CN110531735A - A kind of Reliability Index Test method of instrument electric-control system - Google Patents
A kind of Reliability Index Test method of instrument electric-control system Download PDFInfo
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- CN110531735A CN110531735A CN201910727363.8A CN201910727363A CN110531735A CN 110531735 A CN110531735 A CN 110531735A CN 201910727363 A CN201910727363 A CN 201910727363A CN 110531735 A CN110531735 A CN 110531735A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0256—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults injecting test signals and analyzing monitored process response, e.g. injecting the test signal while interrupting the normal operation of the monitored system; superimposing the test signal onto a control signal during normal operation of the monitored system
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Abstract
The invention discloses a kind of Reliability Index Test methods of instrument electric-control system, wherein this method comprises: carrying out field test to the affiliated complete electronic set of electric-control system, and record the performance parameter after field test under normal temperature environment；Determine the accelerated factor of complete electronic set；According to the field test duration of accelerated factor and complete electronic set, the duration that complete electronic set carries out laboratory test is calculated；Under hot environment stress, laboratory test, and the performance parameter after recording laboratory test are carried out to complete electronic set；The performance parameter after performance parameter and laboratory test after analyzing complete electronic set field test, calculates the testing failure number and fault category of complete electronic set；According to the testing failure number and fault category of complete electronic set, the reliability of electric-control system is determined.Through the invention, the test period can not only be shortened, and can accurate detection have the failure of product, be conducive to research staff and preferably the electric-control system of product improved, improve product quality.
Description
Technical field
The present invention relates to reliability test technical field, in particular to a kind of Reliability Index Test of instrument electric-control system
Method.
Background technique
With the fierceness further of market competition, in civilian household appliances field, high reliability long life product is more and more.Such as
Fruit goes the reliability of assessment product, life characteristics using conventional reliability, life test method, generally requires consuming and is difficult to hold
The time cost received, or even also have little time to finish test, which has just updated or has been eliminated because performance is backward.
Obviously, so long test period, has not only missed the best opportunity of product reliability promotion, but also has severely impacted research and development
Progress, be difficult to receive in practice in engineering.Therefore, reliability, service life etc. are carried out using the method for accelerated life test
The assessment of index then just seems not only necessary but also important.
Summary of the invention
The present invention provides a kind of Reliability Index Test method of instrument electric-control system, can not only shorten the test period,
And can accurate detection have the failure of product, be conducive to research staff and preferably the electric-control system of product improved,
Improve product quality.
According to an aspect of the invention, there is provided a kind of Reliability Index Test method of instrument electric-control system, including
Following steps:
Under normal temperature environment, field test is carried out to the affiliated complete electronic set of the electric-control system, and it is whole to record the electronics
Performance parameter after machine field test；
Determine the accelerated factor of the complete electronic set；
According to the field test duration of the accelerated factor and the complete electronic set, calculates the complete electronic set and tested
The duration of room test；
Under hot environment stress, laboratory test is carried out to the complete electronic set, and records the complete electronic set experiment
Performance parameter after the test of room；
The performance parameter after performance parameter and laboratory test after analyzing the complete electronic set field test, described in calculating
The testing failure number and fault category of complete electronic set；
According to the testing failure number and fault category of the complete electronic set, the reliability of the electric-control system is determined.
Preferably, under normal temperature environment, field test is carried out to the affiliated complete electronic set of the electric-control system, and described in record
Before performance parameter after complete electronic set field test, this method is further comprising the steps of:
It checks the appearance of the affiliated complete electronic set of the electric-control system and tests the state of the art of the complete electronic set；Judge institute
State whether complete electronic set is qualified products；
If it is, executing under normal temperature environment, field test is carried out to the affiliated complete electronic set of the electric-control system, and remember
The step of performance parameter after recording the complete electronic set field test.
