KR20190048821A - Apparatus for estimating of lighting device - Google Patents

Abstract

A purpose of the present invention is to provide an apparatus for evaluating a lighting device which evaluates light output and electrical and temperature characteristics in real time without stopping a test during an accelerated lifespan test of a lighting product. To this end, the apparatus for evaluating a lighting device comprises: a chamber unit in which a lighting device to be measured is installed; and a data measuring unit which detects optical performance of the lighting device to be measured by installing an integrating hemisphere to be able to move on the outside separated from the chamber unit. Therefore, according to the present invention, it is possible to prevent a test time from being increased due to stopping of a test in a process of evaluating optical performance of a lighting device to be inspected, to remove noise of data by blocking a change in conditions caused by stopping of a test, and to accurately evaluate optical characteristics of a lighting device by removing a user error induced by measurement.

Description

[0001] APPARATUS FOR ESTIMATING OF LIGHTING DEVICE [0002]

The present invention relates to an illuminator evaluating apparatus, and more particularly, to an illuminator evaluating apparatus that evaluates light output, electric power, and temperature characteristics in real time without stopping the test during an accelerated life test of the illuminator.

The integrating sphere is a spherical device having a hollow portion on the inner side, and is a device that receives light into the hollow portion and measures its characteristics.

In order to measure the light emitted by the LED, for example, using an integrating sphere, a power card is connected to the LED to emit light. For this purpose, a probe card can be used.

Here, a light emitting diode (LED) is a type of light emitting device using a semiconductor that converts electricity into light, which is also referred to as a light emitting diode (LED). The process of measuring the optical characteristics of the LED using an integrating sphere As follows.

First, the integrating sphere is placed on the upper side of the LED, and the probe card is lowered in a state where the probe card is positioned between the integrating sphere and the LED, so that the LED is brought into contact with the LED chip to emit light. And the characteristics are measured.

However, in the process of lowering the probe card, a gap is generated between the probe card and the integrating sphere, and optical loss is generated in the gap, which hinders accurate measurement of optical characteristics.

Korean Patent Registration No. 10-1151216 entitled " Integral sphere unit with probe card, LED chip test apparatus having the same, and LED chip sorting apparatus "), An old unit was proposed.

1, the integrating sphere body 11 is generally spherical in shape and has a probe card portion 13 integrally formed at the lower end thereof, as shown in Fig. 1, And an optical property measuring device 12 is mounted on the side surface of the integrating sphere body 11 so as to measure the characteristics of light collected in the integrating sphere body 11.

However, in the conventional lighting equipment evaluation apparatus, when the lifetime or characteristics of the lighting equipment are evaluated, the test is stopped at predetermined time intervals, and the optical performance using the integral sphere is evaluated. As a result, There is a problem that noise is caused by a change in the condition caused by the noise.

In addition, there is a problem that the optical characteristics of the lighting apparatus can not be accurately evaluated because a user error occurs due to the suspension of the test and the restart of the test.

Korean Patent Registration No. 10-1151216 entitled " Integral sphere unit with probe card, LED chip test apparatus having the same, and LED chip sorting apparatus)

In order to solve such problems, it is an object of the present invention to provide a lighting device evaluating apparatus which evaluates light output, electric power, and temperature characteristics in real time without stopping the test during the accelerated life test of the lighting product.

According to an aspect of the present invention, there is provided an apparatus for measuring an optical performance of a measurement target illuminating apparatus, the apparatus comprising: a chamber having an illumination device to be measured installed therein; and an integrating hemisphere movably disposed outside the chamber, And a measurement unit.

The apparatus for evaluating illuminators according to the present invention may further include a chamber part having a shielding film for fixing the illuminating device to a rotatably mounted jig and for blocking light emitted from neighboring illuminating devices to the illuminating device to be measured, ; And a data measuring unit for measuring the optical performance of the illumination device to be measured, which is detected through the integration hemisphere, by moving the integration hemisphere when measuring the illumination device to be measured, so as to be in close contact with the chamber part.

In addition, the chamber part according to the present invention is characterized in that the internal temperature is controlled so that the lighting device is exposed to a constant temperature condition.

Further, the chamber part according to the present invention includes a chamber housing having a storage space therein; A jig installed in the chamber housing to fix the lighting device; A heater for heating the internal temperature of the chamber housing to a predetermined temperature; A plurality of sensor units for detecting an internal temperature of the chamber housing and a temperature of the illuminator; And a blocking film installed inside the chamber housing to block the light emitted from the neighboring illumination device from being introduced into the illumination device to be measured.

In addition, the chamber unit according to the present invention may further include a jig driving unit for providing a driving force to rotate the jig in a predetermined direction.

