CN114357812A - Product reliability test method and device, computer equipment and storage medium - Google Patents
Product reliability test method and device, computer equipment and storage medium Download PDFInfo
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Abstract
The application relates to a method, a device, a computer device, a storage medium and a computer program product for testing product reliability, comprising: determining a product reliability acceleration factor according to a product failure mode, wherein the product failure mode is used for indicating possible faults of a product; determining the reliability test duration of the product according to the product reliability acceleration factor, the product test life value and the number of test products, wherein the product test life value is a life value which needs to be met by the product in an ideal state; determining the number of test faults according to the product reliability test duration, wherein the number of test faults is used for indicating the number of faults occurring in all test products in the product reliability test duration; and determining a product reliability test result according to the test fault number and the preset fault number. The method has the advantages that a reliability acceleration model is established by applying severe acceleration stress to the product, reliability acceleration factors are evaluated, a reliability rapid verification test is carried out, rapid verification of the product reliability is realized, the test efficiency is improved, and the cost is saved.
Description
Technical Field
The present application relates to the field of reliability testing technologies, and in particular, to a method and an apparatus for testing product reliability, a computer device, a storage medium, and a computer program product.
Background
And the reliability test refers to the test measurement and verification of the reliability of the product. The research finds out weak links of products under the conditions of limited samples, time and use cost. The reliability test is a general term for various tests performed to understand, evaluate, analyze, and improve the reliability of products. With the rapid development of scientific technology and process level, the quality and reliability level of products are higher and higher, and a reliability verification test method based on conventional stress is generally adopted in the prior art, however, the test method simulates the actual operation condition of the products by applying the conventional stress to the products, so that the test time and the cost of the products with high reliability and long service life are very long. The traditional reliability test method is far from meeting the reliability verification requirement of a high-reliability long-service-life product.
Disclosure of Invention
In view of the above, it is necessary to provide a method, an apparatus, a computer device, a computer readable storage medium, and a computer program product for testing product reliability with high efficiency.
In a first aspect, the present application provides a method for testing product reliability. The method comprises the following steps:
determining a product reliability acceleration factor according to a product failure mode, wherein the product failure mode is used for indicating possible faults of a product;
determining the reliability test duration of the product according to the product reliability acceleration factor, the product test life value and the number of test products, wherein the product test life value is a life value which needs to be met by the product in an ideal state;
determining the number of test faults according to the product reliability test duration, wherein the number of test faults is used for indicating the number of faults occurring in all test products in the product reliability test duration;
and determining a product reliability test result according to the test fault number and the preset fault number.
In one embodiment, determining a product reliability acceleration factor based on a product failure mode comprises:
determining a reliability test stress type and a test stress value corresponding to a product failure mode, wherein the test stress value is the limit stress which can be borne by a product in work;
determining a reliability acceleration model corresponding to the product according to the reliability test stress type corresponding to the product failure mode;
and determining a product reliability acceleration factor according to the reliability acceleration model and the test stress value corresponding to the product.
In one embodiment, the reliability test stress type corresponding to the product failure mode comprises temperature and humidity comprehensive stress; correspondingly, determining a product reliability acceleration factor according to a reliability acceleration model and a test stress value corresponding to the product, wherein the method comprises the following steps:
wherein the content of the first and second substances,
an acceleration model of high temperature stress; g is the activation energy of the product, p is the Boltzmann constant,
the temperature test stress value under the accelerated stress is obtained;
is the temperature under normal stress;
the humidity test stress value under the accelerated stress is obtained;
is the humidity value under normal stress; b is a constant related to the product characteristics.
In one embodiment, determining the product reliability test duration according to the product reliability acceleration factor, the product test life value and the test product quantity includes:
acquiring test parameters corresponding to the product, wherein the test parameters comprise a test risk value, a preset fault number, a product test life value and a test product number;
determining the conventional test duration of the product according to the test life value of the product, the number of the test products and the time length coefficient, wherein the time length coefficient is determined according to the test risk value and the preset fault number;
and determining the product reliability test duration according to the product conventional test duration and the product reliability acceleration factor.
In one embodiment, determining the product reliability test duration according to the product routine test duration and the product reliability acceleration factor comprises:
wherein the content of the first and second substances,
representing the test duration of the product reliability;
representing a time length coefficient; t represents a productA test life value;
representing a product reliability acceleration factor; n represents the number of products tested.
In one embodiment, the method further comprises:
if the number of the test faults is smaller than the preset number of the faults, the service life value of the product is not smaller than the test service life value of the product, the reliability of the product meets the preset requirement, and the test service life value of the product is used as the actual service life value of the product;
and determining the reliability index of the product according to the service life of the product and the actual life value of the product, and verifying the actual life value of the product according to the reliability index.
In a second aspect, the application further provides a product reliability testing device. The device comprises:
the system comprises a first determining module, a second determining module and a control module, wherein the first determining module is used for determining a product reliability acceleration factor according to a product failure mode, and the product failure mode is used for indicating possible faults of a product;
the second determining module is used for determining the reliability test duration of the product according to the product reliability acceleration factor, the product test life value and the number of the test products, wherein the product test life value is a life value which needs to be met by the product in an ideal state;
the third determining module is used for determining the number of test faults according to the product reliability test duration, and the number of test faults is used for indicating the number of faults occurring in all test products in the product reliability test duration;
and the fourth determining module is used for determining a product reliability test result according to the test fault number and the preset fault number.
