CN108398776A - A kind of general level adjusting apparatus adapted on microscope - Google Patents
A kind of general level adjusting apparatus adapted on microscope Download PDFInfo
- Publication number
- CN108398776A CN108398776A CN201810276131.0A CN201810276131A CN108398776A CN 108398776 A CN108398776 A CN 108398776A CN 201810276131 A CN201810276131 A CN 201810276131A CN 108398776 A CN108398776 A CN 108398776A
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- China
- Prior art keywords
- microscope
- knob
- adjusting apparatus
- horizontal adjustment
- adjusting
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
- G02B21/26—Stages; Adjusting means therefor
Abstract
The invention discloses a kind of general level adjusting apparatus adapted on microscope,The adjusting apparatus includes clamp knob (1),Testee intermediate plate (2),Parcel shelf (3),Horizontal adjustment knob (4),Horizontal adjustment bracket (5),Interior telescopic rod (6),Height adjustment knob (7),External extension bar (8),Pedestal (9),Digital display inclinometer (10),The adjusting apparatus of the present invention almost can be in matching experiments a series of light microscopes,It is easy to operate,Without being modified to light microscope,The observation of light microscope is not interfered with more,A kind of only microscopical auxiliary tool,Any damage will not be caused to microscope itself or sample itself,When use,To good position,It is following that adjusting apparatus level is advanced to micro- lens head,Sample is set to be in the field of view of light microscope composition lens,Operation is very easy for the general level adjusting apparatus device,Microscopical measurement effect can effectively be improved.
Description
Technical field
Patent of the present invention belongs to microscope auxiliary device technical field, and in particular to it is a kind of adapt to it is general on microscope
Level tune instrument.
Background technology
Microscope is a kind of optical instrument being made of the combination of a lens or several lens, is that the mankind enter the atomic time
The mark in generation.It is mainly used for amplifying the instrument that small items can be seen as human eye.Microscope spectroscopy microscope and
Electron microscope：Light microscope is initiated in the Jansen father and son by Holland in 1590.Objective table is also dressing table, in object lens
Below or above, to place the sample for needing to observe, the shape side of having, two kinds of circle, there is a light hole in center, is equipped on objective table
There is spring clamping sample in sample propeller (slider), propeller left side, has propeller regulating wheel under objective table, sample can be made to make
Left and right, movement in the front-back direction, but Level tune can not be carried out to sample, and also loading boss is mostly that metal is prepared,
It is easy to damage sample.
When using microscopic object, when high power is observed in especially carrying out, many measured surfaces are not horizontal
, this brings certain influence to observation, and in the image processing process in later stage, and unhorizontal observed image, which can also be given, to be divided
Analysis brings certain counter productive, for example with after micro- sem observation preservation image, its elevation information is utilized in analysis, I
Both know about, elevation information at this time all needs to establish a reference planes, i.e. reference level surface, many analysis softwares
All it is that be defaulted as the article carrying platform of oneself be reference level surface, this just needs sample to need guarantee horizontal when placing, still
Since sample can not many times ensure the unhorizontal height that it can be caused to sample that is horizontal, and observing surface when placing
Data cannot function as the strong argument of paper conclusion.
Therefore, a kind of general level adjusting apparatus adapted on microscope of Patent design of the present invention, the general level tune
The simple and practical in structure of instrument is saved, it is at low cost, it is easy to operate.And intermediate plate is prepared using rubber material, will not be made to sample
At injury.It can not only provide a good visual field under the premise of not damaging testee, additionally it is possible to simply adjust quilt
Survey the level on surface.
Invention content
In order to overcome defect existing for background technology center, the technical solution adopted by the present invention to solve the technical problems
It is：A kind of general level adjusting apparatus adapted on microscope, main actions position include object fixed part, horizontal adjustment section
Divide and height adjusting part divides.
It is an object of the invention to solve can to adjust the level on testee surface in observation process.Do not change existing
Any structure of light microscope be directly erected on microscope when in use, sample is can guarantee in observation process
Always it is under microscopical camera lens, and does not influence the operation during microscope use.
Further, object fixed part has adjusting knob, intermediate plate that can clamp sample by adjusting knob, when along side
When to adjusting knob, adjusting knob can drive intermediate plate to do the axial movement close to intermediate plate along the direction of adjusting knob, play folder
The effect of tight sample.
