CN108332949A - Luminescent device reliability test case, test device and method - Google Patents
Luminescent device reliability test case, test device and method Download PDFInfo
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- CN108332949A CN108332949A CN201810060240.9A CN201810060240A CN108332949A CN 108332949 A CN108332949 A CN 108332949A CN 201810060240 A CN201810060240 A CN 201810060240A CN 108332949 A CN108332949 A CN 108332949A
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- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
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Abstract
The present invention relates to a kind of luminescent device reliability test case, test device and methods, belong to reliability test technical field, include the luminescent device reliability test case of optic probe, telecontrol equipment and test box ontology by construction, in reliability test, telecontrol equipment moves optic probe to designated position, optic probe is placed in the optical parameter of the luminescent device of fixed position in test box in designated position acquisition, which can be used for reliability test analysis.In the above scheme, luminescent device is integrally fixed in test box ontology, and optical parameter acquisition is carried out to luminescent device to move optic probe using telecontrol equipment, it is possible to reduce error caused by luminescent device movement improves the accuracy of reliability test.
Description
Technical field
The present invention relates to reliability test technical fields, more particularly to a kind of luminescent device reliability test case, test
Device and method.
Background technology
For the luminescent device of manufacture, the performance test for carrying out various aspects is needed, in order to detect the aging of luminescent device
Service life generally requires and carries out reliability test to luminescent device.
In traditional reliability test technology, a kind of means of testing is that rotary-tray is arranged in test box, rotary-tray
On be placed with luminescent device, test when rotary-tray rotate, each luminescent device on rotary-tray is tested respectively.
Luminescent device is in rotation status when due to test, and the equipment precision for acquiring the optical parameter of luminescent device is relatively low
When, there are larger errors for the optical parameter acquired to the luminescent device of rotation, have seriously affected the accuracy of reliability test.
Invention content
Based on this, it is necessary to for the low problem of traditional reliability test mode accuracy, provide a kind of luminescent device
Reliability test case, test device and method.
A kind of luminescent device reliability test case, including optic probe, telecontrol equipment and test box ontology；
Optic probe is set in test box ontology and connects spectrometer, and telecontrol equipment is arranged on test box ontology and is used for
Mobile optic probe；
In reliability test, telecontrol equipment moves optic probe to designated position, and optic probe is acquired in designated position and sent out
The optical parameter of optical device, wherein luminescent device is placed in the fixed position in test box.
Include optic probe, telecontrol equipment by construction according to the luminescent device RTA reliability test assembly of aforementioned present invention
With the luminescent device reliability test case of test box ontology, in reliability test, telecontrol equipment moves optic probe to specific bit
It sets, optic probe is placed in the optical parameter of the luminescent device of fixed position in test box, the Optical Parametric in designated position acquisition
Number can be used for reliability test analysis.In the above scheme, luminescent device is integrally fixed in test box ontology, utilizes movement
Device carries out optical parameter acquisition to move optic probe to luminescent device, it is possible to reduce caused by luminescent device movement accidentally
Difference improves the accuracy of reliability test.
Luminescent device reliability test case further includes being arranged in the intrinsic carrying of test box in one of the embodiments,
Device is provided with station on bogey, and station is correspondingly arranged on fixture, and fixture is used to luminescent device being fixed on station.
Conveyer belt is provided on bogey in one of the embodiments, the both ends of conveyer belt pass through test box ontology
Dodge gate, conveyer belt is for transporting luminescent device to station.
It is provided with multiple stations on bogey in one of the embodiments, the position of each station and telecontrol equipment
Movement locus is corresponding, and when optic probe is moved to the position of corresponding station with telecontrol equipment, the optical signal of optic probe connects
Receive the luminous site of the luminescent device on the accurate station.
A kind of luminescent device RTA reliability test assembly, including host computer, programmable controller and above-mentioned luminescent device can
By property test box；
Host computer is connect by programmable controller with telecontrol equipment, and the movement of controlled motion device is used for.