Preferably, the accelerated factor of the complete electronic set is determined, comprising the following steps:
Several electronic components that the complete electronic set includes classify and statistical magnitude；
The basic failure rate and activation energy data of all kinds of electronic components are searched respectively；
Establish the functional reliability model and accelerated life test model of the complete electronic set；
Under the conditions of performance test, according to the quantity and basic failure rate of all kinds of electronic components, each electron-like is calculated
Total crash rate of component；
According to the functional reliability model of the complete electronic set, the crash rate of the complete electronic set is calculated；
According to the accelerated life test model of the complete electronic set, under the conditions of accelerating performance test, according to each electron-like
The quantity and activation energy data of component, calculate total crash rate of all kinds of electronic components；
According to the functional reliability model of the complete electronic set, the crash rate of the complete electronic set is calculated；
According to complete electronic set crash rate under the conditions of performance test and under the conditions of accelerating performance test respectively, meter
Calculate the accelerated factor of the complete electronic set.
Preferably, according to the field test duration of the accelerated factor and the complete electronic set, the complete electronic set is calculated
Carry out the duration of laboratory test, comprising the following steps:
The ratio for determining the equivalent field test duration of field test duration and laboratory of the complete electronic set is 2:3；
By the field test duration of the complete electronic set multiplied by 1.5 times, the laboratory for calculating the complete electronic set is equivalent
Field test duration；
By the equivalent field test duration in the laboratory of the complete electronic set divided by the accelerated factor, the electronics is calculated
The laboratory test duration of complete machine.
Preferably, the complete electronic set is double frequency Full digital high-frequency bathometer.
Preferably, the sum of the field test duration of the complete electronic set and the equivalent field test duration in laboratory are more than or equal to
12040 hours.
Preferably, the fault category includes relevant fault and non-relevant fault, and the relevant fault includes chargeable fault
And non-chargeable fault.
Preferably, according to the testing failure number and fault category of the complete electronic set, determine the electric-control system can
By property, comprising the following steps:
Judge whether the quantity of the chargeable fault of the complete electronic set is more than or equal to 1；
If it is, determining that the complete electronic set is substandard product, the reliability of the electric-control system is 0；
If it is not, then determining that the complete electronic set is qualified products, the reliability of the electric-control system is 1.
Compared with prior art, beneficial effects of the present invention are as follows:
Through the invention, under normal temperature environment and tested model machine is tested under accelerated stress environment respectively, more entirely
The various performance parameters that detected tested model machine in face, while when greatly shortening test by the application of accelerated stress
It is long, during the test and after test can accurate detection have the failure of tested model machine, it is more preferable to be conducive to research staff
The electric-control system of product is improved, improve product quality.
Detailed description of the invention
The drawings described herein are used to provide a further understanding of the present invention, constitutes part of this application, this hair
Bright illustrative embodiments and their description are used to explain the present invention, and are not constituted improper limitations of the present invention.In attached drawing:
Fig. 1 is a kind of flow chart of the Reliability Index Test method of instrument electric-control system according to an embodiment of the present invention；
Fig. 2 is the process of the Reliability Index Test method of according to embodiments of the present invention one another instrument electric-control system
Figure；
Fig. 3 is the flow chart of according to embodiments of the present invention one calculating accelerated factor.
Specific embodiment
Below in conjunction with attached drawing of the present invention, technical solution of the present invention is described, but described embodiment is only
A part of the embodiment of the present invention, based on the embodiments of the present invention, those of ordinary skill in the art are not making creative labor
Every other embodiment obtained under the premise of dynamic, shall fall within the protection scope of the present invention.
The embodiment of the invention provides a kind of Reliability Index Test method of instrument electric-control system, Fig. 1 is according to this hair
The flow chart of the Reliability Index Test method of a kind of instrument electric-control system of bright embodiment, as shown in Figure 1, including following step
It is rapid:
Step S101: under normal temperature environment, field test is carried out to the affiliated complete electronic set of electric-control system, and it is whole to record electronics
Performance parameter after machine field test；
Step S102: the accelerated factor of complete electronic set is determined；
Step S103: it according to the field test duration of accelerated factor and complete electronic set, calculates complete electronic set and carries out laboratory
The duration of test；
Step S104: under hot environment stress, laboratory test is carried out to complete electronic set, and records complete electronic set experiment
Performance parameter after the test of room；
Step S105: the performance parameter after performance parameter and laboratory test after analysis complete electronic set field test, meter
Calculate the testing failure number and fault category of complete electronic set；
Step S106: according to the testing failure number and fault category of complete electronic set, the reliability of electric-control system is determined.
