Camera 300CM far field test machine
Technical field
The utility model relates to a kind of Camera Test machine, in particular to a kind of camera 300CM far field test machine.
Background technique
Field angle is also known as visual field in optical engineering, and the size of field angle determines the field range of optical instrument, visual field
Angle is bigger, and the visual field is bigger, and optical power is with regard to smaller.Generally, target object is more than that this angle would not be received in camera lens
In.By viewpoint classification, standard lens, remote camera and wide-angle lens can be divided into, visual angle is known as standard lens at 45 ° or so;Depending on
Within 40 °, referred to as remote camera is chiefly used in wide-long shot at angle;Visual angle is in 60 ° or more, referred to as wide-angle lens, range of observation
It is larger.
It generally needs to increase between camera and test pattern in the wide-angle camera far field test jig of the prior art
Teleconverter, for reducing the size of test pattern.It needs emphasis to manage camera to be measured in test to be laid in test pattern
The depth of parallelism and relative position between light source surface and teleconverter.The maximum field angle of teleconverter is 130 ° currently on the market, this
If when camera field angle to be measured be more than 130 °, graph card size is calculated using 130 ° of field angles, is surveyed in the specific far field 300CM
In test-run a machine, the freedom degree by adjusting light source guarantee test pattern between camera the depth of parallelism and relative position then relatively it is tired
Difficulty, freedom degree when most of camera far field test machines are using adjusting Camera Test to be measured at present, guarantees itself and test chart
The depth of parallelism and relative position between card.
The test of camera is taken pictures against test pattern, is then led to mainly by test fixture fixing camera
The image analysis software for crossing profession carries out analysis pixel matter, to react camera quality.Wherein, test fixture is for camera shooting
The fixation of head is the fundamental of test, therefore in order to guarantee to test quality, camera is included in test in test pattern
In visual field scope, need to guarantee that camera optical axis is vertical with test pattern and optical axis center passes through test pattern center.It passes
The camera test holding fixture of system, the three-shaft displacement generallyd use adjust camera position, can be protected by three-shaft displacement adjusting
It demonstrate,proves camera optical axis center and passes through test pattern center, but it is vertical with test pattern to be unable to ensure its camera optical axis, therefore
Imaging distorts, to be easy to cause erroneous judgement, finally influences test effect.
Utility model content
Technical problem to be solved in the utility model is to have overcome the deficiencies of the prior art and provide one kind and can easily be accommodated to take the photograph
As between head and test pattern the depth of parallelism and relative position, imaging is more evenly symmetrical and can reduce taking the photograph for the false failure rate of camera
As head 300CM far field test machine.
The technical scheme adopted by the utility model is the utility model includes test cabinet and host computer, the survey
Luminescent screen, test pattern, microscope carrier lifting support, X-axis slide unit, Y-axis slide unit, Z axis swivel slide and test are provided in examination cabinet
Support plate, the test pattern are arranged on the luminescent screen, and the front of the luminescent screen, institute is arranged in the microscope carrier lifting support
It states and is provided with X-axis slide unit on microscope carrier lifting support, Y-axis slide unit is provided on the X-axis slide unit, is provided with Z on the Y-axis slide unit
Axis swivel slide is provided with test carrier plate on the Z axis swivel slide, be provided on the test carrier plate camera carrier slot,
Camera head fixing device and increment mirror support are provided with teleconverter and several rangefinders on the increment mirror support.
Further, the microscope carrier lifting support includes mounting plate and four pillar lifting devices, four pillar liftings
Device is arranged at the lower end surface of the mounting plate, and the lower end surface of the X-axis slide unit, the pillar liter is arranged in the mounting plate
Falling unit includes that the first sliding block, adjusting block structure and the second sliding block matched with first sliding block, first sliding block are set
It sets in the lower end surface of the mounting plate, second sliding block, which reclines, is arranged in the side of first sliding block, the adjusting agllutination
Structure is arranged between second sliding block and the mounting plate.
Further, the adjusting block structure includes adjusting block and height adjustment screw, the lower end surface setting of the adjusting block
There are several boss, the upper surface of the adjusting block is arranged in the height adjustment screw, and the adjusting block passes through several institutes
Boss is stated to be fixed on second sliding block.
