CN111175627B - Photoelectric and quantum efficiency testing system for OLED device - Google Patents
Photoelectric and quantum efficiency testing system for OLED device Download PDFInfo
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- CN111175627B CN111175627B CN201811334498.XA CN201811334498A CN111175627B CN 111175627 B CN111175627 B CN 111175627B CN 201811334498 A CN201811334498 A CN 201811334498A CN 111175627 B CN111175627 B CN 111175627B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
- Y02B20/30—Semiconductor lamps, e.g. solid state lamps [SSL] light emitting diodes [LED] or organic LED [OLED]
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Abstract
The invention relates to a photoelectric and quantum efficiency testing system of an OLED device, which comprises a testing platform, a clamp, an integrating hemisphere, an optical conduction assembly and a radiation illumination testing device, wherein the clamp and the integrating hemisphere are respectively arranged on two side surfaces of the testing platform; the optical conduction assembly is provided with a testing hole at the center of the upper plane of the integrating hemisphere and the top of the bottom hemisphere, and comprises an optical fiber, a lens barrel and an optical reflector, wherein the lens barrel is arranged between the testing hole at the top of the bottom hemisphere of the integrating hemisphere and the top of the radiation illumination testing equipment, and the optical reflector is arranged on the side wall of the lens barrel and can be opened towards the inside of the lens barrel. The invention integrates the photoelectric test and quantum efficiency test equipment, redesigns the test light path and realizes the combination of the photoelectric test and the quantum efficiency test; and by adopting the clamp and the vertical light path, severe test conditions such as a darkroom cabinet and the like are abandoned, and the applicability is improved.
Description
Technical Field
The invention relates to the technical field of photoelectric device measurement, in particular to a photoelectric and quantum efficiency testing system for an OLED device.
Background
Organic light-emitting diodes (OLEDs) are the most rapidly developed thin film display technology in recent years. Since its initial release in 1979, kodak corporation of the United states, it has undergone 40 years of development. As a carrier of OLED technology, OLED device performance is the most direct and effective method to measure the building principle, material combination and manufacturing process of OLED devices. The photoelectric performance test and the quantum efficiency test of the device are the most critical items in the device test all the time, and have important significance for evaluating indexes such as collocation combination of OLED device function layers, performance of organic materials in the device, color and efficiency of luminescent materials in the device and the like.
With the development of the OLED technology, the test equipment and the test method for the OLED photoelectric test and the quantum efficiency test form an independent and complete test system. The photoelectric test system generally comprises a constant-voltage constant-current source, a radiation illuminometer and a clamp, and is required to be used under a darkroom condition; the quantum efficiency test system generally comprises a constant-voltage constant-current source, an integrating sphere, a spectrometer and a clamp, and can be used under the condition of illumination. It can be seen that although there is a certain amount of general equipment in the two systems, due to the difference between the test light path and the test condition, the mode with the highest integration degree is the common fixture and the constant-voltage and constant-current source at present, so that the two tests need to be performed with a single-point test under the condition of manually switching the systems, and the large-scale standardized test will undoubtedly result in time waste and labor cost increase.
Disclosure of Invention
Aiming at the defects in the prior art, the invention provides the photoelectric and quantum efficiency testing system of the OLED device, the photoelectric testing system and the quantum efficiency testing system are effectively integrated by changing the testing light path of the existing equipment, the volume of the equipment is reduced, the number of samples tested at one time is increased, the automatic testing of the samples is realized, and the labor cost is saved.
In order to achieve the purpose, the invention adopts the following technical scheme:
an OLED device photoelectric and quantum efficiency test system, comprising: the test platform comprises a test platform, a clamp, an integrating hemisphere, an optical conduction assembly and a radiation illumination test device, wherein the clamp and the integrating hemisphere are respectively arranged on two side surfaces of the test platform, and the clamp is used for clamping and testing an OLED device; the integrating hemisphere is arranged in a mode that a hemisphere plane faces upwards, and the center of the upper plane and the top point of the bottom hemisphere are provided with test holes; a through hole is formed in the center of the test platform and corresponds to the central test hole of the upper plane of the integrating hemisphere; the optical conduction assembly comprises an optical fiber, a lens barrel and an optical reflector and is used for conducting optical signals; the radiation illumination testing equipment is arranged below the integrating hemisphere and used for collecting optical signals; the lens cone is arranged between the top point testing hole at the bottom of the integrating hemisphere and the top of the radiation illuminance testing device, and the optical reflector is arranged on the side wall of the lens cone and can be opened towards the inside of the lens cone to form a 45-degree included angle for controlling the conduction of a light path.
