CN115841046A - Accelerated degradation test data processing method and device based on wiener process - Google Patents
Accelerated degradation test data processing method and device based on wiener process Download PDFInfo
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Abstract
The application relates to a method and a device for processing accelerated degradation test data based on a wiener process, computer equipment and a storage medium. The method comprises the following steps: the method comprises the steps of obtaining accelerated degradation test data of a product to be tested, screening a target time reduced model from a preset time reduced model set according to the accelerated degradation test data, constructing a nonlinear wiener degradation process based on the target time reduced model, determining a product reliability function of the product to be tested, testing the reliability of the product to be tested according to the product reliability function, and obtaining a product reliability test result of the product to be tested. According to the scheme, a nonlinear wiener process is constructed based on the screened target time reduced model, and nonlinearity of performance degradation is considered; and based on the nonlinear wiener process, determining a product reliability function, and utilizing the product reliability function to realize accurate test of the reliability of the product to be tested. In conclusion, the method can realize accurate product reliability test.
Description
Technical Field
The present application relates to the field of accelerated degradation testing technologies, and in particular, to a method and an apparatus for processing accelerated degradation testing data based on a wiener process, a computer device, and a storage medium.
Background
The accelerated degradation test is to adopt the stress condition which is severe to the normal use of the product, accelerate the degradation process of the product performance along with time and stress under the condition of keeping the failure mechanism unchanged, collect the accelerated degradation data of the product, and realize the rapid test evaluation of the reliability and the service life of the product through statistical inference and extrapolation.
A commonly used accelerated degradation test data analysis method adopts a linear wiener process, and has the advantages of simple form and simple and convenient calculation. The small part of accelerated degradation data analysis method considers the nonlinearity of product performance degradation, and adopts a specific model to reduce the performance degradation time, thereby improving the reliability evaluation precision to a certain extent.
However, the above methods only consider the linearity of the performance degradation, and are suitable for the case that the performance degradation follows a linear function with time, so that the accuracy of the test result is not high.
It can be seen that there is a need to provide an accurate product reliability test scheme.
Disclosure of Invention
In view of the above, there is a need to provide an accurate accelerated degradation test data processing method, apparatus, computer device and computer readable storage medium based on wiener process for solving the above technical problems.
In a first aspect, the application provides a method for processing accelerated degradation test data based on a wiener process. The method comprises the following steps:
acquiring accelerated degradation test data of a product to be tested;
screening a target time reduction model from a preset time reduction model set according to accelerated degradation test data;
constructing a nonlinear wiener degradation process based on a target time reduced model, and determining a product reliability function of a product to be detected;
and testing the reliability of the product to be tested according to the product reliability function to obtain a product reliability test result of the product to be tested.
In one embodiment, the constructing a nonlinear wiener degradation process based on a target time reduced model, and the determining the product reliability function of the product to be tested comprises:
constructing an initial nonlinear wiener process based on a target time reduced model;
constructing an initial product reliability function based on an initial nonlinear wiener process;
and evaluating the non-linear wiener process parameters in the initial product reliability function, and determining the product reliability function of the product to be tested.
In one embodiment, the evaluating the non-linear wiener process parameter in the initial product reliability function and the determining the product reliability function of the product to be tested comprises:
obtaining a failure probability density function of the product to be detected according to the initial product reliability function;
and determining a non-linear wiener process parameter in the initial product reliability function according to a pre-constructed maximum likelihood function of performance degradation, a product reliability function and a failure probability density function, and determining the product reliability function of the product to be detected.
In one embodiment, the product reliability test result comprises a first average fault interval time and a second average fault interval time, and the accelerated degradation test data comprises a plurality of groups of accelerated degradation test stresses;
testing the reliability of the product to be tested according to the product reliability function, wherein the product reliability test result of the product to be tested comprises the following steps:
testing the reliability of the product to be tested under each group of accelerated degradation test stress according to a product reliability function to obtain a first average fault interval time of the product to be tested;
and obtaining the second average fault interval time of the product to be tested under the normal stress according to the first average fault interval time and the acceleration factor corresponding to the target accelerated degradation test stress.