Further, what the sample fixing clip was selected is rubber material, during fixed object or micro-
Specimen surface will not be caused to damage during sem observation.
Four adjusting knobs are arranged under parcel shelf, more accurately may be used altogether for heretofore described level adjustment part
To be known as a miniature telescopic device, i.e. one end of telescopic rod is fixed on the back side of parcel shelf (relative to placement object
For front), telescopic rod is controlled by horizontal adjustment knob, is also had scale mark in horizontal adjustment knob, is being repeated several times
When observing some sample, last operation can be quickly and efficiently repeated, that is, restores each when the observation of this tested sample last time
The numerical value of horizontal adjustment knob does not have to carry out prolonged Level tune to same sample again every time, when experiment is greatly saved
Between.
A kind of general level adjusting apparatus adapted on microscope according to the present invention, it is this to adapt on microscope
The structure of general level adjusting apparatus is simple, at low cost, and easy to operate, improves microscopical observing effect, and suitable popularization makes
With, reasonable design of the present invention may be implemented easily to adjust and fix metallographic microscope by a series of structure,
So as to save the regular hour, the metallographic microscope that is convenient for people to use is learnt, is worked.
Description of the drawings
Fig. 1 is the structural schematic diagram of general level adjusting apparatus of the present invention；
Fig. 2 is the front view of general level adjusting apparatus of the present invention；
Fig. 3 is the vertical view of Fig. 2；
Fig. 4 is the left view of Fig. 2；
Fig. 5 is the three-dimensional shaft side upward view of general level adjusting apparatus of the present invention；
Fig. 6 is the partial enlarged view of level adjustment part；
In figure：1, clamp knob 2, testee intermediate plate 3, parcel shelf
4, horizontal adjustment knob 5, horizontal adjustment bracket 6, interior telescopic rod
7, height adjustment knob 8, external extension bar 9, pedestal
10, digital display inclinometer
Specific implementation mode
In conjunction with the accompanying drawings, the present invention is further explained in detail.Attached drawing is the schematic diagram of simplification, only with signal side
Formula illustrates the basic structure of the present invention, therefore it only shows the composition relevant to the invention.A kind of adaptation shown in please referring to Fig.1
In the general level adjusting apparatus on microscope, this Level tune instrument groundwork includes three parts：Object fixed part, horizontal tune
Section part, height adjusting part point.
Object fixed part includes 1, clamp knob 2, testee intermediate plate 3, parcel shelf.Measured object is taken out with tweezers
After body, at this time it is noted that not damage the surface of testee, fixture is then raised into intermediate plate, sample is pressed in parcel shelf
Intermediate position, can be with the tightness of alignment jig by clamp knob, it is ensured that under the premise of not injuring sample,
It is set to be fastened on parcel shelf, to prevent from sliding in observation.
After sample being clamped by the collective effect of two tabletting type fixtures and fastening screw, it can be seen that in parcel shelf
It is upper that there are one digital display inclinometers, by taking common plane and cylindrical contact as an example, in actual test, and our main detections
Be plane contact contact portion, but due to the presence of its fixed part, place it in microscopically observation when
Level is often not achieved in time, and progress Level tune is at this time just needed to use digital display inclinometer when not being placed on support board
It measures its angle of inclination and records, then tested sample is placed on support board and is fixed by above-mentioned steps, adjusted by level
Note that adjusting the digital display inclinometer just used to that angle just recorded when section part carries out Level tune, try to see
It surveys, sees whether tested sample has reached level, if not provided, horizontal adjustment knob is recycled to carry out micro-positioning regulators, ensure
Tested sample ensures level in observation, and equally records the scale of four adjusting knobs.It is carrying out to cylindrical contact
Observation when, firstly for being fixed with certain requirement, it is ensured that the observation part of tested sample will be in micro objective
Under camera lens, at this time a small angle is rotated by micro-positioning regulators and can reach experimental observation requirement.Due to right
Parcel shelf is rotated, and brightness when for observation may have a certain impact, and at this time make this by height adjusting part point
The height of Level tune instrument can be adjusted, and brightness can be made to have some improvement, and can also preferably adapt to various models
Microscope, and during above-mentioned use, horizontal adjustment knob and height adjustment knob can fix, it is especially horizontal to adjust
Knob is saved, there is numeric indicia thereon, also there is the angle of inclination of each parcel shelf on digital display inclinometer, these data are all can be with
Tested sample is followed to be recorded together.It can ensure, when observation is repeated several times, can quickly and efficiently repeat in this way
Primary operation restores the numerical value of each horizontal adjustment knob when the observation of this tested sample last time, recycles digital display inclinometer
It tests, does not have to carry out prolonged Level tune to same sample again every time, the sight to experimental sample can be greatlyd save
Survey the time.