When the optical reflector is in an open state, a photoelectric test light path transmitted to the radiant illumination test equipment through the optical fiber is opened, and a photoelectric test can be carried out; when the optical reflector is in a closed state, the light path transmitted to the radiation illumination testing equipment through the optical fiber is closed, and quantum efficiency testing can be performed through the conduction of the main light path of the testing hole in the integrating hemisphere.
The test system also comprises a rotating mechanism for driving the clamp to rotate, a pushing mechanism for driving the clamp to move along the radial direction and a control system for testing the supply of voltage/current, integrating optical and electrical information and processing data; the rotating mechanism and the pushing mechanism are arranged on the test platform; the pushing mechanism comprises a transfer clamp, a transfer groove and a gantry guide rail.
The control system comprises a constant-voltage constant-current output source, a computer and a touch screen, wherein the constant-voltage constant-current source is electrically connected with the clamp and is used for providing stable output voltage and current and transmitting an output signal to control software on the computer in real time, and the control software on the computer is used for providing touch control interaction, test parameter setting and mechanical motion control and can calculate and analyze test data; the touch screen is used for controlling the display of the interface and controlling/acquiring the setting and the viewing of the test parameters.
And a metal contact is arranged in the clamp and used for applying current and voltage to a test sample, and the bottom of the clamp is provided with a light through hole.
The rotating mechanism comprises a gear and a motor; the edge of the test platform is provided with a slotted hole, and the rotating mechanism is arranged in the slotted hole;
an annular rotating turntable is arranged at the upper part of the test platform, an annular gear groove meshed with a gear on the rotating mechanism is arranged at the bottom side of the edge part of the turntable, the gear of the rotating mechanism penetrates through a slotted hole of the test platform to be meshed with the gear groove, and the rotating direction and the rotating position of the turntable are determined by the rotating direction and the number of turns of the gear of the rotating mechanism;
the diameter of the turntable is larger than the diameter of the integrating hemisphere.
A plurality of transfer clamps are arranged on the turntable in a concentric circle mode, and the clamp is arranged on the transfer clamps;
the clamp and the transfer clamp are connected in a contact mode through contacts.
A positioning disc is arranged on the inner side of the rotary disc; and the turntable and the positioning disc are radially provided with transfer grooves for driving the transfer clamp to move along the radial direction.
The center of the positioning disc is provided with a light through hole; and light through holes are formed in the positions, corresponding to the light through holes in the clamp, of the starting point and the end point of the transfer groove.
The upper part of the test platform is provided with a gantry guide rail, the gantry guide rail is provided with a wiring belt, the top end of a longitudinal beam of the connecting end of the gantry guide rail and the test platform is connected with one end of the wiring belt, and the other end of the wiring belt is connected with the transfer clamp; the vertical surface of the gantry guide rail beam is provided with guide teeth which are connected with a transfer clamp provided with a guide wheel, and the guide wheel rotates under the power-on condition to enable the transfer clamp to move along the beam.
The optical fiber is arranged along the arc shape of the outer side of the integrating hemisphere, one end of the optical fiber is connected below the testing hole of the top point of the hemisphere at the bottom of the integrating hemisphere, and the other end of the optical fiber is connected on a photoelectric testing light path below the light through hole at the bottom of the clamp.
And in the opening and closing position of the optical reflector, the lens barrel is vertically connected with the optical fiber.
The number of the clamps is more than or equal to 6; the clamp realizes sample switching through rotation; the optical reflector is a single-sided pure plane mirror; the radiation illumination testing equipment is a radiation illuminometer.
