CN110531735B - Reliability index assessment method for instrument electric control system - Google Patents
Reliability index assessment method for instrument electric control system Download PDFInfo
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- CN110531735B CN110531735B CN201910727363.8A CN201910727363A CN110531735B CN 110531735 B CN110531735 B CN 110531735B CN 201910727363 A CN201910727363 A CN 201910727363A CN 110531735 B CN110531735 B CN 110531735B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0256—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults injecting test signals and analyzing monitored process response, e.g. injecting the test signal while interrupting the normal operation of the monitored system; superimposing the test signal onto a control signal during normal operation of the monitored system
Abstract
The invention discloses a reliability index assessment method of an instrument electric control system, wherein the method comprises the following steps: under the normal temperature environment, carrying out field test on an electronic complete machine belonging to the electronic control system, and recording performance parameters after the field test; determining an acceleration factor of the electronic complete machine; calculating the time length of the electronic complete machine for carrying out laboratory tests according to the acceleration factor and the field test time length of the electronic complete machine; carrying out laboratory tests on the electronic complete machine under the stress of a high-temperature environment, and recording performance parameters after the laboratory tests; analyzing the performance parameters of the electronic complete machine after field test and the performance parameters after laboratory test, and calculating the test fault number and the fault category of the electronic complete machine; and determining the reliability of the electric control system according to the test fault number and the fault category of the whole electronic machine. By the aid of the method, test period can be shortened, product faults can be accurately detected, research and development personnel can better improve an electric control system of the product, and product quality is improved.
Description
Technical Field
The invention relates to the technical field of reliability tests, in particular to a reliability index assessment method for an instrument electric control system.
Background
Along with the increasing market competition, in the field of civil household appliances, more and more products with high reliability and long service life are available. If the conventional reliability and service life test method is adopted to evaluate the reliability and service life characteristics of the product, the time cost which is difficult to bear is consumed, and even the test is not completed, the product is updated or eliminated because the performance is lagged. Obviously, such a long testing time not only misses the best timing for improving the reliability of the product, but also seriously affects the progress of research and development, and is unacceptable in engineering practice. Therefore, it is necessary and important to evaluate the reliability, lifetime, and other indicators by using the accelerated lifetime test method.
Disclosure of Invention
The invention provides a reliability index assessment method of an instrument electric control system, which can shorten the test period, can accurately detect the faults of products, is beneficial to better improve the electric control system of the products by research personnel and improves the product quality.
According to one aspect of the invention, the invention provides a reliability index assessment method for an instrument electric control system, which comprises the following steps:
under the normal temperature environment, carrying out field test on the electronic complete machine belonging to the electronic control system, and recording the performance parameters of the electronic complete machine after the field test;
determining an acceleration factor of the electronic complete machine;
calculating the time length of the electronic complete machine for carrying out a laboratory test according to the acceleration factor and the field test time length of the electronic complete machine;
carrying out a laboratory test on the electronic complete machine under the stress of a high-temperature environment, and recording the performance parameters of the electronic complete machine after the laboratory test;
analyzing the performance parameters of the electronic complete machine after field test and the performance parameters after laboratory test, and calculating the test fault number and the fault category of the electronic complete machine;
and determining the reliability of the electric control system according to the test fault number and the fault category of the whole electronic machine.
Preferably, before performing a field test on the electronic complete machine belonging to the electronic control system in a normal temperature environment and recording performance parameters of the electronic complete machine after the field test, the method further includes the following steps:
checking the appearance of an electronic complete machine to which the electronic control system belongs and testing the technical state of the electronic complete machine; judging whether the electronic complete machine is a qualified product;
and if so, performing field test on the electronic complete machine to which the electronic control system belongs in a normal-temperature environment, and recording the performance parameters of the electronic complete machine after the field test.
