CN112710690A - Method for determining acceleration factor in accelerated life test and application - Google Patents
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Abstract
The invention discloses a method for determining an acceleration factor in an accelerated life test and application thereof, which obtains a first environment temperature, a second environment temperature, all component types of tested equipment, the number of components of the same type and corresponding activation energy, obtains the acceleration factor corresponding to each type of component by using a first mapping relation, obtains the estimated failure rate of the tested equipment based on the working failure rate and the number corresponding to each type of component, obtains a first acceleration factor of the tested equipment by using the acceleration factor, the working failure rate and the estimated failure rate of the tested equipment corresponding to each type of component, obtains the activation energy of the tested equipment by using the activation energy and the number corresponding to each type of component, obtains a second acceleration factor of the tested equipment by using a second mapping relation, and determines the final acceleration factor of the tested equipment by using the first acceleration factor and the second acceleration factor of the tested equipment, and carrying out an accelerated life test on the tested equipment by using the final acceleration factor so as to shorten the test time of the accelerated test.
Description
Technical Field
The invention belongs to the technical field of equipment reliability tests, and particularly relates to a method for determining an acceleration factor in an accelerated life test and application thereof.
Background
Reliability is the ability of a product to perform a specified function under specified conditions and for a specified time. The mean time between failures and the service life are commonly used to measure the reliability level. Aiming at equipment with higher reliability level and longer service life, a sufficient special reliability test is strictly carried out according to GJB899A, the test time is longer, and the test cost is higher. An effective reliability accelerated life test scheme is searched, an engineer is guided to be capable of fully and scientifically examining the reliability level of tested equipment in a short test time, the reliability accelerated life test scheme is always one of the research directions of reliability professionals, and one of the most important work is to determine an acceleration factor.
In the reliability accelerated life test scheme, because the tested equipment has more types of components, the corresponding activation energy and the applicable acceleration factor parameters are different for different components, and the inapplicable acceleration factor is selected, so that the test time is longer and the test cost is higher when the reliability test is carried out on the long-life equipment.
Disclosure of Invention
Aiming at least one defect or improvement requirement in the prior art, the invention provides a method for determining an acceleration factor in an accelerated life test and application thereof, aiming at solving the technical problems of longer test time and higher test cost when a reliability test is carried out on a long-life device.
To achieve the above object, according to one aspect of the present invention, there is provided a method of determining an acceleration factor in an accelerated life test, the method including:
acquiring a first environment temperature, a second environment temperature, all component types of the tested equipment, the number of components of the same type and corresponding activation energy, wherein the first environment temperature is the environment temperature of the tested equipment in normal work, and the second environment temperature is the environment temperature of the tested equipment in an accelerated life test;
acquiring an acceleration factor corresponding to each type of component by using a first mapping relation, wherein the first mapping relation is a mapping relation among a first environment temperature, a second environment temperature, activation energy of the same type of component and the acceleration factor corresponding to the same type of component;
obtaining estimated failure rate of the tested equipment based on the working failure rate and the quantity corresponding to each type component, and obtaining a first acceleration factor of the tested equipment by using the acceleration factor, the working failure rate and the estimated failure rate of the tested equipment corresponding to each type component;
obtaining the activation energy of the tested equipment by using the activation energy and the number corresponding to each type of component, and obtaining a second acceleration factor of the tested equipment by using a second mapping relation, wherein the second mapping relation is a mapping relation among the first environment temperature, the second environment temperature, the activation energy of the tested equipment and the second acceleration factor;
and determining a final acceleration factor of the tested equipment by using the first acceleration factor and the second acceleration factor of the tested equipment, and performing an accelerated life test on the tested equipment by using the final acceleration factor.
As a further improvement of the invention, the types of components of the device under test include one or more of resistors, capacitors, magnetic coils, connectors, semiconductor monolithic integrated circuits, and hybrid integrated circuits.
As a further improvement of the invention, the work failure rate corresponding to each type of component is obtained through the GJB/Z299C standard.