Further, the chamber housing according to the present invention may have an opening formed at one side thereof; And a window provided in the opening to allow light emitted from the illumination device to be measured to pass therethrough.

In addition, the chamber housing according to the present invention may further include a sealing part which is in close contact with an inner circumferential surface of the integrating hemisphere to block external light from entering the inside of the integrating hemisphere.

The jig according to the present invention may further include: a jig rotating shaft connected to the jig driving unit; And a plurality of jig frames provided around the jig rotary shaft for fixing the illumination device.

In addition, the data measuring unit according to the present invention may include a measurement unit frame that supports the integral hemisphere movably; An integration hemisphere which is in close contact with the chamber and detects optical information output from the illumination device to be measured; A temperature collecting unit for receiving temperature information detected by the chamber unit and the lighting device; A photodetector receiving optical information of the illumination device to be measured detected by the integration hemisphere; An integral hemispherical driver for providing a driving force for allowing the integration hemisphere to move into and close to the chamber or to be separated from the chamber; And a temperature control signal for causing the chamber to maintain a predetermined temperature, a jig control signal for rotating the jig, and an integration hemisphere control signal for moving the integration hemisphere, wherein the temperature collection unit, And a controller for monitoring and storing the data.

Further, the photodetector according to the present invention is characterized by comprising a photodetector (PD) for detecting the light output of the illumination device to be measured or a spectrometer for detecting the color temperature, the color coordinate, and the color rendering index of the illumination device to be measured.

The present invention can prevent the increase of the test time due to the interruption of the test in the process of evaluating the optical performance of the illumination device to be inspected and remove the noise of the data by blocking the change of the condition caused by the test interruption, It is possible to accurately evaluate the optical characteristics of the lighting apparatus.

1 is a perspective view showing an integrating sphere for evaluating optical characteristics of a lighting apparatus according to the related art.
2 is a perspective view showing an illumination device evaluating apparatus according to the present invention.
3 is a block diagram showing a configuration of an illumination apparatus evaluation apparatus according to the present invention.
4 is a cross-sectional view showing the structure of a temperature measuring unit of the lighting equipment evaluating apparatus according to the present invention.
5 is another cross-sectional view showing a structure of a temperature measuring unit of the lighting equipment evaluating apparatus according to the present invention.
FIG. 6 is another cross-sectional view showing a structure of a temperature measuring unit of the lighting equipment evaluating apparatus according to the present invention. FIG.
FIG. 7 is an exemplary view showing a measuring process of the lighting apparatus evaluating apparatus according to the present invention; FIG.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT Hereinafter, a preferred embodiment of an illuminator evaluation apparatus according to the present invention will be described in detail with reference to the accompanying drawings.

FIG. 2 is a perspective view showing a lighting apparatus evaluation apparatus according to the present invention, FIG. 3 is a block diagram showing the configuration of a lighting apparatus evaluation apparatus according to the present invention, 6 is a sectional view showing another structure of a temperature measuring unit of the illuminator evaluation apparatus according to the present invention, and FIG. 6 is a sectional view showing the structure of a temperature measuring unit according to the present invention. FIG. 7 is a view illustrating an example of a measuring process of the lighting equipment evaluating apparatus according to the present invention.

2 to 7, the lighting apparatus evaluating apparatus according to the present invention includes a chamber unit 100 provided with a lighting device 400 to be measured therein, And a data measuring unit (200) for detecting the optical performance of the illumination device (400) to be measured by providing an integration hemisphere (220).

The chamber unit 100 may be configured such that the illumination devices 400, 400 ', and 400 "are fixed to the jig 120 rotatably installed and the illumination devices 400, 400', 400" And a blocking member for controlling the internal temperature so as to block the light emitted from the neighboring illumination devices 400 'and 400 "from flowing into the illumination device 400 to be measured. The chamber housing 110, A jig 120, a jig driving unit 130, a heater unit 140, a sensor unit 150, and a shielding film 160.

The chamber housing 110 has a receiving space formed therein and includes an upper region in which a jig 120, a sensor unit 150 and a shielding film 160 are provided, a jig driving unit 130, And a lower region where the heater unit 140 is installed.

The chamber housing 110 is provided with an opening 111 at one side thereof and the light emitted from the illumination device 400 to be measured is transmitted through the opening 111 to be measured by the external integration hemisphere 220 A window 112 made of a transparent material is provided.

The chamber housing 110 is in close contact with the inner peripheral surface of the integration hemisphere 220 on the outer surface of the chamber housing 110 in which the window 112 is installed so that external light is introduced into the integration hemisphere 220 A sealing portion 113 is provided for blocking.

