CN205691077U - A kind of optical axis tests device with the datum clamp face depth of parallelism - Google Patents

A kind of optical axis tests device with the datum clamp face depth of parallelism Download PDF

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Publication number
CN205691077U
CN205691077U CN201620638234.3U CN201620638234U CN205691077U CN 205691077 U CN205691077 U CN 205691077U CN 201620638234 U CN201620638234 U CN 201620638234U CN 205691077 U CN205691077 U CN 205691077U
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ccd
optical axis
parallelism
clamp face
datum clamp
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高倩
丁鉴彬
陶小凯
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Shandong Sheenrun Optics Electronics Co Ltd
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Shandong Sheenrun Optics Electronics Co Ltd
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Abstract

Optical axis of the present utility model tests device with the datum clamp face depth of parallelism, including optical alignment system, ccd image sensor, image pick-up card and computer, the optical axis of optical alignment system and the optical axis coincidence of ccd image sensor, and parallel with the datum clamp face of system under test (SUT);Being characterised by: be provided with change-over panel on the focal plane of optical alignment system, laser facula is converted to the visible ray that can be detected by CCT imageing sensor by upper change-over panel by infrared light;Visible light spot after conversion and original iraser hot spot have one-to-one relationship pixel-by-pixel, the image that CCD photosurface is received by image pick-up card is acquired, and by image information transmission to computer, computer realizes the depth of parallelism of system under test (SUT) is tested and calibrated by processing hot spot.Electricity testing device of the present utility model, it is achieved that the depth of parallelism of laser illuminator optical axis is tested and calibration, relative to existing detection method, there is the easy to detect and higher advantage of precision.