As a further improvement of the present invention, obtaining the estimated failure rate of the device under test based on the working failure rate and the number corresponding to each type of component specifically includes:
work failure rate lambda of i-th componentiIs λi＝miλmiWherein m isiIs the number of i-th component, λmiThe working failure rate of an i-th component is determined;
estimated failure rate lambda of the device under testSIs composed of
Wherein n is the number of all the components contained in the tested equipment.
As a further improvement of the invention, the acceleration factor A corresponding to the ith componentiComprises the following steps:
wherein E isiThe value of the activation energy corresponding to the ith component is obtained; k is Boltzmann constant; t is0Ambient temperature, T, for normal operation of the equipment under test taking part in the accelerated testdTo accelerate the ambient temperature under test conditions;
using each type of componentAcquiring a first acceleration factor of the tested equipment by the corresponding acceleration factor, the corresponding work failure rate and the estimated failure rate of the tested equipment
Comprises the following steps:
as a further development of the invention, the activation energy E of the device under testSThe calculation method is as follows:
wherein E isiThe value of the activation energy corresponding to the ith component is obtained; m isiThe number of the ith component is n, and the number of all the components contained in the tested equipment is n.
As a further improvement of the invention, the second acceleration factor of the device under test
Comprises the following steps:
wherein k is Boltzmann constant; t is0Ambient temperature, T, for normal operation of the equipment under test taking part in the accelerated testdTo speed up the ambient temperature under test conditions.
As a further development of the invention, it is provided that the first acceleration factor is used
And a second acceleration factor
Determining the final acceleration factor A of the device under testSThe method specifically comprises the following steps:
to achieve the above object, according to another aspect of the present invention, there is provided a terminal device comprising at least one processing unit, and at least one memory unit, wherein the memory unit stores a computer program which, when executed by the processing unit, causes the processing unit to perform the steps of the above method.
To achieve the above object, according to another aspect of the present invention, there is provided a computer readable medium storing a computer program executable by an electronic device, the computer program causing the electronic device to perform the steps of the above method when the computer program runs on the electronic device.
In general, compared with the prior art, the above technical solution contemplated by the present invention can achieve the following beneficial effects:
the invention provides a method and application for determining an acceleration factor in an accelerated life test, which improve the accuracy of the acceleration factor by comprehensively weighting and determining two different types of acceleration factors, wherein one type of acceleration factor is determined by weighting the acceleration factors of various components according to the determined acceleration factor and failure rate of the components of tested equipment and the weight of the failure rate of the different types of components at the failure rate of the equipment; and the other type of acceleration factor is determined by weighting the activation energy of various components according to the determined activation energy and the number of the components of the tested equipment and the weight of the number of the components in the total number of the components in different types, so that engineering personnel are guided to carry out a reliability accelerated life test by utilizing the acceleration factor, the test duration can be effectively shortened, and the reliability test time and the test cost of the equipment are reduced.
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Fig. 1 is a schematic diagram of a method for determining an acceleration factor in an accelerated life test according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. In addition, the technical features involved in the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
Fig. 1 is a schematic diagram of a method for determining an acceleration factor in an accelerated life test according to an embodiment of the present invention. As shown in fig. 1, a method for determining an acceleration factor in an accelerated life test includes the steps of:
acquiring a first environment temperature, a second environment temperature, all component types of the tested equipment, the number of components of the same type and corresponding activation energy, wherein the first environment temperature is the environment temperature of the tested equipment in normal work, and the second environment temperature is the environment temperature of the tested equipment in an accelerated life test; the device under test is a test object in an accelerated life test, and may be any electronic device, and the types of components include resistors, capacitors, magnetic coils, connectors, semiconductor monolithic integrated circuits, hybrid integrated circuits, and the like, and may be any electronic component used for electronic devices. For example, the test equipment participating in the accelerated test normally operates at an ambient temperature T0And ambient temperature T under accelerated test conditionsdWherein T is0And TdAre thermodynamic temperatures, and the relationship between thermodynamic temperature T and temperature T in degrees Celsius is:
T＝t+273.15
wherein T is the thermodynamic temperature (K) and T is the temperature in degrees Celsius (DEG C).