Preferably, determining an acceleration factor of the electronic complete machine includes the following steps:
classifying a plurality of electronic components contained in the electronic complete machine and counting the number of the electronic components;
respectively searching basic failure rate and activation energy data of various electronic components;
establishing a working reliability model and an accelerated life test model of the electronic complete machine;
under the working test condition, calculating the total failure rate of various electronic components according to the number and the basic failure rate of various electronic components;
calculating the failure rate of the electronic complete machine according to the working reliability model of the electronic complete machine;
according to the accelerated life test model of the electronic complete machine, under the accelerated working test condition, calculating the total failure rate of various electronic components according to the number of various electronic components and the activation energy data;
calculating the failure rate of the electronic complete machine according to the working reliability model of the electronic complete machine;
and calculating an acceleration factor of the electronic complete machine according to the failure rates of the electronic complete machine under the working test condition and the accelerated working test condition respectively.
Preferably, the method for calculating the laboratory test duration of the electronic complete machine according to the acceleration factor and the field test duration of the electronic complete machine comprises the following steps:
determining that the ratio of the field test duration of the electronic complete machine to the laboratory equivalent field test duration is 2: 3;
multiplying the field test time length of the electronic complete machine by 1.5 times, and calculating the laboratory equivalent field test time length of the electronic complete machine;
and dividing the laboratory equivalent field test duration of the electronic complete machine by the acceleration factor to calculate the laboratory test duration of the electronic complete machine.
Preferably, the electronic complete machine is a double-frequency all-digital high-frequency ocean detector.
Preferably, the sum of the field test duration of the electronic complete machine and the laboratory equivalent field test duration is more than or equal to 12040 hours.
Preferably, the fault categories include associated faults and non-associated faults, and the associated faults include responsible faults and non-responsible faults.
Preferably, the reliability of the electronic control system is determined according to the test fault number and the fault category of the electronic whole machine, and the method comprises the following steps:
judging whether the number of responsibility faults of the whole electronic machine is larger than or equal to 1;
if so, determining that the electronic complete machine is an unqualified product, and the reliability of the electronic control system is 0;
if not, the electronic complete machine is determined to be a qualified product, and the reliability of the electronic control system is 1.
Compared with the prior art, the invention has the following beneficial effects:
by the aid of the method, the sample machine is tested in a normal-temperature environment and an accelerated stress environment respectively, various performance parameters of the sample machine are detected more comprehensively, the test duration is greatly shortened by applying accelerated stress, faults of the sample machine can be accurately detected in the test process and after the test, research personnel can improve an electric control system of a product better, and the product quality is improved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the invention without limiting the invention. In the drawings:
FIG. 1 is a flowchart of a reliability index assessment method for an instrument electronic control system according to an embodiment of the invention;
FIG. 2 is a flowchart of another method for assessing reliability indexes of an electronic control system of an instrument according to a first embodiment of the present invention;
fig. 3 is a flowchart of calculating an acceleration factor according to a first embodiment of the present invention.
Detailed Description
The technical solution of the present invention will be described below with reference to the accompanying drawings, but the described embodiments are only a part of the embodiments of the present invention, and all other embodiments obtained by those skilled in the art without any inventive work belong to the scope of the present invention.
The embodiment of the invention provides a reliability index assessment method for an instrument electric control system, and FIG. 1 is a flow chart of the reliability index assessment method for the instrument electric control system according to the embodiment of the invention, and as shown in FIG. 1, the method comprises the following steps:
step S101: under the normal temperature environment, carrying out field test on the electronic complete machine belonging to the electronic control system, and recording the performance parameters of the electronic complete machine after the field test;
step S102: determining an acceleration factor of the electronic complete machine;
step S103: calculating the time length of the electronic complete machine for carrying out laboratory tests according to the acceleration factor and the field test time length of the electronic complete machine;
step S104: carrying out laboratory tests on the electronic complete machine under the stress of a high-temperature environment, and recording the performance parameters of the electronic complete machine after the laboratory tests;
step S105: analyzing the performance parameters of the electronic complete machine after field test and the performance parameters after laboratory test, and calculating the test fault number and the fault category of the electronic complete machine;
step S106: and determining the reliability of the electric control system according to the test fault number and the fault category of the whole electronic machine.
