CN108387489A - Can vertical calibration image planes and optical axis zoom displaing microparticle track approach and device - Google Patents
Can vertical calibration image planes and optical axis zoom displaing microparticle track approach and device Download PDFInfo
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- CN108387489A CN108387489A CN201810165151.0A CN201810165151A CN108387489A CN 108387489 A CN108387489 A CN 108387489A CN 201810165151 A CN201810165151 A CN 201810165151A CN 108387489 A CN108387489 A CN 108387489A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
Abstract
Can the zoom displaing microparticle track approach of vertical calibration image planes and optical axis belong to nano particle diameter fields of measurement with device, attitude regulation platform, optical fiber type laser head, ccd detector and switching fixed plate are constituted imaging end unit by the present invention, the imaging end unit can be fixed on cuboid substrate side surfaces by fixed plate of transferring, and could be secured on the six-freedom micro displacement regulating platform being connect with displacement movement platform；The Gaussian beam of optical fiber type laser head exported, which enters, injects the double facula position probe units that can measure incident beam unit direction vector；Displacement platform moves to different location, and convex lens can observe and measure nanoparticle movement track under different enlargement ratios from ccd detector；Six-freedom micro displacement regulating platform is instructed to change progress posture return adjusting to being imaged end unit posture caused by displacement by obtained beam direction vector, while ensureing that optical axis is vertical with ccd detector imaging surface, moreover it is possible to obtain the micro- enlargement ratio in different displaced positions.
Description
Technical field
The invention belongs to nano particle diameter fields of measurement, relate generally to a kind of method for realizing nano particle track following
With device.
Background technology
Characteristic that nano material is shown in the fields such as material, biology, medicine, environmental protection, chemical industry, metallurgy and building with
Its granule density and particle diameter distribution situation are closely related.The measuring technique of nano particle is more and more paid attention to, to improving
There are great economic implications and far-reaching social effect in the fields such as material product quality, biological medicine and control environmental pollution.
Nano particle trace analysis method（NTA methods）It is just commercialized grain diameter measurement method in 2006, this method is based on laser
Microtechnic is illuminated, fixed wave length laser lighting and certain enlargement ratio charge coupled device are passed through（CCD）Camera micro-imaging
Particle scatters light real-time imaging, tracking and the Brownian movement track for analyzing each particle in detection zone, recycles Stokes-
Einstein formula calculate the grain diameter of each particle.It is received using the development of this method currently, having had more than 150 oversea laboratories
The correlative study that rice grain measures.
When carrying out nano particle diameter measurement using the NTA methods of fixed enlargement ratio, if the small folding of the grain diameter of material
Light rate is small, smaller enlargement ratio, and imaging luminous point can be caused small, be not easy to carry out imaging particle center coordination and track following, because
This needs to increase micro-imaging, and when the big index of refraction of the grain diameter of material is big, larger enlargement ratio can make acquisition at
Picture numbers of particles is less, and the sample size for observing tracking is few, and the range of track following is small, and the measurement of particle size distribution is made to unite
It is inaccurate to count result.Therefore, the NTA methods for becoming enlargement ratio are to carry out a kind of necessary mode of nano particle diameter measurement.It is aobvious
Require lens axis vertical with image planes when micro- imaging, when NTA methods carry out nano particle diameter measurement, if optical axis and image planes are not
Geometric error when track following is vertically not only resulted in, and particle image quality can be influenced to lead to particle imaging barycenter extraction
Inaccuracy, to increase track following error.
The realization of micro-imaging time-varying enlargement ratio at present becomes mainly by being moved to variable focus lens package realizing
Realize zoom while burnt, lens group carries out back and forth movement to realize zooming procedure in lens barrel along guide groove, light in moving process
The pitching beat of axis, i.e. the pitching beat of lens group can only rely on the machining accuracy of guide groove to inhibit it, generally may be used
Think that lens group carries out back and forth movement along guide groove in lens barrel and will not cause the variation of optical axis, but with the increase of use time,
Back and forth movement inevitably results in guide groove abrasion, and effective inhibition is unable to get so as to cause the pitching beat of optical axis.
Invention content
Optical axis changes the problem with enlargement ratio inaccuracy when for above-mentioned micro-imaging, and the present invention is proposed and had developed can
The zoom displaing microparticle track approach and device of vertical calibration image planes and optical axis, the invention ensure that optical axis is imaged with ccd detector
While face is vertical, moreover it is possible to obtain the micro- enlargement ratio in different displaced positions.