In implementation process, before step S101, need to check the appearance of the affiliated complete electronic set of electric-control system and test
The state of the art of complete electronic set；Judge whether complete electronic set is qualified products；If it is, executing under normal temperature environment, to electricity
The affiliated complete electronic set of control system carries out field test, and the step of recording the performance parameter after complete electronic set field test.
In step s 102, several electronic components that complete electronic set includes classify and statistical magnitude；Respectively
Search the basic failure rate and activation energy data of all kinds of electronic components；Establish functional reliability model and the acceleration of complete electronic set
Life test model；Under the conditions of performance test, according to the quantity and basic failure rate of all kinds of electronic components, calculate all kinds of
Total crash rate of electronic component；According to the functional reliability model of complete electronic set, the crash rate of complete electronic set is calculated；According to electricity
The accelerated life test model of sub- complete machine according to the quantity of all kinds of electronic components and swashs under the conditions of accelerating performance test
Energy data living, calculate total crash rate of all kinds of electronic components；According to the functional reliability model of complete electronic set, it is whole to calculate electronics
The crash rate of machine；According to complete electronic set crash rate under the conditions of performance test and under the conditions of accelerating performance test respectively, meter
Calculate the accelerated factor of complete electronic set.
In step s 103, the ratio of the equivalent field test duration of field test duration and laboratory of complete electronic set is determined
For 2:3；By the field test duration of complete electronic set multiplied by 1.5 times, when calculating the equivalent field test in laboratory of complete electronic set
It is long；By the equivalent field test duration in the laboratory of complete electronic set divided by accelerated factor, the laboratory test of complete electronic set is calculated
Duration.
Further, complete electronic set is double frequency Full digital high-frequency bathometer.The field test duration of complete electronic set with
The sum of equivalent field test duration in laboratory is more than or equal to 12040 hours.Fault category includes relevant fault and non-relevant fault,
Relevant fault includes chargeable fault and non-chargeable fault.
In step s 106, first determine whether the quantity of the chargeable fault of complete electronic set is more than or equal to 1；If it is,
Determine that complete electronic set is substandard product, the reliability of electric-control system is 0；If it is not, then determine that complete electronic set is qualified products,
The reliability of electric-control system is 1.
Through the above steps, the test period can not only be shortened, and can accurate detection have the failure of product, favorably
Preferably the electric-control system of product is improved in research staff, improves product quality.
In order to keep technical solution of the present invention and implementation method clearer, below in conjunction with preferred embodiment in fact
Existing process is described in detail.