Acquiring an acceleration factor corresponding to each type of component by using a first mapping relation, wherein the first mapping relation is a mapping relation among a first environment temperature, a second environment temperature, activation energy of the same type of component and the acceleration factor corresponding to the same type of component;
obtaining estimated failure rate of the tested equipment based on the working failure rate and the quantity corresponding to each type component, and obtaining a first acceleration factor of the tested equipment by using the acceleration factor, the working failure rate and the estimated failure rate of the tested equipment corresponding to each type component; for example, the work failure rate corresponding to each type of component may be obtained through the GJB/Z299C standard, of course, the above obtaining manner is only an example, and other standards may also be adopted, or the work failure rate corresponding to each type of component may be calculated through the same type of component sample. As an example, the estimated failure rate of the device under test is obtained based on the working failure rate and the number corresponding to each type of component:
work failure rate lambda of i-th componentiIs λi＝miλmiWherein m isiIs the number of i-th component, λmiThe working failure rate of an i-th component is determined;
estimated failure rate lambda of the device under testSIs composed of
Wherein n is the number of all the components contained in the tested equipment.
As an example, the Arrhenius model may be used to obtain an acceleration factor corresponding to each type of component, where the acceleration factor a corresponding to the ith type of componentiComprises the following steps:
wherein E isiThe value of the activation energy (the unit is eV) corresponding to the i-th component is the energy for the molecule to start to move; k is a Boltzmann constant which generally takes the value of 8.623 multiplied by 10 < -5 > eV/K; t is0Ambient temperature, T, for normal operation of the equipment under test taking part in the accelerated testdTo speed up the ambient temperature under test conditions. Of course, the Arrhenius model is only used as an example, and different models can be selected according to test requirements to obtain the acceleration factor corresponding to each type of component.
Further, the corresponding sum of each type of component is utilizedAcquiring a first acceleration factor of the tested equipment by using the speed factor, the work failure rate and the estimated failure rate of the tested equipment
Comprises the following steps:
obtaining the activation energy of the tested equipment by using the activation energy and the number corresponding to each type of component, and obtaining a second acceleration factor of the tested equipment by using a second mapping relation, wherein the second mapping relation is a mapping relation among the first environment temperature, the second environment temperature, the activation energy of the tested equipment and the second acceleration factor;
as an example, the activation energy E of the device under testSThe calculation method is as follows:
wherein E isiThe value of the activation energy (the unit is eV) corresponding to the i-th component is the energy for the molecule to start to move; m isiThe number of the ith component is n, and the n is the number of all the components contained in the tested equipment;
the Arrhenius model can be used for obtaining a second acceleration factor of the tested equipment
Comprises the following steps:
wherein K is a Boltzmann constant which generally takes the value of 8.623 multiplied by 10 < -5 > eV/K; t is0Ambient temperature, T, for normal operation of the equipment under test taking part in the accelerated testdTo speed up the ambient temperature under test conditions. Of course, the above uses of the Arrhenius model is onlyAs an example, different models may be selected to obtain the second acceleration factor of the device under test depending on the experimental requirements.
And determining a final acceleration factor of the tested equipment by using the first acceleration factor and the second acceleration factor of the tested equipment, and performing an accelerated life test on the tested equipment by using the final acceleration factor. For example, based on the determined first acceleration factor
And a second acceleration factor
Determining the final acceleration factor A of the device under testS：
Of course, the above calculation method of the final acceleration factor is only an example, and different weight parameters or calculation models may be selected according to the experiment requirements to obtain the final acceleration factor.
As a specific example, assuming that a test device is subjected to an accelerated life test, as shown in Table 1, the ambient temperature for normal operation is 25 ℃ and the ambient temperature for the accelerated life test is 75 ℃, the acceleration factor at the ambient temperature is determined.
Table 1 schematic table of first and second ambient temperatures for a device under test of an embodiment of the invention
The tested equipment consists of 7 different components, the activation energy of each component is obtained by looking up data, and the number of the components and the activation energy of the components are respectively shown in the following table 2.