Include host computer, PLC technology by construction according to the luminescent device RTA reliability test assembly of aforementioned present invention
The RTA reliability test assembly of device, optic probe, telecontrol equipment and test box ontology carries out luminescent device using the test device
When reliability test, host computer can be by programmable controller controlled motion device, and then adjusts optics on telecontrol equipment and visit
The position of head obtains the optical parameter of luminescent device in test box using optic probe, and photophore is obtained using the optical parameter
The process of the reliability data of part, above-mentioned reliability test and optical detection can be in the survey of luminescent device RTA reliability test assembly
It is completed together in examination case, shortens the reliability test time, and can be to surveying in such a way that telecontrol equipment moves optic probe
Multiple luminescent devices in examination case are tested, and avoid being replaced as frequently as luminescent device, reduce the error of batch detection, are improved and are surveyed
The accuracy of test result, and test process can be controlled by host computer, realize that the automation of test process, raising can
By property testing efficiency.
Luminescent device reliability test case further includes being arranged in the intrinsic carrying of test box in one of the embodiments,
Device is provided with station on bogey, and station is correspondingly arranged on fixture, and fixture is used to luminescent device being fixed on station；
Host computer is connect by programmable controller with fixture, and the open and-shut mode of fixture is controlled by programmable controller.
Conveyer belt is provided on bogey in one of the embodiments, the both ends of conveyer belt pass through test box ontology
Dodge gate, host computer passes through the rotary electric machine that programmable controller controls conveyer belt, and transport luminescent device is to station.
Luminescent device RTA reliability test assembly further includes programmable power supply and spectrometer in one of the embodiments,；
Host computer is connect with luminescent device reliability test case, and host computer is for controlling luminescent device reliability test case
Test condition；
Host computer is also connect with spectrometer, and host computer is also connect with programmable power supply, programmable power supply be used for luminescent device into
Row power supply, host computer are controlled the break-make that programmable power supply exports by programmable controller, control the operation of spectrometer and read light
The detection data of spectrometer.
Test box ontology includes temperature control test box, humid control test box or warm and humid in one of the embodiments,
Degree control test box；
Host computer is used to control the range of temperature and rate of temperature control test box；
Alternatively, host computer is used to control the humidity amplitude of variation and rate of humid control test box；
Alternatively, host computer is used for while controlling the humidity amplitude of variation and rate and temperature change of Temperature and Humidity Control test box
Amplitude and rate.
A kind of method for testing reliability based on above-mentioned luminescent device RTA reliability test assembly, includes the following steps：
The test condition of PC control test box ontology；
Host computer drives luminescent device to shine by programmable controller and programmable power supply；
Host computer is moved by programmable controller controlled motion device, and optic probe is moved to corresponding luminescent device
Position obtains the optical parameter of luminescent device within a preset period of time by spectrometer and optic probe；
Host computer by programmable power supply obtain driving luminescent device electrical parameter, according to test condition, electrical parameter and
Optical parameter obtains the reliability data of luminescent device.
According to the luminescent device method for testing reliability of aforementioned present invention, the test-strips of PC control test box ontology
Part；Luminescent device is driven to shine by programmable controller and programmable power supply；The position of optic probe is adjusted by telecontrol equipment,
The optical parameter of luminescent device within a preset period of time is obtained using spectrometer and optic probe；It is obtained and is driven by programmable power supply
The electrical parameter of dynamic luminescent device, the reliability data of luminescent device is obtained according to test condition, electrical parameter and optical parameter.
The above method can carry out reliability test using test box ontology to luminescent device, and hair is obtained by spectrometer and optic probe
The optical parameter of optical device can obtain luminescent device in conjunction with control luminescent device luminous electrical parameter and test condition
Reliability data, the process of above-mentioned reliability test, which can be completed at the same time, shines accelerated ageing and optical parameter to luminescent device
Acquisition, shorten reliability detection time, and telecontrol equipment move optic probe by way of can be in test box
Multiple luminescent devices are tested, and avoid being replaced as frequently as luminescent device, are reduced the error of batch detection, are improved test result
Accuracy, and test process can be controlled by host computer, realize the automation of test process, improve reliability test
Efficiency.