Embodiment one
The present embodiment provides the Reliability Index Test methods of another instrument electric-control system, as shown in Fig. 2, Fig. 2 is root
According to the flow chart of the Reliability Index Test method of another instrument electric-control system of the embodiment of the present invention one, including following step
It is rapid:
Step S201: checking the appearance of the affiliated complete electronic set of electric-control system and tests the state of the art of complete electronic set；Judgement
Whether complete electronic set is qualified products；If so, thening follow the steps S202~step S209；If it is not, then terminating this process；
In the embodiment of the present invention, above-mentioned complete electronic set can be double frequency Full digital high-frequency bathometer, and double frequency is digital
High frequency bathometer is mainly made of receiver, transmitter, receiving antenna, four part of transmitting antenna；The scene of complete electronic set
It tests the sum of duration and the equivalent field test duration in laboratory to be more than or equal to 12040 hours, specifically, according to the reality of testing ground
Border situation, can the equivalent field test duration of field test duration and laboratory to complete electronic set do corresponding adjustment, this hair
In bright embodiment, when field test of complete electronic set, is 4800 hours a length of, and field test duration Zhan always examines the 40% of the time, real
It tests the equivalent field test duration Zhan in room and always examines the 60% of the time, a length of 7240 when the equivalent field test in the laboratory of complete electronic set
Hour；
As an alternative embodiment, the property before needing to carry out test before carrying out reliability test to complete electronic set
It can test, specifically include the appearance for 1) checking complete electronic set, it is desirable that the surface of complete electronic set is without the scar for influencing quality；Structure without
Damage, appearance is without deformation；2) booting detection, it is desirable that booting is normal: each instrument shows and reads normally；3) receiver state is wanted
Malfunction indicator lamp should be without lighting state when asking range estimation transmitter normal；4) transmitter state, it is desirable that range estimation transmitter indicator light is just
Red light and amber light should should be flashed without the state that lights, green light when often；5) transmitter forward power value, >=200W is normal, and < 200W is different
Often；6) antenna condition, estimate antenna without deflection, topple over, drawstring non-loosening, fracture etc. abnormal conditions；7) flow velocity inspection, when 13M
Flow speed value, range: (0-3) m/s；8) wave is high checks, wave high level when 13M, range: (0-10) m；9) wind speed inspection, wind when 13M
Speed value, range: (0-75) m/s；
Step S202: under normal temperature environment, field test is carried out to the affiliated complete electronic set of electric-control system, and it is whole to record electronics
Performance parameter after machine field test；
In the embodiment of the present invention, need to test complete electronic set during carrying out field test to complete electronic set
Middle detection, specifically includes following test item: 1) receiver state, and malfunction indicator lamp should be without lighting shape when range estimation transmitter is normal
State；2) transmitter state, red light and amber light should should be flashed without the state that lights, green light when range estimation transmitter indicator light is normal；3) it sends out
Machine forward power value is penetrated, >=200W is normal, and < 200W is abnormal；4) antenna condition, estimate antenna without deflection, topple over, drawstring is without pine
It is dynamic, the abnormal conditions such as fracture；5) flow velocity inspection, flow speed value when 13M, range: (0-3) m/s；6) wave is high checks, wave is high when 13M
Value, range: (0-10) m；7) wind speed inspection, air speed value when 13M, range: (0-75) m/s；
Step S203: the accelerated factor of complete electronic set is determined；
As an alternative embodiment, the specific embodiment of above-mentioned steps S203 is as shown in figure 3, include following step
It is rapid:
301, several electronic components that complete electronic set includes classify and statistical magnitude；
302, the basic failure rate and activation energy data of all kinds of electronic components are searched respectively；
303, the functional reliability model and accelerated life test model of complete electronic set are established；
304, it under the conditions of performance test, according to the quantity and basic failure rate of all kinds of electronic components, calculates all kinds of
Total crash rate of electronic component；
305, according to the functional reliability model of complete electronic set, the crash rate of complete electronic set is calculated；
306, according to the accelerated life test model of complete electronic set, under the conditions of accelerating performance test, according to each electron-like
The quantity and activation energy data of component, calculate total crash rate of all kinds of electronic components；
The specific embodiment of above-mentioned steps are as follows: according to the accelerated life test model of complete electronic set, accelerating work examination
Under the conditions of testing, first according to the activation energy data of all kinds of electronic components, calculates all kinds of electronic components and accelerating performance test
Under the conditions of total crash rate；Then the quantity further according to all kinds of electronic components and all kinds of electronic components are accelerating work examination
Crash rate under the conditions of testing calculates its total crash rate under the conditions of accelerating performance test；