The purpose of the present invention is achieved through the following technical solutions：
It is a kind of can vertical calibration image planes and optical axis zoom displaing microparticle track approach, steps are as follows for this method：
（1）Optical fiber type laser head exports Gaussian beam, and the Gaussian beam first piece of spectroscope of incidence is reflected by first piece of spectroscope
Gaussian Beam and first piece of spectroscope uniform thickness mirror block after be incident on facula position detector I, transmitted through the first piece point
The Gaussian beam of light microscopic enters and injects in hollow pyramid, after the reflection of hollow pyramid, incident second piece of spectroscope, by the second piece point
The Gaussian beam of light microscopic reflection is incident on facula position detector II, transmitted through second piece of spectroscopical Gaussian beam, through convex
Enter after lens and injects on the ccd detector imaging surface to intersect vertically with convex lens optical axis；
（2）Above-mentioned spectroscope is all fixed on the mirror block, facula position detector and hollow pyramid of first piece of spectroscope uniform thickness
On rectangular structure base board, to constitute the double facula position probe units that can detect incident beam direction vector, therefore can be with
Obtain incidence Gaussian beam unit direction vector therein in double determined coordinate systems of facula position probe unit (,,), it should
Unit direction vector measures expression formula,,, whereinWithIt is hot spot in hot spot position
The positional value on detector I and II test surface is set, and、WithFor known constants,
(Compensation of errors due to incident beam drift in a 3 DOF measurement
system for linear guide motion. OPTICS EXPRESS, 2015, 23(22))；
（3）Pitching and the beat of optical fiber type laser head, the height for making it be emitted are adjusted by the attitude regulation platform of optical fiber type laser head
This light beam unit direction vector is (- 1,0,0), then, by optical fiber type laser head and its attitude regulation platform, ccd detector and is turned
The imaging end unit for connecing fixed plate composition is removed from cuboid substrate side surfaces, is installed to the six degree of freedom being connect with displacement movement platform
On micro-positioning regulators platform, and make the Gaussian beam that optical fiber type laser head is emitted back into injecting double facula position probe units and quilt
Its unit direction vector is detected, according to the unit direction vector that measurement obtains, six-freedom micro displacement regulating platform is adjusted, to make
The Gaussian beam unit direction vector of optical fiber type laser head outgoing is again (- 1,0,0), and is made on ccd detector imaging surface
The center of launching spot is identical as before dismounting, and displacement movement platform can do back and forth movement along X-coordinate axis direction, in each position
After shifting movement, Gaussian beam unit direction vector caused by end unit pitching beat and offset is imaged caused by displacement movement
With the change of launching spot center on ccd detector imaging surface, all pass through the adjusting pair of the six-freedom micro displacement regulating platform
It carries out return compensation, the moving displacement range interior energy of displacement movement platform realize convex lens center and ccd detector imaging surface away from
From the focal length less than or equal to convex lens, can also realize that convex lens center is more than with ccd detector imaging surface distance, displacement fortune
After dynamic platform reaches certain displaced position, the radius of launching spot is denoted as on ccd detector imaging surface, and remember that its minimum value is；
（4）It is defined from gauss light beam waistFor the waist radius of the Gaussian beam after convex lens, ccd detector imaging
Face and convex lens centre distanceFor image distance, it with、Relational expression is, whereinFor Gauss light
Therefore Shu Bochang after displacement movement platform moves to certain position, is obtained by the position, image distance can be calculated；
（5）Displacement movement platform moves to image distanceIt is more thanThe sample cell for filling nano particle is placed under convex lens by certain position
Side, in order to nano particle in micro-imaging sample cell, according to focal length of lens when lens micro-imaging, image distanceAnd object distanceIt closes
It is formula, need to realize that sample cell upper end horizontal plane is less than with convex lens centre distance, i.e. object distanceLocation point is in below the horizontal plane of sample cell upper end, then, refractive power plane microscope group is placed below sample cell, is made
Gaussian beam from the incidence of sample cell side into sample cell in irradiate nano particle therein, and ensure to transmit the Gauss of sample cell
With convex lens and ccd detector imaging surface optical effect, which does not occur, for light beam finally can pass through convex lens and ccd detector
Micro-imaging is observed and is measured in sample cell apart from convex lens center under enlargement ratioReceiving at position
Rice grain movement locus, displacement movement platform displacement movement to image distanceIt is more thanDifferent location correspond to different enlargement ratios,
To realize the analysis of zoom displaing microparticle track following.