Description of the drawings
Fig. 1 is the structural schematic diagram of the luminescent device reliability test case of one embodiment；
Fig. 2 is the structural schematic diagram of the luminescent device reliability test case of another embodiment；
Fig. 3 is the plan view from above inside the luminescent device reliability test case of one embodiment；
Fig. 4 is the plan view from above inside the luminescent device reliability test case of another embodiment；
Fig. 5 is the structural schematic diagram of the luminescent device RTA reliability test assembly of one embodiment；
Fig. 6 is the structural schematic diagram of the luminescent device RTA reliability test assembly of another embodiment；
Fig. 7 be one embodiment luminescent device RTA reliability test assembly in fixture position view；
Fig. 8 be another embodiment luminescent device RTA reliability test assembly in fixture position view；
Fig. 9 is the structural schematic diagram of the luminescent device RTA reliability test assembly of another embodiment；
Figure 10 is the structural schematic diagram of the luminescent device RTA reliability test assembly of further embodiment；
Figure 11 is the structural schematic diagram of the luminescent device RTA reliability test assembly of one embodiment；
Figure 12 is the flow diagram of the luminescent device method for testing reliability of one embodiment.
Specific implementation mode
To make the objectives, technical solutions, and advantages of the present invention more comprehensible, with reference to the accompanying drawings and embodiments, to this
Invention is described in further detail.It should be appreciated that the specific embodiments described herein are only used to explain the present invention,
Do not limit protection scope of the present invention.
The embodiment of the present invention can be applied in the scene of the reliability test of various different luminescent devices, therein to shine
Device includes but not limited to LED (Light Emitting Diode, light emitting diode) device, OLED (Organic Light-
Emitting Diode, Organic Light Emitting Diode) device etc..
It is shown in Figure 1, it is the structural schematic diagram of luminescent device reliability test case in one embodiment.In the embodiment
Luminescent device reliability test case include optic probe 110, telecontrol equipment 120 and test box ontology 130；
Optic probe 110 is set in test box ontology 130 and connects spectrometer, and telecontrol equipment 120 is arranged in test box sheet
On body 130 and for moving optic probe 110；
In reliability test, telecontrol equipment 120 moves optic probe 110 to designated position, and optic probe 110 is specified
The optical parameter of station acquisition luminescent device, wherein luminescent device is placed in the fixed position in test box.
In the present embodiment, include shining for optic probe 110, telecontrol equipment 120 and test box ontology 130 by construction
Device reliability test box, in reliability test, telecontrol equipment 120 moves optic probe 110 to designated position, optic probe
110 are placed in the optical parameter of the luminescent device of fixed position in test box in designated position acquisition, which can use
It is analyzed in reliability test.In the above scheme, luminescent device is integrally fixed in test box ontology 130, utilizes telecontrol equipment
120 carry out optical parameter acquisition to move optic probe 110 to luminescent device, it is possible to reduce caused by luminescent device movement accidentally
Difference improves the accuracy of reliability test.
Optionally, telecontrol equipment 120 is arranged in the upper surface of test box ontology 130, and telecontrol equipment 120 is where upper surface
Moved in two dimensional surface, telecontrol equipment 120 move when can with the optic probe 110 inside push to test case ontology 130 into
Row is corresponding mobile.
Optionally, luminescent device can be electroluminescent device, light emitting diode (LED), light emitting transistor, organic light emission
The various types of device for having illumination effect such as diode (OLED), cathode luminescence device.
In one of the embodiments, as shown in Fig. 2, luminescent device reliability test case further includes being arranged in test box sheet
Bogey 140 in body 130 is provided with station on bogey 140, and station is correspondingly arranged on fixture 141, and fixture 141 is used
It is fixed on station in by luminescent device.
In the present embodiment, bogey 140 can be set in test box ontology 130, the bogey 140 is for carrying
Luminescent device, the station on bogey 140 is for disposing luminescent device, the fixture 141 that station is correspondingly arranged to be sent out for fixed
Luminescent device is fixed on station using fixture 141, prevents luminescent device from moving by optical device, is convenient for telecontrol equipment 120 by optics
Probe 110 is moved to exact position and is detected to the optical parameter of luminescent device.
In one of the embodiments, as shown in figure 3, being provided with conveyer belt 142 on bogey 140, conveyer belt 142
Both ends are by the dodge gate of test box ontology 130, and conveyer belt 142 is for transporting luminescent device to station.
