KR102016222B1 - Apparatus for estimating of lighting device - Google Patents

Abstract

It is an object of the present invention to provide an luminaire evaluation apparatus for evaluating light output, electrical and temperature characteristics in real time without interrupting the test during an accelerated life test of a lighting product. To this end, the present invention includes a chamber unit in which the measuring object illuminator is installed therein, and a data measuring unit detecting an optical performance of the measuring object illuminator by installing an integrating hemisphere so as to be movable outside of the chamber unit. . Therefore, the present invention can prevent the increase of the test time due to the interruption of the test in the process of evaluating the optical performance of the inspection target luminaire, and can remove the noise of the data by blocking the change of the condition caused by the interruption of the test. In this case, the optical characteristic of the lighting device can be accurately evaluated by removing the user error caused by the measurement.

Description

Lighting equipment evaluation device {APPARATUS FOR ESTIMATING OF LIGHTING DEVICE}

The present invention relates to an luminaire evaluation apparatus, and more particularly, to an luminaire evaluation apparatus for evaluating light output, electrical and temperature characteristics in real time without interrupting the test during an accelerated life test of a lighting product.

The integrating sphere is a spherical device having a hollow portion inside, and is a device that receives light into the hollow portion and measures its characteristics.

In order to measure the light emitted by an LED using an integrating sphere, for example, a power source must be connected to the LED to emit light. A probe card can be used for this purpose.

Here, an LED (Light Emitting Diode) is a kind of light emitting device using a semiconductor that converts electricity into light. Also called a light emitting diode, a process of measuring the optical characteristics of the LED using an integrating sphere is described in detail. Looking at it as follows.

First, the integrating sphere is placed on the upper side of the LED, the probe card is placed between the integrating sphere and the LED, and the probe card is lowered to contact the LED chip to emit the LED, and the light is received through the receiving hole of the integrating sphere. The characteristic is measured.

However, a gap occurs between the probe card and the integrating sphere in the process of lowering the probe card, and there is a problem in that an optical loss occurs due to the gap, thereby preventing accurate measurement of optical characteristics.

Korean Patent Publication No. 10-1151216 (Invention: Integrating sphere unit with a probe card, LED chip testing apparatus having the same, and LED chip sorting apparatus) has an integral that does not cause light loss during the light receiving process Old units have been proposed.

FIG. 1 is a view showing an integrating sphere for evaluating optical characteristics of a lighting apparatus according to the prior art. As shown in FIG. 1, an integrating sphere body 11 is generally spherical and a probe card part 13 is integrally formed at a lower end thereof. A neck portion is formed to be connected, and an optical characteristic measuring device 12 capable of measuring a characteristic of light collected inside the integrating sphere main body 11 is mounted on a side surface of the integrating sphere main body 11.

However, such a conventional luminaire evaluation device stops the test at a predetermined time interval when evaluating the life or characteristics of the luminaire, and evaluates the optical performance using the integrating sphere, thereby increasing the test time due to the interruption of the test and the test interruption. There is a problem that the noise is caused through the change of the conditions that occur.

In addition, there is a problem that can not accurately evaluate the optical characteristics of the luminaire due to the user error (Error) caused by the test interruption and restart of the test.

Korean Registered Patent Publication No. 10-1151216 (Invention name: Integrating sphere unit with probe card, LED chip testing device having same, and LED chip sorting device)

In order to solve this problem, it is an object of the present invention to provide a lighting device evaluation device for evaluating the light output, electrical and temperature characteristics in real time without interrupting the test during the accelerated life test of the lighting product.

In order to achieve the above object, the present invention provides a chamber unit in which a measurement target illuminator is installed therein, and an integrating hemisphere installed on the outside separated from the chamber to detect optical performance of the measurement target illuminator. It includes a measuring unit.

In addition, the lighting apparatus evaluation apparatus according to the present invention is to be fixed to the jig rotatably installed, the chamber unit having a blocking film for blocking the light emitted from the neighboring lighting equipment to enter the measurement target lighting equipment ; And a data measuring unit for moving the integrating hemisphere during the measurement of the measuring object illuminator to be in close contact with the chamber and measuring the optical performance of the measuring object illuminator detected through the integrating hemisphere.