It is a kind of can vertical calibration image planes and optical axis zoom displaing microparticle track arrangement, first piece of spectroscope, with first piece
The mirror block of spectroscope uniform thickness, facula position detector I, hollow pyramid, second piece of spectroscope and facula position detector II are all solid
It is scheduled on rectangular structure base board and constitutes double facula position probe units, facula position detector I and facula position detector II divide
It is not fixed with two symmetric side of rectangular structure base board, facula position detector image-forming face is parallel with two symmetric sides, rectangular structure base board
Two further pairs claim side difference fixation hollow pyramid and imaging end unit, first piece of spectroscope and second piece of spectroscopical optics point
Smooth surface is coplanar, and two spectroscope odd symmetrys are fixed, the horizontal plane in two spectroscopical optical spectroscopic faces and rectangular structure base board,
Mirror block with first piece of spectroscope uniform thickness is between first piece of spectroscope and facula position detector I, with first piece of spectroscope
The mirror block of uniform thickness participates in the horizontal plane of the optical surface and rectangular structure base board of optical effect, and double facula position probe units are determined
Fixed right-handed coordinate system origin is hollow pyramid angle point, and X-coordinate axle is parallel with cuboid substrate level face and is directed toward imaging end
Unit；It is single can to enter to inject double facula position detections for the Gaussian beam that optical fiber type laser head on attitude regulation platform is exported
Member can be detected its beam direction vector；Convex lens is fixed on rectangular structure base board close to imaging end unit position, optical axis with
Cuboid substrate level face is parallel；Configure ccd detector beside optical fiber type laser head, ccd detector not interference optical fiber formula laser
The attitude regulation of head, and attitude regulation platform and ccd detector are fixed in switching fixed plate, and attitude regulation platform, optical fiber type swash
Shaven head, ccd detector and switching fixed plate constitute imaging end unit, which can be fixed on by fixed plate of transferring
Cuboid substrate side surfaces could be secured on six-freedom micro displacement regulating platform；When imaging end unit is fixed on rectangular structure base board
When ccd detector imaging surface intersect vertically with convex lens optical axis, and ccd detector imaging surface is less than with convex lens centre distance
Equal to the focal length of convex lens；Six-freedom micro displacement regulating platform is connected to the X-coordinate that can be determined along double facula position probe units
On the displacement movement platform of axis direction movement；The sample cell of nano particle is placed below convex lens, and folding is placed below sample cell
Optical plane microscope group in making Gaussian beam from the incidence of sample cell side into sample cell, and ensures to transmit the Gaussian beam of sample cell
Optical effect does not occur with convex lens and ccd detector imaging surface.
The invention has the characteristics that and good result：
Displacement platform moves to different location, and convex lens can observe and measure nanometer under different enlargement ratios from ccd detector
Grain movement locus, instructs six-freedom micro displacement regulating platform to being imaged end unit caused by displacement by obtained beam direction vector
Posture, which changes, carries out posture return adjusting, while ensureing that optical axis is vertical with ccd detector imaging surface, moreover it is possible to obtain in different positions
Micro- enlargement ratio when pan position.
Description of the drawings
Fig. 1 be can vertical calibration image planes and optical axis zoom displaing microparticle track arrangement stationary state when schematic diagram
Fig. 2 be can vertical calibration image planes and optical axis zoom displaing microparticle track arrangement operating status when schematic diagram
In figure：1 first piece of spectroscope, 2 and the mirror block of first piece of spectroscope uniform thickness, 3 facula position detectors I, 4 hollow pyramids, 5
Second piece of spectroscope, 6 facula position detectors II, 7 rectangular structure base boards, 8 attitude regulation platforms, 9 optical fiber type laser heads, 10 convex lens
Mirror, 11 ccd detectors, 12 switching fixed plates, 13 six-freedom micro displacement regulating platforms, 14 displacement movement platforms, 15 sample cells, 16 foldings
Optical plane microscope group.
Specific implementation mode
The specific embodiment of the invention is described in further detail below in conjunction with the accompanying drawings.