In the implementation process, before step S101, the appearance of the electronic complete machine to which the electronic control system belongs needs to be checked and the technical state of the electronic complete machine needs to be tested; judging whether the electronic complete machine is a qualified product; if so, performing field test on the electronic complete machine belonging to the electronic control system in the normal temperature environment, and recording the performance parameters of the electronic complete machine after the field test.
In step S102, classifying a plurality of electronic components included in the electronic complete machine and counting the number of the electronic components; respectively searching basic failure rate and activation energy data of various electronic components; establishing a work reliability model and an accelerated life test model of the electronic complete machine; under the working test condition, calculating the total failure rate of various electronic components according to the number and the basic failure rate of various electronic components; calculating the failure rate of the electronic complete machine according to the work reliability model of the electronic complete machine; according to an accelerated life test model of the electronic complete machine, under an accelerated working test condition, calculating the total failure rate of various electronic components according to the number of the various electronic components and the activation energy data; calculating the failure rate of the electronic complete machine according to the work reliability model of the electronic complete machine; and calculating the acceleration factor of the electronic complete machine according to the failure rate of the electronic complete machine under the working test condition and the accelerated working test condition respectively.
In step S103, determining that the ratio of the field test duration of the electronic complete machine to the laboratory equivalent field test duration is 2: 3; multiplying the field test time length of the electronic complete machine by 1.5 times, and calculating the laboratory equivalent field test time length of the electronic complete machine; and dividing the laboratory equivalent field test duration of the electronic complete machine by the acceleration factor to calculate the laboratory test duration of the electronic complete machine.
Furthermore, the electronic complete machine is a double-frequency all-digital high-frequency ocean detector. The sum of the field test duration of the electronic complete machine and the laboratory equivalent field test duration is more than or equal to 12040 hours. The fault categories include associated faults and non-associated faults, and the associated faults include responsible faults and non-responsible faults.
In step S106, first, it is determined whether the number of responsibility faults of the electronic whole machine is greater than or equal to 1; if so, determining that the electronic complete machine is an unqualified product, and the reliability of the electronic control system is 0; if not, the electronic complete machine is determined to be a qualified product, and the reliability of the electronic control system is 1.
Through the steps, the test period can be shortened, the faults of the product can be accurately detected, the improvement of an electric control system of the product by research personnel is facilitated, and the product quality is improved.
In order to make the technical solution and implementation method of the present invention clearer, the following describes the implementation process in detail with reference to the preferred embodiments.
Example one
The embodiment provides another method for assessing the reliability index of an instrument electronic control system, as shown in fig. 2, fig. 2 is a flowchart of another method for assessing the reliability index of an instrument electronic control system according to the first embodiment of the present invention, and the method includes the following steps:
step S201: checking the appearance of an electronic complete machine to which the electronic control system belongs and testing the technical state of the electronic complete machine; judging whether the electronic complete machine is a qualified product; if yes, executing step S202 to step S209; if not, ending the process;
in the embodiment of the invention, the electronic complete machine can be a double-frequency all-digital high-frequency ocean detector which mainly comprises a receiver, a transmitter, a receiving antenna and a transmitting antenna; the sum of the field test duration of the electronic complete machine and the laboratory equivalent field test duration is more than or equal to 12040 hours, specifically, according to the actual situation of a test field, the field test duration of the electronic complete machine and the laboratory equivalent field test duration can be correspondingly adjusted, in the embodiment of the invention, the field test duration of the electronic complete machine is 4800 hours, the field test duration accounts for 40 percent of the total assessment time, the laboratory equivalent field test duration accounts for 60 percent of the total assessment time, and the laboratory equivalent field test duration of the electronic complete machine is 7240 hours;