In addition, the chamber portion according to the invention is characterized in that the internal temperature is controlled so that the lighting device is exposed to a certain temperature condition.

In addition, the chamber unit according to the present invention comprises a chamber housing having an accommodation space therein; A jig installed in the chamber housing to fix a lighting device; A heater unit for heating the internal temperature of the chamber housing to a predetermined temperature; A plurality of sensor unit for detecting the internal temperature of the chamber housing and the temperature of the lighting device; And a blocking film installed inside the chamber housing to block light emitted from a neighboring lighting device from being introduced into the measurement target lighting device.

In addition, the chamber according to the invention is characterized in that it further comprises a jig driving unit for providing a driving force to rotate the jig in a predetermined direction.

In addition, the chamber housing according to the present invention comprises an opening formed on one side; And a window installed in the opening and configured to transmit light emitted from the illuminator to be measured.

In addition, the chamber housing according to the present invention is characterized in that it further comprises a sealing part in close contact with the inner peripheral surface of the integrating hemisphere to block the external light from entering into the integrating hemisphere.

In addition, the jig according to the present invention is a jig rotating shaft connected to the jig driver; And a plurality of jig frames installed around the jig rotation shaft and fixing the lighting device.

In addition, the data measuring unit according to the present invention includes a measuring unit frame for supporting the integral hemisphere to be movable; An integrating hemisphere in close contact with the chamber and detecting optical information output from a measurement target lighting device; A temperature collector configured to receive temperature information detected by the chamber and the lighting device; A light detector for receiving optical information of the measurement target lighting device detected by the integrating hemisphere; An integrating hemisphere driving unit configured to provide a driving force to move the integrating hemisphere close to the chamber or to be separated from the chamber; And outputting a temperature control signal so that the chamber maintains a constant temperature, a jig control signal so that the jig is rotated, and an integral hemisphere control signal so that the integrating hemisphere is moved, and the data collected by the temperature collector and the light detector. It characterized in that it comprises a control unit for monitoring and storing.

In addition, the light detector according to the present invention is characterized by consisting of a photodetector (PD) for detecting the light output of the measurement target lighting device or a spectrometer for detecting the color temperature, color coordinates, color rendering index of the measurement target lighting device.

The present invention can prevent the increase of the test time due to the interruption of the test in the process of evaluating the optical performance of the inspection target luminaire, and can block the change of conditions caused by the interruption of the test to remove the noise of the data, the measurement There is an advantage that can accurately evaluate the optical characteristics of the lighting equipment by removing the user error by.

1 is a perspective view showing an integrating sphere for evaluating optical characteristics of a lighting apparatus according to the prior art.
Figure 2 is a perspective view of the luminaire evaluation apparatus according to the present invention.
Figure 3 is a block diagram showing the configuration of the luminaire evaluation apparatus according to the present invention.
Figure 4 is a cross-sectional view showing the structure of the temperature measuring unit of the lighting apparatus evaluation apparatus according to the present invention.
Figure 5 is another cross-sectional view showing the structure of the temperature measuring unit of the luminaire evaluation apparatus according to the present invention.
Figure 6 is another cross-sectional view showing the structure of the temperature measuring unit of the luminaire evaluation apparatus according to the present invention.
7 is an exemplary view showing a measurement process of the luminaire evaluation apparatus according to the present invention.

Hereinafter, with reference to the accompanying drawings will be described in detail a preferred embodiment of the lighting device evaluation apparatus according to the present invention.

Figure 2 is a perspective view showing a luminaire evaluation apparatus according to the present invention, Figure 3 is a block diagram showing the configuration of the luminaire evaluation apparatus according to the present invention, Figure 4 is a temperature measuring unit of the luminaire evaluation apparatus according to the present invention 5 is another cross-sectional view illustrating a structure of a temperature measuring unit of a lighting apparatus evaluating apparatus according to the present invention, FIG. 6 is another cross-sectional view illustrating a temperature measuring unit structure of a lighting apparatus evaluating apparatus according to the present invention. 7 is an exemplary view showing a measurement process of the luminaire evaluation apparatus according to the present invention.