It is a kind of can vertical calibration image planes and optical axis zoom displaing microparticle track arrangement, first piece of spectroscope 1, with first piece
4, second pieces of spectroscopes 5 of mirror block 2, facula position detector I 3, hollow pyramid and facula position detector II 6 of spectroscope uniform thickness
It is all fixed on rectangular structure base board 7 and constitutes double facula position probe units, facula position detector I 3 and facula position detection
Device II 6 is fixed with 7 liang of symmetric sides of rectangular structure base board respectively, and facula position detector image-forming face is parallel with two symmetric sides, long
7 two further pairs of cube substrate claim side difference fixation hollow pyramid 4 and imaging end unit, first piece of spectroscope 1 and the second piece point
The optical spectroscopic face of light microscopic 5 is coplanar, and two spectroscope odd symmetrys are fixed, two spectroscopical optical spectroscopic faces and rectangular structure base board
7 horizontal plane, with the mirror block 2 of first piece of spectroscope uniform thickness be located at first piece of spectroscope 1 and facula position detector I 3 it
Between, the horizontal plane of the optical surface and rectangular structure base board 7 of optical effect is participated in the mirror block 2 of first piece of spectroscope uniform thickness, it is double
The right-handed coordinate system origin that facula position probe unit is determined is 4 angle point of hollow pyramid, X-coordinate axle and rectangular structure base board 7
Horizontal plane is parallel and is directed toward imaging end unit；The Gaussian beam that optical fiber type laser head 9 on attitude regulation platform 8 is exported,
Double facula position probe units can be entered to inject, its beam direction vector can be detected；Convex lens 10 is close on rectangular structure base board 7
Imaging end unit position is fixed, and optical axis is parallel with 7 horizontal plane of rectangular structure base board；9 side of optical fiber type laser head configures CCD detection
Device 11, the attitude regulation of the not interference optical fiber formula laser head 9 of ccd detector 11, and attitude regulation platform 8 and ccd detector 11 are solid
It is scheduled in switching fixed plate 12, attitude regulation platform 8, optical fiber type laser head 9, ccd detector 11 and switching fixed plate 12 constitute
It is imaged end unit, which can be fixed on 7 side of rectangular structure base board by fixed plate 12 of transferring, and could be secured to six certainly
By on degree micro-positioning regulators platform 13；11 imaging surface of ccd detector and convex lens when being imaged end unit and being fixed on rectangular structure base board 7
10 optical axises intersect vertically, and 11 imaging surface of ccd detector and convex lens（10）Centre distance is less than or equal to the coke of convex lens 10
Away from；Six-freedom micro displacement regulating platform 13 is connected to what the X-coordinate axis direction that can be determined along double facula position probe units moved
On displacement movement platform 14；The sample cell 15 of nano particle is placed on 10 lower section of convex lens, and refractive power plane is placed below sample cell
Microscope group 16 in making Gaussian beam from 15 side incidence of sample cell into sample cell 15, and ensures to transmit the Gauss light of sample cell 15
Optical effect occurs for Shu Buyu convex lenses 10 and 11 imaging surface of ccd detector.
The convex lens 10 can be the convex lens of arbitrary focal length.
The refractive power plane microscope group 16 can be in capable of making Gaussian beam from 15 side incidence of sample cell into sample cell 15,
And ensure that with convex lens 10 and 11 imaging surface of ccd detector does not occur for the Gaussian beam for transmiting sample cell 15 appointing for optical effect
Meaning optical element.