Level adjustment part includes：5, horizontal adjustment knob 6, horizontal adjustment bracket.It will be appreciated from fig. 6 that sample is fixed
Later, Level tune can be carried out by the above process by adjusting four adjusting knobs.It is to adapt to observe that height, which is adjusted,
When the distance between object lens and objective table and be arranged comprising：6, interior telescopic rod 7, height adjustment knob 8, external extension bar.
The adjusting apparatus of the present invention almost can be in matching experiments a series of light microscopes, it is easy to operate, without to light
It learns microscope to be modified, in use, to good position, it is following that adjusting apparatus level is advanced to micro- lens head, sample is made to be in
In the field of view of optical microphotograph lens head.Operation is very easy for the general level adjusting apparatus device, can effectively improve
Microscopical measurement effect.
Claims (6)
1. a kind of general level adjusting apparatus adapted on microscope, including clamp knob (1), testee intermediate plate (2),
Parcel shelf (3), horizontal adjustment knob (4), horizontal adjustment bracket (5), interior telescopic rod (6), height adjustment knob (7), external extension
Bar (8), pedestal (9), digital display inclinometer (10), it is characterised in that：There are clamp knob (1), fixture tight on parcel shelf (3)
Gu knob (2), clamp knob and clamp knob composition object fixed part are made by alignment jig tightening knob
Elastic adjusting can be carried out by obtaining testee intermediate plate, and appropriateness is adjusted, and tested sample can be fixed on parcel shelf (3), on
It states position to coordinate jointly to fix testee, ensures not falling out when observing under the microscope, on four angles of parcel shelf
There is horizontal adjustment knob (4), be mounted in horizontal adjustment bracket (5), after fixing tested sample, by adjusting in water
Horizontal adjustment knob (4) on flat adjusting bracket (5) makes parcel shelf (3) that can carry out micro-positioning regulators, i.e., by adjusting Level tune
Knob, and then change the inspection surface of its testee above, keep its holding in observation horizontal.
2. a kind of general level adjusting apparatus adapted on microscope as described in claim 1, it is characterised in that：Digital display inclination angle
Instrument is dismountable, and the magnet in its bottom can ensure be fixed on parcel shelf in adjusting level, can also dismantle
Get off to measure the angle of inclination of tested sample.
3. a kind of general level adjusting apparatus adapted on microscope as described in claim 1, it is characterised in that：Testee
The material that intermediate plate (2) uses is the hard rubber for having certain elasticity, it is therefore an objective to avoid causing unnecessary deformation, fixture tight by object
Gu the minimum limit of knob under the premise of clamping tested sample it is also ensured that be unlikely to excessively to fasten and cause to damage quilt
Test specimens.
4. a kind of general level adjusting apparatus adapted on microscope as described in claim 1, it is characterised in that：Interior telescopic rod
(6), height adjustment knob (7), external extension bar (8) divide with a height adjusting part is combined into, by adjusting knob, interior telescopic rod
It can be retracted according to the size of adjusting in external extension bar, it is allow to be also had according to micro objective grease head highness when focusing
The thickness of testee is specifically adjusted, and micro- sem observation is allowed to become apparent from, and due to being provided with height adjusting part point, also allows this
Invention wider array of can fit on the microscope of various models.
5. a kind of general level adjusting apparatus adapted on microscope as described in claim 1, it is characterised in that：With parcel shelf
(3) horizontal adjustment knob (4) being in direct contact is set as four, and positional symmetry is located on four angles, adjusts and revolves with height
Unlike button, horizontal adjustment knob can be described as a miniature telescopic device, and one end of telescopic rod is fixed on parcel shelf
The back side (for the front for placing object), telescopic rod is controlled by horizontal adjustment knob, in horizontal adjustment knob also
There is scale mark.