As shown in Figures 2 to 7, the lighting device evaluation apparatus according to the present invention is movable inside the chamber unit 100 and the chamber unit 100, which is installed inside the measurement target lighting device 400, the chamber 100 Integrating the hemisphere 220 is configured to include a data measuring unit 200 for detecting the optical performance of the measurement target illumination device 400.

The chamber part 100 allows the lighting devices 400, 400 ', 400 "to be fixed to the jig 120 rotatably installed, and the lighting devices 400, 400', 400" are exposed to a predetermined temperature condition. The internal temperature is controlled so as to have a blocking member for blocking the light emitted from the neighboring lighting device 400 ', 400 "to be introduced into the measurement target lighting device 400, the chamber housing 110 and , Jig 120, jig driver 130, heater 140, sensor 150, and blocking film 160.

The chamber housing 110 is a configuration in which an accommodating space is formed therein, an upper region in which a jig 120, a sensor unit 150, a blocking film 160 is installed, a jig driving unit 130, It is divided into a lower region in which the heater unit 140 is installed.

In addition, the chamber housing 110 has an opening 111 installed at one side thereof, and the light emitted from the measurement target lighting device 400 is transmitted to the opening 111 so that the chamber housing 110 can be measured at the external integrating hemisphere 220. Transparent window 112 is installed so that.

In addition, the chamber housing 110 is in close contact with the inner circumferential surface of the integrating hemisphere 220 on the outer surface of the chamber housing 110 in which the window 112 is installed so that external light flows into the integrating hemisphere 220. The sealing part 113 to block is installed.

The jig 120 is installed in the upper region of the chamber housing 110 to fix the lighting devices 400, 400 ′, 400 ″, the jig rotation shaft 121, and the plurality of jig frames 122, 122 ′. , 122 ").

One side of the jig rotation shaft 121 is connected to the jig driver 130 to support the jig frames 122, 122 ′ and 122 ″ so as to rotate according to the operation of the jig driver 130.

The jig frames 122, 122 ′ and 122 ″ are plate-shaped members, and are spaced apart from each other at a predetermined angle (for example, 120 °) with respect to the jig rotation shaft 121 and the jig frame 122. , 122 '), so that the measurement target luminaires 400, 400', 400 "are installed and fixed.

The jig driver 130 is provided in the lower region of the chamber housing 110 to provide a driving force to rotate the jig 120 in a predetermined direction, preferably made of a motor.

The heater unit 140 is installed in the lower region of the chamber housing 110, the on / off according to the temperature control signal transmitted from the data measuring unit 200 so that the internal temperature of the chamber housing 110 is a constant temperature The interior of the chamber housing 110 is heated to maintain it.

The sensor unit 150 detects the internal temperature of the chamber housing 110 and the temperature of the illuminators 400, 400 ′, and 400 ″ of the measurement target. The temperature may be detected by attaching at any position of the device 400, 400 ', 400 ".

The blocking film 160 is installed inside the chamber housing 110 so that when the measurement target illuminator 400 is rotated for measurement and disposed toward the window 112, light is emitted from neighboring illuminators 400 'and 400 ". The light is reflected through the inner wall of the chamber housing 110 to block the inflow into the measurement target lighting device 400, and is installed between the inner wall of the chamber housing 110 and the jig 120.

The data measuring unit 200 moves the integrating hemisphere 220 to be in close contact with the window 112 formed in the chamber part 100 when the measurement target lighting device 400 is measured, and through the integrating hemisphere 220. As a configuration for measuring the optical performance of the detected measurement target lighting device 400, the measuring unit frame 210, the integrating hemisphere 220, the temperature collecting unit 230, the light detector 240, the integrating hemisphere driving unit 250 And a control unit 260.