In the present embodiment, conveyer belt 142 is provided on bogey 140, conveyer belt 142 passes through test box ontology 130,
It, can be in conjunction with the fixture 141 on bogey 140 for transporting luminescent device to the station position in test box ontology 130
It is automatically performed the movement and fixation of luminescent device, quick reliability detection is carried out to the luminescent device of batch.
It should be noted that the dodge gate of test box ontology 130 is opened when transporting luminescent device, reliability inspection is being carried out
It is closed when survey, with the test condition inside steady testing case ontology 130.Dodge gate can be separately positioned on test box ontology 130
Both sides, 142 straight line of conveyer belt can also be arranged by test box ontology 130 in other two positions of test box, conveyer belt
142 enter test box ontology 130 from a dodge gate, and test box ontology 130 is left from another dodge gate.
In one of the embodiments, as shown in figure 4, being provided with multiple stations on bogey 140, the position of each station
It is corresponding with the movement locus of telecontrol equipment 120, the position of corresponding station is moved to telecontrol equipment 120 in optic probe 110
When, the optical signal receiving plane of optic probe 110 is directed at the luminous site of the luminescent device on the station.
In the present embodiment, the position of each station on bogey 140 is opposite with the movement locus of telecontrol equipment 120
It answers, in test, telecontrol equipment 120 can be moved according to scheduled movement locus, the fixed point on movement locus, light
The luminescent device learned on 110 pairs of corresponding stations of probe carries out optical detection, since the position of station can be fixed, to criticizing
When amount luminescent device is detected, telecontrol equipment 120 repeats to move according to scheduled movement locus, without the position to luminescent device
It sets and judgement is identified, reduce the control complexity of telecontrol equipment 120, improve the reliability detection efficiency of luminescent device.
It should be noted that the luminous site of the optical signal receiving plane alignment luminescent device of optic probe 110, it can be maximum
The optical parameter for detecting to limit luminescent device ensures the validity of optical parameter.
Specifically, the conveyer belt 142 of bogey 140 can be with the multiple luminescent devices of simultaneous transmission to corresponding multiple works
Position, after multiple luminescent devices reach corresponding station, the fixture 141 on station carries out the luminescent device on station
Fixed, telecontrol equipment 120 is moved according to scheduled movement locus, often passes through the fixed point of a station, optic probe 110
Optical detection is carried out to the luminescent device on corresponding station.
According to above-mentioned luminescent device reliability test case, a kind of luminescent device RTA reliability test assembly is also provided, below
The embodiment of luminescent device RTA reliability test assembly is described in detail.
It is shown in Figure 5, it is the structural schematic diagram of the luminescent device RTA reliability test assembly of one embodiment of the invention.It should
Luminescent device RTA reliability test assembly in embodiment, including：Host computer 210, programmable controller 220 and above-mentioned photophore
Part reliability test case；
Host computer 210 is connect by programmable controller 220 with telecontrol equipment 120, and the shifting of controlled motion device 120 is used for
It is dynamic.
Specifically, luminescent device RTA reliability test assembly includes host computer 210, programmable controller 220, optic probe
110, telecontrol equipment 120 and test box ontology 130；
Optic probe 110 is set in test box ontology 130 and connects spectrometer, and telecontrol equipment 120 is arranged in test box sheet
On body 130 and for moving optic probe 110；
In reliability test, telecontrol equipment 120 moves optic probe 110 to designated position, and optic probe 110 is specified
The optical parameter of station acquisition luminescent device, wherein luminescent device is placed in the fixed position in test box.
Host computer 210 is connect by programmable controller 220 with telecontrol equipment 120, and the shifting of controlled motion device 120 is used for
It is dynamic.
In the present embodiment, include host computer 210, programmable controller 220, optic probe 110, sportswear by construction
The RTA reliability test assembly for setting 120 and test box ontology 130 carries out reliability test using the test device to luminescent device
When, host computer 210 can be by 220 controlled motion device 120 of programmable controller, and then adjusts optics on telecontrol equipment 120
The position of probe 110 is obtained the optical parameter of luminescent device in test box using optic probe 110, is obtained using the optical parameter
Take the reliability data of luminescent device, the process of above-mentioned reliability test and optical detection can be in luminescent device reliability test
It is completed together in the test box of device, shortens the reliability test time, and optic probe 110 is moved by telecontrol equipment 120
Mode multiple luminescent devices in test box can be tested, avoid being replaced as frequently as luminescent device, reduce batch and examine
The error of survey improves the accuracy of test result, and test process can be controlled by host computer 210, realizes test
The automation of process improves reliability test efficiency.