In a third aspect, the present application also provides a computer device. The computer device comprises a memory storing a computer program and a processor implementing the following steps when executing the computer program:
determining a product reliability acceleration factor according to a product failure mode, wherein the product failure mode is used for indicating possible faults of a product;
determining the reliability test duration of the product according to the product reliability acceleration factor, the product test life value and the number of test products, wherein the product test life value is a life value which needs to be met by the product in an ideal state;
determining the number of test faults according to the product reliability test duration, wherein the number of test faults is used for indicating the number of faults occurring in all test products in the product reliability test duration;
and determining a product reliability test result according to the test fault number and the preset fault number.
In a fourth aspect, the present application further provides a computer-readable storage medium. The computer-readable storage medium having stored thereon a computer program which, when executed by a processor, performs the steps of:
determining a product reliability acceleration factor according to a product failure mode, wherein the product failure mode is used for indicating possible faults of a product;
determining the reliability test duration of the product according to the product reliability acceleration factor, the product test life value and the number of test products, wherein the product test life value is a life value which needs to be met by the product in an ideal state;
determining the number of test faults according to the product reliability test duration, wherein the number of test faults is used for indicating the number of faults occurring in all test products in the product reliability test duration;
and determining a product reliability test result according to the test fault number and the preset fault number.
In a fifth aspect, the present application further provides a computer program product. Computer program product comprising a computer program which, when executed by a processor, performs the steps of:
determining a product reliability acceleration factor according to a product failure mode, wherein the product failure mode is used for indicating possible faults of a product;
determining the reliability test duration of the product according to the product reliability acceleration factor, the product test life value and the number of test products, wherein the product test life value is a life value which needs to be met by the product in an ideal state;
determining the number of test faults according to the product reliability test duration, wherein the number of test faults is used for indicating the number of faults occurring in all test products in the product reliability test duration;
and determining a product reliability test result according to the test fault number and the preset fault number.
According to the product reliability test method, the device, the computer equipment, the storage medium and the computer program product, the product reliability acceleration factor is determined according to the product failure mode, and the product failure mode is used for indicating the possible faults of the product; determining the reliability test duration of the product according to the product reliability acceleration factor, the product test life value and the number of test products, wherein the product test life value is a life value which needs to be met by the product in an ideal state; determining the number of test faults according to the product reliability test duration, wherein the number of test faults is used for indicating the number of faults occurring in all test products in the product reliability test duration; and determining a product reliability test result according to the test fault number and the preset fault number. The method has the advantages that a reliability acceleration model is established by applying severe acceleration stress to the product, reliability acceleration factors are evaluated, a reliability rapid verification test is carried out, rapid verification of the product reliability is realized, the test efficiency is improved, and the cost is saved.
Drawings
FIG. 1 is a diagram of an exemplary application environment for a method for testing product reliability;
FIG. 2 is a schematic flow chart of a method for testing product reliability in one embodiment;
FIG. 3 is a schematic flow chart of a product reliability test method in another embodiment;
FIG. 4 is a schematic flow chart of a product reliability test method in yet another embodiment;
FIG. 5 is a block diagram showing the structure of a product reliability testing apparatus according to an embodiment;
FIG. 6 is a diagram illustrating an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
First, the product mentioned in this application refers to a mechanical product with a physical body, which may be a component, such as a screw, or a capacitor resistor, a system, or a physical device, and is not limited in detail herein. The reliability of a product, also called environmental reliability, refers to the ability or possibility to perform a specified function within a certain time and under certain conditions without failure. The reliability of the product can be evaluated by reliability, failure rate, mean time between failures, etc. The product is constantly subjected to the influence of self, external climatic environment and mechanical environment in the design and application processes, and still needs to work normally, so that the product needs to be verified by using test equipment, and the verification is basically divided into three parts of research and development test, trial production test and mass production random inspection. The higher the reliability, the better for the product. The product with high reliability can work normally for a long time; in terms of technical terminology, it is the higher the reliability of a product, the longer the product can operate without failure.
The product reliability test method provided by the embodiment of the application can be applied to product research and development tests, can also be applied to trial production tests, can perform reliability tests on used products in real time, and can also perform reliability tests on produced products before the products are used. In order to facilitate understanding, the embodiments of the present application take application to a trial production test as an example, and the method provided by the embodiments of the present application is used to perform a reliability test on a trial production product. The embodiment of the application can be applied to the application environment shown in fig. 1. Wherein the terminal 102 communicates with the server 104 via a network. The data storage system may store data that the server 104 needs to process. The data storage system may be integrated on the server 104, or may be located on the cloud or other network server. The server 104 may be implemented as a stand-alone server or a server cluster composed of a plurality of servers. The terminal 102 may be, but is not limited to, various personal computers, notebook computers, smart phones, tablet computers, and internet of things devices, and the internet of things devices may be smart speakers, smart televisions, smart air conditioners, smart car-mounted devices, and the like.
In one embodiment, as shown in fig. 2, a method for testing product reliability is provided, which is described by taking the application of this embodiment to the server in fig. 1 as an example, and includes the following steps:
the product failure mode refers to that in a product design stage and a process design stage, all procedures of a forming process of subsystems and parts forming a product are analyzed one by one to find out all potential failure modes, and necessary measures can be taken in advance to improve the quality and the reliability of the product by analyzing the possible consequences caused by the product failure mode. In short, the product failure mode also affects the product to malfunction, which results in the product not working properly, such as high temperature, humidity, vibration, etc.
The product reliability acceleration factor is the ratio of the lifetime of the product under normal stress to the lifetime under accelerated stress. The stress refers to an internal force per unit area, which is an internal force generated by interaction between parts in an object when the object is deformed by external factors (stress, humidity, temperature field change, and the like). In a product reliability test, a product reliability model is established by applying a stress type corresponding to a product failure mode to a product, so that a test life value of the product is determined. In this embodiment, an acceleration stress is used for the applied stress, and the acceleration stress refers to a stress applied by accelerating the product failure in the test without changing the product failure mechanism.