307, according to the functional reliability model of complete electronic set, the crash rate of complete electronic set is calculated；
308, according to complete electronic set crash rate under the conditions of performance test and under the conditions of accelerating performance test respectively, meter
Calculate the accelerated factor of complete electronic set；
Step S204: the ratio for determining the equivalent field test duration of the field test duration of complete electronic set and laboratory is 2:
3；
Step S205: by the field test duration of complete electronic set multiplied by 1.5 times, the laboratory for calculating complete electronic set is equivalent
Field test duration；
In the embodiment of the present invention, when field test of above-mentioned complete electronic set, is 4800 hours a length of, according to the meter of step S205
Formula is calculated, the equivalent field test duration in laboratory for calculating complete electronic set is about 7240 hours；
Step S206: by the equivalent field test duration in the laboratory of complete electronic set divided by accelerated factor, it is whole to calculate electronics
The laboratory test duration of machine；
In the embodiment of the present invention, above-mentioned accelerated factor, which calculates, is equal to 5.7, can be calculated according to the calculation formula of step S206
The laboratory actual tests duration of complete electronic set is about 1270.2 hours out, and the laboratory actual tests duration of complete electronic set
It cannot be below 1270.2 hours；
Step S207: under hot environment stress, laboratory test is carried out to complete electronic set, and records complete electronic set experiment
Performance parameter after the test of room；
Step S208: the performance parameter after performance parameter and laboratory test after analysis complete electronic set field test, meter
Calculate the testing failure number and fault category of complete electronic set；
In the embodiment of the present invention, the judgment basis of complete electronic set failure are as follows: (1) under prescribed conditions, one or several
A function is lost；(2) under prescribed conditions, one or several performance indicators exceed allowed band；(3) under prescribed conditions, out
Now influence examination model machine function, performance and the mechanical part of structural intergrity, the breakage of structural member or component, fracture or damage
State；Above-mentioned fault category includes relevant fault and non-relevant fault, and relevant fault includes chargeable fault and non-chargeable fault；
Above-mentioned chargeable fault be adjudicate complete electronic set test by whether foundation, chargeable fault include (1) due to design,
Failure caused by technique, element etc.；(2) components and component are designed, are manufactured, selecting improper caused failure；(3) software is wrong
Misquote the failure of hair；(4) failure caused by operation, maintenance and the maintenance procedure provided by tested unit is improper；(5) unconfirmed
Failure (refers to the failure that can not be reappeared or not yet investigate thoroughly reason)；
Above-mentioned non-chargeable fault includes: (1) misjudgement failure as caused by independent failure；(2) failure is not repaired and is occurred again
Failure；(3) failure of model machine is examined as caused by testing equipment, test equipment；(4) operation, maintenance and repair are improper causes
Failure；(5) it is applied with and does not meet failure caused by the proof stress of test determination；
Number of faults in the embodiment of the present invention only include association chargeable fault number, association chargeable fault should by following principle into
Row statistics: (1) susceptible of proof is that the intermittent fault due to caused by very same reason is only calculated as primary fault；(2) when the multiple events of susceptible of proof
When barrier phenomenon is caused by very same reason, primary fault can be calculated as；(3) when having multiple components during the test while failing,
When that cannot be proved to be a component failure and cause other component failures, the failure of each component is calculated as primary independence
Failure；If may prove that a component failure causes other component failures, all components are added up to once
Failure；(4) it is reported that the independent failure that the same position as caused by very same reason crossed occurs, really exclude due to failing and
When occurring again, primary fault should be added up to the failure reported originally, test period is invalid therebetween；(5) if not can determine that
The exact time that failure occurs, then the statistics of efficiency test time traces back to the test point time, i.e., a upper test point to hair
Test period between existing fault detecting point is invalid；(6) if occur in room temperature functional check and performance test after experiment therefore
Barrier then makees same treatment to the judgement of failure, statistics etc. and failure in test；(7) during fault detection and repairing, if
It was found that tested products are not determined as being that should then be regarded as individually blaming as caused by original failure there is also other failures
Failure is appointed to be counted；(8) at the scene in examination, for the light defects of components, if not losing predetermined function, and can
Give the event of in-situ immobilization (not causing to dismantle) by current check according to maintenance instruction, such as loosening, drift, noise, leakage
Deng being not counted in association chargeable fault after confirmed；
Step S209: judge whether the quantity of the chargeable fault of complete electronic set is more than or equal to 1；If so, thening follow the steps
S210；If not, thening follow the steps S211；
Step S210: determine that complete electronic set is substandard product, the reliability of electric-control system is 0；
Step S211: determine that complete electronic set is qualified products, the reliability of electric-control system is 1.