In one embodiment, the step of screening the target time reduced model from the preset time reduced model set according to the accelerated degradation test data comprises:
determining a time reduction factor of each product to be tested according to the accelerated degradation test data;
converting the time reduced models in the time reduced model set into nonlinear optimization equations based on the time reduced factors, evaluating model parameters of each time reduced model and determining each time reduced model;
and screening out a target time reduction model from each time reduction model according to the time reduction factor of each product to be tested.
In one embodiment, screening the target time reduction model from each time reduction model according to the time reduction factor of each product to be tested comprises:
performing model inspection on each time reduction model according to the time reduction factor of each product to be tested to obtain a model inspection result;
screening out an initial time reduced model from each time reduced model according to a model test result;
and screening out a target time reduction model from each initial time reduction model according to the time reduction factor corresponding to the initial time reduction model.
In a second aspect, the application also provides a data processing device for accelerated degradation test based on wiener process. The device comprises:
the data acquisition module is used for acquiring accelerated degradation test data of a product to be tested;
the time reduction model screening module is used for screening a target time reduction model from a preset time reduction model set according to the accelerated degradation test data;
the product reliability function determining module is used for constructing a nonlinear wiener process based on a target time reduced model and determining a product reliability function of a product to be detected;
and the product reliability testing module is used for testing the reliability of the product to be tested according to the product reliability function to obtain a product reliability testing result of the product to be tested.
In a third aspect, the present application also provides a computer device. The computer device comprises a memory and a processor, the memory stores a computer program, and the processor realizes the following steps when executing the computer program:
acquiring accelerated degradation test data of a product to be tested;
screening a target time reduction model from a preset time reduction model set according to accelerated degradation test data;
constructing a nonlinear wiener degradation process based on a target time reduced model, and determining a product reliability function of a product to be detected;
and testing the reliability of the product to be tested according to the product reliability function to obtain a product reliability test result of the product to be tested.
In a fourth aspect, the present application further provides a computer-readable storage medium. The computer-readable storage medium having stored thereon a computer program which, when executed by a processor, performs the steps of:
acquiring accelerated degradation test data of a product to be tested;
screening a target time reduction model from a preset time reduction model set according to accelerated degradation test data;
constructing a nonlinear wiener degradation process based on a target time reduced model, and determining a product reliability function of a product to be detected;
and testing the reliability of the product to be tested according to the product reliability function to obtain a product reliability test result of the product to be tested.
The accelerated degradation test data processing method and device based on the wiener process, the computer equipment and the storage medium acquire accelerated degradation test data of a product to be tested, screen out a target time reduced model from a preset time reduced model set according to the accelerated degradation test data, then construct a nonlinear wiener process based on the target time reduced model, determine a product reliability function of the product to be tested, and finally test the reliability of the product to be tested according to the product reliability function to obtain a product reliability test result of the product to be tested. According to the scheme, on the first aspect, the performance degradation time possibly obeys other time reduction models, namely model optimization is expanded in the time reduction model set, and a target time reduction model is screened out, so that effective support can be provided for accurate test result product reliability; in the second aspect, a nonlinear wiener process is constructed based on the screened target time reduced model, and the nonlinearity of performance degradation is considered, so that the method is more comprehensive; and in the third aspect, a product reliability function is determined based on a nonlinear wiener process, and the reliability of the product to be tested can be accurately tested by utilizing the product reliability function. In conclusion, the adoption of the scheme can realize accurate product reliability test.