In one of the embodiments, as shown in fig. 6, luminescent device reliability test case further includes being arranged in test box sheet
Bogey 140 in body 130 is provided with station on bogey 140, and station is correspondingly arranged on fixture 141, and fixture 141 is used
It is fixed on station in by luminescent device；
Host computer 210 is connect by programmable controller 220 with fixture 141, and fixture is controlled by programmable controller 220
141 open and-shut mode.
In the present embodiment, the fixture 141 in test box on bogey 140 can be connect with programmable controller 220,
Control is opened and closed to fixture 141 by programmable controller 220 in host computer 210, realizes that the automation of luminescent device is fixed.
Optionally, as shown in fig. 7, fixture 141 can be the automatically controlled cuffs being adapted with luminescent device shape, if photophore
Part shape be cuboid-type, can be arranged 2 automatically controlled cuffs luminescent device opposite sides, or setting 4 automatically controlled cuffs
In four sides of luminescent device or four corners；
As shown in figure 8, fixture 141 can also be the combination of spring and baffle, one end of luminescent device is against on baffle, separately
One end is against on spring, fixed luminescent device equally may be implemented, in order to improve fixing intensity, the center of baffle, luminescent device
Center, spring center on the same line.
In one of the embodiments, as shown in figure 9, being provided with conveyer belt 142 on bogey 140, conveyer belt 142
Both ends are by the dodge gate of test box ontology 130, the rotation that host computer 210 passes through the control conveyer belt 142 of programmable controller 220
Motor, transport luminescent device to station.
In the present embodiment, conveyer belt 142 is provided on bogey 140, conveyer belt 142 passes through test box ontology 130,
For luminescent device to transport to the station position to test box, the fixture 141 on binding test case bogey 140 can be with
It is automatically performed the movement and fixation of luminescent device, quick reliability detection is carried out to the luminescent device of batch.
Multiple stations, the position of each station and telecontrol equipment are provided on bogey 140 in one of the embodiments,
120 movement locus is corresponding, when optic probe 110 is moved to the position of corresponding station with telecontrol equipment 120, optic probe
110 optical signal receiving plane is directed at the luminous site of the luminescent device on the station.
In the present embodiment, the position of each station on bogey 140 is opposite with the movement locus of telecontrol equipment 120
It answers, in test, host computer 210 can be by 220 controlled motion device 120 of programmable controller according to scheduled movement locus
It being moved, the fixed point on movement locus, optic probe 110 carries out optical detection to the luminescent device on corresponding station,
Since the position of station can be fixed, when being detected to batch luminescent device, telecontrol equipment 120 is according to scheduled fortune
Dynamic rail mark repeats to move, and judgement is identified without the position to luminescent device, reduces the control complexity of telecontrol equipment 120,
Improve the reliability detection efficiency of luminescent device.
In one of the embodiments, as shown in Figure 10, luminescent device RTA reliability test assembly further includes programmable power supply 230
With spectrometer 240；
Host computer 210 is connect with luminescent device reliability test case, and host computer 210 is for controlling the survey of luminescent device reliability
Try the test condition of case；
Host computer 210 is also connect with spectrometer 240, and host computer 210 is also connect with programmable power supply 230, and programmable power supply 230 is used
It is powered in luminescent device, host computer 210 controls the break-make that programmable power supply 230 exports, control by programmable controller 220
The operation of spectrometer 240 processed and the detection data for reading spectrometer 240.