The technical scheme of the invention has the following beneficial effects:
according to the photoelectric and quantum efficiency testing system of the OLED device, photoelectric testing and quantum efficiency testing equipment are integrated, a testing light path is redesigned, and the photoelectric testing and quantum efficiency testing are combined; the clamp and the vertical light path are adopted, so that the harsh test conditions such as a darkroom cabinet and the like are abandoned, and the applicability is improved; the multi-sample continuous test is realized by adopting a multi-clamp and rotary switching mode; meanwhile, the device is combined with a large-size integrating hemisphere, so that the testing precision and stability are improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention, the drawings used in the embodiments will be briefly described below, and it is apparent that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without inventive efforts.
FIG. 1 is a schematic diagram of the overall structure of a photoelectric and quantum efficiency testing system of an OLED device according to the present invention;
FIG. 2 is a top view of the structure of FIG. 1;
FIG. 3 is a schematic view of the gantry guide rail structure of the present invention;
FIG. 4 is a top view of the structure of FIG. 3;
fig. 5 is a schematic view of the installation position of the optical mirror according to the present invention.
Description of reference numerals:
1-test platform
11-rotating disk
111-gear groove
12-positioning plate
2-clamping apparatus
3-integral hemisphere
4-optical conduction component
41-fiber, 42-lens barrel, 43-optical reflector
5-radiation illumination test equipment
6-rotating mechanism
7-pushing mechanism
71-transfer clip
711-guide wheel
72-transfer trough, 73-gantry rail
8-control system
81-constant voltage and constant current output source, 82-computer, 83-touch screen
9-a wiring tape.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it should be understood that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without making any creative effort based on the embodiments in the present invention, belong to the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the system or element referred to must have a particular orientation, be constructed in a particular orientation, and be operated, and thus, should not be construed as limiting the present invention. Moreover, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should be noted that unless otherwise explicitly stated or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be connected internally or indirectly between two elements. The specific meaning of the above terms in the present invention can be understood as a specific case by those skilled in the art.
As shown in fig. 1-5, the present invention provides a testing system for photoelectric and quantum efficiency of an OLED device, including: the testing device comprises a testing platform 1, a clamp 2, an integrating hemisphere 3, an optical conduction assembly 4 and a radiation illumination testing device 5, wherein the clamp 2 and the integrating hemisphere 3 are respectively arranged on two side surfaces of the testing platform 1, and the clamp 2 is used for clamping and testing an OLED device; the integrating hemisphere 3 is arranged in a mode that a hemisphere plane faces upwards, and the center of the upper plane and the top point of the bottom hemisphere are provided with test holes; a through hole is arranged in the center of the test platform 1 and corresponds to a central test hole of the upper plane of the integrating hemisphere 3; the optical transmission component 4 comprises an optical fiber 41, a lens barrel 42 and an optical reflector 43, and is used for transmitting optical signals; the radiation illumination testing device 5 is arranged below the sub-hemisphere 3 and used for collecting optical signals; the lens cone 42 is arranged between the top point test hole at the bottom of the integrating hemisphere 3 and the top of the radiation illumination test device 5, and the optical reflector 43 is arranged on the side wall of the lens cone 4 and can be opened towards the inside of the lens cone to form an included angle of 45 degrees;
when the optical reflector 43 is in an open state, the optical path transmitted to the radiation illuminance testing device 5 through the optical fiber 41 is opened, and a photoelectric test can be performed; when the optical mirror 43 is in a closed state, the optical path transmitted to the radiation illuminance testing device 5 through the optical fiber 41 is closed, and the optical path is conducted through the testing hole in the integrating hemisphere 3, so that the quantum efficiency test can be performed.
The invention integrates the photoelectric test and quantum efficiency test equipment, redesigns the test light path and realizes the combination of the photoelectric test and the quantum efficiency test; and by adopting the clamp and the vertical light path, severe test conditions such as a darkroom cabinet and the like are abandoned, and the applicability is improved.