Specifically, the stress types of the reliability quick verification test comprise high-temperature stress, vibration stress, temperature cycle stress, temperature and humidity comprehensive stress and the like. And determining the test stress type according to the stress type corresponding to the main failure mode of the product. And determining a reliability acceleration factor by establishing a product reliability model.
the product test life value refers to a life value that a product needs to meet in an ideal state, that is, a state in which a product is expected to be normally used after all possible influences are considered at the beginning of product design, for example, a component is produced, and the component is expected to be used for 10 years, so that the product test life value of the component is 10 years when a product reliability test is performed. It is understood that in practical operation, the test life value of the product in the above example may be more than 10 years, and the specific value may be adjusted according to the requirements of the product.
The number of the tested products refers to the number of the products participating in the verification test in the product reliability verification test, a certain number of the products are selected as samples, and the reliability test is performed on the samples, so that the reliability result of the products is determined. The product reliability test duration refers to the length of time that an accelerated stress condition is applied to the product in the test.
and 208, determining a product reliability test result according to the test fault number and the preset fault number.
And selecting a proper reliability quick verification test scheme according to the risk value acceptable by the test, the test duration and the test fault number condition. And (4) rapidly verifying the test scheme according to the selected reliability, carrying out the test, and counting the number of faults in the test process. If the number of the test faults is larger than or equal to the specified number in the scheme, the service life of the product is shorter, and the reliability of the product cannot meet the specified requirement. If the number of the test faults is less than the specified number in the scheme, the service life of the product is more than or equal to the specified number, and the reliability of the product meets the specified requirement.
In the method provided by the above embodiment, the product reliability acceleration factor is determined according to a product failure mode, where the product failure mode is used to indicate a possible failure of a product; determining the reliability test duration of the product according to the product reliability acceleration factor, the product test life value and the number of test products, wherein the product test life value is a life value which needs to be met by the product in an ideal state; determining the number of test faults according to the product reliability test duration, wherein the number of test faults is used for indicating the number of faults occurring in all test products in the product reliability test duration; and determining a product reliability test result according to the test fault number and the preset fault number. The method has the advantages that a reliability acceleration model is established by applying severe acceleration stress to the product, reliability acceleration factors are evaluated, a reliability rapid verification test is carried out, rapid verification of the product reliability is realized, the test efficiency is improved, and the cost is saved.
In one embodiment, referring to FIG. 3, determining a product reliability acceleration factor based on a product failure mode includes:
and step 306, determining a product reliability acceleration factor according to the reliability acceleration model and the test stress value corresponding to the product.
The stress types of the reliability quick verification test comprise high-temperature stress, vibration stress, temperature cycle stress, temperature and humidity comprehensive stress and the like. And determining the test stress type according to the stress type corresponding to the main failure mode of the product.
And determining a test stress magnitude value by adopting a stepping stress test method, namely gradually increasing the severity of the stress until the product fails to obtain the working limit stress of the product, and taking the working limit stress as the reliability rapid verification test stress magnitude value. Such as: and for high-temperature stress, gradually applying stress of 30 ℃, 35 ℃, 40 ℃, 45 ℃, 50 ℃, 55 ℃, 60 ℃ and the like to the product until the product fails, and taking the test stress value before the failure as the working limit stress and simultaneously as the test stress value for rapidly verifying the reliability.
Establishing a product reliability acceleration model, wherein the acceleration model of high-temperature stress is as follows:
in the formula: t is the life of the product under accelerated stress; c is a constant related to product characteristics; g is the activation energy of the product; p is Boltzmann constant; s is temperature stress.
The acceleration model of the vibrational stress is as follows:
in the formula: h is a vibration stress magnitude; q and n are constants related to the product characteristics.
The acceleration model of the temperature cycling stress is as follows:
in the formula:
the life of the product under normal stress;
the temperature cycling temperature variation range under the accelerated stress;
the temperature cycling temperature variation range under the conventional stress is adopted; and m is a constant related to the product characteristics.
The acceleration model of the temperature and humidity integrated stress is as follows:
in the formula: r is a humidity value; b is a constant related to the product characteristics.
And determining a reliability acceleration factor according to the product reliability acceleration model. The product reliability acceleration factor is the ratio of the lifetime of the product under normal stress to the lifetime under accelerated stress.
The acceleration factor of the high temperature stress is as follows:
in the formula:
is the temperature under accelerated stress;
is the temperature under normal stress.
The acceleration factor of the vibratory stress is as follows:
in the formula:
is the magnitude of the vibratory stress under the acceleration stress;
is the magnitude of the vibrational stress under normal stress.
The acceleration factor of the temperature cycling stress is as follows:
in the method provided by the embodiment, the reliability test stress type and the test stress value corresponding to the product failure mode are determined, and the test stress value is the limit stress which can be borne by the product in work; determining a reliability acceleration model corresponding to the product according to the reliability test stress type corresponding to the product failure mode; and determining a product reliability acceleration factor according to the reliability acceleration model and the test stress value corresponding to the product. The method has the advantages that a reliability acceleration model is established by applying severe acceleration stress to the product, reliability acceleration factors are evaluated, a reliability rapid verification test is carried out, rapid verification of the product reliability is realized, the test efficiency is improved, and the cost is saved.