In the present embodiment, host computer 210 is used to control the test condition of luminescent device reliability test case, spectrometer
240 directly acquire the data that optic probe 110 detects by optical fiber, and spectrometer 240 can be to the optical parameter of luminescent device
It is handled, host computer 210 controls the operation of spectrometer 240 and reads the data of spectrometer 240, and host computer 210 is by that can compile
Range controller 220 can control power supply of the programmable power supply 230 to luminescent device, can obtain electric accordingly when luminescent device shines
Learn parameter, such host computer 210 can under test conditions according to the data of spectrometer 240 and electrical parameter to luminescent device into
Row reliability tests and analyzes, and by the above-mentioned apparatus of construction, can utilize host computer 210 that can complete reliability test and reliable
Property detection and analysis process, shorten the reliability test time, and telecontrol equipment 120 move optic probe 110 by way of can
To test multiple luminescent devices in test box, avoids being replaced as frequently as luminescent device, reduces the error of batch detection,
The accuracy of test result is improved, and test process can be controlled by host computer 210, realize the automatic of test process
Change, improves reliability test efficiency.
Test box ontology 130 includes temperature control test box, humid control test box or temperature in one of the embodiments,
Humid control test box；
Host computer 210 is used to control the range of temperature and rate of temperature control test box；
Alternatively, host computer 210 is used to control the humidity amplitude of variation and rate of humid control test box；
Alternatively, host computer 210 is used for while controlling the humidity amplitude of variation and rate and temperature of Temperature and Humidity Control test box
Amplitude of variation and rate.
In the present embodiment, test box ontology 130 can be temperature control test box, humid control test box or humiture
Test box is controlled, host computer 210 can control the test condition of above-mentioned three kinds of test boxs, wet such as range of temperature and rate
Amplitude of variation and rate are spent, convenient for being detected to the reliability of luminescent device under different test conditions.
Optionally, range of temperature include at least -40 DEG C to 85 DEG C, rate temperature change be greater than or equal to 15 DEG C/
min。
In one of the embodiments, as shown in figure 11, luminescent device RTA reliability test assembly further includes and host computer 210
The display 250 of connection, the test result for showing luminescent device.
The luminescent device RTA reliability test assembly of above-described embodiment is corresponding with luminescent device reliability test case, above-mentioned
The technical characteristic and advantage that the embodiment of luminescent device reliability test case illustrates are suitable for luminescent device reliability
In the embodiment of test box.
According to above-mentioned luminescent device RTA reliability test assembly, also provide a kind of based on above-mentioned luminescent device reliability test dress
The method for testing reliability set is based on the implementation of the method for testing reliability of above-mentioned luminescent device RTA reliability test assembly below
Example is described in detail.
It is shown in Figure 12, it is the reliability test based on above-mentioned luminescent device RTA reliability test assembly of one embodiment
The flow diagram of method.Luminescent device method for testing reliability in the embodiment, includes the following steps：
Step S310：The test condition of PC control test box ontology；
Step S320：Host computer drives luminescent device to shine by programmable controller and programmable power supply；
Step S330：Host computer is moved by programmable controller controlled motion device, and optic probe is moved to correspondence
The position of luminescent device obtains the optical parameter of luminescent device within a preset period of time by spectrometer and optic probe；
Step S340：Host computer obtains the electrical parameter of driving luminescent device by programmable power supply, according to test condition, electricity
It learns parameter and optical parameter obtains the reliability data of luminescent device.
According to the luminescent device method for testing reliability of aforementioned present invention, the test-strips of PC control test box ontology
Part；Luminescent device is driven to shine by programmable controller and programmable power supply；The position of optic probe is adjusted by telecontrol equipment,
The optical parameter of luminescent device within a preset period of time is obtained using spectrometer and optic probe；It is obtained and is driven by programmable power supply
The electrical parameter of dynamic luminescent device, the reliability data of luminescent device is obtained according to test condition, electrical parameter and optical parameter.
The above method can carry out reliability test using test box ontology to luminescent device, and hair is obtained by spectrometer and optic probe
The optical parameter of optical device can obtain luminescent device in conjunction with control luminescent device luminous electrical parameter and test condition
Reliability data, the process of above-mentioned reliability test, which can be completed at the same time, shines accelerated ageing and optical parameter to luminescent device
Acquisition, shorten reliability detection time, and telecontrol equipment move optic probe by way of can be in test box
Multiple luminescent devices are tested, and avoid being replaced as frequently as luminescent device, are reduced the error of batch detection, are improved test result
Accuracy, and test process can be controlled by host computer, realize the automation of test process, improve reliability test
Efficiency.