Further, the rangefinder is two, and two rangefinders are separately positioned on the both ends of the teleconverter.
Further, laser collimator is additionally provided on the increment mirror support.
Further, the camera head fixing device includes that camera quickly clamps block and two camera sides quickly press from both sides,
The camera quickly clamps block and is arranged on the camera carrier slot, and two camera sides quickly press from both sides and are respectively set
At the both ends of the camera carrier slot.
Further, control panel and keyboard components are provided on the test cabinet.
Further, the boss is four.
The beneficial effects of the utility model are: since the utility model includes test cabinet and host computer, the test
Luminescent screen, test pattern, microscope carrier lifting support, X-axis slide unit, Y-axis slide unit, Z axis swivel slide and test is provided in cabinet to carry
Plate, the test pattern are arranged on the luminescent screen, and the front of the luminescent screen is arranged in the microscope carrier lifting support, described
It is provided with X-axis slide unit on microscope carrier lifting support, Y-axis slide unit is provided on the X-axis slide unit, is provided with Z axis on the Y-axis slide unit
Swivel slide is provided with test carrier plate on the Z axis swivel slide, camera carrier slot is provided on the test carrier plate, is taken the photograph
As the fixed device of head and increment mirror support, teleconverter and several rangefinders are provided on the increment mirror support, the X-axis is sliding
The setting of platform and Y-axis slide unit enables the test carrier plate to adjust the movement of X-axis and the movement of Y-axis, the Z axis swivel slide
Setting enable the test carrier plate to adjust the direction of rotation of Z axis, the setting of the microscope carrier lifting support is so that the survey
Examination support plate can adjust the rotation of X-axis, the rotation of Y-axis and the axial movement of Z axis, and the setting of the microscope carrier lifting support is so that originally
Utility model can guarantee that camera center and the center of the test pattern are overlapped, so, the utility model, which has, to be easy to adjust
It saves the depth of parallelism and relative position between camera and test pattern, false failure rate more evenly symmetrical and that camera can be reduced is imaged
The advantages of.
Detailed description of the invention
Fig. 1 is the schematic perspective view of the utility model;
Fig. 2 is the schematic perspective view of microscope carrier lifting support, X-axis slide unit, Y-axis slide unit and Z axis swivel slide;
Fig. 3 is the schematic perspective view of teleconverter and test carrier plate;
Fig. 4 is the schematic perspective view for adjusting block structure.
Specific embodiment
As shown in Figures 1 to 4, in the present embodiment, the utility model includes test cabinet 1 and host computer 2, the survey
Luminescent screen, test pattern 4, microscope carrier lifting support 5, X-axis slide unit 6, Y-axis slide unit 7, Z axis swivel slide 8 are provided in examination cabinet 1
And test carrier plate 9, the test pattern 4 are arranged on the luminescent screen, the microscope carrier lifting support 5 is arranged in the luminescent screen
Front, be provided with X-axis slide unit 6 on the microscope carrier lifting support 5, Y-axis slide unit 7, the Y-axis be provided on the X-axis slide unit 6
It is provided with Z axis swivel slide 8 on slide unit 7, test carrier plate 9 is provided on the Z axis swivel slide 8, is set on the test carrier plate 9
It is equipped with camera carrier slot 10, camera head fixing device and increment mirror support 11, is provided with increment on the increment mirror support 11
The setting of mirror 12 and several rangefinders, the X-axis slide unit 6 and Y-axis slide unit 7 enables the test carrier plate 9 to adjust X-axis
Mobile and Y-axis movement, the setting of the Z axis swivel slide 8 enable the test carrier plate 9 to adjust the direction of rotation of Z axis,
The setting of the microscope carrier lifting support 5 enables the test carrier plate 9 to adjust the axis of the rotation of X-axis, the rotation of Y-axis and Z axis
To movement, in use, camera to be measured is arranged in the camera carrier slot 10, pass through the camera head fixing device
Camera to be measured is fixed, the microscope carrier lifting support 5 is adjusted, further completes the Level tune to the test carrier plate 9,
Ensure that the optical axis of camera to be measured is vertical with the test pattern 4, adjusted secondly by the X-axis slide unit 6 is used to
Left-right position of the camera of survey relative to the test pattern 4, to control in the visual field scope of camera to be measured
The position of imaging, the setting of the teleconverter 12 is so that the distance of camera to the test pattern 4 is reduced to from 3000mm
454mm, then Y-axis displacement is adjusted by using the Y-axis slide unit 7, it is 1mm that Y-axis, which is displaced degree of regulation, is used cooperatively simultaneously
The Z axis swivel slide 8, the rangefinder are used to detect camera to the distance of the test pattern 4, so that the utility model
It can accurately guarantee camera to the distance of the test pattern 4, the setting of the microscope carrier lifting support 5 is so that the utility model
It can guarantee that camera center and the center of the test pattern 4 are overlapped, so that the utility model, which has, can easily be accommodated camera
And the depth of parallelism between test pattern and relative position, imaging it is more evenly symmetrical and the advantages of the false failure rate of camera can be reduced.