The measuring unit frame 210 is configured to guide the integrating hemisphere 220 so as to be movable to be in close contact with the chamber part 100 or to be separated from the chamber part 100, and the integrating hemisphere 220 is moved. It is comprised including the rail part 211.

The integrating hemisphere 220 is a hemispherical member that is in close contact with the chamber part 100 and detects optical information output from the measurement target lighting device 400, and moves along the rail part 211 of the measuring part frame 210. It is disposed in the integral hemisphere frame 221 is installed, and is in close contact with or separated from the chamber unit 100 in accordance with the movement of the integral hemisphere frame 221, the close contact with the chamber unit 100, the chamber unit ( The optical information output from the measurement target lighting device 400 installed in the 100 is detected and transmitted to the light detector 240 connected through the cable 300.

The temperature collector 230 receives temperature information detected by each of the lighting devices 400, 400 ′, 400 ″ installed in the chamber 100 and the jig 120, and the received temperature information is Transmission to the control unit 260.

The light detector 240 is a configuration for receiving optical information of the measurement target lighting device 400 detected by the integrating hemisphere 220, the brightness, luminous flux, luminous intensity, illuminance, wavelength, etc. of the measurement target lighting device 400. It consists of a photodetector (Photodetector) to detect the light output of the.

In addition, the light detector 240 may be made of a spectrometer for detecting the spectral distribution, color temperature, color coordinates, color rendering index of the illumination device 400 to be measured, and may be provided with a photodetector and a spectrometer.

The integrating hemisphere driving unit 250 is configured to move the integrating hemisphere frame 221 so that the integrating hemisphere 220 is in close contact with the chamber part 100 or provides a driving force to be separated from the chamber part 100. It operates in accordance with the integral hemisphere control signal output from the (260), and consists of an actuator or a motor operating in accordance with the pneumatic or hydraulic pressure.

The control unit 260 is configured to control the overall operation of the lighting device evaluation device, and outputs a temperature control signal to the heater unit 140 so that the chamber unit 100 maintains a constant temperature according to the test temperature set by the user. .

In addition, the control unit 260 outputs a jig control signal to the jig driver 130 so that the measurement target lighting device 400 is positioned at the measurement position when the inspection time is reached after the measurement starts. To be placed in the

In addition, when the measurement is started, the control unit 260 outputs an integral hemisphere control signal to the integral hemisphere driver 250 so that the integral hemisphere 220 moves to the chamber unit 110, and when the measurement ends, the integral hemisphere An integral hemisphere control signal is output so that the 220 is separated from the chamber 110.

In addition, the controller 260 monitors and stores the data collected by the temperature collector 230 and the light detector 240, and performs optical performance of the lighting device 400 through a pre-stored evaluation program and an optical information analysis program. Evaluate and analyze.

In addition, the controller 260 may output the evaluation and analysis results through a display means.

As described above, it has been described with reference to a preferred embodiment of the present invention, but those skilled in the art various modifications and changes of the present invention without departing from the spirit and scope of the invention described in the claims below I can understand that you can.

Therefore, in the process of evaluating the optical performance of the inspection equipment, it is possible to prevent the increase of the test time due to the interruption of the test, to block the change of the condition caused by the interruption of the test, and to remove the noise of the data. By eliminating user error, it is possible to accurately evaluate the optical characteristics of the luminaire.

In addition, in the course of describing an embodiment of the present invention, the thickness of the lines or the size of the components shown in the drawings may be exaggerated for clarity and convenience of description, and the above terms are considered in the present invention. As the terms defined herein may vary according to a user's or operator's intention or custom, interpretation of these terms should be made based on the contents throughout this specification.