Method for testing reliability is further comprising the steps of in one of the embodiments,：Before the test begins, host computer is logical
Programmable controller opened clamping apparatus is crossed, when luminescent device is placed on the corresponding station of fixture, host computer passes through PLC technology
Device is closed fixture, to fix luminescent device, wherein be provided with bogey in test box, multiple works are provided on bogey
Position, each station are correspondingly arranged on fixture.
In the present embodiment, the fixture in test box on bogey can be connect with programmable controller, and host computer is logical
It crosses programmable controller and control is opened and closed to fixture, realize that the automation of luminescent device is fixed.
Method for testing reliability is further comprising the steps of in one of the embodiments,：Host computer passes through PLC technology
Device controls the rotary electric machine rotation of transmission belt, is transported luminescent device to station using conveyer belt, wherein conveyer belt setting is being held
It carries and sets, the dodge gate that the both ends of conveyer belt pass through test box ontology；
In the present embodiment, conveyer belt is provided on bogey, conveyer belt passes through test box, for transporting luminescent device
The station position in test box is transported to, the fixture on binding test case bogey can be automatically performed the movement of luminescent device
And fixation, quick reliability detection is carried out to the luminescent device of batch.
It is provided with multiple stations on bogey in one of the embodiments, the position of each station and telecontrol equipment
Movement locus is corresponding, and when optic probe is moved to the position of corresponding station with telecontrol equipment, the optical signal of optic probe connects
Receive the luminous site of the luminescent device on the accurate station.
In the present embodiment, the position of each station on bogey is corresponding with the movement locus of telecontrol equipment, is surveying
When examination, host computer can be moved by programmable controller controlled motion device according to scheduled movement locus, moved
Fixed point on track, optic probe carry out optical detection to the luminescent device on corresponding station, since the position of station can be with
Fixed, when being detected to batch luminescent device, telecontrol equipment according to scheduled movement locus repeat move, without pair
Judgement is identified in the position of luminescent device, reduces the control complexity of telecontrol equipment, improves the reliability detection of luminescent device
Efficiency.
In addition, being acquired to the optical parameter of multiple luminescent devices using optic probe, since multiple luminescent devices are equal
Under identical test environment, host computer can be compared to each other the optical parameter of multiple luminescent devices of acquisition, point
Analyse the consistency of multiple luminescent devices.
Test box ontology includes temperature control test box, humid control test box or warm and humid in one of the embodiments,
Degree control test box；
Host computer is used to control the range of temperature and rate of temperature control test box；
Alternatively, host computer is used to control the humidity amplitude of variation and rate of humid control test box；
Alternatively, host computer is used for while controlling the humidity amplitude of variation and rate and temperature change of Temperature and Humidity Control test box
Amplitude and rate.
In the present embodiment, test box ontology can control test box, humid control test box or Temperature and Humidity Control with temperature
Test box, host computer can control the test condition of above-mentioned three kinds of test boxs, and such as range of temperature and rate, humidity changes width
Degree and rate, convenient for being detected to the reliability of luminescent device under different test conditions.
Host computer drives luminescent device to shine by programmable controller and programmable power supply in one of the embodiments,
Step includes the following steps：
Host computer drives photophore by programmable controller and programmable power supply with preset curent change amplitude and rate
Part shines.
In the present embodiment, host computer changes the driving current of luminescent device with preset curent change amplitude and rate,
Accelerated aging test can be carried out to luminescent device, and then shortens the time of reliability test.
The method for testing reliability of above-described embodiment is corresponding with above-mentioned luminescent device RTA reliability test assembly, in above-mentioned hair
The technical characteristic and advantage that the embodiment of optical device RTA reliability test assembly illustrates are suitable for method for testing reliability
Embodiment in.
Each technical characteristic of embodiment described above can be combined arbitrarily, to keep description succinct, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, it is all considered to be the range of this specification record.
One of ordinary skill in the art will appreciate that implement the method for the above embodiments be can be with
Relevant hardware is instructed to complete by program.The program can be stored in read/write memory medium.The program exists
Step when execution, including described in the above method.The storage medium, including：ROM/RAM, magnetic disc, CD etc..