6. a kind of general level adjusting apparatus adapted on microscope as described in claim 1, it is characterised in that：In pedestal
(9) it is all respectively arranged with rubber sheet gasket on four holders, concave-convex fluctuating is provided in the plane of the rubber sheet gasket described in four
Anti-skid chequer, increase its frictional force between microscope carrier, it is ensured that this adjusting apparatus can be firmer on microscope,
It avoids causing to damage its object lens by there is landing, increases its safety.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810276131.0A CN108398776A (en) | 2018-03-30 | 2018-03-30 | A kind of general level adjusting apparatus adapted on microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810276131.0A CN108398776A (en) | 2018-03-30 | 2018-03-30 | A kind of general level adjusting apparatus adapted on microscope |
Publications (1)
| Publication Number | Publication Date |
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| CN108398776A true CN108398776A (en) | 2018-08-14 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810276131.0A Pending CN108398776A (en) | 2018-03-30 | 2018-03-30 | A kind of general level adjusting apparatus adapted on microscope |
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| CN (1) | CN108398776A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109282796A (en) * | 2018-10-26 | 2019-01-29 | 哈尔滨理工大学 | A kind of quick horizontal location measurement accessory of turning steep-pitch thread lathe tool wear surface |
| CN109443951A (en) * | 2018-10-17 | 2019-03-08 | 河海大学 | A kind of function of the axial asynchronous torsional deflection in measurement multilayer thin body material edge folds ring |
| CN111759525A (en) * | 2020-07-08 | 2020-10-13 | 中国人民解放军军事科学院军事医学研究院 | Adjustable operation platform instrument for rodent experimental animals based on micromanipulation |
| CN113495353A (en) * | 2021-07-02 | 2021-10-12 | 安徽大学 | Adjustable multi-wavelength data acquisition system for microscope system |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02190813A (en) * | 1989-01-20 | 1990-07-26 | Hitachi Ltd | Method and device for adjusting horizontality of sample container |
| CN201611407U (en) * | 2009-11-10 | 2010-10-20 | 宜硕科技(上海)有限公司 | Optical three-dimensional microscope and object stage |
| CN204694218U (en) * | 2015-06-23 | 2015-10-07 | 哈尔滨理工大学 | A kind of articles holding table with rotation and lifting function |
| CN105549196A (en) * | 2016-03-02 | 2016-05-04 | 河南师范大学 | Inclinable type auxiliary device for optical microscope objective table |
| CN206348516U (en) * | 2016-12-22 | 2017-07-21 | 苏州承祚纳米科技有限公司 | A kind of microscope carrier |
-
2018
- 2018-03-30 CN CN201810276131.0A patent/CN108398776A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02190813A (en) * | 1989-01-20 | 1990-07-26 | Hitachi Ltd | Method and device for adjusting horizontality of sample container |
| CN201611407U (en) * | 2009-11-10 | 2010-10-20 | 宜硕科技(上海)有限公司 | Optical three-dimensional microscope and object stage |
| CN204694218U (en) * | 2015-06-23 | 2015-10-07 | 哈尔滨理工大学 | A kind of articles holding table with rotation and lifting function |
| CN105549196A (en) * | 2016-03-02 | 2016-05-04 | 河南师范大学 | Inclinable type auxiliary device for optical microscope objective table |
| CN206348516U (en) * | 2016-12-22 | 2017-07-21 | 苏州承祚纳米科技有限公司 | A kind of microscope carrier |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109443951A (en) * | 2018-10-17 | 2019-03-08 | 河海大学 | A kind of function of the axial asynchronous torsional deflection in measurement multilayer thin body material edge folds ring |
| CN109282796A (en) * | 2018-10-26 | 2019-01-29 | 哈尔滨理工大学 | A kind of quick horizontal location measurement accessory of turning steep-pitch thread lathe tool wear surface |
| CN111759525A (en) * | 2020-07-08 | 2020-10-13 | 中国人民解放军军事科学院军事医学研究院 | Adjustable operation platform instrument for rodent experimental animals based on micromanipulation |
| CN111759525B (en) * | 2020-07-08 | 2021-04-23 | 中国人民解放军军事科学院军事医学研究院 | Adjustable operation platform instrument for rodent experimental animals based on micromanipulation |
| CN113495353A (en) * | 2021-07-02 | 2021-10-12 | 安徽大学 | Adjustable multi-wavelength data acquisition system for microscope system |
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Application publication date: 20180814 |