The test system also comprises a rotating mechanism 6 for driving the clamp 2 to rotate, a pushing mechanism 7 for driving the clamp 2 to move along the radial direction and a control system 8 for providing test voltage/current, integrating optical and electrical information and carrying out data processing; the rotating mechanism 6 and the pushing mechanism 7 are arranged on the test platform 1; the pushing mechanism 7 includes a transfer clamp 71, a transfer slot 72, and a gantry rail 73.
The control system 8 comprises a constant voltage and constant current output source 81, a computer 82 and a touch screen 83, the constant voltage and constant current source 81 is electrically connected with the clamp 2 and is used for providing stable output voltage and current and transmitting an output signal to control software on the computer 82 in real time, and the control software on the computer 82 is used for providing touch interaction, test parameter setting and mechanical motion control and can calculate and analyze test data; the touch screen 83 is connected with the computer 82 by a cable, and the interface of the touch screen 83 includes but is not limited to one or two of RJ 45, USB, HDMI, TYPE-C, DVI, DP and Thunderbolt, and is used for controlling the display of the interface and the setting and viewing of the control/acquisition test parameters.
The rotating mechanism 6 includes a gear and a motor; the edge of the test platform 1 is provided with a slotted hole, and the rotating mechanism 6 is arranged in the slotted hole; an annular rotary turntable 11 is arranged at the upper part of the test platform 1, an annular gear groove 111 meshed with a gear is arranged at the bottom side of the edge part of the turntable 11, the gear of the rotary mechanism 6 passes through a slotted hole of the test platform 1 to be meshed with the gear groove 111, and the rotation direction and the position of the turntable 11 are determined by the rotation direction and the number of turns of the gear of the rotary mechanism 6; the diameter of the turntable 11 is larger than the diameter of the integrating hemisphere 3.
A plurality of transfer clamps 71 are arranged on the turntable 11 in a concentric circle mode, and the clamp 2 is arranged on the transfer clamp 7; the clamp 2 and the transfer clamp 71 are connected in a contact type. A positioning disc 12 is arranged on the inner side of the rotary disc 11; the turntable 11 and the positioning disk 12 are provided with a transfer groove 72 in the radial direction for driving the transfer clip 71 to move in the radial direction. A light through hole is formed in the center of the positioning disc 12; the starting point and the end point of the transfer groove 72 are provided with light through holes corresponding to the light through holes on the clamp 2.
The upper part of the test platform 1 is also provided with a gantry guide rail 73, the top end of a longitudinal beam at the connecting end of the gantry guide rail 73 and the test platform 1 is connected with one end of a wiring belt 9, and the other end of the wiring belt 9 is connected with the transfer clamp 71; the vertical surface of the cross beam of the gantry guide rail 73 is provided with guide teeth which are connected with a transfer clamp 71 provided with a guide wheel 711, and the guide wheel 711 rotates under the condition of electrifying to enable the transfer clamp 71 to move along the cross beam; the transmission clamp 71 is directly connected with the guide wheel 711.
The optical fiber 41 is arranged along the arc shape of the outer side of the integrating hemisphere 3, one end of the optical fiber is connected below the hemispherical vertex test hole at the bottom of the integrating hemisphere 3, and the other end of the optical fiber is connected on the photoelectric test optical path below the light through hole at the bottom of the clamp 2. In the open/close position of the optical mirror 43, the lens barrel 42 is vertically connected to the optical fiber 41.
The clamp 2 realizes sample switching through rotation, and the inner shape can be square, round or other irregular figures, and is preferably square. The number of the clamps can be set according to the size of the turntable 11, and is generally not less than 6. The holder is made of opaque material, generally selected from metals such as stainless steel, cast iron, aluminum and alloy, magnesium alloy, titanium and alloy, copper and alloy, and polymer materials such as polyethylene, polypropylene, polyester, polycarbonate, polytetrafluoroethylene, polyvinyl chloride, polyvinyl acetate, polystyrene, polyisoprene, epoxy resin, polymethyl methacrylate, and preferably aluminum. The invention adopts a mode of multi-clamp and rotary switching to realize continuous testing of multiple samples; meanwhile, the device is combined with a large-size integrating hemisphere, so that the testing precision and stability are improved.