as an optional implementation manner, before performing a reliability test on the electronic complete machine, a performance test before the test needs to be performed, specifically including 1) checking the appearance of the electronic complete machine, and requiring that the surface of the electronic complete machine has no flaw which affects the quality; the structure is not damaged, and the appearance is not deformed; 2) and (4) starting detection, wherein the starting is required to be normal: the display and reading of each instrument are normal; 3) the state of the receiver requires that the fault indicator lamp is not lighted when the visual inspection transmitter is normal; 4) the transmitter state requires that when the indicator light of the transmitter is normally observed by eye, the red light and the yellow light are not in a bright state, and the green light is required to flicker; 5) the forward power value of the transmitter is more than or equal to 200W normal and less than 200W abnormal; 6) the antenna state is that the antenna is not inclined or toppled by visual observation, and the pull rope is not loosened or broken; 7) flow rate check, 13M flow rate value, range: (0-3) m/s; 8) wave height check, 13M wave height value, range: (0-10) m; 9) wind speed check, 13M wind speed value, range: (0-75) m/s;
step S202: under the normal temperature environment, carrying out field test on the electronic complete machine belonging to the electronic control system, and recording the performance parameters of the electronic complete machine after the field test;
in the embodiment of the invention, the in-test detection of the electronic complete machine is required in the process of carrying out the field test on the electronic complete machine, and the in-test detection method specifically comprises the following test items: 1) the state of the receiver, namely the state that the fault indicator lamp is not lighted when the visual inspection transmitter is normal; 2) the state of the transmitter, namely, when the indicator light of the transmitter is normal by visual inspection, the red light and the yellow light are not in a bright state, and the green light is required to flicker; 3) the forward power value of the transmitter is more than or equal to 200W normal and less than 200W abnormal; 4) the antenna state is that the antenna is not inclined or toppled by visual observation, and the pull rope is not loosened or broken; 5) flow check, 13M flow value, range: (0-3) m/s; 6) wave height check, 13M wave height value, range: (0-10) m; 7) wind speed check, 13M wind speed value, range: (0-75) m/s;
step S203: determining an acceleration factor of the electronic complete machine;
as an alternative embodiment, a specific implementation of the step S203 is shown in fig. 3, and includes the following steps:
301. classifying a plurality of electronic components contained in the electronic complete machine and counting the number of the electronic components;
302. respectively searching basic failure rate and activation energy data of various electronic components;
303. establishing a work reliability model and an accelerated life test model of the electronic complete machine;
304. under the working test condition, calculating the total failure rate of various electronic components according to the number and the basic failure rate of various electronic components;
305. calculating the failure rate of the electronic complete machine according to the work reliability model of the electronic complete machine;
306. according to an accelerated life test model of the electronic complete machine, under an accelerated working test condition, calculating the total failure rate of various electronic components according to the number of the various electronic components and the activation energy data;
the specific implementation manner of the steps is as follows: according to an accelerated life test model of the electronic complete machine, under an accelerated working test condition, firstly, according to the activation energy data of various electronic components, calculating the total failure rate of the various electronic components under the accelerated working test condition; then, calculating the total failure rate of the various electronic components under the accelerated working test condition according to the quantity of the various electronic components and the failure rates of the various electronic components under the accelerated working test condition;
307. calculating the failure rate of the electronic complete machine according to the work reliability model of the electronic complete machine;
308. calculating an acceleration factor of the electronic complete machine according to the failure rates of the electronic complete machine under the working test condition and the accelerated working test condition respectively;
step S204: determining that the ratio of the field test duration of the electronic complete machine to the laboratory equivalent field test duration is 2: 3;
step S205: multiplying the field test time length of the electronic complete machine by 1.5 times, and calculating the laboratory equivalent field test time length of the electronic complete machine;
in the embodiment of the invention, the field test time of the electronic complete machine is 4800 hours, and the laboratory equivalent field test time of the electronic complete machine is calculated to be about 7240 hours according to the calculation formula of the step S205;
step S206: dividing the laboratory equivalent field test duration of the electronic complete machine by an acceleration factor to calculate the laboratory test duration of the electronic complete machine;