Drawings
FIG. 1 is a diagram of an application environment of a method for processing accelerated degradation test data based on a wiener process in one embodiment;
FIG. 2 is a schematic flow chart illustrating a method for processing accelerated degradation test data based on a wiener process in one embodiment;
FIG. 3 is a flowchart illustrating the step of determining a product reliability function for a product under test in one embodiment;
FIG. 4 is a schematic flow chart of a method for processing accelerated degradation test data based on a wiener process in another embodiment;
FIG. 5 is a block diagram of an accelerated degradation testing data processing apparatus based on wiener process in one embodiment;
FIG. 6 is a diagram illustrating an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more clearly understood, the present application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
The accelerated degradation test data processing method based on the wiener process provided by the embodiment of the application can be applied to the application environment shown in fig. 1. Wherein a user terminal 102 communicates with a server 104 over a network. Specifically, the experimenter uploads accelerated degradation test data of a product to be tested to the server 104 through the terminal 102, sends a product reliability test message to the server 104, the server 104 responds to the message to obtain the accelerated degradation test data of the product to be tested, then, according to the accelerated degradation test data, a target time reduced model is screened out from a preset time reduced model set, then, based on the target time reduced model, a nonlinear wiener degradation process is established, a product reliability function of the product to be tested is determined, and finally, according to the product reliability function, the reliability of the product to be tested is tested, so that a product reliability test result of the product to be tested is obtained. The terminal 102 may be, but is not limited to, various personal computers, notebook computers, smart phones, tablet computers, and portable wearable devices. The server 104 may be implemented as a stand-alone server or as a server cluster comprised of multiple servers.
In one embodiment, as shown in fig. 2, there is provided a method for processing accelerated degradation test data based on wiener process, which is described by taking the method as an example applied to the server 104 in fig. 1, and includes the following steps:
and S202, acquiring accelerated degradation test data of the product to be tested.
The product to be tested can be electronic equipment, and can also be a part, such as a photovoltaic component or a radar component. The accelerated degradation test data comprises accelerated degradation test stress, accelerated degradation test temperature, performance detection times, test time, performance degradation values detected each time, product quantity and the like.
And step S204, screening a target time reduction model from a preset time reduction model set according to the accelerated degradation test data.
The target time reduction model is the optimal time reduction model. In other words, the model that most accurately characterizes the regularity of the performance degradation over time. All time reduced models can be converted into linear expressions through certain transformation. The time-reduced model set comprises a plurality of pre-constructed linearized models of performance degradation of the product over time. Specifically, the time-reduced model set may include a power function model, an exponential function model, a hybrid model, and the like. In this example, the time-reduced model of product performance degradation under accelerated stress is shown in table 1 below:
TABLE 1 time reduction model for product performance degradation
In the formula (I), the compound is shown in the specification,
is the time reduced function of the product, t is the test time, and a and b are unknown parameters.
In specific implementation, the target time reduction model can be screened from a preset time reduction model set according to the time reduction factor of the product to be measured. Where the linear coefficients may describe a linear fit of the performance degradation over time.
And S206, constructing a nonlinear wiener process based on the target time reduced model, and determining a product reliability function of the product to be detected.
And the product reliability function is used for quickly evaluating the product reliability of the product to be tested under the normal condition. Specifically, the product to be tested may be subjected to an accelerated test to quickly evaluate the reliability of the product. The accelerated test is to accelerate the failure of a tested product by strengthening test conditions on the premise of ensuring that the failure mechanism of the product is not changed, so that necessary information can be obtained in a short time to evaluate the reliability or service life index of the product under normal conditions. The sets of accelerated degradation test stresses may be sets of different temperature stresses. After the target time reduced model is screened out, nonlinear wiener process analysis can be carried out based on the target time reduced model, parameters of the nonlinear wiener process are estimated, and a product reliability function of a product to be detected is determined.
And S208, testing the reliability of the product to be tested according to the product reliability function to obtain a product reliability test result of the product to be tested.
After the product reliability function is obtained, the reliability of the product to be tested can be tested according to the product reliability function under different accelerated degradation test conditions according to accelerated degradation test data, and a product reliability test result of the product to be tested can be obtained. In this embodiment, the product reliability test result includes a test result of the product to be tested under a normal test stress. In specific implementation, the failure probability or the mean time between failures of the product to be tested under normal stress can be evaluated according to the product reliability acceleration model, so as to obtain a product reliability test result.
According to the accelerated degradation test data processing method based on the wiener process, accelerated degradation test data of a product to be tested are obtained, a target time reduced model is screened out from a preset time reduced model set according to the accelerated degradation test data, then, a nonlinear wiener process is constructed based on the target time reduced model, a product reliability function of the product to be tested is determined, and finally, the reliability of the product to be tested is tested according to the product reliability function, and a product reliability test result of the product to be tested is obtained. According to the scheme, on the first aspect, the performance degradation time possibly obeys other time reduction models, namely model optimization is expanded in the time reduction model set, and a target time reduction model is screened out, so that effective support can be provided for accurate test result product reliability; constructing a nonlinear wiener process based on the screened target time reduced model, and considering the nonlinearity of performance degradation; and in the third aspect, a product reliability function is determined based on a nonlinear wiener process, and the reliability of the product to be tested can be accurately tested by utilizing the product reliability function. In conclusion, the adoption of the scheme can realize accurate product reliability test.