In summary, through the foregoing embodiment, respectively under normal temperature environment and accelerated stress environment under to tested model machine into
Row test more comprehensively detected the various performance parameters of tested model machine, while great by the application of accelerated stress
Shorten test duration, during the test and after test can accurate detection have the failure of tested model machine, be conducive to
Research staff preferably improves the electric-control system of product, improves product quality.
Claims (8)
1. a kind of Reliability Index Test method of instrument electric-control system, which comprises the following steps:
Under normal temperature environment, field test is carried out to the affiliated complete electronic set of the electric-control system, and it is existing to record the complete electronic set
Performance parameter after the test of field；
Determine the accelerated factor of the complete electronic set；
According to the field test duration of the accelerated factor and the complete electronic set, calculates the complete electronic set and carry out laboratory examination
The duration tested；
Under hot environment stress, laboratory test is carried out to the complete electronic set, and records the complete electronic set laboratory examination
Performance parameter after testing；
The performance parameter after performance parameter and laboratory test after analyzing the complete electronic set field test, calculates the electronics
The testing failure number and fault category of complete machine；
According to the testing failure number and fault category of the complete electronic set, the reliability of the electric-control system is determined.
2. the method according to claim 1, wherein carrying out scene to the complete electronic set under normal temperature environment
Test, and before recording the performance parameter after the complete electronic set field test, it is further comprising the steps of:
It checks the appearance of the affiliated complete electronic set of the electric-control system and tests the state of the art of the complete electronic set；Judge the electricity
Whether sub- complete machine is qualified products；
If it is, executing under normal temperature environment, field test is carried out to the affiliated complete electronic set of the electric-control system, and record institute
The step of performance parameter after stating complete electronic set field test.
3. according to the method described in claim 2, it is characterized in that, determine the accelerated factor of the complete electronic set, including it is following
Step:
Several electronic components that the complete electronic set includes classify and statistical magnitude；
The basic failure rate and activation energy data of all kinds of electronic components are searched respectively；
Establish the functional reliability model and accelerated life test model of the complete electronic set；
Under the conditions of performance test, according to the quantity and basic failure rate of all kinds of electronic components, each electron-like member device is calculated
Total crash rate of part；
According to the functional reliability model of the complete electronic set, the crash rate of the complete electronic set is calculated；
According to the accelerated life test model of the complete electronic set, under the conditions of accelerating performance test, according to each electron-like member device
The quantity and activation energy data of part, calculate total crash rate of all kinds of electronic components；
According to the functional reliability model of the complete electronic set, the crash rate of the complete electronic set is calculated；
According to complete electronic set crash rate under the conditions of performance test and under the conditions of accelerating performance test respectively, institute is calculated
State the accelerated factor of complete electronic set.
4. the method according to claim 1, wherein according to the scene of the accelerated factor and the complete electronic set
Duration is tested, the duration that the complete electronic set carries out laboratory test is calculated, comprising the following steps:
The ratio for determining the equivalent field test duration of field test duration and laboratory of the complete electronic set is 2:3；
By the field test duration of the complete electronic set multiplied by 1.5 times, the equivalent scene in laboratory of the complete electronic set is calculated
Test duration；
By the equivalent field test duration in the laboratory of the complete electronic set divided by the accelerated factor, the complete electronic set is calculated
Laboratory test duration.
5. according to the method described in claim 4, it is characterized in that, the complete electronic set is the hydrospace detection of double frequency Full digital high-frequency
Instrument.
6. according to the method described in claim 5, it is characterized in that, the field test duration of the complete electronic set and laboratory etc.
The sum of field test duration is imitated to be more than or equal to 12040 hours.