The jig 120 includes a jig rotation shaft 121 and a plurality of jig frames 122 and 122 'which are installed in an upper region of the chamber housing 110 to fix the illumination devices 400, , 122 ").

One side of the jig rotary shaft 121 is connected to the jig driving unit 130 to support the jig frames 122, 122 'and 122 "to be rotated according to the operation of the jig driving unit 130.

The jig frames 122, 122 ', 122 "are plate-shaped members spaced apart from each other at a predetermined angle (for example, 120 °) around the jig rotary shaft 121, 400 ', 400 "to be installed between the first, second, and the third light source units 122, 122'.

The jig driving unit 130 is installed in a lower region of the chamber housing 110 to provide a driving force to rotate the jig 120 in a predetermined direction, and is preferably a motor.

The heater unit 140 is installed in a lower region of the chamber housing 110 and is turned on and off according to a temperature control signal transmitted from the data measuring unit 200 so that the internal temperature of the chamber housing 110 is maintained at a predetermined temperature The inside of the chamber housing 110 is heated.

The sensor unit 150 detects the internal temperature of the chamber housing 110 and the temperature of the illuminating devices 400, 400 ', and 400 ", and a part of the sensor unit 150, May be attached to any position of the device 400, 400 ', 400 " to detect the temperature.

The shielding film 160 is installed inside the chamber housing 110 so that when the illumination device 400 is rotated for measurement and disposed toward the window 112, And is installed between the inner wall of the chamber housing 110 and the jig 120. In this case, the light emitted from the illumination device 400 is reflected by the inner wall of the chamber housing 110,

The data measuring unit 200 moves the integrating hemisphere 220 when measuring the illuminating device 400 to be closely contacted with the window 112 formed in the chamber unit 100 and then passes through the integrating hemisphere 220 The measurement unit frame 210, the integration hemisphere 220, the temperature acquisition unit 230, the optical detection unit 240, the integral hemisphere drive unit 250, And a control unit 260.

The measuring unit frame 210 has a configuration in which the integrating hemisphere 220 is movably supported to be in contact with or separated from the chamber unit 100, And a rail portion 211 for guiding the rail.

The integrating hemisphere 220 is a hemispherical member which closely contacts the chamber part 100 and detects optical information output from the illumination device 400 to be measured and moves along the rail part 211 of the measurement part frame 210 The integrated hemispherical frame 221 is disposed in the integral hemispherical frame 221 and is closely contacted with or separated from the chamber part 100 according to the movement of the integral hemispherical frame 221. When the chamber part 100 is closely contacted with the chamber part 100, 100 detects the optical information output from the illumination device 400 and transmits the optical information to the optical detector 240 connected through the cable 300.

The temperature collecting unit 230 receives the temperature information detected by the interior of the chamber unit 100 and each of the illumination devices 400, 400 ', and 400' installed in the jig 120, To the control unit 260.

The light detecting unit 240 receives the optical information of the measuring target illuminating device 400 detected by the integrating hemisphere 220 and detects the luminance of the measuring target illuminating device 400, And a photodetector for detecting the optical output of the photodetector.

The photodetector 240 may be a spectrometer for detecting a spectral distribution, a color temperature, a color coordinate, and a color rendering index of the illumination device 400, or may be a photodetector and a spectrometer.

The integral hemispherical driving unit 250 is configured to move the integral hemispherical frame 221 so that the integration hemisphere 220 is brought into close contact with the chamber unit 100 or is separated from the chamber unit 100, An actuator operated in pneumatic or hydraulic pressure, or a motor operating in accordance with an electric signal.

The control unit 260 controls the overall operation of the lighting equipment evaluation apparatus and outputs a temperature control signal to the heater unit 140 so that the chamber unit 100 maintains the predetermined temperature according to the test temperature set by the user .

The control unit 260 outputs a jig control signal to the jig driving unit 130 so that the illumination target device 400 is positioned at the measurement position when the measurement time is reached after the start of the measurement, Respectively.

When the measurement is started, the controller 260 outputs the integral hemispherical control signal to the integral hemispherical driver 250 so that the integration hemisphere 220 is moved to the chamber part 110. When the measurement is completed, And outputs an integral hemispherical control signal so that the chamber 220 separates from the chamber part 110. [

The control unit 260 monitors and stores the data collected by the temperature collecting unit 230 and the optical detecting unit 240 and controls the optical performance of the illuminating apparatus 400 through an evaluation program and an optical information analyzing program, Are evaluated and analyzed.

Also, the controller 260 may output the evaluation and analysis result through the display unit.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it will be understood by those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention as defined in the appended claims. It can be understood that

Therefore, it is possible to prevent the increase of the test time due to the interruption of the test in the process of evaluating the optical performance of the illumination device to be tested, to remove the noise of the data by blocking the change of the condition caused by the test interruption, It is possible to accurately evaluate the optical characteristics of the lighting apparatus by eliminating user errors.