As shown in fig. 3, in one embodiment, step S206 includes:
step S226, constructing an initial nonlinear wiener process based on the target time reduced model.
Step S246, an initial product reliability function is constructed based on the initial nonlinear wiener process.
And step S266, evaluating the non-linear wiener process parameters in the initial product reliability function and determining the product reliability function of the product to be tested.
In specific implementation, on the basis of considering performance degradation nonlinearity, uncertain degradation amount and product degradation difference, the nonlinear wiener process is obtained by:
in the formula (I), the compound is shown in the specification,
for a performance degradation value of a product at time t>
And &>
Respectively a drift parameter and a diffusion parameter,
is a Brownian shift function>
Obey mean value->
And variance->
Normal score ofAnd (3) cloth.
Further, based on the nonlinear wiener process, an initial product reliability function of the product to be tested is constructed through test data analysis
：
Wherein D is the failure threshold of the product performance degradation.
After the product reliability function is constructed, the parameters of the nonlinear wiener process are obtained
Are unknown parameters. The parameters of the nonlinear wiener process can be further estimated, so that a final product reliability function can be obtained according to the estimated parameters of the nonlinear wiener process. In the embodiment, a nonlinear wiener process is constructed through a target time reduced model, and a product reliability function can be quickly constructed and determined based on the nonlinear wiener process.
In one embodiment, step S266 includes: obtaining a failure probability density function of a product to be detected according to the initial product reliability function, determining a nonlinear wiener process parameter in the initial product reliability function according to a pre-constructed maximum likelihood function of performance degradation, the product reliability function and the failure probability density function, and determining the product reliability function of the product to be detected.
In this embodiment, after the initial product reliability function is constructed, the maximum likelihood estimation method may be used to solve the nonlinear wiener process parameters. Specifically, a maximum likelihood function of product performance degradation can be constructed in advance, and the maximum likelihood function can be obtained from an initial product reliability function and a failure probability density function of the product
Comprises the following steps:
then the product
The maximum likelihood function of (a) is:
are respectively paired
Calculating a deviation to obtain
Obtaining the nonlinear wiener process parameters by solving the equation set
. Determining a non-linear wiener process parameter>
Thereafter, a further determination of the product reliability function->
. In this embodiment, the nonlinear wiener process parameters can be quickly solved by the maximum likelihood method.
As shown in fig. 4, in one embodiment, the product reliability test result includes a first average time between failures and a second average time between failures, and the accelerated degradation test data includes a plurality of sets of accelerated degradation test stresses;
step S208 includes: step S228, testing the reliability of the product to be tested under each group of accelerated degradation test stress according to the product reliability function to obtain a first average fault interval time of the product to be tested, and obtaining a second average fault interval time of the product to be tested under normal stress according to the first average fault interval time and an acceleration factor corresponding to the target accelerated degradation test stress.
The target accelerated test stress is the accelerated test stress designated by the tester. In practical applications, the product reliability test can be determined according to the acceleration factor actually used. Specifically, the acceleration factor includes higher frequency power cycling, higher vibration levels, high humidity, high temperature, and the like. In this embodiment, the reliability test result includes an average fault interval time and a product failure probability. Mean Time Between Failures (MTBF) identifies the average of the Time from when a new product begins to operate under specified operating environmental conditions to when the first Failure occurs. Longer MTBF means higher reliability and higher ability to work correctly. The unit of MTBF is "hours". It reflects the time quality of the product and is a capability of embodying the function of the product to be kept in a specified time. In this embodiment, the product reliability test performed on the product to be tested includes a reliability test under an accelerated degradation test stress and a reliability test under a normal stress. Specifically, the method can comprise the following steps:
a) Evaluating product reliability of product to be tested under accelerated degradation test stress
Failure probability density function of product under accelerated stress
Comprises the following steps:
the first mean time between failure, MTBF, of the product under accelerated stress is:
b) Evaluation of product reliability under Normal stress
Probability of failure function of product under normal stress
Comprises the following steps:
wherein A is the acceleration factor of the product under the stress of the target accelerated test.