7. according to the method described in claim 6, it is characterized in that, the fault category includes relevant fault and dereferenced event
Barrier, the relevant fault includes chargeable fault and non-chargeable fault.
8. the method according to the description of claim 7 is characterized in that according to the testing failure number and failure of the complete electronic set
Classification determines the reliability of the electric-control system, comprising the following steps:
Judge whether the quantity of the chargeable fault of the complete electronic set is more than or equal to 1；
If it is, determining that the complete electronic set is substandard product, the reliability of the electric-control system is 0；
If it is not, then determining that the complete electronic set is qualified products, the reliability of the electric-control system is 1.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111141977A (en) * | 2019-12-30 | 2020-05-12 | 中国航天标准化研究所 | Test time calculation method based on multi-stress accelerated life model |
| CN114442593A (en) * | 2022-01-21 | 2022-05-06 | 中国科学院苏州生物医学工程技术研究所 | High-temperature stress reliability strengthening test method for electric control system |
| CN114966294A (en) * | 2022-07-27 | 2022-08-30 | 北京智芯微电子科技有限公司 | Reliability test system of power equipment, control method, device and medium |
Citations (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5715180A (en) * | 1995-10-16 | 1998-02-03 | Ford Motor Co. | Method to reduce sample size in accelerated reliability verification tests |
| US5963039A (en) * | 1998-02-04 | 1999-10-05 | Lucent Technologies Inc. | Testing attachment reliability of devices |
| CN101393083A (en) * | 2008-10-31 | 2009-03-25 | 信息产业部电子第五研究所 | Accelerated aging evaluation test apparatus for miniature Stirling refrigerating machine |
| US20100235108A1 (en) * | 2009-03-16 | 2010-09-16 | Adams David O | Usage monitor reliability factor using an advanced fatigue reliability assessment model |
| CN102129466A (en) * | 2011-03-22 | 2011-07-20 | 国网电力科学研究院 | Demonstration-based photovoltaic power station testing diagnosis and forecasting database establishment method |
| CN102981452A (en) * | 2012-12-28 | 2013-03-20 | 吉林大学 | Method for modeling and evaluating reliability of three types of functional components of numerical control machine tool |
| JP2013221844A (en) * | 2012-04-16 | 2013-10-28 | Internatl Business Mach Corp <Ibm> | Life prediction method for solder joint |
| CN103675712A (en) * | 2013-12-31 | 2014-03-26 | 工业和信息化部电子第五研究所 | Power supply service life detection method and system |
| US20140188405A1 (en) * | 2012-12-28 | 2014-07-03 | International Business Machines Corporation | Predicting a time of failure of a device |
| CN104991134A (en) * | 2015-06-26 | 2015-10-21 | 北京强度环境研究所 | Accelerated storage test method for electronic equipment |
| CN105022019A (en) * | 2015-06-23 | 2015-11-04 | 国家电网公司 | Method of comprehensively estimating reliability of single-phase intelligent electric energy meter |
| CN105093028A (en) * | 2015-08-21 | 2015-11-25 | 北京航天长征飞行器研究所 | Test method for acceleration storage of electronic products |
| CN107300650A (en) * | 2017-06-28 | 2017-10-27 | 工业和信息化部电子第五研究所华东分所 | A kind of intermittent life pilot system and method |
| CN107300649A (en) * | 2017-06-26 | 2017-10-27 | 北京强度环境研究所 | A kind of distributor complete machine accelerated storage test method and lifetime estimation method |
| CN108333208A (en) * | 2018-01-22 | 2018-07-27 | 航天科工防御技术研究试验中心 | A kind of complete machine grade product storage-life accelerated test method |
| CN108399271A (en) * | 2017-12-18 | 2018-08-14 | 广东科鉴检测工程技术有限公司 | Instrument control panel accelerated degradation test method and system |