It is a kind of can vertical calibration image planes and optical axis zoom displaing microparticle track approach, steps are as follows for this method：
（1）Optical fiber type laser head 9 exports Gaussian beam, the Gaussian beam first piece of spectroscope 1 of incidence, by first piece of spectroscope 1
It is incident on facula position detector I 3 after the mirror block 2 of the Gaussian Beam of reflection and first piece of spectroscope uniform thickness, transmitted through
The Gaussian beam of one piece of spectroscope 1 enters and injects in hollow pyramid 4, after the reflection of hollow pyramid 4, incident second piece of spectroscope 5,
It is incident on facula position detector II 6 by the Gaussian beam that second piece of spectroscope 5 reflects, transmitted through second piece of spectroscope 5
Gaussian beam enters to inject on 11 imaging surface of ccd detector to intersect vertically with 10 optical axis of convex lens after planoconvex lens 10；
（2）Above-mentioned spectroscope 1,2,5, mirror block 2, facula position detector 3,6 and hollow angle with first piece of spectroscope uniform thickness
Cone 4 is all fixed on rectangular structure base board 7, to constitute the double facula positions detection list that can detect incident beam direction vector
Member, therefore incident Gaussian beam unit direction vector therein in the determined coordinate system of double facula position probe units can be obtained
(,,), which measures expression formula and is,,, wherein
WithFor positional value of the hot spot on facula position detector I 3 and II 6 test surfaces, and、WithFor known constants,；
（3）Pitching and the beat that optical fiber type laser head 9 is adjusted by the attitude regulation platform 8 of optical fiber type laser head 9, make it be emitted
Gaussian beam unit direction vector is (- 1,0,0), then, by optical fiber type laser head 9 and its attitude regulation platform 8, ccd detector
The 11 imaging end units formed with switching fixed plate 12 are removed from 7 side of rectangular structure base board, are installed to and displacement movement platform 14 connects
On the six-freedom micro displacement regulating platform 13 connect, and make the Gaussian beam that optical fiber type laser head 9 is emitted back into injecting double hot spots
Position detection unit is simultaneously detected its unit direction vector, according to the unit direction vector that measurement obtains, adjusts six degree of freedom
Micro-positioning regulators platform 13, to make the Gaussian beam unit direction vector that optical fiber type laser head 9 is emitted be (- 1,0,0) again, and
Make on 11 imaging surface of ccd detector the center of launching spot identical as before dismounting, displacement movement platform 14 can be along X-coordinate axle
Back and forth movement is done in direction, after each displacement movement, end unit pitching beat is imaged caused by displacement movement and offset is drawn
The change of launching spot center on 11 imaging surface of Gaussian beam unit direction vector and ccd detector risen, all by this
The adjusting of six-freedom micro displacement regulating platform 13 carries out it return compensation, and the moving displacement range interior energy of displacement movement platform 14 is realized
10 center of convex lens is less than or equal to the focal length of convex lens 10 with ccd detector 11 imaging surface distance, can also realize in convex lens 10
The heart is more than with 11 imaging surface distance of ccd detector, after displacement movement platform reaches certain displaced position, on ccd detector imaging surface
The radius of launching spot is denoted as, and remember that its minimum value is；
（4）It is defined from gauss light beam waistFor the waist radius of the Gaussian beam after convex lens 10, ccd detector
11 imaging surfaces and 10 centre distance of convex lensFor image distance, it with、Relational expression is,
In,It therefore after displacement movement platform 14 moves to certain position, is obtained by the position for Gaussian beam wavelength,
Image distance is calculated；
（5）Displacement movement platform 14 moves to image distanceIt is more thanThe sample cell 15 for filling nano particle is placed on convex by certain position
10 lower section of lens, in order to nano particle in micro-imaging sample cell 15, according to focal length of lens when lens micro-imaging, image distanceAnd object distanceRelational expression, need to realize that 15 upper end horizontal plane of sample cell is less than with 10 centre distance of convex lens, i.e. object distanceLocation point is in below 15 upper end horizontal plane of sample cell, then, under sample cell 15
Refractive power plane microscope group 16 is placed by side, irradiates nanometer therein in making Gaussian beam from 15 side incidence of sample cell into sample cell 15
Grain, and ensure that with convex lens 10 and 11 imaging surface of ccd detector optical effect does not occur for the Gaussian beam for transmiting sample cell 15,
Finally, can be existed by convex lens 10 and ccd detector 11Micro-imaging observation and measurement under enlargement ratio
Apart from 10 center of convex lens in sample cell 15Nanoparticle movement track at position, 14 displacement of displacement movement platform
Move to image distanceIt is more thanDifferent location correspond to different enlargement ratios, to realize zoom displaing microparticle track following
Analysis.