Second mean time between failures for product under normal stress
Comprises the following steps:
in the embodiment, a new product reliability test scheme is provided, the product reliability is tested by mixing the acceleration factor and the average fault interval time, namely, the average fault interval time, and the method has the advantages of simple form, simplicity and convenience in calculation, consideration of calculation amount and test result precision, and wider application range.
As shown in fig. 4, in one embodiment, step S204 includes: step S224, determining a time reduction factor of each product to be tested according to the accelerated degradation test data, converting the time reduction models in the time reduction model set into a nonlinear optimization equation based on the time reduction factor, evaluating model parameters of each time reduction model, determining each time reduction model, and screening out a target time reduction model from each time reduction model according to the time reduction factor of each product to be tested.
The time reduction factor (hereinafter referred to as the reduction factor) can describe the linear fitting degree of the product performance degradation along with the time. In this embodiment, the screening of the target time reduction model may be to determine a reduction factor of product performance degradation according to accelerated degradation test data. For example, assuming that the total number of products in the accelerated degradation test is m, n tests are performed, and the jth sex of the ith productCan degrade data as
，/>
，/>
A fold-over factor in the performance degradation of the i-th product>
Comprises the following steps:
in the formula (I), the compound is shown in the specification,
is->
The time corresponding to the instant is reduced by a value->
Is the ith product->
Average value of (d); />
Is the average value of the ith product y.
Thus, the solution of parameters a and b is converted into a constrained nonlinear optimization equation:
and solving the equation to obtain parameters a and b of the time reduction model, and further determining each time reduction model.
Taking model 5 in table 1 as an example, the nonlinear optimization equation is:
by solving this equation, parameters a and b of the model 5 are obtained, and the model 5 is determined.
After each time reduction model is determined in the above manner, each time reduction model can be checked according to the reduction factor, so that a target time reduction model can be screened out from each time reduction model. In this embodiment, based on the time reduction factor, the time reduction model can be determined quickly and easily, and an optimal target time reduction model can be selected from a plurality of time reduction models.
In one embodiment, screening the target time reduction model from each initial time reduction model according to the time reduction factor of each product to be tested comprises: and carrying out model inspection on each time reduced model according to the time reduced factor of each product to be inspected to obtain a model checking result, and screening out an initial time reduced model from each time reduced model according to the model checking result. And screening out a target time reduction model from each initial time reduction model according to the time reduction factor corresponding to the initial time reduction model.
In this embodiment, the model may be examined using a reduction factor. In specific implementation, the absolute value of the reduction factor corresponding to the model can be reduced at a certain time
If the model passes the test, the factor is reduced>
If it is satisfied with
If the model does not passAnd (6) checking. />
For the reduction factor check threshold, the calculation formula is as follows: />
In the formula (I), the compound is shown in the specification,
for a verified significance level>
Is significant level>
And a degree of freedom of->
T distribution function value of. By the method, the initial time reduction model can be screened out from each time reduction model. Then, a target time reduction model can be screened out from each initial time reduction model by adopting the reduction factor corresponding to each initial time reduction model. In particular, it can be the sum of the folding factors->
And determining the time reduced model with the maximum sum of the reduction factors as a target time reduced model for accelerating the performance degradation of the test according to the principle that the representation model is better. In the embodiment, the model is verified through the reduction factor, and is optimized through the reduction factor, so that the objectivity and rationality of the target time reduction model can be fully ensured, and the accuracy of the time reduction model is improved.
In order to make a clearer explanation on the accelerated degradation test data processing method based on the wiener process provided by the present application, the following description is made with reference to a specific embodiment:
the accelerated degradation test is carried out on 10 products of a certain type under the high-temperature stress of 80 ℃, and the accelerated degradation test data of the products are shown in a table 2.