100 chamber portion 110 chamber housing
111: opening 112: window
113: sealing unit 120: jig
121: jig rotation shaft 122, 122 ', 122 ": jig frame
130: jig drive unit 140: heater unit
150: sensor unit 160: blocking film
200: data measuring unit 210: measuring unit frame
211: rail portion 220: integral hemisphere
221: integral hemisphere frame 230: temperature collector
240: light detector 250: integral hemisphere drive unit
260 control unit 300 cable
400, 400 ', 400 ": Lighting equipment

Claims (10)

The interior of the chamber 100, the measurement target illuminator 400 is installed therein, and the integrating hemisphere 220 is installed on the outside separated from the chamber 100, so that the optical of the illuminator 400 is measured. As a lighting device evaluation device comprising a data measuring unit 200 for detecting the performance,
The lighting device evaluation device is to fix the lighting device (400, 400 ', 400 ") to the jig 120 rotatably installed, the light emitted from the neighboring lighting device (400', 400") to be measured A chamber part 100 having a blocking film 160 to block the flow into the device 400; And
When the measurement target lighting device 400 is measured, the integral hemisphere 220 is moved to be in close contact with the chamber part 100, and the optical performance of the measurement target lighting device 400 detected through the integration hemisphere 220. Apparatus evaluation apparatus comprising a data measuring unit for measuring the 200. delete The method of claim 1,
The chamber unit 100 is a lighting device evaluation device, characterized in that the internal temperature is controlled so that the lighting device (400, 400 ', 400 ") is exposed to a predetermined temperature condition. The method of claim 3, wherein
The chamber part 100 includes a chamber housing 110 having a receiving space therein;
A jig 120 installed in the chamber housing 110 to fix a lighting device 400, 400 ', 400 ";
A heater unit 140 for heating the internal temperature of the chamber housing 110 to a predetermined temperature;
A plurality of sensor unit 150 for detecting the internal temperature of the chamber housing 110 and the temperature of the lighting device (400, 400 ', 400 "); And
And a blocking film 160 installed inside the chamber housing 110 to block light emitted from neighboring lighting devices 400 ′ and 400 ″ from being introduced into the measurement target lighting device 400. Luminaire evaluation apparatus. The method of claim 4, wherein
The chamber unit 100 further comprises a jig drive unit 130 for providing a driving force for the jig 120 to rotate in a predetermined direction. The method of claim 5,
The chamber housing 110 has an opening 111 formed on one side; And
Illuminator evaluation apparatus is installed in the opening 111, characterized in that it comprises a window (112) for transmitting the light emitted from the illuminator 400 to be measured. The method of claim 6,
The chamber housing 110 further includes a sealing part 113 in close contact with the inner circumferential surface of the integrating hemisphere 220 to block external light from entering the integrating hemisphere 220. Evaluation device. The method of claim 5,
The jig 120 includes a jig rotation shaft 121 connected to the jig driver 130; And
The fixture is installed around the jig rotation shaft 121 and includes a plurality of jig frames 122, 122 ′, 122 ″ for fixing the illuminators 400, 400 ′, 400 ″. Device. The method of claim 3, wherein
The data measuring unit 200 includes a measuring unit frame 210 for supporting the integrating hemisphere 220 to be movable;
An integrating hemisphere 220 in close contact with the chamber part 100 and detecting optical information output from the measurement target lighting device 400;
A temperature collector 230 for receiving temperature information detected by the chamber unit 100 and the lighting apparatuses 400, 400 ′ and 400 ″;
A light detector 240 for receiving optical information of the measurement target lighting device 400 detected by the integrating hemisphere 220;
An integrating hemisphere driving unit 250 which provides a driving force to move the integrating hemisphere 220 into close contact with the chamber part 100 or to be separated from the chamber part 100; And
Outputs a temperature control signal, a jig control signal to rotate the jig 120, an integral hemisphere control signal to move the integrating hemisphere 220 so that the chamber unit 100 maintains a constant temperature, and collects the temperature. And a control unit (260) for monitoring and storing the data collected by the light detector (240). The method of claim 9,
The light detector 240 may include a photo detector (PD) for detecting the light output of the illuminator 400 to be measured or a spectrometer for detecting color temperature, color coordinates, and color rendering index of the illuminator 400 to be measured. Luminaire evaluation apparatus.

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