Claims (4)
1. it is a kind of can vertical calibration image planes and optical axis zoom displaing microparticle track approach, it is characterised in that this method step is such as
Under：
（1）Optical fiber type laser head exports Gaussian beam, and the Gaussian beam first piece of spectroscope of incidence is reflected by first piece of spectroscope
Gaussian Beam and first piece of spectroscope uniform thickness mirror block after be incident on facula position detector I, transmitted through the first piece point
The Gaussian beam of light microscopic enters and injects in hollow pyramid, after the reflection of hollow pyramid, incident second piece of spectroscope, by the second piece point
The Gaussian beam of light microscopic reflection is incident on facula position detector II, transmitted through second piece of spectroscopical Gaussian beam, through convex
Enter after lens and injects on the ccd detector imaging surface to intersect vertically with convex lens optical axis；
（2）Above-mentioned spectroscope is all fixed on the mirror block, facula position detector and hollow pyramid of first piece of spectroscope uniform thickness
On rectangular structure base board, to constitute the double facula position probe units that can detect incident beam direction vector, therefore can be with
Obtain incidence Gaussian beam unit direction vector therein in double determined coordinate systems of facula position probe unit (,,), it should
Unit direction vector measures expression formula,,, whereinWithIt is hot spot in hot spot
Positional value on position sensor I and II test surface, and、WithFor known constants,；
（3）Pitching and the beat of optical fiber type laser head, the height for making it be emitted are adjusted by the attitude regulation platform of optical fiber type laser head
This light beam unit direction vector is (- 1,0,0), then, by optical fiber type laser head and its attitude regulation platform, ccd detector and is turned
The imaging end unit for connecing fixed plate composition is removed from cuboid substrate side surfaces, is installed to the six degree of freedom being connect with displacement movement platform
On micro-positioning regulators platform, and make the Gaussian beam that optical fiber type laser head is emitted back into injecting double facula position probe units and quilt
Its unit direction vector is detected, according to the unit direction vector that measurement obtains, six-freedom micro displacement regulating platform is adjusted, to make
The Gaussian beam unit direction vector of optical fiber type laser head outgoing is again (- 1,0,0), and is made on ccd detector imaging surface
The center of launching spot is identical as before dismounting, and displacement movement platform can do back and forth movement along X-coordinate axis direction, in each position
After shifting movement, Gaussian beam unit direction vector caused by end unit pitching beat and offset is imaged caused by displacement movement
With the change of launching spot center on ccd detector imaging surface, all pass through the adjusting pair of the six-freedom micro displacement regulating platform
It carries out return compensation, the moving displacement range interior energy of displacement movement platform realize convex lens center and ccd detector imaging surface away from
From the focal length less than or equal to convex lens, can also realize that convex lens center is more than with ccd detector imaging surface distance, displacement fortune
After dynamic platform reaches certain displaced position, the radius of launching spot is denoted as on ccd detector imaging surface, and remember that its minimum value is；
（4）It is defined from gauss light beam waistFor the waist radius of the Gaussian beam after convex lens, ccd detector imaging
Face and convex lens centre distanceFor image distance, it with、Relational expression is, whereinFor Gauss
Therefore light beam wavelength after displacement movement platform moves to certain position, is obtained by the position, picture can be calculated
Away from；
（5）Displacement movement platform moves to image distanceIt is more thanThe sample cell for filling nano particle is placed under convex lens by certain position
Side, in order to nano particle in micro-imaging sample cell, according to focal length of lens when lens micro-imaging, image distanceAnd object distanceIt closes
It is formula, need to realize that sample cell upper end horizontal plane is less than with convex lens centre distance, i.e. object distanceLocation point is in below the horizontal plane of sample cell upper end, then, refractive power plane microscope group is placed below sample cell,
Nano particle therein is irradiated in making Gaussian beam from the incidence of sample cell side into sample cell, and ensures to transmit the height of sample cell
With convex lens and ccd detector imaging surface optical effect, which does not occur, for this light beam finally can pass through convex lens and CCD detection
Device existsMicro-imaging is observed and is measured in sample cell apart from convex lens center under enlargement ratioAt position
Nanoparticle movement track, displacement movement platform displacement movement to image distanceIt is more thanDifferent location correspond to different enlargement ratios, to realize the analysis of zoom displaing microparticle track following.