TABLE 2 accelerated degradation test data
a) Time reduced model analysis
And carrying out parameter estimation, model verification and model selection on the time reduction model.
Taking model 5 as an example, firstly, parameter estimation is carried out, and the nonlinear optimization equation is solved:
obtaining model parameters a and b as 1.08 and 1.78 respectively, and then the time-reduced model is:
then, a model check is performed. The reduction factors for product performance degradation are shown in the table below, model 5 passing model verification. In the same way, model 1, model 2, model 3 and model 4 were analyzed and all models passed the verification.
TABLE 3 verification of time reduced model
And finally, carrying out model selection. Sum of reduction factors for each time reduced model
As shown in table 4 below. The sum of the reduction factors of the model 5 is the largest, so the model 5 is the time reduction model with the optimal product.
Thus, the time-reduced model for this product is:
b) Nonlinear wiener process analysis
The non-linear wiener process of the product is as follows:
the product reliability function of the product is:
solving by adopting a maximum likelihood function to obtain the non-linear wiener process parameters of the product
。
c) Reliability test
The mean time between failure MTBF of the product under accelerated stress is:
the acceleration factor of the product under high temperature acceleration stress of 80 ℃ is 9.6, so the mean time between failures of the product under normal stress
Comprises the following steps:
d) Analysis of results
The traditional non-linear wiener process is to analyze accelerated degradation test data by adopting a specific time reduction model (model 1), and the calculated mean time between failures is 33173h. The mean time between failures for actual use of the product is 35021h. The errors of the evaluation result obtained by the method and the evaluation result obtained by the traditional method are respectively 2.77% and 5.28%, so that the accelerated degradation test data processing method based on the wiener process has higher precision.
TABLE 4 selection of time reduction model
It should be understood that, although the steps in the flowcharts related to the embodiments as described above are sequentially displayed as indicated by arrows, the steps are not necessarily performed sequentially as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least a part of the steps in the flowcharts related to the embodiments described above may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, and the execution order of the steps or stages is not necessarily sequential, but may be rotated or alternated with other steps or at least a part of the steps or stages in other steps.
Based on the same inventive concept, the embodiment of the application also provides a device for processing accelerated degradation test data based on the wiener process, which is used for realizing the method for processing the accelerated degradation test data based on the wiener process. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the method, so that specific limitations in one or more embodiments of the accelerated degradation test data processing device based on the wiener process provided below can be referred to the limitations on the accelerated degradation test data processing method based on the wiener process, and details are not repeated here.
In one embodiment, as shown in fig. 5, there is provided an accelerated degradation test data processing apparatus based on a wiener process, including: a data obtaining module 510, a time reduction model screening module 520, a product reliability function determining module 530 and a product reliability testing module 540, wherein:
and the data acquisition module 510 is configured to acquire accelerated degradation test data of the product to be tested.
And a time reduction model screening module 520, configured to screen a target time reduction model from a preset time reduction model set according to the accelerated degradation test data.
A product reliability function determining module 530, configured to construct a non-linear wiener process based on the target time reduced model, and determine a product reliability function of the product to be tested.
The product reliability testing module 540 is configured to test the reliability of the product to be tested according to the product reliability function, so as to obtain a product reliability testing result of the product to be tested.
The accelerated degradation test data processing device based on the wiener process obtains accelerated degradation test data of a product to be tested, screens out a target time reduced model from a preset time reduced model set according to the accelerated degradation test data, then constructs a nonlinear wiener process based on the target time reduced model, determines a product reliability function of the product to be tested, and finally tests the reliability of the product to be tested according to the product reliability function to obtain a product reliability test result of the product to be tested. According to the scheme, on the first aspect, the performance degradation time possibly obeys other time reduction models, namely model optimization is expanded in the time reduction model set, and a target time reduction model is screened out, so that effective support can be provided for accurate test result product reliability; in the second aspect, a nonlinear wiener process is constructed based on the screened target time reduced model, and the nonlinearity of performance degradation is considered, so that the method is more comprehensive; and in the third aspect, a product reliability function is determined based on a nonlinear wiener process, and the reliability of the product to be tested can be accurately tested by utilizing the product reliability function. In conclusion, the adoption of the scheme can realize accurate product reliability test.