In the course of the description of the embodiments of the present invention, the thicknesses of the lines and the sizes of the components shown in the drawings may be exaggerated for clarity and convenience of explanation, , Which may vary depending on the intentions or customs of the user, the operator, and the interpretation of such terms should be based on the contents throughout this specification.

100: chamber part 110: chamber housing
111: opening 112: window
113: sealing part 120: jig
121: jig rotating shaft 122, 122 ', 122 ": jig frame
130: jig driving part 140: heater part
150: sensor part 160:
200: data measuring section 210: measuring section frame
211: rail part 220: integral hemisphere
221: integral hemisphere frame 230: temperature collecting unit
240: optical detector 250: integral hemispherical driver
260: control unit 300: cable
400, 400 ', 400 ": Lighting equipment

Claims (10)

And a control unit for controlling the operation of the measurement target illuminator 400. The measurement target illuminator 400 includes a chamber unit 100 in which a measurement target illuminator 400 is installed and an integrating hemisphere 220 that is movable apart from the chamber unit 100, And a data measuring unit (200) for detecting the performance. The method according to claim 1,
The illuminating device evaluating device allows the illuminating devices 400, 400 'and 400 "to be fixed to the jig 120 rotatably installed and the light emitted from neighboring illuminating devices 400' and 400" A chamber part (100) having a shielding film (160) for blocking entrance to the device (400); And
The measurement target illuminator 400 may be moved such that the integrating hemisphere 220 is moved to be in close contact with the chamber 100 and the optical performance of the measurement target illuminator 400 detected through the integration hemisphere 220 And a data measuring unit (200) for measuring the illuminance of the illuminating device. 3. The method of claim 2,
Wherein the interior temperature of the chamber part (100) is controlled such that the illumination device (400, 400 ', 400 ") is exposed to a constant temperature condition. The method of claim 3,
The chamber unit 100 includes a chamber housing 110 having a storage space therein;
A jig 120 installed in the chamber housing 110 to fix the illumination devices 400, 400 ', 400 ";
A heater unit 140 for heating the internal temperature of the chamber housing 110 to an arbitrary temperature;
A plurality of sensor units 150 for detecting an internal temperature of the chamber housing 110 and a temperature of the illumination devices 400, 400 ', and 400 "
And a blocking layer 160 installed in the chamber housing 110 to block the light emitted from the neighboring illuminating devices 400 'and 400' from flowing into the illuminating device 400 to be measured. A lighting device evaluation device. 5. The method of claim 4,
Wherein the chamber part (100) further comprises a jig driving part (130) for providing driving force to rotate the jig (120) in a predetermined direction. 6. The method of claim 5,
The chamber housing 110 includes an opening 111 formed at one side thereof; And
And a window (112) provided in the opening (111) and allowing light emitted from the illumination device (400) to be measured to pass therethrough. The method according to claim 6,
Wherein the chamber housing (110) further comprises a sealing part (113) which is in close contact with an inner peripheral surface of the integrating hemisphere (220) to block external light from flowing into the interior of the integrating hemisphere (220) Evaluation device. 6. The method of claim 5,
The jig 120 includes a jig rotating shaft 121 connected to the jig driving unit 130; And
And a plurality of jig frames (122, 122 ', 122 ") installed around the jig rotary shaft (121) and fixing the lighting devices (400, 400', 400" Device. The method of claim 3,
The data measuring unit 200 includes a measurement unit frame 210 for movably supporting the integration hemisphere 220;
An integration hemisphere 220 which is in close contact with the chamber part 100 and detects optical information output from the illumination device 400 to be measured;
A temperature collecting unit 230 for receiving temperature information detected by the chamber unit 100 and the illumination devices 400, 400 ', and 400 ";
A photodetector 240 for receiving the optical information of the illumination target device 400 detected by the integration hemisphere 220;
An integral hemispherical driving unit 250 for providing a driving force for allowing the integration hemisphere 220 to move to the chamber unit 100 to be closely contacted or separated from the chamber unit 100; And
A temperature control signal, a jig control signal for rotating the jig 120, and an integration hemisphere control signal for moving the integration hemisphere 220 so that the chamber unit 100 maintains a predetermined temperature, And a control unit (260) for monitoring and storing the data collected by the optical detection unit (240). 10. The method of claim 9,
The photodetector 240 may include a photodetector PD for detecting the optical output of the illumination device 400 or a spectrometer for detecting the color temperature, the color coordinate, and the color rendering index of the illumination device 400 Of the lighting device.

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