kind approach.Specific method is:It is recommended that being received with the form of triangle battle array Collect the fault data of client production, carry out distributional analysis, obtains various reliabilities and life parameter under normal stress level, Such as p divides position service life, MTBF, characteristics life η, is denoted as TNormally;The test data under step 3 accelerated stress level is carried out simultaneously Distributional analysis obtains various reliabilities and life parameter under accelerated stress level, as p divides position service life, MTBF, characteristics life η Deng being denoted as TAccelerate;So, TNormally/TAccelerateSynthesis accelerated factor under as two stress levels.I, II kind approach are obtained Comprehensive accelerated factor is compared, and is corrected and is improved comprehensive accelerated factor, so that it is more met engineering reality, at this time a=2.5, b= 1.3, accelerated factor AF=75.5, test sample amount are n >=10, are added so as to correct the accelerated factor after improving and iterate to In fast life test scheme, it is cured as the accelerated life test plan of development phase, it should be noted that it is still necessary to will be in engineering reality The multiple iteration verification of middle progress is trampled, carries out the quantitative evaluation of different model and different batches of product reliability index, and to grind The product decisions in hair stage provide foundation, this batch of product reliability and service life index of correlation are met the requirements, and it is raw can be transferred to batch The production stage.

Claims (4)

1. a kind of reliability index appraisal procedure based on comprehensive accelerated factor, which is characterized in that include the following steps:
Step 1:The product chife failure models for focusing concern carry out deep failure part FA analyses, fault data statistical Analysis, the check of design & techniques, FMEA analyses, FTA analyses, simulation analysis, it is multi-pronged to find potential failure basic reason, and It is iterated and is screened with FMEA, identify sensitive stress, export sensitive stress collection;
Step 2:Plan design is carried out, determines each key element of accelerated life test plan:Accelerated stress and load Mode, accelerated stress level and number, acceleration model and accelerated factor, test period and test sample amount, failure criterion, measurement Parameter and test period;
Step 3:Implement accelerated life test according to designed testing program, all can characterize is recorded during experiment and is closed Note the key characteristic parameter value of the failure mechanism of fault mode;
Step 4:Accelerated life test data statistic analysis is carried out, it will using the data translation method based on accelerated factor theory Under test data conversion to normal stress level under accelerated stress, to which the Statistical Analysis Problems of accelerated life test be converted For conventional distributional analysis problem, every reliability and life parameter index are obtained;
Step 5:The continuous collection of client production life cycle internal fault data, progressive alternate are corrected and improve comprehensive accelerate The factor makes it more meet engineering reality, so as to which the accelerated factor corrected after improving is iterated to accelerated life test plan In, it is cured as the accelerated life test plan of development phase, carries out the amount of different model and different batches of product reliability index Change assessment, and foundation is provided for the product decisions of development phase.
2. the reliability index appraisal procedure according to claim 1 based on comprehensive accelerated factor, it is characterized in that, step 2 When middle determining accelerated stress, it is failure excitation to need the validity of the sensitive stress collection of the output of verification step 1, used method With FSI (the Failure Stimulation and Improvement) technology of improvement, that is, increase sensitive stress stepwise, until Until failure, verify the stress whether sensitive stress, and find the working limit and the limit of rupture of product, highest stress water It is flat to take a safety coefficient as close possible to upper working limit, for example, the above working limit 90% as accelerated stress Highest stress level.
3. the reliability index appraisal procedure according to claim 1 based on comprehensive accelerated factor, it is characterized in that, step 5 It is middle using product client data carry out the amendment of comprehensive accelerated factor with it is perfect, it is ensured that it is practical that it meets engineering, that is, uses triangle The form of battle array collects the fault data of client production, carries out distributional analysis, obtains the various reliabilities under normal stress level And life parameter, such as p divides position service life, MTBF, characteristics life η, is denoted as TNormally;Simultaneously to the experiment number under accelerated stress level According to distributional analysis is carried out, the various reliabilities and life parameter under accelerated stress level are obtained, as p divides position service life, MTBF, feature Service life η etc., is denoted as TAccelerate;So, TNormally/TAccelerateSynthesis accelerated factor under as two stress levels, itself and theoretical calculation are obtained The synthesis accelerated factor obtained is compared, and can be corrected and be improved comprehensive accelerated factor, it is made more to meet engineering reality.
4. the reliability index appraisal procedure according to claim 1 based on comprehensive accelerated factor, it is characterized in that, step 4 What is utilized when middle progress accelerated life test data statistic analysis will be accelerated based on the data translation method of accelerated factor theory Test data under stress level is converted by comprehensive accelerated factor under normal stress level, to which accelerated life test be united Meter problem analysis evolves into the Lifetime Distribution Analysis problem of a routine, had not only reduced its complexity but also had met common zero mistake in engineering The processing for imitating situation, the specific steps are:
Step 4-1:By accelerated factor, the test data under accelerated stress level is converted under normal stress level, in this way Equivalent to increase sample size;
Step 4-2:Assuming that life of product obeys certain type of distribution, and whether just distributional assumption is investigated by assuming that examining Really;
Step 4-3:Lifetime data after the conversion obtained to step 4-1 carries out fitting of distribution, obtains estimation of distribution parameters, if The situation of zero failure then uses the statistical analysis technique of failure-free data, various under regular service conditions to obtain Reliability and life characteristics parameter;
Step 4-4:For the process data for the product key characteristic parameter that experiment obtains in the process, product can be further established Incidence relation between service life and key characteristic parameter is more suitable for the reliability assessment of high reliability long life product.
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