Several embodiments of the invention above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneously
It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art
It says, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to the protection of the present invention
Range.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.
Claims (10)
1. a kind of luminescent device reliability test case, which is characterized in that including optic probe, telecontrol equipment and test box ontology；
The optic probe is set in the test box ontology and connects spectrometer, and the telecontrol equipment is arranged in the test box
On ontology and for moving the optic probe；
In reliability test, the telecontrol equipment moves the optic probe to designated position, and the optic probe is in the finger
Determine the optical parameter of station acquisition luminescent device, wherein the luminescent device is placed in the fixed position in the test box.
2. luminescent device reliability test case according to claim 1, which is characterized in that further include being arranged in the test
Case intrinsic bogey is provided with station on the bogey, and station is correspondingly arranged on fixture, and the fixture is used for will
The luminescent device is fixed on the station.
3. luminescent device reliability test case according to claim 2, which is characterized in that be provided on the bogey
Conveyer belt, the both ends of the conveyer belt are by the dodge gate of the test box ontology, and the conveyer belt is for transporting described shine
Device is to the station.
4. luminescent device reliability test case according to claim 2, which is characterized in that be provided on the bogey
The position of multiple stations, each station is corresponding with the movement locus of the telecontrol equipment, in the optic probe with described
When telecontrol equipment is moved to the position of corresponding station, the optical signal receiving plane of the optic probe is directed at the photophore on the station
The luminous site of part.
5. a kind of luminescent device RTA reliability test assembly, which is characterized in that including host computer, programmable controller and as right is wanted
Seek the luminescent device reliability test case described in 1；
The host computer is connect by the programmable controller with the telecontrol equipment, the shifting for controlling the telecontrol equipment
It is dynamic.
6. luminescent device RTA reliability test assembly according to claim 5, which is characterized in that the luminescent device reliability
Test box further includes that setting is provided with station, station pair on the intrinsic bogey of the test box, the bogey
It should be provided with fixture, the fixture is used to the luminescent device being fixed on the station；
The host computer is connect by the programmable controller with the fixture, described in programmable controller control
The open and-shut mode of fixture.
7. luminescent device RTA reliability test assembly according to claim 6, which is characterized in that be arranged on the bogey
There is conveyer belt, by the dodge gate of the test box ontology, the host computer passes through described programmable at the both ends of the conveyer belt
Controller controls the rotary electric machine of the conveyer belt, transports the luminescent device to the station.
8. the luminescent device RTA reliability test assembly according to any one of claim 5 to 7, which is characterized in that also wrap
Include programmable power supply and the spectrometer；
The host computer is connect with the luminescent device reliability test case, and the host computer can for controlling the luminescent device
By the test condition of property test box；
The host computer is also connect with the spectrometer, and the host computer is also connect with the programmable power supply, the programmable power supply
For being powered to the luminescent device, the host computer controls the programmable power supply by the programmable controller and exports
Break-make, control the operation of the spectrometer and read the detection data of the spectrometer.
9. luminescent device RTA reliability test assembly according to claim 8, which is characterized in that the test box ontology includes
Temperature controls test box, humid control test box or Temperature and Humidity Control test box；
The host computer is used to control the range of temperature and rate of the temperature control test box；
Alternatively, the host computer is used to control the humidity amplitude of variation and rate of the humid control test box；
Alternatively, the host computer is used for while controlling the humidity amplitude of variation and rate and temperature of the Temperature and Humidity Control test box
Amplitude of variation and rate.
10. a kind of method for testing reliability based on luminescent device RTA reliability test assembly as claimed in claim 8 or 9,
It is characterized in that, includes the following steps：
The test condition of test box ontology described in the PC control；
The host computer drives the luminescent device to shine by the programmable controller and the programmable power supply；
The host computer controls the telecontrol equipment by the programmable controller and moves, and the optic probe is moved to pair
The position for answering the luminescent device described is shone by what the spectrometer and the optic probe obtained within a preset period of time
The optical parameter of device；
The host computer obtains the electrical parameter for driving the luminescent device by the programmable power supply, according to the test-strips
Part, the electrical parameter and the optical parameter obtain the reliability data of the luminescent device.
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