In one embodiment, the reliability test stress type corresponding to the product failure mode comprises temperature and humidity comprehensive stress; correspondingly, determining a product reliability acceleration factor according to a reliability acceleration model and a test stress value corresponding to the product, wherein the method comprises the following steps:
wherein the content of the first and second substances,
an acceleration model of high temperature stress; g is the activation energy of the product, p is the Boltzmann constant,
the temperature test stress value under the accelerated stress is obtained;
is the temperature under normal stress;
the humidity test stress value under the accelerated stress is obtained;
is the humidity value under normal stress; b is a constant related to the product characteristics.
In one embodiment, referring to fig. 4, determining the product reliability test duration according to the product reliability acceleration factor, the product test life value and the number of test products includes:
and 406, determining the product reliability test time according to the conventional test time of the product and the product reliability acceleration factor.
Wherein, the test risk value refers to the acceptable risk probability when the product is used, for example, the test risk value is 20%, 30% and the like; the preset failure number refers to the upper limit of the number of products with failures acceptable in the test process; according to a large amount of test data, the test risk value and the preset fault number can affect the size of the conventional coefficient, namely, after the user determines the test risk value and the preset fault number, the time length coefficient can be determined, and further the product reliability test time length can be determined. For example, when the product test life value is T and the number of test products is N:
if the test risk value is 10% and the preset fault number is 6, the time length coefficient is 9.3;
if the test risk value is 20% and the preset fault number is 3, the time length coefficient is 4.3;
if the test risk value is 30% and the preset fault number is 7, the time length coefficient is 8.1;
if the test risk value is 30% and the preset fault number is 3, the time length coefficient is 3.7;
if the test risk value is 30% and the preset fault number is 1, the time length coefficient is 1.2;
and determining a time length coefficient according to the risk value acceptable by the test and the preset fault number, and selecting a proper reliability test scheme.
In the method provided by the embodiment, test parameters corresponding to the product are obtained, wherein the test parameters comprise a test risk value, a preset fault number, a product test life value and a test product number; determining the conventional test duration of the product according to the test life value of the product, the number of the test products and the time length coefficient, wherein the time length coefficient is determined according to the test risk value and the preset fault number; and determining the product reliability test duration according to the product conventional test duration and the product reliability acceleration factor. The method has the advantages that a reliability acceleration model is established by applying severe acceleration stress to the product, reliability acceleration factors are evaluated, a reliability rapid verification test is carried out, rapid verification of the product reliability is realized, the test efficiency is improved, and the cost is saved.
In one embodiment, determining the product reliability test duration according to the product routine test duration and the product reliability acceleration factor comprises:
wherein the content of the first and second substances,
representing the test duration of the product reliability;
representing a time length coefficient; t represents a product test life value;
representing a product reliability acceleration factor; n represents the number of products tested.
In one embodiment, the method further comprises:
if the number of the test faults is smaller than the preset number of the faults, the service life value of the product is not smaller than the test service life value of the product, the reliability of the product meets the preset requirement, and the test service life value of the product is used as the actual service life value of the product;
and determining the reliability index of the product according to the service life of the product and the actual life value of the product, and verifying the actual life value of the product according to the reliability index.
For products with the service life subject to index distribution, whether other reliability indexes meet the specified requirements can be verified.
Index of failure rate
Verification of (2):
in the formula, T represents an actual life value of the product determined by the product reliability verification.
Reliability index
Verification of (2):
in the formula: x is the working time of the product.
Index of unreliability
Verification of (2):
in the method provided by the above embodiment, if the number of the test failures is less than the preset number of the failures, the life value of the product is not less than the test life value of the product, the reliability of the product meets the preset requirement, and the test life value of the product is taken as the actual life value of the product; and determining the reliability index of the product according to the service life of the product and the actual life value of the product, and verifying the actual life value of the product according to the reliability index. When the life index is not needed, the method provided by the embodiment can be used for conversion to determine other indexes in the product reliability.
It should be understood that, although the steps in the flowcharts related to the embodiments are shown in sequence as indicated by the arrows, the steps are not necessarily executed in sequence as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least a part of the steps in the flowcharts related to the above embodiments may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, and the order of performing the steps or stages is not necessarily sequential, but may be performed alternately or alternately with other steps or at least a part of the steps or stages in other steps.
For ease of understanding, the following examples are given:
and carrying out a reliability verification test on a certain type of product to verify whether the service life of the product can meet the requirement of 10 years.
First, a product reliability test stress type is determined. The stress type corresponding to the main failure mode of the product is high temperature, and the high temperature stress is selected as the stress type of the reliability test. And carrying out a high-temperature stepping stress test on the product to obtain the product with the working limit stress of 85 ℃, so that the test stress value of the product is 85 ℃.
Then, a product reliability acceleration model is established. The reliability acceleration model of the product is as follows:
and determining a product reliability acceleration factor according to the reliability acceleration model of the product. The activation energy of the product is
At a temperature under accelerated stress of
The temperature under normal stress is
。
Secondly, a reliability quick verification test scheme is determined. The test risk value is 30%, the preset number of faults is 1, the number of test products is 10, and the product reliability test duration is 785 hours. If the number of the test faults is more than or equal to 1, the service life of the product is less than 10 years; if the number of the test faults is 0, the service life of the product is more than or equal to 10 years.
And finally, carrying out a reliability rapid verification test on the product, wherein the reliability test duration is 785 hours, and the test fault number is 0. Therefore, the service life of the product meets the requirement of 10 years.
If the traditional reliability verification test is adopted, the test time is 10512 hours. Therefore, the scheme can quickly verify the reliability of the product, the test efficiency is higher, and the test cost is lower.