In one embodiment, the product reliability function determining module 530 is further configured to construct an initial non-linear wiener process based on the target time reduced model, construct an initial product reliability function based on the initial non-linear wiener process, evaluate non-linear wiener process parameters in the initial product reliability function, and determine a product reliability function of the product to be tested.
In one embodiment, the product reliability function determining module 530 is further configured to obtain a failure probability density function of the product to be tested according to the initial product reliability function, determine a non-linear wiener process parameter in the initial product reliability function according to a pre-constructed maximum likelihood function of performance degradation, the product reliability function, and the failure probability density function, and determine the product reliability function of the product to be tested.
In one embodiment, the product reliability testing module 540 is further configured to test the reliability of the product to be tested under each set of accelerated degradation test stress according to a product reliability function to obtain a first average fault interval time of the product to be tested, and obtain a second average fault interval time of the product to be tested under normal stress according to the first average fault interval time and an acceleration factor corresponding to a target accelerated degradation test stress.
In one embodiment, the time-reduced model screening module 520 is further configured to determine a time-reduced factor of each product to be tested according to the accelerated degradation test data, convert the time-reduced models in the time-reduced model set into a nonlinear optimization equation based on the time-reduced factor, evaluate model parameters of each time-reduced model, determine each time-reduced model, and screen out a target time-reduced model from each time-reduced model according to the time-reduced factor of each product to be tested.
In one embodiment, the time-reduced model filtering module 520 is further configured to perform model checking on each time-reduced model according to the time-reduced factor of each product to be tested to obtain a model checking result, filter out an initial time-reduced model from each time-reduced model according to the model checking result, and filter out a target time-reduced model from each initial time-reduced model according to the time-reduced factor corresponding to the initial time-reduced model.
The various modules in the accelerated degradation test data processing device based on the wiener process can be wholly or partially realized by software, hardware and a combination thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
In one embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be as shown in fig. 6. The computer device includes a processor, a memory, an Input/Output interface (I/O for short), and a communication interface. The processor, the memory and the input/output interface are connected through a system bus, and the communication interface is connected to the system bus through the input/output interface. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The database of the computer equipment is used for storing data such as accelerated degradation test data and product reliability test results. The input/output interface of the computer device is used for exchanging information between the processor and an external device. The communication interface of the computer device is used for communicating with an external device through a network connection. The computer program is executed by a processor to implement a method for accelerated degradation testing data processing based on a wiener process.
It will be appreciated by those skilled in the art that the configuration shown in fig. 6 is a block diagram of only a portion of the configuration associated with the present application, and is not intended to limit the computing device to which the present application may be applied, and that a particular computing device may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is provided, which includes a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the accelerated degradation test data processing method based on wiener process when executing the computer program.
In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored, which when executed by a processor implements the steps in the accelerated degradation test data processing method based on the wiener process.
In one embodiment, a computer program product is provided, which comprises a computer program that, when being executed by a processor, implements the steps of the accelerated degradation testing data processing method based on wiener process.
It should be noted that, the user information (including but not limited to user equipment information, user personal information, etc.) and data (including but not limited to data for analysis, stored data, displayed data, etc.) referred to in the present application are information and data authorized by the user or sufficiently authorized by each party, and the collection, use and processing of the related data need to comply with the relevant laws and regulations and standards of the relevant country and region.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, database, or other medium used in the embodiments provided herein may include at least one of non-volatile and volatile memory. The nonvolatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical Memory, high-density embedded nonvolatile Memory, resistive Random Access Memory (ReRAM), magnetic Random Access Memory (MRAM), ferroelectric Random Access Memory (FRAM), phase Change Memory (PCM), graphene Memory, and the like. Volatile Memory can include Random Access Memory (RAM), external cache Memory, and the like. By way of illustration and not limitation, the RAM may take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases referred to in various embodiments provided herein may include at least one of relational and non-relational databases. The non-relational database may include, but is not limited to, a block chain based distributed database, and the like. The processors referred to in the embodiments provided herein may be general purpose processors, central processing units, graphics processors, digital signal processors, programmable logic devices, quantum computing based data processing logic devices, etc., without limitation.