in the embodiment of the present invention, the acceleration factor calculation is equal to 5.7, and the laboratory actual test duration of the electronic complete machine can be calculated according to the calculation formula of step S206 to be about 1270.2 hours, and the laboratory actual test duration of the electronic complete machine cannot be less than 1270.2 hours;
step S207: carrying out laboratory tests on the electronic complete machine under the stress of a high-temperature environment, and recording the performance parameters of the electronic complete machine after the laboratory tests;
step S208: analyzing the performance parameters of the electronic complete machine after field test and the performance parameters after laboratory test, and calculating the test fault number and the fault category of the electronic complete machine;
in the embodiment of the invention, the basis for judging the failure of the electronic complete machine is as follows: (1) under defined conditions, one or more functions are lost; (2) under specified conditions, one or more performance indicators are outside the allowable range; (3) under the specified conditions, the damage, fracture or damage state of mechanical parts, structural parts or components affecting the function, performance and structural integrity of the examination prototype appears; the fault categories comprise associated faults and non-associated faults, and the associated faults comprise responsible faults and non-responsible faults;
the responsibility faults are the basis for judging whether the test of the electronic complete machine passes or not, and the responsibility faults comprise (1) faults caused by design, process, elements and the like; (2) faults caused by improper design, manufacture and selection of parts and components; (3) faults caused by software errors; (4) malfunctions caused by improper operation, maintenance and repair procedures provided by the unit under test; (5) unproven faults (meaning faults that cannot be reproduced or whose cause has not been ascertained);
the above non-responsible faults include: (1) slave failures caused by independent failures; (2) failures that recur without repair; (3) the faults of the examination prototype caused by the test equipment and the test instrument; (4) malfunctions caused by improper operation, maintenance, and repair; (5) failure due to application of a test stress that does not meet the test specifications;
the fault number in the embodiment of the invention only comprises the associated responsibility fault number, and the associated responsibility fault is counted according to the following principle: (1) intermittent faults that can be verified to be due to the same cause are counted as one fault only; (2) when it can be verified that a plurality of failure phenomena are caused by the same cause, it can be counted as a failure; (3) when a plurality of components fail simultaneously in the test process, when the failure of one component can not be proved to cause the failure of other components, the failure of each component is counted as an independent failure; if it can be proved that one component fails to cause the failure of other components, all the components are summed to be a failure; (4) when the reported independent faults caused by the same reason occur at the same part again because the faults cannot be truly eliminated, the reported faults and the originally reported faults are added up to be one fault, and the test time is invalid; (5) if the accurate moment of the fault occurrence cannot be determined, the statistics of the effective test time traces back to the time of the last detection point, namely the test time from the last detection point to the detection point where the fault is found is invalid; (6) if faults occur in the normal-temperature function inspection and the performance test after the test, the judgment, the statistics and the like of the faults are processed in the same way as the faults occurring in the test; (7) during fault detection and repair, if other faults of the tested product are found and cannot be determined to be caused by the original faults, the tested product is regarded as an independent responsibility fault to be counted; (8) in field examination, for slight defects of parts, if the specified functions are not lost, in-situ repair (disassembly is not caused) events such as looseness, drift, noise, leakage and the like can be carried out through daily inspection according to maintenance rules, and after confirmation, related responsibility faults are not counted;
step S209: judging whether the number of responsibility faults of the electronic complete machine is more than or equal to 1; if yes, go to step S210; if not, go to step S211;
step S210: determining that the electronic complete machine is an unqualified product, and the reliability of the electronic control system is 0;
step S211: and determining that the electronic complete machine is a qualified product, wherein the reliability of the electronic control system is 1.
In conclusion, by the embodiment, the tested sample machine is tested in the normal temperature environment and the accelerated stress environment respectively, various performance parameters of the tested sample machine are detected more comprehensively, the test duration is greatly shortened by applying the accelerated stress, the faults of the tested sample machine can be accurately detected in the test process and after the test, the improvement of an electric control system of a product by research and development personnel is facilitated, and the product quality is improved.