Table 2 schematic table of parameters of components of device under test according to an embodiment of the present invention
| Serial number | Class of component | Number of components | Activation energy of component |
| 1 | A | 25 | 0.78 |
| 2 | B | 39 | 0.81 |
| 3 | C | 56 | 0.79 |
| 4 | D | 34 | 0.86 |
| 5 | E | 28 | 0.71 |
| 6 | F | 19 | 0.84 |
| 7 | G | 32 | 0.75 |
| Total of | / | 233 | / |
From the GJB/Z299C, the failure rates of various components and devices under the accelerated test temperature condition and the failure rate of the tested equipment are predicted, as shown in Table 3 below.
Table 3 schematic table of failure rates of devices under test and failure rates of components according to an embodiment of the present invention
According to the determined parameters, by formula
The acceleration factors for each component were determined as shown in table 4 below.
Table 4 schematic table of activation energy and acceleration factor of each component in the embodiment of the present invention
| Class of component | Activation energy of component (E)i) | Acceleration factor (A)i) |
| A | 0.78 | 78.036 |
| B | 0.81 | 92.273 |
| C | 0.79 | 82.519 |
| D | 0.86 | 122.005 |
| E | 0.71 | 52.781 |
| F | 0.84 | 109.108 |
| G | 0.75 | 65.996 |
By the formula
Obtaining devices under testFirst acceleration factor
84.946;
by the formula
Obtaining activation energy E of the device under testSIs 0.79;
by the formula
Obtaining a second acceleration factor of the device under test
82.519;
by passing
The final acceleration factor of the device under test is obtained as 83.731, so that the acceleration test can be performed using the final acceleration factor.
The present embodiment further provides an electronic device, which includes at least one processor and at least one memory, where the memory stores a computer program, and when the computer program is executed by the processor, the processor is enabled to execute the steps of the method for determining an acceleration factor in an accelerated life test in the embodiment, and the specific steps refer to the embodiment and are not described herein again; in this embodiment, the types of the processor and the memory are not particularly limited, for example: the processor may be a microprocessor, digital information processor, on-chip programmable logic system, or the like; the memory may be volatile memory, non-volatile memory, a combination thereof, or the like.
The electronic device may also communicate with one or more external devices (e.g., keyboard, pointing terminal, display, etc.), with one or more terminals that enable a user to interact with the electronic device, and/or with any terminals (e.g., network card, modem, etc.) that enable the electronic device to communicate with one or more other computing terminals. Such communication may be through an input/output (I/O) interface. Also, the electronic device may communicate with one or more networks (e.g., a Local Area Network (LAN), a Wide Area Network (WAN), and/or a public Network, such as the internet) via the Network adapter.
The present embodiment also provides a computer-readable medium, which stores a computer program executable by an electronic device, and which, when run on the electronic device, causes the electronic device to perform the steps of the method of determining an acceleration factor in an accelerated life test of an embodiment. Types of computer readable media include, but are not limited to, storage media such as SD cards, usb disks, fixed hard disks, removable hard disks, and the like.
It will be understood by those skilled in the art that the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the invention, and that any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (10)
1. A method of determining an acceleration factor in an accelerated life test, the method comprising:
acquiring a first environment temperature, a second environment temperature, all component types of the tested equipment, the number of components of the same type and corresponding activation energy, wherein the first environment temperature is the environment temperature of the tested equipment in normal work, and the second environment temperature is the environment temperature of the tested equipment in an accelerated life test;
acquiring an acceleration factor corresponding to each type of component by using a first mapping relation, wherein the first mapping relation is a mapping relation among a first environment temperature, a second environment temperature, activation energy of the same type of component and the acceleration factor corresponding to the same type of component;
obtaining estimated failure rate of the tested equipment based on the working failure rate and the quantity corresponding to each type component, and obtaining a first acceleration factor of the tested equipment by using the acceleration factor, the working failure rate and the estimated failure rate of the tested equipment corresponding to each type component;
obtaining the activation energy of the tested equipment by using the activation energy and the number corresponding to each type of component, and obtaining a second acceleration factor of the tested equipment by using a second mapping relation, wherein the second mapping relation is a mapping relation among the first environment temperature, the second environment temperature, the activation energy of the tested equipment and the second acceleration factor;
and determining a final acceleration factor of the tested equipment by using the first acceleration factor and the second acceleration factor of the tested equipment, and performing an accelerated life test on the tested equipment by using the final acceleration factor.