In the present embodiment, the microscope carrier lifting support 5 includes mounting plate and four pillar lifting devices, four branch
Column lifting device is arranged at the lower end surface of the mounting plate, and the lower end surface of the X-axis slide unit 6, institute is arranged in the mounting plate
State the second sliding block that pillar lifting device includes the first sliding block 14, adjusts block structure 16 and match with first sliding block 14
15, the lower end surface of the mounting plate is arranged in first sliding block 14, and second sliding block 15 reclines to be arranged and slide described first
The side of block 14, the adjusting block structure 16 are arranged between second sliding block 15 and the mounting plate, four pillars
Lifting device is divided into the first pillar lifting device, the second pillar lifting device, third pillar lifting device and the lifting of the 4th pillar
Device, the 4th pillar lifting device and the first pillar lifting device are arranged in one end of the mounting plate, and described
The other end of the mounting plate, the 4th pillar lifting is arranged in two pillar lifting devices and the third pillar lifting device
The front of the third pillar lifting device is arranged in device, and the first pillar lifting device is arranged in second pillar
The front of lifting device when the utility model is finely adjusted, while adjusting the first pillar lifting device and described second
The length of the length of pillar lifting device or the third pillar lifting device and the 4th pillar lifting device, with this school
The rotation parameter of quasi- board X-axis;The first pillar lifting device and the 4th pillar lifting device or institute are adjusted simultaneously
The second pillar lifting device and the third pillar lifting device are stated, the rotation parameter of board Y-axis is calibrated with this;Adjust the Z
Axis swivel slide 8 calibrates the rotation parameter of board Z axis with this.
In the present embodiment, the adjusting block structure 16 includes adjusting block 17 and height adjustment screw 18, the adjusting block
17 lower end surface is provided with several boss 19, and the upper surface of the adjusting block is arranged in the height adjustment screw 18, described
Adjusting block 17 is fixed on second sliding block 15 by several described boss 19, adjusts spiral shell by rotating the height
Silk 18 enables the utility model to adjust the length of the pillar lifting device.
In the present embodiment, the rangefinder is two, and two rangefinders are separately positioned on the teleconverter 12
Both ends.
In the present embodiment, it is additionally provided with laser collimator on the increment mirror support 11, passes through the laser collimator
The cross mark on the test pattern 4 is got to, to correspond to four side positioning identifiers on the test pattern 4, so that verifying is taken the photograph
As whether head center is overlapped with 4 center of test pattern, registration accuracy can reach 0.5mm.
In the present embodiment, the camera head fixing device includes that camera quickly clamps block 20 and two camera sides
Quickly folder 21, the camera quickly clamp block 20 and are arranged on the camera carrier slot 10, two camera sides
Quickly folder 21 is separately positioned on the both ends of the camera carrier slot 10, and the camera quickly clamps to be taken the photograph described in block 20 and two
The position for fixing camera to be measured for as the setting that head side quickly presss from both sides 21 the utility model being consolidated.
In the present embodiment, control panel and keyboard components, the control panel and institute are provided on the test cabinet 1
Stating keyboard components is able to use the utility model conveniently.
In the present embodiment, the boss 19 is four.
The utility model is applied to the technical field of Camera Test machine.
Although the embodiments of the present invention are described with practical solution, does not constitute the utility model is contained
Justice limitation, for those skilled in the art, according to this specification to the modification of its embodiment and with the group of other schemes
Conjunction will be apparent from.