All possible combinations of the technical features in the above embodiments may not be described for the sake of brevity, but should be considered as being within the scope of the present disclosure as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present application. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.
Claims (10)
1. A accelerated degradation test data processing method based on a wiener process is characterized by comprising the following steps:
acquiring accelerated degradation test data of a product to be tested, wherein the accelerated degradation test data comprises a plurality of groups of accelerated degradation test stresses;
screening a target time reduction model from a preset time reduction model set according to the accelerated degradation test data;
constructing a nonlinear wiener degradation process based on the target time reduced model, and determining a product reliability function of the product to be detected;
and testing the reliability of the product to be tested according to the product reliability function to obtain a product reliability test result of the product to be tested.
2. The method of claim 1, wherein the constructing a non-linear wiener degradation process based on the target time-reduced model, and the determining the product reliability function of the product under test comprises:
constructing an initial nonlinear wiener process based on the target time reduced model;
constructing an initial product reliability function based on the initial nonlinear wiener process;
and evaluating the non-linear wiener process parameters in the initial product reliability function, and determining the product reliability function of the product to be tested.
3. The method of claim 2, wherein said evaluating non-linear wiener process parameters in said initial product reliability function, and wherein determining a product reliability function for said product under test comprises:
obtaining a failure probability density function of the product to be detected according to the initial product reliability function;
and evaluating the nonlinear wiener process parameters in the initial product reliability function according to a pre-constructed maximum likelihood function of performance degradation, the product reliability function and the failure probability density function, and determining the product reliability function of the product to be tested.
4. The method of any one of claims 1 to 3, wherein the product reliability test results comprise a first average time between failures and a second average time between failures, and the accelerated degradation test data comprises a plurality of sets of accelerated degradation test stresses;
the step of testing the reliability of the product to be tested according to the product reliability function to obtain a product reliability test result of the product to be tested comprises the following steps:
testing the reliability of the product to be tested under each group of accelerated degradation test stress according to the product reliability function to obtain a first average fault interval time of the product to be tested;
and obtaining a second average fault interval time of the product to be tested under normal stress according to the first average fault interval time and an acceleration factor corresponding to the target accelerated degradation test stress.
5. The method according to any one of claims 1 to 3, wherein the step of screening a target time-reduced model from a set of predetermined time-reduced models according to the accelerated degradation test data comprises:
determining a time reduction factor of each product to be tested according to the accelerated degradation test data;
converting the time reduction models in the time reduction model set into nonlinear optimization equations based on the time reduction factors, evaluating model parameters of each time reduction model, and determining each time reduction model;
and screening out a target time reduction model from each time reduction model according to the time reduction factor of each product to be tested.
6. The method of claim 5, wherein the screening out a target time-reduced model from each of the time-reduced models according to the time-reduced factor of each of the products under test comprises:
performing model inspection on each time reduction model according to the time reduction factor of each product to be tested to obtain a model inspection result;
screening an initial time reduction model from each time reduction model according to a model test result;
and screening out a target time reduction model from each initial time reduction model according to the time reduction factor corresponding to the initial time reduction model.
7. An accelerated degradation test data processing apparatus based on wiener process, the apparatus comprising:
the data acquisition module is used for acquiring accelerated degradation test data of a product to be tested, and the accelerated degradation test data comprises multiple groups of accelerated degradation test stress;
the time reduction model screening module is used for screening a target time reduction model from a preset time reduction model set according to the accelerated degradation test data;
the product reliability function determining module is used for constructing a nonlinear wiener process based on the target time reduced model and determining a product reliability function of the product to be detected;
and the product reliability testing module is used for testing the reliability of the product to be tested according to the product reliability function to obtain a product reliability testing result of the product to be tested.
8. The apparatus of claim 7, wherein the product reliability function determining module is configured to construct an initial non-linear wiener process based on the target time reduced model, construct an initial product reliability function based on the initial non-linear wiener process, evaluate non-linear wiener process parameters in the initial product reliability function, and determine the product reliability function of the product under test.
9. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor, when executing the computer program, implements the steps of the method of any of claims 1 to 6.
10. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the method according to any one of claims 1 to 6.
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