2. The method of claim 1, wherein the component type of the device under test comprises one or more of a resistor, a capacitor, a magnetic coil, a connector, a semiconductor monolithic integrated circuit, and a hybrid integrated circuit.
3. The method for determining the acceleration factor in the accelerated life test of claim 1, wherein the operation failure rate corresponding to each type of component is obtained according to the GJB/Z299C standard.
4. The method for determining the acceleration factor in the accelerated life test as claimed in claim 1, wherein the obtaining of the estimated failure rate of the device under test based on the working failure rate and the number corresponding to each type of device specifically includes:
work failure rate lambda of i-th componentiIs λi＝miλmiWherein m isiIs the number of i-th component, λmiThe working failure rate of an i-th component is determined;
estimated failure rate lambda of the device under testSIs composed of
Wherein n is the number of all the components contained in the tested equipment.
5. The method for determining the acceleration factor in the accelerated life test of claim 4, wherein the acceleration factor A corresponding to the i-th componentiComprises the following steps:
wherein E isiThe value of the activation energy corresponding to the ith component is obtained; k is Boltzmann constant; t is0Ambient temperature, T, for normal operation of the equipment under test taking part in the accelerated testdTo accelerate the ambient temperature under test conditions;
obtaining a first acceleration factor of the tested equipment by using the acceleration factor, the work failure rate and the estimated failure rate of the tested equipment corresponding to each type component
Comprises the following steps:
6. the method for determining the acceleration factor in the accelerated life test of claim 1, wherein the activation energy E of the device under testSThe calculation method is as follows:
wherein E isiThe value of the activation energy corresponding to the ith component is obtained; m isiThe number of the ith component is n, and the number of all the components contained in the tested equipment is n.
7. The method of claim 6, wherein the second acceleration factor of the device under test is determined by a second acceleration factor
Comprises the following steps:
wherein k is Boltzmann constant; t is0Ambient temperature, T, for normal operation of the equipment under test taking part in the accelerated testdTo speed up the ambient temperature under test conditions.
8. The method for determining the acceleration factor in the accelerated life test of claim 1, wherein the first acceleration factor is determined according to
And a second acceleration factor
Determining the final acceleration factor A of the device under testSThe method specifically comprises the following steps:
9. a terminal device, comprising at least one processing unit and at least one memory unit, wherein the memory unit stores a computer program which, when executed by the processing unit, causes the processing unit to carry out the steps of the method according to any one of claims 1 to 8.
10. A computer-readable medium, in which a computer program is stored which is executable by an electronic device, and which, when run on the electronic device, causes the electronic device to carry out the steps of the method according to any one of claims 1-8.
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| CN113607455B (en) * | 2021-10-08 | 2022-02-15 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Servo system life test method and device, computer equipment and storage medium |
| CN114239326A (en) * | 2022-02-28 | 2022-03-25 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Product reliability acceleration coefficient evaluation method and device and computer equipment |
| CN114357812A (en) * | 2022-03-21 | 2022-04-15 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Product reliability test method and device, computer equipment and storage medium |
| CN114992769A (en) * | 2022-05-24 | 2022-09-02 | 宁波奥克斯电气股份有限公司 | Service life estimation method and device, air conditioner and readable storage medium |
| CN114966294A (en) * | 2022-07-27 | 2022-08-30 | 北京智芯微电子科技有限公司 | Reliability test system of power equipment, control method, device and medium |
| CN115186503A (en) * | 2022-07-27 | 2022-10-14 | 北京智芯微电子科技有限公司 | Equipment life prediction method and device and constant-temperature accelerated test system |
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