2. it is a kind of can vertical calibration image planes and optical axis zoom displaing microparticle track arrangement, first piece of spectroscope（1）And first piece
The mirror block of spectroscope uniform thickness（2）, facula position detector I（3）, hollow pyramid（4）, second piece of spectroscope（5）And facula position
Detector II（6）All it is fixed on rectangular structure base board（7）On constitute double facula position probe units, facula position detector I（3）
With facula position detector II（6）Respectively with rectangular structure base board（7）Two symmetric sides are fixed, facula position detector image-forming face with
Two symmetric sides are parallel, rectangular structure base board（7）Two further pairs claim side to distinguish fixation hollow pyramid（4）With imaging end unit, the
One piece of spectroscope（1）With second piece of spectroscope（5）Optical spectroscopic face it is coplanar, and two spectroscope odd symmetrys are fixed, two light splitting
The optical spectroscopic face of mirror and rectangular structure base board（7）Horizontal plane, the mirror block with first piece of spectroscope uniform thickness（2）Positioned at first
Block spectroscope（1）With facula position detector I（3）Between, the mirror block with first piece of spectroscope uniform thickness（2）Participate in optical effect
Optical surface and rectangular structure base board（7）Horizontal plane, the right-handed coordinate system origin that double facula position probe units are determined is
Hollow pyramid（4）Angle point, X-coordinate axle and rectangular structure base board（7）Horizontal plane is parallel and is directed toward imaging end unit；It is characterized in that
Positioned at attitude regulation platform（8）On optical fiber type laser head（9）It is single can to enter to inject double facula position detections for the Gaussian beam exported
Member can be detected its beam direction vector；Convex lens（10）In rectangular structure base board（7）It is upper to be fixed close to imaging end unit position,
Its optical axis and rectangular structure base board（7）Horizontal plane is parallel；Optical fiber type laser head（9）Side configures ccd detector（11）, CCD detection
Device（11）Not interference optical fiber formula laser head（9）Attitude regulation, and attitude regulation platform（8）And ccd detector（11）It is fixed on
Switching fixed plate（12）On, attitude regulation platform（8）, optical fiber type laser head（9）, ccd detector（11）With switching fixed plate（12）
Imaging end unit is constituted, which passes through fixed plate of transferring（12）Rectangular structure base board can be fixed on（7）Side also may be used
It is fixed on six-freedom micro displacement regulating platform（13）On；When imaging end unit is fixed on rectangular structure base board（7）Ccd detector when upper
（11）Imaging surface and convex lens（10）Optical axis intersects vertically, and ccd detector（11）Imaging surface and convex lens（10）Centre-to-centre spacing
From less than or equal to convex lens（10）Focal length；Six-freedom micro displacement regulating platform（13）List can be detected along double facula positions by being connected to
The displacement movement platform for the X-coordinate axis direction movement that member is determined（14）On；The sample cell of nano particle（15）It is placed on convex lens
（10）Refractive power plane microscope group is placed in lower section below sample cell（16）, make Gaussian beam from sample cell（15）Side incidence sample introduction
Product pond（15）In, and ensure to transmit sample cell（15）Gaussian beam not with convex lens（10）And ccd detector（11）Imaging
Optical effect occurs for face.
3. it is according to claim 2 can vertical calibration image planes and optical axis zoom displaing microparticle track arrangement, feature exists
In the convex lens（10）It can be the convex lens of arbitrary focal length.
4. it is according to claim 2 can vertical calibration image planes and optical axis zoom displaing microparticle track arrangement, feature exists
In the refractive power plane microscope group（16）Can Gaussian beam can be made from sample cell（15）Side incidence is into sample cell（15）In,
And ensure to transmit sample cell（15）Gaussian beam not with convex lens（10）And ccd detector（11）Imaging surface occurs optics and makees
Arbitrary optical element.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810165151.0A CN108387489A (en) | 2018-02-27 | 2018-02-27 | Can vertical calibration image planes and optical axis zoom displaing microparticle track approach and device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201810165151.0A CN108387489A (en) | 2018-02-27 | 2018-02-27 | Can vertical calibration image planes and optical axis zoom displaing microparticle track approach and device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110161008A (en) * | 2019-06-04 | 2019-08-23 | 山东理工大学 | Common optical axis degree and amplification factor can self-alignment fluorescent grain tracing method and devices |
-
2018
- 2018-02-27 CN CN201810165151.0A patent/CN108387489A/en not_active Withdrawn
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110161008A (en) * | 2019-06-04 | 2019-08-23 | 山东理工大学 | Common optical axis degree and amplification factor can self-alignment fluorescent grain tracing method and devices |
| CN110161008B (en) * | 2019-06-04 | 2021-10-29 | 山东理工大学 | Fluorescent particle tracing method and device with self-calibration of coaxial-axis degree and amplification factor |
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Application publication date: 20180810 |