Based on the same inventive concept, the embodiment of the application also provides a product reliability testing device for realizing the product reliability testing method. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the method, so that specific limitations in one or more embodiments of the product reliability testing device provided below can be referred to the limitations of the product reliability testing method in the above, and details are not repeated herein.
In one embodiment, as shown in fig. 5, there is provided a product reliability testing apparatus including: a first determination module 501, a second determination module 502, a third determination module 503, and a fourth determination module 504, wherein:
a first determining module 501, configured to determine a product reliability acceleration factor according to a product failure mode, where the product failure mode is used to indicate a possible fault of a product;
a second determining module 502, configured to determine a product reliability test duration according to the product reliability acceleration factor, the product test life value, and the number of test products, where the product test life value is a life value that needs to be met by a product in an ideal state;
a third determining module 503, configured to determine a test failure number according to the product reliability test duration, where the test failure number is used to indicate the number of failures occurring in all test products within the product reliability test duration;
and a fourth determining module 504, configured to determine a product reliability test result according to the test fault number and the preset fault number.
In one embodiment, the first determining module 501 is further configured to:
determining a reliability test stress type and a test stress value corresponding to a product failure mode, wherein the test stress value is the limit stress which can be borne by a product in work;
determining a reliability acceleration model corresponding to the product according to the reliability test stress type corresponding to the product failure mode;
and determining a product reliability acceleration factor according to the reliability acceleration model and the test stress value corresponding to the product.
In one embodiment, the reliability test stress type corresponding to the product failure mode comprises temperature and humidity comprehensive stress; accordingly, the first determining module 501 is further configured to:
wherein the content of the first and second substances,
an acceleration model of high temperature stress; g is the activation energy of the product, p is the Boltzmann constant,
the temperature test stress value under the accelerated stress is obtained;
is the temperature under normal stress;
the humidity test stress value under the accelerated stress is obtained;
is the humidity value under normal stress; b is a constant related to the product characteristics.
In one embodiment, the second determining module 502 is further configured to:
acquiring test parameters corresponding to the product, wherein the test parameters comprise a test risk value, a preset fault number, a product test life value and a test product number;
determining the conventional test duration of the product according to the test life value of the product, the number of the test products and the time length coefficient, wherein the time length coefficient is determined according to the test risk value and the preset fault number;
and determining the product reliability test duration according to the product conventional test duration and the product reliability acceleration factor.
In one embodiment, the second determining module 502 is further configured to:
wherein the content of the first and second substances,
representing the test duration of the product reliability;
representing a time length coefficient; t represents a product test life value;
representing a product reliability acceleration factor; n represents the number of products tested.
In one embodiment, the product reliability testing apparatus further includes a verification module configured to:
if the number of the test faults is smaller than the preset number of the faults, the service life value of the product is not smaller than the test service life value of the product, the reliability of the product meets the preset requirement, and the test service life value of the product is used as the actual service life value of the product;
and determining the reliability index of the product according to the service life of the product and the actual life value of the product, and verifying the actual life value of the product according to the reliability index.
The modules in the product reliability testing device can be wholly or partially realized by software, hardware and a combination thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
In one embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be as shown in fig. 6. The computer device includes a processor, a memory, and a network interface connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The database of the computer device is used for storing product reliability test process data. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to implement a product reliability testing method.
Those skilled in the art will appreciate that the architecture shown in fig. 6 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is provided, comprising a memory and a processor, the memory having a computer program stored therein, the processor implementing the following steps when executing the computer program:
determining a product reliability acceleration factor according to a product failure mode, wherein the product failure mode is used for indicating possible faults of a product;
determining the reliability test duration of the product according to the product reliability acceleration factor, the product test life value and the number of test products, wherein the product test life value is a life value which needs to be met by the product in an ideal state;
determining the number of test faults according to the product reliability test duration, wherein the number of test faults is used for indicating the number of faults occurring in all test products in the product reliability test duration;
and determining a product reliability test result according to the test fault number and the preset fault number.
In one embodiment, the processor, when executing the computer program, further performs the steps of:
determining a reliability test stress type and a test stress value corresponding to a product failure mode, wherein the test stress value is the limit stress which can be borne by a product in work;
determining a reliability acceleration model corresponding to the product according to the reliability test stress type corresponding to the product failure mode;
and determining a product reliability acceleration factor according to the reliability acceleration model and the test stress value corresponding to the product.
In one embodiment, the reliability test stress type corresponding to the product failure mode comprises temperature and humidity combined stress; accordingly, the processor, when executing the computer program, further performs the steps of:
wherein the content of the first and second substances,
an acceleration model of high temperature stress; g is the activation energy of the product, p is the Boltzmann constant,
the temperature test stress value under the accelerated stress is obtained;
is the temperature under normal stress;
for acceleration under stressHumidity test stress value;
is the humidity value under normal stress; b is a constant related to the product characteristics.
In one embodiment, the processor, when executing the computer program, further performs the steps of:
acquiring test parameters corresponding to the product, wherein the test parameters comprise a test risk value, a preset fault number, a product test life value and a test product number;
determining the conventional test duration of the product according to the test life value of the product, the number of the test products and the time length coefficient, wherein the time length coefficient is determined according to the test risk value and the preset fault number;
and determining the product reliability test duration according to the product conventional test duration and the product reliability acceleration factor.
In one embodiment, the processor, when executing the computer program, further performs the steps of:
wherein the content of the first and second substances,
representing the test duration of the product reliability;
representing a time length coefficient; t represents a product test life value;
representing a product reliability acceleration factor; n represents the number of products tested.