Description

A kind of optical axis tests device with the datum clamp face depth of parallelism
Technical field
This utility model relates to a kind of optical axis and tests device with the datum clamp face depth of parallelism, in particular, particularly relates to A kind of sightless laser facula is converted into the optical axis that visible light spot carries out processing again tests with the datum clamp face depth of parallelism Device.
Background technology
Along with the development of modern photoelectron technology, electro-optical system is the most no longer the application of single photoelectric sensor, but shape Become the integrated application of system engineering, become multispectral, multisensor, the integrated application that multi-pass merges, become multispectral, many Sensor, the modern comprehensive electro-optical system that multi-pass merges.At this in comprehensive electro-optical system, the collimation of optical axis be one important Index parameter.For by range finder using laser, the electro-optical system that television camera, 3 kinds of sensors of thermal imaging system merge, steady at one On fixed platform during binding combination, it is necessary to the detection optical axis of 3 sensors is carried out accurate adjustment, makes the collimation of 3 optical axises reach To certain requirement, can ensure that Opto-electrical Section overall view is taken aim at and the concordance in direction of finding range, thus play and accurately indicate target, play light The effect of electricity System Combat Effectiveness.
Generally, multispectral, multiple-sensor integration electro-optical system is the most all collection Display Aim Taking on TV Set, thermal imagery detection, laser Find range in the photoelectric comprehensive body of one.Their difference is laser cell, and in some systems, laser cell simply possesses Distance measurement function, and in some systems, laser cell not only has distance measurement function, is also equipped with irradiating function.The most that configuration, When adjustment optical axis and performance test, it is typically all on the basis of laser beam axis.In electro-optical system, luffing mechanism is Opto-electrical Section That unites surely takes aim at platform, and each sensor is placed on the optical bench of interior pitching frame.Due to sensor spectrum during each working sensor Dimensional discrepancy is relatively big, relates to spectral region wider, the limitation of structure and the restriction in sensor detection aperture, the span of each optical axis Degree interval is big, is required to special heavy caliber reflective parallel light pipe time therefore to light axis consistency adjustment, test.Traditional detection Method automaticity is relatively low, it is difficult to realize the adjusting and measuring on line of optical axis, and accuracy of detection is the lowest.
Summary of the invention
This utility model is for the shortcoming overcoming above-mentioned technical problem, it is provided that a kind of optical axis and the datum clamp face depth of parallelism Test device.
Optical axis of the present utility model tests device with the datum clamp face depth of parallelism, passes including optical alignment system, ccd image Sensor, image pick-up card and computer, the optical axis of optical alignment system and the optical axis coincidence of ccd image sensor, and with tested The datum clamp face of system is parallel;The laser facula that system under test (SUT) is sent by optical alignment system is focused, and ccd image senses Device is made up of CCD object lens and CCD photosurface;It is characterized in that: on the focal plane of described optical alignment system, be provided with conversion Plate, laser facula is converted to the visible ray that can be detected by CCT imageing sensor by upper change-over panel by infrared light, and through CCD thing Mirror is imaged on CCD photosurface;Visible light spot after conversion and original iraser hot spot have one_to_one corresponding pixel-by-pixel Relation, the image that CCD photosurface is received by image pick-up card is acquired, and by image information transmission to computer, calculates Machine realizes the depth of parallelism of system under test (SUT) is tested and calibrated by processing hot spot.
Optical axis of the present utility model tests device with the datum clamp face depth of parallelism, described upper change-over panel is carved with cross and divides Drawing, the electric cross-graduation that the cross-graduation on upper change-over panel produces with ccd image sensor is strictly directed at, after guaranteeing conversion Hot spot has the most corresponding relation with original laser hot spot.
Optical axis of the present utility model tests device with the datum clamp face depth of parallelism, and described optical alignment system uses heavy caliber Formula collimator, its effective clear aperature is not less than 300mm, and the clear aperature inner light beam depth of parallelism is not more than 5, and heavy caliber formula is parallel In light pipe, the focal length of object lens is 3000mm, to ensure its image quality.
The beneficial effects of the utility model are: optical axis of the present utility model and the datum clamp face depth of parallelism test device, logical Cross setting optical alignment system that is parallel with datum clamp face and that be coaxially disposed and ccd image sensor, and in optical alignment It is provided on the focal plane of system iraser hot spot is converted into CCD discernible visible light lasers hot spot, effectively will The hot spot of ccd image sensor collection is mapped with laser facula, by the process to visible light spot, can obtain laser Hot spot is relative to the deviation angle of datum clamp face and direction, it is achieved that test the depth of parallelism of laser illuminator optical axis and school Standard, has the easy to detect and higher advantage of longitude.
Accompanying drawing explanation
Fig. 1 is the structural representation of optical axis of the present utility model and datum clamp face depth of parallelism test device;
In figure: 1 system under test (SUT), 2 optical alignment system, change-over panel on 3,4 ccd image sensors, 5 image pick-up cards, 6 Computer, 7 CCD object lens, 8 CCD photosurfaces.
Detailed description of the invention
The utility model is described in further detail with embodiment below in conjunction with the accompanying drawings.
As it is shown in figure 1, give the structural representation of optical axis of the present utility model and datum clamp face depth of parallelism test device Scheming, it is made up of optical alignment system 2, upper change-over panel 3, ccd image sensor 4, image pick-up card 5 and computer 6, and optics is accurate The optical axis of lineal system 2 and the optical axis coincidence of ccd image sensor 4, and all parallel with the datum clamp face of laser illuminator, upper turn Changing plate 3 to be positioned on the focal plane of optical alignment system 2, the laser facula that system under test (SUT) 1 sends is focused to by optical alignment system 2 On upper change-over panel 3, ccd image sensor 4 is made up of CCD object lens 7 and CCD photosurface 8.Upper change-over panel 3 by laser facula by red Outer light is converted to the visible ray that can be arrived by CCD detection, is imaged on CCD photosurface 8 through CCD object lens 7, and upper change-over panel 3 also will Laser facula residence time on CCD photosurface 8 extends.Laser facula after conversion becomes pixel-by-pixel with original laser facula Corresponding relation.Gather through image pick-up card 5, be transferred to representation of laser facula information on computer 6 to carry out hot spot The centre of form, size, the process of barycenter technical parameter.
Optical alignment system 2 uses heavy caliber formula collimator, and its effective clear aperature is not less than 300mm, objective focal length For 3000mm, the clear aperature inner light beam depth of parallelism is not more than 5, and this design structure ensure that the image quality of optical system.
Upper change-over panel 3 is a kind of novel device of infra detect-transmit, can be converted to visible by the laser of infrared band The HONGGUANG of optical band.Hot spot residence time on CCD photosurface 8 can be made simultaneously to extend, make ccd image sensor 4 be easy to Detect the laser of list, low frequency and narrow pulse.This device has that conversion quantum efficiency is high, the infrared response time is short, under room temperature condition The features such as work, Heat stability is good.Upper change-over panel 3 is carved with cross-graduation, and the electric cross produced with ccd image sensor 4 divides Draw strict alignment.
In photoeletric measuring system, do reception device with CCD solid imaging device, it is achieved that objectifying, automatically of measurement Change and digitized.Laser facula forms optical imagery on CCD photosurface 8, and optical imagery is converted to by ccd image sensor 8 Export with the video signal of intensity proportional.Signal is passed to carry out recording and subsequent treatment on computer 6 by image pick-up card 5.
During detection, before system under test (SUT) 1 is placed in heavy caliber collimator object lens, upper change-over panel 3 is fixed on heavy caliber On the back focal plane of collimator, it is carved with cross-graduation above.With the cross of change-over panel on television camera small field of view cross hair Graduation, and make the two overlap.It is allowed to work to ccd image sensor 4 energising, opens computer and enter image acquisition procedure, this Time should be only able to display the electric cross-graduation of CCD.System under test (SUT) 1 sends laser illuminator, and at this moment ccd image sensor 4 just can gather To the image of laser facula, and can record on computer 6.