In addition, the radiation illumination testing equipment 5 is a radiation illumination meter, and any type product produced by Photores research can be selected; the test platform 1 is a light-tight hard circular plate or square plate, and is generally made of metal such as stainless steel, cast iron, aluminum and alloy, magnesium alloy, titanium and alloy, copper and alloy, or polymer material such as polyethylene, polypropylene, polyester, polycarbonate, polytetrafluoroethylene, polyvinyl chloride, polyvinyl acetate, polystyrene, polyisoprene, epoxy resin, polymethyl methacrylate, preferably aluminum alloy. The cross beam and the longitudinal beam of the gantry guide rail 73 can be of a split type or an integrated type structure, and generally, metal such as stainless steel, cast iron, aluminum and alloy, magnesium alloy, titanium and alloy, copper and alloy, or polymer materials such as polyethylene, polypropylene, polyester, polycarbonate, polytetrafluoroethylene, polyvinyl chloride, polyvinyl acetate, polystyrene, polyisoprene, epoxy resin, polymethyl methacrylate, and the like, preferably aluminum alloy materials. The turntable 11 is generally made of metal such as stainless steel, cast iron, aluminum and alloy, magnesium alloy, titanium and alloy, copper and alloy, or polymer material such as polyethylene, polypropylene, polyester, polycarbonate, polytetrafluoroethylene, polyvinyl chloride, polyvinyl acetate, polystyrene, polyisoprene, epoxy resin, and polymethyl methacrylate, preferably aluminum alloy. The transmission clamp 71 is generally made of metal such as stainless steel, cast iron, aluminum and alloy, magnesium alloy, titanium and alloy, copper and alloy, or polymer material such as polyethylene, polypropylene, polyester, polycarbonate, polytetrafluoroethylene, polyvinyl chloride, polyvinyl acetate, polystyrene, polyisoprene, epoxy resin, and polymethyl methacrylate, preferably polycarbonate.
It should be understood that the above embodiments are only examples for clarity of description, and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. This list is neither intended to be exhaustive nor exhaustive. And obvious variations or modifications therefrom are within the scope of the invention.
Claims (10)
1. The utility model provides a OLED device photoelectricity and quantum efficiency test system which characterized in that includes: the test device comprises a test platform (1), a clamp (2), an integrating hemisphere (3), an optical conduction assembly (4) and a radiation illumination test device (5), wherein the clamp (2) and the integrating hemisphere (3) are respectively arranged on two side surfaces of the test platform (1), and the clamp (2) is used for clamping and testing an OLED device; the integrating hemisphere (3) is arranged in a mode that a hemisphere plane faces upwards, and test holes are formed in the center of an upper plane and the top point of a bottom hemisphere; a through hole is formed in the center of the test platform (1), and corresponds to a central test hole in the upper plane of the integrating hemisphere (3); the optical conduction assembly (4) comprises an optical fiber (41), a lens barrel (42) and an optical reflector (43) and is used for conducting optical signals; the radiation illumination testing equipment (5) is arranged below the integrating hemisphere (3) and used for collecting optical signals; the lens cone (42) is arranged between a vertex testing hole at the bottom of the integrating hemisphere (3) and the top of the radiation illumination testing device (5), and the optical reflector (43) is arranged on the side wall of the lens cone (42), can be opened towards the inside of the lens cone (42) and is used for controlling the conduction of an optical path;
when the optical reflector (43) is in an open state, a photoelectric test optical path transmitted to the radiation illumination test device (5) through the optical fiber (41) is opened, and a photoelectric test can be performed; when the optical reflector (43) is in a closed state, a light path transmitted to the radiation illumination testing device (5) through the optical fiber (41) is closed, and a main light path of a testing hole on the integrating hemisphere (3) is conducted, so that a quantum efficiency test can be performed;
arranging metal contacts in the clamp (2) for applying current and voltage to the test sample; the bottom of the clamp (2) is provided with a light through hole;
and in the opening and closing position of the optical reflector (43), the lens barrel (42) is vertically connected with the optical fiber (41).