In one embodiment, the processor, when executing the computer program, further performs the steps of:
if the number of the test faults is smaller than the preset number of the faults, the service life value of the product is not smaller than the test service life value of the product, the reliability of the product meets the preset requirement, and the test service life value of the product is used as the actual service life value of the product;
and determining the reliability index of the product according to the service life of the product and the actual life value of the product, and verifying the actual life value of the product according to the reliability index.
In one embodiment, a computer-readable storage medium is provided, having a computer program stored thereon, which when executed by a processor, performs the steps of:
determining a product reliability acceleration factor according to a product failure mode, wherein the product failure mode is used for indicating possible faults of a product;
determining the reliability test duration of the product according to the product reliability acceleration factor, the product test life value and the number of test products, wherein the product test life value is a life value which needs to be met by the product in an ideal state;
determining the number of test faults according to the product reliability test duration, wherein the number of test faults is used for indicating the number of faults occurring in all test products in the product reliability test duration;
and determining a product reliability test result according to the test fault number and the preset fault number.
In one embodiment, the computer program when executed by the processor further performs the steps of:
determining a reliability test stress type and a test stress value corresponding to a product failure mode, wherein the test stress value is the limit stress which can be borne by a product in work;
determining a reliability acceleration model corresponding to the product according to the reliability test stress type corresponding to the product failure mode;
and determining a product reliability acceleration factor according to the reliability acceleration model and the test stress value corresponding to the product.
In one embodiment, the reliability test stress type corresponding to the product failure mode comprises temperature and humidity combined stress; accordingly, the computer program when executed by the processor further realizes the steps of:
wherein the content of the first and second substances,
an acceleration model of high temperature stress; g is the activation energy of the product, p is the Boltzmann constant,
the temperature test stress value under the accelerated stress is obtained;
is the temperature under normal stress;
the humidity test stress value under the accelerated stress is obtained;
is the humidity value under normal stress; b is a constant related to the product characteristics.
In one embodiment, the computer program when executed by the processor further performs the steps of:
acquiring test parameters corresponding to the product, wherein the test parameters comprise a test risk value, a preset fault number, a product test life value and a test product number;
determining the conventional test duration of the product according to the test life value of the product, the number of the test products and the time length coefficient, wherein the time length coefficient is determined according to the test risk value and the preset fault number;
and determining the product reliability test duration according to the product conventional test duration and the product reliability acceleration factor.
In one embodiment, the computer program when executed by the processor further performs the steps of:
wherein the content of the first and second substances,
test for indicating product reliabilityA duration;
representing a time length coefficient; t represents a product test life value;
representing a product reliability acceleration factor; n represents the number of products tested.
In one embodiment, the computer program when executed by the processor further performs the steps of:
if the number of the test faults is smaller than the preset number of the faults, the service life value of the product is not smaller than the test service life value of the product, the reliability of the product meets the preset requirement, and the test service life value of the product is used as the actual service life value of the product;
and determining the reliability index of the product according to the service life of the product and the actual life value of the product, and verifying the actual life value of the product according to the reliability index.
In one embodiment, a computer program product is provided, comprising a computer program which, when executed by a processor, performs the steps of:
determining a product reliability acceleration factor according to a product failure mode, wherein the product failure mode is used for indicating possible faults of a product;
determining the reliability test duration of the product according to the product reliability acceleration factor, the product test life value and the number of test products, wherein the product test life value is a life value which needs to be met by the product in an ideal state;
determining the number of test faults according to the product reliability test duration, wherein the number of test faults is used for indicating the number of faults occurring in all test products in the product reliability test duration;
and determining a product reliability test result according to the test fault number and the preset fault number.
In one embodiment, the computer program when executed by the processor further performs the steps of:
determining a reliability test stress type and a test stress value corresponding to a product failure mode, wherein the test stress value is the limit stress which can be borne by a product in work;
determining a reliability acceleration model corresponding to the product according to the reliability test stress type corresponding to the product failure mode;
and determining a product reliability acceleration factor according to the reliability acceleration model and the test stress value corresponding to the product.
In one embodiment, the reliability test stress type corresponding to the product failure mode comprises temperature and humidity combined stress; accordingly, the computer program when executed by the processor further realizes the steps of:
wherein the content of the first and second substances,
an acceleration model of high temperature stress; g is the activation energy of the product, p is the Boltzmann constant,
the temperature test stress value under the accelerated stress is obtained;
is the temperature under normal stress;
the humidity test stress value under the accelerated stress is obtained;
is the humidity value under normal stress; b is a constant related to the product characteristics.
In one embodiment, the computer program when executed by the processor further performs the steps of:
acquiring test parameters corresponding to the product, wherein the test parameters comprise a test risk value, a preset fault number, a product test life value and a test product number;
determining the conventional test duration of the product according to the test life value of the product, the number of the test products and the time length coefficient, wherein the time length coefficient is determined according to the test risk value and the preset fault number;
and determining the product reliability test duration according to the product conventional test duration and the product reliability acceleration factor.
In one embodiment, the computer program when executed by the processor further performs the steps of:
wherein the content of the first and second substances,
representing the test duration of the product reliability;
representing a time length coefficient; t represents a product test life value;
representing a product reliability acceleration factor; n represents the number of products tested.