| CN108446523A (en) * | 2018-05-11 | 2018-08-24 | 北京航天自动控制研究所 | A kind of assessment of complete electronic set storage life and prediction technique |
| CN108510133A (en) * | 2017-02-23 | 2018-09-07 | 北京桑兰特科技有限公司 | A kind of electronic product reliability index appraisal procedure based on comprehensive accelerated factor |
-
2019
- 2019-08-07 CN CN201910727363.8A patent/CN110531735B/en active Active
Patent Citations (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5715180A (en) * | 1995-10-16 | 1998-02-03 | Ford Motor Co. | Method to reduce sample size in accelerated reliability verification tests |
| US5963039A (en) * | 1998-02-04 | 1999-10-05 | Lucent Technologies Inc. | Testing attachment reliability of devices |
| CN101393083A (en) * | 2008-10-31 | 2009-03-25 | 信息产业部电子第五研究所 | Accelerated aging evaluation test apparatus for miniature Stirling refrigerating machine |
| US20100235108A1 (en) * | 2009-03-16 | 2010-09-16 | Adams David O | Usage monitor reliability factor using an advanced fatigue reliability assessment model |
| CN102129466A (en) * | 2011-03-22 | 2011-07-20 | 国网电力科学研究院 | Demonstration-based photovoltaic power station testing diagnosis and forecasting database establishment method |
| JP2013221844A (en) * | 2012-04-16 | 2013-10-28 | Internatl Business Mach Corp <Ibm> | Life prediction method for solder joint |
| US20140188405A1 (en) * | 2012-12-28 | 2014-07-03 | International Business Machines Corporation | Predicting a time of failure of a device |
| CN102981452A (en) * | 2012-12-28 | 2013-03-20 | 吉林大学 | Method for modeling and evaluating reliability of three types of functional components of numerical control machine tool |
| CN103675712A (en) * | 2013-12-31 | 2014-03-26 | 工业和信息化部电子第五研究所 | Power supply service life detection method and system |
| CN105022019A (en) * | 2015-06-23 | 2015-11-04 | 国家电网公司 | Method of comprehensively estimating reliability of single-phase intelligent electric energy meter |
| CN104991134A (en) * | 2015-06-26 | 2015-10-21 | 北京强度环境研究所 | Accelerated storage test method for electronic equipment |
| CN105093028A (en) * | 2015-08-21 | 2015-11-25 | 北京航天长征飞行器研究所 | Test method for acceleration storage of electronic products |
| CN108510133A (en) * | 2017-02-23 | 2018-09-07 | 北京桑兰特科技有限公司 | A kind of electronic product reliability index appraisal procedure based on comprehensive accelerated factor |
| CN107300649A (en) * | 2017-06-26 | 2017-10-27 | 北京强度环境研究所 | A kind of distributor complete machine accelerated storage test method and lifetime estimation method |
| CN107300650A (en) * | 2017-06-28 | 2017-10-27 | 工业和信息化部电子第五研究所华东分所 | A kind of intermittent life pilot system and method |
| CN108399271A (en) * | 2017-12-18 | 2018-08-14 | 广东科鉴检测工程技术有限公司 | Instrument control panel accelerated degradation test method and system |
| CN108333208A (en) * | 2018-01-22 | 2018-07-27 | 航天科工防御技术研究试验中心 | A kind of complete machine grade product storage-life accelerated test method |
| CN108446523A (en) * | 2018-05-11 | 2018-08-24 | 北京航天自动控制研究所 | A kind of assessment of complete electronic set storage life and prediction technique |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111141977A (en) * | 2019-12-30 | 2020-05-12 | 中国航天标准化研究所 | Test time calculation method based on multi-stress accelerated life model |
| CN114442593A (en) * | 2022-01-21 | 2022-05-06 | 中国科学院苏州生物医学工程技术研究所 | High-temperature stress reliability strengthening test method for electric control system |
| CN114442593B (en) * | 2022-01-21 | 2023-05-12 | 中国科学院苏州生物医学工程技术研究所 | High-temperature stress reliability strengthening test method for electric control system |
| CN114966294A (en) * | 2022-07-27 | 2022-08-30 | 北京智芯微电子科技有限公司 | Reliability test system of power equipment, control method, device and medium |
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