2. The OLED device photoelectric and quantum efficiency test system of claim 1, further comprising a rotation mechanism (6) for driving the fixture (2) to rotate, a pushing mechanism (7) for driving the fixture (2) to move in a radial direction, and a control system (8) for testing the supply of voltage/current, integrating optical and electrical information and performing data processing; the rotating mechanism (6) and the pushing mechanism (7) are arranged on the test platform (1); the pushing mechanism (7) comprises a transfer clamp (71), a transfer groove (72) and a gantry guide rail (73).
3. The OLED device photoelectric and quantum efficiency testing system of claim 2, wherein the control system (8) comprises a constant voltage and constant current output source (81), a computer (82) and a touch screen (83), the constant voltage and constant current output source (81) is electrically connected with the fixture (2) and is used for providing stable output voltage and current and transmitting output signals to control software on the computer (82) in real time, and the control software on the computer (82) is used for providing touch interaction, test parameter setting and mechanical motion control and can calculate and analyze test data; the touch screen (83) is used for controlling the display of an interface and controlling/acquiring the setting and viewing of test parameters.
4. The OLED device photo and quantum efficiency test system according to claim 2, characterized in that the rotation mechanism (6) comprises a gear and a motor; a slotted hole is formed in the edge of the test platform (1), and the rotating mechanism (6) is arranged in the slotted hole;
an annular rotary turntable (11) is arranged at the upper part of the test platform (1), an annular gear groove (111) meshed with a gear on the rotary mechanism (6) is arranged at the bottom side of the edge part of the turntable (11), the gear of the rotary mechanism (6) penetrates through a slotted hole of the test platform (1) to be meshed with the gear groove (111), and the rotating direction and the position of the turntable (11) are determined by the rotating direction and the number of turns of the gear of the rotary mechanism (6);
the diameter of the turntable (11) is larger than the diameter of the integrating hemisphere (3).
5. The OLED device photoelectric and quantum efficiency test system according to claim 4, wherein a plurality of transfer clips (71) are concentrically arranged on the turntable (11), and the clamps (2) are arranged on the transfer clips (71);
the clamp (2) is connected with the transfer clamp (71) in a contact mode through a contact point.
6. The OLED device photoelectric and quantum efficiency test system of claim 5, characterized in that the inner side of the turntable (11) is provided with a positioning disk (12); and transfer grooves (72) are arranged on the turntable (11) and the positioning disc (12) along the radial direction and are used for driving the transfer clamps (71) to move along the radial direction.
7. The OLED device photoelectric and quantum efficiency test system of claim 6, wherein the positioning plate (12) is provided with a light through hole at the center; the starting point and the end point of the transfer groove (72) are provided with light through holes corresponding to the light through holes on the clamp (2).
8. The OLED device photoelectric and quantum efficiency testing system of claim 2, characterized in that a gantry guide rail (73) is arranged at the upper part of the testing platform (1), a wiring belt (9) is arranged on the gantry guide rail (73), the top end of a longitudinal beam at the connecting end of the gantry guide rail (73) and the testing platform (1) is connected with one end of the wiring belt (9), and the other end of the wiring belt (9) is connected with the transfer clamp (71); guide teeth are arranged on the vertical surface of the cross beam of the gantry guide rail (73) and connected with a transmission clamp (71) provided with a guide wheel (711), and the guide wheel (711) rotates under the condition of being electrified so as to enable the transmission clamp (71) to move along the cross beam.
9. The OLED device photoelectric and quantum efficiency test system of claim 1, wherein the optical fiber (41) is arranged along the outer arc of the integrating hemisphere (3), one end of the optical fiber is connected below a hemisphere top test hole at the bottom of the integrating hemisphere (3), and the other end of the optical fiber is connected on a photoelectric test optical path below a light through hole at the bottom of the clamp (2).
10. The OLED device photo and quantum efficiency test system according to any one of claims 1-9, characterized in that the number of clamps (2) is equal to or greater than 6; the clamp (2) realizes sample switching through rotation; the optical reflector (43) is a single-side pure plane mirror; the radiation illumination testing equipment (5) is a radiation illuminometer.
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