Claims (3)

1. optical axis tests a device with the datum clamp face depth of parallelism, including optical alignment system (2), ccd image sensor (4), image pick-up card (5) and computer (6), the optical axis of optical alignment system and the optical axis coincidence of ccd image sensor, and with The datum clamp face of system under test (SUT) (1) is parallel;The laser facula that system under test (SUT) is sent by optical alignment system is focused, CCD Imageing sensor is made up of CCD object lens (7) and CCD photosurface (8);It is characterized in that: the focal plane of described optical alignment system On be provided with change-over panel (3), laser facula is converted to be detected by ccd image sensor by upper change-over panel by infrared light Visible ray, and be imaged on CCD photosurface through CCD object lens;Visible light spot after conversion has with original iraser hot spot Having one-to-one relationship pixel-by-pixel, the image that CCD photosurface is received by image pick-up card is acquired, and image information is transmitted To computer, computer realizes the depth of parallelism of system under test (SUT) is tested and calibrated by processing hot spot.
Optical axis the most according to claim 1 tests device with the datum clamp face depth of parallelism, it is characterised in that: described upper conversion Being carved with cross-graduation on plate (3), the electric cross-graduation that the cross-graduation on upper change-over panel and ccd image sensor produce is the most right Standard, has the most corresponding relation with the hot spot after guaranteeing conversion with original laser hot spot.
Optical axis the most according to claim 1 and 2 tests device with the datum clamp face depth of parallelism, it is characterised in that: described light Learning colimated light system (2) and use heavy caliber formula collimator, its effective clear aperature is not less than 300mm, and clear aperature inner light beam is put down Row degree is not more than 5, and in heavy caliber formula collimator, the focal length of object lens is 3000mm, to ensure its image quality.
CN201620638234.3U 2016-06-24 2016-06-24 A kind of optical axis tests device with the datum clamp face depth of parallelism Active CN205691077U (en)

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105973171A (en) * 2016-06-24 2016-09-28 山东神戎电子股份有限公司 Optical axis and mounting reference surface parallelism test device and method
CN106803953A (en) * 2017-02-21 2017-06-06 上海集成电路研发中心有限公司 It is a kind of to assess the whether parallel device and method of camera focal plane
CN107238938A (en) * 2017-04-27 2017-10-10 云南北方驰宏光电有限公司 Transmission-type infrared collimator collimator objective
CN109060305A (en) * 2018-07-03 2018-12-21 长春理工大学 A kind of parallel light tube and method eliminated air agitation and introduce error
CN113029198A (en) * 2021-03-16 2021-06-25 西安应用光学研究所 Calibrating device for tracking precision measuring instrument
CN113315929A (en) * 2021-06-07 2021-08-27 广州市长岛光电机械厂 Optical axis consistency adjusting device

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105973171A (en) * 2016-06-24 2016-09-28 山东神戎电子股份有限公司 Optical axis and mounting reference surface parallelism test device and method
CN106803953A (en) * 2017-02-21 2017-06-06 上海集成电路研发中心有限公司 It is a kind of to assess the whether parallel device and method of camera focal plane
CN107238938A (en) * 2017-04-27 2017-10-10 云南北方驰宏光电有限公司 Transmission-type infrared collimator collimator objective
CN109060305A (en) * 2018-07-03 2018-12-21 长春理工大学 A kind of parallel light tube and method eliminated air agitation and introduce error
CN113029198A (en) * 2021-03-16 2021-06-25 西安应用光学研究所 Calibrating device for tracking precision measuring instrument
CN113029198B (en) * 2021-03-16 2023-03-10 西安应用光学研究所 Calibrating device for tracking precision measuring instrument
CN113315929A (en) * 2021-06-07 2021-08-27 广州市长岛光电机械厂 Optical axis consistency adjusting device
CN113315929B (en) * 2021-06-07 2022-03-25 广州市长岛光电机械厂 Optical axis consistency adjusting device

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