In one embodiment, the computer program when executed by the processor further performs the steps of:
if the number of the test faults is smaller than the preset number of the faults, the service life value of the product is not smaller than the test service life value of the product, the reliability of the product meets the preset requirement, and the test service life value of the product is used as the actual service life value of the product;
and determining the reliability index of the product according to the service life of the product and the actual life value of the product, and verifying the actual life value of the product according to the reliability index.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, database, or other medium used in the embodiments provided herein may include at least one of non-volatile and volatile memory. The nonvolatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical Memory, high-density embedded nonvolatile Memory, resistive Random Access Memory (ReRAM), Magnetic Random Access Memory (MRAM), Ferroelectric Random Access Memory (FRAM), Phase Change Memory (PCM), graphene Memory, and the like. Volatile Memory can include Random Access Memory (RAM), external cache Memory, and the like. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM), among others. The databases referred to in various embodiments provided herein may include at least one of relational and non-relational databases. The non-relational database may include, but is not limited to, a block chain based distributed database, and the like. The processors referred to in the embodiments provided herein may be general purpose processors, central processing units, graphics processors, digital signal processors, programmable logic devices, quantum computing based data processing logic devices, etc., without limitation.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present application. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present application shall be subject to the appended claims.
Claims (10)
1. A method for testing product reliability, the method comprising:
determining a product reliability acceleration factor according to a product failure mode, wherein the product failure mode is used for indicating possible faults of a product;
acquiring test parameters corresponding to the product, wherein the test parameters comprise a test risk value, a preset fault number, a product test life value and a test product number, determining the conventional test time length of the product according to the product test life value, the test product number and a time length coefficient, the time length coefficient is determined according to the test risk value and the preset fault number, determining the reliability test time length of the product according to the conventional test time length of the product and the product reliability acceleration factor, and the product test life value is a life value which needs to be met by the product in an ideal state;
determining a test fault number according to the product reliability test duration, wherein the test fault number is used for indicating the number of faults occurring in all test products in the product reliability test duration;
and determining a product reliability test result according to the test fault number and the preset fault number.
2. The method of claim 1, wherein determining a product reliability acceleration factor based on a product failure mode comprises:
determining a reliability test stress type and a test stress value corresponding to the product failure mode, wherein the test stress value is the limit stress which can be borne by the product during working;
determining a reliability acceleration model corresponding to the product according to the reliability test stress type corresponding to the product failure mode;
and determining the product reliability acceleration factor according to the reliability acceleration model corresponding to the product and the test stress value.
3. The method of claim 2, wherein the reliability test stress type for the product failure mode comprises temperature and humidity combined stress; correspondingly, determining the product reliability acceleration factor according to the reliability acceleration model corresponding to the product and the test stress value, and the method comprises the following steps:
wherein the content of the first and second substances,
an acceleration model of high temperature stress; t is a conventional model of high temperature stress; g is the activation energy of the product, p is the Boltzmann constant,
the temperature test stress value under the accelerated stress is obtained;
is the temperature under normal stress;
the humidity test stress value under the accelerated stress is obtained;
is the humidity value under normal stress; b is a constant related to the product characteristics.
4. The method of claim 1, wherein said determining said product reliability test duration based on said product routine test duration and said product reliability acceleration factor comprises:
wherein the content of the first and second substances,
representing the test duration of the product reliability;
representing a time length coefficient; t represents a product test life value;
representing a product reliability acceleration factor; n represents the number of products tested.
5. The method of claim 1, further comprising:
if the test fault number is smaller than the preset fault number, the service life value of the product is not smaller than the test service life value of the product, the reliability of the product meets the preset requirement, and the test service life value of the product is used as the actual service life value of the product;
determining the reliability index of the product according to the service life of the product and the actual life value of the product, and verifying the actual life value of the product according to the reliability index.
6. A product reliability testing apparatus, characterized in that the apparatus comprises:
the system comprises a first determining module, a second determining module and a control module, wherein the first determining module is used for determining a product reliability acceleration factor according to a product failure mode, and the product failure mode is used for indicating possible faults of a product;
the second determining module is used for obtaining test parameters corresponding to the product, wherein the test parameters comprise a test risk value, a preset fault number, a product test life value and a test product number, the conventional test time length of the product is determined according to the product test life value, the test product number and a time length coefficient, the time length coefficient is determined according to the test risk value and the preset fault number, the reliability test time length of the product is determined according to the conventional test time length of the product and the product reliability acceleration factor, and the product test life value is a life value which needs to be met by the product in an ideal state;
the third determining module is used for determining the number of test faults according to the product reliability test duration, wherein the number of test faults is used for indicating the number of faults occurring in all test products in the product reliability test duration;
and the fourth determining module is used for determining a product reliability test result according to the test fault number and the preset fault number.
7. The apparatus of claim 6, wherein the first determining module comprises:
the first determining unit is used for determining a reliability test stress type and a test stress value corresponding to the product failure mode, wherein the test stress value is the limit stress which can be borne by a product in work;
the second determining unit is used for determining a reliability acceleration model corresponding to the product according to the reliability test stress type corresponding to the product failure mode;
and the third determining unit is used for determining the product reliability acceleration factor according to the reliability acceleration model corresponding to the product and the test stress value.
8. The apparatus of claim 6, further comprising:
the judging module is used for judging whether the service life value of the product is smaller than the test service life value of the product when the test fault number is smaller than the preset fault number, judging whether the reliability of the product meets the preset requirement and taking the test service life value of the product as the actual service life value of the product;
and the fifth determining module is used for determining the reliability index of the product according to the service life of the product and the actual life value of the product, and verifying the actual life value of the product according to the reliability index.
9. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor, when executing the computer program, implements the steps of the method of any of claims 1 to 5.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 5.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114564415A (en) * | 2022-04-29 | 2022-05-31 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Software autonomy evaluation method, device, equipment, medium and program product |
| CN114936463A (en) * | 2022-06-01 | 2022-08-23 | 一汽解放汽车有限公司 | Method and device for acquiring service life of lubricating grease, computer equipment and storage medium |
| CN115468759A (en) * | 2022-09-22 | 2022-12-13 | 中国核动力研究设计院 | Method for accelerated test of hot standby service life of electric valve |
| CN116249306A (en) * | 2023-05-08 | 2023-06-09 | 深圳市精致网络设备有限公司 | Cabinet management method and system based on data set display management |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105737881A (en) * | 2014-12-10 | 2016-07-06 | 天津航天瑞莱科技有限公司 | Acceleration reliability growth test method for electronic equipment |
| CN108510133A (en) * | 2017-02-23 | 2018-09-07 | 北京桑兰特科技有限公司 | A kind of electronic product reliability index appraisal procedure based on comprehensive accelerated factor |
| CN110851940A (en) * | 2018-07-27 | 2020-02-28 | 中车株洲电力机车研究所有限公司 | Product reliability accelerated verification test method based on stress distribution |
| CN111079276A (en) * | 2019-12-08 | 2020-04-28 | 华质卓越质量技术服务(北京)有限公司 | Method for accelerating verification of reliability index of electronic product in multiple failure modes |
| CN111400903A (en) * | 2020-03-16 | 2020-07-10 | 中国科学院微小卫星创新研究院 | Service life evaluation method of passive high-power single machine for navigation |
| CN112115629A (en) * | 2020-08-20 | 2020-12-22 | 中国人民解放军总参谋部第六十研究所 | Whole machine accelerated storage test design method combined with stress simulation |
| CN112710690A (en) * | 2020-12-17 | 2021-04-27 | 武汉船舶通信研究所（中国船舶重工集团公司第七二二研究所） | Method for determining acceleration factor in accelerated life test and application |
| CN113656972A (en) * | 2021-08-19 | 2021-11-16 | 北京卫星环境工程研究所 | Satellite-borne electronic single machine long-service-life acceleration verification method based on sequence advancing equivalence |
| CN113946986A (en) * | 2021-12-20 | 2022-01-18 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Method and device for evaluating average time before product failure based on accelerated degradation test |
| CN114035042A (en) * | 2021-10-08 | 2022-02-11 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Servo system life test method and device, computer equipment and storage medium |
| CN114152823A (en) * | 2021-11-11 | 2022-03-08 | 北京长城电子装备有限责任公司 | Method for evaluating quick reliability of high-reliability long-life liquid crystal display device |
-
2022
- 2022-03-21 CN CN202210274831.2A patent/CN114357812B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105737881A (en) * | 2014-12-10 | 2016-07-06 | 天津航天瑞莱科技有限公司 | Acceleration reliability growth test method for electronic equipment |
| CN108510133A (en) * | 2017-02-23 | 2018-09-07 | 北京桑兰特科技有限公司 | A kind of electronic product reliability index appraisal procedure based on comprehensive accelerated factor |
| CN110851940A (en) * | 2018-07-27 | 2020-02-28 | 中车株洲电力机车研究所有限公司 | Product reliability accelerated verification test method based on stress distribution |
| CN111079276A (en) * | 2019-12-08 | 2020-04-28 | 华质卓越质量技术服务(北京)有限公司 | Method for accelerating verification of reliability index of electronic product in multiple failure modes |
| CN111400903A (en) * | 2020-03-16 | 2020-07-10 | 中国科学院微小卫星创新研究院 | Service life evaluation method of passive high-power single machine for navigation |
| CN112115629A (en) * | 2020-08-20 | 2020-12-22 | 中国人民解放军总参谋部第六十研究所 | Whole machine accelerated storage test design method combined with stress simulation |
| CN112710690A (en) * | 2020-12-17 | 2021-04-27 | 武汉船舶通信研究所（中国船舶重工集团公司第七二二研究所） | Method for determining acceleration factor in accelerated life test and application |
| CN113656972A (en) * | 2021-08-19 | 2021-11-16 | 北京卫星环境工程研究所 | Satellite-borne electronic single machine long-service-life acceleration verification method based on sequence advancing equivalence |
| CN114035042A (en) * | 2021-10-08 | 2022-02-11 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Servo system life test method and device, computer equipment and storage medium |
| CN114152823A (en) * | 2021-11-11 | 2022-03-08 | 北京长城电子装备有限责任公司 | Method for evaluating quick reliability of high-reliability long-life liquid crystal display device |
| CN113946986A (en) * | 2021-12-20 | 2022-01-18 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Method and device for evaluating average time before product failure based on accelerated degradation test |
Non-Patent Citations (2)
| Title |
|---|
| 张振恺 等: "可靠性加速试验技术在家电行业的应用实践", 《中国质量》 * |
| 李梅: "考虑温湿度的可靠性快速评估方案选择优化和分析", 《环境技术》 * |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114564415A (en) * | 2022-04-29 | 2022-05-31 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Software autonomy evaluation method, device, equipment, medium and program product |
| CN114564415B (en) * | 2022-04-29 | 2022-08-16 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Software autonomy evaluation method, device, equipment, medium and program product |
| CN114936463A (en) * | 2022-06-01 | 2022-08-23 | 一汽解放汽车有限公司 | Method and device for acquiring service life of lubricating grease, computer equipment and storage medium |
| CN115468759A (en) * | 2022-09-22 | 2022-12-13 | 中国核动力研究设计院 | Method for accelerated test of hot standby service life of electric valve |
| CN115468759B (en) * | 2022-09-22 | 2024-01-23 | 中国核动力研究设计院 | Accelerated test method for hot standby life of electric valve |
| CN116249306A (en) * | 2023-05-08 | 2023-06-09 | 深圳市精致网络设备有限公司 | Cabinet management method and system based on data set display management |
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