Claims (6)
1. A reliability index assessment method of an instrument electric control system is characterized by comprising the following steps:
under the normal temperature environment, carrying out field test on the electronic complete machine belonging to the electronic control system, and recording the performance parameters of the electronic complete machine after the field test;
determining an acceleration factor of the electronic whole machine, which comprises the following steps:
classifying a plurality of electronic components contained in the electronic complete machine and counting the number of the electronic components;
respectively searching basic failure rate and activation energy data of various electronic components;
establishing a working reliability model and an accelerated life test model of the electronic complete machine;
under the working test condition, calculating the total failure rate of various electronic components according to the number and the basic failure rate of various electronic components;
calculating the failure rate of the electronic complete machine according to the working reliability model of the electronic complete machine;
according to the accelerated life test model of the electronic complete machine, under the accelerated working test condition, calculating the total failure rate of various electronic components according to the number of various electronic components and the activation energy data;
calculating the failure rate of the electronic complete machine according to the working reliability model of the electronic complete machine;
calculating an acceleration factor of the electronic complete machine according to the failure rates of the electronic complete machine under a working test condition and an accelerated working test condition respectively;
according to the acceleration factor and the field test duration of the electronic complete machine, the duration of the electronic complete machine for carrying out a laboratory test is calculated, and the method comprises the following steps:
determining that the ratio of the field test duration of the electronic complete machine to the laboratory equivalent field test duration is 2: 3;
multiplying the field test time length of the electronic complete machine by 1.5 times, and calculating the laboratory equivalent field test time length of the electronic complete machine;
dividing the laboratory equivalent field test duration of the electronic complete machine by the acceleration factor to calculate the laboratory test duration of the electronic complete machine;
carrying out a laboratory test on the electronic complete machine under the stress of a high-temperature environment, and recording the performance parameters of the electronic complete machine after the laboratory test;
analyzing the performance parameters of the electronic complete machine after field test and the performance parameters after laboratory test, and calculating the test fault number and the fault category of the electronic complete machine;
and determining the reliability of the electric control system according to the test fault number and the fault category of the whole electronic machine.
2. The method of claim 1, wherein before performing a field test on the electronic complete machine in a normal temperature environment and recording the performance parameters of the electronic complete machine after the field test, the method further comprises the following steps:
checking the appearance of an electronic complete machine to which the electronic control system belongs and testing the technical state of the electronic complete machine; judging whether the electronic complete machine is a qualified product;
and if so, performing field test on the electronic complete machine to which the electronic control system belongs in a normal-temperature environment, and recording the performance parameters of the electronic complete machine after the field test.
3. The method of claim 1, wherein the electronic ensemble is a dual-frequency all-digital high-frequency marine probe.
4. The method of claim 3, wherein the total of the field test duration of the electronic machine and the laboratory equivalent field test duration is 12040 hours or greater.
5. The method of claim 4, wherein the fault categories include associated faults and non-associated faults, and wherein the associated faults include responsible faults and non-responsible faults.
6. The method according to claim 5, wherein determining the reliability of the electronic control system according to the test fault number and the fault category of the electronic complete machine comprises the following steps:
judging whether the number of responsibility faults of the whole electronic machine is larger than or equal to 1;
if so, determining that the electronic complete machine is an unqualified product, and the reliability of the electronic control system is 0;
if not, the electronic complete machine is determined to be a qualified product, and the reliability of the electronic control system is 1.
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| CN111141977B (en) * | 2019-12-30 | 2022-08-02 | 中国航天标准化研究所 | Test time calculation method based on multi-stress accelerated life model |
| CN114442593B (en) * | 2022-01-21 | 2023-05-12 | 中国科学院苏州生物医学工程技术研究所 | High-temperature stress reliability strengthening test method for electric control system |
| CN114966294B (en) * | 2022-07-27 | 2022-10-25 | 北京智芯微电子科技有限公司 | Reliability test system of power equipment, control method, device and medium |
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